A high temperature temperature field distribution testing device and method based on color camera

Abstract

The present invention discloses a high-temperature temperature field distribution test device and method based on a color camera, comprising an optical part, an electrical part and a software part; the optical part comprises an attenuation filter group and an optical lens; the electrical part comprises a color camera, a data line and a computer; the attenuation filter group, the optical lens and the color camera are threadedly connected in sequence; the color camera is electrically connected to the computer; the high-temperature target to be tested emits light radiation, which is attenuated and filtered by the attenuation filter group, and the photosensitive chip CCD or CMOS on the color camera converts the light signal of the corresponding band into an electrical signal according to the three primary colors of R, G and B, and transmits it to the computer, and the temperature field distribution of the high-temperature target to be tested is analyzed by the software part. The test result of the present invention is less affected by factors such as the state of the target to be tested, the surface roughness, and the surface chemical characteristics, and can achieve high-accuracy testing of the high-temperature temperature field distribution, and accurately reflect the temperature field characteristics of the target to be tested in real time.

Description

Technical Field

[0001] The present invention belongs to the technical field of temperature testing, and more specifically relates to a high-temperature temperature field distribution testing device and method based on a color camera. Background Art

[0002] In the fields of metal smelting, ceramic firing, etc., efficient and accurate measurement and monitoring of the surface temperature of products during the production process is one of the important links to ensure product quality; in the engine field, especially the aviation engine field, in order to ensure the stability of the engine's own performance and improve its service life, it is necessary to accurately test the temperature of high-speed running blades; in the field of scientific research, the temperature characteristics of the space shuttle entering the atmosphere, the temperature characteristics during the wind tunnel research of ultra-high-speed targets, the temperature testing and control during the research and development of new processes and new materials, all of these are inseparable from the high-temperature temperature field distribution, and the real-time and accurate response to the temperature field characteristics of the target to be tested.

[0003] There are two main types of temperature field testing equipment on the market, thermal imagers based on radiation temperature measurement and temperature-indicating paint (temperature-sensitive paint). There are two types of thermal imagers, one that works in the far infrared (8μm-14μm) band, and the other that works in the visible red light and near infrared wave (0.6μm-1.1μm). Both of these bands of thermal imagers use a single band, and believe that the emissivity of the material is a constant and does not change with changes in temperature and state. In addition, during testing, approximate values ​​need to be entered manually. This has little effect on the test results for materials with clear emissivity and conditions where the temperature test accuracy requirements are not too high. However, for high temperature conditions, especially solid-liquid state transitions, surface roughness changes, and the presence or absence of an oxide layer, the impact of the material emissivity on the test results cannot be ignored.

[0004] Temperature-indicating paint is a functional paint that is applied to the surface of the object to be tested, and its color changes with the temperature. The surface temperature and its distribution of the object can be judged by the change in color. This temperature measurement method is non-invasive, does not require test leads, will not damage the test piece, and will not interfere with the target temperature field. It can be used for measurement in harsh environments without destroying the structure and working state of the test piece, and will not affect the startup and heat transfer characteristics of the test piece. It is unique in the wall temperature of high-speed rotating structures and complex components, as well as in displaying large-area distribution. It is easy to use and low in cost. Its disadvantages are that the temperature measurement range is narrow, the measured temperature is low, the temperature resolution accuracy is low, and it is discarded after use, and it is a consumable item.

[0005] Therefore, how to provide a high-temperature temperature field distribution testing device and method based on a color camera is a problem that those skilled in the art urgently need to solve. Summary of the invention

[0006] In view of this, the present invention provides a high-temperature temperature field distribution testing device and method based on a color camera. The test results are less affected by factors such as the state of the target to be tested, the surface roughness, the surface chemical properties, etc., and can achieve high-accuracy testing of the high-temperature temperature field distribution, and accurately reflect the temperature field characteristics of the target to be tested in real time.

[0007] In order to achieve the above object, the present invention adopts the following technical solution:

[0008] A high temperature field distribution test device based on a color camera, comprising: an optical part, an electrical part and a software part;

[0009] Among them, the optical part includes an attenuation filter group and an optical lens; the electrical part includes a color camera, a data line and a computer; the attenuation filter group, the optical lens and the color camera are threadedly connected in sequence; the color camera is electrically connected to the computer through the data line.

[0010] The light radiation emitted by the high-temperature target to be measured is attenuated and filtered by the attenuation filter group (110), and the light-sensitive chip CCD or CMOS on the color camera converts the light signal of the corresponding band into an electrical signal according to the three primary colors of R, G and B, and transmits it to the computer via the data line, and the temperature field distribution of the high-temperature target to be measured is analyzed by the software part.

[0011] Preferably, based on the temperature measurement principle of colorimetry, the temperature of the target to be measured satisfies

[0012]

[0013]

[0014] In the formula, λ R , G , B are the center wavelengths of the three primary color filters of the camera chip R, G, and B; Δλ R , Δλ G , Δλ B Respectively refers to R , G , B is the spectral bandwidth of the central wavelength; T R-G is the target thermodynamic temperature represented by R and G; T B-G is the target thermodynamic temperature represented by B and G; C2 is Planck's second radiation constant; A R , A G and A B are the grayscale and signal intensity conversion coefficients of the three primary colors R, G, and B, which are constants; H(λ R )、H(λ G )、H(λB ) are the spectral grayscales corresponding to the three primary colors R, G, and B; ε(λ R ,T),ε(λ G ,T),ε(λ B , T) are the spectral emissivity of the central wavelength in the three basic spectral segments of R, G, and B respectively; I(λ R )、I(λ G )、I(λ B ) are λ R , G , B is the intensity distribution function of the central wavelength;

[0015] In the visible light range, is a constant, and

[0016]

[0017]

[0018]

[0019] In the formula, I R ,I G ,I B The intensity information corresponding to the three primary color pixels of R, G, and B of the camera chip;

[0020] So the radiation temperature of the target surface to be measured is

[0021]

[0022]

[0023] Preferably, the attenuation filter set includes a bandpass filter and a neutral attenuation filter in the visible light band.

[0024] Preferably, the optical lens has the functions of focal length adjustment and aperture adjustment.

[0025] Preferably, the color camera is a silicon-based CCD or CMOS color camera.

[0026] A high temperature temperature field distribution test method based on a color camera is applied to the high temperature temperature field distribution test device based on a color camera.

[0027] The steps include:

[0028] Step 1: Collect the pixel intensity information of the three primary colors R, G, and B of the camera chip I R ,I G ,I B ;

[0029] Step 2: Interpretation I R ,I G ,I B Value, if I R ,I G are all much greater than 0, and the temperature of the corresponding point of the high-temperature target to be measured is calculated according to formula (6); if I R is close to or equal to 0, and I B ,I G are both greater than 0, the temperature of the corresponding point of the high-temperature target to be measured is calculated according to formula (7); In formula (6) or formula (7), if I G Equal to 0, or I R ,I G ,I B If two of the values ​​are 0, the target temperature is lower than the threshold value and the temperature cannot be determined, and the lowest temperature can be determined.

[0030] Step 3: Based on the temperature information between each pixel in step 2, construct the temperature field of the high-temperature target to be measured and provide the field distribution information.

[0031] The beneficial effects of the present invention are:

[0032] The test results of the present invention are less affected by factors such as the state of the target to be tested, the surface roughness, the surface chemical properties, etc., and can work in low-visibility environments such as kilns and hot rolling. It can achieve high-accuracy testing of high-temperature temperature field distribution, meet the needs of kiln, smelting and wind tunnel testing, and accurately reflect the temperature field characteristics of the target to be tested in real time. BRIEF DESCRIPTION OF THE DRAWINGS

[0033] In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the drawings required for use in the embodiments or the description of the prior art will be briefly introduced below. Obviously, the drawings described below are only embodiments of the present invention. For ordinary technicians in this field, other drawings can be obtained based on the provided drawings without paying creative work.

[0034] Figure 1 The accompanying drawing is a schematic structural diagram of the present invention.

[0035] Figure 2 The accompanying drawing is a structural block diagram of the present invention.

[0036] Figure 3 The accompanying drawing is a flow chart of the method of the present invention. DETAILED DESCRIPTION

[0037] The following will be combined with the drawings in the embodiments of the present invention to clearly and completely describe the technical solutions in the embodiments of the present invention. Obviously, the described embodiments are only part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the present invention.

[0038] Please see attached Figure 1-2 , the present invention provides a high temperature temperature field distribution test device based on a color camera, comprising: an optical part 100, an electrical part 200 and a software part 300;

[0039] Among them, the optical part 100 includes an attenuation filter group 110 and an optical lens 120; the electrical part 200 includes a color camera 210, a data line 220 and a computer 230; the attenuation filter group 110, the optical lens 120 and the color camera 210 are threadedly connected in sequence; the color camera 210 is electrically connected to the computer 230 through the data line 220.

[0040] The light radiation emitted by the high-temperature target to be measured is attenuated and filtered by the attenuation filter group 110. The photosensitive chip CCD or CMOS on the color camera 210 converts the light signal of the corresponding band into an electrical signal according to the three primary colors of R, G, and B, and transmits it to the computer 230 via the data line 220. The temperature field distribution of the high-temperature target to be measured is analyzed by the software part 300.

[0041] Based on the temperature measurement principle of colorimetry, the temperature of the target to be measured meets

[0042]

[0043]

[0044] In the formula, λ R , G , B They are the center wavelengths of the three primary color filters of the camera chip R, G, and B, unit: m; Δλ R , Δλ G , Δλ B Respectively refers to R , G , B is the spectral bandwidth of the central wavelength; T R-G is the target thermodynamic temperature represented by R and G; T B-G is the target thermodynamic temperature represented by B and G, unit: K; C2 is Planck's second radiation constant, Unit: mK; A R , A G and A Bare the grayscale and signal intensity conversion coefficients of the three primary colors R, G, and B, which are constants; H(λ R )、H(λ G )、H(λ B ) are the spectral grayscales corresponding to the three primary colors R, G, and B; ε(λ R ,T),ε(λ G ,T),ε(λ B , T) are the spectral emissivity of the central wavelength in the three basic spectral segments of R, G, and B respectively; I(λ R )、I(λ G )、I(λ B ) are λ R , G , B is the intensity distribution function of the central wavelength;

[0045] In the visible light range, is a constant, and

[0046]

[0047]

[0048]

[0049] In the formula, I R ,I G ,I B The intensity information corresponding to the three primary color pixels of R, G, and B of the camera chip;

[0050] So the radiation temperature of the target surface to be measured is

[0051]

[0052]

[0053] In another embodiment, the attenuation filter set 110 includes a bandpass filter in the visible light band and a neutral density attenuation filter.

[0054] In another embodiment, the optical lens 120 has the functions of focus adjustment and aperture adjustment.

[0055] In another embodiment, the color camera 210 is a silicon-based CCD or CMOS color camera.

[0056] See attached Figure 3 The present invention also provides a high temperature temperature field distribution test method based on a color camera, which is applied to the above-mentioned high temperature temperature field distribution test device based on a color camera.

[0057] The steps include:

[0058] Step 1: Collect the pixel intensity information of the three primary colors R, G, and B of the camera chip I R ,I G ,I B ;

[0059] Step 2: Interpretation I R ,I G ,I B Value, if I R ,I G are all much greater than 0, and the temperature of the corresponding point of the high-temperature target to be measured is calculated according to formula (6); if I R is close to or equal to 0, and I B ,I G are both greater than 0, the temperature of the corresponding point of the high-temperature target to be measured is calculated according to formula (7); In formula (6) or formula (7), if I G Equal to 0, or I R ,I G ,I B If two of the values ​​are 0, the target temperature is lower than the threshold value and the temperature cannot be determined, and the lowest temperature can be determined.

[0060] Step 3: Based on the temperature information between each pixel in step 2, construct the temperature field of the high-temperature target to be measured and provide the field distribution information.

[0061] The test results of the present invention are less affected by factors such as the state of the target to be tested, the surface roughness, the surface chemical properties, etc., and can work in low-visibility environments such as kilns and hot rolling. It can achieve high-accuracy testing of high-temperature temperature field distribution, meet the needs of kiln, smelting and wind tunnel testing, and accurately reflect the temperature field characteristics of the target to be tested in real time.

[0062] The temperature measurement range of the present invention is 500°C-5000°C. It is suitable for high-temperature temperature field testing of various furnaces such as ceramics and glass, and is also suitable for temperature field testing in high-temperature wind tunnels. It is also suitable for high-temperature temperature field testing in harsh environments with low visibility. It has the advantages and characteristics of high sensitivity, large temperature measurement range, long service life and safety.

[0063] In this specification, each embodiment is described in a progressive manner, and each embodiment focuses on the differences from other embodiments. The same or similar parts between the embodiments can be referred to each other. For the device disclosed in the embodiment, since it corresponds to the method disclosed in the embodiment, the description is relatively simple, and the relevant parts can be referred to the method part.

[0064] The above description of the disclosed embodiments enables those skilled in the art to implement or use the present invention. Various modifications to these embodiments will be apparent to those skilled in the art, and the general principles defined herein may be implemented in other embodiments without departing from the spirit or scope of the present invention. Therefore, the present invention will not be limited to the embodiments shown herein, but rather to the widest scope consistent with the principles and novel features disclosed herein.

Claims

1. A high temperature field distribution test device based on a color camera, characterized in that: Working in an environment with low visibility and high temperature, the device comprises: an optical part (100), an electrical part (200) and a software part (300); The optical part (100) comprises an attenuation filter group (110) and an optical lens (120); the electrical part (200) comprises a color camera (210), a data line (220) and a computer (230); the attenuation filter group (110), the optical lens (120) and the color camera (210) are threadedly connected in sequence; the color camera (210) and the computer (230) are electrically connected via the data line (220); The attenuation filter group (110) comprises a bandpass filter in the visible light band and a neutral attenuation filter; The optical lens (120) has the functions of adjusting the focal length and the aperture; The color camera (210) is a silicon-based CCD or CMOS color camera; The temperature measurement range of the color camera is 500°C-5000°C; The light radiation emitted by the high-temperature target to be measured is attenuated and filtered by the attenuation filter group (110), and the light-sensitive chip CCD or CMOS on the color camera (210) converts the light signal of the corresponding wavelength band into an electrical signal according to the three primary colors of R, G and B, and transmits the electrical signal to the computer (230) via the data line (220), and the temperature field distribution of the high-temperature target to be measured is analyzed by the software part (300); Based on the temperature measurement principle of colorimetry, the temperature of the target to be measured meets In the formula, λ R , G , B are the center wavelengths of the three primary color filters of the camera chip R, G, and B; Δλ R , Δλ G , Δλ B Respectively refers to R , G , B is the spectral bandwidth of the central wavelength; T R-G is the target thermodynamic temperature represented by R and G; T B-G is the target thermodynamic temperature represented by B and G; C2 is Planck's second radiation constant; A R , A G and A B are the grayscale and signal intensity conversion coefficients of the three primary colors R, G, and B, which are constants; H(λ R )、H(λ G )、H(λ B ) are the spectral grayscales corresponding to the three primary colors R, G, and B; ε(λ R ,T),ε(λ G ,T),ε(λ B , T) are the spectral emissivity of the central wavelength in the three basic spectral segments of R, G, and B respectively; I(λ R )、I(λ G )、I(λ B ) are λ R , G , B is the intensity distribution function of the central wavelength; In the visible light range, is a constant, and In the formula, I R ,I G ,I B The intensity information corresponding to the three primary color pixels of R, G, and B of the camera chip; So the radiation temperature of the target surface to be measured is 2. A high temperature field distribution test method based on a color camera, characterized in that: The high temperature field distribution testing device based on a color camera as claimed in claim 1, The steps include: Step 1: Collect the pixel intensity information of the three primary colors R, G, and B of the camera chip I R ,I G ,I B ; Step 2: Interpretation I R ,I G ,I B Value, if I R ,I G are all much greater than 0, and the temperature of the corresponding point of the high-temperature target to be measured is calculated according to formula (6); If I R is close to or equal to 0, and I B ,I G If both are greater than 0, the temperature of the corresponding point of the high-temperature target to be measured is calculated according to formula (7); In formula (6) or formula (7), if I G Equal to 0, or I R ,I G ,I B If two of the values ​​are 0, the target temperature is lower than the threshold value and the temperature cannot be determined, and the lowest temperature can be determined. Step 3: Based on the temperature information between each pixel in step 2, construct the temperature field of the high-temperature target to be measured and provide the field distribution information.

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