System and method for parallel measurement of a device under test in an open air environment

Abstract

The present invention provides a system and method for parallel measurement of a device under test in an open air environment. The system (10) includes a plurality of alignment structures (1, 2), each alignment structure (1, 2) including a shaped reflector (5, 6) disposed at the top end of the alignment structure (1, 2) and an antenna (7, 8) disposed at the focal region of the shaped reflector (5, 6). In this case, the devices under test (3, 4) are disposed at the bottom ends of the plurality of alignment structures (1, 2) and are opposite to the corresponding shaped reflectors (5, 6). Additionally, the plurality of alignment structures (1, 2) are placed parallel to each other without a shielding housing.

Description

Technical Field

[0001] The present invention relates to parallel measurements of devices under test (DUTs) in an open environment, especially for production line testing of multiple DUTs with limited interference. Background Art

[0002] Over-the-air (OTA) tests are typically performed in a shielded and sealed environment inside an anechoic chamber. These chambers are designed to be non-reflective and anechoic. The size of the chamber varies depending on the object being tested and the frequency range, and the chamber is typically lined with foam cones that absorb reflected signals. The test takes into account the radiation characteristics of the device while eliminating interference from any other transmissions. In wireless device production testing, these anechoic chambers need to be opened and closed to subsequently place the device under test (DUT). Alternatively, complex mechanisms (such as six-axis robots) are used to load the DUT into these anechoic chambers. Therefore, especially in the case of production testing, the total time and cost are significantly increased.

[0003] From the above perspective, an open test environment is beneficial for production testing. However, without shielding the chamber, the associated interference to the test setup will surely reduce the overall test accuracy. In addition, to test multiple devices (DUTs) simultaneously, especially in an OTA environment, a separate anechoic environment is typically implemented for each DUT to maintain an acceptable level of interference. For example, document US9,179,340B2 shows a system for OTA testing of wireless devices. The system includes a plurality of separate chambers configured to accommodate the devices under test, where these chambers are connected by separately defined propagation path channels. However, this system results in a more complex anechoic chamber with multiple separate enclosures inside to isolate the devices. Summary of the Invention

[0004] Accordingly, it is an object of the present invention to provide a system and method for parallel measurement of DUTs for OTA production testing with a minimal level of interference in a simplified and cost-effective manner.

[0005] This object is solved by the features of the first independent claim for the system and by the features of the second independent claim for the method. The dependent claims contain further improvements.

[0006] According to a first aspect of the present invention, there is provided a system for parallel measurement of a device under test in an open air environment. The system includes a plurality of alignment structures, each alignment structure including: a shaped reflector disposed at the top end of the alignment structure; and an antenna disposed at a focal region of the shaped reflector. In this case, the device under test is disposed at the bottom end of the plurality of alignment structures and opposite to the corresponding shaped reflector. Additionally, the plurality of alignment structures are placed parallel to each other without a shielding housing.

[0007] Therefore, a plurality of Compact Antenna Test Range (CATR) setups are utilized to measure the corresponding DUTs without any shielding housing. Due to the natural property of the CATR, the reflector scatters most of the incident interference from the quiet zone, especially the radiation from adjacent DUTs. Thus, the reflector and the beam collimation mechanism provide a natural interference blocking ability against the radiation from adjacent test setups. Advantageously, multiple DUTs can be tested in parallel with limited interference without individual shielding housings. This is particularly beneficial for production testing of wireless devices, such as testing in a fifth-generation (5G) production line.

[0008] According to a first preferred implementation form of the first aspect of the present invention, the system further includes a measurement unit, which is preferably connected to the antenna of each alignment structure. Advantageously, the parallel measurement of the DUT is performed in a relatively simple manner.

[0009] According to a second preferred implementation form of the first aspect of the present invention, the measurement unit is configured to measure similar performance characteristics for each alignment structure. Additionally or alternatively, the measurement unit is configured to measure different performance characteristics for each alignment structure. Thus, a higher measurement flexibility is achieved.

[0010] According to another preferred implementation form of the first aspect of the present invention, the device under test is placed on a production line, preferably a conveyor belt, at the bottom end of the plurality of alignment structures. In this case, the DUT can be placed on a single conveyor belt located at the bottom end of the alignment structure. Alternatively, a plurality of parallel conveyor belts can be arranged at the bottom end of their respective alignment structures.

[0011] According to another preferred implementation form of the first aspect of the present invention, each device under test operates as a directional antenna having a main beam within a solid angle of 120 degrees. Advantageously, the DUT is oriented with the main radiation power within a 120×120 degree solid angle around the reflector to reduce interference towards adjacent test setups.

[0012] According to another preferred implementation form of the first aspect of the present invention, the measurement unit is used to simultaneously perform measurements on the device under test that operates using the main beam within the solid angle of 120 degrees. Advantageously, parallel tests of the DUT are performed simultaneously.

[0013] According to another preferred implementation form of the first aspect of the present invention, the plurality of alignment structures are arranged horizontally and / or vertically and / or in an inclined position with respect to the test plane. Therefore, the system allows for flexible test setups regarding, for example, the type of DUT to be tested, the alignment requirements for the production line, the layout of the test facility, etc.

[0014] According to another preferred implementation form of the first aspect of the present invention, the plurality of alignment structures are arranged extremely close to each other, preferably with a separation distance of less than 2 meters. Advantageously, the DUT is measured in a compact environment.

[0015] According to another preferred implementation form of the first aspect of the present invention, the system further includes a positioner for simultaneously orienting the plurality of alignment structures. Therefore, advantageously, the CATR and the DUT are oriented relative to each other.

[0016] According to another preferred implementation form of the first aspect of the present invention, the system further includes a shielding wall arranged between the plurality of alignment structures, so that the measurement unit is used to simultaneously perform measurements on the device under test that operates using the main beam with a solid angle greater than 120 degrees. Advantageously, the DUT can be measured with limited interference even if the DUT is not perfectly oriented and / or beamformed.

[0017] According to the second aspect of the present invention, a method for parallel measurement of a device under test in an open-air environment in a system including a plurality of alignment structures is provided. The method includes the following steps: arranging a shaped reflector at the top of the alignment structures. Additionally, the method includes the following steps: arranging an antenna at the focal region of the shaped reflector. Furthermore, the method includes the following steps: arranging the device under test at the bottom of the plurality of alignment structures and opposite the corresponding shaped reflector. In this case, the plurality of alignment structures are placed parallel to each other without a shielding housing. Therefore, multiple Compact Antenna Test Range (CATR) setups are utilized to measure the corresponding DUT without any shielding housing.

[0018] According to a first preferred implementation form of the second aspect of the present invention, the method further includes the step of measuring similar performance characteristics for each alignment structure. In addition or as an alternative, the method further includes the step of measuring different performance characteristics for each alignment structure. Higher measurement flexibility is advantageously achieved.

[0019] According to a second preferred implementation form of the second aspect of the present invention, the method further includes the following steps: placing the device under test on the production line at the bottom end of the plurality of alignment structures, preferably on a conveyor belt. In this case, the DUT can be placed on a single conveyor belt located at the bottom end of the alignment structure. Alternatively, a plurality of parallel conveyor belts can be arranged at the bottom end of their respective alignment structures.

[0020] According to another preferred implementation form of the second aspect of the present invention, the method further includes the following steps: operating each device under test as a directional antenna having a main beam within a solid angle of 120 degrees. Advantageously, the DUT is oriented with the main radiation power in a solid angle of 120×120 degrees around the reflector to reduce interference towards adjacent test setups.

[0021] According to another preferred implementation form of the second aspect of the present invention, the method further includes the following steps: simultaneously performing measurements on the device under test operating with the main beam within the 120-degree solid angle. Advantageously, parallel tests of the DUT are performed simultaneously. BRIEF DESCRIPTION OF THE DRAWINGS

[0022] The exemplary embodiments of the present invention will now be further described by way of example and not limitation with reference to the accompanying drawings. In the drawings:

[0023] Figure 1 A first exemplary embodiment of the system according to the first aspect of the present invention is shown;

[0024] Figure 2 A second exemplary embodiment of the system according to the first aspect of the present invention is shown;

[0025] Figure 3 An exemplary interference situation of the reflector of the alignment structure according to the first aspect of the present invention is shown;

[0026] Figure 4 An exemplary interference situation of the antenna of the alignment structure according to the first aspect of the present invention is shown; and

[0027] Figure 5 An exemplary embodiment of the method according to the second aspect of the present invention is shown. DETAILED DESCRIPTION

[0028] Reference will now be made in detail to embodiments of the present invention, examples of which are illustrated in the accompanying drawings. However, various modifications may be made to the following embodiments of the present invention, and the scope of the present invention is not limited by the following embodiments.

[0029] A first exemplary embodiment of a system 10 according to a first aspect of the present invention is shown in Figure 1 . In particular, two parallel alignment structures 1, 2 are shown herein, wherein the alignment structure 1 includes a reflector 5 and an antenna 7 (e.g., a feed antenna), and the alignment structure 2 includes a reflector 6 and an antenna 8 (e.g., a feed antenna), wherein the antenna 7 is disposed at the focal region of the reflector 5, and the antenna 8 is disposed at the focal region of the reflector 6. The reflector 5 is located at the top of the alignment structure 1, the reflector 6 is located at the top of the alignment structure 2, and the DUTs 3, 4 are placed at the bottom, such that the reflectors 5, 6 are suspended above the respective DUTs 3, 4. The DUTs 3, 4 are wireless devices, such as modular devices, antenna arrays, etc., and preferably operate according to the 5G communication standard. The alignment structures 1, 2 are similar to vertical CATR systems, wherein the CATR and the DUTs 3, 4 are oriented such that the parallel DUTs 3, 4 do not directly radiate energy towards each other.

[0030] The system further includes a measurement unit (MEAS) 9 connected to each of the antennas 7, 8, and performs measurements on the DUTs 3, 4 simultaneously. Each of the antennas 7, 8 is connected to the measurement unit 9 individually or jointly via a switching component (e.g., via a radio frequency (RF) switch box (not shown)). Thus, the measurement unit 9 is capable of measuring the same performance characteristics (e.g., error vector magnitude) for the DUTs 3, 4. Additionally, the measurement unit 9 is capable of measuring multiple different performance characteristics (e.g., error vector magnitude and channel power) for the DUTs 3, 4. The measurement unit 9 may additionally include measurement antennas or probes or sensors for performing detailed measurements on the DUTs 3, 4. Generally, the measurement unit 9 includes signal generation components, data / signal processing components, a user interface, and storage components, which are well known in the art and will not be described in detail herein to avoid unnecessarily obscuring the present invention.

[0031] The system further includes a positioner (POS) 11, which is connected to the measurement unit 9 and is also connected to alignment structures 1 and 2 so as to simultaneously orient the respective orientations of alignment structures 1 and 2. The positioner 11 can optionally be connected to DUTs 3 and 4 so as to simultaneously orient the orientations of DUTs 3 and 4 relative to alignment structures 1 and 2. In this case, the positioner 11 can orient alignment structures 1 and 2 vertically or horizontally or at a certain inclination angle relative to the test plane. Additionally, the positioner 11 can orient alignment structures 1 and 2 at different angles relative to each other. Alignment structures 1 and 2 can be externally oriented by the positioner 11, for example, by a user via the measurement unit 9 according to the requirements of production testing.

[0032] Particularly for the alignment structures 1 and 2 shown herein, two DUTs 3 and 4 to be tested in parallel can be placed on a production line. Thus, the two alignment structures 1 and 2 are vertically oriented on the production line, where the two DUTs 3 and 4 are on one conveyor belt or two parallel conveyor belts, and the one conveyor belt or two parallel conveyor belts are located below respective reflectors 5 and 6. In each instance of the two DUTs 3 and 4, measurements are performed in parallel using the two corresponding alignment structures 1 and 2. Advantageously, a shielding housing (such as an anechoic chamber) is not required, thereby enabling production-level testing of multiple devices. However, alignment structure 1 can include a certain level of shielding portions 13 and 15 as described herein, and alignment structure 2 can include a certain level of shielding portions 14 and 16 as described herein, for example, to isolate the backlobes from antennas 7 and 8 and the side lobes of DUTs 3 and 4. Antennas 7 and 8 irradiate respective reflectors 5 and 6 from the focusing region, and DUTs 3 and 4 (such as antenna arrays) operate with a main radiation power in a solid angle of 120×120 degrees around respective reflectors 5 and 6. It should be noted that Figure 1 Exemplary shielding portions 13, 14, 15, and 16 are partially shown therein. Additional shielding portions can be introduced between antennas 7 and 8 and respective reflectors 5 and 6 as needed.

[0033] Two alignment structures 1, 2 can be placed extremely close, for example, at nearly 1 meter or 2 meters, preferably less than 2 meters, in order to achieve a compact test environment. Since the main radiation from DUT 3, DUT 4 is directed within a 120×120 solid angle around reflectors 5, 6 (at + / - 60 degrees from the line of sight in two orthogonal directions), the influence of the radiation from one DUT on an adjacent DUT within the direct line of sight is negligible. For example, the influence of the radiation from DUT 3 on DUT 4 within the direct line of sight is negligible. On the other hand, the electromagnetic wave radiated by DUT 3 can actually reach reflector 6 with non-negligible power. However, since DUT 3 is not placed in the focal region of reflector 6, reflector 6 scatters most of the radiation from DUT 3 out of the quiet zone (the area where DUT 4 is located). Therefore, reflectors 5, 6 and the beam collimation mechanism provide a natural interference blocking ability to block the radiation from adjacent test mechanisms.

[0034] It is important to note that the number of alignment structures, the number of DUTs, and their respective orientations are shown herein by way of example only and not by way of limitation.

[0035] In Figure 2 a second exemplary embodiment of system 20 according to the first aspect of the present invention is shown. System 20 differs from Figure 1 system 10 in that system 20 includes an additional plurality of shielding walls 21 or a single shielding wall between alignment structure 1 and alignment structure 2 to minimize interference. The shielding wall 21 can be in the form of: a surface with a metal skin, segments with RF absorbing materials (e.g., ferrite or pyramidal foam), or any combination thereof. Such shielding walls 21 advantageously suppress adjacent interference, especially in the case where a DUT (e.g., DUT 3) radiates a beam within a solid angle greater than 120 degrees, and these beams can interfere with an adjacent DUT (e.g., DUT 4) and the DUT adjacent to this adjacent DUT 4. Therefore, even if one or more devices can radiate waves within a main beam solid angle greater than 120 degrees, multiple devices can be tested on a production line.

[0036] In Figure 3 an exemplary interference situation of reflector 5 of alignment structure 1 according to the first aspect of the present invention is shown. The interference source 30 can be, for example, an adjacent DUT. Although the influence of the interference source 30 on DUT 3 within the direct line of sight can be negligible, the interference level on reflector 5 has a considerable intensity. However, since the interference source 30 does not originate from the focal region of reflector 5, reflector 5 scatters almost all of the interference from the quiet zone. Therefore, even without a shielded housing, the interference on reflector 5 can be sufficiently minimized.

[0037] InFigure 4 An exemplary interference situation of the DUT 3 and the antenna 7 of the alignment structure 1 according to the first aspect of the present invention is shown. The interference sources 41 and 42 may be scattered waves from adjacent reflectors, and the interference sources 43 and 44 may be one or more antennas in adjacent antennas. Alternatively, the interference sources 41, 42, 43, and 44 may be any kind of scattering from one or more adjacent reflectors, antennas, and DUTs. However, due to beam collimation on the reflector and beam radiation concentrated within a solid angle of 120 degrees, most of the interference sources 41, 42, 43, and 44 will cause interference at a negligible power level and thus will not significantly affect the antenna 7 and the DUT 3.

[0038] In Figure 5 An exemplary embodiment of the method according to the second aspect of the present invention is shown. In the first step 100, the shaped reflector 5 is arranged at the top of the alignment structure 1, and the shaped reflector 6 is arranged at the top of the alignment structure 2. In the second step 101, the antenna 7 is arranged at the focal region of the shaped reflector 5, and the antenna 8 is arranged at the focal region of the shaped reflector 6. In the third step 102, the devices under test 3 and 4 are respectively arranged at the bottom ends of the plurality of alignment structures 1 and 2, opposite to the corresponding shaped reflectors 5 and 6. In this case, the plurality of alignment structures 1 and 2 are placed parallel to each other without a shielding housing.

[0039] In addition, the method further includes the step of measuring similar performance characteristics for each of the alignment structures 1 and 2. Additionally or alternatively, the method further includes the step of measuring different performance characteristics for each of the alignment structures 1 and 2.

[0040] It is particularly advantageous if the method further includes placing the devices under test 3 and 4 on a production line, preferably on a conveyor belt at the bottom ends of the plurality of alignment structures 1 and 2.

[0041] Furthermore, the method further includes the steps of operating each of the devices under test 3 and 4 as a directional antenna having a main beam within a solid angle of 120 degrees.

[0042] In addition, the method further includes the step of simultaneously performing measurements on the devices under test 3 and 4 operating with a main beam within a solid angle of 120 degrees.

[0043] Embodiments of the present invention can be implemented by hardware, software, or any combination thereof. Each embodiment of the present invention can be implemented by one or more application specific integrated circuits (ASICs), digital signal processors (DSPs), digital signal processing devices (DSPDs), programmable logic devices (PLDs), field programmable gate arrays (FPGAs), processors, controllers, microcontrollers, microprocessors, etc.

[0044] Although various embodiments of the present invention have been described above, it should be understood that these embodiments are presented by way of example only and not by way of limitation. Without departing from the spirit and scope of the present invention, various modifications can be made to the disclosed embodiments based on the disclosure herein. Therefore, the breadth and scope of the present invention should not be limited by any of the above-described embodiments. Instead, the scope of the present invention should be defined in accordance with the appended claims and their equivalents.

[0045] Although the present invention has been shown and described with respect to one or more implementations, equivalent changes and modifications will occur to those skilled in the art upon reading and understanding this specification and the drawings. Additionally, although a particular feature of the present invention may be disclosed with respect to only one of several implementations, such a feature may be combined with one or more other features of the other implementations, which may be desirable and advantageous for any given or particular application.

Claims

1. A system (10) for parallel measurement of a device under test (3, 4) in an open air environment, the system (10) comprising a plurality of alignment structures (1, 2), each alignment structure (1, 2) comprising: A shaped reflector (5, 6), the shaped reflector (5, 6) being arranged at the top end of the alignment structure (1, 2), and An antenna (7, 8), the antenna (7, 8) being arranged at the focal region of the shaped reflector (5, 6); Wherein the device under test (3, 4) is arranged at the bottom end of the plurality of alignment structures (1, 2) and is opposite to the corresponding shaped reflector (5, 6), and Wherein the plurality of alignment structures (1, 2) are placed parallel to each other without a shielding housing.

2. The system according to claim 1, Among them, The system (10) further comprises a measurement unit (9), the measurement unit (9) being connected to the antenna (7, 8) of each alignment structure (1, 2).

3. The system according to claim 2, Among them, The measurement unit (9) is configured to measure similar performance characteristics for each alignment structure (1, 2), and / or Wherein the measurement unit (9) is configured to measure different performance characteristics for each alignment structure (1, 2).

4. The system according to claim 1, Among them, The device under test (3, 4) is placed on a conveyor belt of a production line at the bottom end of the plurality of alignment structures (1, 2).

5. The system according to claim 1, Among them, Each device under test (3, 4) operates as a directional antenna having a main beam within a solid angle of 120 degrees.

6. The system according to claim 2, Among them, The measurement unit (9) is configured to simultaneously perform measurements on the device under test (3, 4) operating with a main beam within a solid angle of 120 degrees.

7. The system according to claim 1, Among them, The plurality of alignment structures (1, 2) are arranged horizontally with respect to a test plane, or Wherein the plurality of alignment structures (1, 2) are arranged vertically with respect to the test plane, or Wherein the plurality of alignment structures (1, 2) are arranged at an inclined position with respect to the test plane.

8. The system according to claim 1, Among them, The plurality of alignment structures (1, 2) are arranged with a separation distance of less than 2 meters.

9. The system according to claim 1, Among them, The system (10) further comprises a positioner (11), the positioner (11) being configured to simultaneously orient the plurality of alignment structures (1, 2).

10. The system according to claim 2, Among them, The system (10) further comprises a shielding wall (21) arranged between the plurality of alignment structures (1, 2), such that the measurement unit (9) is configured to simultaneously perform measurements on the device under test (3, 4) operating with a main beam having a solid angle greater than 120 degrees.

11. A method for parallel measurement of a device under test (3, 4) in an open air environment in a system (10), the system (10) comprising a plurality of alignment structures (1, 2), the method comprising the following steps: Arrange (100) the formed reflectors (5, 6) at the top of the alignment structures (1, 2). Arrange (101) the antennas (7, 8) at the focal regions of the formed reflectors (5, 6). Arrange (102) the device under test (3, 4) at the bottom ends of the plurality of alignment structures (1, 2) and opposite the corresponding formed reflectors (5, 6), and Among them, Place the plurality of alignment structures (1, 2) parallel to each other without a shielding housing.

12. The method according to claim 11,[[]]END]] Among them, The method further includes the step of measuring similar performance characteristics for each alignment structure (1, 2), and / or wherein the method further includes the step of measuring different performance characteristics for each alignment structure (1, 2).

13. The method according to claim 11 or 12,[[]]END]] Among them, The method further includes the step of placing the device under test (3, 4) on a conveyor belt of a production line at the bottom ends of the plurality of alignment structures (1, 2).

14. The method according to claim 11 or 12,[[]]END]] Among them, The method further includes the step of operating each device under test (3, 4) as a directional antenna having a main beam within a solid angle of 120 degrees.

15. The method according to claim 14,[[]]END]] Among them, The method further includes the step of simultaneously performing measurements on the device under test (3, 4) operating with the main beam within the solid angle of 120 degrees.

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