Digital integrated circuit test device and digital integrated circuit test system

Abstract

The embodiment of the present application provides a digital integrated circuit test device and a digital integrated circuit test system. The digital integrated circuit test device includes a storage module, a control module and a channel switching module. The storage module includes a plurality of single-channel storage units. The control module includes a plurality of single-channel control circuits. The plurality of single-channel storage units and the plurality of single-channel control circuits are connected one-to-one. Each of the single-channel control circuits and the single-channel storage unit connected thereto constitute a single-channel resource group. The channel switching module is connected to the plurality of single-channel control circuits, so the corresponding connection relationship of each channel can be changed according to demand; the initialization data and control program of each channel can be set differently, thereby improving the flexibility of the use of the digital integrated circuit test device.

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