Test system

Abstract

The test system provided by the present invention includes a cabinet body, a support bottom plate and a test structure. The part to be tested is arranged on the test structure, and the control mechanism supplies power to the test structure and the part to be tested through corresponding second docking mechanisms and first docking mechanisms. In the test system provided by the present invention, various test methods for parts to be tested are pre-stored in the control mechanism, and the type of the part to be tested is judged according to the parameters of the test mechanism connected to the control mechanism and the test is carried out according to the corresponding test method, which greatly improves the versatility of the test system. At the same time, the control mechanism is used to supply power and air to all test structures, and then the test structure is simplified into two parts, namely a fixture and an electric control mechanism, which maximally simplifies the complexity of the test structure. Moreover, positioning holes and positioning grooves are used to ensure the reliability of the docking between the test mechanism and the support bottom plate and the drawer, and a shock absorption mechanism is used to reduce the vibration noise generated by the part to be tested during the test process.

Description

Technical Field

[0001] The present invention relates to the technical field of detection equipment, and particularly to a test system. Background Art

[0002] Most electronic component products need to undergo operating life tests. Different devices require separate development of dedicated test devices. The general structure of each device includes parts such as a housing, a control system, a power source or a gas source, a human-machine interface, and a carrier. Some components and modules of each device can be shared and used interchangeably. However, due to the independence of individual devices and the differences in standards, the number of required test devices is increasing day by day, the functions are overly redundant, and resources are idly wasted. Summary of the Invention

[0003] The present invention provides a test system that simplifies the complexity of the test system and increases its versatility, to overcome the problems in the prior art that each electronic component product requires separate development of a test system, resulting in an increasing number of test devices, overly redundant functions, and idle waste of resources.

[0004] A test system includes:

[0005] A cabinet body, on which a control mechanism and a plurality of drawers are provided. Each drawer is provided with a first docking mechanism and a gas source switch, and all the first docking mechanisms and all the gas source switches are connected to the control mechanism;

[0006] A support bottom plate, which corresponds to the drawer one by one, and the support bottom plate is detachably arranged on the corresponding drawer;

[0007] A test structure, which is arranged on the support bottom plate, and a second docking mechanism that cooperates with the first docking mechanism is arranged on the test structure;

[0008] A part to be tested is arranged on the test structure. The control mechanism supplies power to the test structure and the part to be tested through the corresponding second docking mechanism and first docking mechanism, and the control mechanism supplies gas to the part to be tested through the corresponding gas source switch.

[0009] The test structure includes a fixture and an electric control mechanism. The part to be tested is detachably arranged on the fixture. The second docking mechanism is arranged on the electric control mechanism, and the electric control mechanism is electrically connected to the control mechanism through the second docking mechanism and the first docking mechanism.

[0010] There are multiple types of the test structure, and each type of the test structure corresponds to a type of the part to be tested. Test methods corresponding to all the test structures are preset in the control mechanism.

[0011] The test system further includes a reset mechanism. The reset mechanism is disposed on the drawer, and the first docking mechanism is disposed on the reset mechanism. Moreover, the reset mechanism has a tendency to move the first docking mechanism towards the second docking mechanism.

[0012] A wire box is provided on the support bottom plate. The reset mechanism and the first docking mechanism are both disposed within the wire box, and the first docking mechanism protrudes from the first side surface of the wire box.

[0013] The wire box has a second side surface opposite to the first side surface. Wires of the first docking mechanism penetrate through the second side surface and are electrically connected to the control mechanism.

[0014] The reset mechanism includes a spring. A first end of the spring abuts against the inner surface of the wire box. The first docking mechanism is disposed at a second end of the spring. And when the first docking mechanism cooperates with the second docking mechanism, the spring is in a compressed state.

[0015] A guiding inclined surface is provided on the second docking mechanism. When the support bottom plate is installed onto the drawer, the first docking mechanism moves under the guiding action of the guiding inclined surface.

[0016] The first docking mechanism includes a plurality of first conductive blocks. All the first conductive blocks are respectively electrically connected to the control mechanism through wires. The second docking mechanism includes a plurality of second conductive blocks, and all the second conductive blocks on the same second docking mechanism correspond one by one to all the first conductive blocks on the corresponding first docking mechanism.

[0017] A positioning pin is provided on the drawer, and a positioning hole is provided on the support bottom plate. And the positioning holes and the positioning pins correspond one by one.

[0018] A shock-absorbing mechanism is provided between the drawer and the support bottom plate.

[0019] A detection mechanism and a heat dissipation mechanism are provided on the cabinet body. Both the control mechanism and the detection mechanism are located in the upper part of the cabinet body. Moreover, the detection mechanism is electrically connected to the control mechanism, and the heat dissipation mechanism is provided on the top surface of the cabinet body.

[0020] The parts to be tested include LED lamps, digital tubes, relay contactors, thermal protectors, travel switches or buttons.

[0021] The test system provided by the present invention pre-stores test methods for various parts to be tested in the control mechanism, determines the types of parts to be tested according to the parameters of the test mechanism connected to the control mechanism, and performs tests according to the corresponding test methods, greatly improving the versatility of the test system. At the same time, the control mechanism is used to supply power and gas to all test structures, thereby simplifying the test structure into two parts: a fixture and an electric control mechanism, minimizing the complexity of the test structure. Moreover, positioning holes and positioning grooves are used to ensure the reliability of the docking between the test mechanism and the support base plate and the drawer, and a shock absorption mechanism is used to reduce the vibration noise generated by the parts to be tested during the test process. Description of the Drawings

[0022] Hereinafter, the present invention will be described in more detail based on embodiments with reference to the drawings.

[0023] Figure 1 It is a schematic structural diagram of the test system of the embodiment of the test system provided by the present invention.

[0024] Figure 2 It is a schematic structural diagram of the support base plate and the test structure of the embodiment of the test system provided by the present invention;

[0025] Figure 3 It is an exploded view of the support base plate and the test structure of the embodiment of the test system provided by the present invention;

[0026] Figure 4 It is a cross-sectional view of the support base plate and the test structure of the embodiment of the test system provided by the present invention;

[0027] In the drawings, the same components are denoted by the same reference numerals. The drawings are not drawn to actual scale.

[0028] 1. Cabinet; 11. Control mechanism; 12. Drawer; 2. First docking mechanism; 3. Gas source switch; 4. Support base plate; 5. Test structure; 51. Fixture; 52. Electric control mechanism; 53. Second docking mechanism; 6. Reset mechanism; 41. Wire box; 21. First conductive block; 531. Second conductive block; 121. Positioning pin; 7. Shock absorption mechanism. Detailed Embodiments

[0029] The present invention will be further described below with reference to the drawings.

[0030] As Figures 1 to 4As shown in the figure, the test system of the present invention includes: a cabinet body 1, on which a control mechanism 11 and a plurality of drawers 12 are provided. Each drawer 12 is provided with a first docking mechanism 2 and a gas source switch 3, and all the first docking mechanisms 2 and all the gas source switches 3 are connected to the control mechanism 11; a support bottom plate 4, which corresponds to the drawer 12 one by one, and the support bottom plate 4 is detachably arranged on the corresponding drawer 12. By using the detachable support bottom plate 4, it is convenient to quickly take out the parts to be tested from the drawer 12; a test structure 5, which is arranged on the support bottom plate 4, and a second docking mechanism 53 that cooperates with the first docking mechanism 2 is arranged on the test structure 5; the parts to be tested are arranged on the test structure 5. The control mechanism 11 supplies power to the test structure 5 and the parts to be tested through the corresponding second docking mechanism 53 and first docking mechanism 2, and the control mechanism 11 supplies gas to the parts to be tested through the corresponding gas source switch 3. When testing the parts to be tested, the parts to be tested are set on the test structure 5 outside the cabinet body 1 and placed in the drawer 12 together with the support bottom plate 4. During the process of putting the support bottom plate 4 in, the first docking mechanism 2 and the second docking mechanism 53 are docked and matched, and the gas source switch 3 on the drawer 12 is also connected to the parts to be tested, so as to realize the quick disassembly and assembly of the support bottom plate 4 and the test structure 5, complete the fixation, power supply and gas supply of the parts to be tested. At this time, the control mechanism 11 obtains the parameters of the test structure 5 to determine the type of the parts to be tested, and then the control mechanism 11 sends the corresponding test strategy to the test structure 5 for testing, overcoming the problems in the prior art that each type of electronic component needs to develop a separate test system, resulting in an increasing number of test devices, excessive functional redundancy and waste of idle resources.

[0031] A main switch is provided on the control mechanism 11, and a power switch for controlling whether the first docking mechanism 2 on the drawer 12 is connected to the control mechanism 11 is provided on each drawer 12. The control mechanism 11 can control the test process of the parts to be tested, and at the same time can monitor the test of the parts to be tested and the state of the parts to be tested after each test, and record and alarm to remind the experimenter when the parts to be tested are abnormal.

[0032] A control signal is transmitted between the control mechanism 11 and the test structure 5 by using a 458 bus. The test structure 5 on each drawer 12 is connected to the control mechanism 11 by a power supply line, and all the gas source switches 3 on the drawers 12 are connected in series and then connected to the control mechanism 11.

[0033] A touch screen is provided on the control mechanism 11, and the experimenter can directly obtain test data and alarm data on the touch screen.

[0034] The test structure 5 includes a fixture 51 and an electric control mechanism 52. The part to be tested is detachably arranged on the fixture 51. The second docking mechanism 53 is arranged on the electric control mechanism 52, and the electric control mechanism 52 is electrically connected to the control mechanism 11 through the second docking mechanism 53 and the first docking mechanism 2. The test structure 5 is simplified to only retain the fixture 51 for fixing the part to be tested and the electric control mechanism 52 for testing the part to be tested, and other functional modules of the test structure 5 in the prior art are all provided by the control mechanism 11, greatly improving the versatility of the life test device and simplifying the complexity of the test structure 5.

[0035] There are multiple types of the test structure 5, and each type of the test structure 5 corresponds to a type of the part to be tested. The control mechanism 11 is preset with test methods corresponding to all the test structures 5, effectively improving the versatility of the test system.

[0036] The test system further includes a reset mechanism 6. The reset mechanism 6 is arranged on the drawer 12. The first docking mechanism 2 is arranged on the reset mechanism 6, and the reset mechanism 6 has a tendency to move the first docking mechanism 2 towards the second docking mechanism 53. When the support base and the test structure 5 are placed above the drawer 12, the second docking mechanism 53 abuts against the first docking mechanism 2 during the falling process. The reset mechanism 6 is used to ensure the reliable connection between the first docking mechanism 2 and the second docking mechanism 53, thereby ensuring the reliability of the test.

[0037] A wire box 41 is arranged on the support bottom plate 4. The reset mechanism 6 and the first docking mechanism 2 are both arranged in the wire box 41. The first docking mechanism 2 protrudes from the first side surface of the wire box 41. The wire box 41 has a second side surface opposite to the first side surface. The wire of the first docking mechanism 2 penetrates through the second side surface and is electrically connected to the control mechanism 11, protecting and limiting the reset mechanism 6 and the first docking mechanism 2, and at the same time avoiding the wire from interfering with the test structure 5, so as to prevent damage to the reset mechanism 6, the first docking mechanism 2 and the wire when the support bottom plate 4 is installed and disassembled.

[0038] The reset mechanism 6 includes a spring. The first end of the spring abuts against the inner surface of the wire box 41. The first docking mechanism 2 is arranged at the second end of the spring, and when the first docking mechanism 2 cooperates with the second docking mechanism 53, the spring is in a compressed state.

[0039] The second docking mechanism 53 is provided with a guiding inclined surface. When the support bottom plate 4 is installed on the drawer 12, the first docking mechanism 2 moves under the guiding action of the guiding inclined surface, ensuring that the first docking mechanism 2 can smoothly abut against the second docking mechanism 53.

[0040] The first docking mechanism 2 includes a plurality of first conductive blocks 21. All the first conductive blocks 21 are respectively electrically connected to the control mechanism 11 through wires. The second docking mechanism 53 includes a plurality of second conductive blocks 531. All the second conductive blocks 531 on the same second docking mechanism 53 correspond one by one to all the first conductive blocks 21 on the corresponding first docking mechanism 2. Among them, the plurality of first conductive blocks 21 include signal wires for transmitting different signals and AC / DC power supply wires. The number of the first conductive blocks 21 is preferably 8.

[0041] The drawer 12 is provided with positioning pins 121, and the support bottom plate 4 is provided with positioning holes, and the positioning holes correspond one by one to the positioning pins 121. The positioning pins 121 and the positioning holes are used to ensure that the support bottom plate 4 can be installed at the set position of the drawer 12.

[0042] A shock-absorbing mechanism 7 is arranged between the drawer 12 and the support bottom plate 4. The shock-absorbing mechanism 7 is used to prevent vibrations generated by the parts to be tested during the test from being transmitted to the cabinet body 1 and causing problems such as noise.

[0043] The cabinet body 1 is provided with a detection mechanism and a heat dissipation mechanism. The control mechanism 11 and the detection mechanism are both located in the upper part of the cabinet body 1, and the detection mechanism is electrically connected to the control mechanism 11. The heat dissipation mechanism is arranged on the top surface of the cabinet body 1. The detection mechanism includes but is not limited to a temperature sensor, a smoke sensor, a vibration sensor, a humidity sensor, an electric energy meter, a gas flow meter, etc. The control mechanism 11 can obtain the data of the detection mechanism and perform corresponding operations or alarms. The heat dissipation mechanism is used to dissipate heat from the control mechanism 11 and the parts to be tested inside the cabinet body 1 to ensure the reliability of the test system.

[0044] The parts to be tested include LED lights, digital tubes, relay contactors, thermal protectors, travel switches or buttons.

[0045] The test process is as follows: Place the parts to be tested that need to undergo a life test in the corresponding test structure 5. Put the test structure 5 into any drawer 12 with a vacant position. After closing the drawer 12, the control mechanism 11 is connected through an 8-channel line, first powers the test structure 5 and then reads the ID number of the test structure 5, and then retrieves the test method corresponding to the ID number in the database, and the test can start.

[0046] Taking a contactor as an example, the lifespan of the contactor is tested. The contactor is fixed on the support base plate 4 through a fixture 51. At this time, the contactor is electrically connected to the electric control mechanism 52 on the support base plate 4. Then, the support base plate 4 is placed on the drawer 12, and with the cooperation of the positioning holes and the positioning pins 121, the first docking mechanism 2 and the second docking mechanism 53 are completed in cooperation. The air source switch 3 is also connected to the contactor. At this time, the power switch on the control mechanism 11 and the switch on the drawer 12 are turned on. The control mechanism 11 obtains the ID of the test structure 5 and retrieves the data for contactor control to test the contactor. At this time, the control mechanism 11 not only controls the on / off of the contactor but also monitors the number of tests and whether the on / off state each time is normal. When an abnormal situation occurs to the contactor, there will be a log record and an alarm to remind the experimenter. At the same time, because the contactor is large in size and has a large operating noise, the shock absorption mechanism 7 can effectively eliminate the noise.

[0047] Although the present invention has been described with reference to the preferred embodiments, various modifications can be made to it and components therein can be replaced with equivalents without departing from the scope of the present invention. In particular, as long as there is no structural conflict, the various technical features mentioned in each embodiment can be combined in any way. The present invention is not limited to the specific embodiments disclosed in the text but includes all technical solutions falling within the scope of the claims.

Claims

1. A test system, characterized in that, Including: A cabinet body (1), on which a control mechanism (11) and a plurality of drawers (12) are arranged. Each drawer (12) is provided with a first docking mechanism (2) and an air source switch (3), and all the first docking mechanisms (2) and all the air source switches (3) are connected to the control mechanism (11); A support bottom plate (4), which corresponds to the drawer (12) one by one, and the support bottom plate (4) is detachably arranged on the corresponding drawer (12); A test structure (5), which is arranged on the support bottom plate (4), and a second docking mechanism (53) that cooperates with the first docking mechanism (2) is arranged on the test structure (5); A part to be tested is arranged on the test structure (5). The control mechanism (11) supplies power to the test structure (5) and the part to be tested through the corresponding second docking mechanism (53) and first docking mechanism (2), and the control mechanism (11) supplies gas to the part to be tested through the corresponding air source switch (3); The test system further includes a reset mechanism (6), which is arranged on the drawer (12). The first docking mechanism (2) is arranged on the reset mechanism (6), and the reset mechanism (6) has a tendency to move the first docking mechanism (2) towards the second docking mechanism (53); Among them, during the test, the part to be tested is arranged on the test structure (5) outside the cabinet body (1) and is placed in the drawer (12) together with the support bottom plate (4). During the process of placing the support bottom plate (4), the first docking mechanism (2) and the second docking mechanism (53) are docked and matched, and the air source switch (3) on the drawer (12) is also communicated with the part to be tested.

2. The test system according to claim 1, wherein The test structure (5) includes a fixture (51) and an electric control mechanism (52). The part to be tested is detachably arranged on the fixture (51). The second docking mechanism (53) is arranged on the electric control mechanism (52), and the electric control mechanism (52) is electrically connected to the control mechanism (11) through the second docking mechanism (53) and the first docking mechanism (2).

3. The test system according to claim 1, wherein There are multiple types of the test structure (5), and each type of the test structure (5) corresponds to a type of the part to be tested. The control method corresponding to all the test structures (5) is preset in the control mechanism (11).

4. The test system according to claim 1, wherein A wire box (41) is arranged on the support bottom plate (4). The reset mechanism (6) and the first docking mechanism (2) are both arranged in the wire box (41), and the first docking mechanism (2) protrudes from the first side surface of the wire box (41) out of the wire box (41).

5. The test system according to claim 4, characterized in that, The wire box (41) has a second side surface opposite to the first side surface. The wire of the first docking mechanism (2) penetrates through the second side surface and is electrically connected to the control mechanism (11).

6. The test system according to claim 4, wherein The reset mechanism (6) includes a spring. The first end of the spring abuts against the inner surface of the wire box (41). The first docking mechanism (2) is arranged at the second end of the spring. When the first docking mechanism (2) cooperates with the second docking mechanism (53), the spring is in a compressed state.

7. The test system according to claim 1, wherein, The second docking mechanism (53) is provided with a guiding inclined surface. When the support bottom plate (4) is installed on the drawer (12), the first docking mechanism (2) moves under the guiding action of the guiding inclined surface.

8. The test system according to claim 1, wherein The first docking mechanism (2) includes a plurality of first conductive blocks (21). All the first conductive blocks (21) are electrically connected to the control mechanism (11) through wires respectively. The second docking mechanism (53) includes a plurality of second conductive blocks (531). All the second conductive blocks (531) on the same second docking mechanism (53) correspond to all the first conductive blocks (21) on the corresponding first docking mechanism (2) one by one.

9. The test system according to claim 1, wherein The drawer (12) is provided with a positioning pin (121). The support bottom plate (4) is provided with positioning holes, and the positioning holes correspond to the positioning pins (121) one by one.

10. The test system according to claim 1, wherein A shock absorption mechanism (7) is arranged between the drawer (12) and the support bottom plate (4).

11. The test system according to claim 1, wherein The cabinet body (1) is provided with a detection mechanism and a heat dissipation mechanism. The control mechanism (11) and the detection mechanism are both located in the upper part of the cabinet body (1). The detection mechanism is electrically connected to the control mechanism (11). The heat dissipation mechanism is arranged on the top surface of the cabinet body (1).

12. The test system according to claim 1, wherein The parts to be tested include LED lights, digital tubes, relay contactors, thermal protectors, travel switches or buttons.

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