Storage device testing method, testing system and testing carrier
By using a combination of multiple test carrier boards and indicator speakers in the storage device testing, corresponding operations are performed according to the program data type in the storage device, the problems of low testing efficiency and waste of resources in the prior art are solved, and efficient Low-cost testing method.
Patent Information
- Application Number
- CN202011566035.3
- Authority / Receiving Office
- CN · China
- Patent Type
- Patents(China)
- Current Assignee / Owner
- Filing Date
- 2020-12-25
- Publication Date
- 2025-01-17
- Estimated Expiration
- 2040-12-25
AI Technical Summary
The prior art has problems such as insufficient bandwidth, wasted resources, complex interactions and error-prone in storage device testing, and the PC takes up a large space.
A method for testing a storage device is provided. Multiple test carrier boards are placed on the same test rack to test the storage device respectively. The method includes detecting whether there is program data in the storage device, performing corresponding operations on the test carrier board according to the data type, or directly testing the storage device. Indicators and speakers are set on the test carrier board to feedback test status and abnormal information.
Improves the efficiency and cost-effectiveness of storage device testing, simplifies operational processes, and reduces space occupancy.
Smart Images

Figure CN112652353B_ABST
Abstract
Description
Technical Field
[0001] The present application relates to the technical field of storage device testing, and in particular to a storage device testing method, a testing system, a testing carrier board, and a computer-readable storage medium. Background Art
[0002] Currently, storage device testing is usually performed using a PC (Personal Computer), and the storage device is tested and corresponding test data is obtained through an application program in the PC.
[0003] The disadvantages are that when a single PC runs multiple test projects at the same time, it will face insufficient bandwidth, resulting in reduced speed; when a single PC only runs one test project, there will be serious waste of resources; and the interaction during the test process is more complicated and prone to errors; the PC takes up a lot of space, etc. Summary of the invention
[0004] The main technical problem solved by the present application is to provide a test method, a test system and a test carrier for a storage device, which can ensure the test efficiency.
[0005] A technical solution adopted in the present application is to provide a testing method for a storage device, which is applied to a test carrier, and multiple test carriers are placed on the same test rack for testing a storage device respectively. The method includes: when detecting that a first storage device is connected, detecting whether there is program data in the first storage device; if so, performing corresponding operations on the test carrier based on the type of the program data; if not, testing the first storage device.
[0006] Among them, based on the type of program data, corresponding operations are performed on the test carrier, including: if the type of program data is an update type program, using the program data to update the test program in the test carrier; if the type of program data is a copy type program, using the program data to copy the test log in the test carrier to copy the test log to the first storage device.
[0007] The updating operation of the test program in the test carrier board using the program data includes: decrypting the program data; verifying the decrypted program data; and updating the test program in the test carrier board using the program data after the verification passes.
[0008] Wherein, an indicator light and a speaker are arranged on the test carrier; the method further comprises: when the program data verification fails, controlling the indicator light to be in a first state and the speaker to emit a prompt sound to prompt that the program data is abnormal.
[0009] Among them, testing the first storage device includes: when testing the first storage device, using the state of the indicator light on the test carrier to provide test feedback; when abnormal information is detected, controlling the indicator light to be in the first state and the speaker to emit a prompt sound to prompt the test abnormality.
[0010] The method further includes: when no abnormal information is detected, controlling the indicator light to be in a second state to indicate that the test is normal.
[0011] Among them, when abnormal information is detected, the control indicator light is in the first state and the speaker emits a prompt sound to prompt the test abnormality, including: when it is detected that the second storage device is connected, whether there is copy-type program data in the second storage device; if so, the test log in the test carrier is copied to the second storage device.
[0012] Another technical solution adopted in the present application is to provide a test carrier, which includes: an interface for connecting to an external storage device; a memory for storing program data; a processor, connected to the memory and used to connect to the external storage device through the interface to execute program data and implement the method provided by the above technical solution.
[0013] Another technical solution adopted in the present application is to provide a test system for a storage device, the test system comprising: a test rack; a plurality of test carriers placed on the test rack for testing a storage device respectively; wherein each test carrier is a test carrier provided by the above technical solution.
[0014] Another technical solution adopted by the present application is to provide a computer-readable storage medium, which is used to store program data. When the program data is executed by a processor, it is used to implement the method provided by the above technical solution.
[0015] The beneficial effects of the present application are as follows: Different from the prior art, the present application provides a method for testing a storage device, the method is applied to a test carrier, and multiple test carriers are placed on the same test rack for testing a storage device respectively, the method comprising: when detecting that a first storage device is connected, detecting whether there is program data in the first storage device; if so, performing corresponding operations on the test carrier based on the type of program data; if not, testing the first storage device. In the above manner, multiple test carriers are placed on the test rack to test the storage devices respectively, which can ensure test efficiency, low test cost, and high space utilization; using the storage device as an input device to operate the test carrier can reduce the operation process, and compared with the input and output devices in the prior art, it occupies less space. BRIEF DESCRIPTION OF THE DRAWINGS
[0016] In order to more clearly illustrate the technical solutions in the embodiments of the present application, the following briefly introduces the drawings required for use in the description of the embodiments. Obviously, the drawings described below are only some embodiments of the present application. For ordinary technicians in this field, other drawings can be obtained based on these drawings without creative work. Among them:
[0017] Figure 1 is a structural schematic diagram of an embodiment of a test system for a storage device provided by the present application;
[0018] Figure 2 It is a structural schematic diagram of an embodiment of a test rack in a test system for a storage device provided by the present application;
[0019] Figure 3 This application provides Figure 1 Schematic diagram of the structure of each layer of the test rack;
[0020] Figure 4 It is a flowchart of an embodiment of a method for testing a storage device provided by the present application;
[0021] Figure 5 is a flow chart of another embodiment of the storage device testing method provided by the present application;
[0022] Figure 6 This application provides Figure 5 Specific flow diagram of step 52;
[0023] Figure 7 is a structural schematic diagram of an embodiment of a test carrier provided by the present application;
[0024] Figure 8 It is a structural schematic diagram of an embodiment of a computer-readable storage medium provided by the present application. DETAILED DESCRIPTION
[0025] The technical solutions in the embodiments of the present application will be clearly and completely described below in conjunction with the drawings in the embodiments of the present application. It will be understood that the specific embodiments described herein are only used to explain the present application, rather than to limit the present application. It should also be noted that, for ease of description, only some but not all structures related to the present application are shown in the drawings. Based on the embodiments in the present application, all other embodiments obtained by ordinary technicians in the field without making creative work are within the scope of protection of the present application.
[0026] Reference to "embodiments" herein means that a particular feature, structure, or characteristic described in conjunction with the embodiments may be included in at least one embodiment of the present application. The appearance of the phrase in various locations in the specification does not necessarily refer to the same embodiment, nor is it an independent or alternative embodiment that is mutually exclusive with other embodiments. It is explicitly and implicitly understood by those skilled in the art that the embodiments described herein may be combined with other embodiments.
[0027] See also Figure 1 , Figure 1 1 is a schematic diagram of a storage device test system according to an embodiment of the present invention. The test system 10 includes a test rack 11 and a plurality of test carriers 12 .
[0028] Among them, multiple test carriers 12 are placed on the test rack 11. The test rack 11 is also provided with a power supply for supplying power to the multiple test carriers 12. The test carrier 12 is provided with an interface connected to the storage device, which is used to test the storage device when communicating with the storage device.
[0029] In some embodiments, the test rack 11 adopts a stacked design, and each layer of the test rack 11 can be provided with a plurality of test carriers 12 .
[0030] In one application scenario, combined with Figure 2 and Figure 3 The test system is described as follows: the test rack 11 is set to 6 layers, and each layer can be provided with a plurality of test carriers 12. Specifically, the size of the test rack 11 is 50cm*50cm*175cm, and the size of the test carrier 12 is designed to be 8.5cm*8.5cm. In this way, considering the necessary intervals for test interference, each layer of the test rack 11 can be provided with a maximum of 16 test carriers, which can be specifically arranged as follows: Figure 3 4*4 matrix setup shown.
[0031] Therefore, in Figure 2 The test rack 11 shown can be provided with 96 test carriers 12 , and each test carrier 12 can test a storage device, so a maximum of 96 storage devices can be tested simultaneously.
[0032] In some embodiments, the sizes of the test frame 11 and the test carrier 12 can be set according to actual needs.
[0033] In some embodiments, an indicator light and a speaker are provided on the test carrier 12, which can be used to provide status feedback on the test of the storage device. According to different test states, the indicator light displays different states accordingly.
[0034] In other embodiments, the test system 10 includes two special storage devices, and different types of program data are stored in the two storage devices. For example, the first storage device is used to store update program data, which is used to update the program data in the test carrier 12 when connected to the test carrier 12. The second storage device is used to store copy program data, which is used to copy the test log in the test carrier 12 when connected to the test carrier 12.
[0035] See also Figure 4 , Figure 4 The method of this embodiment is applied to a test carrier, and multiple test carriers are placed on the same test rack to test a storage device respectively.
[0036] Specifically, the test carrier may be the test carrier 12 in the above embodiment. The test rack may be the test rack 11 in the above embodiment.
[0037] The method includes:
[0038] Step 41: When it is detected that the first storage device is connected, detect whether there is program data in the first storage device.
[0039] In some embodiments, the test carrier is provided with an interface, which is connected to an interface of the first storage device to complete data interaction. In other embodiments, the interface of the first storage device of different types can be adapted by an extension cable.
[0040] In some embodiments, the first storage device may be a hard disk, such as a mechanical hard disk, a solid-state hard disk, a mobile hard disk, etc., or may be a CF (Compact Flash) card, a flash memory card, a USB flash drive, etc.
[0041] In this embodiment, the program data may be script data for performing corresponding operations on the data in the test carrier. If it is detected that there is program data in the first storage device, step 42 is executed. If it is detected that there is no program data in the first storage device, step 43 is executed.
[0042] Step 42: Based on the type of program data, perform corresponding operations on the test carrier.
[0043] In some embodiments, the type of program data may be an update program, such as program data for updating the firmware program of the test carrier. The type of program data may be a copy program, such as copying the test log and program data of the test carrier.
[0044] Step 43: Test the first storage device.
[0045] In some embodiments, the software performance and hardware performance of the first storage device may be tested, such as testing the read and write speed, testing whether the hardware function is defective, etc.
[0046] In this embodiment, the method is applied to a test carrier, and multiple test carriers are placed on the same test rack to test a storage device respectively. When detecting that the first storage device is connected, it is detected whether there is program data in the first storage device; if so, based on the type of the program data, the test carrier is operated accordingly; if not, the first storage device is tested. In this way, multiple test carriers are placed on the test rack to test the storage devices respectively, which can ensure test efficiency, low test cost, and high space utilization; using the storage device as an input device to operate the test carrier can reduce the operation process and occupy less space than the input and output devices in the prior art.
[0047] See also Figure 5 , Figure 5 1 is a flow chart of another embodiment of a method for testing a storage device provided by the present application. The method comprises:
[0048] Step 51: When it is detected that the first storage device is connected, detect whether there is program data in the first storage device.
[0049] When it is detected that there is program data in the first storage device, step 52 or step 53 is executed according to the type of the program data.
[0050] When it is detected that there is no program data in the first storage device, step 54 is executed.
[0051] Step 52: If the type of the program data is an update program, use the program data to update the test program in the test carrier.
[0052] In this embodiment, after the storage device for testing the test carrier is changed in type, the test program of the test carrier needs to be updated accordingly. The program data is stored in a first storage device, the first storage device is connected to the test carrier, and the test program in the test carrier is updated using the program data. For example, the current test program in the test carrier can test items A, B, C, D, and E, while the items that the storage device for the next test needs to test are A, B, C, D, E, and F. The test program in the test carrier is updated using the program data of the first storage device, so that the test program in the test carrier can test items A, B, C, D, E, and F.
[0053] In other embodiments, the program data and the test program data in the first storage device are stored separately, and when the program data is started, the test program in the test carrier is updated by calling the test program data. The program data and the test program can also be directly copied to the test carrier, and then the program data is started, so that the test program data updates the test program in the test carrier.
[0054] In some embodiments, see Figure 6 , step 52 may be as follows:
[0055] Step 521: Decrypt the program data.
[0056] In some embodiments, in order to ensure the security of the program data, the program data is encrypted, and when the test carrier detects the program data, the program data is decrypted.
[0057] Specifically, the program data in the first storage device can be copied to the test carrier and then decrypted, or the decryption key can be sent to the first storage device so that the first storage device decrypts the program data using the decryption key. In other embodiments, the decrypted program data is copied to the test carrier.
[0058] Step 522: Verify the decrypted program data.
[0059] By verifying the decrypted program data, the security of the program data can be guaranteed.
[0060] For example, when using algorithms such as MD5 (Message Digest Algorithm MD5), SHA (Secure Hash Algorithm), and MAC (Message Authentication Codes) to generate a text file that matches the file and stores the corresponding value when the program data is generated, if the MD5 algorithm is used, a text file with an MD5 value will be generated accordingly. The MD5 value can be an unordered and unique string.
[0061] If the program data is modified afterwards, the corresponding text file will also be changed and a new text file will be generated. Then the verification can be performed based on the original text file.
[0062] Step 523: After the verification is passed, the test program in the test carrier is updated using the program data.
[0063] In some embodiments, the test carrier is provided with an indicator light and a speaker. When the program data verification fails, the indicator light is controlled to be in a first state and the speaker emits a prompt sound to prompt that the program data is abnormal.
[0064] In other embodiments, different states of the indicator light can be used to determine whether an abnormality occurs when updating the test program in the test carrier. If no abnormality occurs, the indicator light is always on, and if an abnormality occurs, the indicator light is controlled to flash to indicate an abnormality occurs during the update.
[0065] Step 53: If the type of the program data is a copy type program, use the program data to perform a copy operation on the test log in the test carrier to copy the test log to the first storage device.
[0066] Step 54: Test the first storage device.
[0067] In some embodiments, when testing the first storage device, the state of the indicator light on the test carrier is used to provide test feedback; when abnormal information is detected, the indicator light is controlled to be in the first state and the speaker emits a prompt sound to indicate that the test is abnormal. When no abnormal information is detected, the indicator light is controlled to be in the second state to indicate that the test is normal. If no abnormality occurs, the indicator light is always on, and if an abnormality occurs, the indicator light is controlled to flash to indicate that the test is abnormal.
[0068] In one application scenario, when abnormal information is detected, the control indicator light and the speaker emit a prompt sound to prompt the test abnormality. After that, the user can unplug the first storage device and then connect the test carrier to the second storage device. When the connection of the second storage device is detected, it is detected whether there is a copy-type program data in the second storage device; if so, the test log in the test carrier is copied to the second storage device. The second storage device can be a USB flash drive.
[0069] In other embodiments, the test carrier may store test programs for different types of storage devices, and when detecting that the storage device is connected, if there is no program data in the storage device, the identification information of the storage device is obtained, and the type of the storage device is determined by the identification information. Then, the corresponding test program is determined according to the type, and then the storage device is tested using the test program.
[0070] In other embodiments, the test carrier may store test programs for different types of storage devices. When it is detected that the storage device is connected, if there is program data in the storage device, the type of the program data is determined. If the type is an update program, the type of the storage device corresponding to the program data is obtained, and then the corresponding target test program is determined based on the type, and then the target test program is updated using the program data.
[0071] In one application scenario, two indicator lights and a buzzer are provided on the test carrier, wherein the first indicator light is a two-color light, such as yellow and green, and the second indicator light is a single-color light, such as red.
[0072] When the test carrier starts normally, the first indicator light is always yellow. When a storage device is detected, the first indicator light flashes yellow. It is determined that there is program data in the storage device. If the program data is an update program, it is decrypted and verified. If the verification fails, the second indicator light flashes red, the buzzer sounds, and the first indicator light turns off. If the verification passes, the program data will copy the test program in the storage device to the corresponding file of the test carrier. After the verification, the first indicator light changes to always green. Then the storage device is unplugged, and the first indicator light changes to always yellow.
[0073] If it is determined that there is no program data in the storage device, the storage device is tested using a test program. At this time, the first indicator light is flashing yellow. After the test is completed, if there is no error information, the first indicator light is always green, otherwise the first indicator light is off, the second indicator light is flashing red, and the buzzer sounds. Then the storage device is unplugged, and the first indicator light is always yellow.
[0074] When the second indicator light flashes red and the buzzer sounds, replace the storage device with the copy program data and copy the test log at the corresponding position in the test carrier to the storage device. At this time, the first indicator light flashes yellow. After the copy is completed, the first indicator light turns green and stays on.
[0075] In this embodiment, compared with the prior art, these tests require the use of a mouse and keyboard as input devices, and each run requires repeated configuration. In this embodiment, the input device used in the test process is only a storage device, and the output devices include an indicator light, a speaker, and a storage device. The operation logic is simpler than that of a traditional PC, which is convenient for users to operate.
[0076] See also Figure 7 , Figure 7 1 is a schematic diagram of the structure of an embodiment of a test carrier provided by the present application. The test carrier 70 includes an interface 71 , a processor 72 and a memory 73 .
[0077] The interface 71 is used to connect to an external storage device; the memory 73 is used to store program data; the processor 72 is connected to the memory 73 and is used to connect to the external storage device through the interface 71 to execute the program data, and implement the following method:
[0078] When the connection of the first storage device is detected, whether there is program data in the first storage device is detected; if yes, corresponding operations are performed on the test carrier based on the type of the program data; if no, the first storage device is tested.
[0079] It can be understood that the processor 72 in this embodiment can also implement any method of the above embodiments, which will not be described in detail here.
[0080] In some embodiments, the test carrier 70 is also provided with indicator lights, speakers, etc., which are respectively connected to the processor 72 for working under the control of the processor 72.
[0081] The test carrier 70 of the present embodiment implements the above method to place multiple test carriers on the test rack and test the storage devices separately, which can ensure test efficiency, low test cost and high space utilization; using the storage device as an input device to operate the test carrier can reduce the operation process and occupy less space than the input and output devices in the prior art.
[0082] The test carrier 70 may be the test carrier in any of the above embodiments.
[0083] See also Figure 8 , Figure 8 1 is a schematic diagram of a computer-readable storage medium according to an embodiment of the present application. The computer-readable storage medium 80 is used to store program data 81. When the program data 81 is executed by a processor, it is used to implement the following method:
[0084] When the connection of the first storage device is detected, whether there is program data in the first storage device is detected; if yes, corresponding operations are performed on the test carrier based on the type of the program data; if no, the first storage device is tested.
[0085] It can be understood that the computer-readable storage medium 80 in this embodiment can also implement any method of the above embodiments, which will not be described in detail here.
[0086] When the computer-readable storage medium 80 of this embodiment is applied to the above-mentioned test carrier, the above-mentioned method is implemented, and multiple test carriers are placed on the test rack to test the storage devices separately, which can ensure test efficiency, low test cost, and high space utilization; using the storage device as an input device to operate the test carrier can reduce the operation process and occupy less space compared to the input and output devices in the prior art.
[0087] In the several embodiments provided in this application, it should be understood that the disclosed methods and devices can be implemented in other ways. For example, the device implementation described above is only illustrative, for example, the division of the above modules or units is only a logical function division, and there may be other division methods in actual implementation, such as multiple units or components can be combined or integrated into another system, or some features can be ignored or not executed.
[0088] The units described above as separate components may or may not be physically separated, and the components shown as units may or may not be physical units, that is, they may be located in one place or distributed on multiple network units. Some or all of the units may be selected according to actual needs to achieve the purpose of this embodiment.
[0089] In addition, each functional unit in each embodiment of the present application may be integrated into one processing unit, or each unit may exist physically separately, or two or more units may be integrated into one unit. The above-mentioned integrated unit may be implemented in the form of hardware or in the form of software functional units.
[0090] If the integrated units in the above other embodiments are implemented in the form of software functional units and sold or used as independent products, they can be stored in a computer-readable storage medium. Based on this understanding, the technical solution of the present application is essentially or the part that contributes to the prior art or all or part of the technical solution can be embodied in the form of a software product, and the computer software product is stored in a storage medium, including a number of instructions to enable a computer device (which can be a personal computer, server, or network device, etc.) or a processor (processor) to perform all or part of the steps of the method described in each embodiment of the present application. The aforementioned storage medium includes: U disk, mobile hard disk, read-only memory (ROM, Read-Only Memory), random access memory (RAM, RandomAccess Memory), disk or optical disk and other media that can store program codes.
[0091] The above description is only an implementation method of the present application, and does not limit the patent scope of the present application. Any equivalent structure or equivalent process transformation made using the contents of the present application specification and drawings, or directly or indirectly used in other related technical fields, are also included in the patent protection scope of the present application.
Claims
1. A method for testing a storage device, characterized in that: The method is applied to a test carrier, and a plurality of the test carriers are placed on the same test rack for testing a storage device respectively. The method comprises: When detecting that the first storage device is connected, detecting whether the first storage device has program data; If yes, then based on the type of the program data, perform corresponding operations on the test carrier; If not, testing the first storage device; The performing corresponding operations on the test carrier based on the type of the program data includes: If the type of the program data is an update program, using the program data to update the test program in the test carrier; If the type of the program data is a copy type program, the program data is used to perform a copy operation on the test log in the test carrier, so as to copy the test log to the first storage device.
2. The method according to claim 1, characterized in that The updating operation of the test program in the test carrier board by using the program data includes: decrypting the program data; Verifying the decrypted program data; After the verification is passed, the test program in the test carrier is updated using the program data.
3. The method according to claim 2, characterized in that The test carrier is provided with an indicator light and a speaker; The method further comprises: When the program data verification fails, the indicator light is controlled to be in the first state and the speaker emits a prompt sound to prompt that the program data is abnormal.
4. The method according to claim 1, characterized in that: The testing of the first storage device includes: When testing the first storage device, providing test feedback using the state of the indicator light on the test carrier; When abnormal information is detected, the control indicator light is in the first state and the speaker emits a prompt sound to prompt the test abnormality.
5. The method according to claim 4, characterized in that The method further comprises: When no abnormal information is detected, the control indicator light is in the second state to indicate that the test is normal.
6. The method according to claim 4, characterized in that When abnormal information is detected, the indicator light is controlled to be in the first state and the speaker emits a prompt sound to prompt the test abnormality, which includes: When detecting that the second storage device is connected, detecting whether there is program data of the copy type in the second storage device; If yes, a copy operation is performed on the test log in the test carrier to copy the test log to the second storage device.
7. A test carrier, characterized in that: The test carrier comprises: An interface for connecting an external storage device; A memory for storing program data; A processor is connected to the memory and is used to connect to the external storage device through the interface to execute the program data and implement the method according to any one of claims 1 to 6.
8. A testing system, characterized in that: The test system comprises: Test rack; A plurality of test carriers are placed on the test rack and are used to test a storage device respectively; wherein each test carrier is the test carrier as claimed in claim 7.
9. A computer-readable storage medium, characterized in that: The computer-readable storage medium is used to store program data, and when the program data is executed by a processor, it is used to implement the method according to any one of claims 1 to 6.
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