A device and method for measuring micro-mass in a microgravity environment

Abstract

The present invention belongs to the field of aerospace technology, and specifically relates to a device and method for measuring micro-mass in a microgravity environment. The technical solution is: a device for measuring micro-mass in a microgravity environment, including a sealing cover, a base is arranged inside the sealing cover, a motion guide mechanism is installed on the base, the other end of the motion guide mechanism is connected to a test platform, piezoelectric films are arranged at both ends of the test platform, a loading device is installed on the piezoelectric film, one loading device is loaded with a substance to be tested of unknown mass, and the other loading device is loaded with a reference substance of known mass. The present invention provides a device and method for measuring micro-mass in a microgravity environment with high measurement accuracy.

Description

Technical Field

[0001] The present invention belongs to the field of aerospace technology, and in particular relates to a device and method for measuring micro-mass in a microgravity environment. Background Art

[0002] The existing methods for measuring tiny masses in a microgravity environment include: using thrusters to generate dynamic acceleration to measure the mass of a substance, using centrifugal force to measure the mass of a substance, and using vibration to measure the mass of a substance. Among them, when using thrusters to generate dynamic acceleration, the measurement cost is relatively high. Using the centrifugal method to measure the mass of a substance takes a long time. Using the vibration method to measure the mass of a substance, its measurement accuracy and sensitivity are difficult to guarantee. Summary of the invention

[0003] In order to solve the above problems existing in the prior art, the present invention aims to provide a device and method for measuring tiny masses in a microgravity environment with high measurement accuracy.

[0004] The technical solution adopted by the present invention is:

[0005] A device for measuring tiny masses in a microgravity environment comprises a sealing cover, a base is arranged inside the sealing cover, a motion guide mechanism is installed on the base, the other end of the motion guide mechanism is connected to a test platform, piezoelectric films are arranged at both ends of the test platform, loading devices are installed on the piezoelectric films, one of the loading devices is loaded with a substance to be tested of unknown mass, and the other loading device is loaded with a reference substance of known mass.

[0006] The present invention is a device for measuring tiny masses by applying Newton's second law of motion in an on-orbit microgravity environment. The present invention uses a known reference mass to compare and test an unknown mass to be measured, and measures the mass of a tiny mass material in a microgravity environment by measuring a voltage or frequency shift that is linearly related to the deformation of a piezoelectric film. Compared with a measurement method that uses a thruster to generate dynamic acceleration, the measurement cost is low, compared with a centrifugal force method test solution, the test time is short, and compared with a vibration method test solution, the measurement accuracy and sensitivity are high.

[0007] The instantaneous force provided by the motion guide mechanism can make the test platform and all the components on it in the same motion acceleration field. According to Newton's second law of motion, the piezoelectric film between the test platform and the two loading devices will produce corresponding deformation, which is reflected by the voltage or frequency shift that is linearly related to the force. The ratio calculation replaces the monitoring of the output transient force of the motion guide mechanism, and then the mass of the unknown substance to be tested is solved.

[0008] As a preferred solution of the present invention, the motion guide mechanism is at 90 degrees to the test platform. During measurement, when the motion guide mechanism drives the test platform to move, the pressure on the piezoelectric films at both ends is perpendicular to the piezoelectric films, ensuring that the deformation of the piezoelectric films is more stable and the output voltage or frequency shift is more accurate.

[0009] As a preferred embodiment of the present invention, the motion guide mechanism includes a guide cylinder, which is fixed on the base, a guide rod is sleeved in the guide cylinder, and the other end of the guide rod is connected to the test platform; a spring is connected between the guide rod and the guide cylinder, and an anti-skew rod is also fixed in the guide cylinder, the anti-skew rod is sleeved in the spring, and the other end of the anti-skew rod is sleeved in the guide rod. When the guide rod is pushed upward by the spring, the guide rod drives the test platform and the two loading devices to move. The guide cylinder can limit the guide rod to ensure that the guide rod moves in a straight line, thereby improving the accuracy of the measurement.

[0010] As a preferred solution of the present invention, a locking mechanism for locking the guide rod is connected inside the guide cylinder. Before measuring, the guide rod is locked by the locking mechanism so that the spring is in a compressed state, which facilitates the release of the spring during measurement. During measurement, the guide rod is unlocked, and the test platform is pushed up during the process of the spring recovering its deformation.

[0011] As a preferred embodiment of the present invention, a limiting ring is fixed at the bottom of the guide rod, a limiting step for blocking the limiting ring is provided at the upper end of the guide cylinder, and a vibration-damping ring is fixed on the side of the limiting step facing the limiting ring. The vibration-damping ring on the limiting step can reduce vibration and limit the guide rod. When the limiting ring on the guide rod touches the vibration-damping ring and the spring has not yet completely recovered its deformation, the vibration generated by the spring is small, which correspondingly improves the stability of the test platform and the loading device and improves the measurement accuracy.

[0012] As a preferred embodiment of the present invention, the loading device includes a universal tooling fixture, which is installed on the piezoelectric film, and is respectively provided with a wireless power receiving module and a high-voltage rectifier module, and the wireless power receiving module and the high-voltage rectifier module are electrically connected; an inverted arch base is provided in the inner sleeve of the universal tooling fixture, an inverted arch electrostatic adsorption module is fixed in the inverted arch base, a plug-in connector is connected between the inverted arch electrostatic adsorption module and the high-voltage rectifier module, and a sample tank is provided in the inner sleeve of the inverted arch electrostatic adsorption module of the inverted arch base; a wireless charging module for charging the wireless power receiving module is installed on the test platform.

[0013] The substance to be tested is placed in a sample tank, and the sample tank is installed in the inverted arch base. The wireless power receiving module transmits electrical energy to the high-voltage rectifier module, and the high-voltage rectifier module supplies power to the inverted arch electrostatic adsorption module in the inverted arch base through the plug-in connector. The substance in the sample tank is affected by the inverted arch electrostatic adsorption module and adsorbed on the inner wall of the sample tank by electrostatic induction or dielectric polarization, thereby ensuring that the substance to be tested and the sample tank remain relatively still, improving the measurement accuracy during quality testing.

[0014] Among them, when the substance to be tested is a conductive substance, the substance to be tested generates an electrostatic reaction under the action of the electric field of the inverted arch-shaped electrostatic adsorption module; when the substance to be tested is a non-conductive substance, the substance to be tested generates dielectric polarization under the action of the electric field of the inverted arch-shaped electrostatic adsorption module.

[0015] As a preferred embodiment of the present invention, the sample tank includes a sample tank body, which is sleeved in an inverted arch electrostatic adsorption module of an inverted arch base, one end of the sample tank body is connected to a piston core rod, and the other end of the sample tank body is connected to a suction nozzle, which is sealed with a rubber plug. For a tiny mass to be measured that needs to be measured on-orbit in a microgravity environment, the material to be measured is sucked into the sample tank through the suction nozzle at the front end of the sample tank body, and the suction nozzle is sealed with a rubber plug. After the material is loaded, the sample tank can be installed in the inverted arch base.

[0016] As a preferred embodiment of the present invention, the plug-in connector includes a power supply connector, which is installed on an inverted arch base, and is electrically connected to the inverted arch electrostatic adsorption module. The universal fixture is provided with a power supply socket for plugging the power supply connector, and the power supply socket is electrically connected to the high-voltage rectifier module. When the inverted arch is installed into the groove of the universal fixture, the power supply connector on the inverted arch base is inserted into the power supply socket on the universal fixture, and the high-voltage rectifier module can be delivered to the arch electrostatic module through the plug-in connector.

[0017] As a preferred solution of the present invention, a plurality of electromagnetic adsorption modules are installed at the bottom of the universal fixture, which can keep the universal fixture in contact with the mass measurement platform without separation, thereby improving the measurement accuracy of mass measurement in a microgravity environment.

[0018] A method for measuring micro-mass in a microgravity environment comprises the following steps:

[0019] S1: Place a reference substance with a known mass into one of the sample cans, place a test substance with an unknown mass into another sample can, place the two sample cans into loading devices respectively, and install the two loading devices at both ends of the test platform;

[0020] S2: The entire mass measurement device is powered on, the electromagnetic adsorption module at the bottom of the loading device is activated, and the universal fixture in the loading device is adsorbed to the test platform;

[0021] S3: After the mass measurement device is powered on, the inverted arch-shaped electrostatic adsorption module is powered on and works to adsorb the non-rigid substances to be tested inside the sample tanks on the left and right sides by electrostatic adsorption or dielectric polarization;

[0022] S4: Start the motion guide mechanism, and the data processing software calculates the mass of the substance to be tested through ratio calculation.

[0023] The beneficial effects of the present invention are:

[0024] 1. The universal fixture and sample tank of the present invention realizes the approximately rigid body processing of the small mass of the tested material in the microgravity environment, ensuring that the test accuracy is not affected by the floating of the tested material.

[0025] 2. The present invention uses a space balance to offset the measurement of the transient force output by the motion guide mechanism or the transient motion acceleration of the test platform through ratio calculation, thereby effectively reducing the test error.

[0026] 3. The motion guide mechanism is used to output transient force to provide motion acceleration to the test platform and its components, saving fuel energy and reducing test costs.

[0027] 4. The electromagnetic adsorption module is used to output a small preload force to ensure that the test platform and its components have the same acceleration, thus improving the test accuracy. BRIEF DESCRIPTION OF THE DRAWINGS

[0028] Figure 1 It is a schematic diagram of the structure of the present invention;

[0029] Figure 2 It is a structural schematic diagram of the motion guiding mechanism;

[0030] Figure 3 yes Figure 2 A partial enlarged view of the middle A;

[0031] Figure 4 It is a structural schematic diagram of the loading device.

[0032] In the figure, 1-sealing cover; 2-base; 3-motion guide mechanism; 4-test platform; 5-loading device; 31-guide cylinder; 32-guide rod; 33-spring; 34-locking mechanism; 35-anti-skew rod; 41-piezoelectric film; 51-universal tooling fixture; 52-inverted arch base; 53-mating connector; 54-sample tank; 311-limiting step; 312-vibration damping ring; 321-limiting ring; 341-electromagnetic relay; 342-electromagnet; 343-connecting spring; 344-blocking column; 511-wireless power receiving module; 512-high voltage rectifier module; 513-electromagnetic adsorption module; 521-inverted arch electrostatic adsorption module; 531-power supply connector; 532-power supply socket; 541-sample tank body; 542-piston core rod; 543-nozzle; 544-rubber plug. DETAILED DESCRIPTION

[0033] Embodiments of the present invention are described in detail below, examples of which are shown in the accompanying drawings, wherein the same or similar reference numerals throughout represent the same or similar elements or elements having the same or similar functions. The embodiments described below with reference to the accompanying drawings are exemplary and are intended to be used to explain the present invention, and should not be construed as limiting the present invention.

[0034] like Figure 1 As shown, the micro-mass measuring device in a microgravity environment of this embodiment includes a sealing cover 1, a base 2 is arranged in the sealing cover 1, a motion guide mechanism 3 is installed on the base 2, the other end of the motion guide mechanism 3 is connected to a test platform 4, piezoelectric films 41 are arranged at both ends of the test platform 4, and loading devices 5 are installed on the piezoelectric films 41, one of the loading devices 5 is loaded with a substance to be tested of unknown mass, and the other loading device 5 is loaded with a reference substance of known mass.

[0035] The present invention is a device for measuring tiny masses by applying Newton's second law of motion in an on-orbit microgravity environment. The present invention uses a known reference mass to compare and test an unknown mass to be measured, and measures the mass of a tiny mass material in a microgravity environment by measuring a voltage or frequency shift that is linearly related to the deformation of a piezoelectric film 41. Compared with a measurement method that uses a thruster to generate dynamic acceleration, the measurement cost is low, compared with a centrifugal force method test solution, the test time is short, and compared with a vibration method test solution, the measurement accuracy and sensitivity are high.

[0036] The instantaneous force provided by the motion guide mechanism 3 can make the test platform 4 and all the components thereon in the same motion acceleration field. According to Newton's second law of motion, the piezoelectric film 41 between the test platform 4 and the two loading devices 5 will produce corresponding deformation, which is reflected by the voltage or frequency shift that is linearly related to the force. The ratio calculation replaces the monitoring of the output transient force of the motion guide mechanism 3, and then the mass of the unknown substance to be tested is solved.

[0037] It should be noted that: the motion guide mechanism 3 is at 90° to the test platform 4. During measurement, when the motion guide mechanism 3 drives the test platform 4 to move, the pressure on the piezoelectric film 41 at both ends is perpendicular to the piezoelectric film 41, ensuring that the deformation of the piezoelectric film 41 is more stable and the output voltage or frequency shift is more accurate. The test platform 4 should be a rigid structure with as large an elastic modulus as possible; the force arms on the left and right sides of the test platform 4 should be as short as possible. The sealing cover 1 is integrated with multiple operating buttons, including but not limited to a "power" button, a "ready to measure" button, a "start measuring" button, and a quality test result display screen.

[0038] Among them, Figure 2 As shown, the motion guide mechanism 3 includes a guide cylinder 31, which is fixed on the base 2, and a guide rod 32 is sleeved in the guide cylinder 31, and the other end of the guide rod 32 is connected to the test platform 4; a spring 33 is connected between the guide rod 32 and the guide cylinder 31, and an anti-deflection rod 35 is also fixed in the guide cylinder 1, and the anti-deflection rod 35 is sleeved in the spring 33, and the other end of the anti-deflection rod 35 is sleeved in the guide rod 32. When the guide rod 32 is pushed upward by the spring 33, the guide rod 32 drives the test platform 4 and the two loading devices 5 to move. The guide cylinder 31 can limit the guide rod 32 to ensure that the guide rod 32 moves in a straight line, thereby improving the accuracy of the measurement.

[0039] The guide cylinder 31 is connected with a locking mechanism 34 for locking the guide rod 32. Before measuring, the guide rod 32 is locked by the locking mechanism 34, so that the spring 33 is in a compressed state, which is convenient for releasing the spring 33 during measurement. During measurement, the guide rod 32 is unlocked, and the test platform 4 is pushed up during the process of the spring 33 recovering its deformation.

[0040] A limiting ring 321 is fixed at the bottom of the guide rod 32, and a limiting step 311 for blocking the limiting ring 321 is provided at the upper end of the guide cylinder 31, and a vibration-damping ring 312 is fixed on the side of the limiting step 311 facing the limiting ring 321. The vibration-damping ring 312 on the limiting step 311 can play a role in vibration reduction and limiting the guide rod 32. When the limiting ring 321 on the guide rod 32 touches the vibration-damping ring 312, and the spring 33 has not yet completely recovered its deformation, the vibration generated by the spring 33 is small, which correspondingly improves the stability of the test platform 4 and the loading device 5, and improves the measurement accuracy.

[0041] like Figure 3As shown, the locking mechanism 34 includes an electromagnetic relay 341, the normally closed contact of the electromagnetic relay 341 is electrically connected to an electromagnet 342, a through hole is provided on the side wall of the guide cylinder 31, the electromagnet 342 is installed at the through hole of the guide cylinder 31, and a blocking column 344 is also connected in the through hole through a connecting spring 343, the blocking column 344 is located on the upper side of the limit ring 321 of the guide rod 32, and the material of the blocking column 344 is iron. When the electromagnetic relay 341 is turned on, the electromagnet 342 is energized and has magnetism, and the electromagnet 342 attracts the blocking column 344, then the limit ring 321 of the guide rod 32 will not be blocked by the blocking column 344, and the guide rod 32 rises under the push of the spring 33. Before the quality measurement is performed, the electromagnetic relay 341 is powered off, the electromagnet 342 loses its magnetism, and the blocking column 344 extends to the upper side of the limit ring 321 under the push of the connecting spring 343 , so that the blocking column 344 can block the limit ring 321 .

[0042] like Figure 4 As shown, the specific structure of the loading device is:

[0043] The loading device 5 includes a universal fixture 51, which is installed on the piezoelectric film 41. A wireless power receiving module 511 and a high-voltage rectifier module 512 are respectively arranged on the universal fixture 51, and the wireless power receiving module 511 and the high-voltage rectifier module 512 are electrically connected; an inverted arch base 52 is provided inside the universal fixture 51, and an inverted arch electrostatic adsorption module 521 is fixed inside the inverted arch base 52, and a plug-in connector 53 is connected between the inverted arch electrostatic adsorption module 521 and the high-voltage rectifier module 512, and a sample tank 54 is provided inside the inverted arch electrostatic adsorption module 521 of the inverted arch base 52; a wireless charging module for charging the wireless power receiving module 511 is installed on the test platform 4.

[0044] The substance to be tested is placed in the sample tank 54, and the sample tank 54 is installed in the inverted arch base 52. The wireless power receiving module 511 transmits electric energy to the high-voltage rectifier module 512, and the high-voltage rectifier module 512 supplies power to the inverted arch electrostatic adsorption module 521 in the inverted arch base 52 through the plug connector 53. The substance in the sample tank 54 is affected by the inverted arch electrostatic adsorption module 521, and is adsorbed on the inner wall of the sample tank 54 by electrostatic induction or dielectric polarization, thereby ensuring that the substance to be tested and the sample tank 54 remain relatively still, thereby improving the measurement accuracy during quality testing.

[0045] When the substance to be tested is a conductive substance, the substance to be tested generates electrostatic induction under the electric field of the inverted arch electrostatic adsorption module 521 ; when the substance to be tested is a non-conductive substance, the substance to be tested generates dielectric polarization under the electric field of the inverted arch electrostatic adsorption module 521 .

[0046] The sample tank 54 includes a sample tank body 541, which is sleeved in the inverted arch electrostatic adsorption module 521 of the inverted arch base 52, one end of the sample tank body 541 is connected to a piston core rod 542, and the other end of the sample tank body 541 is connected to a suction nozzle 543, and the suction nozzle 543 is blocked with a rubber plug 544. For a small mass to be measured that needs to be measured on-orbit in a microgravity environment, the material to be measured is sucked into the sample tank 54 through the suction nozzle 543 at the front end of the sample tank body 541, and the suction nozzle 543 is sealed by the rubber plug 544. After the material is loaded, the sample tank 54 can be installed in the inverted arch base 52.

[0047] The plug-in connector 53 includes a power supply connector 531, which is installed on the inverted arch base 52. The power supply connector 531 is electrically connected to the inverted arch electrostatic adsorption module 521. The universal fixture 51 is provided with a power supply socket 532 for plugging the power supply connector 531, and the power supply socket 532 is electrically connected to the high-voltage rectifier module 512. When the inverted arch is installed in the groove of the universal fixture 51, the power supply connector 531 on the inverted arch base 52 is inserted into the power supply socket 532 on the universal fixture 51, and the high-voltage rectifier module 512 can be delivered to the arch electrostatic module through the plug-in connector 53.

[0048] A plurality of electromagnetic adsorption modules 513 are installed at the bottom of the universal fixture 51. The electromagnetic adsorption modules 513 should keep the universal fixture 1 in contact with the mass measurement platform without separation, so as to improve the measurement accuracy of mass measurement in a microgravity environment.

[0049] The process of tiny mass measurement in microgravity environment:

[0050] S1: placing the sample tank 54 loaded with a known reference mass substance and an unknown mass substance to be measured in a universal fixture 51 respectively, and restraining them with a restraining belt thereon;

[0051] S2: Place the universal fixture 51 (including the sample tank 54) on both sides of the test platform 4, power on the entire mass measurement device, and activate the electromagnetic adsorption module 513. The small preload force generated should ensure reliable contact and gap-free between the universal fixture 51 and the test platform 4.

[0052] S3: After the mass measurement device is powered on, the electrostatic adsorption module is powered on and works to realize approximately rigid body processing of the non-rigid substances to be measured inside the sample tanks 54 on the left and right sides by means of electrostatic adsorption or dielectric polarization;

[0053] S4: confirm the status of each component on the mass measurement device in the sealing cover 1 (the degree of rigidification of the material inside the sample tank 54, the gap between the universal fixture 51 and the test platform 4, etc.), and close the sealing cover 1;

[0054] S5: Click the "prepare for measurement" button on the sealing cover 1 to allow the motion guide mechanism 3 to have initial energy;

[0055] S6: Click the “start measurement” button on the sealing cover 1 , and the motion guide mechanism 3 starts to move. Through the internal data processing software, the test mass of the unknown substance to be tested will eventually be presented on the display screen on the sealing cover 1 .

[0056] The following is the derivation of the mass of the substance to be measured:

[0057] a) Let the mass of the loading device 5 be m1, the mass of the reference material be m0, the mass of all the additional masses of the connecting shafts on the left and right sides and the test platform 4 be m2, and the mass of the sample to be tested be m. At a certain moment, the force exerted by the motion guide mechanism 3 to move the test platform 4 and its components is F i , the resulting instantaneous acceleration is a i The software records that the voltages tested by the left and right instruments of the test platform 4 are V1 and V2 respectively. Since V∝F, the corresponding forces on the left and right sides are assumed to be F1 and F2.

[0058] b) Establish the following relationship:

[0059] F i =(m0+m+m1+m2)×a i (Formula 1)

[0060] F1=m0×a i (Formula 2)

[0061] F2=(m+m1)×a i (Formula 3)

[0062] Solving the system of equations simultaneously, we can obtain:

[0063] m=F2m0 / F1–m1 (Formula 4)

[0064] Among them, F1 and F2 are forces that are linearly related to the measured voltages on the left and right sides.

[0065] c) From (Equation 4), we can see that the force F released by the mass m to be measured and the motion guide mechanism 3 is i and acceleration a i Not relevant.

[0066] d) To analyze the dynamic characteristics of the mass measurement device, differential equations are used to perform dynamic error analysis. The partial derivatives of each component in (Equation 4) are obtained, and the error transfer function is:

[0067] f'(m0)=F2 / F1

[0068] f'(m1)=-1

[0069] f'(F2)=m0 / F1

[0070] f'(F1)=-F2m0 / F1 2

[0071] Then the dynamic error of the mass measurement device is:

[0072]

[0073] e) From (Equation 5), we can see that the mass m1 of the loading device 5 and the force F provided by the motion guide mechanism to the mass measuring device are i and acceleration a i The value of has no effect on the test results; the measurement accuracy of F1 and F2 has a greater impact on the quality test results. Although the reference mass m0 has a certain impact on the test results, since m0 is a known constant, its impact on the quality test results can be basically ignored;

[0074] f) F1 and F2 are represented by V1, V2 or frequency shift which are linearly related to force. Therefore, a high-precision data acquisition and processing system is used to obtain V1 and V2 values ​​to ensure measurement accuracy.

[0075] The present invention is not limited to the above-mentioned optional implementation modes. Anyone can derive other various forms of products under the inspiration of the present invention. However, no matter what changes are made in the shape or structure, all technical solutions that fall within the scope defined by the claims of the present invention fall within the protection scope of the present invention.

Claims

1. A micro-mass measurement device in a microgravity environment, characterized in that: The invention comprises a sealing cover (1), wherein a base (2) is arranged in the sealing cover (1), a motion guide mechanism (3) is installed on the base (2), the other end of the motion guide mechanism (3) is connected to a test platform (4), both ends of the test platform (4) are provided with piezoelectric films (41), a loading device (5) is installed on the piezoelectric film (41), one loading device (5) contains a substance to be tested of unknown mass, and the other loading device (5) contains a reference substance of known mass; The motion guide mechanism (3) and the test platform (4) are at an angle of 90°; The motion guide mechanism (3) comprises a guide cylinder (31), the guide cylinder (31) being fixed on the base (2), a guide rod (32) being sleeved in the guide cylinder (31), and the other end of the guide rod (32) being connected to the test platform (4); a spring (33) being connected between the guide rod (32) and the guide cylinder (31), an anti-deflection rod (35) being fixed in the guide cylinder (1), the anti-deflection rod (35) being sleeved in the spring (33), and the other end of the anti-deflection rod (35) being sleeved in the guide rod (32).

2. The device for measuring micro-mass in a microgravity environment according to claim 1, characterized in that: A locking mechanism (34) for locking the guide rod (32) is connected inside the guide cylinder (31).

3. The device for measuring micro-mass in a microgravity environment according to claim 1, characterized in that: A limiting ring (321) is fixed to the bottom of the guide rod (32), a limiting step (311) for blocking the limiting ring (321) is provided at the upper end of the guide cylinder (31), and a vibration-damping ring (312) is fixed to the side of the limiting step (311) facing the limiting ring (321).

4. The device for measuring micro-mass in a microgravity environment according to claim 1, characterized in that: The loading device (5) comprises a universal fixture (51), the universal fixture (51) being mounted on the piezoelectric film (41), the universal fixture (51) being respectively provided with a wireless power receiving module (511) and a high-voltage rectifier module (512), the wireless power receiving module (511) and the high-voltage rectifier module (512) being electrically connected; an inverted arch-shaped base (52) being provided inside the universal fixture (51), an inverted arch-shaped electrostatic adsorption module (521) being fixed inside the inverted arch-shaped base (52), a plug-in connector (53) being connected between the inverted arch-shaped electrostatic adsorption module (521) and the high-voltage rectifier module (512), and a sample tank (54) being provided inside the inverted arch-shaped electrostatic adsorption module (521) of the inverted arch-shaped base (52); and a wireless charging module for charging the wireless power receiving module (511) being installed on the test platform (4).

5. The device for measuring micro-mass in a microgravity environment according to claim 4, characterized in that: The sample tank (54) comprises a sample tank body (541), which is sleeved in an inverted arch-shaped electrostatic adsorption module (521) of an inverted arch-shaped base (52), one end of the sample tank body (541) is connected to a piston core rod (542), and the other end of the sample tank body (541) is connected to a suction nozzle (543), and the suction nozzle (543) is sealed with a rubber plug (544).

6. The device for measuring micro-mass in a microgravity environment according to claim 4, characterized in that: The plug-in connector (53) comprises a power supply connector (531), the power supply connector (531) being mounted on an inverted arch-shaped base (52), the power supply connector (531) being electrically connected to an inverted arch-shaped electrostatic adsorption module (521), and a power supply socket (532) for plugging the power supply connector (531) being provided on the universal fixture (51), the power supply socket (532) being electrically connected to a high-voltage rectifier module (512).

7. The device for measuring micro-mass in a microgravity environment according to claim 4, characterized in that: A plurality of electromagnetic adsorption modules (513) are installed at the bottom of the universal fixture (51).

8. A method for measuring micro-mass in a microgravity environment, characterized in that: The steps include: S1: placing a reference substance of known mass into one of the sample tanks (54), placing a test substance of unknown mass into another sample tank (54), placing the two sample tanks (54) into loading devices (5) respectively, and installing the two loading devices (5) at both ends of the test platform (4); S2: The entire mass measurement device is powered on, and the electromagnetic adsorption module (513) at the bottom of the loading device (5) is activated, so that the universal fixture (51) in the loading device (5) and the test platform (4) are adsorbed together; S3: After the mass measurement device is powered on, the inverted arch-shaped electrostatic adsorption module (521) is powered on and works to adsorb the non-rigid substances to be measured inside the sample tanks (54) on the left and right sides by means of electrostatic adsorption or dielectric polarization; S4: Start the motion guide mechanism (3), and the data processing software calculates the mass of the substance to be measured through ratio calculation.

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