Test Circuit and Test Device
By designing test circuits for wiring components and switch unit groups, the problems of traditional manual measurement inaccurate and cable fall-off are solved, and automation and safety improvements of insulation and continuity detection are achieved.
Patent Information
- Application Number
- CN202110351416.8
- Authority / Receiving Office
- CN · China
- Patent Type
- Patents(China)
- Current Assignee / Owner
- Filing Date
- 2021-03-31
- Publication Date
- 2025-07-11
- Estimated Expiration
- 2041-03-31
AI Technical Summary
In insulation testing and continuity testing in nuclear power plants and the power industry, traditional manual measurement methods have problems with equipment hazards caused by inaccuracy and cable falloff.
A test circuit is designed to realize fixed connection and automatic switching of cables through wiring components, first switching units group and second switching units group, and combine indicator lights and trigger mechanisms to automatically perform insulation and continuity detection.
Improve the accuracy and safety of the test, avoid the risk of equipment downtime caused by cable falloff, and simplify the operation process.
Smart Images

Figure CN113030668B_ABST
Abstract
Description
Technical Field
[0001] The present invention belongs to the technical field of electrical testing, and particularly relates to a test circuit and a test device. Background Art
[0002] In nuclear power plants and the power industry, in previous insulation testing and continuity testing work, two people were required to cooperate in the measurement during insulation testing and continuity testing. One person held the wiring removed from the cabinet side, and the other person had to hold a multimeter and a megohmmeter to conduct insulation testing and continuity testing. Since most insulation testing and continuity testing are for four-wire thermal resistors, it is not very accurate to measure by hand contacting the test leads. Moreover, for insulation testing, each of the four wires in the four-wire system needs to be tested for insulation, and for continuity testing, it is a pairwise test among the four wires in the four-wire system. Therefore, measuring by hand is not accurate, and because the wires are relatively messy, the four wires are not arranged smoothly and neatly, but are oriented randomly. During testing, there is a risk that the cable may fall off the hand and swing back to the cabinet, causing the terminals to touch, and in severe cases, it may cause serious consequences such as tripping the machine or reactor. Summary of the Invention
[0003] The purpose of the present invention is to provide a test circuit, aiming to solve the problem of testing hazards existing in traditional testing methods.
[0004] In the first aspect of an embodiment of the present invention, a test circuit is provided. The test circuit includes:
[0005] A wiring component, the wiring component includes N wiring ports, and the N wiring ports are used to connect N cables to be tested one by one;
[0006] A first switch unit group, including N*(N - 1) / 2 first switch units. The first ends of each first switch unit are interconnected to form a first test node of the test circuit, and the second ends of each first switch unit are interconnected to form a second test node of the test circuit. Any two wiring ports are respectively connected to the third end and the fourth end of a first switch unit. The first test node and the second test node are used to connect a resistance testing device;
[0007] Wherein, when the first switch unit is not triggered, the first end and the second end of the first switch unit are respectively kept disconnected from the third end and the fourth end. When the first switch unit is triggered, the first end, the third end, the fourth end, and the second end of the first switch unit are connected to form a continuity detection loop;
[0008] The second switch unit group includes N second switch units. The first ends of each of the second switch units are interconnected to form a third test node of the test circuit. The second end of each of the second switch units is respectively connected to a wiring port. The third test node is used to connect an insulation testing device;
[0009] Wherein, when the second switch unit is not triggered, the first end and the second end of the second switch unit remain in a disconnected state. When the second switch unit is triggered, the first end and the second end of the second switch unit are connected to form an insulation detection loop.
[0010] In one embodiment, N is equal to 4.
[0011] In one embodiment, the first switch unit includes a first switch mechanism, a second switch mechanism, and a first triggering mechanism. The first switch mechanism and the second switch mechanism are respectively mechanically connected or electrically connected to the first triggering mechanism. The first end and the second end of the first switch mechanism are respectively the first end and the third end of the first switch unit. The first end and the second end of the second switch mechanism are respectively the second end and the fourth end of the first switch unit;
[0012] The first triggering mechanism is used to correspondingly control the first switch mechanism and the second switch mechanism to be connected or disconnected synchronously according to the triggering operation of the user.
[0013] In one embodiment, the second switch unit includes a third switch mechanism and a second triggering mechanism. The third switch mechanism and the second triggering mechanism are mechanically connected or electrically connected;
[0014] The first end and the second end of the second switch mechanism are respectively the first end and the second end of the second switch unit;
[0015] The second triggering mechanism is used to correspondingly control the third switch mechanism to be connected or disconnected according to the triggering operation of the user.
[0016] In one embodiment, the test circuit further includes a positive power input terminal, a negative power input terminal, and a first indicator light group. The first indicator light group includes N*(N - 1) / 2 first indicator lights and N*(N - 1) / 2 fourth switch mechanisms;
[0017] The positive pole of the power input terminal and the negative pole of the power input terminal are used to connect to a power supply module. The first ends of each of the fourth switching mechanisms are interconnected to form a first power node and are connected to the positive pole of the power input terminal. The second end of each of the fourth switching mechanisms is connected to one end of a first indicator light. The second ends of each of the first indicator lights are interconnected to form a second power node and are connected to the negative pole of the power input terminal. The fourth switching mechanism is mechanically or electrically connected to the first triggering mechanism one by one.
[0018] In one embodiment, the test circuit further includes a second indicator light group, and the second indicator light group includes N second indicator lights and N fifth switching mechanisms;
[0019] The first ends of each of the fifth switching mechanisms are interconnected to form a third power node and are connected to the positive pole of the power input terminal. The second end of each of the fifth switching mechanisms is connected to one end of a second indicator light. The second ends of each of the second indicator lights are interconnected to form a fourth power node and are connected to the negative pole of the power input terminal. The fifth switching mechanism is mechanically or electrically connected to the second triggering mechanism one by one.
[0020] In one embodiment, the test circuit further includes a changeover switch. The first end of the changeover switch is connected to the positive pole of the power input terminal. The second end of the changeover switch is connected to the first power node. The third end of the changeover switch is connected to the third power node;
[0021] The changeover switch is used to connect the positive pole of the power input terminal to the first power node or to the third power node correspondingly according to a user's triggering operation.
[0022] In one embodiment, the test circuit further includes a power switch, and the power switch is arranged at the front stage of the positive pole of the power input terminal or at the front end of the negative pole of the power input terminal;
[0023] The power switch is used to connect or disconnect the power supply module correspondingly according to a user's triggering operation.
[0024] In one embodiment, the test circuit further includes a ground wire. One end of the ground wire forms a fourth test node of the test circuit. The other end of the ground wire is used to connect to a ground pole. The fourth test node is used to connect to the insulation testing device.
[0025] A second aspect of the embodiments of the present invention provides a test device, and the test device includes a housing and the above-mentioned test circuit arranged in the housing.
[0026] The beneficial effects of the embodiments of the present invention compared with the prior art are as follows: The above-mentioned test circuit is provided with wiring ports for accessing cables, replacing the original method of holding the test by hand. The cables are fixed, eliminating the danger of terminal contact and equipment shutdown caused by the cable slipping out of the hand. At the same time, by setting the first switch unit group and the second switch unit group, during the test, only the corresponding switch unit needs to be triggered to achieve the insulation detection and continuity detection of the cable, without repeatedly plugging in the cable, improving the convenience and reliability of the test. BRIEF DESCRIPTION OF THE DRAWINGS
[0027] Figure 1 FIG. 1 is a schematic diagram of the first structure of the test circuit provided by the embodiment of the present invention;
[0028] Figure 2 FIG. 2 is a schematic diagram of the structure of the test device provided by the embodiment of the present invention;
[0029] Figure 3 FIG. 3 is a schematic diagram of the second structure of the test circuit provided by the embodiment of the present invention;
[0030] Figure 4 FIG. 4 is a schematic diagram of the third structure of the test circuit provided by the embodiment of the present invention;
[0031] Figure 5 FIG. 5 is a schematic diagram of the fourth structure of the test circuit provided by the embodiment of the present invention;
[0032] Figure 6 FIG. 6 is a schematic diagram of the fifth structure of the test circuit provided by the embodiment of the present invention;
[0033] Figure 7 FIG. 7 is a schematic diagram of the sixth structure of the test circuit provided by the embodiment of the present invention. DETAILED DESCRIPTION OF THE EMBODIMENTS
[0034] In order to make the technical problems, technical solutions and beneficial effects to be solved by the present invention more clearly understood, the present invention will be further described in detail below with reference to the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are only for explaining the present invention and are not used to limit the present invention.
[0035] It should be noted that when an element is referred to as being "fixed to" or "disposed on" another element, it can be directly on the other element or indirectly on the other element. When an element is referred to as being "connected to" another element, it can be directly connected to the other element or indirectly connected to the other element.
[0036] It should be understood that the orientation or positional relationship indicated by the terms "length", "width", "upper", "lower", "front", "rear", "left", "right", "vertical", "horizontal", "top", "bottom", "inner", "outer", etc. is based on the orientation or positional relationship shown in the drawings. It is only for the convenience of describing the present invention and simplifying the description, rather than indicating or implying that the device or element referred to must have a specific orientation, be constructed and operated in a specific orientation. Therefore, it should not be construed as a limitation to the present invention.
[0037] In addition, the terms "first" and "second" are only used for descriptive purposes and should not be construed as indicating or implying relative importance or implicitly specifying the quantity of the indicated technical features. Thus, the features defined with "first" and "second" may explicitly or implicitly include one or more of such features. In the description of the present invention, "a plurality" means two or more unless otherwise specifically defined.
[0038] In the first aspect of the embodiment of the present invention, a test circuit 100 is provided.
[0039] As Figure 1 shown, Figure 1 FIG. 13 is a first schematic structural diagram of the test circuit 100 provided by the embodiment of the present invention. In this embodiment, the test circuit 100 includes:
[0040] A wiring component 10, the wiring component 10 includes N wiring ports J1 to JN, and the N wiring ports are used to connect N cables to be tested one by one;
[0041] A first switch unit group 20, including N*(N - 1) / 2 first switch units 21. The first ends of each first switch unit 21 are interconnected to form a first test node C1 of the test circuit 100, and the second ends of each first switch unit 21 are interconnected to form a second test node C2 of the test circuit 100. Any two wiring ports are respectively connected to the third end and the fourth end of a first switch unit 21. The first test node C1 and the second test node C2 are used to connect a resistance test device;
[0042] Wherein, when the first switch unit 21 is not triggered, the first end and the second end of the first switch unit 21 are respectively kept disconnected from the third end and the fourth end. When the first switch unit 21 is triggered, the first end, the third end, the fourth end and the second end of the first switch unit 21 are connected to form a continuity detection loop;
[0043] A second switch unit group 30, including N second switch units 31. The first ends of each second switch unit 31 are interconnected to form a third test node C3 of the test circuit 100, and the second end of each second switch unit 31 is respectively connected to a wiring port. The third test node C3 is used to connect an insulation test device;
[0044] When the second switch unit 31 is not triggered, the first end and the second end of the second switch unit 31 remain disconnected. When the second switch unit 31 is triggered, the first end and the second end of the second switch unit 31 are connected to form an insulation detection circuit.
[0045] In this embodiment, when insulation testing and continuity testing are required for the cable, the connection ports of the connection assembly 10 are used to connect and fix the cables to be tested one by one. The connection ports can fix the cables to be tested by means such as screws and buckles, so as to ensure the stability of the cables and prevent problems such as terminals touching or equipment shutdown caused by detachment. The connection ports can be fixedly arranged or separately arranged. At the same time, the first test node C1 and the second test node C2 are connected to the resistance testing device, and the third test node C3 is connected to the insulation detection device. To avoid interference, the insulation test and the continuity test are not carried out simultaneously, that is, only one of the resistance testing device and the insulation testing device is connected to the test circuit 100 during testing.
[0046] Among them, the resistance testing device tests the resistance values of the thermal resistances between multiple cables pairwise. Therefore, in order to achieve the switching test of each cable, in this embodiment, N*(N - 1) / 2 first switch units 21 are provided. That is, when pairwise continuity testing of N cables is required, C 2 N = N*(N - 1) / 2. When N is equal to 3, the number of the first switch units 21 is 3. When N is equal to 4, the number of the first switches is 6. The N*(N - 1) / 2 first switch units 21 are pairwise connected to the N connection ports. At the same time, the first switch units 21 are connected to the first test node C1 and the second test node C2. During the continuity test, the first switch units 21 are indirectly connected to the resistance testing device. The user triggers the N*(N - 1) / 2 first switch units 21 respectively, so as to switch two different cables to be connected to the resistance testing device respectively, and achieve pairwise continuity testing of N cables. In this embodiment, the resistance testing device is a multimeter.
[0047] In this embodiment, when the first switch unit 21 is turned on, the first end of the first switch unit 21 can be connected to the third end or the fourth end. Correspondingly, the second end of the first switch unit 21 is connected to the other ends of the third end and the fourth end. When the first switch unit 21 is turned on, the first test node C1 is connected to the second test node C2 through the first end, the second end, the third end, and the fourth end of the first switch unit 21 and is correspondingly connected to the resistance test device. Assuming that when the first switch unit 21 is turned on, the first end of the first switch unit 21 is connected to the third end and the second end is connected to the fourth end, that is, the first test node C1 is connected to one of the cables to be tested, and the second test node C2 is connected to the other cable to be tested. When the first switch is turned off, in order to avoid interference from other cables during the continuous test switching process, the first end and the second end of the first switch unit 21 are turned off, and the second end and the fourth end are turned off at the same time, that is, when the two cables to be tested are not being tested, they are both in a turned-off state with respect to the test nodes, avoiding the situation where one of the two cables in the previous group is connected to the test node when testing the next group of two cables to be tested, thereby improving the test accuracy.
[0048] The insulation test device performs insulation tests on each single cable one by one. Therefore, the test circuit 100 is provided with N second switch units 31. The second switch units 31 are respectively connected to a wiring port and are also connected to the third test node C3, and are thus indirectly connected to the cable to be tested and the insulation test device during the test. The user triggers the N second switch units 31 respectively to switch different cables to be connected to the insulation test device.
[0049] Among them, the first switch unit 21 and the second switch unit 31 can be switch components with controlled functions, such as push-button switches, touch switches, relays, and other switch components. The quantities of the first switch unit 21 and the second switch unit 31 are set according to the cables to be tested. In one embodiment, the cable is a four-wire cable, that is, N is equal to 4, the number of the first switches is 6, and the number of the second switches is 4.
[0050] In this embodiment, each component of the test circuit 100 can be arranged on structures such as a circuit board and a fixing board, or can also be integrally arranged, and the specific structure can be set according to requirements.
[0051] In this embodiment, the test circuit 100 is provided with a wiring port for connecting the cable, replacing the original way of holding the test by hand. The cable is fixed, eliminating the danger of terminal contact and equipment shutdown caused by the cable slipping out of the hand. At the same time, by providing the first switch unit group 20 and the second switch unit group 30, during the test, only the corresponding switch unit needs to be triggered to achieve the insulation detection and continuity detection of the cable, without repeatedly plugging in the cable, improving the test convenience and reliability.
[0052] Such as Figure 3As shown, in one embodiment, the first switch unit 21 includes a first switch mechanism K1, a second switch mechanism K2 and a first trigger mechanism T1, the first switch mechanism K1 and the second switch mechanism K2 are respectively mechanically or electrically connected to the first trigger mechanism T1, the first end and the second end of the first switch mechanism K1 are respectively the first end and the third end of the first switch unit 21, the first end and the second end of the second switch mechanism K2 are respectively the second end and the fourth end of the first switch unit 21;
[0053] The first trigger mechanism T1 is used for controlling the first switch mechanism K1 and the second switch mechanism K2 to be connected or disconnected synchronously according to the trigger operation of the user.
[0054] In this embodiment, when the first switch unit 21 is turned on, the first end of the first switch unit 21 is connected to the third end and the second end is connected to the fourth end. The two ends of the first switch mechanism K1 correspond to the first end and the third end of the first switch unit 21, and the two ends of the second switch mechanism K2 correspond to the second end and the fourth end of the first switch unit 21.
[0055] When the test circuit 100 is correspondingly disposed on the housing 200 to form a test device, as shown in FIG. Figure 2 As shown, the first switch mechanism K1 and the second switch mechanism K2 are arranged in the shell 200, and can be arranged on the circuit board or the fixed plate. The first trigger mechanism T1 is arranged on the surface of the shell 200. The first trigger mechanism T1 is mechanically or electrically connected to the first switch mechanism K1 and the second switch mechanism K2. At the same time, the corresponding test nodes and wiring ports can be arranged on the shell 200 and correspondingly connected to the circuit board or the fixed plate. The first switch mechanism K1 and the second switch mechanism K2 are linked and turned on or off at the same time when the first trigger mechanism T1 is actuated, so that the first end and the third end of the first switch unit 21 are connected and the second end is connected to the fourth end. The two cables in the group to be tested are connected or disconnected with the first test node C1 and the second test node C2 respectively, thereby realizing continuity testing and switching.
[0056] Among them, the first trigger mechanism T1 can be a trigger mechanism such as a touch switch, a button, a knob, etc., the first switch mechanism K1 and the second switch mechanism K2 can be switch structures such as metal springs and relays, and the corresponding switch mechanism can be selected according to the type of the first trigger mechanism T1.
[0057] In one embodiment, Figure 2 As shown, the first switch unit 21 is a two-stage button switch, the first trigger mechanism T1 is a button handle, and the first switch mechanism K1 and the second switch mechanism K2 are metal sheets or metal contacts inside the button switch.
[0058] like Figure 4As shown, in one embodiment, the second switch unit 31 includes a third switch mechanism K3 and a second trigger mechanism T2, and the third switch mechanism K3 and the second trigger mechanism T2 are mechanically or electrically connected;
[0059] The first end and the second end of the second switch mechanism K2 are respectively the first end and the second end of the second switch unit 31;
[0060] The second trigger mechanism T2 is configured to correspondingly control the third switch mechanism K3 to be connected or disconnected according to a trigger operation of a user.
[0061] In this embodiment, when the second switch unit 31 is turned on, the first end and the second end of the second switch unit 31 are connected, and both ends of the third switch mechanism K3 correspond to the first end and the second end of the second switch unit 31.
[0062] When the test circuit 100 is correspondingly arranged in the housing 200 to form a test device, as Figure 2 shown, the third switch mechanism K3 is arranged in the housing 200 and can be arranged on a circuit board or a fixing plate. The second trigger mechanism T2 is arranged on the surface of the housing 200, and the second trigger mechanism T2 is mechanically or electrically connected to the third switch mechanism K3. At the same time, corresponding test nodes can be arranged on the housing 200 and correspondingly connected to the circuit board or the fixing plate. The third switch mechanism K3 is turned on or off when the second trigger mechanism T2 acts, so as to connect the first end and the second end of the second switch unit 31, and a cable to be tested is correspondingly connected or disconnected from the third test node C3, thereby realizing insulation testing and switching.
[0063] Among them, the second trigger mechanism T2 can be a trigger mechanism such as a touch switch, a button, a knob, etc., and the third switch mechanism K3 can be a switch structure such as a metal shrapnel, a relay, etc. The corresponding switch mechanism can be correspondingly selected according to the type of the second trigger mechanism T2.
[0064] In one embodiment, as Figure 2 shown, the second switch unit 31 is a two-position boat switch, the first trigger mechanism T1 is a boat structure, and the third switch mechanism K3 is a metal sheet or a metal contact inside the boat switch.
[0065] As Figure 3 shown, in one embodiment, the test circuit 100 further includes a power input positive terminal V+, a power input negative terminal V−, and a first indicator light group. The first indicator light group includes N*(N - 1) / 2 first indicator lights L1 and N*(N - 1) / 2 fourth switch mechanisms K4;
[0066] The positive terminal V+ and the negative terminal V- of the power input are used to connect to the power supply module. The first ends of each fourth switching mechanism K4 are interconnected to form a first power node V1 and are connected to the positive terminal V+ of the power input. The second end of each fourth switching mechanism K4 is connected to one end of a first indicator light L1. The second ends of each first indicator light L1 are interconnected to form a second power node V2 and are connected to the negative terminal V- of the power input. The fourth switching mechanism K4 is mechanically or electrically connected to the first triggering mechanism T1 one by one.
[0067] In this embodiment, a plurality of first indicator lights L1 corresponding to the continuity test are also provided in the test circuit 100. The first indicator lights L1 are provided in one-to-one correspondence with the first switch unit 21. The test circuit 100 is also provided with a first power node V1 and a second power node V2 for supplying working power to the first indicator lights L1, as well as the positive terminal V+ and the negative terminal V- of the power input. When the test circuit 100 is working, the first power node V1 is connected to the positive terminal V+ of the power input, and the second power node V2 is connected to the negative terminal V- of the power input. When performing a continuity test on a group of two cables, the first triggering mechanism T1 simultaneously controls the first switching mechanism K1, the second switching mechanism K2, and the fourth switching mechanism K4 to conduct. The first test node C1 and the second test node C2 are connected to the group of two cables and perform a continuity test. At the same time, the first indicator lights L1 are lit to prompt the user of the current test position and status, avoiding misoperations that may cause different first triggering mechanisms T1 to act simultaneously, thereby causing different groups of two cables to be tested simultaneously and affecting the test accuracy.
[0068] Among them, when the test circuit 100 is correspondingly arranged in the housing 200, as Figure 2 shown, the first indicator lights L1 can be arranged on the surface of the housing 200, and can be arranged on the same surface or different surfaces as the first triggering mechanism T1. The specific positions are correspondingly set according to the test requirements. When N is equal to 4, the number of the first indicator lights L1 is 6.
[0069] When the first switch unit 21 is a knife switch, the fourth switching mechanism K4 is a metal sheet or a contact inside the knife switch, and the knife switch is a nine-pin two-position knife switch.
[0070] Correspondingly, as Figure 4 shown, in one embodiment, the test circuit 100 further includes a second indicator light group. The second indicator light group includes N second indicator lights L2 and N fifth switching mechanisms K5;
[0071] The first ends of each fifth switch mechanism K5 are interconnected to form a third power supply node V3 and are connected to the positive pole V+ of the power supply input terminal. The second end of each fifth switch mechanism K5 is connected to the first end of one of the second indicator lights L2. The second ends of each second indicator light L2 are interconnected to form a fourth power supply node V4 and are connected to the negative pole V- of the power supply input terminal. The fifth switch mechanism K5 is mechanically or electrically connected to the second trigger mechanism T2 one by one.
[0072] In this embodiment, a plurality of second indicator lights L2 corresponding to insulation testing are further provided in the test circuit 100. The second indicator lights L2 are provided corresponding to the second switch unit 31 one by one. The test circuit 100 is further provided with a third power supply node V3 and a fourth power supply node V4 for providing a working power supply for the second indicator lights L2. When the test circuit 100 is working, the third power supply node V3 is connected to the positive pole V+ of the power supply input terminal, and the fourth power supply node V4 is connected to the negative pole V- of the power supply input terminal. When the cable is subjected to insulation testing, the second trigger mechanism T2 simultaneously controls the third switch mechanism K3 and the fifth switch mechanism K5 to conduct. The third test node C3 is connected to the cable and conducts insulation testing. At the same time, the second indicator light L2 lights up, prompting the user of the current testing position and status, and avoiding misoperation resulting in different second trigger mechanisms T2 acting simultaneously, thereby affecting the testing accuracy due to different cables being tested simultaneously.
[0073] Among them, when the test circuit 100 is correspondingly arranged in the housing 200, as Figure 2 shown, the second indicator light L2 can be arranged on the surface of the housing 200, and can be arranged on the same surface or different surfaces as the second trigger mechanism T2. The specific position is correspondingly set according to the testing requirements. When N is equal to 4, the number of second indicator lights L2 is 4.
[0074] When the second switch unit 31 is a rocker switch, the fifth switch mechanism K5 is a metal sheet or a contact inside the rocker switch, and the rocker switch is a two-pin two-position rocker switch.
[0075] The colors of the first indicator light L1 and the second indicator light L2 can be the same or different, and the colors and structures are not specifically limited.
[0076] As Figure 5 shown, in one embodiment, the test circuit 100 further includes a changeover switch KX. The first end of the changeover switch KX is connected to the positive pole V+ of the power supply input terminal, the second end of the changeover switch KX is connected to the first power supply node V1, and the third end of the changeover switch KX is connected to the third power supply node V3;
[0077] The changeover switch KX is used to correspondingly connect the positive pole V+ of the power supply input terminal to the first power supply node V1 or the third power supply node V3 according to the user's trigger operation.
[0078] In this embodiment, in order to switch the power supply of the first indicator light L1 and the second indicator light L2 during testing, and then achieve separate lighting indications, a switching switch KX is also provided in the test circuit 100. When the first end and the second end of the switching switch KX are connected, the positive pole V+ of the power input terminal is connected to the first power node V1, and the negative pole V- of the power input terminal is connected to the second power node V2, thereby providing a working power supply for the first indicator light L1. When the first end and the third end of the switching switch KX are connected, the positive pole V+ of the power input terminal is connected to the third power node V3, and the negative pole V- of the power input terminal is connected to the fourth power node V4, thereby providing a working power supply for the second indicator light L2.
[0079] Among them, the power module is set on the same circuit board as the internal power supply module and the test circuit 100 or is connected to the test circuit 100 as an external power supply module. The setting position of the power module can be selected correspondingly, and no specific limitation is made here. The power module can be a switching power supply or a battery structure. In one embodiment, as Figure 5 shown, the power module is a battery.
[0080] When the test circuit 100 is correspondingly set in the housing 200, the switching switch KX can be set on the surface of the housing 200 for the convenience of user operation. The switching switch KX can be set at any position of the housing 200, such as the front, back or side, etc.
[0081] Such as Figure 6 and Figure 2 shown, in one embodiment, the test circuit 100 further includes a power switch KS. The power switch KS is set at the front stage of the positive pole V+ of the power input terminal or the front end of the negative pole V- of the power input terminal. The power switch KS is used to correspondingly connect or disconnect the power module according to the user's trigger operation.
[0082] Such as Figure 7 shown, in one embodiment, the test circuit 100 further includes a ground wire. One end of the ground wire forms the fourth test node C4 of the test circuit 100. The other end of the ground wire is used to connect to the ground electrode. The fourth test node C4 is used to connect to an insulation test device.
[0083] In this embodiment, the insulation test device is a megohmmeter. The two test leads of the megohmmeter are respectively connected to the third test node C3 and the fourth test node C4, so as to perform ground insulation tests on the cables to be tested respectively.
[0084] The present invention also proposes a test device. The test device includes a housing 200 and a test circuit 100 provided in the housing 200. The specific structure of the test circuit 100 refers to the above embodiments. Since this test device adopts all the technical solutions of the above embodiments, it has at least all the beneficial effects brought by the technical solutions of the above embodiments, and will not be elaborated here one by one.
[0085] In this embodiment, a circuit board is provided inside the housing 200. Each switching mechanism is disposed on the circuit board. The circuit board is connected to each wiring port, power input terminal, and test node through connecting wires or conductors, as Figure 2 shown. Each triggering mechanism and indicator light are disposed on the surface of the housing 200. The user triggers each triggering mechanism to switch the switch KX and the power switch KS, thereby performing on-off control on each switching mechanism, the switch KX, and the power switch KS on the circuit board, and determining the current test position and test type through the indicator light, as well as determining the insulation test and continuity test results of the cable under test through the insulation test equipment and resistance test equipment.
[0086] Among them, the switching mechanism, the switch KX, and the power switch KS can be disposed on the same surface or different surfaces, and the specific setting position is not limited.
[0087] The above-described embodiments are only used to illustrate the technical solutions of the present invention and are not intended to limit them. Although the present invention has been described in detail with reference to the foregoing embodiments, those of ordinary skill in the art should understand that they can still modify the technical solutions described in the foregoing embodiments or perform equivalent replacements on some of the technical features. These modifications or replacements do not cause the essence of the corresponding technical solutions to deviate from the spirit and scope of the technical solutions of the embodiments of the present invention and should all be included in the protection scope of the present invention.
Claims
1. A test circuit, characterized in that, Including: A wiring assembly, the wiring assembly including N wiring ports, the N wiring ports being used to connect N cables to be tested one by one; A first switch unit group, including N*(N - 1) / 2 first switch units, the first ends of each of the first switch units being interconnected to form a first test node of the test circuit, the second ends of each of the first switch units being interconnected to form a second test node of the test circuit, any two wiring ports being respectively connected to the third end and the fourth end of a first switch unit, the first test node and the second test node being used to connect a resistance test device; Wherein, when the first switch unit is not triggered, the first end and the second end of the first switch unit are respectively kept disconnected from the third end and the fourth end, and when the first switch unit is triggered, the first end, the third end, the fourth end and the second end of the first switch unit are connected to form a continuity detection loop; A second switch unit group, including N second switch units, the first ends of each of the second switch units being interconnected to form a third test node of the test circuit, the second end of each of the second switch units being respectively connected to a wiring port, the third test node being used to connect an insulation test device; Wherein, when the second switch unit is not triggered, the first end and the second end of the second switch unit are kept disconnected from each other, and when the second switch unit is triggered, the first end and the second end of the second switch unit are connected to form an insulation detection loop; The first switch unit includes a first switch mechanism, a second switch mechanism and a first trigger mechanism, the first switch mechanism and the second switch mechanism being respectively mechanically connected or electrically connected to the first trigger mechanism, the first end and the second end of the first switch mechanism being respectively the first end and the third end of the first switch unit, and the first end and the second end of the second switch mechanism being respectively the second end and the fourth end of the first switch unit; The first trigger mechanism is used to correspondingly control the first switch mechanism and the second switch mechanism to be synchronously connected or disconnected according to a user's trigger operation; The second switch unit includes a third switch mechanism and a second trigger mechanism, the third switch mechanism and the second trigger mechanism being mechanically connected or electrically connected; The first end and the second end of the second switch mechanism are respectively the first end and the second end of the second switch unit; The second trigger mechanism is used to correspondingly control the third switch mechanism to be connected or disconnected according to a user's trigger operation; The test circuit further includes a ground wire, one end of the ground wire forming a fourth test node of the test circuit, the other end of the ground wire being used to connect to a ground electrode, and the fourth test node being used to connect the insulation test device.
2. The test circuit according to claim 1, wherein N is equal to 4.
3. The test circuit according to claim 1, characterized in that, The test circuit further includes a positive power input terminal, a negative power input terminal and a first indicator light group, the first indicator light group including N*(N - 1) / 2 first indicator lights and N*(N - 1) / 2 fourth switch mechanisms; The positive pole of the power input terminal and the negative pole of the power input terminal are used to connect to a power supply module. The first ends of each of the fourth switching mechanisms are interconnected to form a first power node and are connected to the positive pole of the power input terminal. The second end of each of the fourth switching mechanisms is connected to one end of a first indicator light. The second ends of each of the first indicator lights are interconnected to form a second power node and are connected to the negative pole of the power input terminal. The fourth switching mechanism is mechanically or electrically connected to the first triggering mechanism one by one.
4. The test circuit according to claim 3, characterized in that, The test circuit further includes a second indicator light group, and the second indicator light group includes N second indicator lights and N fifth switching mechanisms; The first ends of each of the fifth switching mechanisms are interconnected to form a third power node and are connected to the positive pole of the power input terminal. The second end of each of the fifth switching mechanisms is connected to one end of a second indicator light. The second ends of each of the second indicator lights are interconnected to form a fourth power node and are connected to the negative pole of the power input terminal. The fifth switching mechanism is mechanically or electrically connected to the second triggering mechanism one by one.
5. The test circuit according to claim 4, wherein The test circuit further includes a changeover switch. The first end of the changeover switch is connected to the positive pole of the power input terminal. The second end of the changeover switch is connected to the first power node. The third end of the changeover switch is connected to the third power node; The changeover switch is used to connect the positive pole of the power input terminal to the first power node or to the third power node correspondingly according to the triggering operation of the user.
6. The test circuit according to claim 5, wherein The test circuit further includes a power switch, and the power switch is arranged at the front stage of the positive pole of the power input terminal or at the front end of the negative pole of the power input terminal; The power switch is used to connect or disconnect the power supply module correspondingly according to the triggering operation of the user.
7. A testing device, characterized in that, It includes a housing and the test circuit as described in any one of claims 1 to 6 provided in the housing.
Citation Information
Patent Citations
Test circuit and test device
CN215526006U