A transient milling temperature testing device capable of following tool-chip contact wear

Abstract

The application provides a transient milling temperature testing device capable of following the contact wear between a cutter and a chip, comprising a milling cutter piece, a T-shaped milling cutter handle connected with the milling cutter piece, a temperature collection and transmission terminal embedded in the T-shaped milling cutter handle, and a wear-following thin film thermocouple temperature sensor embedded on a rake face of the milling cutter piece. The wear-following thin film thermocouple temperature sensor is embedded in the rake face of the milling cutter piece, so that the sensor thermal contact point can follow the wear, and the sensor can be disassembled and replaced, the problem that the traditional measurement method cannot measure the temperature in the contact area between the rake face of the cutter and the chip is solved, and by embedding the temperature collection and transmission terminal in the handle, the temperature signal in the milling process can be transmitted to a PC end in real time in a changing curve form to display the real-time temperature, and a new method and technical approach are provided for the transient temperature measurement in high-speed milling and precision machining.

Description

TECHNICAL FIELD

[0001] The present application relates to the technical field of transient milling temperature detection and sensor technology, in particular, especially relates to a kind of milling temperature test device based on thin film thermocouple temperature sensor. BACKGROUND

[0002] With the improvement of the automation and intelligent level of processing system, especially in high speed, precision and ultra-precision machining, milling temperature and distribution are one of the key factors affecting tool life and machining quality. The accurate measurement of milling area temperature and distribution has been a hotspot and problem in milling mechanism research. As one of the most important parameters in high-speed milling process, milling temperature, due to the comprehensive effect of cutting force, cutting heat, cutting impact and other factors, the tool and workpiece contact surface will experience complex transient temperature field changes, resulting in wear and damage, thereby degrading the quality of the machining surface and reducing the dimensional accuracy of the parts and the machining efficiency of the machine tool. Therefore, how to quickly, reliably and accurately collect the transient temperature information of the tool rake face and chip contact area in the milling process has attracted widespread attention from researchers, and designing and developing a temperature sensing device that meets the application requirements is a necessary condition for intelligent monitoring of the milling process, and is also one of the keys to intelligent manufacturing.

[0003] Because the workpiece is fixed, the tool rotates, the blade cuts intermittently, and the non-contact temperature measurement method cannot obtain the accurate temperature of the blade rake face and chip contact area during processing, and the traditional contact temperature measurement method is prone to sensor damage due to unavoidable friction. SUMMARY

[0004] According to the above technical problems, a transient milling temperature testing device that can follow the tool-chip contact wear is provided. The thin film thermocouple temperature sensor that can follow the wear is embedded in the milling blade rake face, the sensor can be detached and replaced, and the sensor thermal contact can follow the wear. The technical shortcomings that the traditional measurement method cannot measure the temperature of the tool rake face and chip contact area are solved, and by embedding the temperature acquisition and transmission device in the milling tool handle, the temperature is transmitted to the pc end in real time during the milling process to display the real-time temperature in the form of changing curve, which provides a new method and technical approach for temperature measurement in high-speed milling and precision machining, and has important application value.

[0005] The technical means adopted by the present application are as follows:

[0006] The device comprises a milling blade, a T-shaped milling tool handle connected with the milling blade, a temperature acquisition and transmission terminal embedded in the T-shaped milling tool handle, and a thin film thermocouple temperature sensor embedded in the rake face of the milling blade.

[0007] Further, the thin film thermocouple temperature sensor comprises a wedge-shaped ceramic substrate made of 99 alumina ceramic material, a first compensation wire and a second compensation wire fixed in the substrate, a first hot electrode thin film and a second hot electrode thin film deposited on the substrate in sequence, and a protective thin film deposited on the two hot electrode thin films.

[0008] Further, the milling blade is made of hard alloy, and the wedge-shaped groove is arranged on the rake face of the milling blade for placing the thin film thermocouple temperature sensor.

[0009] Further, the T-shaped milling tool handle is provided with a square groove for placing the temperature acquisition and transmission terminal fixing assembly, and the temperature acquisition and transmission terminal is fixed in the temperature acquisition and transmission terminal fixing assembly.

[0010] Further, the T-shaped milling tool handle is further provided with two bolt grooves and a first compensation wire through hole; and the second compensation wire through hole is arranged at the connection between the T-shaped milling tool handle and the milling blade.

[0011] Further, the temperature acquisition and transmission terminal fixing assembly is in the shape of a hollow cuboid, and the through holes are arranged on the left and right sides, respectively; the two side bolts are in interference fit with the two bolt grooves of the tool handle, for fixing the temperature acquisition and transmission terminal; and the wire through hole is arranged on the lower side wall.

[0012] Further, the first compensation wire through hole corresponds to the wire through hole.

[0013] Further, the temperature acquisition and transmission terminal fixing assembly is made of polytetrafluoroethylene material.

[0014] Further, the second hot electrode thin film is overlapped on the first hot electrode thin film, and the overlapped area forms a hot junction area that can follow the wear.

[0015] Further, the first hot electrode thin film is made of NiCr thin film; the second hot electrode thin film is made of NiSi thin film; the first compensation wire is made of NiCr lead wire; the second compensation wire is made of NiSi lead wire; and the protective thin film is made of SiO2 thin film.

[0016] Compared with the prior art, the application has the following advantages:

[0017] 1、The milling temperature testing device provided by the application adopts the thin film thermocouple temperature sensor which can follow abrasion, and has the advantages of self-renewal of hot junction, follow-up of abrasion, long service life, fast dynamic response speed, high sensitivity and the like.

[0018] 2、The milling temperature testing device provided by the application embeds the thin film thermocouple temperature sensor which can follow abrasion in the rake face of the carbide milling blade, has the advantages of being detachable and replaceable, and the thin film thermocouple temperature sensor directly participates in cutting along with the milling blade, so that the transient temperature measurement of the contact area between the rake face of the milling blade and the chip can be realized.

[0019] Based on the above reasons, the application can be widely popularized in the field of transient milling temperature detection technology and sensors. BRIEF DESCRIPTION OF DRAWINGS

[0020] In order to more clearly illustrate the technical solutions in the embodiments of the application or the prior art, the following will briefly introduce the drawings needed to be used in the embodiments or the prior art description. Obviously, the drawings in the following description are some embodiments of the application, and other drawings can be obtained by those skilled in the art without creative labor under the premise of the drawings.

[0021] Figure 1 It is a schematic diagram of the overall structure of the milling temperature testing device of the application.

[0022] Figure 2 It is a three-dimensional schematic diagram of the T-shaped milling tool handle of the milling temperature testing device of the application.

[0023] Figure 3 It is an assembly schematic diagram of the thin film thermocouple temperature sensor and the carbide milling blade of the application.

[0024] Figure 4 It is an exploded schematic diagram of the thin film thermocouple temperature sensor of the application.

[0025] Figure 5 It is a detailed diagram of the electrode of the thin film thermocouple temperature sensor of the application.

[0026] Figure 6 It is a three-dimensional schematic diagram of the temperature acquisition and transmission terminal fixing assembly of the application.

[0027] Figure 7 It is a working block diagram of the transient temperature acquisition and wireless transmission system of the device of the application.

[0028] In the figure: 1, T-shaped milling cutter handle; 1-1, bolt groove; 1-2, first compensation wire through hole; 1-3, second compensation wire through hole; 1-4, square groove; 2, temperature acquisition and transmission terminal fixing assembly; 2-1, wire through hole; 3, bolt; 4, compensation wire; 4-1, second compensation wire; 4-2, first compensation wire; 5, milling cutter blade; 6, thin film thermocouple temperature sensor; 6-1, ceramic base; 6-2, first hot electrode thin film; 6-3, second hot electrode thin film; 6-4, protective thin film; 6-5, hot junction area; 7, fastening screw. DETAILED DESCRIPTION

[0029] It should be noted that the embodiments and features of the embodiments in the present application can be combined with each other without conflict. The technical solutions in the embodiments of the present application will be described in detail below with reference to the accompanying drawings and in combination with the embodiments.

[0030] In order to make the purpose, technical solutions and advantages of the embodiments of the present application clearer, the technical solutions in the embodiments of the present application will be described clearly and completely below in combination with the drawings of the embodiments of the present application. Obviously, the described embodiments are only part of the embodiments of the present application, not all the embodiments. The description of the at least one exemplary embodiment is actually only illustrative, but not as any limitation on the present application and its application or use. Based on the embodiments in the present application, all other embodiments obtained by those skilled in the art without creative labor are within the scope of protection of the present application.

[0031] It should be noted that the terms used herein are only for describing specific embodiments, and are not intended to limit the exemplary embodiments according to the present application. As used herein, the singular form is intended to include the plural form unless the context clearly indicates otherwise, and it should also be understood that when the terms "comprise" and / or "include" are used in the specification, there is a feature, step, operation, device, component and / or combination thereof.

[0032] The foregoing is considered as illustrative only of the principles of the application. Further, since numerous modifications and changes will readily occur to those skilled in the art, it is not desired to limit the application to the exact construction and practice described. Accordingly, all suitable modifications and equivalents can be resorted to falling within the scope of the application. Unless otherwise indicated herein, the contents of all patents, patent applications, publications, and test methods cited herein are hereby incorporated by reference in their entirety for all purposes.

[0033] In the description of the present application, it is to be understood that the orientation or positional relationships indicated by terms such as "front", "back", "up", "down", "left", "right", "lateral", "vertical", "horizontal", "top", "bottom", and the like are generally based on the orientation or positional relationships shown in the drawings, and are merely intended to facilitate the description and simplify the description, and do not indicate or imply that the device or element referred to must have a particular orientation or be constructed and operated in a particular orientation, and therefore cannot be construed as limiting the scope of protection of the present application. The orientation terms "inner", "outer" refer to the inner and outer relative to the contour of the parts themselves.

[0034] For the convenience of description, spatial relative terms such as "over", "above", "upper surface", "upper", and the like can be used herein to describe the spatial positional relationship of one device or feature with respect to other devices or features as shown in the drawings. It should be understood that the spatial relative terms are intended to include different orientations in use or operation in addition to the orientation of the device as described in the drawings. For example, if the device in the drawings is inverted, the device described as "above" or "over" other devices or structures will be positioned "below" or "under" the other devices or structures. Thus, the exemplary term "above" can include both "above" and "below" orientations. The device can also be positioned in other different ways (rotated 90 degrees or in other orientations), and the spatial relative descriptions used herein are interpreted accordingly.

[0035] In addition, it should be noted that the use of the terms "first", "second", and the like, to describe various components, do not necessarily indicate that the components are limited to the above terms, and therefore should not be construed as limiting the scope of protection of the present application.

[0036] As Figure 1As shown in the figure, the application provides a transient milling temperature testing device which can follow the wear of the tool-chip contact, comprising: a milling blade 5, a T-shaped milling tool handle 1 which is connected with the milling blade 5, a temperature collection and transmission terminal which is embedded in the T-shaped milling tool handle 1, a wear-following thin film thermocouple temperature sensor 6 which is embedded on the rake face of the milling blade 5, the thin film thermocouple temperature sensor 6 is connected with the signal input end of the temperature collection and transmission terminal through a compensation lead wire 4, the heat potential generated by cutting is transmitted, the heat potential is converted into a temperature signal by the temperature collection and transmission terminal, and the temperature signal is wirelessly transmitted to the PC terminal on the machine position, so as to realize the real-time measurement of the milling temperature.

[0037] In specific implementation, as a preferred embodiment of the application, as shown in Figure 3 The milling blade 5 is made of hard alloy, is fixed on the T-shaped milling tool handle through a fastening screw 7, and the rake face of the milling blade 5 is provided with a wedge-shaped groove for placing the wear-following thin film thermocouple temperature sensor 6.

[0038] In specific implementation, as a preferred embodiment of the application, as shown in Figure 4 、 5 The wear-following thin film thermocouple temperature sensor 6 comprises a ceramic substrate 6-1 which is made of 99 alumina ceramic material, a first compensation lead wire 4-2 and a second compensation lead wire 4-1 which are fixed in the substrate 6-1, a first thermoelectric electrode thin film 6-2 and a second thermoelectric electrode thin film 6-3 which are sequentially deposited on the substrate 6-1, and a protective thin film 6-4 which is deposited on the second thermoelectric electrode thin film 6-3; the second thermoelectric electrode thin film 6-3 is overlapped on the first thermoelectric electrode thin film 6-2, and the overlapped area is formed as a wear-following hot junction area 6-5.

[0039] In specific implementation, as a preferred embodiment of the application, the first thermoelectric electrode thin film 6-2 is made of a NiCr thin film; the second thermoelectric electrode thin film 6-3 is made of a NiSi thin film; the first compensation lead wire 4-2 is made of a NiCr lead wire; the second compensation lead wire 4-1 is made of a NiSi lead wire; and the protective thin film 6-4 is made of a SiO2 thin film.

[0040] In specific implementation, as a preferred embodiment of the application, as shown in Figure 2As shown, the T-shaped milling cutter handle 1 is provided with a square slot 1-4 for placing a temperature acquisition and emission terminal fixing assembly, and the temperature acquisition and emission terminal is fixed inside the temperature acquisition and emission terminal fixing assembly 2. The T-shaped milling cutter handle 1 is also provided with two bolt grooves 1-1 and a first compensation lead wire through hole 1-2; and the connection between the T-shaped milling cutter handle 1 and the milling cutter blade 5 is provided with a second compensation lead wire through hole 1-3. The T-shaped milling cutter handle 1 adopts a standard T-shaped numerical control handle, and the model of the numerical control handle is ATS 60-C40-H28-160-4T, and the length of the numerical control handle 1 is selected according to the size of the temperature acquisition and emission terminal fixing assembly 2.

[0041] In specific implementation, as a preferred embodiment of the present application, as shown in Figure 6 As shown, the temperature acquisition and emission terminal fixing assembly 2 is in the shape of a hollow cuboid, and is provided with through holes on the left and right sides, respectively. The two sides are in interference fit between the two bolt grooves 1-1 of the handle and the bolt, for fixing the temperature acquisition and emission terminal. After loading the temperature acquisition terminal, the intelligent milling cutter can maintain dynamic balance during processing, and the lead wire through hole 2-1 is provided on the lower side wall. The temperature acquisition and emission terminal fixing assembly 2 is processed into a cuboid shell by wire cutting technology and laser welding technology.

[0042] In specific implementation, as a preferred embodiment of the present application, in order to reduce the interference of wireless data transmission signals, the temperature acquisition and emission terminal fixing assembly is made of polytetrafluoroethylene.

[0043] In summary, the present application can be applied to the measurement of transient milling temperature. The present application provides a transient milling temperature testing device that can follow the wear of the tool-chip contact. The thin film thermocouple temperature sensor that can follow the wear is embedded on the rake face of the milling cutter blade, which can be easily disassembled and replaced, and the thin film thermocouple temperature sensor can wear together with the milling cutter blade, so that the sensor can monitor the transient temperature of the contact area between the milling cutter rake face and the chip in real time. The temperature acquisition and emission device is embedded in the milling cutter handle, and the temperature is transmitted to the pc end in real time in the form of a changing curve during the milling process. Therefore, the present application has the advantages of being detachable, replaceable, self-renewable thermal junction, fast dynamic response speed, high sensitivity, accurate and real-time measurement of transient temperature of the milling processing area, etc. The present application provides a new method for transient milling temperature testing, and provides a new technical approach for the research and development of intelligent milling temperature measuring tools.

[0044] It should be noted that the above embodiments are only used to illustrate the technical solutions of the present application, and are not intended to limit the present application; although the present application has been described in detail with reference to the above embodiments, those skilled in the art should understand that the technical solutions recorded in the above embodiments can be modified, or some or all of the technical features can be replaced by equivalents; and these modifications or replacements do not make the essence of the corresponding technical solutions deviate from the scope of the technical solutions of the embodiments of the present application.

Claims

1. A transient milling temperature test device that can follow the tool-chip contact wear, characterized by, The application relates to a transient milling temperature testing device which comprises the following parts: a milling blade, a T-shaped milling cutter handle matched with the milling blade, a temperature acquisition and transmission terminal embedded in the T-shaped milling cutter handle, and a thin film thermocouple temperature sensor capable of following wear and embedded on a rake face of the milling blade. A square groove is arranged on the T-shaped milling cutter handle and used for placing a temperature acquisition and transmission terminal fixing assembly. The milling blade is made of hard alloy, a wedge-shaped groove is arranged on the rake face of the milling blade and used for placing the thin film thermocouple temperature sensor capable of following wear, the thin film thermocouple temperature sensor directly participates in cutting together with the milling blade, and the transient temperature of a contact area between the rake face of the milling blade and a chip can be measured. The thin film thermocouple temperature sensor comprises a wedge-shaped ceramic base made of 99 alumina ceramic material, first and second compensation wires fixed in the base, first and second thermoelectric electrode thin films deposited on the base in sequence, and a protective thin film deposited on the two thermoelectric electrode thin films. The second thermoelectric electrode thin film is overlapped on the first thermoelectric electrode thin film, and an overlapped area is formed into a hot junction area capable of following wear. The thin film thermocouple temperature sensor is a detachable and replaceable independent structure. The thin film thermocouple temperature sensor is embedded in the rake face of the milling blade, the hot junction of the sensor can follow wear, the sensor can be detached and replaced, the problem that the traditional measurement method cannot measure the temperature of the contact area between the rake face of the tool and the chip is solved, the temperature acquisition and transmission terminal is embedded in the handle, and the temperature signal can be transmitted to a PC end in a real time mode through wireless transmission in the milling process. Two bolt grooves and a first compensation wire through hole are arranged on the T-shaped milling cutter handle.

2. The instantaneous milling temperature test device of followable tool-chip contact wear according to claim 1, characterized in that, The temperature acquisition and transmission terminal fixing assembly is in a hollow cuboid shape, through holes are arranged on left and right sides, and two bolts are in interference fit between the two bolt grooves and the handle.

3. The instantaneous milling temperature test device of followable tool-chip contact wear according to claim 1, characterized in that, The first compensation wire through hole and the wire through hole correspond to each other.

4. The instantaneous milling temperature test device of followable tool-chip contact wear according to claim 2, characterized in that, The temperature acquisition and transmission terminal fixing assembly is made of polytetrafluoroethylene material.

5. The instantaneous milling temperature test device of followable tool-chip contact wear according to claim 3, characterized in that, The first thermoelectric electrode thin film is made of a NiCr thin film, the second thermoelectric electrode thin film is made of a NiSi thin film, the first compensation wire is made of a NiCr lead wire, the second compensation wire is made of a NiSi lead wire, and the protective thin film is made of a SiO2 thin film.

6. The instantaneous milling temperature test device of followable tool-chip contact wear according to claim 1, characterized in that, ​

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