A visual inspection device for automatically identifying the appearance defects of capacitors

Abstract

The present invention discloses a vision inspection device for automatically identifying the appearance defects of capacitors, which includes a main frame, a vibrating feeding tray, a feeding track, a feeding tray, an inspection tray, pin detection, bottom contour detection, bottom defect detection, top contour detection, top defect detection, top pin solder joint defect detection, external detection, bottom defect rejection port, pin defect rejection port, top defect rejection port, external defect rejection port, qualified product recovery port, defect finished product material centralized collection port, etc. The vision inspection device adopts intermittent movement, and each inspection station will pause for static camera photographing to record problems. After the feeding tray rejects the capacitors with bottom defects, the capacitors are sent to the inspection tray for further detection and screening, solving the problem of material dropping caused by emergency shutdown or the inability of the capacitors to stand firmly due to convex points at the bottom, improving the detection accuracy, and avoiding problems such as false detection, missed detection, wrong detection, material dropping, and inconsistent problem points in secondary re-inspection.

Description

Technical Field

[0001] The present invention relates to the technical field of detection equipment, and specifically provides a vision detection equipment for automatically identifying the appearance defects of capacitors. Background Art

[0002] In large-scale modern industrial production, various electronic products have entered people's vision and all aspects of life, greatly enriching our material life and promoting the development of production. At present, China is in a period of rapid development of the manufacturing industry. The infrastructure construction of detection equipment is relatively weak and still in the extensive stage. For example, the appearance detection of capacitors is still in the semi-automatic detection stage, which requires a large amount of manpower to participate. Among the electronic products used in various industries, the sizes of capacitors to be used vary due to different industries. These capacitors are all detected manually. Larger capacitors, such as those with a diameter within 15 - 30 mm, can have their appearance defects detected by the human eye. However, for small capacitors, such as those with a diameter within 4 - 10 mm, manual detection by the human eye is prone to misdetection and missed detection. These detections vary from person to person, resulting in different differences in efficiency and quality. In order to reduce these impacts and improve efficiency, production enterprises need to provide specialized training for operators, and also need a large number of actual operations on the production line. This not only increases the production cost, but also places higher and higher requirements on operators, seriously affecting the production progress and unable to meet the enterprise's goal of pursuing high quality and high efficiency. How to detect capacitors efficiently and accurately? One of the existing devices is mainly manual detection, and the other capacitor appearance defect detection device uses continuous feeding detection. The inspection tray drives the capacitors to rotate continuously through each vision detection point for continuous detection. When taking pictures of the capacitors during movement, problems such as blurred images are likely to occur, resulting in low detection accuracy, false detection, missed detection, misdetection, dropping of materials, and inconsistent problem points in secondary re-inspection. Moreover, its structure transports the capacitors to the transparent glass inspection tray through a vibrating feeding tray and a conveying track. However, the detection of capacitors requires a full 360-degree non-blind-spot detection. When using continuous feeding detection, the capacitors are not supported. When there is an emergency stop or when the bottom of the capacitor has a raised point and cannot stand firmly, it will cause the problem of dropping materials, which seriously affects the normal continuous operation of the equipment for detection. This has become an issue that cannot be ignored by today's capacitor manufacturers in terms of product economic effects.

[0003] Therefore, production enterprises urgently need a new type of vision detection equipment for automatically identifying the appearance defects of capacitors to solve the above problems. Summary of the Invention

[0004] The purpose of the present invention is to provide a vision detection equipment for automatically identifying the appearance defects of capacitors to solve the technical problems raised in the above background art.

[0005] To achieve the above object, the present invention provides the following technical solution: A vision inspection device for automatically identifying the appearance defects of capacitors, comprising:

[0006] A main frame;

[0007] The feeding mechanism includes a feeding tray and a feeding track. The feeding tray is fixed on one side of the main frame, and the feeding track is fixed on the main frame for transporting capacitors.

[0008] A feeding disk, rotatably fixed on the main frame. There are at least two or more tooth grooves on the side of the feeding disk. A first suction nozzle is arranged in the tooth groove. The feeding track transports the capacitor to the position of the tooth groove. A first detection device and a bottom defect removal port are sequentially installed along the clockwise direction on the outer side of the feeding disk. The feeding disk moves intermittently in the clockwise direction;

[0009] An inspection disk, rotatably fixed on the other side of the feeding disk. There are at least two or more second suction nozzles arranged on the inspection disk. The tooth groove is vertically tangent to the second suction nozzle, so that the capacitor at the feeding disk is transported to the inspection disk. A second detection device, a defect removal port and a qualified product recovery port are sequentially arranged along the counterclockwise direction on the outer side of the inspection disk. The inspection disk moves intermittently in the counterclockwise direction;

[0010] A material centralized collection port, fixed on the other side of the main frame, and connected to the ends of the bottom defect removal port, the defect removal port and the qualified product recovery port.

[0011] Preferably, the feeding disk is provided with a first solenoid valve controlling a vacuum generator corresponding to each first suction nozzle, and the inspection disk is provided with a second solenoid valve controlling a vacuum generator corresponding to each second suction nozzle.

[0012] Preferably, a fiber optic detection switch is further fixedly arranged at the bottom of the tangent position between the feeding disk and the feeding track.

[0013] Preferably, the first detection device includes a pin detection device and a bottom defect detection device. The pin detection device, the bottom defect detection device and the bottom defect removal port are sequentially arranged along the clockwise direction.

[0014] Preferably, the bottom defect detection device includes a bottom contour detection device and a bottom defect detection device arranged sequentially in the clockwise direction.

[0015] Preferably, the second detection device includes a top detection device and an external detection device arranged sequentially in the counterclockwise direction.

[0016] Preferably, the top detection device includes a top contour detection device, a top defect detection device, and a top pin soldering defect detection device arranged in a counterclockwise direction in sequence.

[0017] Preferably, air nozzles are provided at the defect removal opening, the bottom defect removal opening, and the qualified product recovery opening.

[0018] Preferably, the defect removal opening includes a pin defect removal opening, a top defect removal opening, and an external defect removal opening arranged in a counterclockwise direction in sequence. The ends of the pin defect removal opening, the top defect removal opening, and the external defect removal opening are connected to the material centralized collection opening.

[0019] Preferably, the tooth grooves of the feeding tray are set in a stepped manner and are integrally coated black.

[0020] Compared with the prior art, the beneficial effects of the present invention are as follows:

[0021] 1. Adopting a step-by-step feeding structure, solenoid valves are arranged on the overall feeding tray and the material inspection tray to control the vacuum generator. The capacitor is sucked by the vacuum and driven to move forward intermittently, preventing the capacitor from being thrown out during sudden acceleration and sudden stop.

[0022] 2. Before entering the material inspection tray, capacitors with bottom protrusions or bottom depressions are removed first, solving the problem of material dropping caused by emergency shutdown or the inability of the capacitor to stand firm due to a raised point at the bottom of the capacitor.

[0023] 3. The feeding tray and the material inspection tray perform intermittent movement through the operation of the motor at the bottom. When reaching each detection station, they stop to take static camera photos to record problems and then continue intermittent movement, improving the detection accuracy and avoiding problems such as false detection, missed detection, wrong detection, material dropping, and inconsistent problem points in secondary re-inspection.

[0024] 4. The overall layout of the detection equipment is compact, and the operation is convenient and simple. Description of the Drawings

[0025] Figure 1 It is a schematic structural diagram of a vision detection device for automatically identifying the appearance defects of capacitors according to the present invention;

[0026] Figure 2 It is a three-dimensional structural diagram of the feeding track of a vision detection device for automatically identifying the appearance defects of capacitors according to the present invention;

[0027] Figure 3 It is a front view of the material tray and the feeding track of a vision detection device for automatically identifying the appearance defects of capacitors according to the present invention;

[0028] Figure 4Partial enlarged schematic view of the feeding tray and the feeding track at position A of a vision inspection device for automatically identifying capacitance appearance defects according to the present invention;

[0029] Figure 5 Front view of the feeding tray of a vision inspection device for automatically identifying capacitance appearance defects according to the present invention;

[0030] Figure 6 Cross-sectional view taken along line A-A of the feeding tray of a vision inspection device for automatically identifying capacitance appearance defects according to the present invention;

[0031] Figure 7 Partial enlarged schematic view at position I of the feeding tray of a vision inspection device for automatically identifying capacitance appearance defects according to the present invention;

[0032] Figure 8 Stereoscopic schematic view of the feeding tray and the feeding track of a vision inspection device for automatically identifying capacitance appearance defects according to the present invention;

[0033] Figure 9 Stereoscopic structure schematic view of the inspection tray of a vision inspection device for automatically identifying capacitance appearance defects according to the present invention;

[0034] Figure 10 Stereoscopic structure schematic view of the material centralized collection port of a vision inspection device for automatically identifying capacitance appearance defects according to the present invention;

[0035] Figure 11 Stereoscopic structure schematic view of the bottom defect rejection port of a vision inspection device for automatically identifying capacitance appearance defects according to the present invention;

[0036] Figure 12 Partial enlarged schematic view at position A of the bottom defect rejection port of a vision inspection device for automatically identifying capacitance appearance defects according to the present invention. Detailed implementation manners

[0037] Next, the technical solutions in the embodiments of the present invention will be clearly and completely described in conjunction with the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only a part of the embodiments of the present invention, rather than all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by those of ordinary skill in the art without creative efforts shall fall within the protection scope of the present invention.

[0038] Please refer to Figures 1-7 , the present invention provides a technical solution: a vision inspection device for automatically identifying capacitance appearance defects, including:

[0039] Main frame 1;

[0040] The feeding mechanism includes a vibrating feeding tray 2 and a feeding track 3. The vibrating feeding tray 2 is fixed on one side of the main frame 1, and the feeding track 3 is fixed on the main frame 1. The tail end of the vibrating feeding tray 2 is connected to the feeding track 3, which is used to convey capacitors to achieve capacitor feeding. Specifically, a limiting groove 3.1 and a capacitor guiding cylinder 14 are provided on the feeding track 3, so that the capacitor pins face upward and the bottom faces downward, and are conveyed in a fixed direction to the feeding tray 4 to ensure that the capacitor will not fall or flip during the conveying process.

[0041] The feeding tray 4 is rotatably fixed on the main frame 1. At least two or more tooth grooves 4.1 are provided on the side surface of the feeding tray 4. A first suction nozzle 16 is provided in the tooth groove 4.1. When the feeding track 3 conveys the capacitor to the tooth groove 4.1, the first suction nozzle 16 sucks the capacitor. A first detection device and a bottom defect removal port 7 are sequentially installed on the outer side of the feeding tray 4 in the clockwise direction. The feeding tray 4 moves intermittently in the clockwise direction, and the intermittent movement is carried out by the operation of a motor provided at the bottom of the feeding tray 4. It stops for a moment when it moves one station, that is, the distance of one tooth groove 4.1, and then moves to the next station. More specifically, a first solenoid valve controls a vacuum generator 17, which corresponds to and controls the first suction nozzle 16 one by one, and is used to control the first suction nozzle 16 to disconnect or close the vacuum. The negative pressure vacuum pumping method is used to suck the capacitor from the side. When the feeding track 3 conveys the capacitor into the tooth groove 4.1 of the feeding tray 4, the first suction nozzle 16 sucks the capacitor from the side to prevent the capacitor from falling off during the intermittent movement. More specifically, a fixedly installed optical fiber detection switch 13 is also provided at the tangent point between the feeding tray 4 and the feeding track 3. The feeding tray 4 stops at the optical fiber detection switch 13 every time it advances one pitch, that is, the distance of one tooth groove 4.1, so that the optical fiber detection switch 13 can detect whether a capacitor has entered the tooth groove 4.1 of the feeding tray after feeding. If not, the optical fiber detection switch 13 sends information to the industrial control computer to control the first solenoid valve to control the vacuum generator 17 to disconnect the vacuum or send an alarm message if it fails to detect twice continuously, further ensuring the normal operation of the equipment.

[0042] The material inspection tray 8 is rotatably fixed on the other side of the feeding tray 4. There are at least two or more second suction nozzles 8.1 provided on the material inspection tray 8. The second suction nozzles 8.1 are arranged opposite to the tooth grooves 4.1, one below and one above, so that the capacitors on the feeding tray 4 are transported to the material inspection tray 8. A second detection device, a defective product rejection port, and a qualified product recovery port 11.3 are sequentially arranged along the counterclockwise direction on the outer side of the material inspection tray 8. The material inspection tray 8 moves intermittently in the counterclockwise direction. The intermittent movement is carried out by the operation of the motor at the bottom of the material inspection tray 8. It pauses for the distance of one suction nozzle port 8.1 for one working position and then moves to the next working position, that is, the motors under the feeding tray 4 and the material inspection tray 8 are controlled to operate synchronously through the program bus of the industrial control computer. More specifically, a second solenoid valve for controlling a vacuum generator 18 is provided on the material inspection tray 8 corresponding to each of the second suction nozzles 8.1. The second solenoid valve for controlling the vacuum generator 18 is used to control the second suction nozzle 8.1 to break or close the vacuum. More specifically, the second suction nozzle 8.1 of the material inspection tray 8 is made of transparent PC material, so that after the second suction nozzle 8.1 sucks the capacitor, the capacitor can still be illuminated from the bottom to facilitate inspection.

[0043] The material centralized collection port 12 is fixed on the other side of the main frame 1 and is provided with a plurality of tracks, which are connected to the ends of the bottom defective product rejection port 7, the defective product rejection port, and the qualified product recovery port 11.3.

[0044] Specifically, the first detection device includes a pin detection device 5 and a bottom defect detection device. The pin detection device 5, the bottom defect detection device, and the bottom defective product rejection port 7 are sequentially arranged along the clockwise direction. When there are defects or unevenness at the bottom of the capacitor, the bottom surface of the capacitor cannot be sealed with the second suction nozzle 8.1, and there will be unstable feeding, pouring, and insufficient suction phenomena. Seriously, it will affect the stability of the whole machine. Therefore, when the bottom defect detection device detects that there are defects in the capacitor, when the defective capacitor rotates to the bottom defective product rejection port 7, the first suction nozzle 16 on the feeding tray 4 disconnects the vacuum of the vacuum generator 17 through the first solenoid valve, and transports the capacitor with bottom defects to the bottom defective product rejection port 7. Specifically, the tooth groove 4.1 is designed in a stepped shape and coated black. Since the pin detection device 5 uses a camera to take pictures, when taking a side view using the black background color of the first tooth groove 4.1 as a whole, at this time the capacitor pins are white and are more obvious in the black background, and it can accurately judge whether there are defects such as bending of the capacitor pins. At the same time, it can also make the overall structure of the visual inspection equipment for automatically identifying capacitor appearance defects more compact.

[0045] Specifically, the bottom defect detection device includes a bottom contour detection device 6 and a bottom defect detection device 6.1 arranged in a counterclockwise direction in sequence. More specifically, the bottom contour detection device 6 uses a laser scanning device to detect whether the contour shape of the capacitor is smooth and complete through an algorithm. The bottom defect detection device 6.1 uses a hemispherical lampshade, and a camera is arranged inside the lampshade, which can achieve 360° lighting to make the detection more accurate. The bowl-shaped structure can shield the interference of external light sources on visual detection and improve the accuracy of each detection, and is used to detect whether there are protrusions or depressions at the bottom of the capacitor. After being detected by the bottom contour detection device 6 and the bottom defect detection device 6.1 and classified, the capacitors will not have problems such as uneven bottoms or unqualified bottoms, so as to screen for subsequent entry into the inspection tray 8. More specifically, an air nozzle 19 is also arranged at the bottom defect removal port 7. When the bottom contour detection device 6 and the bottom defect detection device 6.1 detect that the capacitor is defective, the industrial control computer can control the air nozzle 19 to blow air to further ensure that the defective capacitors fall into the bottom defect removal port 7.

[0046] Specifically, the second detection device includes a top detection device and an external detection device 10 arranged in a counterclockwise direction in sequence. The top detection device includes a top contour detection device 9, a top defect detection device 9.1, and a top pin soldering point defect detection device 9.2 arranged in a counterclockwise direction in sequence. Specifically, the top contour detection device 9 uses a laser scanning device to detect whether the top contour is smooth and complete through an algorithm. The top defect detection device 9.1, the top pin soldering point defect detection device 9.2, and the external detection device 10 use hemispherical lampshades, and cameras are arranged inside the lampshades, which can achieve 360° lighting to make the detection more accurate. The bowl-shaped structure can shield the interference of external light sources on visual detection and improve the accuracy of each detection. More specifically, the top defect detection device 9.1 mainly detects whether there are protrusions or depressions at the top of the capacitor, the top pin soldering point defect detection device 9.2 mainly detects whether there are cases of missing soldering at the pin soldering points, and the external detection device 10 mainly detects whether there are defects around the capacitor.

[0047] Specifically, the defect removal openings include a pin defect removal opening 11, a top defect removal opening 11.1, and an external defect removal opening 11.2 arranged counterclockwise in sequence. The ends of the pin defect removal opening 11, the top defect removal opening 11.1, and the external defect removal opening 11.2 are respectively and correspondingly connected to multiple tracks of the material centralized collection opening 12. When the second suction nozzle 8.1 of the inspection tray 8 rotates to the pin defect removal opening 11, the top defect removal opening 11.1, and the external defect removal opening 11.2, the defective capacitors detected by the pin detection 5, the top contour detection device 9, the top defect detection device 9.1, the top pin solder joint defect detection device 9.2, the external detection 10, etc. are removed to the corresponding material centralized collection opening 12 for classification of product appearance defects. Through program control, when the vision detects a problem with the pins, a record of the pin problem will be sent to the industrial control computer. Then, when a problem with the top solder joint is found during the top inspection, a record of the top solder joint problem will be attached after the pin problem record, that is, the second problem point will be recorded. When this capacitor moves to the pin removal opening, this capacitor will be removed according to the first problem point (preferably according to the first problem point rather than the second problem). At this time, two problem points will be recorded on the industrial control computer. And so on. When the user queries the problems, they will know the proportion of problems that are likely to occur during the production of more capacitors, realizing targeted management. More specifically, the defect removal openings include a pin defect removal opening 11, a top defect removal opening 11.1, and an external defect removal opening 11.2 arranged counterclockwise in sequence; more specifically, air nozzles (not specifically shown in the figure one by one) are provided at the pin defect removal opening 11, the top defect removal opening 11.1, the external defect removal opening 11.2, and the qualified product recovery opening 11.3 to further ensure the effective removal and recovery of capacitors.

[0048] Working principle:

[0049] First, feed the components onto the feeding track 3 through the vibrating feeding tray 2. Then, convey the capacitors through the feeding track 3 to the tooth grooves 4.1 of the feeding tray 4. At this time, the first solenoid valve controls the vacuum generator 17 to use negative pressure to evacuate the air, so that the first suction nozzle 16 can suck the capacitor from the side to prevent it from falling off during intermittent movement. At this time, the feeding tray 4 performs intermittent movement through the motor at the bottom, moving one station and pausing, then moving another station. When passing through the first pin detection 5 station, it pauses for static camera photographing to record problems. Then it continues intermittent movement to the bottom contour detection device 6 and the bottom defect detection device 6.1 stations, where it pauses for static camera photographing to record problems. When it reaches the bottom rejection port 7 station, it pauses to reject bottom defects such as bottom protrusions and bottom depressions that occurred during the previous bottom detection 6. At this time, the capacitors that have been sorted will not have problems such as uneven bottoms or unqualified bottoms, which are screened for subsequent entry into the inspection tray 8. Capacitors without defects will be exchanged with each other at the tangent point between the feeding tray 4 and the inspection tray 8. The first suction nozzle 16 on the feeding tray 4 disconnects the vacuum of the vacuum generator 17 through the first solenoid valve. The second suction nozzle 8.1 on the bottom of the inspection tray 8 opens the vacuum of the vacuum generator 18 through the second solenoid valve to suck the bottom of the capacitor to prevent it from falling off during intermittent movement. The inspection tray 8 performs intermittent movement through the motor at the bottom and successively moves to stations such as the top contour detection device 9, the top defect detection device 9.1, and the top pin soldering defect detection device 9.2, pausing for static camera photographing to record problems and then continuing intermittent movement. When passing through the external detection device 10 station, it pauses for static camera photographing to record problems. When it reaches the pin defect rejection port 11, the capacitors with problems detected by the pin detection 5 device are rejected into the material centralized collection port 12. When it reaches the top defect rejection port 11.1, the defective capacitors detected by the top contour detection 9, the top defect detection 9.1, and the top pin soldering defect detection 9.2 are rejected into the material centralized collection port 12. When it reaches the external defect rejection port, the defective capacitors detected by the external detection device 10 are rejected into the material centralized collection port 12, realizing the classification of product appearance defects one by one. The capacitors that are detected to be qualified without defects are recycled to the material centralized collection port 12 through the qualified product recovery port 11.3.

[0050] Although the embodiments of the present invention have been shown and described, it will be understood by those of ordinary skill in the art that various changes, modifications, substitutions, and variations can be made to these embodiments without departing from the principles and spirit of the present invention. The scope of the present invention is defined by the appended claims and their equivalents.

Claims

1. A visual inspection device for automatically identifying the appearance defects of capacitors, characterized in that, it includes: A main frame; The feeding mechanism includes a feeding tray and a feeding track. The feeding tray is fixed on one side of the main frame, and the feeding track is fixed on the main frame for transporting capacitors; A feeding disk, rotatably fixed on the main frame. There are at least two or more tooth grooves on the side of the feeding disk, and a first suction nozzle is arranged in the tooth groove. The feeding track transports the capacitor to the tooth groove. Along the clockwise direction, a first detection device and a bottom defect removal port are sequentially installed on the outer side of the feeding disk; the feeding disk moves intermittently in the clockwise direction; An inspection disk, rotatably fixed on the other side of the feeding disk. There are at least two or more second suction nozzles arranged on the inspection disk. The tooth groove is arranged perpendicular to and tangent to the second suction nozzle, so that the capacitor at the feeding disk is transported to the inspection disk. Along the counterclockwise direction, a second detection device, a defect removal port and a qualified product recovery port are sequentially arranged on the outer side of the inspection disk; the inspection disk moves intermittently in the counterclockwise direction; A material centralized collection port, fixed on the other side of the main frame, and connected to the ends of the bottom defect removal port, the defect removal port and the qualified product recovery port; The first detection device includes a pin detection device and a bottom defect detection device. The pin detection device, the bottom defect detection device and the bottom defect removal port are sequentially arranged along the clockwise direction; The feeding disk is provided with a first solenoid valve controlled vacuum generator corresponding to and controlling the first suction nozzle one by one, and the inspection disk is provided with a second solenoid valve controlled vacuum generator corresponding to and controlling the second suction nozzle one by one.

2. The visual inspection device for automatically identifying the appearance defects of capacitors according to claim 1, characterized in that: A fiber optic detection switch is also fixedly arranged at the bottom where the feeding disk is tangent to the feeding track.

3. The visual inspection device for automatically identifying the appearance defects of capacitors according to claim 1, characterized in that: The bottom defect detection device includes a bottom contour detection device and a bottom defect detection device arranged sequentially in the clockwise direction.

4. The visual inspection device for automatically identifying the appearance defects of capacitors according to claim 1, characterized in that: The second detection device includes a top detection device and an external detection device arranged sequentially in the counterclockwise direction.

5. The visual inspection device for automatically identifying the appearance defects of capacitors according to claim 4, characterized in that: The top detection device includes a top contour detection device, a top defect detection device and a top pin soldering defect detection device arranged sequentially in the counterclockwise direction.

6. The visual inspection device for automatically identifying the appearance defects of capacitors according to claim 1, characterized in that: Air nozzles are arranged at the defect removal port, the bottom defect removal port and the qualified product recovery port.

7. The visual inspection device for automatically identifying the appearance defects of capacitors according to claim 1, characterized in that: The defect removal openings include a pin defect removal opening, a top defect removal opening, and an external defect removal opening that are arranged counterclockwise in sequence. The ends of the pin defect removal opening, the top defect removal opening, and the external defect removal opening are connected to the material centralized collection opening.

8. The visual inspection device for automatically identifying the appearance defects of capacitors according to claim 1, characterized in that: The tooth grooves of the feeding tray are arranged in a stepped manner and are integrally coated with black.

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