Automatic analyzer, method for determining contamination of reaction cup thereof, and storage medium

Abstract

An automatic analyzer, a method for determining contamination of a reaction cup of the automatic analyzer, and a storage medium, take the gap between at least one adjacent reaction cup as a calibration site or take at least one placement site not used for placing a reaction cup as a calibration site, can measure the transmittance of the reaction cup in real time according to the light source background intensity collected at the calibration site, and output prompt information that the reaction cup is contaminated to prompt that the reaction cup is contaminated when it is judged that the transmittance meets a preset abnormal condition, which can avoid affecting the measurement result. Moreover, the light source background intensity obtained on the calibration site can accurately reflect the real-time spectral intensity of the light source, so that the transmittance of the reaction cup calculated by using the light source background intensity obtained on the calibration site and the measured cup blank light intensity of the reaction cup in each cup blank measurement period is more accurate, and the contamination of the reaction cup can be more accurately judged.

Description

Technical Field

[0001] This invention relates to the field of in vitro diagnostic technology, specifically to an automated analyzer and a method for determining contamination of its reaction cups and a storage medium. Background Technology

[0002] Automated analyzers are analytical instruments with high sensitivity and specificity. Taking the fully automated biochemical analyzer commonly used in clinical laboratories as an example, it is frequently used to detect various analytical indicators in blood, urine, or other bodily fluids. Fully automated biochemical analyzers calculate the concentration of the sample by measuring the absorbance of the reaction solution in the reaction vessel. Since the measurement beam passes through the reaction vessel, contamination of the reaction vessel can significantly affect the measurement results. Therefore, it is necessary to assess the contamination status of the reaction vessel before measuring the sample to avoid affecting the measurement results due to contamination. Summary of the Invention

[0003] This application provides an automatic analyzer and a method and storage medium for determining reaction vessel contamination, to detect whether the reaction vessel is contaminated and avoid the impact of reaction vessel contamination on measurement results.

[0004] One embodiment provides an automatic analyzer, including an optical measurement component, a reaction component, a processor, and an output device;

[0005] The photometric component includes a light source assembly and a detection unit. The light source assembly is used to emit a light beam of at least one wavelength and illuminate the detection position with the light beam. The detection unit is used to collect the light beam passing through the detection position and output an electrical signal according to the spectral intensity of the light beam.

[0006] The reaction component is connected to the processor and includes multiple placement positions for placing reaction cups and at least one calibration position. Under the control of the processor, the reaction component schedules the multiple placement positions and at least one calibration position to the detection position according to a set time sequence during each cup blank measurement cycle, so that the object under test at the placement position or calibration position is irradiated by the light beam.

[0007] The processor is also connected to the detection unit and the output device respectively, and is used to receive the electrical signal output by the detection unit, obtain the cup blank light intensity of the reaction cup at the placement position according to the electrical signal output by the detection unit when the test object at the placement position is irradiated by the light beam, obtain the background intensity of the light source according to the electrical signal output by the detection unit when the test object at the calibration position is irradiated by the light beam, calculate the transmittance of the reaction cup according to the cup blank light intensity and the background intensity of the light source, and send a prompt message that the reaction cup is contaminated to the output device when it is determined that the transmittance meets the preset abnormal conditions.

[0008] The output device is used to output a warning message indicating that the reaction vessel is contaminated.

[0009] One embodiment provides a method for determining contamination in the reaction cup of an automated analyzer, comprising:

[0010] The control reaction unit schedules multiple placement positions and at least one calibration position to the detection position according to a set time sequence during each cup blank measurement cycle, so that the object under test at the placement position or calibration position is irradiated by the light beam;

[0011] The receiving and detection unit outputs an electrical signal based on the spectral intensity of the light beam passing through the detection position.

[0012] The cup blank light intensity of the reaction cup at the placement position is obtained from the electrical signal output by the detection unit when the object under test at the placement position is irradiated by the light beam.

[0013] The background intensity of the light source is obtained from the electrical signal output by the detection unit when the object under test at the calibration position is irradiated by the light beam;

[0014] The transmittance of the reaction cup is calculated based on the blank light intensity of the cup and the background intensity of the light source;

[0015] When it is determined that the transmittance meets the preset abnormal conditions, a prompt message indicating that the reaction cup is contaminated is sent to the output device.

[0016] One embodiment provides a computer-readable storage medium including a program that can be executed by a processor to implement the method described above.

[0017] According to the automatic analyzer and its method for determining reaction cup contamination and storage medium of the above embodiments, at least one gap between adjacent reaction cups is used as a calibration position, or at least one placement position not used for placing reaction cups is used as a calibration position. The transmittance of the reaction cup can be measured in real time based on the background intensity of the light source acquired at the calibration position. The transmittance of the reaction cup is used to determine whether it is contaminated, and a prompt is given when contamination is detected. Based on this prompt, timely actions such as replacing the contaminated reaction cup can be taken, thereby avoiding any impact on the measurement results. Since the background intensity of the light source obtained at the calibration position can accurately reflect the real-time spectral intensity of the light source, the transmittance of the reaction cup calculated by using the background intensity of the light source obtained at the calibration position and the measured cup blank light intensity in each cup blank measurement cycle is more accurate, and the contamination status of the reaction cup can be determined more accurately. Attached Figure Description

[0018] Figure 1 This is a schematic diagram of the structure of an automatic analyzer according to an embodiment of this application;

[0019] Figure 2 This is a schematic diagram of the measurement optical path of an automatic analyzer based on filter spectral dispersion according to an embodiment of this application;

[0020] Figure 3 This is a schematic diagram of the measurement optical path of an automatic analyzer based on grating spectroscopy according to an embodiment of this application;

[0021] Figure 4 This is a schematic diagram of the measurement optical path when the automatic analyzer based on filter spectral dispersion detects the calibration position according to an embodiment of this application.

[0022] Figure 5 This is a schematic diagram of the reactive cup chain structure according to an embodiment of this application;

[0023] Figure 6 This is a flowchart illustrating a light source monitoring method for an automatic analyzer according to an embodiment of this application;

[0024] Figure 7 This is a flowchart of another method for monitoring the light source of an automatic analyzer according to an embodiment of this application;

[0025] Figure 8 This is a flowchart illustrating a calibration method for an automatic analyzer according to an embodiment of this application;

[0026] Figure 9 This is a schematic diagram illustrating the stabilization process of the spectral intensity of various wavelengths after the halogen lamp is powered on, according to an embodiment of this application.

[0027] Figure 10 This is a schematic diagram of the stabilization process curve of a 340nm wavelength beam after the halogen lamp is powered on, according to an embodiment of this application.

[0028] Figure 11 A flowchart illustrating another calibration method for an automatic analyzer according to an embodiment of this application;

[0029] Figure 12 This is a flowchart illustrating a method for determining contamination in the reaction cup of an automatic analyzer, as described in an embodiment of this application. Detailed Implementation

[0030] The present invention will be further described in detail below with reference to specific embodiments and accompanying drawings. Similar elements in different embodiments are referred to by associated similar element reference numerals. In some cases, certain operations related to this application are not shown or described in the specification. This is to avoid obscuring the core parts of this application with excessive description. For those skilled in the art, detailed description of these related operations is not necessary; they can fully understand the related operations based on the description in the specification and general technical knowledge in the art. Furthermore, the features, operations, or characteristics described in the specification can be combined in any suitable manner to form various embodiments.

[0031] The serial numbers assigned to components in this document, such as "first" and "second," are used only to distinguish the described objects and have no sequential or technical meaning. The terms "connection" and "linkage" used in this application, unless otherwise specified, include both direct and indirect connections (linkages).

[0032] In this embodiment of the invention, the reaction component of the automatic analyzer includes multiple placement positions for placing reaction cups and at least one calibration position. The spectral absorbance of the test object can be calculated based on the electrical signal output by the detection unit when the test object at the placement position is irradiated by a light beam. The background intensity of the light source is obtained based on the electrical signal output by the detection unit when the test object at the calibration position is irradiated by a light beam. When the fluctuation between the background intensities of adjacent N (N is an integer greater than or equal to 2) light sources corresponding to the same wavelength exceeds a fluctuation threshold, a light source abnormality warning message is output. Furthermore, the spectral absorbance of the test object at the placement position can be calibrated based on the background intensity of the light source.

[0033] Please refer to Figure 1 This is a schematic diagram of an automatic analyzer according to an embodiment of this application. The automatic analyzer may include a photometry component 01, a reaction component 02, a processor 03, and an output device 04. The photometry component 01 may include a light source assembly 11 and a detection unit 12. The reaction component 02 is connected to the processor 03, and the processor 03 is also connected to the detection unit 12 and the output device 04.

[0034] The light source assembly 11 emits a light beam of at least one wavelength and illuminates the detection position with the emitted light beam. The reaction component 02 includes multiple placement positions for placing reaction cups and at least one calibration position. Under the control of the processor 03, the reaction component 02 schedules the multiple placement positions and at least one calibration position to the detection position according to a set timing sequence, so that the object under test at the placement position or calibration position receives light beam illumination. The detection unit 12 collects the light beam passing through the detection position and outputs an electrical signal based on the spectral intensity of the collected light beam. The processor 03 receives the electrical signal output by the detection unit 12, calculates the spectral absorbance of the object under test based on the electrical signal output by the detection unit 12 when the object under test at the placement position receives light beam illumination, and obtains the background intensity of the light source based on the electrical signal output by the detection unit 12 when the object under test at the calibration position receives light beam illumination.

[0035] For automated analyzers, this can be an automated analyzer based on filter-based spectral dispersion, such as... Figure 2The diagram shows the measurement optical path of an automatic analyzer based on filter-based spectral dispersion. The light source assembly 11 includes a light source S and collimating units 111, a beam-splitting unit 112, and a first focusing unit 113 arranged at intervals on the same side of the light source S. The detection unit 12 includes a second focusing unit 121 and a photodetector 122. The collimating unit 111 can be, for example, a condenser lens; the beam-splitting unit 112 can be, for example, a filter array; the first focusing unit 113 can be, for example, a condenser lens; and the second focusing unit 121 can be, for example, a condenser lens. The light beam emitted from the light source S is collimated by the collimating unit 111 and then passes through the beam-splitting unit 112. The beam-splitting unit 112 splits the collimated beam into beams of at least one wavelength. These beams are then converged and shaped by the first focusing unit 113 before illuminating the detection position, so that the object being measured at the placement or calibration position receives the light beam illumination. The second focusing unit 121 collects the light beam passing through the detection position and focuses the light beam onto the photodetector 122, which converts the spectral intensity of the light beam into an electrical signal output. In one embodiment, the optical axes of the collimating unit 111, the first focusing unit 113, and the second focusing unit 121 can be located on the same straight line, and the light source S is located on the optical axis.

[0036] like Figure 2 As shown, the beam splitting unit 112 can be a filter array. Typically, multiple wavelength filters can be mounted on a filter rotating wheel to form a filter array. The processor 03 can control the motor of the filter rotating wheel to drive the rotating wheel to sequentially rotate each filter into the optical path, thereby achieving the measurement of a beam of at least one wavelength. The reaction component 02 can be a reaction disk with multiple placement positions for placing reaction cups containing the reaction liquid. During measurement, the processor 03 can drive the reaction disk to sequentially move each reaction cup to the detection position according to a set timing sequence, causing the reaction cup to rotate into the optical path, thereby achieving the measurement of the spectral absorbance of each reaction cup. The detection position could be, for example, a... Figure 2 The location of point A in the middle. Specifically, based on... Figure 2 The measurement optical path shown can be used to measure the spectral absorbance of each reaction vessel in the following two ways (Method 1 and Method 2):

[0037] Method 1: The processor 03 drives the beam splitter 112 to rotate a filter of one wavelength into the optical path and then stops. At this time, the light emitted by the light source S is collimated and split into light of one wavelength by the filter. Then, the processor 03 controls the reaction disk to rotate the reaction cups to the detection position (point A) in sequence, so that each reaction cup is irradiated by the light beam of that wavelength in sequence, and the spectral absorbance of all reaction cups at that wavelength is measured. Then, the processor 03 controls the beam splitter 112 to rotate the filter of the next wavelength into the optical path and then stops. Then, the processor 03 controls the reaction disk to rotate the reaction cups to the detection position (point A) in sequence, and the spectral absorbance of all reaction cups at that wavelength is measured. This process is repeated to measure the spectral absorbance of all reaction cups at all wavelengths.

[0038] Method 2: The processor 03 controls the reaction disk to rotate a reaction cup to the detection position (point A) and stop it. Then, it controls the beam splitter 112 to sequentially rotate multiple filters into the optical path, so that the reaction cup is irradiated by a beam of light of each wavelength in turn, thus completing the measurement of the spectral absorbance of the reaction cup under all wavelength beams. Then, the processor 03 controls the reaction disk to rotate the next reaction cup to the detection position (point A) and stop it, and completes the measurement of the spectral absorbance of the reaction cup under all wavelength beams in the same way. This process is repeated to complete the measurement of the spectral absorbance of all reaction cups under all wavelengths.

[0039] For automated analyzers, it can also be an automated analyzer based on grating spectral dispersion, such as... Figure 3 The diagram shows the measurement optical path of an automatic analyzer based on grating beam splitting. The light source assembly 11 includes a light source S and third focusing units 114 spaced apart on one side of the light source S. The detection unit 12 includes a fourth focusing unit 123, an entrance slit 124, a grating 125, and a photoelectric detection unit 126. The third focusing unit 114 can be, for example, a condensing lens; the fourth focusing unit 123 can be, for example, a condensing lens; the grating 125 can be, for example, a concave planar image field grating; and the photoelectric detection unit 126 can be a detector array. Figure 3 As shown, the light beam emitted by the light source S is focused and shaped by the third focusing unit 114 before illuminating the detection position, so that the object under test at the placement or calibration position receives the light beam illumination. The fourth focusing unit 123 collects the light beam passing through the detection position and focuses it through the entrance slit 124. The grating 125 diffracts and disperses the light beam after it passes through the entrance slit 124, and images the resulting spectrum onto the photoelectric detection unit 126. The photoelectric detection unit 126 converts the spectral intensity of the spectrum into an electrical signal output. The detection position could be, for example, […]. Figure 3 The location of point A. In one embodiment, the optical axes of the third focusing unit 114 and the fourth focusing unit 123 are on the same straight line, and the light source S and the entrance slit 124 are located on this optical axis.

[0040] Specifically, such as Figure 3 As shown, the reaction component 02 can be a reaction disk with multiple placement positions for placing reaction cups containing the reaction liquid. During measurement, the processor 03 controls the reaction disk 02 to rotate a reaction cup to the detection position (point A) and stop. At this time, the light beam emitted by the light source S is focused and shaped by the third focusing unit 114 and then illuminates the reaction cup. After passing through the reaction cup, the light beam is collected by the fourth focusing unit 123 and focused onto the entrance slit 124. After diffraction and dispersion by the grating 125, the resulting spectrum is imaged on the photoelectric detection unit 126, realizing the measurement of the spectral absorbance of the reaction cup under all wavelength beams. Then, the next reaction cup is rotated to the detection position (point A) and stopped, and the measurement of the spectral absorbance of the reaction cup under all wavelength beams is continued. This process is repeated to complete the measurement of the spectral absorbance of all reaction cups under all wavelength beams.

[0041] In this embodiment, the calibration position in the reaction component 02 can be a gap between reaction cups, or it can be a specially configured placement position not used for placing reaction cups. The object to be measured at the calibration position can be air or a uniformly transparent material.

[0042] For example, for such Figure 2 The automatic analyzer based on filter spectral dispersion shown can use the gap between reaction cups at positions 1 and 2 as a calibration position. During measurement, in addition to controlling the reaction component 02 to move the placement position to detection position A according to the set timing, the processor 03 also controls the reaction component 02 to move the gap between reaction cups at positions 1 and 2 to detection position A, so that the object under test at the calibration position also receives light beam illumination. The background intensity of the light source is obtained from the electrical signal output by the detection unit 12 when the object under test at the calibration position receives light beam illumination. The optical path is shown in [reference needed]. Figure 4 For example, the processor 03 can schedule multiple placement positions and the gap between reaction cups 1 and 2 to the detection position according to a set timing sequence in each measurement cycle, so that the background intensity of the light source can be acquired once in each measurement cycle. In one embodiment, at least one placement position in the reaction component 02 that is not used to place the reaction cup can also be configured as a calibration position, for example in... Figure 2In this process, position 1 is used as the calibration position. No reaction cup is placed at position 1. During measurement, the processor 03 controls the reaction component 02 to move position 1 to point A, allowing the object being measured at position 1 to be irradiated by the light beam. The background intensity of the light source is obtained from the electrical signal output by the detection unit 12 when the object at position 1 is irradiated by the light beam. For automatic analyzers, they typically measure the spectral absorbance of the reaction liquid in the reaction cups at certain time intervals and calculate the concentration of the analyte based on the changes in spectral absorbance measured within this time interval. This time interval is the measurement cycle of the automatic analyzer. Within one measurement cycle, the automatic analyzer will complete the measurement of the spectral absorbance of all reaction cups under all wavelength light beams.

[0043] For example Figure 3 The automatic analyzer based on grating spectral dispersion shown is analogous to... Figure 4 Alternatively, the gap between two adjacent placement positions of the reaction cup can be used as a calibration position, for example, the gap between the reaction cup at position 1 and the reaction cup at position 2 can be used as a calibration position. In one embodiment, at least one placement position in the reaction component 02 that is not used to place the reaction cup can also be used as a calibration position, for example, in Figure 3 The first placement position is used as the calibration position. No reaction cup is placed at the first placement position. During the measurement process, the processor 03 controls the reaction component 02 to move the first placement position to point A, so that the object under test at the first placement position receives the light beam. The background intensity of the light source is obtained from the electrical signal output by the detection unit 12 when the object under test at the first placement position receives the light beam.

[0044] In practical applications, under the control of the processor 03, the reaction component 02 can schedule multiple placement positions to the detection position according to a set timing sequence in each measurement cycle, and schedule at least one calibration position to the detection position according to a set timing sequence every M measurement cycles, thus acquiring the light source background intensity at least once every M measurement cycles. For example, scheduling one calibration position to the detection position according to a set timing sequence every two measurement cycles allows the light source background intensity to be acquired once every two cycles. Alternatively, multiple placement positions and at least one calibration position can be scheduled to the detection position according to a set timing sequence in each measurement cycle, thus enabling the acquisition of the light source background intensity at least once in each cycle.

[0045] In this application example, the reaction vessel used in the automated analyzer can be as follows: Figure 5The reaction cup chain shown has an air gap between adjacent reaction cups. The reaction component 02 can be controlled to adjust the air gap between two reaction cups to the detection position, for example, the air gap between reaction cup 1 and reaction cup 2. When the light beam passes through the air gap between two adjacent reaction cups at the detection position, the background intensity of the light source can be obtained from the electrical signal output by the detection unit 12.

[0046] In this embodiment, the automatic analyzer can be either a filter-based or grating-based analyzer. The calibration position can be a gap between reaction cups or a position not used for placing reaction cups. Regardless of whether the automatic analyzer is filter-based or grating-based, and regardless of whether the calibration position is a gap between reaction cups or a position not used for placing reaction cups, when the light beam emitted by the light source assembly 11 passes through the calibration position, the light beam will not be affected by changes in the absorbance of the reaction liquid in the reaction cups. Therefore, after the light beam passes through the gap between reaction cups or the position not used for placing reaction cups, it is collected by the detection unit 12. The electrical signal output by the detection unit 12 can accurately reflect the change in the spectral intensity of the light beam emitted by the light source assembly 11. The spectral intensity obtained from the electrical signal output by the detection unit 12 when the test object at the calibration position is irradiated by the light beam can be called the light source background intensity. In this way, the stability of the light source can be monitored based on the fluctuation of the light source background intensity.

[0047] Based on this, in one embodiment, when the processor 03 determines that the fluctuation between the background intensities of adjacent N (N is an integer greater than or equal to 2) light sources corresponding to the same wavelength beam exceeds the fluctuation threshold, it sends a light source abnormality prompt message to the output device 04, and the output device 04 outputs the light source abnormality prompt message. The output device 04 can be, for example, a display screen, an alarm, an indicator light, etc. When it determines that the fluctuation between the background intensities of adjacent N light sources corresponding to the same wavelength beam exceeds the fluctuation threshold, it can display the light source abnormality prompt message on the display screen, and / or sound an alarm, and / or illuminate or flash an indicator light, etc., to indicate that the light source is unstable. In one embodiment, when the processor 03 determines that the fluctuation between the background intensities of adjacent N light sources corresponding to the same wavelength beam exceeds the fluctuation threshold, it can also mark incomplete tests. This allows for easy and clear identification of which tests were measured after the light source abnormality occurred, enabling further processing, such as retesting, thereby ensuring the accuracy of the test results.

[0048] In one embodiment, after the automatic analyzer is powered on, the light source assembly 11 begins to emit a light beam of at least one wavelength and illuminates the detection position. Under the control of the processor 03, the reaction unit 02 schedules multiple placement positions and at least one calibration position to the detection position according to a set timing sequence, so that the object to be tested at the placement position or calibration position receives the light beam illumination. The processor 03 calculates the spectral absorbance of the object to be tested based on the electrical signal output by the detection unit 12 when the object to be tested at the placement position receives the light beam illumination, and obtains the background intensity of the light source based on the electrical signal output by the detection unit 12 when the object to be tested at the calibration position receives the light beam illumination. When it is determined that the fluctuation amount between the background intensity of the light source corresponding to the same wavelength light beam is less than the fluctuation threshold, a measurement prompt message indicating that sample measurement can begin is sent to the output device 04. The output device 04 outputs the measurement prompt message. The output device 04 can be, for example, a display screen, in which case the measurement prompt message can be displayed to indicate that the measurement can begin. At this time, the automatic analyzer can start the measurement automatically, or the user can manually start the measurement after receiving the measurement prompt message.

[0049] For automated analyzers, changes in environmental factors during measurement may introduce errors. For example, changes in ambient temperature can cause a drift in the light source radiation, i.e., a slow change, leading to errors in the measurement results of the automated analyzer. In this application, the gaps between reaction cups or placement positions not used for placing reaction cups can be used as calibration positions. The reaction component 02 may include a reaction disk. When the processor 03 controls the reaction component 02 to schedule multiple reaction cups, it will necessarily schedule the gaps between reaction cups to the detection position in the optical path, or it will necessarily schedule the placement positions not used for placing reaction cups, which are used as calibration positions, to the detection positions in the optical path. In the same measurement cycle, the time interval between the detection of the spectral absorbance of the reaction liquid in the reaction cup and the detection of the spectral absorbance (background intensity) of the light source at the calibration position is generally short. Within a short time interval, the change in ambient temperature is generally small, and the resulting drift in the light source radiation is also small, or even negligible. Therefore, the background intensity of the light source collected at the calibration position in the same measurement cycle can be used to correct the error in the spectral absorbance of the reaction liquid in the reaction cup caused by changes in ambient temperature.

[0050] In one embodiment, reference is made to Figure 1The automatic analyzer may not include the output device 04. Under the control of the processor 03, the reaction unit 02 schedules multiple placement positions and at least one calibration position to the detection position according to a set timing sequence in each measurement cycle, so that the object under test at the placement position or calibration position receives light beam irradiation. The processor 03 can calculate the spectral absorbance of the object under test based on the electrical signal output by the detection unit 12 when the object under test at the placement position receives light beam irradiation, obtain the background intensity of the light source based on the electrical signal output by the detection unit 12 when the object under test at the calibration position receives light beam irradiation, and then calibrate the spectral absorbance of the object under test at the placement position based on the background intensity of the light source.

[0051] Specifically, in each measurement cycle, the processor 03 can control the reaction unit 02 to schedule a calibration position to a detection position. In this case, in each measurement cycle, for each wavelength of light beam, the processor 03 calibrates the spectral absorbance of the object under test at each placement position according to the background intensity of a light source corresponding to that wavelength of light beam. For example, as shown in... Figure 2 He Ru Figure 4 Taking the automatic analyzer based on filter spectral dispersion as an example, the reaction component 02 is a reaction disk, assuming it has 16 placement positions (1 to 16). The gap between the reaction cup at position 1 and position 2 is used as the calibration position. Assuming measurement is performed in mode two, during measurement, the processor 03 can control the reaction component 02 to first rotate the reaction cup at position 1 to the detection position (point A) and stop. Then, it controls the spectral dispersion unit 112 to sequentially rotate multiple filters into the optical path, so that the reaction cup at position 1 receives illumination from a beam of each wavelength in sequence, completing the measurement of the spectral absorbance of the reaction cup at position 1 under all wavelength beams. Then, the processor 03 controls the reaction component 02 to rotate the gap between the reaction cups at positions 1 and 2 to the detection position (point A) and stop. Then, it controls the spectral dispersion unit 112 to sequentially rotate multiple filters into the optical path. The light sheet is sequentially inserted into the optical path, so that light beams of each wavelength illuminate the gap between the reaction cups at positions 1 and 2, obtaining the background intensity of the light source corresponding to each wavelength. That is, each wavelength corresponds to a background intensity of the light source. Next, the processor 03 controls the reaction unit 02 to rotate the reaction cup at position 2 and the reaction cups at each subsequent position sequentially to the detection position (point A) and stop. The spectral absorbance of the reaction cup at position 2 and the reaction cups at each subsequent position under all wavelengths is measured in the same way as when detecting the reaction cup at position 1, completing one measurement cycle. Afterward, for each wavelength of light beam in this measurement cycle, the spectral absorbance of the reaction cups at each position under that wavelength of light beam is calibrated using the obtained background intensity of the light source corresponding to that wavelength of light beam.

[0052] Specifically, in each measurement cycle, the processor 03 can also control the reaction unit 02 to schedule at least two calibration positions to the detection position. In this case, in each measurement cycle, the processor 03 calibrates the spectral absorbance of the object under test at each placement position between the calibration position corresponding to the background intensity of the light source and the next calibration position, based on the background intensity of the light source acquired at each calibration position. For example, as shown in... Figure 2 He Ru Figure 4Taking the automatic analyzer based on filter spectroscopy as an example, it includes two calibration positions. The gap between the reaction cup at position 1 and position 2 is used as the first calibration position, and the gap between the reaction cup at position 8 and position 9 is used as the second calibration position. Assuming the measurement is performed in method two, during measurement, processor 03 can control reaction component 02 to first rotate the reaction cup at position 1 to the detection position (point A) and stop. Then, it controls the beam splitting unit 112 to sequentially rotate multiple filters into the optical path, so that the reaction cup at position 1 is irradiated by light beams of each wavelength in sequence, completing the measurement of the spectral absorbance of the reaction cup at position 1 under all wavelength light beams. Next, processor 03 controls reaction component 02 to rotate the gap between the reaction cups at positions 1 and 2 (the first calibration position) to the detection position (point A) and stop. Then, it controls the beam splitting unit 112 to sequentially rotate multiple filters into the optical path, so that light beams of each wavelength irradiate the gap between the reaction cups at positions 1 and 2, obtaining the background intensity of the light source corresponding to each wavelength light beam, that is, each wavelength light beam corresponds to a background intensity of the light source. Then, processor 03... The control reaction unit 02 rotates the reaction cups at positions 2 to 8 sequentially to the detection position (point A) and stops, measuring the spectral absorbance of the reaction cups at positions 2 to 8 under all wavelength beams in the same manner as when detecting the reaction cup at position 1. Next, the processor 03 controls the control reaction unit 02 to rotate the gap (second calibration position) between the reaction cups at positions 8 and 9 to the detection position (point A) and stops, obtaining the light source background intensity of each wavelength beam corresponding to the second calibration position using the same method as when detecting the first calibration position. Then, the processor 03 controls the control reaction unit 02 to rotate the reaction cups at positions 9 to 16 sequentially to the detection position (point A) and stops, measuring the spectral absorbance of the reaction cups at positions 9 to 16 under all wavelength beams in the same manner as when detecting the reaction cup at position 1; thus completing one measurement cycle. Subsequently, for this measurement cycle, for each wavelength beam obtained at the first calibration position, the background intensity of the light source corresponding to each wavelength beam is used to calibrate the spectral absorbance of the reaction cups at positions 2 to 8 under the corresponding wavelength beam; for each wavelength beam obtained at the second calibration position, the background intensity of the light source corresponding to each wavelength beam is used to calibrate the spectral absorbance of the reaction cups at positions 9 to 16 and position 1 under the corresponding wavelength beam.

[0053] Preferably, the gaps between all adjacent reaction cups can be used as calibration points, such as... Figure 2 He Ru Figure 4Taking the filter-based automatic analyzer as an example, the gaps between reaction cups at positions 1 and 2, 2 and 3, ... 15 and 16, and 16 and 16 are all used as calibration positions. This shortens the time interval between acquiring the background intensity of adjacent light sources, better reflecting the real-time stability of the light source. Furthermore, in this case, the background intensity acquired through the gap between reaction cups 1 and 2 can be used to calibrate the spectral absorbance of reaction cup 2, and the background intensity acquired through the gap between reaction cups 2 and 3 can be used to calibrate the spectral absorbance of reaction cup 3, and so on. This allows for the setting of a closest calibration position for each reaction cup, enabling real-time calibration of the spectral absorbance based on fluctuations or drifts in the light source, further improving the accuracy of the measurement results.

[0054] In one specific embodiment, when calibrating the spectral absorbance of the test object at each placement position based on the background intensity of the light source, the processor 03 specifically performs the following steps: For each test object at a placement position, it calculates a calibration factor based on the background intensity of the light source obtained when the test object at the calibration position receives a light beam of the same wavelength as that placement position and the background intensity of the reference light source corresponding to that placement position; and calibrates the spectral absorbance of the test object at that placement position under the illumination of a light beam of the same wavelength based on the calculated calibration factor. Specifically, for each test object at a placement position, the processor 03 calculates the ratio of the background intensity of the light source obtained when the test object at the calibration position receives a light beam of the same wavelength as that placement position to the background intensity of the reference light source corresponding to that placement position, thereby obtaining the calibration factor of the test object at that placement position under the illumination of a light beam of the same wavelength; the processor 03 calibrates the spectral absorbance of the test object at that placement position under the illumination of a light beam of the same wavelength based on the calculated calibration factor using a calibration formula; wherein the calibration formula may be:

[0055]

[0056] In this formula, A′ λi L represents the calibrated spectral absorbance. λi L is the background intensity of the light source at this placement position when the wavelength of the beam is λ, measured in the i-th measurement cycle. λblank This represents the background intensity of the reference light source at this placement position when the beam wavelength is λ. To determine the spectral absorbance of the object under test at this placement position before calibration under a light beam of wavelength λ, I λcupblank For the cup blank measured at this placement position during the cup blank measurement cycle, I λiThe spectral intensity of the light beam with wavelength λ collected by the detection unit 12 during the i-th measurement cycle after illuminating the object under test at the placement position. The "cup blank" refers to the spectral absorbance of the light beam passing through the reaction cup when the reaction cup is empty or the liquid in the reaction cup is deionized water or purified water. The background intensity of the reference light source can be the background intensity of the light source measured during the cup blank measurement cycle based on the object under test at the calibration position receiving the light beam; or, the background intensity of the reference light source can also be the background intensity of the light source measured during a measurement cycle of the object under test at the placement position based on the object under test at the calibration position receiving the light beam.

[0057] In the calibration formula above, This is the calibration factor. As shown in the calibration formula above, for a test object placed at the same location under illumination by the same wavelength beam, the spectral absorbance of the test object at that location is error-free only if the background intensity of the reference light source obtained during the cup blank measurement period is equal to the background intensity of the light source during the i-th period. However, in reality, the background intensity of the light source will always fluctuate to some extent. It is not necessarily equal to 1. In this application, by obtaining the background intensity of the light source at the calibration position, a calibration factor can be obtained in each measurement cycle. Therefore, the calibrated spectral absorbance A′ can be obtained using the calibration formula described above. λi This enables the calibration of errors caused by fluctuations in the light source.

[0058] According to the automatic analyzer of the above embodiments, at least one gap between adjacent reaction cups is used as a calibration position, or at least one placement position not used for placing reaction cups is used as a calibration position. On the one hand, the stability of the light source can be judged by the fluctuation of the background intensity of the light source collected at the calibration position. When it is determined that the fluctuation between the background intensities of adjacent N light sources corresponding to the same wavelength beam is less than the fluctuation threshold, a measurement prompt message indicating that sample measurement can begin is sent to the output device. When it is determined that the fluctuation between the background intensities of adjacent N light sources corresponding to the same wavelength beam exceeds the fluctuation threshold, a light source abnormality prompt message is sent to the output device to indicate that the light source is abnormal. After receiving the light source abnormality prompt message, the user can take further abnormality handling actions, or the automatic analyzer can automatically take further abnormality handling actions, such as stopping the measurement, thereby avoiding the influence of light source fluctuation on the measurement results and avoiding clinical risks. Furthermore, when it is determined that the fluctuation between the background intensities of adjacent N light sources corresponding to the same wavelength beam exceeds the fluctuation threshold, the incomplete tests can be marked. In this way, it is convenient and clear to know which tests were measured after the light source abnormality occurred, so as to take further processing actions, such as retesting, thereby ensuring the accuracy of the test results. On the other hand, the spectral absorbance of the object under test at the placement position can be calibrated based on the background intensity of the light source collected at the calibration position. Calibration further improves the accuracy of the measurement results. Using the scheme of this application, there is no need to design a dedicated detection channel for monitoring the stability of the light source; instead, it shares the same optical path as the measurement optical path for the spectral absorbance of the object under test at the placement position. That is, the structure of the automatic analyzer does not need to be changed; the existing structure can be used to monitor the stability of the light source and calibrate the spectral absorbance of the object under test at the placement position, resulting in lower costs. Moreover, measuring the light source using the calibration position is unaffected by other factors, thus accurately monitoring light source fluctuations and providing timely alarms. Simultaneously, using the scheme of this application, the measurement of the background intensity of the light source and the measurement of the spectral absorbance of the reaction cup can be completed within the same measurement cycle with a very short interval. Therefore, the spectral absorbance of the reaction cup can be calibrated in real time using the background intensity of the light source, improving the accuracy and precision of the measurement.

[0059] Based on the automatic analyzer described in the above embodiments, this application provides a method for monitoring the light source of the automatic analyzer, the flowchart of which is shown below. Figure 6 The method may include the following steps:

[0060] Step 101: Control the placement and calibration positions of the reaction components.

[0061] During measurement, the processor 03 controls the reaction unit 02 to schedule multiple placement positions and at least one calibration position to the detection position according to a set timing sequence, so that the object under test at the placement position or calibration position is irradiated by a light beam of at least one wavelength emitted by the light source assembly 11. In one embodiment, the processor 03 may control the reaction unit 02 to schedule multiple placement positions and at least one calibration position to the detection position according to a set timing sequence in each measurement cycle.

[0062] Step 102: Calculate the spectral absorbance of the object being measured at the placement position.

[0063] When the processor 03 controls the reaction unit 02 to schedule a placement position to a detection position, the object under test at the placement position is irradiated by a light beam of at least one wavelength emitted by the light source assembly 11. After the light beam passes through the object under test at the placement position, it is received by the detection unit 12. The detection unit 12 outputs an electrical signal to the processor 03 based on the spectral intensity of the light beam passing through the detection position. After receiving the electrical signal, the processor 03 calculates the spectral absorbance of the object under test at the placement position based on the electrical signal.

[0064] Step 103: Obtain the background intensity of the light source.

[0065] When the processor 03 controls the reaction unit 02 to move a calibration position to a detection position, the object under test at the calibration position is irradiated by a light beam of at least one wavelength emitted by the light source assembly 11. This light beam passes through the object under test at the calibration position and is then received by the detection unit 12. The detection unit 12 outputs an electrical signal to the processor 03 based on the spectral intensity of the light beam passing through the detection position. Upon receiving this electrical signal, the processor 03 calculates the background intensity of the light source at the calibration position. The object under test at the calibration position can be air or a uniformly transparent material, and the calibration position can be a gap between reaction cups or a placement position not used for placing reaction cups.

[0066] Step 104: Determine whether the fluctuation between the background intensity of adjacent N light sources corresponding to the same wavelength beam exceeds the fluctuation threshold.

[0067] Processor 03 determines whether the fluctuation between the background intensity of adjacent N (N is an integer greater than or equal to 2) light sources corresponding to the same wavelength beam exceeds the fluctuation threshold. If yes, step 105 is executed; otherwise, step 101 is executed.

[0068] Step 105: Send a light source malfunction warning message to the output device.

[0069] When the processor 03 determines that the fluctuation between the background intensities of adjacent N light sources corresponding to the same wavelength beam exceeds the fluctuation threshold, it sends a light source abnormality warning message to the output device 04 to indicate a light source abnormality. After receiving the light source abnormality warning message, the user can take further abnormality handling actions, or the automatic analyzer can automatically take further abnormality handling actions, such as stopping the measurement, thereby avoiding the influence of light source fluctuations on the measurement results and avoiding clinical risks.

[0070] After obtaining the background intensity of the light source from the electrical signal output by the detection unit 12 when the object under test at the calibration position is irradiated by the light beam, the processor 03 can also execute step 106.

[0071] Step 106: Calibrate the spectral absorbance of the object being measured at the placement position.

[0072] The processor 03 calibrates the spectral absorbance of the object under test at each placement position based on the background intensity of the light source corresponding to each wavelength beam. In a specific embodiment, for each object under test at each placement position, the processor 03 calculates a calibration factor based on the background intensity of the light source obtained when the object under test at the calibration position receives a beam of the same wavelength as that placement position and the background intensity of the reference light source corresponding to that placement position. The processor then calibrates the spectral absorbance of the object under test at that placement position under the illumination of the beam of the same wavelength based on the calculated calibration factor. Specifically, for each object under test at each placement position, the processor 03 calculates the ratio of the background intensity of the light source obtained when the object under test at the calibration position receives a beam of the same wavelength as that placement position to the background intensity of the reference light source corresponding to that placement position, thus obtaining the calibration factor of the object under test at that placement position under the illumination of the beam of the same wavelength. The processor 03 then calibrates the spectral absorbance of the object under test at that placement position under the illumination of the beam of the same wavelength based on the calculated calibration factor using the aforementioned calibration formula. Calibration can further improve the accuracy of the measurement results.

[0073] Reference Figure 7 The flowchart below shows another method for monitoring the light source of an automatic analyzer provided in this application embodiment. The method may include the following steps:

[0074] Step 201: Obtain the background intensity of the light source.

[0075] After the automatic analyzer is powered on, the processor 03 controls the reaction unit 02 to schedule at least one calibration position to the detection position according to a set timing sequence. The object under test at the calibration position is irradiated by a light beam of at least one wavelength emitted by the light source assembly 11. After passing through the object under test at the calibration position, the light beam is received by the detection unit 12. The detection unit 12 outputs an electrical signal to the processor 03 based on the spectral intensity of the light beam passing through the detection position. After receiving the electrical signal, the processor 03 calculates the background intensity of the light source at the calibration position based on the electrical signal. The object under test at the calibration position can be air or a uniformly transparent material, and the calibration position can be a gap between reaction cups or a placement position not used to place reaction cups.

[0076] Step 202: Determine whether the fluctuation amount between the background intensity of adjacent N light sources corresponding to the same wavelength beam is less than the fluctuation threshold.

[0077] After obtaining the background intensity of the light source, the processor 03 determines whether the fluctuation amount between the background intensities of adjacent N (N is an integer greater than or equal to 2) light sources corresponding to the same wavelength beam is less than the fluctuation threshold. If so, step 203 is executed; otherwise, the processor continues to obtain the background intensity of the light source and determines whether the fluctuation amount between the background intensities of adjacent N light sources corresponding to the same wavelength beam is less than the fluctuation threshold.

[0078] Step 203: Send a measurement prompt message to the output device indicating that sample measurement can begin.

[0079] When the processor 03 determines that the fluctuation amount between the background intensities of adjacent N light sources corresponding to the same wavelength beam is less than the fluctuation threshold, it sends a measurement prompt message to the output device 04 indicating that sample measurement can begin. After the sample measurement begins, steps 204 to 209 are executed.

[0080] Step 204: Control the placement and calibration positions of the reaction components.

[0081] Step 205: Calculate the spectral absorbance of the object being measured at the placement position.

[0082] Step 206: Obtain the background intensity of the light source.

[0083] Step 207: Determine whether the fluctuation between the background intensities of adjacent N light sources corresponding to the same wavelength beam exceeds the fluctuation threshold. If yes, proceed to step 208; otherwise, continue to step 204.

[0084] Step 208: Send a light source malfunction warning message to the output device.

[0085] Step 209: Calibrate the spectral absorbance of the object being measured at the placement position.

[0086] Steps 204 to 209 correspond one-to-one with steps 101 to 106. For the specific execution process, please refer to steps 101 to 106.

[0087] The light source monitoring method of the automatic analyzer provided in this embodiment can determine the stability of the light source by measuring the fluctuation of the light source background intensity at the calibration position. After the automatic analyzer is powered on, it acquires the light source background intensity. When it is determined that the fluctuation between the background intensities of N adjacent light sources corresponding to the same wavelength beam is less than the fluctuation threshold, it sends a measurement prompt message to the output device indicating that sample measurement can begin. During the measurement process, when it is determined that the fluctuation between the background intensities of N adjacent light sources corresponding to the same wavelength beam exceeds the fluctuation threshold, it sends a light source abnormality prompt message to the output device to indicate a light source abnormality. After receiving the light source abnormality prompt message, the user can take further abnormality handling actions, or the automatic analyzer can automatically take further abnormality handling actions, such as stopping the measurement, thereby avoiding the influence of light source fluctuations on the measurement results and avoiding clinical risks.

[0088] Based on the automatic analyzer described in the above embodiments, this application also provides a calibration method for the automatic analyzer, the flowchart of which can be found here. Figure 8 The method may include the following steps:

[0089] Step 301: Control the placement and calibration positions of the reaction components.

[0090] During measurement, the processor 03 controls the reaction unit 02 to schedule multiple placement positions and at least one calibration position to the detection position according to a set timing sequence in each measurement cycle, so that the object under test at the placement position or calibration position is irradiated by a light beam of at least one wavelength emitted by the light source assembly 11.

[0091] Step 302: Calculate the spectral absorbance of the object being measured at the placement position.

[0092] When the processor 03 controls the reaction unit 02 to schedule a placement position to a detection position, the object under test at the placement position is irradiated by a light beam of at least one wavelength emitted by the light source assembly 11. After the light beam passes through the object under test at the placement position, it is received by the detection unit 12. The detection unit 12 outputs an electrical signal to the processor 03 based on the spectral intensity of the light beam passing through the detection position. After receiving the electrical signal, the processor 03 calculates the spectral absorbance of the object under test at the placement position based on the electrical signal.

[0093] Step 303: Obtain the background intensity of the light source.

[0094] When the processor 03 controls the reaction unit 02 to move a calibration position to a detection position, the object under test at the calibration position is irradiated by a light beam of at least one wavelength emitted by the light source assembly 11. This light beam passes through the object under test at the calibration position and is then received by the detection unit 12. The detection unit 12 outputs an electrical signal to the processor 03 based on the spectral intensity of the light beam passing through the detection position. Upon receiving this electrical signal, the processor 03 calculates the background intensity of the light source at the calibration position. The object under test at the calibration position can be air or a uniformly transparent material, and the calibration position can be a gap between reaction cups or a placement position not used for placing reaction cups.

[0095] Step 304: Calibrate the spectral absorbance of the object being measured at the placement position.

[0096] The processor 03 calibrates the spectral absorbance of the object under test at the placement position based on the acquired background intensity of the light source. In a specific embodiment, for each object under test at the placement position, the processor 03 calculates a calibration factor based on the background intensity of the light source obtained when the object under test at the calibration position receives a light beam of the same wavelength as that placement position and the background intensity of the reference light source corresponding to that placement position. The processor then calibrates the spectral absorbance of the object under test at that placement position under the illumination of the light beam of the same wavelength based on the calculated calibration factor. Specifically, for each object under test at the placement position, the processor 03 calculates the ratio of the background intensity of the light source obtained when the object under test at the calibration position receives a light beam of the same wavelength as that placement position to the background intensity of the reference light source corresponding to that placement position, thus obtaining the calibration factor of the object under test at that placement position under the illumination of the light beam of the same wavelength. The processor 03 then calibrates the spectral absorbance of the object under test at that placement position under the illumination of the light beam of the same wavelength based on the calculated calibration factor using the aforementioned calibration formula. Calibration can further improve the accuracy of the measurement results.

[0097] For example, as Figure 2 He Ru Figure 4Taking the automatic analyzer based on filter spectral dispersion as an example, the gap between reaction cups at positions 1 and 2 is used as a calibration position. The processor 03 controls the reaction unit 02 to schedule the calibration position to the detection position according to a set time sequence in each measurement cycle. Assuming that it performs the measurement in mode one, the processor 03 controls the spectral dispersion unit 112 to sequentially rotate the two filters into the optical path, that is, to measure two wavelengths, such as λ1 and λ2. During measurement, within one measurement cycle, the processor 03 controls the rotation of the beam splitter 112 to first allow the detection position to be illuminated by a λ1 wavelength beam. Then, the processor 02 controls the reaction unit 02 to rotate the reaction cup at position 1 to the detection position (point A) and stop, allowing the reaction cup at position 1 to be illuminated by the λ1 wavelength beam, thus obtaining the spectral absorbance of the reaction cup at position 1 under the λ1 wavelength beam illumination. The processor 03 then controls the reaction unit 02 to rotate the gap between the reaction cups at positions 1 and 2 to the detection position (point A) and stop, allowing the λ1 wavelength beam to illuminate the gap between the reaction cups at positions 1 and 2, thus obtaining the background intensity L of the light source corresponding to λ1. λ1 Next, the processor 03 controls the reaction unit 02 to rotate the reaction cup at position 2 and all subsequent positions sequentially to the detection position (point A) and stop, obtaining the spectral absorbance of the reaction cup at position 2 and all subsequent positions under λ1 wavelength light irradiation in the same manner as when detecting the reaction cup at position 1. Then, the processor 03 continues to control the rotation of the beam splitting unit 112 so that the detection position receives λ2 wavelength light irradiation; then, the processor 03 controls the reaction unit 02 to schedule each position and calibration position in the same way as when irradiating the detection position with λ1, obtaining the spectral absorbance of the reaction cup at position 1 under λ2 wavelength light irradiation and the background intensity L of the light source corresponding to λ2. λ2 The absorbance of the reaction cup at position 2 and subsequent positions under λ2 wavelength light beam illumination is measured; this completes one measurement cycle. Then, according to the calibration formula described above, L... λ1 The spectral absorbance of the reaction cups at each location was calibrated under illumination by a wavelength beam of λ1, using L... λ2 The spectral absorbance of each reaction vessel placed in its respective position under λ2 wavelength light beam illumination was calibrated.

[0098] Within the same measurement cycle, the time interval between detecting the spectral absorbance of the reaction cup and detecting the background intensity of the light source in the gap between the reaction cups is generally short. Within this short time interval, changes in ambient temperature are generally small, resulting in minimal, even negligible, drift in the light source radiation. Therefore, the background intensity of the light source collected in the gap between the reaction cups within the same measurement cycle can be used to correct for errors in the spectral absorbance of the reaction liquid in the reaction cup caused by changes in ambient temperature. Based on this, preferably, each gap between reaction cups can be used as a calibration point. The background intensity of the light source measured at this calibration point is used to calibrate the spectral absorbance of the reaction cup at the next placement position. That is, the background intensity of the light source collected in the gap between reaction cups at positions 1 and 2 is used to calibrate the spectral absorbance of the reaction cup at position 2; the background intensity of the light source collected in the gap between reaction cups at positions 2 and 3 is used to calibrate the spectral absorbance of the reaction cup at position 3, and so on. In this way, the time interval between detecting the spectral absorbance of the reaction cup and detecting the background intensity of the light source in the gap of the reaction cup is the shortest, usually within 5 seconds. In such a short time, the change in ambient temperature is small, and the resulting drift in light source radiation can be ignored, which can better correct the error in the spectral absorbance of the reaction liquid in the reaction cup caused by changes in ambient temperature.

[0099] The calibration method for the automatic analyzer provided in this embodiment can use the background intensity of the light source collected at the calibration position during the same measurement cycle to correct the error in the spectral absorbance of the reaction liquid in the reaction vessel caused by changes in ambient temperature. Calibration can further improve the accuracy of the measurement results.

[0100] For automated analyzers, such as biochemical analyzers, the most commonly used light source is a halogen lamp. After a halogen lamp is powered on, its spectral radiation needs a certain period of time to reach a stable state. The stabilization process of spectral intensity at various wavelengths can be found in [reference needed]. Figure 9 Calculating the concentration of the analyte in the reaction vessel requires spectral absorbance data over a certain time interval. Therefore, the stability of the light source must meet certain conditions during this period to ensure the accuracy of the automatic analyzer's measurement results. Typically, the light source needs a certain period of time after being powered on before its stability meets the measurement conditions of the automatic analyzer. This period from power-on to meeting the stability requirements is usually called the light source incubation time.

[0101] If the spectral absorbance of the reaction cup and the background intensity of the light source at the calibration position are both measured within the same measurement cycle, the aforementioned spectral absorbance calibration function can be used to shorten the light source incubation time and reduce waiting time.

[0102] Based on this, and according to the concept of this application, in one embodiment, referring to Figure 1The automatic analyzer may not include the output device 04. Under the control of the processor 03, the reaction unit 02 schedules multiple placement positions and at least one calibration position to the detection position according to a set time sequence in each measurement cycle, so that the object under test at the placement position or calibration position receives light beam irradiation. The processor 03 receives the electrical signal output by the detection unit 12, obtains the background intensity of the light source based on the electrical signal output by the detection unit 12 when the object under test at the calibration position receives light beam irradiation, and records the electrical signal output by the detection unit 12 when the object under test at the placement position receives light beam irradiation based on the electrical signal output by the detection unit 12 when the object under test at the placement position receives light beam irradiation based on the electrical signal output by the detection unit 12 when the object under test at the placement position receives light beam irradiation based on the electrical signal output by the detection unit 12 when the object under test at the placement position receives light beam irradiation based on the current background intensity of the light source.

[0103] Specifically, after the automatic analyzer is powered on, the light source assembly 11 emits a light beam of at least one wavelength and illuminates the detection position. The detection unit 12 collects the light beam passing through the detection position and outputs an electrical signal based on the spectral intensity of the collected light beam. In each measurement cycle, the processor 03 can first control the reaction component 02 to schedule at least one calibration position to the detection position according to a set timing sequence, so that the object under test at the calibration position is illuminated by the light beam of at least one wavelength emitted by the light source assembly 11. After passing through the object under test at the calibration position, the light beam is received by the detection unit 12. The detection unit 12 outputs an electrical signal to the processor 03 based on the spectral intensity of the light beam passing through the detection position. After receiving the electrical signal, the processor 03 calculates the background intensity of the light source at the calibration position based on the electrical signal. The object under test at the calibration position can be air or a uniformly transparent material, and the calibration position can be a gap between reaction cups or a placement position not used for placing reaction cups.

[0104] The processor 03 determines whether the fluctuation between two adjacent light source background intensities within a preset time period is less than a preset fluctuation amount. For example, within 1 minute, when it is determined that the fluctuation between two adjacent light source background intensities within the preset time period is less than the preset fluctuation amount, it is considered that the light source has reached the stability requirement. At this time, the electrical signal output by the detection unit 12 when the test object at the placement position receives the light beam is recorded. The spectral absorbance of the test object is calculated based on the electrical signal output by the detection unit 12 when the test object at the placement position receives the light beam, and then the spectral absorbance of the test object at the placement position is calibrated based on the current light source background intensity.

[0105] For example, without the scheme described in this application, the incubation time for the aforementioned light source in an automated analyzer can typically reach up to 10 minutes. Assuming the stability requirement for the light source is a relative range not exceeding ΔK, then the radiant intensity of the light source must not exceed ΔK within 10 minutes before clinical testing can begin. However, if the scheme described in this application is adopted, the spectral absorbance of the reaction cups and the background intensity of the light source at the calibration position are measured within the same measurement cycle. Since the time interval between the spectral absorbance measurement of all reaction cups and the background intensity measurement of the light source in this measurement cycle is generally short, for example, as short as 5 seconds, then as long as the light intensity fluctuation of the light source within 5 seconds does not exceed ΔK, clinical testing can begin. ΔK can be used as the preset fluctuation value. The stabilization curve after the light source is turned on is relatively smooth, and the absolute value of the slope of change becomes smaller and smaller. Taking a 340nm wavelength beam after a halogen lamp is powered on as an example, its stabilization curve can be found in [reference needed]. Figure 10 Because the spectral absorbance of the reaction cup at the placement position can be calibrated using the background intensity of the light source obtained at the calibration position during each measurement cycle, the error in the spectral absorbance of the reaction liquid in the reaction cup caused by light source fluctuations can be corrected, improving the accuracy of the measurement. Therefore, clinical testing can begin when the light source is not so stable. As long as the fluctuation between two consecutive background intensities of the light source within a preset time period is less than a preset fluctuation, the spectral absorbance of the reaction cup at the placement position can be recorded, which is equivalent to starting clinical testing earlier, thereby shortening the light source incubation time. Using the scheme of this application, the light source incubation time can be shortened from 5 minutes to 1 minute.

[0106] Based on the automatic analyzer of this embodiment, this application also provides another calibration method for the automatic analyzer, the flowchart of which can be found here. Figure 11 The method may include the following steps:

[0107] Step 401: Obtain the background intensity of the light source.

[0108] After the automatic analyzer is powered on, in each measurement cycle, the processor 03 controls the reaction unit 02 to schedule at least one calibration position to the detection position according to a set timing sequence. The object under test at the calibration position is irradiated by a light beam of at least one wavelength emitted by the light source assembly 11. After passing through the object under test at the calibration position, the light beam is received by the detection unit 12. The detection unit 12 outputs an electrical signal to the processor 03 based on the spectral intensity of the light beam passing through the detection position. After receiving the electrical signal, the processor 03 calculates the background intensity of the light source at the calibration position based on the electrical signal. The object under test at the calibration position can be air or a uniformly transparent material, and the calibration position can be a gap between reaction cups or a placement position not used to place reaction cups.

[0109] Step 402: Determine whether the fluctuation between two adjacent light source background intensities within a preset time period is less than the preset fluctuation amount.

[0110] After obtaining the background intensity of the light source from the calibration bit, the processor 03 determines whether the fluctuation between two adjacent background intensities of the light source within a preset time period is less than a preset fluctuation amount. If so, step 403 is executed; otherwise, the processor continues to obtain the background intensity of the light source and determines whether the fluctuation between two adjacent background intensities of the light source within a preset time period is less than a preset fluctuation amount.

[0111] Step 403: Calculate the spectral absorbance of the object being measured at the placement position.

[0112] When the processor 03 determines that the fluctuation between two adjacent light source background intensities within a preset time period is less than a preset fluctuation, the control reaction unit 02 schedules multiple placement positions to detection positions according to a set time sequence. The object under test at the placement position scheduled to the detection position is irradiated by a light beam of at least one wavelength emitted by the light source component 11. The processor 03 records the electrical signal output by the detection unit 12 when the object under test at the placement position is irradiated by the light beam, and then calculates the spectral absorbance of the object under test based on the electrical signal output by the detection unit 12 when the object under test at the placement position is irradiated by the light beam.

[0113] In one embodiment, the processor 03 may also control the reaction component 02 to schedule multiple placement positions and at least one calibration position to the detection position according to a set time sequence in each measurement cycle, so that the test object at the placement position or calibration position is irradiated by a light beam of at least one wavelength emitted by the light source component 11; when it is determined that the fluctuation between two adjacent light source background intensities within a preset time period is less than a preset fluctuation, the electrical signal output by the detection unit 12 when the test object at the placement position is irradiated by the light beam is recorded, and then the spectral absorbance of the test object at the placement position is calculated based on the electrical signal output by the detection unit 12 when the test object at the placement position is irradiated by the light beam.

[0114] Step 404: Calibrate the spectral absorbance of the object being measured at the placement position.

[0115] After obtaining the spectral absorbance of the object under test at the placement position, processor 03 calibrates the spectral absorbance of the object under test at the placement position based on the current background intensity of the light source. Specifically, calibration can be performed using the calibration formula mentioned above.

[0116] For example, as Figure 2 He Ru Figure 4Taking the automatic analyzer based on filter spectral dispersion as an example, the gap between the reaction cups at positions 1 and 2 is used as the calibration position. The processor 03 can control the reaction unit 02 to move this calibration position to detection point A, acquiring the background intensity of the light source when at least one wavelength of light emitted by the light source passes through this calibration position. For example, if the light source emits two wavelengths of light, λ1 and λ2, the background intensities L1, L2, L3, and L4 are acquired sequentially for the λ1 wavelength light. When L4 is acquired, it is determined that the fluctuations of L3 and L4 are less than a preset fluctuation and within a preset time period. At this point, the electrical signal output by the detection unit 12 when the object under test at the placement position is irradiated by the light beam is recorded, and the spectral absorbance of the object under test at the placement position is calculated based on this electrical signal. Then, based on L4, the spectral absorbance of the object under test at the placement position is calibrated using the aforementioned calibration formula. The same method can be used for the λ2 wavelength light beam.

[0117] For example, as Figure 2 He Ru Figure 4 Taking the automatic analyzer based on filter spectroscopy as an example, the gap between any two adjacent reaction cups is used as the calibration position. The processor 03 can control the reaction component 02 to sequentially schedule each calibration position to the detection position A. The light source emits a wavelength beam, and the processor 03 obtains the background intensity of the light source when the wavelength beam passes through each calibration position. For example, when passing through the first calibration position (the gap between the reaction cups at positions 1 and 2), the background intensity L1 is obtained; when passing through the second calibration position (the gap between the reaction cups at positions 2 and 3), the background intensity L2 is obtained; and when passing through the third calibration position (the gap between the reaction cups at positions 3 and 4), the background intensity L3 is obtained. At this time, it is determined that the fluctuation of L2 and L3 is less than the preset fluctuation and within the preset time period. Then, the electrical signal output by the detection unit 12 when the test object at position 4 receives the beam is recorded, and the spectral absorbance of the test object at the position is calculated based on the electrical signal. Then, based on L3, the spectral absorbance of the test object at position 4 is calibrated using the above calibration formula. Then, the background intensity of the light source when the light beam passes through the fourth calibration position (the gap between the reaction cup at position 4 and position 5) is obtained, and the spectral absorbance of the reaction cup at position 5 is calibrated using this background intensity.

[0118] The automatic analyzer and calibration method provided in this embodiment measure the spectral absorbance of the test object at the placement position and the background intensity of the light source at the calibration position within the same measurement cycle. The spectral absorbance of the test object at the placement position is calibrated using the background intensity of the light source. Calibration can correct the error in the spectral absorbance of the test object at the placement position caused by light source fluctuations, thereby improving the accuracy of the measurement. Therefore, it can enter clinical testing when the light source is not so stable. As long as the fluctuation between two adjacent background intensities of the light source within a preset time period is less than the preset fluctuation amount, the spectral absorbance of the test object at the placement position can be recorded, which is equivalent to starting clinical testing in advance, thereby shortening the light source incubation time and reducing the test waiting time.

[0119] For automatic analyzers, the spectral intensity of the light source will continuously decrease during use. In addition, the optical efficiency of each optical component in the optical path will also decrease to varying degrees. Therefore, the total energy of the optical system is not constant. Thus, the transmittance of the reaction cup cannot be accurately calculated solely based on the signal intensity transmitted through the reaction cup.

[0120] Based on this, and according to the concept of this application, one embodiment also provides an automatic analyzer, the structural schematic of which can be referred to... Figure 1 In this embodiment, under the control of the processor, the reaction component 02 schedules multiple placement positions and at least one calibration position to the detection position according to a set time sequence during each cup blank measurement cycle, so that the test object at the placement position or calibration position receives light beam irradiation. The processor 03 is used to receive the electrical signal output by the detection unit 12, obtain the cup blank light intensity of the reaction cup at the placement position based on the electrical signal output by the detection unit 12 when the test object at the placement position receives light beam irradiation, obtain the background intensity of the light source based on the electrical signal output by the detection unit 12 when the test object at the calibration position receives light beam irradiation, calculate the transmittance of the reaction cup based on the cup blank light intensity and the background intensity of the light source, and send a contamination warning message to the output device 04 when it is determined that the transmittance of the reaction cup meets the preset abnormal conditions. The output device 04 is used to output the contamination warning message of the reaction cup. The calibration position includes the gap between reaction cups or the placement position not used to place the reaction cup, and the test object at the calibration position can be air or a uniformly transparent object. The automatic analyzer in this embodiment can also be as follows. Figure 2 The automatic analyzer based on filter spectral dispersion shown can also be as follows: Figure 3 The automatic analyzer shown is based on grating spectroscopy.

[0121] Specifically, processor 03 can calculate the transmittance of the reaction vessel according to the following transmittance calculation formula: The transmittance calculation formula is:

[0122]

[0123] Among them, Ti Let I be the transmittance of the reaction cup obtained in the i-th cup blank measurement cycle. blanki Let I be the cup blank light intensity measured in the i-th cup blank measurement cycle. i0 The background intensity of the light source is the value of the reaction cup measured during the i-th cup blank measurement cycle.

[0124] Since the background intensity of the light source obtained at the calibration position can accurately reflect the real-time spectral intensity of the light source, the transmittance of the reaction cup calculated by using the background intensity of the light source obtained at the calibration position and the measured cup blank light intensity of the reaction cup in each cup blank measurement cycle is more accurate, and thus can more accurately determine whether the reaction cup is contaminated.

[0125] In one embodiment, the processor 03 may send a contamination alert to the output device 04 when it determines that the transmittance of the reaction cup is less than a preset transmittance threshold. In another embodiment, the processor 03 may send a contamination alert to the output device 04 when it determines that the fluctuation value of the transmittance of the reaction cup between two consecutive measurements exceeds a change threshold.

[0126] In one embodiment, the reaction component 02 may, under the control of the processor 03, schedule multiple placement positions and one calibration position to the detection position according to a set timing sequence in each cup blank measurement cycle; in each cup blank measurement cycle, the processor 03 obtains the background intensity of the light source based on the electrical signal output by the detection unit 12 when the object under test at the calibration position is irradiated by the light beam, and uses the background intensity of the light source as the background intensity of the light source for all reaction cups in that cup blank measurement cycle.

[0127] For example, as Figure 2 He Ru Figure 4Taking the automatic analyzer based on filter-based spectral dispersion as an example, the gap between the reaction cups at positions 1 and 2 is used as the calibration position. Assuming measurement is performed in mode two, the processor 03 controls the spectral dispersion unit 112 to insert a filter into the optical path, i.e., to measure a wavelength, such as λ1. In each cup blank measurement cycle, the processor 03 can control the reaction component 02 to first rotate the reaction cup at position 1 to the detection position A and stop it. Then, it controls the spectral dispersion unit 112 to rotate, so that the reaction cup at position 1 receives the illumination of a beam of wavelength λ1, obtaining the cup blank light intensity of the reaction cup at position 1 under the λ1 wavelength beam. Then, the processor 03 controls the reaction component 02 to rotate the gap between the reaction cups at positions 1 and 2 to the detection position A and stop it. It controls the spectral dispersion unit 112 to rotate, so that the beam of wavelength λ1 illuminates the gap between the reaction cups at positions 1 and 2, obtaining the background intensity of the light source corresponding to the λ1 wavelength beam. Next, the processor 03 controls the reaction unit 02 to rotate the reaction cup at position 2 and the reaction cups at each subsequent position sequentially to the detection point A and stop. The cup blank light intensity of the reaction cup at position 2 and the reaction cups at each subsequent position under the λ1 wavelength beam is measured in the same manner as when detecting the reaction cup at position 1. Then, the light source background intensity corresponding to λ1 is taken as the light source background intensity of all reaction cups in the cup blank measurement period. Based on the light source background intensity corresponding to λ1 and the cup blank light intensity of each reaction cup under the λ1 beam illumination, the transmittance of each reaction cup at each position is calculated using the transmittance calculation formula mentioned above.

[0128] In one embodiment, the reaction component 02 may also be under the control of the processor 03 to schedule multiple placement positions and at least two calibration positions to the detection position according to a set timing sequence in each cup blank measurement cycle; in each cup blank measurement cycle, the processor 03 obtains at least two light source background intensities based on the electrical signal output by the detection unit 12 when the object under test at the calibration position is irradiated by the light beam, and for each light source background intensity, the processor 03 uses the light source background intensity as the light source background intensity of the reaction cup at each placement position between the calibration position and the next calibration position in the cup blank measurement cycle.

[0129] For example, as Figure 2 He Ru Figure 4Taking the automatic analyzer based on filter-based spectral dispersion as an example, the gap between the reaction cups at positions 1 and 2 is used as the first calibration position, and the gap between the reaction cups at positions 8 and 9 is used as the second calibration position. Assuming that the measurement is performed in mode two, the processor 03 controls the spectral dispersion unit 112 to rotate a filter into the optical path, i.e., to measure a wavelength, such as λ1. In each cup blank measurement cycle, the processor 03 can control the reaction component 02 to first rotate the reaction cup at position 1 to the detection position A and stop, and then control the spectral dispersion unit 112 to rotate so that the reaction cup at position 1 receives the illumination of a beam of wavelength λ1, thus obtaining the cup blank light intensity of the reaction cup at position 1 under the λ1 wavelength beam. Next, the processor 03 controls the reaction unit 02 to rotate the first calibration position (the gap between the reaction cups at positions 1 and 2) to the detection position A and stop, and controls the beam splitting unit 112 to rotate so that the λ1 wavelength beam passes through the first calibration position, obtaining the background intensity of the light source when the λ1 wavelength beam passes through the first calibration position; then, the processor 03 controls the reaction unit 02 to rotate the reaction cups at positions 2 to 8 sequentially to the detection position A and stop, completing the cup blank light test of the reaction cups at positions 2 to 8 under the λ1 wavelength beam in the same manner as when detecting the reaction cup at position 1. The processor 03 then controls the reaction unit 02 to rotate the second calibration position (the gap between the reaction cups at positions 8 and 9) to the detection position A and stop. The background intensity of the light source when the λ1 wavelength beam passes through the second calibration position is obtained using the same method as when detecting the first calibration position. Then, the processor 03 controls the reaction unit 02 to rotate the reaction cups at positions 9 to 16 sequentially to the detection position A and stop. The cup blank light intensity of the reaction cups at positions 9 to 16 under the λ1 wavelength beam is measured in the same way as when detecting the reaction cup at position 1. Subsequently, for the blank measurement cycle of the cup, based on the background intensity of the light source when the λ1 wavelength beam passes through the first calibration position and the blank light intensity of each reaction cup at positions 2 to 8 under the illumination of the λ1 beam, the transmittance of each reaction cup at positions 2 to 8 is calculated using the transmittance calculation formula mentioned above; based on the background intensity of the light source when the λ1 wavelength beam passes through the second calibration position and the blank light intensity of each reaction cup at positions 9 to 16 and 1 under the illumination of the λ1 beam, the transmittance of each reaction cup at positions 9 to 16 and 1 is calculated using the transmittance calculation formula mentioned above.

[0130] Preferably, the gaps between all adjacent reaction cups can be used as calibration points, such as... Figure 2 He Ru Figure 4Taking the automatic analyzer based on filter spectral dispersion as an example, the transmittance of the reaction cup at position 2 can be calculated based on the background intensity of the light source obtained when the beam passes through the gap between reaction cups at positions 1 and 2, and the cup blank light intensity of reaction cup 2. Similarly, the transmittance of the reaction cup at position 3 can be calculated based on the background intensity of the light source obtained when the beam passes through the gap between reaction cups at positions 2 and 3, and the cup blank light intensity of reaction cup 3. This process is repeated to obtain the transmittance of each reaction cup at each position. This allows for real-time monitoring of the background intensity of the light source, resulting in highly accurate transmittance readings.

[0131] Based on the concept of this application, and referring to Figure 12 The flowchart below illustrates a method for determining contamination in the reaction cup of an automated analyzer, as provided in this application. This method may include the following steps:

[0132] Step 501: Control the placement and calibration positions of the reaction components.

[0133] During each cup blank measurement cycle, the processor 03 controls the reaction unit 02 to schedule multiple placement positions and at least one calibration position to the detection position according to a set timing sequence, so that the object under test at the placement position or calibration position is irradiated by a light beam of at least one wavelength emitted by the light source assembly 11.

[0134] Step 502: Obtain the cup blank light intensity of the reaction cup at the placement position.

[0135] When the processor 03 controls the reaction unit 02 to schedule a placement position to a detection position, the object under test at the placement position is irradiated by a light beam of at least one wavelength emitted by the light source assembly 11. After the light beam passes through the object under test at the placement position, it is received by the detection unit 12. The detection unit 12 outputs an electrical signal to the processor 03 based on the spectral intensity of the light beam passing through the detection position. The processor 03 obtains the cup blank light intensity of the reaction cup at the placement position based on the electrical signal output by the detection unit 12 when the object under test at the placement position is irradiated by the light beam.

[0136] Step 503: Obtain the background intensity of the light source.

[0137] When the processor 03 controls the reaction unit 02 to schedule a calibration position to a detection position, the object under test at the calibration position is irradiated by a light beam of at least one wavelength emitted by the light source assembly 11. After the light beam passes through the object under test at the calibration position, it is received by the detection unit 12. The detection unit 12 outputs an electrical signal to the processor 03 based on the spectral intensity of the light beam passing through the detection position. After receiving the electrical signal, the processor 03 calculates the background intensity of the light source at the calibration position based on the electrical signal.

[0138] Step 504: Calculate the permeability of the reaction vessel.

[0139] Processor 03 calculates the transmittance of the reaction cup based on the obtained cup blank light intensity and light source background intensity.

[0140] Specifically, the reaction component 02 can be controlled by the processor 03 to schedule multiple placement positions and one calibration position to the detection position according to a set timing sequence in each cup blank measurement cycle. In this case, in each cup blank measurement cycle, the processor 03 will obtain the background intensity of the light source based on the electrical signal output by the detection unit 12 when the object under test at the calibration position is irradiated by the light beam. The background intensity of the light source will be used as the background intensity of the light source for all reaction cups in the cup blank measurement cycle. Then, the transmittance of each reaction cup will be calculated using the transmittance calculation formula mentioned above.

[0141] The reaction unit 02 can also, under the control of the processor 03, schedule multiple placement positions and at least two calibration positions to the detection position according to a set timing sequence during each cup blank measurement cycle. In this case, during each cup blank measurement cycle, the processor 03 obtains at least two light source background intensities based on the electrical signal output by the detection unit 12 when the object under test at the calibration position is irradiated by the light beam. For each light source background intensity, the processor 03 uses this light source background intensity as the light source background intensity of the reaction cup at each placement position between the calibration position and the next calibration position during the cup blank measurement cycle. Then, based on the light source background intensity, the transmittance of the reaction cup at each placement position between the calibration position and the next calibration position is calculated using the aforementioned transmittance calculation formula.

[0142] Step 505: Determine whether the transmittance meets the preset abnormal conditions.

[0143] After obtaining the transmittance of the reaction cup, processor 03 determines whether the transmittance meets preset abnormal conditions. For example, it determines whether the transmittance is less than a preset transmittance threshold; if it is less, the preset abnormal conditions are met. Alternatively, it can determine whether the fluctuation value of the transmittance between two consecutive values ​​exceeds a change threshold; if it does, the preset abnormal conditions are met. If the transmittance meets the preset abnormal conditions, step 506 is executed; otherwise, the subsequent tests continue according to the set timing sequence.

[0144] Step 506: Indicates that the reaction vessel is contaminated.

[0145] When the processor 03 determines that the transmittance of the reaction cup meets the preset abnormal conditions, it sends a contamination warning message to the output device 04 to indicate that the reaction cup is contaminated.

[0146] The automatic analyzer and its method for determining reaction cup contamination provided in this application embodiment use at least one gap between adjacent reaction cups as a calibration position or at least one placement position not used for placing reaction cups as a calibration position. It can measure the transmittance of the reaction cups in real time based on the background intensity of the light source collected at the calibration position, determine whether the reaction cups are contaminated based on the transmittance, and provide a timely prompt when contamination is detected. Users can then take timely action based on this prompt, such as replacing the contaminated reaction cup, or the automatic analyzer can automatically perform contamination removal actions, thereby avoiding any impact on the measurement results. Since the background intensity of the light source obtained at the calibration position can accurately reflect the real-time spectral intensity of the light source, the transmittance of the reaction cups calculated using the background intensity of the light source obtained at the calibration position and the measured cup blank light intensity in each cup blank measurement cycle is more accurate, thus enabling a more accurate determination of the contamination status of the reaction cups.

[0147] Those skilled in the art will understand that all or part of the functions of the various methods in the above embodiments can be implemented by hardware or by computer programs. When all or part of the functions in the above embodiments are implemented by computer programs, the program can be stored in a computer-readable storage medium, which may include: read-only memory, random access memory, disk, optical disk, hard disk, etc., and the program is executed by a computer to achieve the above functions. For example, the program can be stored in the memory of a device, and when the program in the memory is executed by the processor, all or part of the above functions can be achieved. In addition, when all or part of the functions in the above embodiments are implemented by computer programs, the program can also be stored in a server, another computer, disk, optical disk, flash drive, or external hard drive, etc., and can be downloaded or copied to the memory of a local device, or the system of the local device can be updated. When the program in the memory is executed by the processor, all or part of the functions in the above embodiments can be achieved.

[0148] The above examples illustrate the present invention only to aid in understanding it and are not intended to limit the scope of the invention. Those skilled in the art can make various simple deductions, modifications, or substitutions based on the principles of this invention.

Claims

1. An automatic analyzer, characterized in that, It includes optical measurement components, reaction components, a processor, and an output device; The photometric component includes a light source assembly and a detection unit. The light source assembly is used to emit a light beam of at least one wavelength and illuminate the detection position with the light beam. The detection unit is used to collect the light beam passing through the detection position and output an electrical signal according to the spectral intensity of the light beam. The reaction component is connected to the processor and includes multiple placement positions for placing reaction cups and at least one calibration position. Under the control of the processor, the reaction component schedules the multiple placement positions and at least one calibration position to the detection position according to a set time sequence during each cup blank measurement cycle, so that the object under test at the placement position or calibration position is irradiated by the light beam; the calibration position is the position where the light beam emitted by the light source assembly does not pass through the reaction cup. The processor is also connected to the detection unit and the output device, respectively, for receiving the electrical signal output by the detection unit, obtaining the blank light intensity of the reaction cup at the placement position based on the electrical signal output by the detection unit when the test object at the placement position is irradiated by the light beam, wherein the blank light intensity is the light intensity of the light beam passing through the reaction cup when the reaction cup is empty or the liquid in the reaction cup is deionized water or purified water; obtaining the background intensity of the light source based on the electrical signal output by the detection unit when the test object at the calibration position is irradiated by the light beam, calculating the transmittance of the reaction cup based on the blank light intensity and the background intensity of the light source, and sending a prompt message that the reaction cup is contaminated to the output device when it is determined that the transmittance meets the preset abnormal conditions; The output device is used to output a warning message indicating that the reaction vessel is contaminated.

2. The automatic analyzer as described in claim 1, characterized in that, Specifically, the processor is used to send a warning message indicating that the reaction cup is contaminated when it determines that the transmittance is less than a preset transmittance threshold.

3. The automatic analyzer as described in claim 1, characterized in that, Specifically, the processor is used to send a warning message indicating that the reaction cup is contaminated to the output device when it determines that the fluctuation value of the transmittance between two consecutive times exceeds the change threshold.

4. The automatic analyzer as described in claim 1, characterized in that, The processor is specifically used to calculate the transmittance of the reaction vessel according to the transmittance calculation formula, which is: ， Wherein, T i is the transmittance of the reaction cup in the i th cup blank measurement period, I blanki is the light intensity of the cup blank measured by the reaction cup in the i th cup blank measurement period, I i0 is the corresponding light source background intensity measured by the reaction cup in the i th cup blank measurement period.

5. The automatic analyzer as described in claim 1, characterized in that, Under the control of the processor, the reaction component schedules multiple placement positions and one calibration position to the detection position according to a set time sequence in each cup blank measurement cycle. In each cup blank measurement cycle, the processor obtains the background intensity of the light source based on the electrical signal output by the detection unit when the object under test at the calibration position is irradiated by the light beam, and uses the background intensity of the light source as the background intensity of the light source for all reaction cups in that cup blank measurement cycle.

6. The automatic analyzer as described in claim 1, characterized in that, Under the control of the processor, the reaction component schedules multiple placement positions and at least two calibration positions to the detection position according to a set timing sequence in each cup blank measurement cycle. In each cup blank measurement cycle, the processor obtains at least two light source background intensities based on the electrical signal output by the detection unit when the object under test at the calibration position is irradiated by the light beam. For each light source background intensity, the processor uses the light source background intensity as the light source background intensity of the reaction cup at each placement position between the calibration position and the next calibration position in the cup blank measurement cycle.

7. The automatic analyzer as described in claim 1, characterized in that, The object being measured at the calibration position includes air or a uniformly transparent object.

8. The automatic analyzer as described in claim 1, characterized in that, The calibration position includes the gap between reaction cups or a placement position not used to place reaction cups.

9. The automatic analyzer as described in claim 1, characterized in that, The light source assembly includes a light source and collimation units, beam splitting units, and a first focusing unit arranged at intervals on the same side of the light source; the detection unit includes a second focusing unit and a photodetector. The light beam emitted by the light source is collimated by the collimating unit and then passes through the beam splitting unit. The beam splitting unit splits the collimated light beam into light beams of at least one wavelength. The light beams are then focused and shaped by the first focusing unit and then illuminate the detection position. The second focusing unit collects the light beam passing through the detection position and focuses the light beam onto the photodetector, which converts the spectral intensity of the light beam into an electrical signal output.

10. The automatic analyzer as described in claim 1, characterized in that, The light source assembly includes a light source and a third focusing unit spaced apart on one side of the light source; the detection unit includes a fourth focusing unit, an entrance slit, a grating, and a photoelectric detection unit. The light beam emitted by the light source is focused and shaped by the third focusing unit before illuminating the detection position; The fourth focusing unit collects the light beam passing through the detection position and focuses the light beam through the entrance slit. The grating diffracts and disperses the light beam after it passes through the entrance slit and images the resulting spectrum onto the photoelectric detection unit. The photoelectric detection unit converts the spectral intensity of the spectrum into an electrical signal for output.

11. A method for determining contamination in the reaction cup of an automatic analyzer, characterized in that, include: The control reaction component schedules multiple placement positions and at least one calibration position to the detection position according to a set time sequence during each cup blank measurement cycle, so that the object under test at the placement position or calibration position is irradiated by the light beam; the calibration position is the position where the light beam emitted by the light source component does not pass through the reaction cup; The receiving and detection unit outputs an electrical signal based on the spectral intensity of the light beam passing through the detection position; The blank light intensity of the reaction cup at the placement position is obtained by the electrical signal output by the detection unit when the object under test at the placement position is irradiated by the light beam; the blank light intensity of the cup is the light intensity of the light beam passing through the reaction cup when the reaction cup is empty or the liquid in the reaction cup is deionized water or pure water. The background intensity of the light source is obtained from the electrical signal output by the detection unit when the object under test at the calibration position is irradiated by the light beam; The transmittance of the reaction cup is calculated based on the blank light intensity of the cup and the background intensity of the light source; When it is determined that the transmittance meets the preset abnormal conditions, a prompt message indicating that the reaction cup is contaminated is sent to the output device.

12. A computer-readable storage medium, characterized in that, Includes a program that can be executed by a processor to implement the method as described in claim 11.

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