Display screen abnormality recovery method and device, computer device, and storage medium

Abstract

The application relates to a display screen abnormality recovery method and device, computer equipment and a storage medium, which comprises the following steps: starting an ESD detection work queue; judging whether a register abnormality signal sent by a DDIC corresponding to the display screen is received within a preset detection delay corresponding to the ESD detection work queue; when the register abnormality signal is received, performing an ESD display screen abnormality recovery operation; when the register abnormality signal is not received, detecting the DDIC state through the ESD detection work queue; and when the ESD detection work queue detects that the DDIC state is abnormal, performing an ESD display screen abnormality recovery operation. The application detects the register abnormality signal sent by the DDIC outside the detection work queue, and thus additional abnormality detection is performed, so that the display screen abnormality recovery time is shorter than the preset detection delay of the detection work queue, that is, the display screen abnormality recovery time can be effectively shortened while the accuracy of the display screen abnormality recovery is ensured.

Description

TECHNICAL FIELD

[0001] The present application relates to the field of mobile communication devices, in particular to an ESD (Electro-Static discharge) display screen abnormality recovery method and device, computer equipment and storage medium. BACKGROUND

[0002] A mobile phone display screen is also called a display screen, which is used to display images and colors. Currently, mobile phones generally use OLCD screens (Organic Light-Emitting Diode). A mobile phone display screen is hit by static electricity, resulting in display screen abnormalities. The current recovery method for display screen abnormalities caused by static electricity in mobile phones generally includes DDIC (Display Driver Integrated Circuit) register read-back judgment, TE (Tear Effect) detection judgment, etc.

[0003] The existing DDIC register read-back judgment method is generally set to read back once every 5 seconds to determine whether the screen display is normal. If the register read-back value indicates that the screen is in an abnormal state such as black screen, green screen or screen, the AP (application processor) end controls the DDIC to perform hardware reset recovery. If the time interval of read-back is reduced, the power consumption of the entire machine will be increased and the performance will be affected. Therefore, if the display screen is abnormal, it needs to be automatically recovered for up to 5 seconds, which is too long. SUMMARY

[0004] Therefore, it is necessary to provide a display screen abnormality recovery method, device, computer equipment and storage medium capable of effectively shortening the display screen abnormality recovery time in view of the above technical problems.

[0005] A display screen abnormality recovery method, the method comprising:

[0006] starting an ESD detection work queue;

[0007] determining whether a register abnormality signal sent by a DDIC corresponding to the display screen is received within a preset detection delay corresponding to the ESD detection work queue;

[0008] when the register abnormality signal is received, performing an ESD display screen abnormality recovery operation;

[0009] when the register abnormality signal is not received, detecting the DDIC state through the ESD detection work queue, and when the ESD detection work queue detects that the DDIC state is abnormal, performing an ESD display screen abnormality recovery operation.

[0010] In one of the embodiments, the register exception signal comprises a register exception interrupt signal, which is generated after the DDIC is struck by ESD.

[0011] In one of the embodiments, the ESD display screen exception recovery operation comprises:

[0012] Zeroing the waiting time in the ESD detection work queue.

[0013] In one of the embodiments, the ESD display screen exception recovery operation comprises:

[0014] In one of the embodiments, the ESD display screen exception recovery operation comprises:

[0015] In one of the embodiments, the ESD display screen exception recovery operation comprises:

[0016] Powering down the voltage pins of the display screen in sequence.

[0017] Re-powering up the voltage pins in sequence and performing display screen reset operation.

[0018] In one of the embodiments, the ESD display screen exception recovery operation comprises:

[0019] In one of the embodiments, the ESD display screen exception recovery operation comprises:

[0020] In one of the embodiments, the ESD display screen exception recovery operation comprises:

[0021] When the display screen is playing video and the MIPI transmission data is incorrect, the number of reporting of the display screen tearing effect signal is obtained, and when the number of reporting is less than a preset threshold within a preset time interval, the display screen is in an abnormal state.

[0022] In one of the embodiments, the ESD display screen exception recovery operation comprises:

[0023] A display screen abnormality recovery apparatus, the apparatus comprising:

[0024] A queue starting module for starting an ESD detection work queue;

[0025] A signal receiving module for judging whether a register abnormality signal sent by a DDIC corresponding to the display screen is received within a preset detection delay corresponding to the ESD detection work queue;

[0026] A first abnormality recovery module for executing an ESD display screen abnormality recovery operation when the register abnormality signal is received;

[0027] A second abnormality recovery module for detecting the DDIC state through the ESD detection work queue when the register abnormality signal is not received, and executing an ESD display screen abnormality recovery operation when the ESD detection work queue detects that the DDIC state is abnormal.

[0028] A computer device comprising a memory and a processor, the memory storing a computer program, and the processor implementing the following steps when executing the computer program:

[0029] Starting an ESD detection work queue;

[0030] Judging whether a register abnormality signal sent by a DDIC corresponding to the display screen is received within a preset detection delay corresponding to the ESD detection work queue;

[0031] Executing an ESD display screen abnormality recovery operation when the register abnormality signal is received;

[0032] Detecting the DDIC state through the ESD detection work queue when the register abnormality signal is not received, and executing an ESD display screen abnormality recovery operation when the ESD detection work queue detects that the DDIC state is abnormal.

[0033] A computer readable storage medium having a computer program stored thereon, the computer program being executed by a processor to implement the following steps:

[0034] Starting an ESD detection work queue;

[0035] Judging whether a register abnormality signal sent by a DDIC corresponding to the display screen is received within a preset detection delay corresponding to the ESD detection work queue;

[0036] Executing an ESD display screen abnormality recovery operation when the register abnormality signal is received;

[0037] When the register exception signal is not received, the DDIC state is detected through the ESD detection work queue, and when the ESD detection work queue detects that the DDIC state is abnormal, an ESD display screen exception recovery operation is performed.

[0038] The display screen exception recovery method, device, computer equipment and storage medium described above, by starting an ESD detection work queue; determining whether a register exception signal sent by the DDIC corresponding to the display screen is received within a preset detection delay corresponding to the ESD detection work queue; when the register exception signal is received, performing an ESD display screen exception recovery operation; when the register exception signal is not received, detecting the DDIC state through the ESD detection work queue, and when the ESD detection work queue detects that the DDIC state is abnormal, performing an ESD display screen exception recovery operation. The present application detects additional exceptions through the register exception signal sent by the DDIC outside the detection work queue, so the display screen exception recovery time is shorter than the preset detection delay of the detection work queue, that is, the display screen exception recovery time can be effectively shortened while ensuring the accuracy of the display screen exception recovery. BRIEF DESCRIPTION OF DRAWINGS

[0039] Figure 1 An application environment diagram of the display screen exception recovery method in one embodiment;

[0040] Figure 2 A flowchart of the display screen exception recovery method in one embodiment;

[0041] Figure 3 A sub-flowchart of performing an ESD display screen exception recovery operation in one embodiment;

[0042] Figure 4 A sub-flowchart of the display screen exception recovery steps when playing a video in one embodiment;

[0043] Figure 5 A flowchart of the display screen exception recovery method in a more specific embodiment;

[0044] Figure 6 A structural block diagram of the display screen exception recovery device in one embodiment;

[0045] Figure 7 An internal structure diagram of the computer equipment in one embodiment. DETAILED DESCRIPTION

[0046] In order to make the purposes, technical solutions and advantages of the present application clearer, the present application will be further described in detail below with reference to the drawings and embodiments. It should be understood that the specific embodiments described herein are only used to explain the present application and not intended to limit the present application.

[0047] The display screen abnormality recovery method provided by the present application can be applied in an application environment as shown in Figure 1 The application processor and the display driving integrated circuit are two components of the mobile communication device. The application processor (AP) is connected with each pin of the display driving integrated circuit (DDIC). The application processor starts an ESD detection work queue, judges whether a register abnormality signal sent by the DDIC corresponding to the display screen is received within a preset detection delay corresponding to the ESD detection work queue, executes an ESD display screen abnormality recovery operation when the register abnormality signal is received, and executes the ESD display screen abnormality recovery operation when the DDIC state is detected by the ESD detection work queue and the DDIC state is abnormal.

[0048] In one embodiment, as shown in Figure 2 A display screen abnormality recovery method is provided. The method is applied to the application processor in Figure 1 for example, and includes the following steps.

[0049] Step 201, starting an ESD detection work queue.

[0050] The ESD detection work queue specifically refers to a work queue for detecting whether the display screen is abnormal due to ESD. ESD means electrostatic discharge. ESD can cause electronic devices to malfunction or be damaged. When semiconductor devices are placed alone or installed in a circuit module, permanent damage to these devices can occur even without power. That is, ESD can easily cause magnetic aging of the display screen and affect the normal operation of the display screen. The ESD detection work queue can be a loop work queue created in the system kernel layer. Specifically, the application processor can start the ESD detection work queue in the system kernel layer to detect whether the system display screen is in an ESD abnormal state after the display screen is turned on. After the screen is turned off, the ESD detection work queue can be canceled by a corresponding cancel instruction.

[0051] Specifically, the application processor can create a loop work queue in the system kernel layer to monitor whether the screen is abnormal due to ESD. When the display screen abnormality recovery is executed, the ESD detection work queue can be directly used to judge

[0052] Step 205, judge whether the register abnormal signal sent by the DDIC corresponding to the display screen is received within the preset detection delay corresponding to the ESD detection work queue.

[0053] The preset detection delay refers to the delay corresponding to the read-back time (cycle time) set by the ESD detection work queue. For example, if the cycle of the ESD detection work queue is set to 5 seconds, the preset detection delay specifically refers to the 5 seconds after the start of each cycle of the ESD detection work queue. The judgment process specifically refers to judging whether the register abnormal signal sent by the DDIC corresponding to the display screen is received within the 5 seconds.

[0054] Specifically, the display screen abnormality can be detected in the form of an error flag. When the DDIC detects that the screen is abnormal, the corresponding register abnormal signal can be directly sent to the application processor to trigger the error flag mechanism of the application processor. The display screen abnormality recovery is performed by the error flag mechanism, and when the DDIC does not detect that the screen is abnormal, the display screen abnormality can be detected by the ESD detection work queue.

[0055] Step 205, when the register abnormal signal is received, the ESD display screen abnormality recovery operation is performed.

[0056] Specifically, the DDIC has a built-in display screen abnormality detection mechanism, such as for common ESD display screen abnormalities such as black screen or green screen. The built-in abnormality detection mechanism in the DDIC can immediately detect the abnormality, at which time the DDIC can send a corresponding register abnormal signal to the application processor. In one embodiment, the register abnormal signal specifically includes a register abnormal interrupt signal, which is generated by the DDIC after being attacked by ESD and is automatically generated by the abnormality detection device built in the DDIC. Since the DDIC internally includes an ESD state detection logic circuit, it can be used to detect some ESD display screen abnormalities. When the DDIC is attacked by ESD, the abnormality of the DDIC can be transmitted to the application processor through the interrupt signal by the ESD state detection logic circuit in the DDIC. The interrupt signal pin of the DDIC is connected to the application processor. The application processor can directly receive the register abnormal signal sent by the DDIC through the interrupt signal pin. And after receiving the register abnormal signal sent by the DDIC, the ESD display screen abnormality recovery operation is directly performed. The abnormal display screen after being attacked by ESD is reset to the original appearance.

[0057] Step 207, when the register abnormal signal is not received, the DDIC state is detected by the ESD detection work queue, and when the ESD detection work queue detects that the DDIC state is abnormal, the ESD display screen abnormality recovery operation is performed.

[0058] When the register abnormal signal is not received, the DDIC can be in a normal state or an abnormal state that cannot be found by the DDIC self-checking. For example, for the abnormal screen phenomenon of partial black screen, partial green screen, garbled screen and red screen, the DDIC self-checking cannot find the abnormality. In this case, the abnormality of the display screen can be detected at the end of each cycle of the ESD detection work queue. When the ESD detection work queue detects the abnormal state of the DDIC, the ESD display screen abnormality recovery operation is performed to reset the display screen to the original appearance after the abnormality caused by the ESD attack.

[0059] The display screen abnormality recovery method described above starts the ESD detection work queue, judges whether the register abnormal signal sent by the DDIC of the display screen is received within the preset detection delay of the ESD detection work queue, performs the ESD display screen abnormality recovery operation when the register abnormal signal is received, and detects the state of the DDIC by the ESD detection work queue when the register abnormal signal is not received. When the ESD detection work queue detects the abnormal state of the DDIC, the ESD display screen abnormality recovery operation is performed. The register abnormal signal sent by the DDIC outside the detection work queue is used for additional abnormality detection in the present application, so that the display screen abnormality recovery time is shorter than the preset detection delay of the detection work queue, that is, the display screen abnormality recovery time can be effectively shortened while the accuracy of the display screen abnormality recovery is ensured.

[0060] In one of the embodiments, the step 205 further includes setting the waiting time in the ESD detection work queue to zero.

[0061] Specifically, when the register abnormal signal is received within the cycle time of the ESD detection work queue, it indicates that the current display screen has an abnormality, and the ESD display screen abnormality recovery operation has been performed by the application processor to restore the abnormal display screen to the normal state. At this time, the waiting time in the ESD detection work queue can be directly cleared to zero, and the initial operation of the ESD display screen abnormality recovery is restarted to detect the ESD display screen abnormality in the subsequent process. In the embodiment, after the register abnormal signal is received and the ESD display screen abnormality recovery operation is performed, the waiting time in the ESD detection work queue is cleared to zero, and the flow of the display screen abnormality detection and recovery is restarted, so that the timeliness of the display screen abnormality recovery can be ensured.

[0062] In one of the embodiments, the step 207 includes obtaining the screen end register value of the DDIC register by the ESD detection work queue, and performing the ESD display screen abnormality recovery operation when the screen end register value indicates that the DDIC is in an abnormal state.

[0063] Specifically, the application processor can read the state register value in the DDIC through the MIPI (Mobile Industry Processor Interface) protocol, compare the read state register value with the normal register value, and determine whether the current DDIC is in an abnormal state and whether there is a phenomenon that causes the display screen to appear display abnormalities (such as black screen, green screen, flower screen, red screen, etc.). Each time the register value is read in a loop of an ESD detection work queue to determine whether the register value is read. For example, for the case where the loop of the ESD detection work queue is 5 seconds, it takes at most 5 seconds to control the DDIC to power on and off to perform hardware reset recovery, and increasing the reading period will increase resource scheduling and power consumption. In the embodiment, the screen end register value of the DDIC register is obtained to determine whether the display screen is abnormal, which can effectively ensure the accuracy of the display screen abnormality determination.

[0064] As shown in Figure 3 In one embodiment, the ESD display screen abnormality recovery operation includes:

[0065] Step 302, power off the voltage pins of the display screen in order.

[0066] Step 304, power on the voltage pins in order to perform the display screen reset operation.

[0067] Specifically, in order to recover the display screen, the voltage pins in the display screen can be powered off in order, and powered on after the power-off is completed. The static electricity of the screen is removed to restore the display screen affected by ESD to normal. Since the ESD process is a static charge transfer process between objects with different potentials, the intensity is affected by the amount of electricity and the distance between objects. By powering off the voltage pins in the display screen in order, and powering on after the power-off is completed, the amount of electricity of the display screen can be cleared in a short time, thereby restoring the display screen affected by ESD to normal. In the embodiment, by performing the reset operation of powering on and off the voltage pins of the display screen, the display screen affected by ESD can be effectively restored to normal.

[0068] In one embodiment, before step 201, it further includes: when the display screen is playing a video, detecting the display screen state through the MIPI and TE detection mechanism, and when the display screen is in an abnormal state, performing the ESD display screen abnormality recovery operation.

[0069] In this embodiment, when the display is playing video, the TE detection mechanism can effectively ensure the efficiency of display recovery. By detecting whether MIPI transmission is faulty, if so, the TE detection mechanism is directly invoked to determine if the display is malfunctioning and unable to transmit data normally. If so, an ESD display abnormality recovery operation is performed, directly initiating a DDIC hardware reset. In this embodiment, using MIPI and TE detection mechanisms to perform abnormality detection while the display is playing video effectively ensures the efficiency of abnormality detection.

[0070] like Figure 4 As shown, in one embodiment, when the display is playing video, the display status is detected through MIPI and TE detection mechanisms. When the display is in an abnormal state, the ESD display abnormality recovery operation includes:

[0071] Step 401: When the display screen is playing video and MIPI data transmission error occurs, obtain the number of reported display screen tearing effect signals. When the number of reported signals within a preset time interval is less than a preset threshold, the display screen is in an abnormal state.

[0072] Step 403: Perform ESD display screen abnormality recovery operation.

[0073] Specifically, TE detection refers to determining whether the display screen is malfunctioning by detecting the number of TE (tear effect) signals within a preset time interval. When playing video, if no TE signal is sent to the AP within a short period, the DDIC is determined to be in an abnormal state, requiring hardware recovery. In this embodiment, determining whether the display screen is malfunctioning by counting the number of reported tear effect signals within a preset time interval while the display screen is playing video effectively ensures the accuracy of display screen malfunction detection.

[0074] In one specific embodiment, the detailed flowchart of this application can be referred to. Figure 5 When initiating display anomaly recovery, the system first checks if the display is playing video. If video is playing, it directly acquires the number of reported TE signals. Based on whether the number of reported TE signals falls below a threshold, a screen anomaly is determined, and ESD display anomaly recovery is performed. When no video is playing, a 5-second delay work queue is created for anomaly detection. Simultaneously, it checks if an error flag is triggered within the 5-second period. If an error flag is triggered, the delay in the work queue is immediately cleared, and ESD display anomaly recovery is performed. Otherwise, if no error flag is triggered, the system reads the on-screen register values ​​once and performs a register comparison to determine if a display anomaly has occurred. If an anomaly is found, the corresponding ESD display anomaly recovery operation is performed.

[0075] It should be understood that although Figures 2-4 The steps in the flowcharts are shown in sequence according to the arrows, but these steps are not necessarily executed in the order indicated by the arrows. Unless otherwise specified herein, the execution of these steps is not strictly limited in sequence, and these steps can be executed in other orders. Moreover, Figures 2-4 At least part of the steps in the flowcharts can include multiple steps or multiple stages, which are not necessarily executed at the same time, but can be executed at different times, and the execution order of these steps or stages is not necessarily sequential, but can be alternately executed with other steps or steps or stages in other steps.

[0076] In one embodiment, as Figure 6 A display screen abnormality recovery apparatus is provided, comprising:

[0077] The queue finding module 601 is configured to start an ESD detection work queue.

[0078] The signal receiving module 603 is configured to determine whether a register abnormality signal sent by a DDIC corresponding to the display screen is received within a preset detection delay time corresponding to the ESD detection work queue.

[0079] The first abnormality recovery module 605 is configured to execute an ESD display screen abnormality recovery operation when the register abnormality signal is received.

[0080] The second abnormality recovery module 607 is configured to detect a DDIC state through the ESD detection work queue when the register abnormality signal is not received, and execute an ESD display screen abnormality recovery operation when the ESD detection work queue detects an abnormality in the DDIC state.

[0081] In one embodiment, the first abnormality recovery module 605 is further configured to set the waiting time in the ESD detection work queue to zero.

[0082] In one embodiment, the second abnormality recovery module 607 is specifically configured to obtain a screen end register value of a DDIC register through the ESD detection work queue, and execute an ESD display screen abnormality recovery operation when the screen end register value indicates that the DDIC is in an abnormal state.

[0083] In one embodiment, the first abnormality recovery module 605 and the second abnormality recovery module 607 are specifically configured to sequentially power down each voltage pin of the display screen, and sequentially power up each voltage pin to execute a display screen reset operation.

[0084] In one of the embodiments, a third abnormality recovery module is further included, configured to: when the display screen is playing a video, detect the display screen state through the MIPI and TE detection mechanism, and when the display screen is in an abnormal state, perform an ESD display screen abnormality recovery operation.

[0085] In one of the embodiments, the third abnormality recovery module is specifically configured to: when the display screen is playing a video and the MIPI transmission data is in error, acquire the number of reports of the display screen tearing effect signal, and when the number of reports is less than a preset threshold within a preset time interval, the display screen is in an abnormal state; and perform an ESD display screen abnormality recovery operation.

[0086] The specific limitations of the display screen abnormality recovery apparatus can be referred to the limitations of the display screen abnormality recovery method in the foregoing, which will not be repeated here. Each module in the display screen abnormality recovery apparatus can be realized by software, hardware and combinations thereof, in whole or in part. Each module can be embedded in or independent of the processor in the computer device in hardware form, or can be stored in the memory in the computer device in software form, so as to be called and executed by the processor to perform the operations corresponding to each module.

[0087] In one embodiment, a computer device is provided, which can be a terminal, and the internal structure diagram thereof can be as shown in Figure 7 The computer device includes a processor, a memory, a communication interface, a display screen and an input device connected through a system bus. The processor of the computer device is configured to provide computing and control capabilities. The memory of the computer device includes a non-volatile storage medium and an internal memory. The non-volatile storage medium stores an operating system and a computer program. The internal memory provides an environment for the operating system and the computer program in the non-volatile storage medium to run. The communication interface of the computer device is configured to perform wired or wireless communication with an external terminal. The wireless communication can be achieved through WIFI, operator network, NFC (near field communication) or other technologies. The computer program is executed by the processor to implement a display screen abnormality recovery method. The display screen of the computer device can be a liquid crystal display screen or an electronic ink display screen. The input device of the computer device can be a touch layer overlaid on the display screen, or a key, trackball or touchpad arranged on the shell of the computer device, or an external keyboard, touchpad or mouse, etc.

[0088] Those skilled in the art can understand that Figure 7 The structure shown in the figure is only a block diagram of part of the structure related to the scheme of the present application, and does not constitute a limitation on the computer device to which the scheme of the present application is applied. The specific computer device can include more or fewer components than those shown in the figure, or combine certain components, or have a different component arrangement.

[0089] In one embodiment, a computer device is provided, comprising a memory and a processor, the memory storing a computer program, and the processor implementing the following steps when executing the computer program:

[0090] starting an ESD detection work queue;

[0091] determining whether a register abnormal signal sent by a DDIC corresponding to the display screen is received within a preset detection delay corresponding to the ESD detection work queue;

[0092] when the register abnormal signal is received, performing an ESD display screen abnormality recovery operation;

[0093] when the register abnormal signal is not received, detecting a DDIC state through the ESD detection work queue, and when the ESD detection work queue detects that the DDIC state is abnormal, performing the ESD display screen abnormality recovery operation.

[0094] In one embodiment, the processor further implements the following step when executing the computer program: setting a waiting time in the ESD detection work queue to zero.

[0095] In one embodiment, the processor further implements the following step when executing the computer program: obtaining a screen end register value of a DDIC register through the ESD detection work queue, and when the screen end register value indicates that the DDIC is in an abnormal state, performing the ESD display screen abnormality recovery operation.

[0096] In one embodiment, the processor further implements the following step when executing the computer program: sequentially powering down each voltage pin of the display screen; and sequentially re-powering each voltage pin to perform a display screen reset operation.

[0097] In one embodiment, the processor further implements the following step when executing the computer program: when the display screen is playing a video, detecting a display screen state through a MIPI and TE detection mechanism, and when the display screen is in an abnormal state, performing the ESD display screen abnormality recovery operation.

[0098] In one embodiment, the processor further implements the following step when executing the computer program: when the display screen is playing a video and MIPI transmission data is incorrect, obtaining a number of reports of a display screen tearing effect signal, and when the number of reports is less than a preset threshold within a preset time interval, the display screen is in an abnormal state; and performing the ESD display screen abnormality recovery operation.

[0099] In one embodiment, a computer readable storage medium is provided, storing a computer program, and the computer program is executed by a processor to implement the following steps:

[0100] starting an ESD detection work queue;

[0101] determining whether the register abnormal signal sent by the DDIC corresponding to the display screen is received within a preset detection delay corresponding to the ESD detection work queue;

[0102] performing an ESD display screen abnormality recovery operation when the register abnormal signal is received;

[0103] performing an ESD display screen abnormality recovery operation when the register abnormal signal is received;

[0104] In one embodiment, the computer program, when executed by the processor, further implements the following steps: zeroing the waiting time in the ESD detection work queue.

[0105] In one embodiment, the computer program, when executed by the processor, further implements the following steps: obtaining the screen end register value of the DDIC register through the ESD detection work queue, and performing an ESD display screen abnormality recovery operation when the screen end register value indicates that the DDIC is in an abnormal state.

[0106] In one embodiment, the computer program, when executed by the processor, further implements the following steps: sequentially powering down each voltage pin of the display screen; and sequentially re-powering each voltage pin to perform a display screen reset operation.

[0107] In one embodiment, the computer program, when executed by the processor, further implements the following steps: when the display screen is playing a video, detecting the display screen state through a MIPI and TE detection mechanism, and performing an ESD display screen abnormality recovery operation when the display screen is in an abnormal state.

[0108] In one embodiment, the computer program, when executed by the processor, further implements the following steps: when the display screen is playing a video and the MIPI transmission data is incorrect, obtaining the number of reports of a display screen tearing effect signal, and when the number of reports is less than a preset threshold within a preset time interval, the display screen is in an abnormal state; and performing an ESD display screen abnormality recovery operation.

[0109] Those skilled in the art can understand that all or part of the processes in the above-mentioned embodiment methods can be completed by a computer program instructing relevant hardware. The computer program can be stored in a non-volatile computer readable storage medium. When the computer program is executed, the processes of the above-mentioned embodiments of the methods can be included. Any reference to memory, storage, database or other medium used in the embodiments provided in the present application can include at least one of non-volatile and volatile memory. The non-volatile memory can include read-only memory (ROM), magnetic tape, floppy disk, flash memory or optical memory. The volatile memory can include random access memory (RAM) or external cache memory. As an illustration but not limitation, the RAM can be in a variety of forms, such as static random access memory (SRAM) or dynamic random access memory (DRAM).

[0110] Any combination of the technical features of the above embodiments can be made. In order to make the description simple, all possible combinations of the technical features in the above embodiments are not described, however, as long as the combination of the technical features does not exist, it should be considered as the scope of the present application.

[0111] The above embodiments only express several implementation manners of the present application, and the description is more specific and detailed, but it should not be understood as a limitation on the scope of the patent. It should be pointed out that for those skilled in the art, without departing from the concept of the present application, some modifications and improvements can be made, which are all within the protection scope of the present application. Therefore, the protection scope of the patent of the present application should be subject to the appended claims.

Claims

1. A display screen abnormality recovery method, the method comprising: starting an ESD detection work queue; determining whether a register abnormality signal sent by a DDIC corresponding to the display screen is received within a preset detection delay corresponding to the ESD detection work queue; the register abnormality signal comprises a register abnormality interrupt signal, the register abnormality interrupt signal is generated after the DDIC is struck by ESD; the preset detection delay refers to a delay corresponding to a cycle time set by the ESD detection work queue; when the register abnormality signal is received, performing an ESD display screen abnormality recovery operation and setting the waiting time in the ESD detection work queue to zero; when the register abnormality signal is not received, detecting the DDIC state at the end of each cycle of the ESD detection work queue by the ESD detection work queue, and performing the ESD display screen abnormality recovery operation when the ESD detection work queue detects that the DDIC state is abnormal.

2. The method of claim 1, wherein, The detection of the DDIC state by the ESD detection work queue and the performance of the ESD display screen abnormality recovery operation when the ESD detection work queue detects that the DDIC state is abnormal comprise: obtaining a screen-side register value of a DDIC register by the ESD detection work queue, and performing the ESD display screen abnormality recovery operation when the screen-side register value indicates that the DDIC is in an abnormal state.

3. The method of claim 1, wherein, The performance of the ESD display screen abnormality recovery operation comprises: sequentially powering down each voltage pin of the display screen; sequentially re-powering each voltage pin of the display screen and performing a display screen reset operation.

4. The method of claim 1, wherein, Before the starting of the ESD detection work queue, the method further comprises: when the display screen is playing a video, detecting the display screen state by a MIPI and TE detection mechanism, and performing the ESD display screen abnormality recovery operation when the display screen is in an abnormal state.

5. The method of claim 4, wherein, The detection of the display screen state by the MIPI and TE detection mechanism and the performance of the ESD display screen abnormality recovery operation when the display screen is in an abnormal state when the display screen is playing a video comprise: when the display screen is playing a video and MIPI transmission data is incorrect, obtaining the number of reports of a display screen tearing effect signal, and determining that the display screen is in an abnormal state when the number of reports is less than a preset threshold within a preset time interval; and performing the ESD display screen abnormality recovery operation. The apparatus comprises:

6. A display screen abnormality recovery apparatus characterized by comprising: a queue starting module configured to start an ESD detection work queue; a signal receiving module configured to determine whether a register abnormality signal sent by a DDIC corresponding to the display screen is received within a preset detection delay corresponding to the ESD detection work queue; the register abnormality signal comprises a register abnormality interrupt signal, the register abnormality interrupt signal is generated after the DDIC is struck by ESD; the preset detection delay refers to a delay corresponding to a cycle time set by the ESD detection work queue; a first abnormality recovery module configured to perform an ESD display screen abnormality recovery operation and set the waiting time in the ESD detection work queue to zero when the register abnormality signal is received; ​ The second abnormality recovery module is configured to, when the register abnormality signal is not received, detect the DDIC state at the end of each queue cycle of the ESD detection work queue, and perform an ESD display screen abnormality recovery operation when the ESD detection work queue detects the abnormal DDIC state.

7. The apparatus of claim 6, wherein, The second abnormality recovery module is further configured to acquire a screen end register value of the DDIC register through the ESD detection work queue, and perform an ESD display screen abnormality recovery operation when the screen end register value indicates that the DDIC is in an abnormal state.

8. The apparatus of claim 6, wherein, The first abnormality recovery module and the second abnormality recovery module are further configured to sequentially power off each voltage pin of the display screen, sequentially power on each voltage pin, and perform a display screen reset operation. 9.A computer device, comprising a memory and a processor, wherein the memory stores a computer program, and the computer device is configured to perform the method according to any one of claims 1-8 when the computer program is executed by the processor. The processor, when executing the computer program, implements the steps of the method in any one of claims 1 to 5.

10. A computer-readable storage medium having stored thereon a computer program, characterized in that, The computer program, when executed by the processor, implements the steps of the method in any one of claims 1 to 5.

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