An anti-interference test system

Abstract

The present disclosure provides an anti-interference test system, including a host module, a calibration module and a test module, wherein the host module includes: a control unit, a signal transmitting unit, a first coupling unit, a power meter unit, a switch unit and a power attenuation unit; the switch unit is controlled by the control unit to control the on / off state of the switch unit, and when the switch unit is in the first on state, the system works in the calibration mode, the interference signal output by the calibration signal transmitting unit, and the power meter unit receives the interference signal output by the signal transmitting unit to act on the open circuit test voltage of the calibration module; when the switch unit is in the second on state, the system works in the test mode, and the power meter unit receives the interference signal output by the signal transmitting unit to monitor whether the signal transmitting unit works normally. While improving the detection efficiency of the conducted disturbance immunity test, the accuracy of the detection result is improved, and the conducted disturbance immunity test work in complex scenarios can be handled.

Description

Technical Field

[0001] The present disclosure relates to the field of electrical detection technology, and in particular to an anti-interference test system. Background Art

[0002] At present, with the continuous innovation and development of electronic technology, everything from smart phones in people's hands to cars and aircraft are equipped with a variety of electronic devices to assist people in operation and use. Due to factors such as static electricity generated by electronic equipment during operation, static-charged devices will generate a short-term high-intensity electromagnetic field when discharging. This electromagnetic field will act on the power cords, communication cables, interface cables and other connecting lines of electrical and electronic equipment, causing circuit failures or even damage to the electrical and electronic equipment. Therefore, it is necessary to test the performance of electrical and electronic equipment in resisting these interferences when subjected to electromagnetic field discharge disturbances.

[0003] In the existing conducted disturbance immunity test process, a larger site is often required to arrange the detection system, and auxiliary facilities such as supporting components and power supply need to be arranged. The test process is relatively cumbersome and cannot cope with the conducted disturbance immunity test work in complex scenarios such as small environments. Before arranging the test device, it is necessary to build a calibration device for the RF signal source, and during the test process, it is necessary to manually calibrate the output of the RF signal source, monitor the readings of the voltmeter / power meter, and monitor the working conditions of the tested device. This is extremely time-consuming and labor-intensive, and the accuracy of the test results is low. Summary of the invention

[0004] The embodiments of the present disclosure at least provide an anti-interference test system, which improves the detection efficiency of the conducted disturbance immunity test while improving the accuracy of the detection result, and can cope with the conducted disturbance immunity test work in complex scenarios.

[0005] The embodiment of the present disclosure provides an anti-interference test system, the anti-interference test system comprising: a host module, a calibration module and a test module, wherein the host module comprises: a control unit, a signal transmitting unit, a first coupling unit, a power meter unit, a switch unit and a power attenuation unit;

[0006] The control unit is connected to the signal transmitting unit, the switch unit and the power meter unit; the switch unit includes a first conduction state and a second conduction state;

[0007] When the anti-interference test system needs to perform signal calibration, the control unit controls the switch unit to be in a first conducting state, and the signal calibration path is turned on and works;

[0008] The signal calibration path includes the control unit, the signal transmitting unit, the first coupling unit, the power attenuation unit, the switch unit and the power meter unit which are sequentially connected in series, and the power attenuation unit in the signal calibration path is connected to the calibration module, wherein the calibration module is used to receive the interference signal output by the signal transmitting unit and attenuated by the power attenuation unit, generate an open circuit test voltage for calibrating the interference signal, and input the open circuit test voltage to the power attenuation unit;

[0009] When the anti-interference test system needs to be tested, the control unit controls the switch unit to be in the second conducting state, and the test path is turned on and works;

[0010] The test path includes the control unit, the signal transmitting unit, the first coupling unit, the switch unit and the power meter unit which are connected in series in sequence, the first coupling unit in the test path is connected to the power attenuation unit, and the test module is connected to the power attenuation unit, wherein the test path is used to detect whether the signal transmitting unit is working normally.

[0011] In an optional implementation, in the signal calibration path, the interference signal output by the signal transmitting unit forms an open circuit test voltage after passing through the first coupling unit, the power attenuation unit, and the calibration module, and the open circuit test voltage is sent to the power meter unit through the power attenuation unit and the switch unit;

[0012] In the test path, the interference signal output by the signal transmitting unit is sent to the power meter unit after passing through the first coupling unit and the switch unit, so as to detect whether the signal transmitting unit works normally.

[0013] In an optional implementation manner, the control unit is used to:

[0014] Controlling the switch unit to be in the first conducting state, adjusting the parameters of the interference signal output by the signal transmitting unit at a preset frequency, and storing the calibration output power of the signal transmitting unit when the open circuit test voltage of the interference signal output by the received signal transmitting unit acting on the calibration module is a preset voltage threshold;

[0015] The switch unit is switched from the first conduction state to the second conduction state, the parameters of the interference signal output by the signal transmitting unit are adjusted according to the calibrated output power, and whether the signal transmitting unit is operating normally is determined according to the power meter reading received from the power meter unit.

[0016] In an optional implementation, the signal transmitting unit includes a signal source device and a power amplifier device;

[0017] The signal source device is connected to the power amplifier device, and the power amplifier device is connected to the first coupling unit;

[0018] The signal source device is used to generate the interference signal;

[0019] The power amplifier device is used to amplify the voltage value of the interference signal generated by the signal source device.

[0020] In an optional implementation, the control unit includes a human-computer interaction component and a control mainboard component;

[0021] The human-machine interaction device is connected to the control mainboard device;

[0022] The control mainboard device is connected to the signal transmitting unit, the switch unit and the power meter unit;

[0023] The human-computer interaction device is used to collect test parameters input by the user;

[0024] The control main board device is used to control the conduction state of the switch unit and the parameters of the interference signal output by the signal transmitting unit according to the test parameters.

[0025] In an optional implementation, the power attenuation unit includes a first power attenuation device and a second power attenuation device;

[0026] The first power attenuation device is used to attenuate the power of the interference signal input by the signal transmitting unit to the calibration module or the test module according to a preset first attenuation ratio;

[0027] The second power attenuation device is used to attenuate the power of the interference signal input to the switch unit after passing through the calibration module according to a preset second attenuation ratio;

[0028] The input end of the first power attenuation device serves as the first input end of the power attenuation unit and is connected to the first coupling unit; the output end of the first power attenuation device serves as the first output end of the power attenuation unit;

[0029] When the anti-interference test system needs to perform signal calibration, the first output end of the power attenuation unit is connected to the calibration module; the input end of the second power attenuation device serves as the second input end of the power attenuation unit and is connected to the calibration module; the output end of the second power attenuation device serves as the second output end of the power attenuation unit and is connected to the switch unit;

[0030] When the anti-interference test system needs to be tested, the first output end of the power attenuation unit is connected to the test module as the signal output end of the host module, and an interference signal is input to the test module.

[0031] In an optional implementation, the calibration module includes: a load unit, a second coupling unit, and an ohmic conversion unit;

[0032] The load unit, the second coupling unit and the ohmic conversion unit are connected in sequence;

[0033] The second coupling unit is connected to the power attenuation unit, and the ohmic conversion unit is connected to the power attenuation unit.

[0034] In an optional implementation manner, the second coupling unit is connected to a power input terminal of the device under test;

[0035] The second coupling unit is used to couple the interference signal output by the signal transmitting unit to the input power signal of the device under test, so as to generate signal interference for the device under test, so as to test the anti-interference capability of the device under test.

[0036] In an optional implementation, the human-computer interaction device includes a touch screen and a keyboard;

[0037] The touch screen is connected to the control mainboard component;

[0038] The keyboard is connected to the control mainboard component.

[0039] In an optional implementation, the interference signal output by the signal transmitting unit is a radio frequency signal.

[0040] In an optional implementation, the first coupling unit includes a directional coupler.

[0041] An anti-interference test system provided by an embodiment of the present disclosure includes a host module, a calibration module and a test module, wherein the host module includes: a control unit, a signal transmitting unit, a first coupling unit, a power meter unit, a switch unit and a power attenuation unit; the control unit is connected to the signal transmitting unit, the switch unit and the power meter unit; the switch unit includes a first conduction state and a second conduction state; when the anti-interference test system needs to perform signal calibration, the control unit controls the switch unit to be in the first conduction state, and the signal calibration path is turned on; the signal calibration path includes a control unit, a signal transmitting unit, a first coupling unit, a power attenuation unit, a switch unit and a power meter unit connected in series in sequence, and the signal calibration path The power attenuation unit in the path is connected to the calibration module, wherein the calibration module is used to receive the interference signal output by the signal transmitting unit and attenuated by the power attenuation unit, generate an open circuit test voltage for calibrating the interference signal, and input the open circuit test voltage to the power attenuation unit; when the anti-interference test system needs to be tested, the control unit controls the switch unit to be in the second conduction state, and the test path is turned on; the test path includes a control unit, a signal transmitting unit, a first coupling unit, a switch unit and a power meter unit connected in series in sequence, the first coupling unit in the test path is connected to the power attenuation unit, and the test module is connected to the power attenuation unit, wherein the test path is used to detect whether the signal transmitting unit is working normally. While improving the detection efficiency of the conducted disturbance immunity test, the accuracy of the detection result is improved, and the conducted disturbance immunity test work in complex scenarios can be handled.

[0042] In order to make the above-mentioned objectives, features and advantages of the present disclosure more obvious and easy to understand, preferred embodiments are specifically cited below and described in detail with reference to the attached drawings. BRIEF DESCRIPTION OF THE DRAWINGS

[0043] In order to more clearly illustrate the technical solutions of the embodiments of the present disclosure, the following is a brief introduction to the drawings required for use in the embodiments. The drawings herein are incorporated into the specification and constitute a part of the specification. These drawings illustrate embodiments consistent with the present disclosure and are used together with the specification to illustrate the technical solutions of the present disclosure. It should be understood that the following drawings only illustrate certain embodiments of the present disclosure and should not be regarded as limiting the scope. For ordinary technicians in this field, other relevant drawings can also be obtained based on these drawings without creative work.

[0044] Figure 1 One of the structural schematic diagrams of an anti-interference test system provided by an embodiment of the present disclosure is shown;

[0045] Figure 2 A second structural schematic diagram of an anti-interference test system provided by an embodiment of the present disclosure is shown;

[0046] Figure 3 A third structural schematic diagram of an anti-interference test system provided by an embodiment of the present disclosure is shown;

[0047] Figure 4 A fourth structural schematic diagram of an anti-interference test system provided in an embodiment of the present disclosure is shown.

[0048] Illustration: 100-anti-interference test system; 110-host module; 120-calibration module; 130-test module; 111-control unit; 112-signal transmitting unit; 113-first coupling unit; 114-power meter unit; 115-switch unit; 116-power attenuation unit; 1121-signal source device; 1122-power amplifier device; 1161-first power attenuation device; 1162-second power attenuation device; 121-load unit; 122-second coupling unit; 123-ohm conversion unit; 1111-human-computer interaction device; 1112-control mainboard device; 10-touch screen; 20-keyboard. DETAILED DESCRIPTION

[0049] In order to make the purpose, technical scheme and advantages of the embodiments of the present disclosure clearer, the technical scheme in the embodiments of the present disclosure will be clearly and completely described below in conjunction with the drawings in the embodiments of the present disclosure. Obviously, the described embodiments are only part of the embodiments of the present disclosure, rather than all of the embodiments. The components of the embodiments of the present disclosure generally described and shown in the drawings here can be arranged and designed in various different configurations. Therefore, the following detailed description of the embodiments of the present disclosure provided in the drawings is not intended to limit the scope of the present disclosure for protection, but merely represents the selected embodiments of the present disclosure. Based on the embodiments of the present disclosure, all other embodiments obtained by those skilled in the art without making creative work belong to the scope of protection of the present disclosure.

[0050] It should be noted that similar reference numerals and letters denote similar items in the following drawings, and therefore, once an item is defined in one drawing, further definition and explanation thereof is not required in subsequent drawings.

[0051] The term "and / or" herein only describes an association relationship, indicating that three relationships may exist. For example, A and / or B may represent the following three situations: A exists alone, A and B exist at the same time, and B exists alone. In addition, the term "at least one" herein represents any combination of at least two of any one or more of a plurality of. For example, including at least one of A, B, and C may represent including any one or more elements selected from the set consisting of A, B, and C.

[0052] Research has found that in the existing conducted disturbance immunity test process, a larger site is often required to arrange the detection system, and auxiliary facilities such as supporting components and power supplies need to be arranged. The test process is relatively cumbersome and cannot cope with conducted disturbance immunity testing in complex scenarios such as small environments. In addition, during the test process, it is necessary to manually calibrate the output of the RF signal source, monitor the readings of the voltmeter / power meter, and monitor the working conditions of the tested device, which is extremely time-consuming and labor-intensive, and the accuracy of the test results is low.

[0053] Based on the above research, the present disclosure provides an anti-interference test system, a host module, a calibration module and a test module, wherein the host module includes: a control unit, a signal transmitting unit, a first coupling unit, a power meter unit, a switch unit and a power attenuation unit; the control unit is connected to the signal transmitting unit, the switch unit and the power meter unit; the switch unit includes a first conduction state and a second conduction state; when the anti-interference test system needs to perform signal calibration, the control unit controls the switch unit to be in the first conduction state, and the signal calibration path is turned on; the signal calibration path includes a control unit, a signal transmitting unit, a first coupling unit, a power attenuation unit, a switch unit and a power meter unit connected in series in sequence, and the signal calibration path is turned on and works; The power attenuation unit in the quasi-path is connected to the calibration module, wherein the calibration module is used to receive the interference signal output by the signal transmitting unit and attenuated by the power attenuation unit, generate an open circuit test voltage for calibrating the interference signal, and input the open circuit test voltage to the power attenuation unit; when the anti-interference test system needs to be tested, the control unit controls the switch unit to be in the second conduction state, and the test path is turned on; the test path includes a control unit, a signal transmitting unit, a first coupling unit, a switch unit and a power meter unit connected in series in sequence, the first coupling unit in the test path is connected to the power attenuation unit, and the test module is connected to the power attenuation unit, wherein the test path is used to detect whether the signal transmitting unit is working normally. While improving the detection efficiency of the conducted disturbance immunity test, the accuracy of the detection result is improved, and the conducted disturbance immunity test work in complex scenarios can be handled.

[0054] To facilitate understanding of this embodiment, an anti-interference test system method disclosed in an embodiment of the present disclosure is first introduced in detail.

[0055] See also Figure 1 , which is one of the structural schematic diagrams of an anti-interference testing system 100 provided in an embodiment of the present disclosure.

[0056] The anti-interference test system 100 includes: a host module 110, a calibration module 120 and a test module 130, wherein the host module 110 includes: a control unit 111, a signal transmitting unit 112, a first coupling unit 113, a power meter unit 114, a switch unit 115 and a power attenuation unit 116.

[0057] The signal transmitting unit 112, the first coupling unit 113, the switch unit 115 and the power meter unit 114 are connected in sequence; the first input terminal A of the power attenuation unit 116 is connected to the first coupling unit 113, the first output terminal B of the power attenuation unit 116 is connected to the calibration module 120, the second input terminal C of the power attenuation unit 116 is connected to the calibration module 120, and the second output terminal D of the power attenuation unit 116 is connected to the switch unit 115; the control unit 111 is connected to the signal transmitting unit 112, the switch unit 115 and the power meter unit 114.

[0058] Here, when the anti-interference test system 100 needs to perform signal calibration, the control unit 111 controls the switch unit 115 to be in the first conduction state, and the signal calibration path is turned on and working; the signal calibration path includes the control unit 111, the signal transmitting unit 112, the first coupling unit 113, the power attenuation unit 116, the switch unit 115 and the power meter unit 114 connected in series in sequence, and the power attenuation unit 116 in the signal calibration path is connected to the calibration module 120.

[0059] Further, when the anti-interference test system 100 needs to perform an anti-interference test on the object to be detected, the control unit 111 controls the switch unit 115 to be in the second conduction state, and the test path is turned on and works; the test path includes the control unit 111, the signal transmitting unit 112, the first coupling unit 113, the switch unit 115 and the power meter unit 114 connected in series in sequence. The first coupling unit 113 in the test path is connected to the power attenuation unit 116, and the test module 130 is connected to the power attenuation unit 116.

[0060] The calibration module 120 is used to receive the interference signal output by the signal transmitting unit 112 and attenuated by the power attenuation unit 116, and generate an open circuit test voltage for calibrating the interference signal; the test path is used to detect whether the signal transmitting unit 112 is working normally.

[0061] The first coupling unit 113 is used to allow most of the energy of the interference signal output by the signal transmitting unit 112 to flow through the first coupling unit 113, and a small amount of energy is transmitted to the switch unit 115. The power attenuation unit 116 is used to attenuate the interference signal and the open circuit test voltage passing through the power attenuation unit 116 based on a preset attenuation ratio. The interference signal can be a radio frequency signal.

[0062] Specifically, the anti-interference test system 100 conducts conduction interference to the device under test by coupling the interference signal output by the signal transmitting unit 112 to the current input terminal of the device under test, such as the power line, the communication line, etc., so that the user can observe the working state of the device under test in the presence of conducted interference to determine the anti-interference ability of the device under test. The anti-interference test system 100 includes two working modes, one is a calibration mode and the other is a test mode. When the anti-interference test system 100 works in the calibration mode, the switch unit 115 is in a first conduction state; when the anti-interference test system 100 works in the test mode, the switch unit 115 is in a second conduction state.

[0063] The test module is used to receive the interference signal output by the signal transmitting unit 112 after calibration and attenuated by the power attenuation unit 116, so as to complete the anti-interference test of the object to be detected.

[0064] Preferably, the test module can adopt the radio frequency conducted disturbance immunity test arrangement specified in the national standard GB / T 17626.6-2017.

[0065] In actual application, the calibration mode works before the test mode, and is used to calibrate the frequency and amplitude of the interference signal that the signal transmitting unit 112 needs to output during the test according to the user's experimental requirements before the anti-interference test, and the control unit 111 stores the output power of the calibrated signal transmitting unit 112 at this time. After completing the calibration of the output power of the signal transmitting unit 112, the control unit 111 drives the signal transmitting unit 112 to work at the power according to the output power of the signal transmitting unit 112 stored in the calibration mode. At this time, the frequency and amplitude of the interference signal output by the signal transmitting unit 112 can meet the requirements of the anti-interference test, and there is no need to manually adjust and manually monitor the output of the signal transmitting unit 112.

[0066] Among them, the anti-interference test system 100 can be applied to the conducted disturbance immunity test under the national standard GB / T 17626.6-2017.

[0067] Optionally, the first coupling unit 113 may include a directional coupler, and the switch unit 115 may include a single-pole double-throw relay.

[0068] As a possible implementation, the control unit 111 is used to: control the switch unit 115 to be in the first conduction state, adjust the parameters of the interference signal output by the signal transmitting unit 112 at a preset frequency, and when the received open-circuit test voltage of the interference signal output by the signal transmitting unit 112 acting on the calibration module 120 is a preset voltage threshold, store the calibrated output power of the signal transmitting unit 112; switch the switch unit 115 from the first conduction state to the second conduction state, adjust the parameters of the interference signal output by the signal transmitting unit 112 according to the calibrated output power, and determine whether the signal transmitting unit is working normally according to the received power meter reading output by the power meter unit 114.

[0069] The parameters of the interference signal include: the frequency and amplitude value of the interference signal.

[0070] Here, when the anti-interference test system 100 works in the calibration mode, the control unit 111 sends a control signal to the switch unit 115 to control the switch unit 115 to be in the first conduction state, and sends a control signal to the signal transmitting unit 112. At a certain test frequency within the test frequency range specified in the preset test standard, the control signal transmitting unit 112 outputs an interference signal. The interference signal output by the control signal transmitting unit 112 forms an open circuit test voltage after passing through the first coupling unit 113, the power attenuation unit 116 and the calibration module 120. The open circuit test voltage passes through the power attenuation unit 116 and then enters the power meter unit 114 via the switch unit 115. After calculation by the power meter unit 114, the corresponding power value is obtained, and the open circuit test voltage and the corresponding power value are transmitted to the control unit 111 as power meter indications. After receiving the open circuit test voltage and the corresponding power value transmitted by the power meter unit 114, the control unit 111 compares it with the preset voltage threshold corresponding to the preset test standard. If they are equal, the calibration work at the test frequency is completed, and the output power of the signal transmitting unit 112 at this time is recorded as the calibration output power. If they are not equal, it is necessary to continue to adjust until the open circuit test voltage transmitted by the power meter unit 114 is equal to the preset voltage threshold. After completing the calibration work at the current test frequency, the control unit 111 sends a control signal to the switch unit 115 to transfer to the next test frequency, and so on.

[0071] Among them, the test frequency range specified in the preset test standard can be the test frequency range under the national standard GB / T17626.6-2017: 150kHz~80MHz. In the specific implementation, each calibration process corresponds to only one test frequency, and the calibration process can cover the entire 150kHz~80MHz frequency range in a step-by-step manner, preferably, the frequency step cannot exceed 1%; or one or more test frequencies within the test frequency range: 150kHz~80MHz can be selected for calibration according to the working conditions of the device to be tested.

[0072] Here, when the anti-interference test system 100 works in the test mode, the control unit 111 sends a control signal to the switch unit 115 to control the switch unit 115 to switch from the first conduction state to the second conduction state, and sends a control signal to the signal transmitting unit 112 to control the signal transmitting unit 112 to output the interference signal with the calibrated output power stored in the calibration mode. At this time, the interference signal enters the switch unit 115 via the first coupling unit 113 and is transmitted to the power meter unit 114. The control unit 111 collects the interference signal transmitted to the power meter unit 114, monitors whether the signal transmitting unit 112 outputs the interference signal normally, and if the working state of the signal transmitting unit 112 is abnormal, the signal transmitting unit 112 is adjusted in time to ensure that the signal transmitting unit 112 is in a normal working state.

[0073] Optionally, the control unit 111 controls the signal transmitting unit 112 to output the dwell time of the interference signal at each test frequency point, which can be determined according to the operation time of the device to be tested, and the shortest dwell time is not less than 0.5 s.

[0074] For example, see the following Table 1, which is a comparison table of the experimental levels and open-circuit test voltages specified in the national standard GB / T 17626.6-2017. If an electronic product needs to be tested as a device under test and needs to undergo an anti-interference test at a test level of 1, during the calibration process, the control unit 111 outputs a control signal to the signal transmitting unit 112, and the control signal transmitting unit 112 outputs an interference signal until the open-circuit test voltage collected by the control unit 111 is 120 dB (μV), the effective value corresponding to the test level 1 in Table 1, and the calibration process is completed.

[0075] Table 1

[0076]

[0077] In this way, during the conducted disturbance immunity test, there is no need to manually adjust the signal transmitting unit 112 and manually monitor the output of the signal transmitting unit 112, and the calibration and testing work can be automatically completed. The staff only needs to observe the working status of the device to be tested, which reduces the complexity of the conducted disturbance immunity test, improves the test efficiency, and has higher accuracy.

[0078] An embodiment of the present application provides an anti-interference test system, a host module, a calibration module and a test module, wherein the host module includes: a control unit, a signal transmitting unit, a first coupling unit, a power meter unit, a switch unit and a power attenuation unit; the control unit is connected to the signal transmitting unit, the switch unit and the power meter unit; the switch unit includes a first conduction state and a second conduction state; when the anti-interference test system needs to perform signal calibration, the control unit controls the switch unit to be in the first conduction state, and the signal calibration path is turned on; the signal calibration path includes a control unit, a signal transmitting unit, a first coupling unit, a power attenuation unit, a switch unit and a power meter unit connected in series in sequence, and the signal calibration path The power attenuation unit in the path is connected to the calibration module, wherein the calibration module is used to receive the interference signal output by the signal transmitting unit and attenuated by the power attenuation unit, generate an open circuit test voltage for calibrating the interference signal, and input the open circuit test voltage to the power attenuation unit; when the anti-interference test system needs to be tested, the control unit controls the switch unit to be in the second conduction state, and the test path is turned on; the test path includes a control unit, a signal transmitting unit, a first coupling unit, a switch unit and a power meter unit connected in series in sequence, the first coupling unit in the test path is connected to the power attenuation unit, and the test module is connected to the power attenuation unit, wherein the test path is used to detect whether the signal transmitting unit is working normally. While improving the detection efficiency of the conducted disturbance immunity test, the accuracy of the detection result is improved, and the conducted disturbance immunity test work in complex scenarios can be handled.

[0079] See also Figure 2 , which is a second structural diagram of an anti-interference testing system 100 provided in an embodiment of the present disclosure.

[0080] The anti-interference test system 100 includes: a host module 110, a calibration module 120 and a test module 130, wherein the host module 110 includes: a control unit 111, a signal transmitting unit 112, a first coupling unit 113, a power meter unit 114, a switch unit 115 and a power attenuation unit 116. The signal transmitting unit 112 includes: a signal source device 1121 and a power amplifier device 1122. The power attenuation unit 116 includes: a first power attenuation device 1161 and a second power attenuation device 1162.

[0081] The signal source device 1121 is connected to the power amplifier device 1122, and the power amplifier device 1122 is connected to the first coupling unit 113; the input end of the first power attenuation device 1161 serves as the first input end A of the power attenuation unit 116, and is connected to the first coupling unit 113; the output end of the first power attenuation device 1161 serves as the first output end B of the power attenuation unit 116.

[0082] Here, when the anti-interference test system 100 needs to be calibrated, the first output terminal B of the power attenuation unit 116 is connected to the calibration module 120; the input terminal of the second power attenuation device 1162 serves as the second input terminal C of the power attenuation unit 116, and is connected to the calibration module 120; the output terminal of the second power attenuation device 1162 serves as the second output terminal D of the power attenuation unit 116, and is connected to the switch unit 115.

[0083] Furthermore, when the anti-interference test system 100 needs to be tested, the first output terminal B of the power attenuation unit 116 is connected to the test module 130 as the signal output terminal of the host module 110 to input an interference signal to the test module 130 .

[0084] Here, the signal source device 1121 is used to generate the interference signal; the power amplifier device 1122 is used to amplify the voltage value of the interference signal generated by the signal source device 1121. The first power attenuation device 1161 is used to attenuate the power of the interference signal input from the signal transmitting unit 112 to the calibration module 120 or the test module 130 according to a preset first attenuation ratio; the second power attenuation device 1162 is used to attenuate the power of the interference signal input to the switch unit 115 after passing through the calibration module 120 according to a preset second attenuation ratio.

[0085] Here, since it is difficult for a general signal source device 1121 to directly meet the voltage value required by the high test level, a power amplifier device 1122 needs to be provided to amplify the interference signal output by the signal source device 1121 to meet the voltage value required by the high test level.

[0086] The first attenuation ratio and the second attenuation ratio can be set according to actual conditions and are not specifically limited here. The signal source device 1121 can be a radio frequency signal source.

[0087] Preferably, the first power attenuation device 1161 may be a 6 dB attenuator, and the second power attenuation device 1162 may be a 10 dB attenuator.

[0088] See also Figure 3, which is a third structural diagram of an anti-interference testing system 100 provided in an embodiment of the present disclosure.

[0089] The anti-interference test system 100 includes: a host module 110, a calibration module 120 and a test module 130, wherein the host module 110 includes: a control unit 111, a signal transmitting unit 112, a first coupling unit 113, a power meter unit 114, a switch unit 115 and a power attenuation unit 116. The signal transmitting unit 112 includes: a signal source device 1121 and a power amplifier device 1122. The power attenuation unit 116 includes: a first power attenuation device 1161 and a second power attenuation device 1162. The calibration module 120 includes: a load unit 121, a second coupling unit 122 and an ohmic conversion unit 123.

[0090] Here, the load unit 121 , the second coupling unit 122 and the ohmic transformation unit 123 are connected in sequence. The second coupling unit 122 is connected to the power attenuation unit 116 , and the ohmic transformation unit 123 is connected to the power attenuation unit 116 .

[0091] Specifically, the second coupling unit 122 is connected to the first power attenuation device 1161 in the power attenuation unit 116 , and the ohmic conversion unit 123 is connected to the second power attenuation device 1162 in the power attenuation unit 116 .

[0092] The load unit 121 may include a 150-50 ohm converter and a 50 ohm load; and the ohm conversion unit 123 may include a 150-50 ohm converter.

[0093] As a possible implementation, when the anti-interference test system 100 is in test mode, the second coupling unit 122 can be connected to the power input terminal of the device to be tested in the test module 130; in this connection mode, the second coupling unit 122 is used to couple the interference signal output by the signal transmitting unit 112 to the input power signal of the device to be tested, so as to generate signal interference for the device to be tested, so as to test the anti-interference ability of the device to be tested.

[0094] See also Figure 4 , which is a fourth structural diagram of an anti-interference testing system 100 provided in an embodiment of the present disclosure.

[0095] The anti-interference test system 100 includes: a host module 110, a calibration module 120 and a test module 130, wherein the host module 110 includes: a control unit 111, a signal transmitting unit 112, a first coupling unit 113, a power meter unit 114, a switch unit 115 and a power attenuation unit 116. The signal transmitting unit 112 includes: a signal source device 1121 and a power amplifier device 1122. The power attenuation unit 116 includes: a first power attenuation device 1161 and a second power attenuation device 1162. The calibration module 120 includes: a load unit 121, a second coupling unit 122 and an ohmic conversion unit 123. The control unit 111 includes: a human-machine interaction device 1111 and a control mainboard device 1112. The human-machine interaction device 1111 includes a touch screen 10 and a keyboard 20.

[0096] The human-computer interaction device 1111 is connected to the control main board device 1112; the control main board device 1112 is connected to the signal transmitting unit 112, the switch unit 115 and the power meter unit 114; the touch screen 10 is connected to the control main board device 1112; and the keyboard 20 is connected to the control main board device 1112.

[0097] Here, the human-computer interaction device 1111 is used to collect test parameters input by the user; the control mainboard device 1112 is used to control the conduction state of the switch unit 115 and the parameters of the interference signal output by the signal transmitting unit 112 according to the test parameters.

[0098] As a possible implementation, the touch screen 10 is installed on the front panel of the host module 110 and is connected to the control mainboard device 1112 via a (low voltage differential signal, Low Voltage Differential Signaling, LVDS) interface; the keyboard 20 is installed on the front panel of the host module 110 and is connected to the control mainboard device 1112 via a universal serial bus (Universal Serial Bus, USB) interface.

[0099] Optionally, the control mainboard device 1112 is loaded with an Android system, which can read the power indication calculated by the power meter unit 114 and control the conduction state of the switch unit 115 according to user settings.

[0100] An embodiment of the present application provides an anti-interference test system, a host module, a calibration module and a test module, wherein the host module includes: a control unit, a signal transmitting unit, a first coupling unit, a power meter unit, a switch unit and a power attenuation unit; the control unit is connected to the signal transmitting unit, the switch unit and the power meter unit; the switch unit includes a first conduction state and a second conduction state; when the anti-interference test system needs to perform signal calibration, the control unit controls the switch unit to be in the first conduction state, and the signal calibration path is turned on; the signal calibration path includes a control unit, a signal transmitting unit, a first coupling unit, a power attenuation unit, a switch unit and a power meter unit connected in series in sequence, and the signal calibration path The power attenuation unit in the path is connected to the calibration module, wherein the calibration module is used to receive the interference signal output by the signal transmitting unit and attenuated by the power attenuation unit, generate an open circuit test voltage for calibrating the interference signal, and input the open circuit test voltage to the power attenuation unit; when the anti-interference test system needs to be tested, the control unit controls the switch unit to be in the second conduction state, and the test path is turned on; the test path includes a control unit, a signal transmitting unit, a first coupling unit, a switch unit and a power meter unit connected in series in sequence, the first coupling unit in the test path is connected to the power attenuation unit, and the test module is connected to the power attenuation unit, wherein the test path is used to detect whether the signal transmitting unit is working normally. While improving the detection efficiency of the conducted disturbance immunity test, the accuracy of the detection result is improved, and the conducted disturbance immunity test work in complex scenarios can be handled.

[0101] Those skilled in the art can clearly understand that, for the convenience and simplicity of description, the specific working process of the system and device described above can refer to the corresponding process in the aforementioned method embodiment, and will not be repeated here. In the several embodiments provided in the present disclosure, it should be understood that the disclosed system can be implemented in other ways. The device embodiments described above are merely schematic. For example, the division of the units is only a logical function division. There may be other division methods in actual implementation. For example, multiple units or components can be combined or integrated into another system, or some features can be ignored or not executed. Another point is that the mutual coupling or direct coupling or communication connection shown or discussed can be through some communication interfaces, indirect coupling or communication connection of devices or units, which can be electrical, mechanical or other forms.

[0102] The units described as separate components may or may not be physically separated, and the components shown as units may or may not be physical units, that is, they may be located in one place or distributed on multiple network units. Some or all of the units may be selected according to actual needs to achieve the purpose of the solution of this embodiment.

[0103] In addition, each functional unit in each embodiment of the present disclosure may be integrated into one processing unit, or each unit may exist physically separately, or two or more units may be integrated into one unit.

[0104] If the functions are implemented in the form of software functional units and sold or used as independent products, they can be stored in a non-volatile computer-readable storage medium that is executable by a processor. Based on this understanding, the technical solution of the present disclosure, or the part that contributes to the prior art or the part of the technical solution, can be embodied in the form of a software product, which is stored in a storage medium and includes several instructions for a computer device (which can be a personal computer, a server, or a network device, etc.) to perform all or part of the steps of the method described in each embodiment of the present disclosure. The aforementioned storage medium includes: various media that can store program codes, such as a USB flash drive, a mobile hard disk, a read-only memory (ROM), a random access memory (RAM), a magnetic disk or an optical disk.

[0105] Finally, it should be noted that the above-described embodiments are only specific implementation methods of the present disclosure, which are used to illustrate the technical solutions of the present disclosure, rather than to limit them. The protection scope of the present disclosure is not limited thereto. Although the present disclosure is described in detail with reference to the above-described embodiments, ordinary technicians in the field should understand that any technician familiar with the technical field can still modify the technical solutions recorded in the above-described embodiments within the technical scope disclosed in the present disclosure, or can easily think of changes, or make equivalent replacements for some of the technical features therein; and these modifications, changes or replacements do not make the essence of the corresponding technical solutions deviate from the spirit and scope of the technical solutions of the embodiments of the present disclosure, and should be included in the protection scope of the present disclosure. Therefore, the protection scope of the present disclosure should be based on the protection scope of the claims.

Claims

1. An anti-interference test system, characterized in that: The anti-interference test system comprises: a host module, a calibration module and a test module, wherein the host module comprises: a control unit, a signal transmitting unit, a first coupling unit, a power meter unit, a switch unit and a power attenuation unit; The control unit is connected to the signal transmitting unit, the switch unit and the power meter unit; the switch unit includes a first conduction state and a second conduction state; When the anti-interference test system needs to perform signal calibration, the control unit controls the switch unit to be in a first conducting state, and the signal calibration path is turned on and works; The signal calibration path includes the control unit, the signal transmitting unit, the first coupling unit, the power attenuation unit, the switch unit and the power meter unit which are sequentially connected in series, and the power attenuation unit in the signal calibration path is connected to the calibration module, wherein the calibration module is used to receive the interference signal output by the signal transmitting unit and attenuated by the power attenuation unit, generate an open circuit test voltage for calibrating the interference signal, and input the open circuit test voltage to the power attenuation unit; When the anti-interference test system needs to be tested, the control unit controls the switch unit to be in the second conducting state, and the test path is turned on and works; The test path includes the control unit, the signal transmitting unit, the first coupling unit, the switch unit and the power meter unit which are sequentially connected in series, the first coupling unit in the test path is connected to the power attenuation unit, the test module is connected to the power attenuation unit, wherein the test path is used to detect whether the signal transmitting unit is working normally; In the signal calibration path, the interference signal output by the signal transmitting unit forms an open circuit test voltage after passing through the first coupling unit, the power attenuation unit and the calibration module, and the open circuit test voltage is sent to the power meter unit through the power attenuation unit and the switch unit; In the test path, the interference signal output by the signal transmitting unit is sent to the power meter unit after passing through the first coupling unit and the switch unit, so as to detect whether the signal transmitting unit works normally; The control unit is used for: Controlling the switch unit to be in the first conducting state, adjusting the parameters of the interference signal output by the signal transmitting unit at a preset frequency, and storing the calibration output power of the signal transmitting unit when the open circuit test voltage of the interference signal output by the received signal transmitting unit acting on the calibration module is a preset voltage threshold; Switching the switch unit from the first conduction state to the second conduction state, adjusting the parameters of the interference signal output by the signal transmitting unit according to the calibrated output power, and determining whether the signal transmitting unit is operating normally according to the power meter reading received from the power meter unit; The power attenuation unit includes a first power attenuation device and a second power attenuation device; The first power attenuation device is used to attenuate the power of the interference signal input by the signal transmitting unit to the calibration module or the test module according to a preset first attenuation ratio; The second power attenuation device is used to attenuate the power of the interference signal input to the switch unit after passing through the calibration module according to a preset second attenuation ratio; The input end of the first power attenuation device serves as the first input end of the power attenuation unit and is connected to the first coupling unit; the output end of the first power attenuation device serves as the first output end of the power attenuation unit; When the anti-interference test system needs to perform signal calibration, the first output end of the power attenuation unit is connected to the calibration module; the input end of the second power attenuation device serves as the second input end of the power attenuation unit and is connected to the calibration module; the output end of the second power attenuation device serves as the second output end of the power attenuation unit and is connected to the switch unit; When the anti-interference test system needs to be tested, the first output end of the power attenuation unit is connected to the test module as the signal output end of the host module, and an interference signal is input to the test module.

2. The anti-interference test system according to claim 1, characterized in that: The signal transmitting unit includes a signal source device and a power amplifier device. The signal source device is connected to the power amplifier device, and the power amplifier device is connected to the first coupling unit; The signal source device is used to generate the interference signal; The power amplifier device is used to amplify the voltage value of the interference signal generated by the signal source device.

3. The anti-interference test system according to claim 1, characterized in that: The control unit includes a human-computer interaction device and a control mainboard device; The human-machine interaction device is connected to the control mainboard device; The control mainboard device is connected to the signal transmitting unit, the switch unit and the power meter unit; The human-computer interaction device is used to collect test parameters input by the user; The control main board device is used to control the conduction state of the switch unit and the parameters of the interference signal output by the signal transmitting unit according to the test parameters.

4. The anti-interference test system according to claim 1, characterized in that: The calibration module includes: a load unit, a second coupling unit and an ohmic conversion unit; The load unit, the second coupling unit and the ohmic conversion unit are connected in sequence; The second coupling unit is connected to the power attenuation unit, and the ohmic conversion unit is connected to the power attenuation unit.

5. The anti-interference test system according to claim 4, characterized in that: The second coupling unit is connected to a power input terminal of the device under test; The second coupling unit is used to couple the interference signal output by the signal transmitting unit to the input power signal of the device under test, so as to generate signal interference for the device under test, so as to test the anti-interference capability of the device under test.

6. The anti-interference test system according to claim 3, characterized in that: The human-computer interaction device includes a touch screen and a keyboard; The touch screen is connected to the control mainboard component; The keyboard is connected to the control mainboard component.

7. The anti-interference test system according to claim 1, characterized in that: The interference signal output by the signal transmitting unit is a radio frequency signal.

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