Temperature measurement circuit, method and device

Abstract

The present invention relates to the field of temperature measurement technology, and more particularly to a temperature measurement circuit, method, and device. The present invention linearizes the measurement circuit to achieve a higher temperature range, and determines whether temperature measurement is required based on the on / off state of a switch, thereby accurately achieving temperature measurement in complex environments. This avoids the technical problem of being unable to perform accurate temperature measurement when the temperature range varies significantly due to the influence of ambient temperature.

Description

Technical Field

[0001] The present invention relates to the technical field of temperature measurement, and in particular to a temperature measurement circuit, method and device. Background Art

[0002] When performing medical temperature measurement, the patient's body temperature is collected to determine the patient's condition. In existing temperature measurement equipment, temperature measurement can be performed through a temperature measurement circuit, and semiconductor thermistors are generally used as temperature sensitive elements in temperature measurement circuits. However, temperature measurement circuits have poor versatility, and the inherent nonlinearity of the thermistor's resistance-temperature curve seriously affects measurement accuracy, making it impossible to accurately measure temperature when the temperature range varies greatly.

[0003] The above content is only used to assist in understanding the technical solution of the present invention and does not constitute an admission that the above content is prior art. Summary of the Invention

[0004] The main purpose of the present invention is to provide a temperature measurement circuit, method and device, aiming to solve the technical problem that the existing technology cannot accurately measure temperature when the temperature range varies greatly.

[0005] To achieve the above object, the present invention provides a temperature measurement circuit, which includes: a constant current circuit and a measurement circuit; wherein the constant current circuit is connected to the linearization circuit and the measurement circuit respectively;

[0006] The constant current circuit is used to provide a constant power supply signal;

[0007] The measuring circuit is configured to perform temperature measurement based on the collected temperature information when receiving the power supply signal;

[0008] The linearization circuit is used to linearize the output of the measurement circuit when the measurement circuit performs temperature measurement according to the power supply signal, so as to reduce the output voltage corresponding to the measurement circuit so as not to exceed the measurement range.

[0009] Optionally, the measurement circuit includes: a first switch and a first resistor; wherein,

[0010] The first end of the first switch is connected to the output end of the constant current circuit, the second end of the first switch is connected to the first end of the first resistor, and the second ends of the first resistor are respectively connected to the second ends of the linearization circuit.

[0011] Optionally, the linearization circuit includes: a third resistor; wherein,

[0012] The first end of the third resistor is connected to the output end of the constant current circuit and the first end of the first switch respectively, and the second end of the third resistor is connected to the second input end of the constant current circuit, the second end of the first resistor and the first end of the second resistor respectively.

[0013] Optionally, the constant current circuit includes: an operational amplifier and a second resistor;

[0014] The non-inverting input terminal of the operational amplifier is connected to an external power supply, and the inverting input terminal of the operational amplifier is connected to the second end of the first resistor, the second end of the third resistor, and the first end of the second resistor as a control terminal; the second end of the second resistor is grounded; and the output terminal of the operational amplifier is connected to the first end of the first switch.

[0015] Optionally, the temperature measurement circuit further includes: a calibration circuit; wherein,

[0016] The calibration circuit is connected to the output terminal of the operational amplifier and the first terminal of the third resistor respectively;

[0017] The calibration circuit is used to perform circuit measurement calibration according to the power supply signal when the calibration circuit is turned on.

[0018] The present invention provides a temperature measurement method, which comprises the following steps:

[0019] Upon receiving user operation information, determining the switch open / close state according to the operation information;

[0020] When the switch opening and closing state is a preset first switch state, obtaining a target voltage parameter;

[0021] The target temperature is determined according to the target voltage parameter and a preset temperature calculation rule.

[0022] Optionally, determining the target temperature according to the target voltage parameter and a preset temperature calculation rule includes:

[0023] Determining a first resistance conductance according to the target voltage parameter using a preset temperature calculation rule;

[0024] determining a resistance value of a first resistor based on the conductance of the first resistor;

[0025] The first resistor value is matched with a preset temperature table, and a target temperature is determined according to the matching result.

[0026] Optionally, after determining the switch on / off state according to the operation information, the method further includes:

[0027] When the switch opening and closing state is a preset second switch state, determining the conductance of the calibration resistor according to the second switch state;

[0028] determining a target calibration parameter based on the calibration resistance and conductance, and comparing the target calibration parameter with an initial calibration parameter;

[0029] If the comparison fails, the temperature measurement is calibrated using the preset calibration strategy.

[0030] Optionally, if the comparison fails, performing temperature measurement calibration using a preset calibration strategy includes:

[0031] If the comparison fails, adjusting the switch opening and closing state to a preset third state;

[0032] Perform temperature measurement calibration on the temperature measurement circuit using the target resistor package.

[0033] In addition, to achieve the above-mentioned object, the present invention further provides a temperature measurement device, which includes the temperature measurement circuit as described above and applies the temperature measurement method as described above.

[0034] The present invention provides a temperature measurement circuit, comprising: a constant current circuit and a measurement circuit; wherein the constant current circuit is connected to a linearization circuit and a measurement circuit, respectively; the constant current circuit is configured to provide a power supply signal; the measurement circuit is configured to perform temperature measurement based on collected temperature information upon receiving the power supply signal; and the linearization circuit is configured to linearize the measurement circuit output when the measurement circuit performs temperature measurement based on the power supply signal, thereby reducing the output voltage corresponding to the measurement circuit to within a measurement range. Furthermore, upon receiving user operation information, the present invention determines a switch state based on the operation information; obtains a target voltage parameter when the switch state is a preset first switch state; and determines a target temperature based on the target voltage parameter and a preset temperature calculation rule. Compared with the prior art, the present invention achieves a higher temperature range through linearization of the measurement circuit, and switches between different operating modes such as calibration and measurement by adjusting the switch state, thereby achieving accurate temperature measurement in complex environments and avoiding the technical problem of being unable to perform accurate temperature measurement when the temperature range varies greatly due to the influence of ambient temperature. BRIEF DESCRIPTION OF THE DRAWINGS

[0035] Figure 1 Schematic diagram of the structure of the first embodiment of the temperature measurement circuit of the present invention;

[0036] Figure 2 1 is a circuit diagram of a first embodiment of a temperature measurement circuit according to the present invention;

[0037] Figure 3This is a flow chart of a first embodiment of a temperature measurement method according to the present invention;

[0038] Figure 4 Schematic diagram of the structure of the second embodiment of the temperature measurement circuit of the present invention;

[0039] Figure 5 This is a circuit diagram of a third embodiment of a temperature measurement circuit according to the present invention;

[0040] Figure 6 FIG. 4 is a flow chart of a second embodiment of a temperature measurement method according to the present invention.

[0041] Description of Figure Numbers:

[0042] Label name Label name 10 constant current circuit R1~R4 The first to fourth resistors 20 Measurement circuit K1 First switch 30 Linearization circuit K2 Second switch 40 Calibration circuit Q1 Operational amplifier

[0043] The purpose, features and advantages of the present invention will be further described with reference to the accompanying drawings and in conjunction with the embodiments. DETAILED DESCRIPTION

[0044] It should be understood that the specific embodiments described herein are only used to explain the present invention and are not intended to limit the present invention.

[0045] The following will clearly and completely describe the technical solutions in the embodiments of the present invention in conjunction with the accompanying drawings. Obviously, the described embodiments are only part of the embodiments of the present invention, not all of the embodiments. All other embodiments obtained by ordinary technicians in this field based on the embodiments of the present invention without making any creative efforts shall fall within the scope of protection of the present invention.

[0046] It should be noted that all directional indications in the embodiments of the present invention (such as up, down, left, right, front, back, etc.) are only used to explain the relative position relationship, movement status, etc. between the various components under a certain specific posture (as shown in the accompanying drawings). If the specific posture changes, the directional indication will also change accordingly.

[0047] In addition, the descriptions of "first", "second", etc. in the present invention are for descriptive purposes only and should not be understood as indicating or implying their relative importance or implicitly indicating the number of the indicated technical features. Therefore, the features defined as "first" or "second" may explicitly or implicitly include at least one of such features. In addition, the technical solutions between the various embodiments can be combined with each other, but this must be based on the fact that they can be implemented by ordinary technicians in this field. When the combination of technical solutions is contradictory or cannot be implemented, it should be considered that such combination of technical solutions does not exist and is not within the scope of protection required by the present invention.

[0048] refer to Figure 1 、 Figure 2 , Figure 1Schematic diagram of the structure of the first embodiment of the temperature measurement circuit of the present invention; Figure 2 1 is a circuit diagram of a first embodiment of a temperature measurement circuit according to the present invention;

[0049] An embodiment of the present invention provides a temperature measurement circuit, which includes: a constant current circuit 10 and a measurement circuit 20; wherein the constant current circuit 10 is connected to a linearization circuit 30 and a measurement circuit 20 respectively;

[0050] The constant current circuit 10 is used to provide a constant current electrical signal;

[0051] The measuring circuit 20 is configured to perform temperature measurement based on the collected temperature information when receiving the power supply signal;

[0052] The linearization circuit 30 is used to linearize the output of the measurement circuit when the measurement circuit 20 performs temperature measurement according to the constant current signal, so as to reduce the output voltage corresponding to the measurement circuit 20 to not exceed the measurement range.

[0053] It should be noted that the power supply signal provided by the constant current circuit 10 may be a constant current output by a constant current source.

[0054] It is easy to understand that the linearization circuit 30 linearizes the output voltage of the measurement circuit 20 by linearizing the measurement circuit 20 , and limits the maximum output range of the output voltage, thereby increasing the versatility of the measurement circuit 20 .

[0055] Furthermore, the measurement circuit 20 includes: a first switch K1 and a first resistor R1; wherein, the first end of the first switch K1 is connected to the output end of the constant current circuit 10, the second end of the first switch K1 is connected to the first end of the first resistor R1, and the second end of the first resistor R1 is connected to the linearization circuit 30 and the control end of the constant current circuit 10 respectively.

[0056] It is easy to understand that the linearization circuit 30 includes: a third resistor R3; wherein the first end of the third resistor R3 is respectively connected to the output end of the operational amplifier Q1 and the first end of the first switch K1, and the second end of the third resistor R3 is respectively connected to the inverting input end of the operational amplifier Q1, the second end of the first resistor R1, and the first end of the second resistor R2.

[0057] In addition, the constant current circuit 10 includes: an operational amplifier Q1 and a second resistor R2; wherein the non-inverting input terminal of the operational amplifier Q1 is connected to an external reference voltage, the inverting input terminal of the operational amplifier Q1 is connected as a control terminal to the second end of the first resistor R1, the second end of the third resistor R3, and the second end of the second resistor R2, respectively, and the output terminal of the operational amplifier Q1 is connected to the first end of the first switch K1 and the first end of the third resistor R3, respectively.

[0058] It is worth noting that, in this embodiment, the first resistor R1 in the measurement circuit 20 is generally a thermistor. When the first switch K1 is closed, that is, the thermistor is energized, the temperature can be measured by connecting the thermistor in parallel with the linearization circuit 30. The specific temperature data can be measured by detecting the voltage of the thermistor and inferring the resistance.

[0059] The embodiment of the present invention also provides a temperature measurement method, referring to Figure 3 , Figure 3 FIG. 1 is a flow chart of a first embodiment of a temperature measurement method according to the present invention.

[0060] In this embodiment, the temperature measurement method includes the following steps:

[0061] Step S10: upon receiving user operation information, determining the switch open / close state according to the operation information.

[0062] It should be noted that user operation information refers to operation information input by the user according to needs, wherein the operation information includes adjusting the on / off state of a switch, etc.

[0063] It can be understood that the switch on / off state may be the on / off state of the first switch K1 , and may also be the on / off state of other switches in the circuit.

[0064] Step S20: when the switch opening and closing state is the preset first switch K1 state, obtaining a target voltage parameter.

[0065] It is worth noting that the preset state of the first switch K1 is that the first switch K1 in the temperature measurement circuit is closed, other switches are closed, and only the temperature measurement circuit 20 is working. The target voltage parameter refers to the Va and Vb values ​​corresponding to the two sides of the first resistor R1, wherein the first resistor R1 can be a thermistor.

[0066] Step S30: determining a target temperature according to the target voltage parameter and a preset temperature calculation rule.

[0067] It is understandable that the preset temperature calculation rule is used to calculate corresponding temperature information according to the voltage values ​​across the thermistor.

[0068] Furthermore, the step S30 includes:

[0069] Determine the conductance of the first resistor R1 according to the target voltage information using a preset temperature calculation rule;

[0070] determining a resistance value of the first resistor R1 based on the conductance of the first resistor R1;

[0071] The resistance value of the first resistor R1 is matched with a preset temperature table, and the target temperature is determined according to the matching result.

[0072] It is easy to understand that the resistance of the first resistor R1 and the conductance of the first resistor R1 are inversely proportional to each other.

[0073] It should be understood that the preset temperature table is used to query corresponding temperature data according to the resistance value of the thermistor.

[0074] In this embodiment, the conductance value of the first resistor R1 is obtained as follows:

[0075] y=kx+b

[0076] Where y is the conductance of the thermistor, k and b are preset values, which are generally the factory calibration values ​​of the temperature measurement device, and x is the calculated result of the ADC measured voltage value, that is, the calculation result of the target voltage parameter.

[0077] It should be understood that the target voltage parameter is calculated as:

[0078] x=Va / (Vb-Va)

[0079] Wherein, Va and Vb are the voltage values ​​on both sides of the thermistor respectively.

[0080] In a specific implementation, when temperature measurement is required, the Va and Vb values ​​corresponding to the thermistor at the temperature to be measured can be obtained by measuring, and the corresponding x value can be calculated using the formula x=Va / (Vb-Va). Finally, the y value can be calculated. The y value is the conductance of the thermistor. Taking the reciprocal can get its resistance value at the temperature to be measured. By using the table lookup method, the temperature value corresponding to the resistance value can be finally obtained to complete the measurement.

[0081] This embodiment provides a temperature measurement circuit, comprising: a constant current circuit 10 and a measurement circuit 20; wherein the constant current circuit 10 is connected to a linearization circuit 30 and the measurement circuit 20, respectively; the constant current circuit 10 is configured to provide a power supply signal; the measurement circuit 20 is configured to perform temperature measurement based on collected temperature information upon receiving the power supply signal; and the linearization circuit 30 is configured to linearize the output of the measurement circuit 20 when the measurement circuit 20 performs temperature measurement based on the constant current signal, so as to reduce the output voltage corresponding to the measurement circuit 20 to within a measurement range. Furthermore, upon receiving user operation information, the present invention determines the switch state based on the operation information; obtains a target voltage parameter when the switch state is a preset first switch K1 state; and determines a target temperature based on the target voltage parameter and a preset temperature calculation rule. This embodiment achieves a higher temperature range by linearizing the measurement circuit, and determines whether temperature measurement is required based on the switch state, thereby achieving accurate temperature measurement in complex environments and avoiding the technical problem of being unable to perform accurate temperature measurement when the temperature range varies greatly due to the influence of ambient temperature.

[0082] refer to Figure 4 、 Figure 5 , Figure 4 Schematic diagram of the structure of the second embodiment of the temperature measurement circuit of the present invention; Figure 5 2 is a circuit diagram of a second embodiment of a temperature measurement circuit according to the present invention;

[0083] An embodiment of the present invention provides a temperature measurement circuit, which further includes: a calibration circuit 40; wherein the calibration circuit 40 is connected to the output end of the operational amplifier Q1 and the first end of the third resistor R3 respectively;

[0084] The calibration circuit 40 is used to perform circuit measurement calibration according to the power supply signal when the calibration circuit 40 is turned on.

[0085] It should be noted that the calibration circuit 40 includes: a second switch K2 and a fourth resistor R4; wherein the first end of the second switch K2 is respectively connected to the output end and the first end of the operational amplifier Q1, the second end of the second switch K2 is connected to the fourth resistor R4, and the fourth resistor R4 is respectively connected to the second end of the first resistor R1 and the first end of the second resistor R2.

[0086] refer to Figure 6 , Figure 6 FIG. 4 is a flow chart of a second embodiment of a temperature measurement method according to the present invention.

[0087] Based on the first embodiment above, in this embodiment, after step S10, the following steps are further performed:

[0088] Step S2: When the switch opening / closing state is a preset second switch K2 state, the conductance of the calibration resistor is determined according to the second switch K2 state.

[0089] It should be noted that the preset state of the second switch K2 is to open the second switch K2 in the calibration circuit 40 to start the calibration circuit 40 and close the first switch K1 for measuring resistance so that only the calibration circuit 40 works normally.

[0090] It is understandable that the conductance of the calibration resistor is used to calculate the calibration parameters, wherein the calculation of the calibration parameters requires the use of temperature values ​​corresponding to multiple sets of resistance values ​​to calculate the corresponding calibration parameters.

[0091] Step S3: determining a target calibration parameter according to the calibration resistor conductance, and comparing the target calibration parameter with the initial calibration parameter.

[0092] It is worth noting that the target calibration parameters refer to the calibration parameters obtained based on the measurement results corresponding to different resistance values ​​using a linear regression equation; the initial calibration parameters can be the calibration parameters obtained when the temperature measurement device is calibrated according to a high-precision resistor package when it leaves the factory.

[0093] It should be noted that three sets of resistance values ​​are used to cover the temperatures of three points, for example: 0°C, 25°C and 50°C. The conductance value of the calibration resistor can be obtained by taking the reciprocal of the resistance value, and the voltage values ​​Va and Vb on both sides of the resistor corresponding to the resistance are measured. The corresponding ADC measurement voltage value is calculated using the formula x = Va / (Vb-Va).

[0094] It is easy to understand that after obtaining the calculation results of different ADC measurement voltage values ​​based on three sets of different resistance values, the corresponding calibration parameters k and b are obtained according to the linear regression equation of y=kx+b, and the calibration parameters detected by the internal calibration circuit 40 are compared with the initial calibration parameters. If the errors between the two are within the allowable range, the calibration passes; if the errors between the two are outside the allowable range, the calibration fails and the equipment needs to be recalibrated.

[0095] Furthermore, multiple measurements are required for each set of resistance values. The measured voltage may fluctuate at the moment of switching, so any abnormal voltages measured during switching should be ignored. For the same device, the Va value for the same period of time is fixed, for example, 299mV. Any Va values ​​in each set of measurements that deviate significantly from the average value should be discarded, along with the Vb value for that measurement.

[0096] It should be understood that when a temperature probe is connected for measurement, the Vb value will not exceed 3.1V. Exceeding 3.1V indicates that the temperature probe is not connected.

[0097] Step S4: If the comparison fails, temperature measurement calibration is performed using a preset calibration strategy.

[0098] It is understandable that if the calibration parameters obtained by the internal calibration circuit 40 have a large error compared to the initial calibration parameters, it is possible that the internal calibration circuit 40 has failed and a high-precision calibration is required.

[0099] Furthermore, in order to perform high-precision calibration, after step S4, the following steps may be further performed:

[0100] If the comparison fails, adjusting the switch opening and closing state to a preset third state;

[0101] Perform temperature measurement calibration on the temperature measurement circuit using the target resistor package.

[0102] It should be noted that the reference Figure 5 The target resistance pack can be an external resistance pack for high-precision calibration. In addition, the temperature measuring device can also be calibrated using the resistance pack when it leaves the factory.

[0103] In a specific implementation, the preset third state means that the first switch K1 and the second switch K2 inside the temperature measuring resistor are both switched to the disconnected state, so that when the resistor pack is connected to the circuit, only the resistor pack is in the working state.

[0104] At this point, the measurement circuit 20 is calibrated using an external high-precision resistor pack Rq to determine the values ​​of calibration parameters k and b. The external resistor pack calibration is automatic. After the input port is connected to the resistor pack, the device's internal analog switch is used to switch to external calibration mode. The external calibration resistor is connected in parallel with Rb and then in series with Ra; the formula is satisfied:

[0105] y=kx+b

[0106] Where y is the conductance of the resistor to be measured; x represents the calculated result of the ADC measurement; k and b are the coefficients to be calibrated, k = 1 / Ra and b = -1 / Rb.

[0107] In this embodiment, the theoretical values ​​are k=1 / Ra=1 / 1000; b=-1 / Rb=-1 / 10000.

[0108] Take n groups of resistance values ​​and differentiate them to get y1...yn. Measure Va and Vb corresponding to the n groups of resistance values ​​and calculate x1...xn. The corresponding calibration parameter is obtained as follows:

[0109] k=[n∑xi*yi-∑xi*∑y] / [n∑xi2-(∑xi)2]

[0110] b=∑yi / nk*(∑xi / n)

[0111] This embodiment determines the conductance of a calibration resistor according to the state of a preset second switch K2 when the switch opening and closing state is the state of the second switch K2; determines a target calibration parameter according to the conductance of the calibration resistor, and compares the target calibration parameter with the initial calibration parameter; if the comparison fails, performs temperature measurement calibration using a preset calibration strategy; this embodiment achieves accurate measurement of the temperature measurement circuit by performing internal calibration on the opening and closing of the switch or by calibrating using an external high-precision resistor pack, thereby improving the accuracy of the temperature measurement circuit when performing temperature measurement.

[0112] It should be understood that the above is only an example and does not constitute any limitation to the technical solution of the present invention. In specific applications, those skilled in the art can make settings as needed, and the present invention does not impose any limitation on this.

[0113] It should be noted that the workflow described above is merely illustrative and does not limit the scope of protection of the present invention. In practical applications, technicians in this field can select part or all of it according to actual needs to achieve the purpose of the embodiment scheme, and no limitation is made here.

[0114] In addition, for technical details not fully described in this embodiment, reference can be made to the temperature measurement method provided in any embodiment of the present invention, and will not be repeated here.

[0115] In addition, it should be noted that, in this document, the terms "comprises," "includes," or any other variations thereof are intended to encompass non-exclusive inclusion, such that a process, method, article, or system comprising a series of elements includes not only those elements but also other elements not explicitly listed, or elements inherent to such process, method, article, or system. In the absence of further limitations, an element defined by the phrase "comprising a ..." does not exclude the presence of other identical elements in the process, method, article, or system comprising the element.

[0116] The serial numbers of the above embodiments of the present invention are for descriptive purposes only and do not represent the superiority or inferiority of the embodiments. The above are only preferred embodiments of the present invention and do not limit the scope of the present invention. Any equivalent structure or equivalent process transformation made by using the contents of the present invention description and drawings, or directly or indirectly applied in other related technical fields, are also included in the scope of patent protection of the present invention.

Claims

1. A temperature measurement circuit, characterized in that: The temperature measurement circuit includes: a constant current circuit and a measurement circuit; wherein the constant current circuit is connected to the linearization circuit and the measurement circuit respectively; the measurement circuit includes: a first switch and a first resistor; the linearization circuit includes: a third resistor; the constant current circuit includes: an operational amplifier and a second resistor; The non-inverting input terminal of the operational amplifier is connected to an external power supply, and the inverting input terminal of the operational amplifier is connected as a control terminal to the second end of the first resistor, the second end of the third resistor, and the first end of the second resistor respectively; the second end of the second resistor is grounded; and the output terminal of the operational amplifier is connected to the first end of the first switch; The constant current circuit is used to provide a constant power supply signal; The measuring circuit is configured to perform temperature measurement based on the collected temperature information when receiving the power supply signal; The linearization circuit is used to linearize the output of the measurement circuit when the measurement circuit performs temperature measurement according to the constant current signal, so as to reduce the output voltage corresponding to the measurement circuit so as not to exceed the measurement range.

2. The temperature measurement circuit according to claim 1, wherein: The measuring circuit includes: a first switch and a first resistor; wherein, The first end of the first switch is connected to the output end of the constant current circuit, the second end of the first switch is connected to the first end of the first resistor, and the second ends of the first resistor are respectively connected to the second ends of the linearization circuit.

3. The temperature measurement circuit according to claim 2, wherein: The linearization circuit includes: a third resistor; wherein, The first end of the third resistor is connected to the output end of the constant current circuit and the first end of the first switch respectively, and the second end of the third resistor is connected to the second input end of the constant current circuit and the second end of the first resistor respectively.

4. The temperature measurement circuit according to claim 1, wherein: The temperature measurement circuit further includes: a calibration circuit; wherein, The calibration circuit is connected to the output terminal of the operational amplifier and the first terminal of the third resistor respectively; The calibration circuit is used to perform circuit measurement calibration according to the constant current circuit when the calibration circuit is turned on.

5. A temperature measurement method, characterized in that: The temperature measurement method is applied to the temperature measurement circuit according to any one of claims 1 to 4, and the temperature measurement method includes: Upon receiving user operation information, determining the switch open / close state according to the operation information; When the switch opening and closing state is a preset first switch state, obtaining a target voltage parameter; The target temperature is determined according to the target voltage parameter and a preset temperature calculation rule.

6. The temperature measurement method according to claim 5, wherein: The determining the target temperature according to the target voltage parameter and a preset temperature calculation rule includes: Determining a first resistance conductance according to the target voltage parameter using a preset temperature calculation rule; determining a resistance value of a first resistor based on the conductance of the first resistor; The first resistor value is matched with a preset temperature table, and a target temperature is determined according to the matching result.

7. The temperature measurement method according to claim 5, wherein: After determining the switch opening and closing state according to the operation information, the method further includes: When the switch opening and closing state is a preset second switch state, determining the conductance of the calibration resistor according to the second switch state; determining a target calibration parameter based on the calibration resistance and conductance, and comparing the target calibration parameter with an initial calibration parameter; If the comparison fails, the temperature measurement is calibrated using the preset calibration strategy.

8. The temperature measurement method according to claim 7, wherein: If the comparison fails, the temperature measurement calibration is performed using a preset calibration strategy, including: If the comparison fails, adjusting the switch opening and closing state to a preset third state; Perform temperature measurement calibration on the temperature measurement circuit using the target resistor package.

9. A temperature measuring device, characterized in that: The temperature measuring device applies the temperature measuring method according to any one of claims 5 to 8.

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