A thermal history simulation method and related device for multiple samples in a vertical profile

Abstract

The present application discloses a method for simulating the thermal history of multiple samples in a vertical profile and its related device. By means of assumption, a number of thermal history curve groups of the geological formation to be simulated in vertical profiles are obtained. Each group of thermal history curves in the vertical profile includes the thermal history curves of samples at different heights in the vertical profile of the geological formation to be simulated. Based on each group of thermal history curves in the vertical profile, various low-temperature chronology methods are used to simulate each sample to obtain simulation results. Furthermore, the goodness of fit of each group of thermal history curves in the vertical profile under the known experimental simulation results of each low-temperature chronology is calculated, and the minimum value of the goodness of fit is used as the comprehensive goodness of fit of each group of thermal history curves in the vertical profile. The groups of thermal history curves in the vertical profile are screened through the comprehensive goodness of fit, and then the final thermal history curve simulation result of the geological formation to be simulated is obtained, solving the technical problem that when applying multiple chronology data for joint inversion of the thermal history, it is difficult to unify the evaluation criteria and it is impossible to obtain a high-precision thermal history simulation result.

Description

Technical Field

[0001] The present application relates to the field of geological technologies, and in particular, to a method for simulating the thermal history of multiple samples in a vertical profile and related devices thereof. Background Art

[0002] In recent years, low-temperature chronology methods have been widely applied in aspects such as energy exploration and geological research. Currently, the method of jointly inverting the thermal history through multiple chronology data has become the main approach to improving the accuracy of thermal history simulation. However, when multiple methods are jointly applied, it is difficult to unify the evaluation criteria, and how to obtain high-precision thermal history simulation results is a technical problem that needs to be urgently solved by those skilled in the art. Summary of the Invention

[0003] The present application provides a method for simulating the thermal history of multiple samples in a vertical profile and related devices thereof, which is used to solve the technical problem that when applying multiple chronology data to jointly invert the thermal history, it is difficult to unify the evaluation criteria and high-precision thermal history simulation results cannot be obtained.

[0004] In view of this, in the first aspect of the present application, a method for simulating the thermal history of multiple samples in a vertical profile is provided, including:

[0005] Obtaining a plurality of groups of thermal history curves of the vertical profiles of the geological formation to be simulated by means of assumption, wherein each group of the thermal history curves of the vertical profiles includes the thermal history curves of the samples at different heights in the vertical profile of the geological formation to be simulated;

[0006] Performing simulations of multiple low-temperature chronology methods on each of the samples based on each group of the thermal history curves of the vertical profiles to obtain multiple low-temperature chronology simulation results corresponding to each group of the thermal history curves of the vertical profiles;

[0007] Calculating the goodness of fit of each group of the thermal history curves of the vertical profiles under each low-temperature chronology simulation result according to the multiple low-temperature chronology simulation results corresponding to each group of the thermal history curves of the vertical profiles, and taking the minimum value of the goodness of fit of each group of the thermal history curves of the vertical profiles under each low-temperature chronology simulation result as the comprehensive goodness of fit of each group of the thermal history curves of the vertical profiles;

[0008] Screening the groups of the thermal history curves of the vertical profiles through the comprehensive goodness of fit to obtain several groups of the thermal history curves of the vertical profiles after screening;

[0009] Obtaining the final thermal history curve simulation result of the geological formation to be simulated based on several groups of the thermal history curves of the vertical profiles after screening.

[0010] Optionally, the obtaining a plurality of groups of thermal history curves of the vertical profiles of the geological formation to be simulated by means of assumption includes:

[0011] After obtaining a number of samples at different heights in the vertical section of the geological formation to be simulated, select one sample from all the samples as the target sample, and assume N thermal history curves of the target sample within a preset time range and a preset temperature range;

[0012] Calculate the temperature difference between each non-target sample and the target sample according to the height difference between each non-target sample and the target sample;

[0013] Superimpose the temperature difference between each non-target sample and the target sample on the basis of each thermal history curve of the target sample to obtain the thermal history curves of each non-target sample, thereby obtaining N groups of vertical section thermal history curve groups.

[0014] Optionally, the multiple low-temperature chronology methods are a combination of multiple methods among the fission track age method, fission track length method, vitrinite reflectance method, mineral U-Th / He age method, Ar-Ar dating method, and bedrock quartz optically stimulated luminescence method.

[0015] Optionally, screening the vertical section thermal history curve groups by the comprehensive goodness of fit to obtain several screened vertical section thermal history curve groups, including:

[0016] Compare the comprehensive goodness of fit of each vertical section thermal history curve group with a preset goodness-of-fit threshold, retain the vertical section thermal history curve groups whose comprehensive goodness of fit is greater than or equal to the preset goodness-of-fit threshold, and remove the vertical section thermal history curve groups whose comprehensive goodness of fit is less than the preset goodness-of-fit threshold.

[0017] Optionally, obtaining the final thermal history curve simulation result of the geological formation to be simulated based on several screened vertical section thermal history curve groups, including:

[0018] Calculate the average value or weighted average value of the curve values of the thermal history curves of the same sample at several identical time points in all the screened vertical section thermal history curve groups, and connect the average value or weighted average value of the curve values of each sample at each time point in chronological order to obtain the final thermal history curve simulation result of the geological formation to be simulated.

[0019] The second aspect of the present application provides a thermal history simulation device for multiple samples in a vertical section, including:

[0020] A first acquisition unit for obtaining several vertical section thermal history curve groups of the geological formation to be simulated by means of assumption, wherein the vertical section thermal history curve groups include the thermal history curves of samples at different heights in the vertical section of the geological formation to be simulated;

[0021] A simulation unit, configured to simulate various low-temperature chronology methods for each of the samples based on each group of vertical profile thermal history curves, and obtain various low-temperature chronology simulation results corresponding to each group of vertical profile thermal history curves;

[0022] A calculation unit, configured to calculate the goodness of fit of each group of vertical profile thermal history curves under each low-temperature chronology simulation result according to the various low-temperature chronology simulation results corresponding to each group of vertical profile thermal history curves, and use the minimum value of the goodness of fit of each group of vertical profile thermal history curves under each low-temperature chronology simulation result as the comprehensive goodness of fit of each group of vertical profile thermal history curves;

[0023] A screening unit, configured to screen the groups of vertical profile thermal history curves through the comprehensive goodness of fit, and obtain several groups of vertical profile thermal history curves after screening;

[0024] A second acquisition unit, configured to obtain the final thermal history curve simulation result of the geological formation to be simulated based on several groups of vertical profile thermal history curves after screening.

[0025] Optionally, the first acquisition unit is specifically configured to:

[0026] After obtaining several samples at different heights on the vertical profile of the geological formation to be simulated, select one sample from all the samples as the target sample, and assume N thermal history curves of the target sample within a preset time range and a preset temperature range;

[0027] Calculate the temperature difference between each non-target sample and the target sample according to the height difference between each non-target sample and the target sample;

[0028] On the basis of each thermal history curve of the target sample, superimpose the temperature difference between each non-target sample and the target sample to obtain the thermal history curves of each non-target sample, so as to obtain N groups of vertical profile thermal history curves.

[0029] Optionally, the second acquisition unit is specifically configured to:

[0030] Calculate the average value or weighted average value of the curve values of the thermal history curves of the same sample in all the groups of vertical profile thermal history curves after screening at several identical time points, and connect the average value or weighted average value of the curve values of each sample at each time point in chronological order to obtain the final thermal history curve simulation result of the geological formation to be simulated.

[0031] A third aspect of the present application provides a thermal history simulation device for multiple samples on a vertical profile, where the device includes a processor and a memory;

[0032] The memory is configured to store program codes and transmit the program codes to the processor;

[0033] The processor is configured to execute, according to the instructions in the program code, any of the methods for simulating the thermal history of multiple samples in a vertical profile according to the first aspect.

[0034] A fourth aspect of the present application provides a computer-readable storage medium, which is configured to store program code. When the program code is executed by a processor, it implements any of the methods for simulating the thermal history of multiple samples in a vertical profile according to the first aspect.

[0035] As can be seen from the above technical solutions, the present application has the following advantages:

[0036] The present application provides a method for simulating the thermal history of multiple samples in a vertical profile, including: obtaining a plurality of groups of thermal history curves of samples at different heights in a vertical profile of the geological formation to be simulated by way of assumption, where each group of thermal history curves of the vertical profile includes the thermal history curves of samples at different heights in the vertical profile of the geological formation to be simulated; performing simulations on each sample by using a plurality of low-temperature chronology methods based on each group of thermal history curves of the vertical profile to obtain a plurality of low-temperature chronology simulation results corresponding to each group of thermal history curves of the vertical profile; calculating the goodness of fit of each group of thermal history curves of the vertical profile under each low-temperature chronology simulation result according to the plurality of low-temperature chronology simulation results corresponding to each group of thermal history curves of the vertical profile, and taking the minimum value of the goodness of fit of each group of thermal history curves of the vertical profile under each low-temperature chronology simulation result as the comprehensive goodness of fit of each group of thermal history curves of the vertical profile; screening the groups of thermal history curves of the vertical profile through the comprehensive goodness of fit to obtain a plurality of groups of screened thermal history curves of the vertical profile; and obtaining the final thermal history curve simulation result of the geological formation to be simulated based on the plurality of groups of screened thermal history curves of the vertical profile.

[0037] In the present application, multiple groups of thermal history curves of samples at different heights in a vertical profile of the geological formation to be simulated are obtained to form groups of thermal history curves of the vertical profile, and a plurality of low-temperature chronology methods are used to perform simulations on each sample. According to the obtained plurality of low-temperature chronology simulation results, the goodness of fit corresponding to each simulation result is calculated. By taking the minimum goodness of fit of each group of thermal history curves of the vertical profile as the comprehensive goodness of fit as a unified evaluation criterion, the groups of thermal history curves of the vertical profile are screened to obtain groups of thermal history curves of the vertical profile with high precision. Based on the groups of thermal history curves of the vertical profile with high precision, the final thermal history simulation result of the geological formation to be simulated is obtained, improving the accuracy of the simulation result and solving the technical problem that it is difficult to unify the evaluation criteria when jointly inversing the thermal history by using multiple chronology data and it is impossible to obtain a thermal history simulation result with high precision. BRIEF DESCRIPTION OF THE DRAWINGS

[0038] To more clearly illustrate the technical solutions in the embodiments of the present application or the prior art, the following will briefly introduce the accompanying drawings required for the description of the embodiments or the prior art. Obviously, the accompanying drawings in the following description are only some embodiments of the present application. For those of ordinary skill in the art, without creative efforts, other accompanying drawings can be obtained based on these drawings.

[0039] Figure 1 It is a schematic flow chart of a thermal history simulation method for multiple samples in a vertical profile provided by an embodiment of the present application;

[0040] Figure 2 It is a thermal history curve diagram of 6 samples taken from a certain wellbore vertical profile provided by an embodiment of the present application;

[0041] Figure 3 It is a comparison diagram of the apatite U-Th / He age, apatite fission track age, and average confined track length corresponding to the simulated average thermal history curve provided by an embodiment of the present application with the measured data;

[0042] Figure 4 It is a comparison diagram of the histogram of the confined track length distribution of apatite fission tracks corresponding to the simulated average thermal history curve provided by an embodiment of the present application with the measured length distribution histogram;

[0043] Figure 5 It is a schematic structural diagram of a thermal history simulation device for multiple samples in a vertical profile provided by an embodiment of the present application. Detailed implementation manners

[0044] The present application provides a thermal history simulation method for multiple samples in a vertical profile and its related device, which is used to solve the technical problem that it is difficult to unify the evaluation criteria and it is impossible to obtain high-precision thermal history simulation results when applying multiple geochronological data for joint inversion of the thermal history.

[0045] In order to enable those skilled in the art to better understand the solution of the present application, the following will clearly and completely describe the technical solutions in the embodiments of the present application with reference to the accompanying drawings in the embodiments of the present application. Obviously, the described embodiments are only some embodiments of the present application, rather than all embodiments. Based on the embodiments in the present application, all other embodiments obtained by those of ordinary skill in the art without creative efforts belong to the scope of protection of the present application.

[0046] For ease of understanding, please refer to Figure 1 , an embodiment of the present application provides a thermal history simulation method for multiple samples in a vertical profile, including:

[0047] Step 101: Obtain several groups of vertical profile thermal history curves of the geological formation to be simulated by means of hypothesis. Among them, each group of vertical profile thermal history curves includes the thermal history curves of samples at different heights on the vertical profile of the geological formation to be simulated.

[0048] Several groups of vertical profile thermal history curves can be randomly hypothesized by methods such as Monte Carlo. Specifically, after obtaining several samples at different heights on the vertical profile of the geological formation to be simulated, select one sample from all samples as the target sample, and hypothesize N thermal history curves of the target sample within a preset time range and a preset temperature range. The thermal history curve is a time-temperature curve; calculate the temperature difference between each non-target sample and the target sample according to the height difference between each non-target sample and the target sample; superimpose the temperature difference between each non-target sample and the target sample on the basis of each thermal history curve of the target sample to obtain the thermal history curves of each non-target sample, so as to obtain N groups of vertical profile thermal history curves.

[0049] Obtain multiple samples at different altitudes on the vertical profile of the geological formation to be simulated, and select one sample from the multiple samples as the target sample. The bottom sample or the top sample can be selected as the target sample, etc. Determine the preset time range and the preset temperature range of the thermal history curve of the sample according to the geological background of the geological formation to be simulated, and then generate N thermal history curves of the target sample by means of hypothesis within the preset time range and the preset temperature range. The thermal history curves of other non-target samples can be obtained by deforming the thermal history curve of the target sample. First, calculate the height difference between each non-target sample and the target sample, and multiply the height difference between each non-target sample and the target sample by the paleogeothermal gradient to obtain the temperature difference between each non-target sample and the target sample. Select a thermal history curve i of the target sample, and superimpose the temperature difference between each non-target sample and the target sample on the basis of this thermal history curve to obtain the thermal history curves of each non-target sample. At this time, the thermal history curves of each non-target sample obtained based on the thermal history curve i and the thermal history curve i of the target sample together form a group of vertical profile thermal history curves, that is, when a thermal history curve of a sample is hypothesized, a group of thermal history curves representing samples at different heights on the vertical profile can be constructed. Since there are N thermal history curves of the target sample, correspondingly, N groups of vertical profile thermal history curves can be obtained, and the number of thermal history curves in each group of vertical profile thermal history curves is the same as the number of samples of the geological formation to be simulated.

[0050] Step 102: Based on each group of vertical profile thermal history curves, perform simulations of multiple low-temperature chronology methods on each sample to obtain multiple low-temperature chronology simulation results corresponding to each group of vertical profile thermal history curves.

[0051] Based on the thermal history curve groups of each vertical profile, various low-temperature chronology methods are simulated for each sample, and multiple low-temperature chronology simulation results can be obtained for each sample. The multiple low-temperature chronology methods in the embodiments of this application are a combination of multiple methods among the fission track age method, the fission track length method, the vitrinite reflectance method, the mineral U-Th / He age method, the Ar-Ar dating method, and the quartz optically stimulated luminescence method of bedrock. For each low-temperature chronology method, a chronology data profile is formed, so that corresponding simulation results can be calculated for each group of vertical profile thermal history curve groups. For example, for the fission track method, a set of simulated fission track ages can be calculated corresponding to each group of thermal vertical profile thermal history curve groups.

[0052] Step 103: Calculate the goodness of fit of each vertical profile thermal history curve group under each low-temperature chronology simulation result according to the multiple low-temperature chronology simulation results corresponding to each vertical profile thermal history curve group, and take the minimum value of the goodness of fit of each vertical profile thermal history curve group under each low-temperature chronology simulation result as the comprehensive goodness of fit of each vertical profile thermal history curve group.

[0053] When using the fission track age method to simulate the age, the calculation formula for the goodness of fit p of the corresponding vertical profile thermal history curve group under the simulation result of the fission track age method can be:

[0054]

[0055] In the formula, age is the measured age result, is the average error of the measured age, n is the number of samples, σ i is the error of the measured age of the i-th sample, is the average error between the simulated ages of multiple samples and the measured age, o i is the measured age of the i-th sample, M i is the simulated age of a single thermal history curve corresponding to the i-th sample, e is a constant, and x is the simulated age result.

[0056] The calculation formula for the goodness of fit under other low-temperature chronology simulation results is similar to the above formula. When using the fission track length method to simulate the fission track length, the goodness of fit p of the corresponding vertical profile thermal history curve group under the simulation result of the fission track age method can be obtained by calculating the average error of the measured fission track length and the average error of the simulated fission track length. The advantage of using the measured average error and the simulated average error is that it weakens the adverse effects brought by individual abnormal samples and emphasizes the constraint effect of the overall data on the thermal history.

[0057] Each group of vertical profile thermal history curve groups corresponds to multiple goodness-of-fit values. For each group of vertical profile thermal history curve groups, the minimum value of the goodness-of-fit under the results of each low-temperature chronology simulation is taken as the comprehensive goodness-of-fit of each vertical profile thermal history curve group. When the embodiments of the present application use methods such as the mineral U-Th / He age method, fission track age method, fission track length method, and vitrinite reflectance method for simulation, the corresponding comprehensive goodness-of-fit is p 综 = min(p U-Th / He , p 裂变径迹年龄 , p 裂变径迹长度 , p Ro ), min(·) is the minimum value function, and p U-Th / He , p 裂变径迹年龄 , p 裂变径迹长度 , p Ro are the goodness-of-fit values obtained through the mineral U-Th / He age method, fission track age method, fission track length method, and vitrinite reflectance method respectively.

[0058] In the embodiments of the present application, the minimum goodness-of-fit of all simulation methods is taken as the comprehensive goodness-of-fit, so that different low-temperature chronology methods and multiple samples can be integrated on one vertical profile, and the application on the vertical profile greatly improves the accuracy and reliability of thermal history simulation.

[0059] Step 104: Screen the vertical profile thermal history curve groups through the comprehensive goodness-of-fit to obtain several screened vertical profile thermal history curve groups.

[0060] Compare the comprehensive goodness-of-fit of each vertical profile thermal history curve group with the preset goodness-of-fit threshold, retain the vertical profile thermal history curve groups with a comprehensive goodness-of-fit greater than or equal to the preset goodness-of-fit threshold, and remove the vertical profile thermal history curve groups with a comprehensive goodness-of-fit less than the preset goodness-of-fit threshold.

[0061] For each group of vertical profile thermal history curve groups, calculate the overall goodness-of-fit of the vertical profile for each low-temperature chronology method respectively, and then take the minimum goodness-of-fit among them as the evaluation parameter of this group of vertical profile thermal history curve groups, as the standard for evaluating the reliability of this group of vertical profile thermal history curve groups, and then decide whether to retain or eliminate this group of vertical profile thermal history curve groups.

[0062] Generally, a high-precision p threshold can be set to 0.5, and an acceptable p threshold can be set to 0.05 (corresponding to a 95% confidence interval). That is to say, when the final p 综 ≥ 0.5 for a certain group of vertical profile thermal history curve groups, this group of vertical profile thermal history curve groups belongs to the high-precision thermal history simulation results; those with p 综 ≥ 0.05 belong to the acceptable vertical profile thermal history curve groups. In short, p 综The larger, the better, indicating that the vertical profile thermal history curve group is closer to the truth, or in other words, the greater the possibility.

[0063] Step 105: Obtain the simulation result of the final thermal history curve of the geological formation to be simulated based on the selected several vertical profile thermal history curve groups.

[0064] Calculate the average value or weighted average value of the curve values of the thermal history curves of the same sample in all the selected vertical profile thermal history curve groups at several same time points, and connect the average value or weighted average value of the curve values of each sample at each time point in chronological order to obtain the simulation result of the final thermal history curve of the geological formation to be simulated.

[0065] Sample each thermal history curve based on the same time interval to obtain several time points, calculate the average value or weighted average value of the curve values (i.e., temperature values) of the thermal history curves of the same sample at each of the same time points, and then connect the average value or weighted average value of the temperature values at each time point in chronological order to obtain the average thermal history curve of each sample. Finally, construct a new group of vertical profile thermal history curve groups (i.e., the average thermal history curves of each sample), which is the simulation result of the final thermal history curve of the geological formation to be simulated.

[0066] In the embodiment of the present application, vertical profiles are taken from a certain well, and a total of 6 samples are taken, and all of them are subjected to apatite U-Th / He dating; among them, 5 samples are subjected to apatite fission track dating; among them, the fission track confined track length data of 2 samples reach more than 100, so they are used for thermal history simulation, and the remaining length distributions are only used for final display and do not actually participate in thermal history simulation. As Figure 2 shown, 100,000 thermal history curves are randomly searched, and finally the thermal history curves with p 综 ≥0.04 are taken, and their average values are obtained to obtain the average thermal history curve. The dotted lines respectively represent the upper and lower limits of the temperatures of the top sample and the bottom sample. The rectangular frames in the figure represent the approximate ranges of the inflection points of the thermal history curves obtained according to the geological background, which helps to constrain the random search range and improve the simulation reliability. Figure 3 It shows the comparison between the apatite U-Th / He age, apatite fission track age, and average confined track length corresponding to the average thermal history curve obtained by simulation and the measured data. Figure 4 It represents the comparison between the distribution histogram of the apatite fission track confined track length corresponding to the average thermal history curve obtained by simulation and the measured length distribution.

[0067] In the embodiments of the present application, multiple groups of thermal history curves of samples at different heights on the vertical section of the geological body to be simulated are obtained to form a vertical section thermal history curve group. A variety of low-temperature chronology methods are used to simulate each sample, and the goodness of fit corresponding to each simulation result is calculated based on the obtained various low-temperature chronology simulation results. By taking the minimum goodness of fit of each group of vertical section thermal history curve groups as the comprehensive goodness of fit as a unified evaluation criterion, the vertical section thermal history curve group is screened to obtain a high-precision vertical section thermal history curve group. The final thermal history simulation result of the geological body to be simulated is obtained by integrating the high-precision vertical section thermal history curve group, which improves the accuracy of the simulation result and solves the technical problem that it is difficult to unify the evaluation criteria when applying multiple chronology data for joint inversion of thermal history and it is impossible to obtain a high-precision thermal history simulation result.

[0068] The above is an embodiment of a thermal history simulation method for multiple samples on a vertical section provided by the present application. The following is an embodiment of a thermal history simulation device for multiple samples on a vertical section provided by the present application.

[0069] Please refer to Figure 5 , a thermal history simulation device for multiple samples on a vertical section provided by the embodiments of the present application, includes:

[0070] A first acquisition unit, configured to obtain a plurality of vertical section thermal history curve groups of the geological body to be simulated by way of assumption, wherein the vertical section thermal history curve group includes thermal history curves of samples at different heights on the vertical section of the geological body to be simulated;

[0071] A simulation unit, configured to perform simulations on each sample using a variety of low-temperature chronology methods based on each vertical section thermal history curve group to obtain a variety of low-temperature chronology simulation results corresponding to each vertical section thermal history curve group;

[0072] A calculation unit, configured to calculate the goodness of fit of each vertical section thermal history curve group under each low-temperature chronology simulation result based on the variety of low-temperature chronology simulation results corresponding to each vertical section thermal history curve group, and take the minimum value of the goodness of fit of each vertical section thermal history curve group under each low-temperature chronology simulation result as the comprehensive goodness of fit of each vertical section thermal history curve group;

[0073] A screening unit, configured to screen the vertical section thermal history curve group through the comprehensive goodness of fit to obtain a plurality of screened vertical section thermal history curve groups;

[0074] A second acquisition unit, configured to obtain the final thermal history curve simulation result of the geological body to be simulated based on the plurality of screened vertical section thermal history curve groups.

[0075] As a further aspect, the first acquisition unit is specifically configured to:

[0076] After obtaining a number of samples at different heights on the vertical section of the geological formation to be simulated, select one sample from all the samples as the target sample, and assume N thermal history curves of the target sample within a preset time range and a preset temperature range;

[0077] Calculate the temperature difference between each non-target sample and the target sample according to the height difference between each non-target sample and the target sample;

[0078] On the basis of each thermal history curve of the target sample, superimpose the temperature difference between each non-target sample and the target sample to obtain the thermal history curves of each non-target sample, thereby obtaining N groups of vertical section thermal history curve groups.

[0079] As a further improvement, the second acquisition unit is specifically used for:

[0080] Calculate the average value or weighted average value of the curve values of the thermal history curves of the same sample at several identical time points in all the screened vertical section thermal history curve groups, and connect the average value or weighted average value of the curve values of each sample at each time point in chronological order to obtain the final thermal history curve simulation result of the geological formation to be simulated.

[0081] In the embodiments of the present application, multiple groups of thermal history curves of samples at different heights on the vertical section of the geological formation to be simulated are obtained to obtain vertical section thermal history curve groups, and various low-temperature chronology methods are used to simulate each sample, and the goodness of fit corresponding to various simulation results is calculated according to the obtained various low-temperature chronology simulation results. By using the minimum goodness of fit of each group of vertical section thermal history curve groups as the comprehensive goodness of fit as a unified evaluation criterion to screen the vertical section thermal history curve groups, high-precision vertical section thermal history curve groups are obtained, and the final thermal history simulation result of the geological formation to be simulated is obtained by integrating the high-precision vertical section thermal history curve groups, which improves the accuracy of the simulation result and solves the technical problem that it is difficult to unify the evaluation criteria and it is impossible to obtain high-precision thermal history simulation results when applying multiple chronology data for joint inversion of thermal history.

[0082] The embodiments of the present application also provide a thermal history simulation device for multiple samples on a vertical section, and the device includes a processor and a memory;

[0083] The memory is used to store program codes and transmit the program codes to the processor;

[0084] The processor is used to execute the thermal history simulation method for multiple samples on a vertical section in the foregoing method embodiments according to the instructions in the program codes.

[0085] The embodiments of the present application also provide a computer-readable storage medium, and the computer-readable storage medium is used to store program codes, and when the program codes are executed by a processor, the thermal history simulation method for multiple samples on a vertical section in the foregoing method embodiments is implemented.

[0086] Those skilled in the art can clearly understand that for the convenience and brevity of description, the specific working processes of the above-described devices and units can refer to the corresponding processes in the foregoing method embodiments, and will not be described herein again.

[0087] In the description of this application and the above-mentioned drawings, terms such as "first", "second", "third", "fourth", etc. (if any) are used to distinguish similar objects and do not necessarily describe a specific order or sequence. It should be understood that the data used in this way can be interchanged under appropriate circumstances so that the embodiments of this application described herein can be implemented in an order different from those illustrated or described herein. In addition, the terms "comprising" and "having" and any variations thereof are intended to cover non-exclusive inclusion. For example, a process, method, system, product or device comprising a series of steps or units does not necessarily have to be limited to those steps or units clearly listed, but may include other steps or units not clearly listed or inherent to these processes, methods, products or devices.

[0088] It should be understood that in this application, "at least one (item)" means one or more, and "a plurality" means two or more. "And / or" is used to describe the association relationship of associated objects and indicates that three relationships can exist. For example, "A and / or B" can mean: only A exists, only B exists, and both A and B exist at the same time. Among them, A and B can be singular or plural. The character " / " generally means that the associated objects before and after are in an "or" relationship. "At least one (one) of the following" or similar expressions refer to any combination of these items, including any combination of single items (ones) or plural items (ones). For example, at least one (one) of a, b or c can mean: a, b, c, "a and b", "a and c", "b and c", or "a and b and c", where a, b, c can be single or multiple.

[0089] In several embodiments provided in this application, it should be understood that the disclosed devices and methods can be implemented in other ways. For example, the device embodiments described above are merely illustrative. For example, the division of the units is only a logical function division, and there may be other division methods in actual implementation. For example, multiple units or components can be combined or integrated into another system, or some features can be ignored or not executed. Another point is that the displayed or discussed coupling or direct coupling or communication connection to each other can be through some interfaces, and the indirect coupling or communication connection of the devices or units can be in an electrical, mechanical or other form.

[0090] The unit described as a separation component may or may not be physically separated. The component shown as a unit may or may not be a physical unit, that is, it may be located in one place or may be distributed across multiple network units. Some or all of the units can be selected according to actual needs to achieve the purpose of the solution of this embodiment.

[0091] In addition, each functional unit in various embodiments of the present application can be integrated in a processing unit, or each unit can exist physically alone, or two or more units can be integrated in one unit. The above-mentioned integrated unit can be implemented in the form of hardware or in the form of a software functional unit.

[0092] If the above-mentioned integrated unit is implemented in the form of a software functional unit and sold or used as an independent product, it can be stored in a computer-readable storage medium. Based on such an understanding, the technical solution of the present application, in essence, or the part that contributes to the prior art, or all or part of this technical solution, can be embodied in the form of a software product. This computer software product is stored in a storage medium and includes several instructions for a computer device (which can be a personal computer, a server, or a network device, etc.) to execute all or part of the steps of the methods described in various embodiments of the present application. The aforementioned storage medium includes: USB flash drives, mobile hard disks, read-only memories (English full name: Read-Only Memory, English abbreviation: ROM), random access memories (English full name: Random Access Memory, English abbreviation: RAM), magnetic disks or optical discs and other various media that can store program codes.

[0093] As described above, the above embodiments are only used to illustrate the technical solutions of the present application and are not intended to limit them; although the present application has been described in detail with reference to the foregoing embodiments, those of ordinary skill in the art should understand that they can still modify the technical solutions recorded in the foregoing embodiments, or perform equivalent replacements for some of the technical features; and these modifications or replacements do not cause the essence of the corresponding technical solutions to deviate from the spirit and scope of the technical solutions of the various embodiments of the present application.

Claims

1. A method for simulating the thermal history of multiple samples in a vertical profile, characterized in that, it includes: Obtaining a number of vertical profile thermal history curve groups of the geological formation to be simulated by means of assumption, wherein each group of the vertical profile thermal history curve groups includes the thermal history curves of samples at different heights on the vertical profile of the geological formation to be simulated; The obtaining a number of vertical profile thermal history curve groups of the geological formation to be simulated by means of assumption includes: After obtaining a number of samples at different heights on the vertical profile of the geological formation to be simulated, selecting one sample from all the samples as the target sample, and assuming N thermal history curves of the target sample within a preset time range and a preset temperature range; Calculating the temperature difference between each non-target sample and the target sample according to the height difference between each non-target sample and the target sample; Superimposing the temperature difference between each non-target sample and the target sample on each thermal history curve of the target sample to obtain the thermal history curves of each non-target sample, thereby obtaining N groups of vertical profile thermal history curve groups; Based on each group of the vertical profile thermal history curve groups, performing simulations of multiple low-temperature chronology methods on each of the samples to obtain multiple low-temperature chronology simulation results corresponding to each group of the vertical profile thermal history curve groups; Calculating the goodness of fit of each group of the vertical profile thermal history curve groups under each low-temperature chronology simulation result according to the multiple low-temperature chronology simulation results corresponding to each group of the vertical profile thermal history curve groups, and taking the minimum value of the goodness of fit of each group of the vertical profile thermal history curve groups under each low-temperature chronology simulation result as the comprehensive goodness of fit of each group of the vertical profile thermal history curve groups; Screening the vertical profile thermal history curve groups through the comprehensive goodness of fit to obtain several screened vertical profile thermal history curve groups; Obtaining the final thermal history curve simulation result of the geological formation to be simulated based on several screened vertical profile thermal history curve groups, including: Calculating the average value or weighted average of the curve values of the thermal history curves of the same sample in all the screened vertical profile thermal history curve groups at several same time points, and connecting the average value or weighted average of the curve values of each sample at each time point in chronological order to obtain the final thermal history curve simulation result of the geological formation to be simulated.

2. The method for simulating the thermal history of multiple samples in a vertical profile according to claim 1, characterized in that, The multiple low-temperature chronology methods are a combination of multiple methods such as the fission track age method, the fission track length method, the vitrinite reflectance method, the mineral U-Th / He age method, the Ar-Ar dating method, and the quartz optically stimulated luminescence method of bedrock.

3. The method for simulating the thermal history of multiple samples in a vertical profile according to claim 1, characterized in that, The screening the vertical profile thermal history curve groups through the comprehensive goodness of fit to obtain several screened vertical profile thermal history curve groups includes: Compare the comprehensive goodness of fit of each of the vertical profile thermal history curve groups with a preset goodness of fit threshold, retain the vertical profile thermal history curve groups whose comprehensive goodness of fit is greater than or equal to the preset goodness of fit threshold, and remove the vertical profile thermal history curve groups whose comprehensive goodness of fit is less than the preset goodness of fit threshold.

4. A thermal history simulation device for multiple samples in a vertical profile, characterized in that it includes: A first acquisition unit for acquiring a plurality of vertical profile thermal history curve groups of the geological formation to be simulated by means of assumption, wherein each of the vertical profile thermal history curve groups includes thermal history curves of samples at different heights in the vertical profile of the geological formation to be simulated; Specifically, the first acquisition unit is configured to: After acquiring a plurality of samples at different heights in the vertical profile of the geological formation to be simulated, select one sample from all the samples as a target sample, and assume N thermal history curves of the target sample within a preset time range and a preset temperature range; Calculate the temperature difference between each non-target sample and the target sample according to the height difference between each non-target sample and the target sample; On the basis of each thermal history curve of the target sample, superimpose the temperature difference between each non-target sample and the target sample to obtain the thermal history curves of each non-target sample, so as to obtain N groups of vertical profile thermal history curve groups; A simulation unit for simulating each of the samples by means of a plurality of low-temperature chronology methods based on each of the vertical profile thermal history curve groups, and obtaining a plurality of low-temperature chronology simulation results corresponding to each of the vertical profile thermal history curve groups; A calculation unit for calculating the goodness of fit of each of the vertical profile thermal history curve groups under each low-temperature chronology simulation result according to the plurality of low-temperature chronology simulation results corresponding to each of the vertical profile thermal history curve groups, and taking the minimum value of the goodness of fit of each of the vertical profile thermal history curve groups under each low-temperature chronology simulation result as the comprehensive goodness of fit of each of the vertical profile thermal history curve groups; A screening unit for screening the vertical profile thermal history curve groups by means of the comprehensive goodness of fit to obtain a plurality of the vertical profile thermal history curve groups after screening; A second acquisition unit for obtaining a final thermal history curve simulation result of the geological formation to be simulated based on a plurality of the vertical profile thermal history curve groups after screening; Specifically, the second acquisition unit is configured to calculate the average value or weighted average value of the curve values of the thermal history curves of the same sample in all the vertical profile thermal history curve groups after screening at a plurality of identical time points, and connect the average value or weighted average value of the curve values of each sample at each time point in chronological order to obtain the final thermal history curve simulation result of the geological formation to be simulated.

5. A thermal history simulation device for multiple samples in a vertical profile, characterized in that the device includes a processor and a memory; The memory is used for storing program codes and transmitting the program codes to the processor; The processor is configured to execute the thermal history simulation method for multiple samples in a vertical profile according to any one of claims 1-3 based on the instructions in the program codes.

6. A computer-readable storage medium, characterized in that The computer-readable storage medium is used for storing program codes, and when the program codes are executed by a processor, the method for simulating the thermal history of multiple samples in a vertical profile according to any one of claims 1-3 is implemented.

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