A method, system, device and storage medium for automatic design of probe tooling

Abstract

The present invention discloses a method, system, device and storage medium for automatic design of probe tooling, the method comprising: step 1, obtaining test point information, the test point information including the probe type of the test point and the test point installation position; step 2, based on the probe type of the test point, associating the test point with a probe template; step 3, simulating the installation of the associated probe template, performing interference detection on all test points, updating the identification of the test point according to the interference detection result, and determining the installation angle of the probe template according to the identification of the test point; step 4, assembling the probe template according to the installation angle and the test point installation position for the test point that meets the placement requirements of the probe template body. The present invention divides the test points into: completely interfering test points, test points that meet the placement requirements and test points to be optimized by assembling probe templates and interference checking for the test points, and finally outputs an assembly report, thereby realizing the automatic design of the probe tooling.

Description

Technical Field

[0001] The present invention belongs to the technical field of electronic manufacturing, and in particular relates to a method, system, equipment and storage medium for automatic design of probe tooling. Background Art

[0002] In the PCB (Printed Circuit Board) production process, probe testing plays an extremely important role in detecting the interference of test point tooling. During the probe testing process, a pre-set coordinate position program is generally used to move the test probe to contact it. Each test probe performs open-circuit or signal testing on the PCB assembly components according to the test program.

[0003] The test program of the online tester is generally automatically generated by reading the test point location by ECAD (Electronic Computer Aided Design) and then generating the test program by combining the test point data and component data.

[0004] However, when performing tooling interference analysis on test points, the existing technology requires manual selection of a probe template for each test position, and the placement angle of the probe template needs to be manually adjusted, which is cumbersome and time-consuming. Summary of the invention

[0005] In order to solve the above problems existing in the prior art, the present invention provides a method, system, device and storage medium for automatic design of probe tooling. The technical problem to be solved by the present invention is achieved through the following technical solutions:

[0006] A method for automatic design of a probe tooling, comprising:

[0007] Step 1: Acquire test point information, wherein the test point information at least includes the probe type of the test point and the installation position of the test point;

[0008] Step 2: Associating the test point with a probe template based on the probe type of the test point;

[0009] Step 3, simulating the installation of the associated probe template, performing interference detection on all the test points, and updating the identification of the test points according to the interference detection results, so as to determine the installation angle of the probe template according to the identification of the test points, wherein the identification of the test points includes completely interfering test points, test points that meet the placement requirements of the probe template body, and test points to be optimized; the initial identification of all the test points is the test points to be optimized;

[0010] Step 4: Assemble the probe template according to the installation angle and the installation position of the test point for the test point that meets the placement requirement of the probe template body.

[0011] An embodiment of the present invention further provides a system for automatic design of a probe tool, comprising:

[0012] An acquisition module, used to acquire test point information, wherein the test point information at least includes a probe type of the test point and an installation position of the test point;

[0013] an associating module, configured to associate the test point with a probe template based on the probe type of the test point;

[0014] An installation angle determination module simulates the installation of the associated probe template, is used to perform interference detection on all the test points, and updates the identification of the test points according to the interference detection results, so as to determine the installation angle of the probe template according to the identification of the test points, wherein the identification of the test points includes completely interfering test points, test points that meet the placement requirements of the probe template body, and test points to be optimized; the initial identification of all the test points is the test points to be optimized;

[0015] An assembly module is used to assemble the probe template according to the installation angle and the installation position of the test point that meets the placement requirement of the probe template body.

[0016] An embodiment of the present invention further provides an electronic device, comprising a processor, a communication interface, a memory and a communication bus, wherein the processor, the communication interface and the memory communicate with each other via the communication bus;

[0017] Memory for storing computer programs;

[0018] The processor is used to implement the method steps of automatic design of probe tooling described in the above embodiment when executing the computer program.

[0019] An embodiment of the present invention further provides a storage medium, wherein the storage medium stores a computer program, and when the computer program is executed by a processor, the method steps for automatically designing a probe tooling described in the above embodiment are implemented.

[0020] Beneficial effects of the present invention:

[0021] 1. The present invention can automatically read the test point information and probe template information: the test point information includes the test point installation position, the test point probe type, etc., and combined with the test point installation position, the probe type and the probe template, the probe template is automatically assembled and tested according to the installation angle and installation position, thereby realizing the automatic design of the probe tooling.

[0022] 2. The present invention can realize automatic detection: after assembling the probe template according to the installation angle and the installation position of the test point, it is automatically determined whether there is assembly interference and an assembly report is output.

[0023] 3. The present invention can provide a probe template selection solution, automatically analyzing whether there is assembly interference in the "tooling head" of each test point, eliminating the need to manually select the probe template for adjustment each time, thereby solving the tedious step of adjusting the angle each time the probe template is placed and simplifying the operation logic.

[0024] 4. The method for automating the design of probe tooling provided by the present invention can effectively shorten the design and production cycle of probe tooling.

[0025] The present invention will be further described in detail below with reference to the accompanying drawings and embodiments. BRIEF DESCRIPTION OF THE DRAWINGS

[0026] Figure 1 It is a flow chart of a method for automatic design of a probe tooling provided by an embodiment of the present invention;

[0027] Figure 2 It is a flow chart of another method for automatic design of probe tooling provided by an embodiment of the present invention;

[0028] Figure 3 is a schematic diagram of a polygonal probe template provided by an embodiment of the present invention;

[0029] Figure 4 is a schematic diagram of a probe template body provided by an embodiment of the present invention;

[0030] Figure 5 The embodiment of the present invention provides Figure 4 Schematic diagram of a probe template with an assembly sheet;

[0031] Figure 6 is a schematic diagram of a circular probe template provided by an embodiment of the present invention;

[0032] Figure 7 is a schematic diagram of a T-shaped probe template provided by an embodiment of the present invention;

[0033] Figure 8 It is a schematic diagram of using a simple model to eliminate completely interfering test points provided by an embodiment of the present invention;

[0034] Fig. 9 It is a schematic diagram of obtaining an installation sequence using Kruskal provided by an embodiment of the present invention;

[0035] Fig.10 It is a schematic diagram of two unprocessed test points to be optimized arranged at a vertical angle with a line connecting the center points provided by an embodiment of the present invention;

[0036] Fig.11 It is a schematic diagram of initializing and adjusting another test point angle based on a known angle provided by an embodiment of the present invention;

[0037] Fig.12 is a schematic diagram of an installation angle of a probe template body provided by an embodiment of the present invention;

[0038] Fig.13 This is a schematic diagram of an assembly effect provided by an embodiment of the present invention;

[0039] Fig.14 is a schematic diagram of a system for automatic design of a probe tooling provided by an embodiment of the present invention;

[0040] Fig.15 It is a structural schematic diagram of an electronic device provided by an embodiment of the present invention. DETAILED DESCRIPTION

[0041] The present invention is further described in detail below with reference to specific embodiments, but the embodiments of the present invention are not limited thereto.

[0042] Embodiment 1

[0043] See also Figure 1 and Figure 2 , Figure 1 is a flow chart of a method for automatic design of a probe tooling provided by an embodiment of the present invention, Figure 2 1 is a flow chart of another method for automatic design of a probe tool provided by an embodiment of the present invention. This embodiment provides a method for automatic design of a probe tool. The method may include steps 1 to 6, wherein:

[0044] Step 1: Acquire test point information, where the test point information at least includes the probe type of the test point and the installation position of the test point.

[0045] (1) Obtain test point information based on the read-in ECAD data. The test point information includes:

[0046] a. Test point probe types: RF (radio frequency probe), BTB (connector test socket), TP (test point), CA (connector) and LED;

[0047] b. Test point front and back properties: Group (when Group = 0, front; when Group = 1, back);

[0048] c. Test point name (bit number);

[0049] d. Test point installation position: Position (X, Y);

[0050] e. Probe template body flag type: 0: circular (TP, AN (no matching probe type)), 1: rotatable (CA, RF, LED), 2: non-rotatable (BTB);

[0051] f. Initialization field: The probe template list is empty.

[0052] (2) Read the probe template information from the probe template library. The probe template information includes:

[0053] a.Probe template name;

[0054] b. Probe template shape, size, and coordinates;

[0055] c. Probe template type: There are four main templates: 0: polygonal probe template, such as Figure 3 As shown; 1: Probe template with assembly sheet, such as Figure 5 As shown; 2: Circular probe template, such as Figure 6 As shown; 3: T-type probe template, such as Figure 7 shown.

[0056] d. The probe template can be applied to the probe type CompTypes (for example, a probe template can be installed with RF or CA);

[0057] e. Probe template probe depth AF (the probe depth cannot touch the device)

[0058] (3) Read component information based on ECAD data. The component information includes: component position number; component height; front and back attributes; component shape, size, position and angle.

[0059] Step 2: Based on the probe type of the test point, associate the test point with a probe template.

[0060] Specifically, the probe template is associated with the probe type of the test point, and after the matching is completed, the test point is associated with the probe template.

[0061] In this embodiment, one test point may be associated with multiple probe templates, that is, the probe template to be selected may include multiple probe templates:

[0062] 1. If the probe type of the current test point is TP (test point):

[0063] Calculate the distance between the test points, that is, find the minimum center distance of each test point relative to the nearby test points; select the probe template according to the minimum center distance between the current test points, as follows:

[0064] When the minimum center distance is between (39-52) mil, use Figure 6 39mil round needle block;

[0065] When the minimum center distance is greater than 52mil, use Figure 6 50mil round needle block;

[0066] When the minimum center distance is greater than 65mil, use Figure 6 50mil or 75mil round needle block;

[0067] When the minimum center distance is greater than 79mil, use Figure 6 50mil, 75mil or 100mil round needle blocks;

[0068] When the minimum center distance is less than 39 mil, the probe template is not placed.

[0069] 2. If the test point probe type is CA or RF, the associated probe template is the probe template with the assembly sheet (such as Figure 5 ) and / or polygonal probe templates (such as Figure 3 );

[0070] 3. If the test point probe type is BTB and the placement angle is fixed (using the preset angle), the associated probe template is a polygonal probe template (such as Figure 3 ), the probe template body is placed at a fixed angle, and the assembly piece can be rotated;

[0071] 4. If the test point probe type is LED, the associated probe template is a T-type probe template (such as Figure 7 );

[0072] 5. If there is no matching probe type for the test point, no judgment will be made.

[0073] It should be noted that the types of probe templates in this embodiment include but are not limited to the above four types, and the shapes and sizes of the probe templates include but are not limited to the shapes and sizes shown in the figures.

[0074] Step 3, simulate the installation of the associated probe template, perform interference detection on all test points, and update the identification of the test points according to the interference detection results to determine the installation angle of the probe template according to the identification of the test points, where the identification of the test points includes complete interference test points, test points that meet the placement requirements of the probe template body, and test points to be optimized; the initial identification of all test points is the test points to be optimized.

[0075] Specifically, in the present embodiment, when the test point is identified as a completely interfering test point, it means that the probe template of the test point cannot be installed, that is, it is a test point where interference will occur no matter how the probe template is placed; when the test point is identified as a test point that meets the placement requirements of the probe template body, it means that the installation angle of the probe template of the test point can be determined, that is, it is a test point that can be installed at a certain angle at the test point without interfering with other probe templates and devices; when the test point is identified as a test point to be optimized, it means that the installation angle of the probe template of the test point still needs to be optimized, that is, it is a test point that does not meet the placement requirements of the probe template body after automatic adjustment, and the test point to be optimized can be assembled by manual adjustment after the automatic adjustment is completed. Therefore, after the above judgment, it can be determined which test points are test points that meet the placement requirements of the probe template body, thereby determining the angle of the test point when it meets the placement requirements of the probe template body, and using this angle as its installation angle.

[0076] In a specific embodiment, step 3 may specifically include steps 3.1 to 3.3, wherein:

[0077] Step 3.1. Install a preset probe template for the test point according to the rotation characteristics of the probe template matched by the test point to obtain a fully interfering test point and a test point that meets the placement requirements of the probe template body, add the fully interfering test point to the fully interfering test point group, and use the test points other than the fully interfering test point group as the first test point group, the first test point group includes the test points to be optimized and / or the test points that meet the placement requirements of the probe template body, wherein the preset probe template includes a simplified circular probe template installed when the test point probe template is a non-rotatable probe template and a rotatable test point probe template, the simplified circular probe template being a circular probe template obtained with the minimum interference distance as the radius.

[0078] That is to say, if the probe template of the test point is a non-rotatable probe template, the preset probe template is the probe template used by itself, and the preset probe templates of the remaining test points are simplified circular probe templates, wherein the minimum interference distance can be set according to design requirements, or can be calculated according to the probe template type of each test point, and this embodiment does not make any specific limitations on this.

[0079] In a specific embodiment, step 3.1 may specifically include steps 3.11 to 3.12, wherein:

[0080] Step 3.11, determine whether the probe template matched by the current test point can be rotated. If not, install the matched probe template for the current test point. If so, install a simplified circular probe template for the current test point to perform interference detection on the preset probe templates of all test points in pairs, obtain the interference number of each test point, and sort the test points with interference from most to least according to the interference number.

[0081] Step 3.12, remove the test point with the largest number of interferences, and refresh the number of interferences of the remaining test points after the removal. If the preset probe templates of the remaining test points still have interferences, continue to remove the test point with the largest number of interferences until the preset probe templates of the remaining test points no longer interfere. Then, update the identification of all removed test points to complete interference test points, record the test points where interference occurs (i.e., the test points removed previously), and add these test points to the complete interference test point group. The identification of the test points where no interference occurs and the probe template is non-rotatable is updated to the test points that meet the placement requirements of the probe template body, and the test points that meet the placement requirements of the probe template body are added to the test point group that meets the placement requirements of the probe template body. The identification of the test point where no interference occurs and the probe template is rotatable is still the test point to be optimized.

[0082] In one specific embodiment, the interference detection algorithm includes:

[0083] Based on the mathematical function provided by boost, detect whether there is interference between two templates. If both templates are circular, determine the size relationship between the center distance Dis of the two templates and the sum of the radii of the two templates. If Dis≤(R1+R2), a collision occurs, that is, interference occurs between the two templates. If Dis>(R1+R2), no collision occurs, that is, no interference occurs between the two templates. If one template is a circle and the other template is a polygon, determine whether the center of the circular template is within the contour of the polygon template. If it is within the contour of the polygon template, a collision occurs, that is, interference occurs between the two templates. If it is not within the contour of the polygon template, determine the minimum distance Dis1 from the circular template to the contour of the polygon template and the size relationship with the radius R of the circular template. If Dis1≤R, a collision occurs, that is, interference occurs between the two templates. If Dis1>R, no collision occurs, that is, no interference occurs between the two templates. If both templates are polygons, determine the shortest distance Dis2 between the contours of the two polygon templates. If Dis2≤0, a collision occurs, that is, interference occurs between the two templates. If Dis2>0, no collision occurs, that is, no interference occurs between the two templates.

[0084] Step 3.2: perform interference detection on the probe template of the test points in the first test point group and the probe templates of other test points to obtain a second test point group, which includes the remaining test points to be optimized and / or test points that meet the probe template body placement requirements.

[0085] Specifically, by installing placeable probe templates for the remaining test points (test points excluding the above-mentioned completely interfering test points), it is possible to distinguish between test points that meet the probe template body placement requirements and test points to be optimized.

[0086] In a specific embodiment, step 3.2 may specifically include steps 3.21 to 3.22, wherein:

[0087] Step 3.21: If there are multiple test points in the first test point group, initially, all test points in the first test point group are marked as unprocessed, and the shortest paths of all test points in the first test point group are calculated to obtain pairs of test points and the installation order of the test points.

[0088] Specifically, Kruskal shortest path calculation is performed on all test points in the first test point group to obtain pairs of test points and the installation order of the test points.

[0089] During the processing, there are three situations for a pair of test points: (1) both are test points that meet the probe template body placement requirements or both test points have been processed; (2) one is a test point that meets the probe template body placement requirements and the other is a test point to be optimized; (3) both are test points to be optimized.

[0090] In this embodiment, all placeable probe templates of unprocessed test points to be optimized are obtained to obtain a probe template list (the probe templates of each test point in the probe template list are sorted from small to large according to area). When matching the probe templates at the test points, the probe template with the smallest area is matched first in order.

[0091] Step 3.22, if the test points in the test point pair are all unprocessed test points to be optimized, then the starting test point (the starting test point in the installation sequence) is used as the first test point to be optimized, and the other one is used as the second test point to be optimized, and the initialization angle is the vertical angle of the center line connecting the first test point to be optimized and the second test point to be optimized, and execute steps 3.221 to 3.223.

[0092] Step 3.221: perform interference detection on the first test point to be optimized according to a preset simulation installation method, and update the identifier of the first test point to be optimized according to the interference detection result.

[0093] In this embodiment, the preset simulation installation method includes:

[0094] S1. Obtain the interference result of the current test point according to the first algorithm.

[0095] S2. If the interference result of step S1 is interference, the probe template of the current test point is adjusted according to the setting method, and interference detection is performed, and the identification of the current test point is updated according to the interference detection result.

[0096] The first algorithm includes: performing interference detection on the probe template of the current test point in turn with the probe templates of all test points that meet the probe template placement requirements and the simplified circular probe templates of the remaining unprocessed test points to be optimized to obtain interference results, wherein the specific method of interference detection is the interference detection algorithm described above.

[0097] In a specific embodiment, adjusting the probe template of the current test point according to a setting method and performing interference detection, and updating the identifier of the current test point according to the interference detection result may specifically include:

[0098] S2.1. After rotating and adjusting the probe template body of the current test point at a preset angle, obtain the interference result of the current test point according to the first algorithm.

[0099] Preferably, the preset angles are 0 degrees, 90 degrees, 180 degrees and 270 degrees.

[0100] S2.2 If the interference result of step S2.1 is that no interference occurs, the current test point is processed according to the fourth algorithm, and the identifier of the current test point is updated according to the processing result of the fourth algorithm.

[0101] S2.3. If the interference result of step S2.1 is that interference occurs, the current test point is processed according to the second algorithm to obtain the interference result of the current test point.

[0102] S2.4. If the interference result of the current test point is no interference after step S2.3, the current test point is processed according to the fourth algorithm, and the identification of the current test point is updated according to the processing result of the fourth algorithm.

[0103] S2.5. If, after step S2.3, the interference result of the current test point is that interference occurs, the identification of the current test point is updated.

[0104] The second algorithm includes: performing rotation adjustment and interference detection on the probe template body of the current test point from the initial angle at the first step length angle to obtain the interference result of the current test point.

[0105] The fourth algorithm includes: determining whether to continue adjusting the probe template body of the current test point according to the relationship between the device height H and the probe height AF of the probe template body of the current test point, so as to update the identifier of the current test point according to the adjustment result.

[0106] In this embodiment, the second algorithm may specifically include: starting from the initial angle, rotating and adjusting the probe template body of the current test point at a first step angle, and repeating the first algorithm after each rotation. If interference still occurs after rotating 360 degrees, it is determined that the current test point does not meet the placement requirements of the probe template body. The identifier of this current test point remains as a test point to be optimized and is marked as a processed test point to be optimized. If interference does not occur at a certain angle, save this angle and execute the fourth algorithm. If interference still occurs after being processed by the fourth algorithm, start from the saved angle of the probe template body of the current test point and continue to execute the third algorithm.

[0107] The third algorithm includes: rotating and adjusting the probe template body of the current test point at a second step angle and repeating the first algorithm after each rotation. If interference still occurs after rotating 360 degrees, it is determined that the current test point does not meet the placement requirements of the probe template body. The identifier of this current test point remains as a test point to be optimized and is marked as a processed test point to be optimized. If interference does not occur at a certain angle, save this angle and continue to execute the fourth algorithm.

[0108] The fourth algorithm may specifically include: judging the relationship between the device height H and the penetration height AF of the probe template body of the current test point. If H < AF, update the identifier of the current test point to a test point that meets the placement requirements of the probe template body and mark it as processed, and set the current angle as the installation angle of the current test point. If H ≥ AF, calculate the shortest distance between the probe template body of the current test point and the device. If the shortest distance is less than or equal to the preset safety distance, continue to execute the third algorithm on the probe template body of the current test point based on the current angle. If, after being processed by the third algorithm, the shortest distance is still less than or equal to the preset safety distance, the current test point does not meet the placement requirements of the probe template body. The identifier of the current test point remains as a test point to be optimized and is marked as a processed test point to be optimized. If the shortest distance is greater than the preset safety distance, update the identifier of the current test point to a test point that meets the placement requirements of the probe template body and mark it as processed, and set the current angle as the installation angle of the current test point.

[0109] S3. If the interference result in step S1 is no interference, process the current test point according to the above fourth algorithm and update the identifier of the current test point according to the processing result of the fourth algorithm.

[0110] Step 3.222. After determining the identifier of the first test point to be optimized, perform interference detection on the second test point to be optimized according to the above preset simulation installation method, and update the identifier of the second test point to be optimized according to the interference detection result.

[0111] In this embodiment, the processing method of the second test point to be optimized is the same as the processing method of the first test point to be optimized. Through the above preset simulation installation method, the identification and installation angle of the first test point to be optimized and the second test point to be optimized can be obtained.

[0112] Step 3.223: perform interference detection again according to the identifier of the first test point to be optimized and the identifier of the second test point to be optimized, and update the identifiers of the first test point to be optimized and the second test point to be optimized according to the interference detection result.

[0113] If the second test point to be optimized is identified as a test point to be optimized, that is, the second test point to be optimized does not meet the test point requirements for probe template body placement, and at the same time, the first test point to be optimized is identified as a test point that meets the probe template body placement requirements, then the first test point to be optimized is executed with the third algorithm and the fourth algorithm. Afterwards, if the identification of the first test point to be optimized is still a test point that meets the probe template body placement requirements, then continue to execute steps 3.222 and 3.223 under the identification of this test point. If the first test point to be optimized does not meet the probe template body placement requirements, then select an identification and angle that meets the probe template body placement requirements (that is, any identification and angle that meets the requirements before) as the identification and installation angle of the first test point to be optimized, and the identification of the second test point to be optimized is still the test point to be optimized and is marked as a processed test point to be optimized;

[0114] If the identification of the second test point to be optimized is a test point that meets the probe template body placement requirements, the identification and angle of the second test point to be optimized at this time are used as the identification and installation angle of the second test point to be optimized, and marked as processed.

[0115] Step 3.23, if one of the two test points in the test point alignment is an unprocessed test point to be optimized and the other is a processed test point to be optimized, the initialization angle is 0 degrees, and interference detection is performed according to the preset simulation installation method described above. The identification of the unprocessed test point to be optimized is updated according to the interference detection result, and it is marked as processed.

[0116] Step 3.24, if one of the test points is a test point to be optimized and the other is a test point that meets the placement requirements of the probe template body: when the test point to be optimized is a processed test point to be optimized, no judgment is required; when the test point to be optimized is an unprocessed test point to be optimized, the initialization angle is the installation angle of the test point that meets the placement requirements of the probe template body, and interference detection is performed according to the preset simulation installation method described above, and the identification of the unprocessed test point to be optimized is updated according to the interference detection result, and it is marked as processed.

[0117] Step 3.25: If both test points in the test point alignment meet the probe template body placement requirements or both test points have been processed, no judgment is required.

[0118] After the above processing, the status of the two test points in the test point pair is set to processed. If the test point to be optimized meets the placement requirements of the probe template body, it is identified as a test point that meets the placement requirements of the probe template body and added to the test point group that meets the placement requirements of the probe template body. If it does not meet the placement requirements, it is still a test point to be optimized.

[0119] Step 3.26: If there is only one test point in the first test point group, the initialization angle is 0 degrees, and interference detection is performed according to the preset simulation installation method, and the identification of the test point is updated according to the interference detection result. At this time, there is no need to mark the test point as processed or unprocessed.

[0120] Step 3.3: adjust the remaining test points to be optimized in the second test point group to perform interference detection with the probe templates of all test points that meet the probe template body placement requirements, and update the identification of the remaining test points to be optimized according to the interference detection results.

[0121] Specifically, this embodiment also needs to optimize and adjust the remaining test points to be optimized after the above steps are executed, determine whether each test point to be optimized still interferes with all test points that meet the probe template body placement requirements after adjustment, and determine the final identification of the remaining test points to be optimized based on whether interference occurs.

[0122] In a specific embodiment, step 3.3 may specifically include steps 3.31 to 3.32, wherein:

[0123] Step 3.31, rotating the probe template body of the current test point to be optimized from 0 degrees to 360 degrees at a third step angle, and repeatedly executing the fifth algorithm after each rotation, if no interference occurs, executing the sixth algorithm to obtain the interference quantity;

[0124] Step 3.32: If the number of interferences is 0, the identifier of the currently to-be-optimized test point is a test point that meets the placement requirements of the probe template body, and the identifier and angle of the currently to-be-optimized test point at this time are used as the identifier and installation angle of the currently to-be-optimized test point. After excluding the test points where the probe template body cannot rotate, take the test point P that meets the placement requirements of the probe template body and interferes with the probe template body of the currently to-be-optimized test point when the last interference number before the change in the interference number is 1. Rotate the probe template body of the test point P within the range of ±90° of its installation angle at the fourth step angle and does not interfere with the currently to-be-optimized test point. At the same time, execute the fifth algorithm and the sixth algorithm (regardless of the order) for the test point P. If there is no interference, record the angles of the test point P that meets the placement requirements of the probe template body and the currently to-be-optimized test point respectively, and update the identifier of the currently to-be-optimized test point to a test point that meets the placement requirements of the probe template body, and use the angle of the test point P and the angle of the currently to-be-optimized test point at this time as their respective installation angles. If there is interference, restore the original installation angle of the test point P, then the currently to-be-optimized test point does not meet the placement requirements of the probe template body, and the identifier of the currently to-be-optimized test point remains the to-be-optimized test point, and mark the currently to-be-optimized test point as interfered (the to-be-optimized test point here can be manually adjusted).

[0125] In this embodiment, the fifth algorithm includes: judging the relationship between the device height H and the downward probing height AF of the probe template body of the current test point. If H < AF, there is no interference. If H ≥ AF, calculate the shortest distance between the probe template body of the current test point and the device. If the shortest distance is less than or equal to the preset safety distance, there is interference. If the shortest distance is greater than the preset safety distance, there is no interference.

[0126] The sixth algorithm includes: using the above-mentioned interference detection algorithm to detect the interference between the probe template of the current test point and the probe templates of all test points that meet the probe template placement requirements in turn.

[0127] Step 4: Obtain a probe template list according to the associated probe template, and judge whether the test point that meets the placement requirements of the probe template body is a preset test point (the preset test point is a test point that is sensitive to cost, that is, a test point with a higher cost). If so, judge whether to replace the current probe template with other probe templates according to the sorting in the probe template list, and perform interference inspection on the replaced probe template using the above-mentioned preset simulation installation method. If the requirements are met, replace it. If the requirements are not met, do not replace it.

[0128] Specifically, if there are multiple probe templates associated with a test point, the probe template list is sorted from small to large according to the area of ​​the probe template. Therefore, when the test point is a cost-sensitive test point, it can be replaced according to the sorting in the probe template list to reduce costs.

[0129] Step 5. Assemble the probe template according to the installation angle for the test points that meet the placement requirements of the probe template body; on the basis of installing the probe template body (the probe template body is equipped with an assembly piece), first install the assembly piece at 0 degrees relative to the probe template body. If interference occurs, install the assembly piece at an angle between -90 degrees and 90 degrees relative to the probe template body. If interference still occurs, mark the interference status of the assembly piece. If no interference occurs, set this angle as the installation angle of the assembly piece.

[0130] Specifically, a probe template is selected according to the probe type of the test point, and a probe template body and an assembly sheet are placed on the test point according to the installation position and installation angle of the test point.

[0131] In addition, the probe template body is installed according to the installation angle determined in the above steps. On the basis of installing the probe template body, the assembly piece is installed. When installing the assembly piece, it is preferred to install the assembly piece at 0 degrees relative to the probe template body (that is, it is installed at the same angle as the probe template body). If interference occurs, it is assembled at -90 degrees to 90 degrees relative to the probe template body (during adjustment of the assembly piece, it can be used in the range of -90 to 90 degrees relative to the body, with smaller angles being preferred. The smaller the angle relative to the body, the more stable it is). If interference still occurs, the interference status of the assembly piece is marked, and this probe template is highlighted when outputting the assembly drawing. If no interference occurs, the angle of the assembly piece at this time is recorded, and it is set as the installation angle of the assembly piece of this probe template.

[0132] Step 6: Output assembly report

[0133] An assembly report is output according to the updated interference status, and the assembly report includes information such as an assembly drawing, interference conditions, and a rotation angle of a probe template.

[0134] The present invention can automatically read the test point information and the probe template information: the test point information includes the test point installation position, the test point probe type, etc., and in combination with the test point installation position, the probe type and the probe template, the probe template is automatically assembled and detected according to the installation angle and the installation position, thereby realizing the automatic design of the probe tooling; the present invention can realize automatic detection: after the probe template is assembled according to the installation angle and the test point installation position, it is automatically determined whether there is assembly interference, and an assembly report is output; the present invention can provide a probe template selection scheme, automatically analyze whether there is assembly interference of the "tooling head" of each test point, and there is no need to manually select the probe template for adjustment each time, which solves the tedious steps of adjusting the angle each time the probe template is placed, and simplifies the operation logic; the method for automating the probe tooling design provided by the present invention can effectively shorten the cycle of probe tooling design and production.

[0135] Embodiment 2

[0136] This embodiment further provides a specific method for automatic design of probe tooling based on the above embodiment, the method comprising:

[0137] 1. Get the test point information.

[0138] The installation surfaces of test points P0, P1, P2, P3, P4, P5, P6, P7, and P8 are all BOTTOM surfaces, so the front and back properties of the test points are: Group = 1;

[0139] The probe types of test points P0, P1, P2, P3, P5, P6, and P7 are all RF, the body flag type is 1, and the type is rotatable; the test point names (bit numbers) are: P0: RN800, P1: RN801, P2: RN802, P3: RN803, P5: RN805, P6: RN806, P7: RN807;

[0140] The test point installation positions are: ((P0(10,30), P1(10,27), P2(12,25), P3(18,20), P5(28,15), P6(43,20), P7(50,20));

[0141] The probe type of test point P4 is BTB; the body flag type is 2, non-rotatable type; the test point installation position is P4 (25, 25), and the test point name (bit number) is Q1205;

[0142] The probe type of test point P8 is TP; the body flag type is 0, circular type; the test point installation position is P8 (38, 30), and the test point name (bit number) is TP301;

[0143] Initialize the probe template list to be empty.

[0144] 2. Get template information.

[0145] 1. Figure 3 The probe template is a polygonal probe template, and the applicable probe types are BTB and RF. The probe depth of this type of probe template is AF = 1.5mm; 2. Figure 6 The probe template is a circular probe template, and the applicable probe type is TP. This type of probe template has no penetration depth; 3: Figure 5 The probe template with assembly sheet is applicable to the probe types of RF and CA. The probing depth of this type of probe template is AF=1.5mm.

[0146] 3. Read component information.

[0147] Component position number U1; component height is 2.5mm;

[0148] Front and back properties: The component is located on the BOTTOM surface, and the coordinates of the component dimensions are rectangle Rect, lower left coordinate RP1 (19.5, 19.5), upper right coordinate RP2 (24.3, 21), center coordinate RC1 (22, 19.9), and the installation angle is horizontal 0°.

[0149] 4. Associate test points with probe templates.

[0150] P8: Match the circular probe template, the probe template list is TP, obtain the center distance from P8 to each test point, and the nearest center distance is P8->P6, the distance is 11.18mm>79mils, and the probe template for the installed test point is Figure 6 50mil, 75mil or 100mil round needle blocks;

[0151] P4: Matching Figure 3 The polygonal probe template of the probe template list is BTB;

[0152] The rest of the test points match Figure 5 The probe template with assembly piece, the probe template list is (RF,CA).

[0153] 5. The probe template body is automatically placed to simplify template interference judgment.

[0154] (i) Completely interfering test points are screened out by installing simplified circular probe templates on all test points, and these completely interfering test points are added to the completely interfering test point group.

[0155] The probe templates matched with P4 and P8 are non-rotatable probe templates. The probe template body is obtained and installed at a fixed angle. The circular probe templates with the minimum interference distance as the radius are assembled for the remaining test points (such as Figure 8As shown), and perform interference detection on the probe templates of all test points or the simplified circular probe templates in pairs, and record the number of interferences at each test point: at this time, P0, P1 and P2 all have interferences, and the number of interferences of P0, P1 and P2 are 1, 2, and 1 respectively. Sort the test points with interferences from most to least according to the number of interferences, record and remove the test point P1 with the largest number of interferences, and refresh the number of interferences of the remaining test points. If the remaining test points still have interferences, repeat this step until no interference occurs; add the test point P1 with recorded interference to the complete interference test point group, and P1 is marked as a complete interference test point. Add the test points P4 and P8 with no interference and non-rotatable probe templates to the test point group that meets the placement requirements of the probe template body, and the marks of P4 and P8 are both test points that meet the placement requirements of the probe template body.

[0156] (ii) Install placeable probe templates for the remaining test points (i.e., P0, P2, P3, P4, P5, P6, P7, and P8) to distinguish between test points that meet the placement requirements of the probe template body and test points to be optimized.

[0157] 1. If there are multiple test points remaining, mark all remaining test points as unprocessed.

[0158] like Fig. 9 As shown, the shortest path calculation is performed according to the Kruskal algorithm, and the installation order of each test point is obtained as follows: (P0->P2, P6->P7, P2->P3, P3->P4, P4->P5, P8->P6, P5->P8).

[0159] Get all the probe templates that can be placed for the unprocessed test points to be optimized, and get the probe template list. The identifiers of P4 and P8 are test points that meet the requirements of probe template body placement. The P4 probe template list is BTB, the P8 probe template list is TP, and the remaining test point probe template list is (RF, CA).

[0160] 1.1. Take a pair of test points in turn for judgment:

[0161] 1.2. Take P0->P2. Both test points are unprocessed test points to be optimized. Fig.10 As shown, the two test point probe template bodies are installed at a vertical angle to the center line of the two test points. The coordinates of the center points are P0 (10, 30) and P2 (12, 25), and the slope of the line is:

[0162]

[0163] The vertical slope is K2*K=-1; from K2=tanα=0.4, the installation angle is obtained to be α=arctan(0.4)=21.8°.

[0164] Among them, when the slope does not exist, the connecting line is the y-axis, and the vertical angle of the connecting line is α=0°; when the slope is 0, the connecting line is the x-axis, and the connecting angle is α=90°.

[0165] 1.21. Perform interference detection on the first test point P0 to be optimized, and perform interference detection on P0 and the probe templates of all test points that meet the probe template body placement requirements and the simplified circular probe templates of the remaining unprocessed test points to be optimized. No interference occurs to P0;

[0166] 1.22. Execute the distance judgment with the surrounding devices, traverse all device heights, U1 height 2.5mm>AF (1.5mm), based on the boost function, judge that the distance between P0 and U1 is Dis=21.36mm: at this time, the distance Dis>7mm, which is greater than the preset safety distance, then P0 is marked as a test point that meets the probe template body placement requirements.

[0167] 1.23. The same judgment method as the first test point to be optimized is performed on the second test point to be optimized; at this time, P2 is identified as a test point that meets the probe template body placement requirements, and the installation angles of P0 and P2 are saved respectively, both of which are 21.8°, and the status of P0 and P2 is set to processed.

[0168] 1.3. Perform the same judgment steps for P6 and P7 as for P0 and P2, and obtain the installation angles of P6 and P7, which are both 90°. The identifications of P6 and P7 are both test points that meet the requirements for the placement of the probe template body, and the status is set to processed.

[0169] 1.4. Process P2->P3. P3 is the test point to be optimized. P2 is the test point that meets the probe template body placement requirements and is a processed test point. No judgment is required. The initialization angle of P3 is the installation angle of P2, 21.8° (e.g. Fig.11 Based on initialization angle adjustment).

[0170] 1.41. Perform interference detection on P3 and all probe templates that meet the probe template placement requirements and the simplified circular probe templates of the remaining unprocessed test points to be optimized. P3 is found to have no interference.

[0171] 1.42. Execute the distance judgment with the surrounding devices, traverse all the device heights, U1 height 2.5mm>AF(1.5mm), and judge that the distance between P3 and U1 is Dis<0, that is, P3 and U1 interfere with each other.

[0172] 1.43. Rotate P3 from the current angle of 21.8° in a step of 1°, and perform 1.41 and 1.42 judgments again until no interference occurs after 89 steps of rotation.

[0173] 1.44. Save the P3 angle at this time as (21.8°+89°=110.8°), mark it as a test point that meets the probe template body placement requirements, and set the status to processed.

[0174] 1.5. Process P3 and P4. At this time, the identifications of P3->P4 are all test points that meet the placement requirements of the probe template body and are set as processed test points without judgment.

[0175] 1.6. According to the above steps, the P5 installation angle is 74.8°, which is marked as a test point that meets the probe template body placement requirements and the status is processed.

[0176] 6. For the probe templates of test points that are more cost-sensitive, use the current installation angle and other parameters to replace the probe templates according to the probe template list, and then perform interference check according to the above steps. If it does not meet the requirements, do not replace it. If it meets the requirements, replace it. For example, for P8, the above installed probe template is 50mil, and the replaceable probe template is a 75mil or 100mil round needle block. After the interference detection in the above steps, the probe template is finally selected as 100mil.

[0177] 7. Install the probe template at the test point that meets the probe template body placement requirements

[0178] In step 5, install the probe template body according to the determined installation angle (the body installation angle is as follows Fig.12 ), on the basis of installing the probe template body, install the assembly piece. When installing the assembly piece, it is preferred to assemble it at 0 degrees relative to the probe template body. If interference occurs, it is assembled at -90 degrees to 90 degrees relative to the probe template body. If interference still occurs, the interference state of the assembly piece is marked. When outputting the assembly drawing, this probe template is highlighted; the installation angles of the test point assembly pieces that meet the placement requirements of the probe template body are P0 (0°, 0°), P2 (0°, 0°), P3 (90°, 0°), P5 (0°, 0°), P6 (0°, 0°), and P7 (0°, 0°), respectively, and the assembly report is obtained: the final assembly drawing is as follows: Fig.13 As shown, the RN801 test point is interference.

[0179] Embodiment 3

[0180] See also Fig.14 , Fig.14 1 is a schematic diagram of a system for automatic design of a probe tooling provided by an embodiment of the present invention. The system for automatic design of a probe tooling includes:

[0181] An acquisition module, used to acquire test point information, wherein the test point information at least includes a probe type of the test point and an installation position of the test point;

[0182] an associating module, configured to associate the test point with a probe template based on the probe type of the test point;

[0183] An installation angle determination module simulates the installation of an associated probe template, is used to perform interference detection on all the test points, and updates the identification of the test points according to the interference detection results, so as to determine the installation angle of the probe template according to the identification of the test points, wherein the identification of the test points includes completely interfering test points, test points that meet the placement requirements of the probe template body, and test points to be optimized; the initial identification of all the test points is the test points to be optimized;

[0184] An assembly module is used to assemble the probe template according to the installation angle and the installation position of the test point that meets the placement requirement of the probe template body.

[0185] The system for automatic design of probe tooling provided in this embodiment can execute the above method embodiments, and its implementation principles and technical effects are similar, which will not be repeated here.

[0186] Embodiment 4

[0187] See also Fig.15 , Fig.15 1 is a schematic diagram of the structure of an electronic device provided in this embodiment. The electronic device 1100 includes: a processor 1101, a communication interface 1102, a memory 1103 and a communication bus 1104, wherein the processor 1101, the communication interface 1102 and the memory 1103 communicate with each other through the communication bus 1104;

[0188] A memory 1103, used for storing computer programs;

[0189] The processor 1101 is configured to implement the above method steps when executing a computer program.

[0190] When the processor 1101 executes the computer program, some or all of the method steps in the above embodiments are implemented.

[0191] The electronic device provided by the embodiment of the present invention can execute the above method embodiment, and its implementation principle and technical effect are similar, which will not be repeated here.

[0192] Embodiment 5

[0193] This embodiment provides a computer-readable storage medium on which a computer program is stored. When the computer program is executed by a processor, part or all of the method steps in the above embodiments are implemented.

[0194] The computer-readable storage medium provided in the embodiment of the present invention can execute the above method embodiment, and its implementation principle and technical effect are similar, which will not be repeated here.

[0195] Those skilled in the art will appreciate that the embodiments of the present application may be provided as methods, devices (equipment), or computer program products. Therefore, the present application may adopt the form of a complete hardware embodiment, a complete software embodiment, or an embodiment in combination with software and hardware, which are collectively referred to as "modules" or "systems" herein. Moreover, the present application may adopt the form of a computer program product implemented on one or more computer-readable storage media (including but not limited to disk storage, CD-ROM, optical storage, etc.) containing computer-usable program codes. The computer program is stored / distributed in a suitable medium, provided together with other hardware or as a part of hardware, or may adopt other distribution forms, such as by the Internet or other wired or wireless telecommunication systems.

[0196] In the description of the present invention, it should be understood that the terms "first" and "second" are used for descriptive purposes only and cannot be understood as indicating or implying relative importance or implicitly indicating the number of technical features indicated. In the description of the present invention, the meaning of "plurality" is two or more, unless otherwise clearly and specifically defined.

[0197] In the description of this specification, the description with reference to the terms "one embodiment", "some embodiments", "example", "specific example", or "some examples" means that the specific features, structures or characteristics described in conjunction with the embodiment or example are included in at least one embodiment or example of the present invention. In this specification, the schematic representation of the above terms does not necessarily refer to the same embodiment or example. Moreover, the specific features, structures or characteristics described can be combined in any one or more embodiments or examples in a suitable manner.

[0198] The above contents are further detailed descriptions of the present invention in combination with specific preferred embodiments, and it cannot be determined that the specific implementation of the present invention is limited to these descriptions. For ordinary technicians in the technical field to which the present invention belongs, several simple deductions or substitutions can be made without departing from the concept of the present invention, which should be regarded as falling within the protection scope of the present invention.

Claims

1. A method for automatic design of probe tooling, characterized in that: include: Step 1: Acquire test point information, wherein the test point information at least includes the probe type of the test point and the installation position of the test point; Step 2: Associating the test point with a probe template based on the probe type of the test point; Step 3, simulating the installation of the associated probe template, performing interference detection on all the test points, and updating the identification of the test points according to the interference detection results, so as to determine the installation angle of the probe template according to the identification of the test points, wherein the identification of the test points includes completely interfering test points, test points that meet the placement requirements of the probe template body, and test points to be optimized; the initial identification of all the test points is the test points to be optimized; Step 4: Assemble the probe template according to the installation angle and the installation position of the test point for the test point that meets the placement requirement of the probe template body.

2. The method for automatic design of probe tooling according to claim 1, characterized in that: The step 3 comprises: Step 3.1, installing a preset probe template for the test point according to the rotation characteristics of the probe template matched by the test point to obtain a complete interference test point and a test point that meets the placement requirements of the probe template body, adding the complete interference test point to a complete interference test point group, and taking the test points other than the complete interference test point group as a first test point group, the first test point group including test points to be optimized and / or test points that meet the placement requirements of the probe template body, wherein the preset probe template includes a test point probe template that is a non-rotatable probe template and a simplified circular probe template installed when the test point probe template is rotatable, the simplified circular probe template being a circular probe template obtained with a minimum interference distance as a radius; Step 3.2, performing interference detection on the probe template of the test point in the first test point group and the probe template of the other test points to obtain a second test point group, wherein the second test point group includes the remaining test points to be optimized and / or the test points that meet the placement requirements of the probe template body; Step 3.3: adjust the remaining test points to be optimized in the second test point group to perform interference detection with all probe templates that meet the probe template body placement requirements, and update the identification of the remaining test points to be optimized according to the interference detection results.

3. The method for automatic design of probe tooling according to claim 2, characterized in that: The step 3.1 comprises: Step 3.11, determine whether the probe template matched by the current test point can be rotated, if not, install the matched probe template for the current test point, if yes, install the simplified circular probe template for the current test point, so as to perform interference detection on the preset probe templates of all test points in pairs, obtain the interference number of each test point, and sort the test points with interference from most to least according to the interference number; Step 3.12, remove the test point with the largest number of interferences, and refresh the number of interferences of the remaining test points after the removal. If the preset probe templates of the remaining test points still have interferences, continue to remove the test point with the largest number of interferences until the preset probe templates of the remaining test points no longer interfere. Then, the identifiers of all removed test points are updated to completely interfering test points, and the identifiers of test points where no interference occurs and the probe template is non-rotatable are updated to test points that meet the placement requirements of the probe template body. The identifiers of test points where no interference occurs and the probe template is rotatable are still test points to be optimized.

4. The method for automatic design of probe tooling according to claim 2, characterized in that: The step 3.2 comprises: Step 3.21: If there are multiple test points in the first test point group, initially, all the test points in the first test point group are marked as unprocessed, and the shortest paths of all the test points in the first test point group are calculated to obtain pairs of test points and the installation order of the test points; Step 3.22, if all the test points in the test point pair are unprocessed test points to be optimized, the starting test point is used as the first test point to be optimized, and the other one is used as the second test point to be optimized, and the initialization angle is the vertical angle of the center line connecting the first test point to be optimized and the second test point to be optimized, and steps 3.221 to 3.223 are executed; Step 3.221, performing interference detection on the first test point to be optimized according to a preset simulation installation method, and updating the identification of the first test point to be optimized according to the interference detection result; Step 3.222: after determining the identifier of the first test point to be optimized, perform interference detection on the second test point to be optimized according to the preset simulated installation method, and update the identifier of the second test point to be optimized according to the interference detection result; Step 3.223: Perform interference detection again according to the identifier of the first test point to be optimized and the identifier of the second test point to be optimized, and update the identifiers of the first test point to be optimized and the second test point to be optimized according to the interference detection result.

5. The method for automatic design of probe tooling according to claim 4, characterized in that: The preset simulation installation method comprises: S1. Obtain the interference result of the current test point according to the first algorithm; S2. If the interference result of step S1 is interference, adjusting the probe template of the current test point according to a setting method, performing interference detection, and updating the identifier of the current test point according to the interference detection result; The first algorithm includes: performing interference detection on the probe template of the current test point in sequence with the probe templates of all test points that meet the probe template placement requirements and the simplified circular probe templates of the remaining unprocessed test points to be optimized to obtain interference results.

6. The method for automatic design of probe tooling according to claim 5, characterized in that: The step of adjusting the probe template of the current test point according to a set method, performing interference detection, and updating the identifier of the current test point according to the interference detection result includes: S2.1, after rotating and adjusting the probe template body of the current test point at a preset angle, obtain the interference result of the current test point according to the first algorithm; S2.2 If the interference result of step S2.1 is that no interference occurs, the current test point is processed according to the fourth algorithm, and the identifier of the current test point is updated according to the processing result of the fourth algorithm; S2.3, if the interference result of step S2.1 is interference, processing the current test point according to the second algorithm to obtain the interference result of the current test point; S2.4, if the interference result of the current test point is no interference after step S2.3, the current test point is processed according to the fourth algorithm, and the identifier of the current test point is updated according to the processing result of the fourth algorithm; S2.

5. If, after step S2.3, the interference result of the current test point is interference, then update the identifier of the current test point; And after step S1, it also includes: S3, if the interference result of step S1 is that no interference occurs, processing the current test point according to the fourth algorithm, and updating the identifier of the current test point according to the processing result of the fourth algorithm; The second algorithm includes: obtaining the interference result of the current test point by rotating and adjusting the probe template body of the current test point at a first step angle from an initial angle and performing interference detection; The fourth algorithm includes: determining whether to continue adjusting the probe template body of the current test point according to the relationship between the device height H and the probe height AF of the probe template body of the current test point, so as to update the identifier of the current test point according to the adjustment result.

7. The method for automatic design of probe tooling according to claim 6, characterized in that: The second algorithm specifically includes: starting from the initialization angle, the probe template body of the current test point is rotated and adjusted at the first step length angle and the first algorithm is repeatedly executed after each rotation; if interference still occurs after rotating 360 degrees, the current test point is still identified as a test point to be optimized and marked as a processed test point to be optimized; if no interference occurs at a certain angle, this angle is saved and the fourth algorithm is executed; if interference still occurs after being processed by the fourth algorithm, the probe template body of the current test point is started from the saved angle and the third algorithm is continued to be executed; The third algorithm includes: rotating and adjusting the probe template body of the current test point at a second step angle and repeatedly executing the first algorithm after each rotation; if interference still occurs after rotating 360 degrees, the current test point is still identified as a test point to be optimized and marked as a processed test point to be optimized; if no interference occurs at a certain angle, the angle is saved and the fourth algorithm is continued to be executed; The specific fourth algorithm includes: determining the relationship between the device height H and the probing height AF of the probe template body at the current test point. If H < AF, update the identification of the current test point to a test point that meets the probe template body placement requirements and mark it as processed, and set the current angle as the installation angle of the current test point. If H ≥ AF, calculate the closest distance between the probe template body of the current test point and the device. If the closest distance is less than or equal to the preset safety distance, continue to execute the third algorithm on the probe template body of the current test point based on the current angle. If after being processed by the third algorithm, the closest distance is still less than or equal to the preset safety distance, the identification of the current test point remains as a test point to be optimized and is marked as a processed test point to be optimized. If the closest distance is greater than the preset safety distance, update the identification of the current test point to a test point that meets the probe template body placement requirements and mark it as processed, and set the current angle as the installation angle of the current test point.

8. The method for automatic design of probe tooling according to any one of claims 4 to 7, characterized in that: If there are multiple test points in the first test point group, after step 3.21, it further includes: If one of the two test points in the test point pair is an unprocessed test point to be optimized and the other is a processed test point to be optimized, initialize the angle to 0 degrees, perform interference detection according to the above-mentioned preset simulation installation method, update the identification of the unprocessed test point to be optimized according to the interference detection result, and mark it as processed; If one of the test point pair is a test point to be optimized and the other is a test point that meets the probe template body placement requirements: when the test point to be optimized is a processed test point to be optimized, no judgment is required; when the test point to be optimized is an unprocessed test point to be optimized, initialize the angle to the installation angle of the test point that meets the probe template body placement requirements, perform interference detection according to the above-mentioned preset simulation installation method, update the identification of the unprocessed test point to be optimized according to the interference detection result, and mark it as processed; If both of the two test points in the test point pair are test points that meet the probe template body placement requirements or both test points are processed, no judgment is required.

9. The method for automatic design of probe tooling according to any one of claims 4 to 7, characterized in that: Step 3.2 further includes: If there is only one test point in the first test point group, initialize the angle to 0 degrees, perform interference detection according to the preset simulation installation method, and update the identification of the test point according to the interference detection result.

10. The method for automatic design of probe tooling according to claim 7, characterized in that: Step 3.223 includes: If the identifier of the second test point to be optimized is the test point to be optimized, and at the same time the identifier of the first test point to be optimized is the test point that meets the probe template body placement requirements, then execute the third algorithm and the fourth algorithm on the first test point to be optimized. If the identifier of the first test point to be optimized is still the test point that meets the probe template body placement requirements, then continue to execute according to Step 3.222 and Step 3.223 under this test point identifier. If the first test point to be optimized does not meet the probe template body placement requirements, then select an identifier and angle that meet the probe template body placement requirements as the identifier and installation angle of the first test point to be optimized, and the identifier of the second test point to be optimized is still the test point to be optimized and is marked as the processed test point to be optimized; If the identifier of the second test point to be optimized is the test point that meets the probe template body placement requirements, then use the identifier and angle of the second test point to be optimized at this time as the identifier and installation angle of the second test point to be optimized, and mark it as processed.

11. The method for automatic design of probe tooling according to claim 2, characterized in that: Step 3.3 includes: Step 3.31: Rotate the probe template body of the current test point to be optimized from 0 degrees to 360 degrees at the third step angle, and repeat the execution of the fifth algorithm after each rotation. If there is no interference, then execute the sixth algorithm to obtain the interference quantity; Step 3.32: If the interference quantity is 0, then the identifier of the current test point to be optimized is the test point that meets the probe template body placement requirements, and use the identifier and angle of the current test point to be optimized at this time as the identifier and installation angle of the current test point to be optimized; after excluding the test points where the probe template body cannot rotate, take the last interference quantity of 1 before the change in the interference quantity and the test point P that meets the probe template body placement requirements and interferes with the probe template body of the current test point to be optimized. Rotate the probe template body of the test point P at the fourth step angle within the range of ±90° of its installation angle and does not interfere with the current test point to be optimized. At the same time, execute the fifth algorithm and the sixth algorithm on the test point P. If there is no interference, then update the identifier of the current test point to be optimized to the test point that meets the probe template body placement requirements, and use the angle of the test point P and the angle of the current test point to be optimized at this time as their respective installation angles. If there is interference and restore the original installation angle of the test point P, then the identifier of the current test point to be optimized is still the test point to be optimized; The fifth algorithm includes: judging the relationship between the device height H and the probing height AF of the probe template body of the current test point. If H < AF, then there is no interference. If H ≥ AF, then calculate the closest distance between the probe template body of the current test point and the device. If the closest distance is less than or equal to the preset safety distance, then there is interference. If the closest distance is greater than the preset safety distance, then there is no interference; The sixth algorithm includes: performing interference detection on the probe template of the current test point in turn with the probe templates of all test points that meet the probe template placement requirements.

12. The method for automatic design of probe tooling according to claim 1, characterized in that: After step 3, the method further includes: A probe template list is obtained based on the associated probe template, and it is determined whether the test point that meets the placement requirements of the probe template body is a preset test point. If so, it is determined whether other probe templates should replace the current probe template according to the order in the probe template list, and an interference check is performed on the replaced probe template. If the requirements are met, it is replaced; if not, it is not replaced.

13. The method for automatic design of probe tooling according to claim 1, characterized in that: The step 4 also includes: On the basis of installing the probe template body, first install the assembly piece at 0 degrees relative to the probe template body. If interference occurs, install the assembly piece at an angle between -90 degrees and 90 degrees relative to the probe template body. If interference still occurs, mark the interference status of the assembly piece. If no interference occurs, set this angle as the installation angle of the assembly piece.

14. A system for automatic design of probe tooling, characterized in that: include: An acquisition module, used to acquire test point information, wherein the test point information at least includes a probe type of the test point and an installation position of the test point; an associating module, configured to associate the test point with a probe template based on the probe type of the test point; An installation angle determination module simulates the installation of the associated probe template, is used to perform interference detection on all the test points, and updates the identification of the test points according to the interference detection results, so as to determine the installation angle of the probe template according to the identification of the test points, wherein the identification of the test points includes completely interfering test points, test points that meet the placement requirements of the probe template body, and test points to be optimized; the initial identification of all the test points is the test points to be optimized; An assembly module is used to assemble the probe template according to the installation angle and the installation position of the test point that meets the placement requirement of the probe template body.

15. An electronic device, characterized in that: It includes a processor, a communication interface, a memory and a communication bus, wherein the processor, the communication interface and the memory communicate with each other through the communication bus; Memory for storing computer programs; A processor, configured to implement the method according to any one of claims 1 to 13 when executing the computer program.

16. A storage medium, characterized in that: The storage medium stores a computer program, and when the computer program is executed by a processor, the method according to any one of claims 1 to 13 is implemented.

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