A BOB testing system and testing method

Abstract

The present invention discloses a BOB test system, which includes a control unit, an error code tester unit, an optical line terminal, an optical splitter, an attenuator, an ONU optical port, a photodetector and an analog-to-digital converter; the error code tester unit receives a control signal of a specified code pattern and rate sent by the control unit to generate an optical signal of the corresponding code pattern and rate and sends it to the optical line terminal, the optical line terminal is connected to the optical splitter to realize multi-way optical splitting and is attenuated to a specified optical power through the attenuator and then accesses the ONU optical port; the ONU optical port is also connected to the photodetector, and the photodetector is connected to the analog-to-digital converter; the photodetector is used to detect the test signal and generate a signal current, and the signal current is sent to the control unit after being converted by the analog-to-digital converter. At the same time, the present invention also provides a BOB test method. The technical solution provided by the present invention improves the BOB test efficiency, has simple operation, and saves costs and equipment power consumption.

Description

Technical Field

[0001] The present invention relates to the technical field of BOB testing, and particularly to a BOB testing system and a testing method. Background Art

[0002] BOB testing is a key process in the production process of optical network terminals. Through BOB testing, it is possible to detect whether the optical power of a bi-directional optical sub-assembly (BOSA) is normal and accurate. BOB is the abbreviation of BOSA-On-Board. Conventional BOB testing is single-channel testing, with complex external wiring. It is necessary to separately configure and assemble each testing component together. Each channel of testing only realizes one-way optical power testing, and one testing station and one testing computer are configured. When performing multi-channel testing, separate configurations are required, which is complex and occupies a large space. At the same time, it is necessary to cooperate with different devices to develop testing parameters. The single-unit polling testing has low efficiency, high device power consumption, and a long cycle; multiple sets of devices have high costs and low device utilization rates. Summary of the Invention

[0003] The present invention provides a BOB testing system and a testing method, aiming to solve the problems existing in the above-mentioned BOB testing.

[0004] To achieve the above object, the present invention provides a BOB testing system, including a control unit, an error code tester unit, an optical line terminal, a splitter, an attenuator, an ONU optical port, a photodetector, and an analog-to-digital converter; the control unit, the error code tester unit, the optical line terminal, and the analog-to-digital converter are connected through an IIC bus; the error code tester unit includes an error code tester processor and a signal generator. The error code tester processor receives a control signal of a specified code pattern and rate sent by the control unit and generates an optical signal of the corresponding code pattern and rate through the signal generator; the signal generator is connected to the optical line terminal and sends the optical signal to the optical line terminal; the optical line terminal is connected to the splitter to achieve multi-channel splitting and is attenuated to a specified optical power through the attenuator and then accesses the ONU optical port; the ONU optical port is used to connect to the BOB and receive a test signal from the BOB; the ONU optical port is also connected to the photodetector, and the photodetector is connected to the analog-to-digital converter; the photodetector is used to detect the test signal and generate a signal current, and the signal current is sent to the control unit after being converted by the analog-to-digital converter.

[0005] Preferably, it further includes a digital-to-analog converter, and the digital-to-analog converter is connected to the control unit through an IIC bus; the digital-to-analog converter is connected to the attenuator to achieve control of the attenuation power of the optical signal.

[0006] Preferably, the digital-to-analog converter includes a digital-to-analog conversion chip and an operational amplifier connected to each other. The digital-to-analog conversion chip is used for digital-to-analog conversion, and the operational amplifier is used for generating a voltage signal for an attenuator to attenuate the optical signal transmitted by the optical line terminal to a specified optical power.

[0007] Preferably, the signal generator is connected to the optical line terminal through a SERDES interface.

[0008] Preferably, the analog-to-digital converter includes an analog-to-digital conversion chip and a logarithmic converter connected to each other. The logarithmic converter is used for converting a current signal into a voltage value; the analog-to-digital conversion chip is used for identifying the voltage value and converting it into a digital signal.

[0009] Preferably, it further includes a management port connected to the control unit. The control unit is connected to a host computer through the management port to achieve human-machine interconnection.

[0010] Preferably, the management port includes any one of a USB port, a wired network interface, a WIFI interface, and a Bluetooth interface.

[0011] Meanwhile, the present invention provides a BOB test method, including:

[0012] The control unit receives a test instruction sent by the host computer, and sends a control signal of a specified code pattern and rate to the error detector processor through an IIC bus, and sends an optical power original signal to the digital-to-analog converter;

[0013] The error detector processor receives the control signal and generates an optical signal of a corresponding code pattern and rate through a signal generator for the optical line terminal;

[0014] The optical line terminal realizes multi-way optical splitting through an optical splitter, and then accesses the ONU optical port after being attenuated to a specified optical power by an attenuator controlled by the digital-to-analog converter according to the original signal;

[0015] The ONU optical port receives a test signal from the BOB;

[0016] The test signal is converted by the analog-to-digital converter and sent to the control unit;

[0017] The control unit compares the received test signal with the original signal to obtain a test result.

[0018] Further, when applied to a digital-to-analog converter, it includes:

[0019] Receiving an optical power original signal sent by the control unit;

[0020] Controlling a port of the digital-to-analog conversion chip to generate an electrical signal;

[0021] The electrical signal generates a voltage signal through an operational amplifier;

[0022] Apply the voltage signal to the voltage input pin of the attenuator.

[0023] Furthermore, when applied to an analog-to-digital converter, it includes:

[0024] Receive the current signal sent by the photodetector;

[0025] The current signal is converted into a voltage value through a logarithmic converter;

[0026] Identify the voltage value through an analog-to-digital conversion chip and convert it into a digital signal;

[0027] Send the digital signal to the control unit.

[0028] The BOB test system and test method provided by the present invention, through highly integrating the BOB test platform, integrating multiple tests in a set of test systems, realizing simultaneous testing of different BOB test devices and multiple BOB test devices, saving costs, having high equipment utilization rate, small occupied space, being able to complete the testing of different devices with one host computer, being able to parallelly test multiple test devices, having high test efficiency; being easier and simpler to customize different devices, having a short development cycle; and simultaneously saving equipment power consumption. Brief Description of the Drawings

[0029] Figure 1 It is a schematic structural diagram of a BOB test system provided by an embodiment of the present invention;

[0030] Figure 2 It is a schematic flow diagram of a BOB test method provided by an embodiment of the present invention;

[0031] Figure 3 It is a schematic flow diagram of applying to a digital-to-analog converter in a BOB test method provided by an embodiment of the present invention;

[0032] Figure 4 It is a schematic flow diagram of applying to an analog-to-digital converter in a BOB test method provided by an embodiment of the present invention;

[0033] Figure 5 It is a schematic comparison diagram with a traditional test platform provided by an embodiment of the present invention.

[0034] In the figure, 10 is the control unit; 11 is the management port; 20 is the error code tester unit; 21 is the error code tester processor; 22 is the signal generator; 30 is the optical line terminal; 40 is the optical splitter; 50 is the attenuator; 60 is the ONU optical port; 70 is the photodetector; 80 is the digital-to-analog converter; 90 is the analog-to-digital converter; 100 is the IIC bus. Detailed Embodiments

[0035] In order to make the objectives, technical solutions and advantages of the present invention clearer and more understandable, the present invention will be further described in detail below with reference to the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are only used to explain the present invention and are not used to limit the present invention. All other embodiments obtained by those of ordinary skill in the art based on the embodiments of the present invention without making creative efforts fall within the scope of protection of the present invention.

[0036] Please refer to Figure 1 , an embodiment of the present invention provides a BOB test system, which specifically includes a control unit 10, an error code tester unit 20, an optical line terminal 30, an optical splitter 40, an attenuator 50, an ONU optical port 60, a photodetector 70, a digital-to-analog converter 80, and an analog-to-digital converter 90; the control unit 10, the error code tester unit 20, the optical line terminal 30, the digital-to-analog converter 80, and the analog-to-digital converter 90 are connected through an IIC bus 100; IIC refers to the Inter-Integrated Circuit bus; the error code tester unit 20 includes an error code tester processor 21 and a signal generator 22, the error code tester processor 21 receives a control signal of a specified code pattern and rate sent by the control unit 10 and generates an optical signal of the corresponding code pattern and rate through the signal generator 22; the signal generator 22 is connected to the optical line terminal 30 and sends the optical signal to the optical line terminal 30; the optical line terminal 30 is connected to the optical splitter 40 to achieve multi-way splitting and is attenuated to a specified optical power through the attenuator 50 and then accesses the ONU optical port 60; ONU is the Optical Network Unit, and the ONU optical port 60 is used to connect to the BOB and receive the test signal from the BOB; the ONU optical port 60 is also connected to the photodetector 70, and the photodetector 70 is connected to the analog-to-digital converter 90; the photodetector 70 is used to detect the test signal and generate a signal current, and the signal current is sent to the control unit 10 after being converted by the analog-to-digital converter 90.

[0037] The BOB test system further includes a management port 11, and the control unit 10 is connected to a host computer through the management port 11 to achieve human-machine interconnection. The management port 11 includes any one of a USB port, a wired network interface, a WIFI interface, and a Bluetooth interface. The control unit 10 receives a test instruction sent by the host computer, and sends a control signal of a specified code pattern and rate to the error code detector processor 21 through the IIC bus 100, and sends an optical power original signal to the digital-to-analog converter 80. Specifically, in an embodiment of the present invention, the host computer is a computer used by a tester, and the management port 11 is a USB port. Preferably, the control unit is a single-chip microcomputer, such as a micro control unit (MCU) of the C8051F340 model.

[0038] Specifically, in an embodiment of the present invention, the error code detector processor 21 is an error code detector chip of the model VSC8228. The error code detector processor 21 receives a control signal sent by the control unit 10 through the IIC bus 100, and generates an optical signal of a corresponding code pattern and rate through the signal generator 22. The signal generator 22 is connected to the optical line terminal 30 through a SERDES interface. SERDES is the abbreviation of serializer / deserializer. The optical line terminal 30 includes a PON SFP interface, where PON is Passive Optical Network, and SFP is Small Form-factor Pluggables.

[0039] The optical line terminal 30 is connected to the optical splitter 40, and the one-to-many splitting is achieved through the optical splitter 40. Specifically, in an embodiment of the present invention, the optical splitter 40 achieves one-to-eight splitting, that is, 8-way BOB tests can be simultaneously implemented.

[0040] The digital-to-analog converter 80 is connected to the control unit 10 via the IIC bus 100; the digital-to-analog converter 80 is connected to the attenuator 50 to achieve the control of the optical signal attenuation power. The digital-to-analog converter 80 includes a digital-to-analog conversion chip and an operational amplifier connected to each other. The digital-to-analog conversion chip is used for digital-to-analog conversion, and the operational amplifier is used to generate a voltage signal for the attenuator 50 to attenuate the optical signal transmitted by the optical line terminal 30 to a specified optical power. Specifically, in an embodiment of the present invention, the digital-to-analog conversion chip uses a chip of model AD5593, and the operational amplifier uses an amplifier of model MAX4230. During specific operation, the digital-to-analog conversion chip receives the original optical power signal sent by the control unit 10, controls a certain I / O port of the AD5593 to generate an electrical signal, generates a voltage signal through the operational amplifier MAX4230, and applies it to the voltage input pin of the attenuator 50, thereby attenuating the optical signal transmitted by the optical line terminal 30 to the specified optical power and outputting it to the ONU optical port 60.

[0041] The analog-to-digital converter 90 includes an analog-to-digital conversion chip and a logarithmic converter connected to each other. The logarithmic converter is used to convert the current signal into a voltage value; the analog-to-digital conversion chip is used to identify the voltage value and convert it into a digital signal. Specifically, in an embodiment of the present invention, the analog-to-digital conversion chip uses a chip of model AD5593, and the model of the logarithmic converter is ADL5303. During specific operation, it receives the optical signal sent by the ONU optical port 60. After being detected by the photoelectric detector 70 (Photoelectric Detector, PD), the PD generates signal currents of different magnitudes according to the strength of the optical signal to form a current signal. The current signal is converted into a voltage value with a wider value range and higher precision by the logarithmic converter ADL5303 and is recognized and converted into a digital signal by the AD5593. The digital signal is sent to the control unit 10 via the IIC bus 100 and finally presented on the upper computer interface.

[0042] Please refer to Figure 1 and Figure 2 , specifically, in an embodiment of the present invention, the BOB test method provided by the present invention includes:

[0043] Step S10: The control unit 10 receives the test instruction sent by the upper computer, sends a control signal of a specified code pattern and rate to the error code meter processor 21 via the IIC bus 100, and sends the original optical power signal to the digital-to-analog converter 80; it is customized on the upper computer according to the model of the tested BOB device and the test requirements, and meets the algorithm modification according to the driving chip used by the BOB. When testing different BOB devices, only the corresponding test parameters need to be called, without the need to cooperate with the device for separate test development, shortening the test development cycle, simplifying the test steps at the same time, and reducing the test requirements.

[0044] Step S20: The error detector processor 21 receives the control signal and generates an optical signal with a corresponding pattern and rate through the signal generator 22 to the optical line terminal 30; through the pattern and rate control of the control unit 10, the flexibility of the BOB test is achieved, and a wide range of BERT (Bidirectional Encoder Representation from Transformers) rates (1.25G - 10G) are supported.

[0045] Step S30: The optical line terminal 30 realizes multi-way splitting through the optical splitter 40, and then after being attenuated to a specified optical power by the attenuator 50 controlled by the original signal via the digital-to-analog converter 80, it is connected to the ONU optical port 60; through the multi-way splitting of the optical splitter 40, such as 8-way splitting, 8-way BOB tests can be carried out simultaneously, improving the test efficiency. Moreover, a set of test equipment can complete 8-way BOB tests simultaneously, improving the equipment utilization rate and reducing the input cost. At the same time, the optical line terminal 30 adopts the PON SFP interface method, which can support different products, and by replacing the optical module, it can support, for example, G / EPON and 10G PON interfaces. The tested BOB device is connected to the ONU optical port 60, and the ONU optical port 60 tests the BOB device by sending and receiving optical signals.

[0046] Step S40: The ONU optical port 60 receives the test signal from the BOB.

[0047] Step S50: The test signal is converted by the analog-to-digital converter 90 and then sent to the control unit 10; specifically, the photodetector 70 collects the optical signal of the ONU optical port 60, that is, the test signal. The photodetector 70 generates current signals of different magnitudes according to the intensity of the optical signal. The current signals are converted into digital signals by the analog-to-digital converter 90 and then sent to the control unit 10 via the IIC product line 00.

[0048] Step S60: The control unit 10 compares the received test signal with the original signal to obtain the test result, completing the BOB test.

[0049] Please refer to Figure 3 , when the specific digital-to-analog converter works, it includes:

[0050] Step 101: Receive the original optical power signal sent by the control unit;

[0051] Step 102: Control the ports of the digital-to-analog conversion chip to generate electrical signals;

[0052] Step 103: The electrical signal generates a voltage signal through the operational amplifier;

[0053] Step 104: Apply the voltage signal to the voltage input pin of the attenuator.

[0054] Please refer to Figure 4 , when the specific analog-to-digital converter works, it includes:

[0055] Step 201: Receive the current signal sent by the photodetector;

[0056] Step 203: Convert the current signal into a voltage value through a logarithmic converter;

[0057] Step 204: Identify the voltage value through an analog-to-digital conversion chip and convert it into a digital signal;

[0058] Step 205: Send the digital signal to the control unit.

[0059] Please refer to Figure 5 , specifically in an embodiment of the present invention, through the BOB test system and test method provided by the present invention, compared with the traditional BOB test, obvious benefits are achieved in terms of device interface, volume, test efficiency, device power consumption, rate support, supported products, software support, and cost.

[0060] Compared with the prior art, the BOB test system and test method provided by the present invention highly integrate the BOB test platform, integrate multiple tests in a set of test systems, realize simultaneous testing of different BOB test devices and multiple BOB test devices, save costs, have high device utilization rate, occupy less space, can complete the testing of different devices with one host computer, can parallelly test multiple test devices, and have high test efficiency; it is easier and simpler to customize different devices, with a short development cycle; at the same time, it saves device power consumption.

[0061] The above are only the embodiments of the present invention. It should be noted here that for those of ordinary skill in the art, improvements can be made without departing from the inventive concept of the present invention, but these all belong to the protection scope of the present invention.

Claims

1. A BOB test system, characterized in that, It includes a control unit, an error code meter unit, an optical line terminal, an optical splitter, an attenuator, an ONU optical port, a photodetector, an analog-to-digital converter, and a digital-to-analog converter; the control unit, the error code meter unit, the optical line terminal, the analog-to-digital converter, and the digital-to-analog converter are connected through an IIC bus; the error code meter unit includes an error code meter processor and a signal generator, the error code meter processor receives a control signal of a specified code pattern and rate sent by the control unit and generates an optical signal of the corresponding code pattern and rate through the signal generator; the signal generator is connected to the optical line terminal and sends the optical signal to the optical line terminal; the optical line terminal is connected to the optical splitter to achieve multi-channel splitting and is attenuated to a specified optical power through the attenuator and then accesses the ONU optical port; the ONU optical port is used to connect to the BOB and receive a test signal from the BOB; the ONU optical port is also connected to the photodetector, and the photodetector is connected to the analog-to-digital converter; the photodetector is used to detect the test signal and generate a signal current, and the signal current is converted by the analog-to-digital converter and then sent to the control unit; the digital-to-analog converter includes a digital-to-analog conversion chip, and the digital-to-analog conversion chip of the digital-to-analog converter receives the original optical power signal sent by the control unit and controls the attenuator to attenuate the optical signal sent by the optical line terminal to the specified optical power; the control unit compares the received test signal with the original signal to obtain a test result and completes the BOB test.

2. The BOB test system according to claim 1, wherein The digital-to-analog converter includes a digital-to-analog conversion chip and an operational amplifier connected to each other. The digital-to-analog conversion chip is used for digital-to-analog conversion, and the operational amplifier is used to generate a voltage signal for the attenuator to attenuate the optical signal sent by the optical line terminal to the specified optical power.

3. The BOB test system according to claim 1, wherein The signal generator is connected to the optical line terminal through a SERDES interface.

4. The BOB test system according to claim 1, characterized in that, The analog-to-digital converter includes an analog-to-digital conversion chip and a logarithmic converter connected to each other. The logarithmic converter is used to convert the current signal into a voltage value; the analog-to-digital conversion chip is used to identify the voltage value and convert it into a digital signal.

5. The BOB test system according to claim 1, characterized in that, It also includes a management port connected to the control unit, and the control unit is connected to the upper computer through the management port to achieve human-machine interconnection.

6. The BOB test system according to claim 5, characterized in that, The management port includes any one of a USB port, a wired network interface, a WIFI interface, and a Bluetooth interface.

7. A BOB test method, characterized in that, It includes: The control unit receives a test instruction sent by the upper computer, and sends a control signal of a specified code pattern and rate to the error code meter processor through the IIC bus, and sends the original optical power signal to the digital-to-analog converter; specifically, when the digital-to-analog converter works, it includes: receiving the original optical power signal sent by the control unit; controlling the ports of the digital-to-analog conversion chip to generate an electrical signal; the electrical signal generates a voltage signal through the operational amplifier; applying the voltage signal to the voltage input pin of the attenuator. The error code meter processor receives the control signal and generates an optical signal of the corresponding code pattern and rate through the signal generator to the optical line terminal. The optical line terminal realizes multi-way splitting through an optical splitter, and then accesses the ONU optical port after being attenuated to a specified optical power by an attenuator controlled by the digital-to-analog converter according to the original signal; The ONU optical port receives the test signal from the BOB; The test signal is converted by an analog-to-digital converter and then sent to the control unit; The control unit compares the received test signal with the original signal to obtain the test result.

8. The BOB test method according to claim 7, which is applied to an analog-to-digital converter, is characterized in that, It includes: Receiving the current signal sent by the photodetector; The current signal is converted into a voltage value by a logarithmic converter; Identifying the voltage value through an analog-to-digital conversion chip and converting it into a digital signal; Sending the digital signal to the control unit.

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