Fully automatic detection device for surface mount diodes

By designing high-voltage resistant test seats and solenoid valves in semiconductor testing equipment, and using nitrogen to protect the environment, traditional testing equipment solves the leakage and fire risks caused by air media at high voltages, achieving safer and more accurate testing.

CN114563677BActive Publication Date: 2025-06-17YANGZHOU YANGJIE ELECTRONIC TECH CO LTD
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Patent Information

Application Number
CN202210195025.6
Authority / Receiving Office
CN · China
Patent Type
Patents(China)
Current Assignee / Owner
Filing Date
2022-03-01
Publication Date
2025-06-17
Estimated Expiration
2042-03-01

AI Technical Summary

Technical Problem

During high voltage testing, traditional semiconductor testing equipment is prone to leakage of the product under test due to the conductive dielectric in the air, inaccurate testing, and may even cause fires.

Method used

A fully automatic detection device for patch diodes is designed, using components such as high-pressure resistant test seats and solenoid valves. The solenoid valve is activated by the trigger rod to release nitrogen, forming an inert gas to protect the environment, ensuring the safety and accuracy of the test.

Benefits of technology

It effectively improves the safety and accuracy of the test, avoids leakage problems caused by air media, and reduces test errors and fire risks.

✦ Generated by Eureka AI based on patent content.

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Abstract

Automatic full - detection device for surface - mount diodes, which relates to a semiconductor detection device. It includes an opening seat body with an opening adapted to the surface - mount diode at the top; a pair of test pieces are fixedly and symmetrically arranged in the seat body and are adapted to the pins of the surface - mount diode; a solenoid valve is fixedly arranged at the bottom of the seat body and is communicated with the inner cavity of the seat body through an air pipe; a trigger rod is movably limited on the seat body by a spring. The suction nozzle for testing sucks up the product to be tested and presses it on a pair of test pieces. During the downward pressing process, the trigger rod moves downward to trigger the solenoid valve to work, releasing N2 in the test seat to form an inert gas protection around the test pieces. Through the shielding around the test seat, the loss of N2 is reduced. When the product contacts the test pieces, the instrument conducts a high - voltage test. After the test is completed, the suction nozzle is lifted to transfer the material to the next working station. The present invention has the characteristics of compact structure, improved test safety and accuracy, etc.
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Description

Technical Field

[0001] The present invention relates to a semiconductor detection device, and particularly to a fully automatic detection device for surface mount diodes. Background Art

[0002] The traditional test socket design is to directly press the material onto the test piece by a nozzle for testing. This testing method is exposed to the air environment. When the test voltage is below 2 KV, there is no problem. When testing high voltages above 2 KV, since the air contains conductive media, it is easy for the product under test to have large leakage current and inaccurate testing. Seriously, it may even cause arcing and burn the test piece or the pins of the material. For example, a utility model patent with the application number CN2021109949360, a method for automatically testing wafers based on a rotary testing machine, published on October 08, 2021. Among them, the rotary testing machine includes an industrial control computer, an electric control turntable, a scanning eyepiece, and multiple test stations. The electric control turntable is provided with a loading station, a picking station, and multiple test stations, and the loading station, the picking station, and the multiple test stations are evenly arranged in a ring; each test station has a probe, and the probes of the multiple test stations are respectively arranged above the multiple test stations; the scanning eyepiece is arranged directly above the loading station, and the industrial control computer is respectively connected to the electric control turntable, the scanning eyepiece, and the test stations. Based on this rotary testing machine, multiple wafers placed on the turntable can be tested simultaneously. The testing machine adopted in this method also has problems such as large leakage current and inaccurate testing of the product under test, and seriously, it may even cause arcing and burn the test piece or the pins of the material. Summary of the Invention

[0003] The present invention aims at the above problems and provides a fully automatic detection device for surface mount diodes that improves the safety and accuracy of testing.

[0004] The technical solution of the present invention is: a fully automatic detection device for surface mount diodes, including a high-voltage resistant test socket arranged below an electric control turntable, characterized in that the high-voltage resistant test socket includes:

[0005] A seat body, the top of the seat body is provided with an opening adapted to the surface mount diode;

[0006] A pair of test pieces, the pair of test pieces are fixedly and symmetrically arranged in the seat body and are adapted to the pins of the surface mount diode;

[0007] A solenoid valve, the solenoid valve is fixedly arranged at the bottom of the seat body and is communicated with the inner cavity of the seat body through an air pipe; and

[0008] A trigger rod, the trigger rod is movably limited on the seat body through a spring, and when the surface mount diode is pressed down, the trigger rod overcomes the elastic force of the spring and extends out from the bottom surface of the seat body, triggering the start switch of the solenoid valve, so that nitrogen enters the inner cavity through the air pipe.

[0009] The trigger rod includes an upper top portion, a limiting portion, and a triggering portion that are fixedly connected in sequence;

[0010] A limiting cavity adapted to the trigger rod is provided on the seat body;

[0011] The spring is sleeved on the triggering portion, and by pressing down the upper top portion, the triggering portion is extended out of the limiting cavity.

[0012] A plurality of air outlet holes are provided on the seat body below the test piece.

[0013] It further includes a high-pressure resistant test seat material picking device located inside the seat body;

[0014] The high-pressure resistant test seat material picking device includes:

[0015] A material discharging lifting mechanism, the material discharging lifting mechanism is vertically and fixedly arranged inside the seat body; a material discharging port adapted thereto is provided inside the seat body;

[0016] A material picking frame, the material picking frame is arranged on the material discharging lifting mechanism, and the surface mount diode is moved out of the seat body through the material discharging lifting mechanism; and

[0017] A flipping mechanism, the flipping mechanism is movably arranged on the material picking frame;

[0018] The flipping mechanism includes a material sucking plate, a flipping arm, and a flipping motor;

[0019] The material sucking plate is adapted to the surface mount diode on the test piece, and a plurality of material sucking discs are provided on the side facing the surface mount diode;

[0020] The flipping arm is movably arranged on the material picking frame, one end is connected to the rotating shaft of the flipping motor, and the other end is connected to the material sucking plate. Through the flipping motor fixedly arranged on the material picking frame, the reciprocating flipping of the flipping arm is realized.

[0021] It further includes a rotating mechanism arranged on the material picking frame;

[0022] The rotating mechanism includes a rotating motor and a rotating frame;

[0023] The rotating frame is of a U-shaped structure and is vertically rotatably arranged on the material picking frame;

[0024] The rotating motor is fixedly arranged at the bottom of the material picking frame, and drives the rotating frame to rotate through its rotating shaft;

[0025] The bottom of the material sucking plate is hinged to the rotating frame through the flipping arm.

[0026] The material sucking plate includes a material sucking portion, a connecting rod portion, and a circular hinged portion that are fixedly connected in sequence;

[0027] The material suction part is used to suck the surface-mounted diodes;

[0028] The connecting rod is fixedly connected to the circular hinge part through the flipping arm;

[0029] The circular connection part is hinged to the rotating frame.

[0030] The flipping arm includes a motor connection arm and a rod connection arm fixedly connected in sequence;

[0031] The motor connection arm is connected to the rotating shaft of the flipping motor;

[0032] The rod connection arm drives the material suction plate to reciprocally flip through the motor connection arm.

[0033] The material discharging lifting mechanism is a rodless cylinder.

[0034] An extended linear drive mechanism is provided between the material suction part and the connecting rod part;

[0035] The cylinder body of the extended linear drive mechanism is fixedly connected to the connecting rod part, and the piston rod end is fixedly connected to the material suction part.

[0036] The present invention includes an opening seat body with an opening adapted to the surface-mounted diode at the top; a pair of the test pieces are symmetrically and fixedly arranged in the seat body and are adapted to the pins of the surface-mounted diode; the solenoid valve is fixedly arranged at the bottom of the seat body and is communicated with the inner cavity of the seat body through an air pipe; the trigger rod is movably limited on the seat body through a spring. The suction nozzle for testing sucks up the product to be tested and presses it on a pair of test pieces. During the downward pressing process, the trigger rod moves downward to trigger the solenoid valve to work, releasing N2 in the test seat to form an inert gas protection around the test pieces. Through the shielding around the test seat, the loss of N2 is reduced. When the product contacts the test pieces, the instrument conducts a high-voltage test. After the test is completed, the suction nozzle is lifted to transfer the material to the next working station. The present invention has the characteristics of compact structure, improved test safety and accuracy, etc. Description of the Drawings

[0037] Figure 1 It is a schematic structural diagram of the present invention,

[0038] Figure 2 It is a schematic structural diagram of the state during the test of the surface-mounted diode,

[0039] Figure 3 It is a schematic structural diagram of several air outlet holes,

[0040] Figure 4 It is a schematic structural diagram of the usage state of the present utility model,

[0041] Figure 5 It is Figure 1 a schematic structural diagram of the material picking device in

[0042] Figure 6 It is a schematic structural diagram of the connection state between the rotating mechanism and the suction plate (the rotating motor is omitted).

[0043] Figure 7 It is a schematic structural diagram of the connection state between the flipping motor and the flipping arm.

[0044] Figure 8 It is a schematic structural diagram of the motor connecting arm in a top view state.

[0045] Figure 9 It is a schematic structural diagram of the extending linear driving mechanism;

[0046] Figure 10 It is a schematic structural diagram of the patch diode socketing device.

[0047] Figure 11 It is a schematic side structural diagram of the pipe clamping link mechanism;

[0048] In the figure, A1 is the base body, A11 is the air outlet, A2 is the test piece, A3 is the solenoid valve, A4 is the trigger rod, A5 is the patch diode, and A6 is the suction nozzle;

[0049] B1 is the feeding lifting mechanism, and B2 is the picking frame.

[0050] B3 is the flipping mechanism, B31 is the suction plate, B32 is the flipping arm, B321 is the motor connecting arm, B322 is the rod connecting arm, B33 is the flipping motor, B4 is the rotating mechanism, B41 is the rotating motor, B42 is the rotating frame, B5 is the extending linear driving mechanism;

[0051] C1 is the horizontal linear driving mechanism, C2 is the lifting linear driving mechanism, C3 is the pipe clamping mechanism, C31 is the pipe clamping cylinder, C32 is the pipe clamping arm, C33 is the pipe clamping link mechanism, C331 is the short pull rod, C332 is the link one, C333 is the link two, C334 is the chuck, C3341 is the bayonet, and C4 is the sleeve. Detailed implementation manners

[0052] The embodiments of the present invention will be described in detail below. The examples of the embodiments are shown in the drawings, where the same or similar reference numerals represent the same or similar elements or elements with the same or similar functions throughout. The embodiments described below with reference to the drawings are exemplary and are only used to explain the present invention and should not be construed as a limitation to the present invention.

[0053] The present invention is as Figures 1-3 shown; a fully automatic patch diode detection device, including a high-voltage resistant test base disposed below an electric control turntable, characterized in that the high-voltage resistant test base includes:

[0054] Seat body A1, an opening adapted to the surface mount diode A5 is provided at the top of the seat body A1;

[0055] A pair of test pieces A2, the pair of test pieces A2 are fixedly and symmetrically arranged in the seat body A1 and are adapted to the pins of the surface mount diode A5; the extending end of the test piece A2 from the seat body A1 is electrically connected to a test instrument;

[0056] Solenoid valve A3, the solenoid valve A3 is fixedly arranged at the bottom of the seat body A1 and is communicated with the inner cavity of the seat body A1 through an air pipe; and

[0057] Trigger rod A4, the trigger rod A4 is movably limited on the seat body A1 through a spring, and when the surface mount diode A5 is pressed down, the trigger rod A4 overcomes the elastic force of the spring and extends out from the bottom surface of the seat body A1 to trigger the start switch of the solenoid valve A3, so that nitrogen enters the inner cavity through the air pipe.

[0058] The trigger rod A4 includes a top part, a limiting part and a triggering part which are fixedly connected in sequence;

[0059] A limiting cavity adapted to the trigger rod A4 is provided on the seat body A1;

[0060] The spring is sleeved on the triggering part, and when the top part is pressed down, the triggering part extends out of the limiting cavity to touch the start switch of the solenoid valve A3.

[0061] A plurality of air outlet holes 11 are provided below the test piece A2 on the seat body A1. An air inlet nozzle for connecting with an air pipe is provided at the bottom of the seat body A1. Nitrogen enters the air outlet holes A11 from the air inlet nozzle through the air pipe and blows towards the test piece A2 to improve the safety and accuracy of the test.

[0062] The suction nozzle A6 for testing (the suction nozzle A6 is arranged on a suction pen, the suction pen is fixedly arranged on an electric control turntable, and the turntable can realize the lifting and rotating functions through the equipment) sucks up the product to be tested (surface mount diode A5) and presses it on a pair of test pieces A2. During the pressing process, the trigger rod A4 moves downward to trigger the solenoid valve A3 to work, release N2 in the test seat, form an inert gas protection around the test piece A2, and reduce the loss of N2 through the shielding around the test seat. When the product contacts the test piece A2, the instrument performs a high-voltage test. After the test is completed, the suction nozzle A6 is lifted to transfer the material to the next station.

[0063] As Figures 4-9 shown, it further includes a high-voltage resistant test seat material picking device located in the seat body;

[0064] The high-voltage resistant test seat material picking device includes:

[0065] The feeding lifting mechanism 1 is vertically and fixedly arranged inside the seat body; a suitable feeding port is arranged inside the seat body;

[0066] The picking rack 2 is arranged on the feeding lifting mechanism 1, and the surface-mounted diode is moved out of the seat body through the feeding lifting mechanism 1; the picking rack 2 is fixedly connected with the slider of the feeding lifting mechanism 1;

[0067] And the flipping mechanism 3 is movably arranged on the picking rack 2;

[0068] The flipping mechanism 3 includes a suction plate 31, a flipping arm 32 and a flipping motor 33;

[0069] The suction plate 31 is adapted to the surface-mounted diode on the test piece, and a plurality of suction cups are arranged on the side facing the surface-mounted diode;

[0070] The flipping arm 32 is movably arranged on the picking rack 2, one end is connected to the rotating shaft of the flipping motor 33, and the other end is connected to the suction plate 31. Through the flipping motor 33 fixedly arranged on the picking rack 2, the reciprocating flipping of the flipping arm 32 is realized.

[0071] Furthermore, it further includes a rotating mechanism 4 arranged on the picking rack 2;

[0072] The rotating mechanism 4 includes a rotating motor 41 and a rotating frame 42;

[0073] The rotating frame 42 is of a U-shaped structure and is vertically rotatably arranged on the picking rack 2;

[0074] The rotating motor 41 is fixedly arranged at the bottom of the picking rack 2 and drives the rotating frame 42 to rotate through its rotating shaft;

[0075] The bottom of the suction plate 31 is hinged to the rotating frame 42 through the flipping arm 32.

[0076] The usage method of this case is as follows:

[0077] When the surface-mounted diode falls onto the test piece, the flipping mechanism 3 located on the side of the surface-mounted diode starts to act. As shown in Figure 5 , first, the flipping motor 33 rotates counterclockwise, so that the rod connecting arm 322 of the flipping arm 32 rotates counterclockwise, and then the flipping arm 32 flips towards the surface-mounted diode. When it flips to the surface-mounted diode, it starts to inhale to pick up the surface-mounted diode. Then the flipping motor 33 rotates clockwise, and the flipping arm 32 is in the Figure 5 position. The picked-up surface-mounted diode is lowered from the seat body to the bottom of the seat body through the feeding lifting mechanism 1, and the surface-mounted diode is transported to the corresponding feeding box through the rotating mechanism 4.

[0078] As shown inFigure 6 As shown in the figure, the material suction plate 31 is hinged to the rotating frame 42 of the U-shaped structure. By rotating the rotating motor 41, the rotation of the material suction plate 31 is realized, so as to adapt to the discharging plates at different positions.

[0079] Furthermore, it is defined that the material suction plate 31 includes a material suction part, a connecting rod part and a circular hinge part which are fixedly connected in sequence;

[0080] The material suction part is used for sucking the surface mount diodes;

[0081] The connecting rod is fixedly connected to the circular hinge part through the flipping arm 32; a clearance fit is adopted between the connecting rod and the rod connecting arm 322. When the material suction plate 31 rotates to adapt to the discharging plate, it has no influence on the connecting arm.

[0082] The circular hinge part is hinged to the rotating frame 42.

[0083] Furthermore, it is defined that the flipping arm 32 includes a motor connecting arm 321 and a rod connecting arm 322 which are fixedly connected in sequence;

[0084] The motor connecting arm 321 is connected to the rotating shaft of the flipping motor 33;

[0085] The rod connecting arm 322 drives the material suction plate 31 to reciprocally flip through the motor connecting arm 321.

[0086] Furthermore, it is defined that the discharging lifting mechanism 1 is a rodless cylinder.

[0087] Furthermore, it is optimized that an extending linear driving mechanism 5 is arranged between the material suction part and the connecting rod part;

[0088] The cylinder body of the extending linear driving mechanism 5 is fixedly connected to the connecting rod part, and the piston rod end is fixedly connected to the material suction part. By adjusting the extending length of the material suction part through the extending linear driving mechanism 5, the accuracy and flexibility of material suction are improved.

[0089] The extending linear driving mechanism 5 includes an extending cylinder, an extending oil cylinder or an extending electric push rod. In this case, an extending cylinder is preferably used.

[0090] The surface mount diodes are tested by applying current and voltage. After the test is completed, they need to be transported out and put into a storage box for qualified surface mount diodes. In order to protect the two pins of the surface mount diodes, sleeves are usually manually sleeved on the pins to prevent damage to the pins during subsequent processing. However, the manual sleeving method not only has low efficiency but also easily leaves sweat stains on the pins, affecting the service life after welding.

[0091] In view of the above problems, this case is further optimized as Figures 10-11 shown in the figure, a surface mount diode pin sleeving device is arranged on the outer side of the seat body;

[0092] It includes a horizontal linear drive mechanism C1, a lifting linear drive mechanism C2, and a pipe clamping mechanism C3;

[0093] The pipe clamping mechanism C3 is arranged on the lifting linear drive mechanism C2 and reciprocates up and down through the lifting linear drive mechanism C2;

[0094] The lifting linear drive mechanism C2 is vertically arranged on the horizontal linear drive mechanism C1 and reciprocates in the horizontal direction through the horizontal linear drive mechanism C1;

[0095] The pipe clamping mechanism C3 includes a pipe clamping cylinder C31, a pipe clamping arm C32, and a pair of symmetrically arranged pipe clamping link mechanisms C33;

[0096] The pipe clamping link mechanism C33 includes a short pull rod C331, a first link C332, a second link C333, and a chuck C334;

[0097] One end of the short pull rod C331 is hinged to the piston rod end of the pipe clamping cylinder C31, and the other end is hinged to the first link C332;

[0098] One end of the first link C332 and one end of the second link C333 are respectively hinged to the U-shaped pipe clamping arm C32;

[0099] The other end of the first link C332 and the other end of the second link C333 are respectively hinged to the L-shaped chuck C334;

[0100] The chuck C334 is provided with a bayonet C3341 adapted to the sleeve C4.

[0101] The working mode of this case is as follows: The pipe clamping mechanism C3 is lowered to a position adapted to the pipe pushing position through the lifting linear drive mechanism C2. After the sleeve C4 at the pipe pushing position is pushed into the bayonet C3341 of a pair of chucks C334 by a push rod, the vertically arranged pipe clamping cylinder C31 clamps the sleeve C4 by retracting the piston rod. Then, the sleeve C4 is lifted to a position adapted to the pins of the surface mount diode through the lifting linear drive mechanism C2. The horizontal linear drive mechanism C1 acts to move left or right, and the sleeve C4 is sleeved onto the corresponding pins. After the sleeving is completed, a pair of chucks C334 release the sleeve C4, move to the middle position of a pair of pins through the horizontal linear drive mechanism C1, and descend to receive the sleeve C4 at the pipe pushing position.

[0102] The lifting linear drive mechanism C2 is a lifting rodless cylinder.

[0103] The horizontal linear drive mechanism C1 is a horizontal rodless cylinder.

[0104] The bayonet C3341 is provided with a rubber layer.

[0105] A number of protrusions are provided on the fitting surface between the rubber layer and the sleeve C4, thereby improving the reliability during intubation.

[0106] Regarding the content disclosed in this case, the following points need to be explained:

[0107] (1). The accompanying drawings of the embodiments disclosed in this case only relate to the structures involved in the embodiments disclosed in this case. For other structures, reference can be made to the general design;

[0108] (2). Without conflict, the embodiments disclosed in this case and the features in the embodiments can be combined with each other to obtain new embodiments;

[0109] The above is only the specific implementation manner disclosed in this case, but the protection scope of this disclosure is not limited thereto. The protection scope disclosed in this case shall be subject to the protection scope of the claims.

Claims

1. The fully automatic detection device for surface mount diodes includes a high-voltage resistant test seat arranged below the electric control turntable, and is characterized in that, The high-voltage resistant test socket includes: A seat body, with an opening adapted to the surface mount diode provided at the top of the seat body; A pair of test pieces, symmetrically and fixedly arranged in the inner cavity of the seat body, adapted to the pins of the surface mount diode; A solenoid valve, fixedly arranged at the bottom of the seat body and communicated with the inner cavity of the seat body through an air pipe; and A trigger rod, movably limited on the seat body by a spring. When the surface mount diode is pressed down, the trigger rod protrudes from the bottom surface of the seat body against the elastic force of the spring, triggering the start switch of the solenoid valve, so that nitrogen enters the inner cavity through the air pipe; A plurality of air outlet holes are provided below the test pieces on the seat body; an air inlet nozzle for connecting with the air pipe is provided at the bottom of the seat body, and nitrogen enters the air outlet holes respectively through the air pipe from the air inlet nozzle and blows towards the test pieces.

2. The fully automatic detection device for surface mount diodes according to claim 1, is characterized in that, The trigger rod includes a top part, a limiting part and a triggering part fixedly connected in sequence; A limiting cavity adapted to the trigger rod is provided on the seat body; The spring is sleeved on the triggering part, and the triggering part is extended from the limiting cavity by pressing down the top part.

3. The fully automatic detection device for surface mount diodes according to claim 1, is characterized in that, It further includes a high-voltage resistant test socket material picking device located in the seat body; The high-voltage resistant test socket material picking device includes: A feeding lifting mechanism, vertically and fixedly arranged in the seat body; a feeding port adapted thereto is provided in the seat body; A material picking frame, arranged on the feeding lifting mechanism, and the surface mount diode is removed from the seat body through the feeding lifting mechanism; and A flipping mechanism, movably arranged on the material picking frame; The flipping mechanism includes a suction plate, a flipping arm and a flipping motor; The suction plate is adapted to the surface mount diode on the test piece, and a plurality of suction cups are provided on the side facing the surface mount diode; The flipping arm is movably arranged on the material picking frame, one end is connected to the rotating shaft of the flipping motor, and the other end is connected to the flipping suction plate. Through the flipping motor fixedly arranged on the material picking frame, the reciprocating flipping of the flipping arm is realized.

4. The fully automatic detection device for surface mount diodes according to claim 3, is characterized in that, It further includes a rotating mechanism arranged on the material picking frame; The rotating mechanism includes a rotating motor and a rotating frame; The rotating frame is in a U-shaped structure and is vertically rotatably arranged on the material picking frame; The rotating motor is fixedly arranged at the bottom of the material picking frame, and drives the rotating frame to rotate through its rotating shaft; The bottom of the suction plate is hinged to the rotating frame through the flipping arm.

5. The fully automatic detection device for surface mount diodes according to claim 3, is characterized in that, The suction plate includes a suction part, a connecting rod part and a circular hinged part fixedly connected in sequence; The suction part is used for sucking the surface mount diode; The connecting rod is fixedly connected to the circular hinged part through the flipping arm; The circular hinged part is hinged to the rotating frame.

6. The fully automatic detection device for surface mount diodes according to claim 3, is characterized in that, The flipping arm includes a motor connecting arm and a rod connecting arm fixedly connected in sequence; The motor connecting arm is connected to the rotating shaft of the flipping motor; The rod connecting arm drives the suction plate to reciprocate and flip through the motor connecting arm.

7. The fully automatic detection device for surface mount diodes according to claim 3, is characterized in that, The feeding lifting mechanism is a rodless cylinder.

8. The fully automatic detecting device for patch diodes according to claim 5, wherein, An extending linear driving mechanism is provided between the suction part and the connecting rod part; The cylinder body of the extending linear driving mechanism is fixedly connected to the connecting rod part, and the piston rod end of the extending linear driving mechanism is fixedly connected to the suction part.

Citation Information

Patent Citations

  • High-voltage-resistant test socket

    CN216926987U

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    CN216928491U

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