Chip fixture for test socket

Abstract

The present invention relates to a chip fixing device for a test seat, which mainly includes a fixed seat body and a movable stopper; the seat groove of the fixed seat body is used to set the test seat; the movable stopper is set in the fixed seat body, and can be controlled to move the stopper between a first position and a second position; wherein the first position refers to a position where the stopper is located above the orthographic projection direction of the chip slot of the test seat, and the second position refers to a position where the stopper leaves the orthographic projection direction of the chip slot of the test seat. Therefore, the seat groove of the present invention can be used to install test seats of different specifications and sizes, and the movable stopper can drive the stopper to limit the chip to be tested from falling off from the chip slot in response to whether there is an external force; or drive the stopper to cancel the fixing of the chip to be tested, so as to allow the chip to be taken and placed.

Description

Technical Field

[0001] The present invention relates to a chip fixing device for a test seat, and in particular to a chip fixing device for a test seat which can prevent the chip to be tested from falling off the test seat when the chip to be tested is being transferred along with the test seat. Background Art

[0002] The test sockets of traditional chip testing equipment are all positioned on the test substrate, and during the test, the chip to be tested must be pressed by a pressure head to ensure that the chip to be tested can fully contact the probes in the test socket, and the pressure head must continue to press the chip to be tested during the entire test process. In fact, this combination of fixed test sockets and pressure heads takes up a considerable amount of space, and the number of groups that can be configured in a large-scale testing equipment is still limited.

[0003] Therefore, in order to overcome the problem of machine space, current test equipment manufacturers are working hard to develop a three-dimensional configuration of the test seat, that is, after the test seat is loaded with the chip to be tested, it can be moved to a specific position or stacked for (burn in) testing. However, this will test the stability of the chip to be tested in the test seat during the transfer process.

[0004] For related prior art, please refer to "Socket for IC package" disclosed in U.S. Publication No. 2002177347. The purpose of the patent document is a test socket, that is, latches are directly configured on the test socket to press the IC into the test socket. In other words, according to the patent document, latches are only configured for dedicated test sockets, and the latches cannot be transferred to other test sockets. Furthermore, the operating principle of the patent is to push the front end inclined surface of the latch by pressing down the T-shaped spring support member, so that the front end projection of the latch slides down along the tilted surface to press against the IC.

[0005] However, according to this configuration, whether the T-shaped spring support member pushes the latch member or the front protrusion of the latch member slides along the inclined surface, debris will be generated due to surface friction over time to contaminate the IC or the test socket. Moreover, according to the contents disclosed in the drawings of the patent document, the entire operation mode of the T-shaped spring support member pushing the latch member is very easy to cause interference and may not operate smoothly. Summary of the invention

[0006] The main purpose of the present invention is to provide a chip fixing device for a test socket, which can effectively prevent the chip to be tested from falling off the test socket when the chip to be tested is transferred along with the test socket; and can arbitrarily match test sockets and chips to be tested with different specifications and sizes.

[0007] To achieve the above-mentioned purpose, a chip fixing device of a test seat of the present invention is configured on the test seat, and the test seat includes a chip slot, which is used to accommodate the chip to be tested; the chip fixing device of the test seat of the present invention mainly includes a fixing seat body, and at least one movable stopper; the fixing seat body includes a through groove and a receiving seat groove, and the test seat is arranged in the receiving seat groove, and the chip slot of the test seat corresponds to the through groove and is exposed from the upper surface of the fixing seat body; each movable stopper includes a stopper, which is arranged on the fixing seat body and is controlled to move the stopper between a first position and a second position; wherein the first position refers to a position where the stopper is located above the orthographic projection direction of the chip slot of the test seat, and the second position refers to a position where the stopper leaves the orthographic projection direction of the chip slot of the test seat.

[0008] Therefore, the receptacle groove of the present invention can be used to install test sockets of different specifications and sizes, and the movable stopper can drive the stopper to be located above the orthographic projection direction of the chip slot of the test socket according to whether there is an external force, so as to limit the chip to be tested from falling off the chip slot; or, drive the stopper to leave the position above the orthographic projection direction of the chip slot of the test socket to facilitate the placement of the chip to be tested.

[0009] In order to achieve the above-mentioned purpose, a chip fixing device of a test seat of the present invention is arranged on the test seat, and the test seat includes a chip slot, which is used to accommodate the chip to be tested; the chip fixing device of the test seat of the present invention mainly includes a fixing seat body and two movable blocks; the fixing seat body includes a through groove and a receiving groove, and the test seat is arranged in the receiving groove, and the chip slot of the test seat corresponds to the through groove and is exposed from the upper surface of the fixing seat body; the two movable blocks are arranged in the through groove and correspond to the corresponding two sides of the chip slot of the test seat respectively, and each movable block includes a stopper; the two movable blocks can be controlled so that the stopper moves between a first position and a second position. Among them, the first position refers to the position where the stoppers of the two movable blocks are respectively located on the two corresponding sides above the chip to be tested and the chip to be tested does not leave the chip slot; the second position refers to the position where the stopper leaves the positive projection direction of the chip slot of the test seat and the chip to be tested is able to leave the chip slot.

[0010] Therefore, another form of the chip fixing device of the test seat of the present invention, in addition to providing a seat groove for installing test seats of different specifications and sizes, is also provided with two movable blocks on two corresponding sides of the chip slot of the test seat, which can clamp the chip to be tested from both sides to better ensure that the chip to be tested does not fall off the test seat.

[0011] To achieve the aforementioned purpose, the present invention provides a chip fixing device for a test seat, which is configured on the test seat, and the test seat includes a chip slot for accommodating a chip to be tested; the chip fixing device for the test seat of the present invention mainly includes a fixed seat body, two movable blocks, two pairs of rocker arms, two first connecting rods, and two second connecting rods; the fixed seat body includes a seat groove, a through groove, four arm grooves, two first long grooves, and two second long grooves; and the through groove and the arm grooves penetrate the upper and lower surfaces of the fixed seat body; the test seat is arranged in the seat groove, and the chip slot of the test seat corresponds to the through groove and is exposed from the upper surface of the fixed seat body; the four arm grooves are respectively arranged on the outside of the four corners of the through groove; the two first long grooves and the two second long grooves penetrate the two side end surfaces of the fixed seat body and are respectively located on both sides of the test seat; and the two movable blocks are arranged in the through groove Each movable stopper includes a stopper, and the two movable stops are respectively corresponding to the corresponding two sides of the chip slot of the test seat; the two movable stops are arranged on the fixed seat body, and are controlled to move the stopper between the first position and the second position; two pairs of rocker arms are respectively configured on both sides of the two movable stops and accommodated in four arm-containing grooves, each rocker arm includes a fixed end and a movable end; two first connecting rods and two second connecting rods, each first connecting rod passes through the first long grooves and is pivotally connected to the fixed end of the rocker arm and the movable stopper; each second connecting rod passes through the second long grooves and is pivotally connected to the movable stopper; wherein the second position refers to when the movable ends of the two pairs of rocker arms are pushed by external force, and the rocker arms drive the movable stops to make the stopper located above the positive projection direction of the chip slot of the test seat; the first position refers to the position where the external force is canceled and the stopper is located above the positive projection direction of the chip slot of the test seat.

[0012] Therefore, another form of the chip fixing device of the test seat of the present invention not only provides a seat groove for installing test seats of different specifications and sizes, but also uses a rocker arm to drive the movable stopper to displace it between the first position and the second position. That is, when the rocker arm is driven by an external force, such as a test head pressing down the rocker arm, the rocker arm will drive the movable stopper to move the stopper away from the position above the orthographic projection direction of the chip slot of the test seat, so that the test head can contact the chip to be tested in the chip slot; on the other hand, when the external force is removed, that is, when the test head is away from the rocker arm, the stopper will return to the position above the orthographic projection direction of the chip slot of the test seat to prevent the chip from falling out of the chip slot. BRIEF DESCRIPTION OF THE DRAWINGS

[0013] Figure 1 It is a three-dimensional diagram of the chip fixing device of the test socket of the present invention.

[0014] Figure 2 It is an exploded view of the chip fixing device of the test socket of the present invention.

[0015] Figure 3It is a cross-sectional view of the chip fixing device of the test seat of the present invention when the stopper is located at the first position.

[0016] Figure 4 It is a cross-sectional view of the chip fixing device of the test socket of the present invention when the stopper is located at the second position. DETAILED DESCRIPTION

[0017] [Modes for carrying out the invention]

[0018] Before the chip fixing device of the test socket of the present invention is described in detail in this embodiment, it should be noted that similar components will be represented by the same component symbols in the following description. Furthermore, the drawings of the present invention are only for schematic illustration and may not be drawn to scale, and not all details may be fully presented in the drawings.

[0019] Please also see Figure 1 ,and Figure 2 , Figure 1 is a three-dimensional diagram of a chip fixing device of a test socket of the present invention, Figure 2 1 is an exploded view of the chip fixing device of the test socket of the present invention. As shown in the figure, the chip fixing device 1 of the test socket of the present embodiment can be regarded as a test socket base plate (socket plate), which can be matched with a test socket S of any specification and size. To further explain, the chip fixing device 1 of the test socket of the present embodiment mainly includes a fixing socket body 2, two movable blocks 3, two pairs of rocker arms 4, two first connecting rods 51, two second connecting rods 52, two third connecting rods 53, and two reset springs 6.

[0020] Furthermore, the fixing seat body 2 includes a seat groove 20, a through groove 21, four arm grooves 22, two first long grooves 23, and two second long grooves 24; wherein the through groove 21 and the arm grooves 22 penetrate the upper and lower surfaces of the fixing seat body 2; the seat groove 20 can be installed with various test seats S, and the chip socket SC of the test seat S corresponds to the through groove 21 and is exposed from the upper surface of the fixing seat body 2. In addition, the four arm grooves 22 are respectively arranged outside the four corners of the through groove 21, and each arm groove 22 has a longitudinal guide groove 25 on both sides, which is connected to the arm groove 22.

[0021] On the other hand, the two first long grooves 23 and the two second long grooves 24 penetrate the front and rear end surfaces of the fixing seat body 2 and are respectively located on both sides of the test seat S; wherein the first long groove 23 is a horizontal long groove, and the second long groove 24 is an oblique long groove, and one end thereof adjacent to the first long groove 23 extends toward the upper surface of the fixing seat body 2.

[0022] Furthermore, two movable stoppers 3 are disposed in the through slot 21 and correspond to the two sides of the chip socket SC of the test seat S, respectively, and each movable stopper 3 includes a stopper 31. Furthermore, each movable stopper 3 includes a body portion 301 and a cantilever portion 302, the body portion 301 is provided with two through holes 303, 304, and the ends of the cantilever portions 302 of the two movable stoppers 3 are respectively provided with the stopper 31.

[0023] Furthermore, rocker arms 4 are disposed on both sides of each movable stopper 3, that is, two pairs of rocker arms 4 are disposed in four arm receiving slots 22, respectively; wherein each rocker arm 4 includes a fixed end 41 and a movable end 42. In addition, guide protrusions 421 are disposed on both sides of each movable end 42, which are received in the longitudinal guide slots 25 on both sides of the arm receiving slot 22 and can be guided by the longitudinal guide slots 25 to perform lifting and lowering actions.

[0024] In addition, the two first connecting rods 51 respectively pass through the first long slots 23 on both sides of the fixing seat body 2 and are pivotally connected to the fixed end 41 of the rocker arm 4 and the through hole 303 of the movable stopper 3; the two second connecting rods 52 respectively pass through the second long slots 24 on both sides of the fixing seat body 2 and are pivotally connected to another through hole 304 of the movable stopper 3, that is, the through hole 304 adjacent to the receiving seat groove 20. In addition, the two third connecting rods 53 are arranged on the fixing seat body 2 and are located on both sides of the test seat S and below the cantilever portion 302 of the movable stopper 3.

[0025] In addition, a receiving groove 32 is provided on one side of the main body 301 of each movable stopper 3 away from the cantilever portion 302 for accommodating the return spring 6 ; that is, the return spring 6 is disposed in the through groove 21 and located between the fixed seat body 2 and the movable stopper 3 .

[0026] Please also refer to Figure 3 , which is a cross-sectional view of the chip fixing device 1 of the test socket of the present invention when the stopper 31 is located at the first position; Figure 3 The figure is a normal state diagram, that is, a cross-sectional view of the chip fixing device 1 of the test socket and the test socket S in the transfer state after the chip IC to be tested is loaded on the test socket S. As shown in the figure, the return spring 6 applies a biasing force to drive the side end surface of the main body 301 of the movable stopper 3 to be closely attached to the side end surface of the test socket S.

[0027] At this time, the guide protrusion 421 of the movable end 42 of the rocker arm 4 is located in the longitudinal guide groove 25, which is closer to the upper surface of the fixed seat body 2; the first connecting rod 51 and the second connecting rod 52 are respectively located in the first long groove 23 and the two second long grooves 24, which are close to the side facing the test seat S; and the lower surface of the cantilever portion 302 of the movable stopper 3 also abuts against the third connecting rod 53. More specifically, at this time, the stopper 31 is located above the orthographic projection direction of the chip socket SC of the test seat S to prevent the chip IC to be tested from escaping from the chip socket SC.

[0028] It should be particularly noted that, in the present embodiment, when the stopper 31 is located at the first position, the distance between the stopper 31 and the upper surface of the chip IC to be tested is less than the depth of the chip slot SC of the test socket S; that is, there is a clearance between the end of the stopper 31 and the upper surface of the chip IC to be tested, and there is no direct contact, thereby effectively preventing the stopper 31 from scratching the surface of the chip IC to be tested.

[0029] Please refer to Figure 4 , which is a cross-sectional view of the chip fixing device 1 of the test seat of the present invention when the stopper 31 is located at the second position; as shown in the figure, the pressing joint 7 of this embodiment includes a test head 71 and four pressing rods 72, wherein the test head 71 corresponds to the chip slot SC of the test seat S, that is, corresponds to the chip IC to be tested, and the four pressing rods 72 correspond to the movable ends 42 of the rocker arms 4 in the four arm slots 22 respectively.

[0030] Therefore, when a test is to be performed, the pressing joint 7 is lowered, and the pressing rod 72 applies a downward force to press down the movable end 42 of the rocker arm 4, thereby driving the movable stopper 3 to be displaced, and through the guiding effect of the first connecting rod 51 and the second connecting rod 52 in the first long groove 23 and the second long groove 24, the rocker arm 4 drives the movable stopper 3 to make the stopper 31 leave the position above the direct projection direction of the chip slot SC of the test seat S; wherein the first long groove 23 will guide the movable stopper 3 to shift horizontally in the direction away from the test seat S, and the second long groove 24 will guide the movable stopper 3 to shift obliquely upward away from the test seat S, thereby the stoppers 31 located on both sides above the test seat S will be completely moved away from the position above the direct projection direction of the chip slot SC, so that the test head 71 can be completely pressed down to contact the chip IC to be tested.

[0031] In addition, when the test is completed, the pressing joint 7 rises, the test head 71 leaves the chip IC to be tested, and the four pressing rods 72 gradually rise, that is, the pressing force is cancelled; at this time, the movable stopper 3 is affected by the biasing force of the reset spring 6 and resets to the position as shown in FIG. Figure 3The first position shown in the figure; that is, the stopper 31 is returned to the position above the orthogonal projection direction of the chip slot SC of the test seat S to prevent the chip IC to be tested from being removed from the chip slot SC. On the other hand, when the chip is to be placed, a pressing rod is also provided on the placement mechanism (not shown in the figure) to move the movable stopper 3 away from the position above the orthogonal projection direction of the chip slot SC in the same way, so as to facilitate the placement mechanism to remove the tested chip and place the chip to be tested.

[0032] In summary, compared with the prior art, the chip fixing device of the test socket of the present invention has at least the following advantages:

[0033] (1) The present invention is an independent component that can be used with test sockets of different specifications and sizes and can be reused without the need to redesign, replace or install the test socket due to the conversion of the chip to be tested or the test socket;

[0034] (2) The structure is simple, easy to assemble and maintain, durable, and stable in operation, which can effectively prevent the chip under test from falling out of the chip slot of the test seat during the transfer process;

[0035] (3) The stopper does not directly contact the chip to be tested, so there is no risk of scratching the chip to be tested;

[0036] (4) When the thickness of the chips to be tested is different, it is only necessary to replace the stopper to match the chips to be tested with different thickness specifications; and

[0037] (5) The present invention does not require the configuration of an additional power source, and the original test equipment does not need to be excessively modified; it only needs to install a down-pressing rod on the down-pressing connector of the original equipment, and the chip to be tested in the test seat can be fixed or released in the original action mode for transfer or testing.

[0038] The above embodiments are merely examples for the convenience of description. The scope of rights claimed by the present invention should be based on the scope of the claims, but not limited to the above embodiments.

[0039] Explanation of symbols

[0040] 1: Chip fixture of test socket

[0041] 2: Fixed seat body

[0042] 3: Movable stopper

[0043] 4: Rocker arm

[0044] 6: Return spring

[0045] 7: Press down the connector

[0046] 20: Seat slot

[0047] 21:Through groove

[0048] 22: Arm slot

[0049] 23: The first long groove

[0050] 24: The second longest groove

[0051] 25: Longitudinal guide groove

[0052] 31: Stopper

[0053] 41: Fixed end

[0054] 42:Activity terminal

[0055] 51: First connecting rod

[0056] 52: Second connecting rod

[0057] 53: Third connecting rod

[0058] 71:Test Head

[0059] 72: Downward pressure rod

[0060] 301: Ontology Department

[0061] 302: cantilever part

[0062] 303,304:Through hole

[0063] 421:Guide convex part

[0064] IC: chip under test

[0065] S: Test socket

[0066] SC: Chip slot.

Claims

1. A chip fixing device for a test socket, which is configured on the test socket, and the test socket includes a chip slot for accommodating a chip to be tested; the chip fixing device for the test socket includes: A fixing seat body, comprising a through slot and a receiving slot, the test seat is arranged in the receiving slot, the chip slot of the test seat corresponds to the through slot and is exposed from the upper surface of the fixing seat body; At least one movable stopper, each movable stopper comprising a stopper; the at least one movable stopper is disposed on the fixing seat body and is controlled so that the stopper moves between a first position and a second position; The first position refers to the position where the stopper is located above the orthographic projection direction of the chip slot of the test seat; the second position refers to the position where the stopper leaves the orthographic projection direction of the chip slot of the test seat.

2. The chip fixing device of the test seat according to claim 1 further includes at least one rocker arm, at least one first connecting rod, and at least one second connecting rod; the fixing seat body includes at least one arm receiving slot, at least one first long slot, and at least one second long slot; the at least one rocker arm is received in the at least one arm receiving slot, the at least one first connecting rod passes through the at least one first long slot and is pivotally connected to one end of the at least one rocker arm, and the at least one movable stopper; the at least one second connecting rod passes through the at least one second long slot and is pivotally connected to the at least one movable stopper.

3. The chip fixing device of the test socket according to claim 2, wherein: The at least one first long groove is a horizontal long groove, and the at least one second long groove is an oblique long groove, and one end of the second second groove adjacent to the at least one first long groove extends toward the upper surface of the fixing seat body.

4. The chip fixing device of the test socket according to claim 2, wherein: The fixing seat body also includes a longitudinal guide groove, which is connected to the at least one arm receiving groove; the at least one rocker arm includes a fixed end and a movable end, the at least one first connecting rod is pivotally connected to the fixed end, and the movable end is provided with a guiding protrusion, which is received in the longitudinal guide groove and is guided by the longitudinal guide groove to perform lifting and lowering movements.

5. The chip fixing device of the test seat according to claim 4, further comprising at least one return spring, which is arranged between the fixing seat body and the at least one movable stopper, and the at least one return spring applies a biasing force to drive the stopper to move toward the first position.

6. The chip fixing device of the test socket according to claim 2, wherein: The at least one movable stopper comprises a main body and a cantilever. The main body is provided with two through holes. The at least one first connecting rod and the at least one second connecting rod are respectively pivotally connected to the two through holes. The stopper is arranged on the cantilever.

7. The chip fixing device of the test seat according to claim 6 further comprises a third connecting rod; the third connecting rod is arranged on the fixing seat body; when the stopper is located at the first position, the lower surface of the cantilever portion of the at least one movable stopper abuts against the third connecting rod.

8. The chip fixing device of the test socket according to claim 1, wherein: When the stopper is located at the first position, the distance between the stopper and the upper surface of the chip to be tested is smaller than the depth of the chip slot of the test seat.

9. A chip fixing device of a test socket, which is configured on the test socket, and the test socket includes a chip slot, which is used to accommodate a chip to be tested; the chip fixing device of the test socket includes: A fixing seat body, comprising a through slot and a receiving slot, the test seat is arranged in the receiving slot, the chip slot of the test seat corresponds to the through slot and is exposed from the upper surface of the fixing seat body; Two movable blocks are arranged in the through slot and correspond to two sides of the chip slot of the test seat, respectively, each movable block includes a stopper; the two movable blocks are controlled so that the stopper moves between a first position and a second position; Among them, the first position refers to the position where the stoppers of the two movable blocks are respectively located on two corresponding sides above the chip to be tested and prevent the chip to be tested from detaching from the chip slot; the second position refers to the position where the stoppers leave the positive projection direction of the chip slot of the test seat and the chip to be tested is able to detach from the chip slot.

10. A chip fixing device for a test socket, which is arranged on the test socket, and the test socket includes a chip slot for accommodating a chip to be tested; the chip fixing device for the test socket includes: A fixed seat body, comprising a seat groove, a through groove, four arm grooves, two first long grooves, and two second long grooves; the through groove and the arm grooves penetrate the upper and lower surfaces of the fixed seat body; the test seat is arranged in the seat groove, the chip slot of the test seat corresponds to the through groove and is exposed from the upper surface of the fixed seat body; the four arm grooves are arranged outside the four corners of the through groove; the two first long grooves and the two second long grooves penetrate the two side end surfaces of the fixed seat body and are respectively located on both sides of the test seat; Two movable blocks are arranged in the through slot and correspond to two sides of the chip slot of the test seat, respectively, each movable block includes a stopper; the two movable blocks are controlled so that the stopper moves between a first position and a second position; Two pairs of rocker arms, which are respectively arranged on both sides of the two movable stoppers and accommodated in four arm-accommodating slots, each rocker arm comprising a fixed end and a movable end; as well as Two first connecting rods and two second connecting rods, each first connecting rod passes through the first long slots and is pivotally connected to the fixed end of the rocker arm and the movable stopper; each second connecting rod passes through the second long slots and is pivotally connected to the movable stopper; Among them, the second position refers to when the movable ends of the two pairs of rocker arms are pushed by external force, and the rocker arms drive the movable stop block to make the stop member leave the position above the direct projection direction of the chip slot of the test seat; the first position refers to when the external force is cancelled, and the stop member is located at the position above the direct projection direction of the chip slot of the test seat.

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