A train device testing method, device, equipment and medium

Abstract

The present invention discloses a train device testing method, device, equipment and medium, which relates to the field of rail train technology, in order to solve the problem that various network devices of high-speed trains cannot be detected. The train device testing method comprises: obtaining a test instruction including a device identification of a device to be tested, confirming the type information of the device to be tested based on the device identification, providing a corresponding test drive signal for the device to be tested according to the type information, receiving the operation data generated by the device to be tested under the test drive signal, parsing the operation data, and obtaining the test result of the device to be tested. The train device testing method provided by the present invention is used to detect various network devices of high-speed trains.

Description

Technical Field

[0001] The present invention relates to the technical field of rail vehicles, and in particular to a method, device, equipment and medium for testing train components. Background Art

[0002] High-speed trains are modern high-speed transportation tools, and are the embodiment of the most advanced scientific and technological means of trains. They can significantly increase the speed of train travel, thereby improving train transportation efficiency. High-speed trains are fast, comfortable, stable, and safe, and are very popular among contemporary people. Countries around the world strongly support the use of new high-speed trains to meet the growing travel needs.

[0003] As train speeds continue to increase, once a failure occurs, it will have serious consequences. Therefore, train fault detection becomes more important. As train control systems become increasingly complex, in the existing testing process, for the testing of each device in the train, it is necessary to set up a separate test bench for each device and use the corresponding test methods to complete the test. For example, there are more than ten types of network equipment in high-speed trains. The existing train fault detection method can only detect one type of network equipment, which requires more hardware equipment support. In addition, when a device fails, the device needs to be returned to the factory for inspection and repair, which seriously reduces the efficiency of inspection and repair. At present, there is no train fault detection method that can detect all kinds of network equipment in the train.

[0004] Therefore, there is an urgent need for a virtual train platform to integrate all the equipment in the train and simulate the functions and actual operating conditions of each equipment in the train. Summary of the invention

[0005] The object of the present invention is to provide a train device testing method, device, equipment and medium for solving the problem of detecting various network devices in a high-speed train.

[0006] In order to achieve the above object, the present invention provides the following technical solutions:

[0007] On the one hand, an embodiment of the present specification provides a train device testing method, which is applied to a virtual train, in which various network devices and corresponding operating systems corresponding to those in a real train are provided; the train device testing method includes:

[0008] Obtaining a test instruction; wherein the test instruction includes a device identification of the device to be tested;

[0009] Based on the device identification, confirm the type information of the device to be tested;

[0010] Providing a corresponding test drive signal to the device under test according to the type information of the device under test;

[0011] Receiving operation data generated by the device under test when driven by the test drive signal; the operation data includes state information and operating parameters of the device under test;

[0012] The operating data is parsed to obtain a test result of the device under test.

[0013] On the other hand, an embodiment of the present specification provides a train device testing device, including:

[0014] Test instruction acquisition module: used to acquire test instructions; the test instructions include the device identification of the device to be tested;

[0015] A device type confirmation module for confirming the type information of the device to be tested based on the device identification;

[0016] A device under test driving module, used for providing a corresponding test driving signal to the device under test according to the type information of the device under test;

[0017] An operation data receiving module, used for receiving the operation data generated by the device under test when driven by the test drive signal; the operation data includes the state and working parameters of the device under test;

[0018] The test result output module is used to analyze the operation data to obtain the test result of the device under test.

[0019] On the other hand, an embodiment of the present specification provides a train device to be tested, including a processor and a communication interface coupled to the processor; the processor is used to run a computer program or instruction to implement the above-mentioned train device testing method.

[0020] On the other hand, an embodiment of the present specification provides a computer storage medium, wherein the computer storage medium stores instructions, and when the instructions are executed, the above-mentioned train device testing method is implemented.

[0021] Compared with the prior art, in a train device testing method provided by the present invention, a test instruction is obtained, the test instruction includes a device identification of a device to be tested; based on the device identification, the type information of the device to be tested is confirmed; according to the type information of the device to be tested, a corresponding test drive signal is provided to the device to be tested; operating data generated by the device to be tested under the drive of the test drive signal is received; the operating data is parsed to obtain a test result of the device to be tested; the test instruction includes the identification information of the device to be tested, so that the device to be tested that needs to be tested can be accurately found among more than ten types of network devices in the train, and providing the device with a corresponding test drive signal according to the device type of the device to be tested can enable the device to simulate the actual device operating status, and the operating data generated by it can be parsed, thereby realizing the detection of each device in the train, thereby improving the detection efficiency and maintenance efficiency of train devices. BRIEF DESCRIPTION OF THE DRAWINGS

[0022] The drawings described herein are used to provide a further understanding of the present invention and constitute a part of the present invention. The exemplary embodiments of the present invention and their descriptions are used to explain the present invention and do not constitute an improper limitation of the present invention. In the drawings:

[0023] Figure 1 A flow chart of a train device testing method provided in an embodiment of this specification;

[0024] Figure 2 This is a schematic diagram of the structure of a train device testing device provided in an embodiment of this specification;

[0025] Figure 3 This is a schematic diagram of the structure of a train device testing equipment provided in an embodiment of this specification. DETAILED DESCRIPTION

[0026] In order to clearly describe the technical solutions of the embodiments of the present invention, in the embodiments of the present invention, words such as "first" and "second" are used to distinguish the same items or similar items with basically the same functions and effects. For example, the first threshold and the second threshold are only used to distinguish different thresholds, and their order is not limited. Those skilled in the art can understand that words such as "first" and "second" do not limit the quantity and execution order, and words such as "first" and "second" do not necessarily limit them to be different.

[0027] It should be noted that, in the present invention, words such as "exemplary" or "for example" are used to indicate examples, illustrations or descriptions. Any embodiment or design described as "exemplary" or "for example" in the present invention should not be interpreted as being more preferred or more advantageous than other embodiments or designs. Specifically, the use of words such as "exemplary" or "for example" is intended to present related concepts in a specific way.

[0028] In the present invention, "at least one" means one or more, and "plurality" means two or more. "And / or" describes the association relationship of associated objects, indicating that three relationships may exist. For example, A and / or B can mean: A exists alone, A and B exist at the same time, and B exists alone, where A and B can be singular or plural. The character " / " generally indicates that the associated objects before and after are in an "or" relationship. "At least one of the following" or similar expressions refers to any combination of these items, including any combination of single or plural items. For example, at least one of a, b or c can mean: a, b, c, the combination of a and b, the combination of a and c, the combination of b and c, or the combination of a, b and c, where a, b, c can be single or multiple.

[0029] High-speed trains contain more than ten types of network equipment. If some of the network equipment fails, they need to be sent to the original foreign factory for repair. The repair cycle is long and the price is high. At the same time, the existing high-speed train fault detection method can only detect a single network device and cannot detect various equipment in the high-speed train.

[0030] Based on this, the present invention proposes a train device testing method, device, equipment and medium, which can detect various network devices in high-speed trains. Next, the embodiments of this specification are described in conjunction with the accompanying drawings:

[0031] Figure 1 This is a flow chart of a train device testing method provided in an embodiment of this specification. This method is applied to a virtual train, in which various network devices and corresponding operating systems corresponding to those in a real train are arranged. From a program perspective, the execution subject of this process may be a controller in the virtual train, such as Figure 1 As shown, the process may include the following steps:

[0032] Step 101: Acquire a test instruction, wherein the test instruction includes a device identification of a device to be tested.

[0033] The test instruction may be issued by the controller in the virtual train or sent to the controller by other subjects, and this specification embodiment does not specifically limit this. The test instruction may be to test a certain network device or to test a certain function in a certain network device.

[0034] Step 102: Based on the device identification, confirm the type information of the device to be tested.

[0035] The type information of the device under test includes: communication type, digital output type, digital input type, analog output type, and analog input type.

[0036] Step 103: providing a corresponding test drive signal for the device under test according to the type information of the device under test.

[0037] High-speed trains contain more than ten types of network devices. Testing each type of network device requires a different test drive signal. The test drive signal can be provided by a controller in the virtual train to control the network devices in the virtual train for the device under test, or it can be provided by an externally connected device.

[0038] Step 104: receiving operation data generated by the device under test when driven by the test drive signal.

[0039] The operation data includes the state information and working parameters of the device under test. The state information is whether the device under test is running, and the working parameters are the voltage value, resistance value, temperature value or waveform signal size generated by the device under test after receiving the test drive signal.

[0040] Step 105: Analyze the operation data to obtain the test result of the device under test.

[0041] The operation data can be analyzed by using dedicated test software, which can test various devices in the high-speed train and can also be used to control the train control unit in the virtual train.

[0042] Specifically, before the above step of providing a corresponding test drive signal to the device under test according to the type information of the device under test, the following may also be included:

[0043] Establishing a mapping relationship between the device type of each device of the virtual train and the test drive signal;

[0044] The mapping relationship is stored.

[0045] The mapping relationship is stored in a memory by setting computer program instructions, and the controller in the virtual train can read the instructions in the memory.

[0046] Specifically, after the operation data is parsed in the above steps and the test results of the equipment to be tested are obtained, the test results can be transmitted to a display arranged in the virtual train for display, thereby realizing visualization of the test results.

[0047] The displayed content includes whether each item in each device is faulty and the operating status of the tested device, such as voltage value, current value, etc. It can also display the numerical value of a given test drive signal, such as load size, temperature value, signal size, etc.

[0048] Figure 1The above method provides a train device testing method, which obtains a test instruction, wherein the test instruction includes a device identification of the device to be tested; based on the device identification, confirms the type information of the device to be tested; according to the type information of the device to be tested, provides a corresponding test drive signal for the device to be tested; receives the operating data generated by the device to be tested under the drive of the test drive signal; analyzes the operating data to obtain the test result of the device to be tested; the test instruction includes the identification information of the device to be tested, which can accurately find the device to be tested among more than ten types of network devices in the train, and providing the device with a corresponding test drive signal can enable the device to simulate the actual device operating status, and analyze the operating data generated by it, thereby realizing the detection of the device to be tested. The test instruction can be an instruction to test a single device to be tested, or an instruction to test a single function in the device to be tested, thereby realizing not only the detection of multiple devices in the high-speed train, but also the detection of a single functional point of a single device.

[0049] based on Figure 1 The present specification also provides some specific embodiments of the method, which are described below.

[0050] The above-mentioned device to be tested may be a train control unit, a temperature acquisition module, an input / output module or a human-machine exchange interface.

[0051] Example 1

[0052] When the device to be tested is a train control unit, the controller in the virtual train obtains a test instruction for testing the train control unit, and based on the test instruction, provides the train control unit with a corresponding test drive signal: a level signal of a programmable power supply, a waveform signal of a signal generator, and a test load signal; the controller controls the train control unit to receive the level signal of the programmable power supply, the waveform signal of the signal generator, and / or collects a load signal of the test load;

[0053] The controller receives the operation data generated by the operation of the train control unit at this time, and the operation data is the size of the waveform signal of the signal generator received by the train control unit and / or the load value of the collected test load.

[0054] The operation data is read and analyzed by special test software to obtain the test result of the train control unit, and the test result is sent to the display for display to complete the test.

[0055] The train control unit contains multiple functional points, each of which requires a different test drive signal. Some functional points require a waveform signal from a signal generator for testing, while others require a load signal from a test load for testing. When a waveform signal from a signal generator is required for testing, the signal value after the train control unit receives the waveform signal is collected. When the signal value is consistent with the expected data, it means that the train control unit is normal, otherwise the train control unit is faulty. When a given load signal is required for testing, the operating data after the train control unit is connected to the load is collected. If the operating data at this time has a current connected, it means that the train control unit is normal, otherwise the train control unit is faulty.

[0056] Example 2

[0057] When the device to be tested is a temperature acquisition module, the controller in the virtual train obtains a test instruction for testing the temperature acquisition module, and based on the test instruction, provides the temperature acquisition module with a corresponding test drive signal: a level signal of a programmable power supply and a temperature signal of a temperature sensor; the controller controls the temperature acquisition module to receive the level signal of the programmable power supply and to acquire the temperature value of the temperature sensor;

[0058] The controller receives the operation data generated by the operation of the temperature acquisition module at this time, and the operation data is the temperature value of the temperature sensor acquired by the temperature acquisition module.

[0059] The operating data is read and analyzed by dedicated test software to obtain the test result of the temperature acquisition module, and the test result is sent to a display for display to complete the test.

[0060] When the temperature value collected by the temperature acquisition module to be tested is within the temperature value range of the given temperature sensor, the temperature acquisition module is normal, otherwise the temperature acquisition module is faulty.

[0061] Example 3

[0062] When the device to be tested is the input-output module, the controller in the virtual train obtains a test instruction for testing the input-output module, and based on the test instruction, provides the input-output module with a corresponding test drive signal: a level signal of a programmable power supply, a waveform signal of a signal generator, and a load signal of a test load; the controller controls the input module to receive the level signal of the programmable power supply and the waveform signal of the signal generator; and controls the output module to collect the load signal of the test load;

[0063] The controller receives the operation data generated by the operation of the input and output modules at this time. The operation data is the load parameters of the test load collected by the output module and the waveform signal size of the signal generator received by the input module.

[0064] The operation data is read and analyzed by dedicated test software to obtain the test results of the input and output modules, and the test results are sent to a display for display to complete the test.

[0065] For the input module, when the operating data generated after the input module receives the waveform signal sent by the signal generator is consistent with the expected data, the input module is normal, otherwise the input module is faulty; for the output module, when the output module collects the load parameters of the test load and generates operating data, if the operating data at this time has a connected current, it means that the output module is normal, otherwise the output module is faulty.

[0066] Example 4

[0067] When the device to be tested is a human-machine exchange interface, the controller in the virtual train obtains a test instruction for testing the human-machine exchange interface, and based on the test instruction, provides the human-machine exchange interface with a corresponding test drive signal: a level signal of a programmable power supply, a test light source signal, and an external input hardware signal; the controller controls the human-machine exchange interface to receive the level signal of the programmable power supply, the external input hardware signal, and the test light source signal;

[0068] The controller receives the operation data generated by the operation of the human-machine exchange interface at this time, and the operation data is the information of the external input hardware received by the human-machine exchange interface and the brightness value of the accompanying test light source.

[0069] The operation data is read and analyzed by dedicated test software to obtain the test result of the human-machine exchange interface, and the test result is sent to a display for display to complete the test.

[0070] The human-machine exchange interface is a device with display function for train operators to interact with the train. The external input hardware can be input devices such as keyboard and mouse. The test light source is a device that can generate light and is used to test the display function of the human-machine exchange interface.

[0071] When the human-machine exchange interface receives the information of the external input hardware and the brightness value of the test light source, and the human-machine exchange interface performs the corresponding operation of the external input hardware information and displays the brightness of the test light source, the human-machine exchange interface is normal, otherwise the human-machine exchange interface fails.

[0072] Through the train device testing method, the above-mentioned train control unit, temperature acquisition module, input and output module or human-machine exchange interface can be detected. At the same time, the embodiments in this specification are only examples of the application of this method. More than ten types of network devices included in high-speed trains can be detected using this method.

[0073] Based on the same idea, an embodiment of this specification also provides a device corresponding to the above method, which is applied to a virtual train, and the virtual train is provided with various network devices and a corresponding operating system corresponding to the real train. Figure 2 Schematic diagram of the structure of a train device testing device provided in the embodiments of this specification. Figure 2 As shown, the device may include:

[0074] Test instruction acquisition module 201: used to acquire a test instruction; the test instruction includes a device identification of the device to be tested;

[0075] The device type confirmation module 202 is used to confirm the type information of the device under test based on the device identification;

[0076] The device under test driving module 203 is used to provide a corresponding test driving signal for the device under test according to the type information of the device under test;

[0077] The operation data receiving module 204 is used to receive the operation data generated by the device under test when driven by the test drive signal; the operation data includes the state and working parameters of the device under test;

[0078] The test result output module 205 is used to analyze the operation data to obtain the test result of the device under test.

[0079] based on Figure 2 The present specification also provides a specific implementation scheme of the device, which will be described below.

[0080] Optionally, the device may further include a mapping storage module, which is used to establish a mapping relationship between the device type of each device in the virtual train and the test drive signal; and store the mapping relationship.

[0081] Optionally, the device may further include a display module, used for transmitting the test result to a display for display, and the display is a display arranged in the virtual train.

[0082] Optionally, the device to be tested includes a train control unit, a temperature acquisition module, an input / output module or a human-machine exchange interface;

[0083] When the device under test is the train control unit, the driving signal is a level signal of a programmable power supply, a waveform signal of a signal generator, and a test load signal; the operation data receiving module can be specifically used for:

[0084] Controlling the train control unit to receive the level signal of the programmable power supply;

[0085] Based on the test instruction, control the train controller to receive the waveform signal of the signal generator and / or collect the load signal of the accompanying test load;

[0086] The operating data generated by the train control unit is received, wherein the operating data is the waveform signal size of the signal generator and / or the load parameters of the accompanying test load.

[0087] Optionally, when the device under test is the temperature acquisition module, the test drive signal is a level signal of the programmable power supply and a temperature signal of a temperature sensor; the operation data receiving module can be specifically used for:

[0088] Control the temperature acquisition module to receive the level signal of the programmable power supply and acquire the temperature value of the temperature sensor;

[0089] The operating data generated by the temperature acquisition module is received, where the operating data is the temperature value acquired by the temperature acquisition module.

[0090] Optionally, when the device under test is the input-output module, the test drive signal is the level signal of the programmable power supply, the waveform signal of the signal generator and the load signal of the accompanying test load; the operation data receiving module can be specifically used for:

[0091] The control input module receives the level signal of the programmable power supply and the waveform signal of the signal generator;

[0092] Controlling the output module to collect the load signal of the accompanying test load;

[0093] The operating data generated by the input-output module is received, wherein the operating data is the load parameter of the test load collected by the output module and the waveform signal size of the signal generator received by the input module.

[0094] Optionally, when the device under test is the human-machine exchange interface, the test drive signal is a level signal of the programmable power supply, a test light source signal and an external input hardware signal; the operation data receiving module can be specifically used for:

[0095] Controlling the human-machine exchange interface to receive the level signal of the programmable power supply, the external input hardware signal and the accompanying test light source signal;

[0096] The operating data generated by the human-machine exchange interface is received, wherein the operating data is the information of the external input hardware and the brightness value of the accompanying test light source.

[0097] All relevant contents of each step of the above method embodiment design can be referred to the functional description of the corresponding functional module and will not be repeated here.

[0098] In the case of using the corresponding integrated unit, Figure 3 The structure diagram of a train device testing device provided in the embodiment of this specification is shown. The device is applied to a virtual train, and the virtual train is provided with various network devices and corresponding operating systems corresponding to the real train. Figure 3 As shown, the train test equipment may include:

[0099] A communication unit / communication interface, used to obtain test instructions;

[0100] A processing unit / processor, configured to confirm the type information of the device to be tested based on the device identification;

[0101] Providing a corresponding test drive signal to the device under test according to the type information of the device under test;

[0102] Receiving operation data generated by the device under test when driven by the test drive signal; the operation data includes state information and operating parameters of the device under test;

[0103] The operating data is parsed to obtain a test result of the device under test.

[0104] like Figure 3 As shown, the terminal device may also include a communication line. The communication line may include a path to transmit information between the above components.

[0105] Optional, such as Figure 3 As shown, the terminal device may further include a memory. The memory is used to store computer-executable instructions for executing the solution of the present invention, and the execution is controlled by the processor. The processor is used to execute the computer-executable instructions stored in the memory, thereby implementing the method provided by the embodiment of the present invention.

[0106] like Figure 3As shown, the memory may be a read-only memory (ROM) or other types of static storage devices that can store static information and instructions, a random access memory (RAM) or other types of dynamic storage devices that can store information and instructions, or an electrically erasable programmable read-only memory (EEPROM), a compact disc read-only memory (CD-ROM) or other optical disc storage, optical disc storage (including compressed optical disc, laser disc, optical disc, digital versatile disc, Blu-ray disc, etc.), a magnetic disk storage medium or other magnetic storage device, or any other medium that can be used to carry or store the desired program code in the form of instructions or data structures and can be accessed by a computer, but is not limited thereto. The memory may exist independently and be connected to the processor through a communication line. The memory may also be integrated with the processor.

[0107] Optionally, the computer-executable instructions in the embodiment of the present invention may also be referred to as application program codes, which is not specifically limited in the embodiment of the present invention.

[0108] In a specific implementation, as an example, Figure 3 As shown, the processor may include one or more CPUs, such as Figure 3 CPU0 and CPU1 in.

[0109] In a specific implementation, as an example, Figure 3 As shown, the terminal device may include multiple processors, such as Figure 3 Each of these processors can be a single-core processor or a multi-core processor.

[0110] Based on the same idea, an embodiment of the present invention further provides a computer storage medium corresponding to the above embodiment, wherein the computer storage medium stores instructions, and when the instructions are executed, it is used to implement:

[0111] Obtaining a test instruction; wherein the test instruction includes a device identification of the device to be tested;

[0112] Based on the device identification, confirm the type information of the device to be tested;

[0113] Providing a corresponding test drive signal to the device under test according to the type information of the device under test;

[0114] Receiving operation data generated by the device under test when driven by the test drive signal; the operation data includes state information and operating parameters of the device under test;

[0115] The operating data is parsed to obtain a test result of the device under test.

[0116] In the above embodiments, it can be implemented in whole or in part by software, hardware, firmware or any combination thereof. When implemented by software, it can be implemented in whole or in part in the form of a computer program product. The computer program product includes one or more computer programs or instructions. When the computer program or instruction is loaded and executed on a computer, the process or function described in the embodiment of the present invention is executed in whole or in part. The computer can be a general-purpose computer, a special-purpose computer, a computer network, a terminal, a user device or other programmable device. The computer program or instruction can be stored in a computer-readable storage medium, or transmitted from one computer-readable storage medium to another computer-readable storage medium. For example, the computer program or instruction can be transmitted from one website site, computer, server or data center to another website site, computer, server or data center by wired or wireless means. The computer-readable storage medium can be any available medium that can be accessed by a computer or a data storage device such as a server, data center, etc. that integrates one or more available media. The available medium can be a magnetic medium, such as a floppy disk, a hard disk, or a tape; it can also be an optical medium, such as a digital video disc (DVD); it can also be a semiconductor medium, such as a solid state drive (SSD).

[0117] Although the present invention is described herein in conjunction with various embodiments, in the process of implementing the claimed invention, those skilled in the art may understand and implement other variations of the disclosed embodiments by viewing the drawings, the disclosure, and the appended claims. In the claims, the word "comprising" does not exclude other components or steps, and "one" or "an" does not exclude multiple situations. A single processor or other unit may implement several functions listed in the claims. Certain measures are recorded in different dependent claims, but this does not mean that these measures cannot be combined to produce good results.

[0118] Although the present invention has been described in conjunction with specific features and embodiments thereof, it is apparent that various modifications and combinations may be made thereto without departing from the spirit and scope of the present invention. Accordingly, this specification and the accompanying drawings are merely exemplary illustrations of the present invention as defined by the appended claims and are deemed to cover any and all modifications, variations, combinations or equivalents within the scope of the present invention. Obviously, those skilled in the art may make various modifications and variations to the present invention without departing from the spirit and scope of the present invention. Thus, the present invention is intended to include such modifications and variations if they fall within the scope of the claims of the present invention and their equivalents.

Claims

1. A train device testing method, characterized in that: The method is applied to a virtual train, in which various network devices and corresponding operating systems corresponding to those in a real train are arranged; the train device testing method comprises: Obtaining a test instruction; the test instruction includes a device identification of the device to be tested; the device to be tested includes a train control unit, a temperature acquisition module, an input and output module or a human-machine exchange interface; Based on the device identification, confirm the type information of the device to be tested; Providing a corresponding test drive signal to the device under test according to the type information of the device under test; Receiving operation data generated by the device under test when driven by the test drive signal; the operation data includes state information and operating parameters of the device under test; When the device under test is the train control unit, the test drive signal is a level signal of a programmable power supply, a waveform signal of a signal generator, and a test load signal; and receiving the operation data generated by the device under test driven by the test signal includes: Controlling the train control unit to receive the level signal of the programmable power supply; Based on the test instruction, control the train controller to receive the waveform signal of the signal generator and / or collect the load signal of the accompanying test load; Receiving operation data generated by the train control unit, the operation data being the waveform signal size of the signal generator and / or the load parameter of the accompanying test load; When the device under test is the temperature acquisition module, the test drive signal is a level signal of the programmable power supply and a temperature signal of the temperature sensor; and the receiving of the operation data generated by the device under test driven by the test signal includes: Control the temperature acquisition module to receive the level signal of the programmable power supply and acquire the temperature value of the temperature sensor; Receive the operating data generated by the temperature acquisition module, where the operating data is the temperature value acquired by the temperature acquisition module; When the device under test is the input-output module, the test drive signal is the level signal of the programmable power supply, the waveform signal of the signal generator and the load signal of the accompanying test load; the receiving of the operation data generated by the device under test driven by the test signal includes: The control input module receives the level signal of the programmable power supply and the waveform signal of the signal generator; Controlling the output module to collect the load signal of the accompanying test load; Receive the operation data generated by the input-output module, wherein the operation data is the load parameter of the test load collected by the output module and the waveform signal size of the signal generator received by the input module; When the device under test is the human-machine exchange interface, the test drive signal is a level signal of the programmable power supply, a test light source signal and an external input hardware signal; the receiving of the operation data generated by the device under test driven by the test signal includes: Controlling the human-machine exchange interface to receive the level signal of the programmable power supply, the external input hardware signal and the accompanying test light source signal; Receiving operation data generated by the human-machine exchange interface, the operation data being information of the external input hardware and the brightness value of the accompanying test light source; The operating data is parsed to obtain a test result of the device under test.

2. A train device testing method according to claim 1, characterized in that: Before providing a corresponding test drive signal to the device under test according to the type information of the device under test, the method further includes: Establishing a mapping relationship between the device type of each device in the virtual train and the test drive signal; The mapping relationship is stored.

3. A train device testing method according to claim 1, characterized in that: After parsing the operation data and obtaining the test result, the method further includes: transmitting the test result to a display for display, wherein the display is a display arranged in the virtual train.

4. A train device testing device, characterized in that: include: Test instruction acquisition module: used to acquire test instructions; the test instructions include the device identification of the device to be tested; A device type confirmation module for confirming the type information of the device to be tested based on the device identification; the device to be tested includes a train control unit, a temperature acquisition module, an input and output module or a human-machine exchange interface; A device under test driving module, used for providing a corresponding test driving signal to the device under test according to the type information of the device under test; An operation data receiving module, used for receiving the operation data generated by the device under test when driven by the test drive signal; the operation data includes the state and working parameters of the device under test; When the device under test is the train control unit, the driving signal is a level signal of a programmable power supply, a waveform signal of a signal generator, and a test load signal; the operation data receiving module is specifically used for: Controlling the train control unit to receive the level signal of the programmable power supply; Based on the test instruction, control the train controller to receive the waveform signal of the signal generator and / or collect the load signal of the accompanying test load; Receiving operation data generated by the train control unit, the operation data being the waveform signal size of the signal generator and / or the load parameter of the accompanying test load; When the device under test is the temperature acquisition module, the test drive signal is the level signal of the programmable power supply and the temperature signal of the temperature sensor; the operation data receiving module can be specifically used for: Control the temperature acquisition module to receive the level signal of the programmable power supply and acquire the temperature value of the temperature sensor; Receive the operating data generated by the temperature acquisition module, where the operating data is the temperature value acquired by the temperature acquisition module; When the device under test is the input-output module, the test drive signal is the level signal of the programmable power supply, the waveform signal of the signal generator and the load signal of the accompanying test load; the operation data receiving module is specifically used for: The control input module receives the level signal of the programmable power supply and the waveform signal of the signal generator; Controlling the output module to collect the load signal of the accompanying test load; Receive the operation data generated by the input-output module, wherein the operation data is the load parameter of the test load collected by the output module and the waveform signal size of the signal generator received by the input module; When the device under test is the human-machine exchange interface, the test drive signal is the level signal of the programmable power supply, the accompanying test light source signal and the external input hardware signal; the operation data receiving module is specifically used for: Controlling the human-machine exchange interface to receive the level signal of the programmable power supply, the external input hardware signal and the accompanying test light source signal; Receiving operation data generated by the human-machine exchange interface, the operation data being information of the external input hardware and the brightness value of the accompanying test light source; The test result output module is used to analyze the operation data to obtain the test result of the device under test.

5. A train device to be tested, characterized in that: It comprises a processor and a communication interface coupled to the processor; the processor is used to run a computer program or instruction to implement the train device testing method as claimed in any one of claims 1 to 3.

6. A computer storage medium, characterized in that: The computer storage medium stores instructions, and when the instructions are executed, the train device testing method according to any one of claims 1 to 3 is implemented.

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