A wavelength calibration method, device, electronic device and storage medium

Abstract

An embodiment of the present application discloses a wavelength calibration method, apparatus, electronic device, and storage medium. Among them, the method includes: obtaining a spectral image corresponding to each column of wavelength channels in at least two columns of wavelength channels on a chip to be calibrated; determining a central wavelength value corresponding to each column of wavelength channels based on the spectral image; performing linear interpolation processing between the central wavelength values corresponding to any two adjacent columns of wavelength channels among the at least two columns of wavelength channels to determine a wavelength value corresponding to each pixel column in each column of wavelength channels.

Description

Technical Field

[0001] The present application relates to the field of optical communication technologies, and in particular, to a wavelength calibration method, apparatus, electronic device, and storage medium. Background Art

[0002] Due to its ability to provide free switching of any optical wavelength to any port and its precise optical power attenuation control function, the wavelength selective switch (WSS) has become a key device in a reconfigurable optical add-drop multiplexer (ROADM) system and has been widely used in intelligent optical networks. To enable the WSS to achieve free switching of any wavelength to any port and precise optical power attenuation control function, the WSS must be calibrated. The WSS consists of conventional free-space optical coupling elements and a core optical chip, where the core optical chip is the key part of the WSS device, and the calibration of the WSS is also the calibration of the optical chip.

[0003] However, the current calibration method calibrates each wavelength, each port, and each attenuation level one by one, which is inefficient and time-consuming, and is not conducive to the large-scale production of WSS. Summary of the Invention

[0004] Embodiments of the present application are expected to provide a wavelength calibration method, apparatus, electronic device, and storage medium.

[0005] The technical solution of the present application is implemented as follows:

[0006] An embodiment of the first aspect of the present application provides a wavelength calibration method, where the wavelength calibration method includes:

[0007] Obtain spectral images corresponding to each column of wavelength channels in at least two columns of wavelength channels on the chip to be calibrated;

[0008] Based on the spectral images, determine the central wavelength values corresponding to each column of wavelength channels;

[0009] Perform linear interpolation processing on the central wavelength values corresponding to any two adjacent columns of wavelength channels among the at least two columns of wavelength channels to determine the wavelength values corresponding to each pixel column in each column of wavelength channels.

[0010] Optionally, the determining the central wavelength values corresponding to each column of wavelength channels based on the spectral images includes:

[0011] Obtain the minimum insertion loss value corresponding to each column of wavelength channels from the spectral images;

[0012] Determine a first wavelength value and a second wavelength value based on the minimum insertion loss value and a preset threshold;

[0013] Determine a wavelength average value based on the first wavelength value and the second wavelength value,

[0014] and use the wavelength average value as the central wavelength value corresponding to each column of wavelength channels.

[0015] Optionally, the performing linear interpolation processing between the central wavelength values corresponding to any two adjacent columns of wavelength channels among the at least two columns of wavelength channels to determine the wavelength value corresponding to each pixel column in each column of wavelength channels includes:

[0016] Obtain a first central wavelength value corresponding to a first wavelength channel and a second central wavelength value corresponding to a second wavelength channel; the first wavelength channel is any one of the at least two columns of wavelength channels; the second wavelength channel is a column of wavelength channels adjacent to the first wavelength channel among the at least two columns of wavelength channels;

[0017] Determine the wavelength difference between the first central wavelength value and the second central wavelength value, and the total number of pixel columns between the pixel column corresponding to the first central wavelength and the pixel column corresponding to the second central wavelength;

[0018] Based on the wavelength difference and the total number of pixel columns, perform linear interpolation processing on the first central wavelength value and the second central wavelength value to determine the wavelength value corresponding to each pixel column in the first wavelength channel and the second wavelength channel.

[0019] Optionally, the method further includes:

[0020] Determine the maximum wavelength value and the minimum wavelength value corresponding to each column of wavelength channels based on the multiple wavelength values obtained after linear interpolation processing;

[0021] Determine the wavelength range corresponding to each column of wavelength channels based on the maximum wavelength value and the minimum wavelength value.

[0022] An embodiment of the second aspect of the present application provides a wavelength calibration device, where the wavelength calibration device includes:

[0023] An acquisition module, configured to acquire a spectral image corresponding to each column of wavelength channels on a chip to be calibrated;

[0024] A first determination module, configured to determine the central wavelength value corresponding to each column of wavelength channels based on the spectral image;

[0025] A second determination module, configured to perform linear interpolation processing on the central wavelength values respectively corresponding to any two adjacent wavelength channels among the at least two columns of wavelength channels, and determine the wavelength value corresponding to each pixel column in each column of wavelength channels.

[0026] Optionally, the first determination module is specifically configured to:

[0027] Obtain the minimum insertion loss value corresponding to each column of wavelength channels from the spectral image;

[0028] Based on the minimum insertion loss value and a preset threshold, determine a first wavelength value and a second wavelength value;

[0029] Determine a wavelength average value based on the first wavelength value and the second wavelength value,

[0030] Take the wavelength average value as the central wavelength value corresponding to each column of wavelength channels.

[0031] Optionally, the second determination module is specifically configured to:

[0032] Obtain a first central wavelength value corresponding to a first wavelength channel and a second central wavelength value corresponding to a second wavelength channel; the first wavelength channel is any one of the at least two columns of wavelength channels; the second wavelength channel is a column of wavelength channels adjacent to the first wavelength channel among the at least two columns of wavelength channels;

[0033] Determine the wavelength difference between the first central wavelength value and the second central wavelength value, and the total number of pixel columns separated between the pixel column corresponding to the first central wavelength and the pixel column corresponding to the second central wavelength;

[0034] Based on the wavelength difference and the total number of pixel columns, perform linear interpolation processing on the first central wavelength value and the second central wavelength value, and determine the wavelength value corresponding to each pixel column in the first wavelength channel and the second wavelength channel.

[0035] Optionally, the apparatus further includes a third determination module, and the third determination module is configured to:

[0036] Based on the multiple wavelength values obtained after linear interpolation processing, determine the maximum wavelength value and the minimum wavelength value corresponding to each column of wavelength channels;

[0037] Based on the maximum wavelength value and the minimum wavelength value, determine the wavelength range corresponding to each column of wavelength channels.

[0038] An embodiment of the third aspect of the present application provides an electronic device, including:

[0039] A memory, configured to store executable instructions;

[0040] A processor, when executing the executable instructions stored in the memory, implements the wavelength calibration method according to any one of claims 1 to 4.

[0041] An embodiment of the fourth aspect of the present application provides a computer-readable storage medium, on which a computer program is stored. When the computer program is executed by a processor, any step in the above method is implemented.

[0042] A data processing method and system provided by an embodiment of the present application. The wavelength calibration method includes: obtaining a spectral image corresponding to each column of wavelength channels in at least two columns of wavelength channels on a chip to be calibrated; determining a central wavelength value corresponding to each column of wavelength channels based on the spectral image; performing linear interpolation processing on the central wavelength values corresponding to any two adjacent columns of wavelength channels among the at least two columns of wavelength channels to determine the wavelength value corresponding to each pixel column in each column of wavelength channels. By adopting the technical solution of the present application, by determining the central wavelength value corresponding to each column of wavelength channels on the optical chip and performing interpolation processing based on the central wavelength value, the wavelength value corresponding to each pixel column can be obtained, thereby realizing accurate calibration of the chip to be calibrated, improving the calibration efficiency, and reducing the calibration time. Description of the Drawings

[0043] Figure 1 It is a schematic flowchart of a wavelength calibration method provided by an embodiment of the present application;

[0044] Figure 2 It is a schematic diagram showing the change of the intensity of the emitted light wave with the wavelength provided by an embodiment of the present application;

[0045] Figure 3 It is a schematic structural diagram of a wavelength calibration device provided by an embodiment of the present application;

[0046] Figure 4 It is a schematic structural diagram of a wavelength calibration system provided by an embodiment of the present application;

[0047] Figure 5 It is a schematic structural diagram of a wavelength calibration device provided by a specific embodiment of the present application. Detailed Embodiments

[0048] Next, the technical solutions in the embodiments of the present application will be clearly and completely described in conjunction with the accompanying drawings in the embodiments of the present application. Obviously, the described embodiments are only a part of the embodiments of the present application, rather than all the embodiments. All other embodiments obtained by those of ordinary skill in the art based on the embodiments of the present application without creative efforts shall fall within the protection scope of the present application.

[0049] In addition, the accompanying drawings are only schematic illustrations of the present application and are not necessarily drawn to scale. The same reference numerals in the drawings denote the same or similar parts, and thus repeated descriptions thereof will be omitted. Some of the block diagrams shown in the drawings are functional entities and do not necessarily correspond to physically or logically independent entities. These functional entities can be implemented in software form, or implemented in one or more hardware modules or integrated circuits, or implemented in different networks and / or processor devices and / or microcontroller devices.

[0050] The flowcharts shown in the accompanying drawings are only illustrative and do not necessarily include all steps. For example, some steps can be further decomposed, while some steps can be combined or partially combined. Therefore, the actual execution order may be changed according to the actual situation.

[0051] The purpose of the terms used herein is only to describe specific embodiments and is not a limitation of the present application. When used herein, the singular forms "a", "an" and "the" are also intended to include the plural forms unless the context clearly indicates otherwise. It should also be understood that the terms "comprising" and / or "including", when used in this specification, determine the presence of the described features, integers, steps, operations, elements and / or components, but do not exclude the presence or addition of one or more other features, integers, steps, operations, elements, components and / or groups. When used herein, the term "and / or" includes any and all combinations of the related listed items.

[0052] In the related art, when calibrating an optical chip in a wavelength selection device, calibration is often performed for each wavelength, each port, and each attenuation level one by one. This method has a large computational workload, resulting in low efficiency and long time consumption.

[0053] An embodiment of the present application provides a wavelength calibration method, which is applied to an electronic device. The functions implemented by this method can be achieved by a processor in the electronic device calling program code. Of course, the program code can be stored in a computer storage medium. It can be seen that the electronic device at least includes a processor and a storage medium. As an example, the electronic device can be a mobile phone, a computer, a terminal, an information transceiver device, a tablet device, a personal digital assistant, etc.

[0054] In some embodiments, please refer to Figure 1 , Figure 1 which is a schematic flowchart of a wavelength calibration method provided by an embodiment of the present application; an embodiment of the present application provides a wavelength calibration method including:

[0055] S110, obtaining spectral images corresponding to each column of wavelength channels in at least two columns of wavelength channels on the chip to be calibrated.

[0056] In this embodiment, the chip to be calibrated may be an optical chip on a wavelength selective switch. The chip to be calibrated may include two or more columns of wavelength channels, and each column of wavelength channels may include at least one pixel column. Here, preferably, each column of wavelength channels includes the same number of pixel columns.

[0057] Exemplarily, the wavelength selective switch is wavelength scanned by a wavelength scanning system, and based on the obtained spectrum, the wavelength channels are sequentially labeled according to the principle from short wavelength to long wavelength, such as wavelength channel 1, wavelength channel 2, wavelength channel 3... wavelength channel m. Among them, wavelength channel 1 includes the 1st to Nth pixel columns, wavelength channel 2 includes the (N + 1)th to 2Nth pixel columns, wavelength channel 3 includes the (2N + 1)th to 3Nth pixel columns... wavelength channel m includes the (N(m - 1)+1)th to mNth pixel columns. Here, N≥1 and m≥2.

[0058] S120. Based on the spectral image, determine the central wavelength value corresponding to each column of wavelength channels.

[0059] Based on the above example, the central wavelength value corresponding to wavelength channel 1 is the wavelength value λ1 corresponding to the N / 2th pixel column, the central wavelength value corresponding to wavelength channel 2 is the wavelength value λ2 corresponding to the (N / 2 + N)th pixel column, the central wavelength value corresponding to wavelength channel 3 is the wavelength value λ3 corresponding to the (N / 2 + 2N)th pixel column... the central wavelength value corresponding to wavelength channel m is the wavelength value λm corresponding to the (N / 2+(m - 1)N)th pixel column.

[0060] S130. Perform linear interpolation between the central wavelength values corresponding to any two adjacent columns of wavelength channels among at least two columns of wavelength channels to determine the wavelength value corresponding to each pixel column in each column of wavelength channels.

[0061] In this embodiment, interpolation is performed between the central wavelength value λ1 corresponding to wavelength channel 1 and the central wavelength value λ2 corresponding to wavelength channel 2. For example, calculate the difference Δλ between the central wavelength values corresponding to wavelength channel 1 and wavelength channel 2. Since there are N pixel columns between the two central wavelengths, interpolation can be performed at an amplitude of Δλ / N, that is, the wavelength value of the latter pixel column increases by Δλ / N relative to the previous pixel column. The interpolation between wavelength channel 2, wavelength channel 3... wavelength channel m is similar to the foregoing.

[0062] In the embodiment of the present application, by determining the central wavelength value corresponding to each column of wavelength channels on the optical chip and performing interpolation based on the central wavelength value, the wavelength value corresponding to each pixel column can be obtained, without calibrating each pixel column, reducing the workload, improving the calibration efficiency, and reducing the calibration time.

[0063] In some alternative embodiments, please refer to Figure 2, Figure 2 It is a schematic diagram showing the variation of the intensity of the emitted light wave provided by the embodiment of the present application; Step S120 includes:

[0064] Obtain the minimum insertion loss value corresponding to each column of wavelength channels from the spectral image;

[0065] Based on the minimum insertion loss value and a preset threshold, determine the first wavelength value and the second wavelength value;

[0066] Determine the average wavelength based on the first wavelength value and the second wavelength value,

[0067] And use the average wavelength as the central wavelength value corresponding to each column of wavelength channels.

[0068] In an optical system, insertion loss is characterized as the ratio of the intensity of the emitted light after passing through the insertion device to the intensity of the incident light. In this embodiment, the intensity of the incident light corresponding to each wavelength channel is the same. Therefore, the greater the intensity of the emitted light, the smaller the insertion loss.

[0069] Based on the above Figure 1 , the minimum insertion loss value P1 corresponding to each column of wavelength channels can be determined. Here, the minimum insertion loss value represents the intensity of the light wave with the minimum insertion loss. According to the minimum insertion loss value P1 and the spectral image, the left and right two wavelength values λa and λb corresponding to a decrease in intensity of n dB (decibels) can be determined, and the central wavelength value (λa + λb) / 2 can be calculated therefrom. Here, n is a preset threshold, and the specific value can be determined according to actual accuracy requirements or experience.

[0070] It should be noted that usually, the central wavelength value (λa1 + λb1) / 2 corresponding to the first wavelength channel is equal to the wavelength value λ1 corresponding to the N / 2-th pixel column. However, when there is a central wavelength shift, (λa1 + λb1) / 2 is not equal to λ1. Therefore, the central wavelength shift index of each wavelength channel can also be obtained based on (λa1 + λb1) / 2 and λ1. In addition, through the maximum insertion loss value and the minimum insertion loss value in the spectral image, the extinction ratio index of each wavelength channel can also be determined.

[0071] In some alternative embodiments, Step S130 includes:

[0072] Obtain the first central wavelength value corresponding to the first wavelength channel and the second central wavelength value corresponding to the second wavelength channel; the first wavelength channel is any one of at least two columns of wavelength channels; the second wavelength channel is a column of wavelength channels adjacent to the first wavelength channel among at least two columns of wavelength channels;

[0073] Determine the wavelength difference between the first central wavelength value and the second central wavelength value, and the total number of pixel columns separated between the pixel column corresponding to the first central wavelength and the pixel column corresponding to the second central wavelength;

[0074] Based on the wavelength difference and the total number of pixel columns, perform linear interpolation on the first central wavelength value and the second central wavelength value to determine the wavelength value corresponding to each pixel column in the first wavelength channel and the second wavelength channel.

[0075] In this embodiment, the central wavelength value corresponding to each channel can be determined first based on the above scheme, and then interpolation processing can be performed on adjacent wavelength channels.

[0076] Exemplarily, calculate the difference Δλ between the central wavelength values corresponding to wavelength channel 1 and wavelength channel 2 respectively. Since there are N pixel columns between the two central wavelengths, interpolation can be performed at an amplitude of Δλ / N, that is, the wavelength value of the latter pixel column increases by Δλ / N relative to the previous pixel column, and interpolation is performed on the side of wavelength channel 1 far from wavelength channel 2 with the same interpolation amplitude. Similar interpolation is performed between wavelength channel 2, wavelength channel 3... wavelength channel (m - 1), and interpolation processing with the same gradient as the side close to wavelength channel (m - 1) is performed on the side of wavelength channel m far from wavelength channel (m - 1).

[0077] In some alternative embodiments, the method further includes:

[0078] Based on the multiple wavelength values obtained after linear interpolation processing, determine the maximum wavelength value and the minimum wavelength value corresponding to each column of wavelength channels;

[0079] Based on the maximum wavelength value and the minimum wavelength value, determine the wavelength range corresponding to each column of wavelength channels.

[0080] After completing the above interpolation processing, the wavelength corresponding to each pixel column in each column of wavelength channels can be obtained, including the minimum wavelength value corresponding to the first pixel column in wavelength channel 1 and the maximum wavelength value corresponding to the Nth pixel column, the minimum wavelength value corresponding to the (N + 1)th pixel column in wavelength channel 2 and the maximum wavelength value corresponding to the 2Nth pixel column, the minimum wavelength value corresponding to the (2N + 1)th pixel column in wavelength channel 3 and the maximum wavelength value corresponding to the 3Nth pixel column... the minimum wavelength value corresponding to the (N(m - 1) + 1)th pixel column in wavelength channel m and the maximum wavelength value corresponding to the mNth pixel column. Thus, the wavelength range corresponding to each column of wavelength channels can be determined. When it is necessary to allocate the output path of the incident light wave satisfying the above wavelength range, only based on the wavelength of the incident light wave, the incident light wave can be input into the wavelength channel corresponding to the corresponding wavelength range to achieve the wavelength scheduling function.

[0081] In some embodiments, please refer to Figure 3 , Figure 3 is a schematic structural diagram of a wavelength calibration device provided by an embodiment of the present application; an embodiment of the present application provides a wavelength calibration device 300, including:

[0082] An acquisition module 310, configured to acquire spectral images corresponding to each of at least two columns of wavelength channels on a chip to be calibrated.

[0083] In this embodiment, the chip to be calibrated may be an optical chip on a wavelength selective switch. The chip to be calibrated may include two or more columns of wavelength channels, and each column of wavelength channels may include at least one pixel column. Here, preferably, each column of wavelength channels includes the same number of pixel columns.

[0084] Exemplarily, the wavelength selective switch is wavelength scanned by the acquisition module, and based on the obtained spectrum, the wavelength channels are sequentially marked according to the principle from short wavelength to long wavelength, such as wavelength channel 1, wavelength channel 2, wavelength channel 3... wavelength channel m. Among them, wavelength channel 1 includes the 1st to Nth pixel columns, wavelength channel 2 includes the (N + 1)th to 2Nth pixel columns, wavelength channel 3 includes the (2N + 1)th to 3Nth pixel columns... wavelength channel m includes the (N(m - 1)+1)th to mNth pixel columns. Here, N≥1 and m≥2.

[0085] A first determination module 320, configured to determine the central wavelength value corresponding to each column of wavelength channels based on the spectral images.

[0086] Based on the above example, the central wavelength value corresponding to wavelength channel 1 is the wavelength value λ1 corresponding to the N / 2th pixel column, the central wavelength value corresponding to wavelength channel 2 is the wavelength value λ2 corresponding to the (N / 2 + N)th pixel column, the central wavelength value corresponding to wavelength channel 3 is the wavelength value λ3 corresponding to the (N / 2 + 2N)th pixel column... the central wavelength value corresponding to wavelength channel m is the wavelength value λm corresponding to the (N / 2+(m - 1)N)th pixel column.

[0087] A second determination module 330, configured to perform linear interpolation processing on the central wavelength values corresponding to any two adjacent columns of wavelength channels among at least two columns of wavelength channels, and determine the wavelength value corresponding to each pixel column in each column of wavelength channels.

[0088] In this embodiment, interpolation processing is performed between the central wavelength value λ1 corresponding to wavelength channel 1 and the central wavelength value λ2 corresponding to wavelength channel 2. For example, the difference Δλ between the central wavelength values corresponding to wavelength channel 1 and wavelength channel 2 is calculated. Since there are N pixel columns between the two central wavelengths, interpolation can be performed at an amplitude of Δλ / N, that is, the wavelength value of the latter pixel column increases by Δλ / N relative to the previous pixel column. The interpolation processing between wavelength channel 2, wavelength channel 3... wavelength channel m is similar to the foregoing.

[0089] In the embodiments of the present application, by determining the central wavelength value corresponding to each column of wavelength channels on the optical chip and performing interpolation processing based on the central wavelength value, the wavelength value corresponding to each pixel column can be obtained, without the need to calibrate each pixel column, reducing the workload, improving the calibration efficiency, and reducing the calibration time.

[0090] In some alternative embodiments, the first determination module 320 is specifically configured to:

[0091] Obtain the minimum insertion loss value corresponding to each column of wavelength channels from the spectral image;

[0092] Based on the minimum insertion loss value and a preset threshold, determine the first wavelength value and the second wavelength value;

[0093] Determine the average wavelength based on the first wavelength value and the second wavelength value,

[0094] Take the average wavelength as the central wavelength value corresponding to each column of wavelength channels.

[0095] In an optical system, insertion loss is characterized as the ratio of the output light intensity to the input light intensity of a light energy after passing through an insertion device. In this embodiment, the input light intensities corresponding to each wavelength channel are the same. Therefore, the greater the intensity of the output light, the smaller the insertion loss.

[0096] Based on the above Figure 1 , the minimum insertion loss value P1 corresponding to each column of wavelength channels can be determined. Here, the minimum insertion loss value represents the intensity of the light wave with the minimum insertion loss. According to the minimum insertion loss value P1 and the spectral image, the left and right two wavelength values λa, λb corresponding to the intensity drop of n dB (decibel) can be determined, and the central wavelength value (λa + λb) / 2 can be calculated therefrom. Here, n is a preset threshold, and the specific value can be determined according to actual accuracy requirements or experience.

[0097] It should be noted that generally, the central wavelength value (λa1 + λb1) / 2 corresponding to wavelength channel 1 is equal to the wavelength value λ1 corresponding to the N / 2-th pixel column. However, when there is a central wavelength shift, (λa1 + λb1) / 2 is not equal to λ1. Therefore, the central wavelength shift index of each wavelength channel can also be obtained based on (λa1 + λb1) / 2 and λ1. In addition, through the maximum insertion loss value and the minimum insertion loss value in the spectral image, the extinction ratio index of each wavelength channel can also be determined.

[0098] In some alternative embodiments, the second determination module 330 is specifically configured to:

[0099] Obtain the first central wavelength value corresponding to the first wavelength channel and the second central wavelength value corresponding to the second wavelength channel; the first wavelength channel is any one of at least two columns of wavelength channels; the second wavelength channel is a column of wavelength channels adjacent to the first wavelength channel among at least two columns of wavelength channels;

[0100] Determine the wavelength difference between the first central wavelength value and the second central wavelength value, and the total number of pixel columns separated between the pixel column corresponding to the first central wavelength and the pixel column corresponding to the second central wavelength;

[0101] Based on the wavelength difference and the total number of pixel columns, perform linear interpolation processing on the first central wavelength value and the second central wavelength value to determine the wavelength value corresponding to each pixel column in the first wavelength channel and the second wavelength channel.

[0102] Exemplarily, calculate the difference Δλ between the central wavelength values corresponding to wavelength channel 1 and wavelength channel 2 respectively. Since there are N pixel columns between the two central wavelengths, interpolation can be performed at an amplitude of Δλ / N, that is, the wavelength value of the latter pixel column increases by Δλ / N relative to the previous pixel column, and interpolation is performed on the side of wavelength channel 1 far from wavelength channel 2 with the same interpolation amplitude. Similar interpolation is performed between wavelength channel 2, wavelength channel 3... wavelength channel (m - 1), and interpolation processing with the same gradient as the side close to wavelength channel (m - 1) is performed on the side of wavelength channel m far from wavelength channel (m - 1).

[0103] In some alternative embodiments, the wavelength calibration device further includes a third determination module, and the third determination module is configured to:

[0104] Based on the multiple wavelength values obtained after linear interpolation processing, determine the maximum wavelength value and the minimum wavelength value corresponding to each column of wavelength channels;

[0105] Based on the maximum wavelength value and the minimum wavelength value, determine the wavelength range corresponding to each column of wavelength channels.

[0106] After the above interpolation process is completed, the wavelength corresponding to each pixel column in each column of wavelength channels can be obtained, including the minimum wavelength value corresponding to the first pixel column in wavelength channel 1 and the maximum wavelength value corresponding to the Nth pixel column, the minimum wavelength value corresponding to the (N + 1)th pixel column in wavelength channel 2 and the maximum wavelength value corresponding to the 2Nth pixel column, the minimum wavelength value corresponding to the (2N + 1)th pixel column in wavelength channel 3 and the maximum wavelength value corresponding to the 3Nth pixel column... the minimum wavelength value corresponding to the (N(m - 1) + 1)th pixel column in wavelength channel m and the maximum wavelength value corresponding to the mNth pixel column. Thus, the wavelength range corresponding to each column of wavelength channels can be determined. When it is necessary to allocate the output path of the incident light wave satisfying the above wavelength range, it is only necessary to input the incident light wave into the wavelength channel corresponding to the corresponding wavelength range based on the wavelength of the incident light wave, and the wavelength scheduling function can be realized.

[0107] In some embodiments, the embodiment of the present application provides an electronic device, including:

[0108] A memory for storing executable instructions;

[0109] A processor for implementing any step in the above wavelength calibration method when executing the executable instructions stored in the memory.

[0110] Specific examples are as described in the above method examples and will not be elaborated here one by one.

[0111] In some embodiments, please refer to Figure 4 , Figure 4 which is a schematic structural diagram of a wavelength calibration system provided by the embodiment of the present application. A wavelength calibration system provided by the embodiment of the present application includes: a host 410, a selection switch 420, and a scanning device 430;

[0112] The host 410 is configured to control the scanning device to acquire spectral images corresponding to each column of wavelength channels in at least two columns of wavelength channels on the chip to be calibrated; based on the spectral images, determine the central wavelength value corresponding to each column of wavelength channels; perform linear interpolation processing between the central wavelength values corresponding to any two adjacent columns of wavelength channels in at least two columns of wavelength channels to determine the wavelength value corresponding to each pixel column in each column of wavelength channels;

[0113] The selection switch 420 is configured to respond to the control instruction of the host and adjust the switch state of the corresponding wavelength channel;

[0114] The scanning device 430 is configured to respond to the control instruction of the host and acquire the response value of each wavelength point within the scanning range to obtain a spectral image.

[0115] Here, the switch states of the wavelength channels include the open state and the closed state, and only when the wavelength channel is open, light waves are allowed to pass through. The scanning device 430 can be connected to the output port of the selection switch to detect parameters such as the wavelength and intensity of the output light wave. The response value represents the ratio of the intensity of the output light wave to the intensity of the input light wave. For specific examples, please refer to the method examples described above, and will not be elaborated here one by one.

[0116] In some embodiments, the embodiments of the present application provide a computer-readable storage medium, on which a computer program is stored. When the computer program is executed by a processor, any step in the above method is implemented.

[0117] In a specific embodiment, please refer to Figure 5 , Figure 5 which is a schematic structural diagram of the wavelength calibration device provided in a specific embodiment of the present application.

[0118] The laser 510 is connected to the input port of the wavelength selection switch 530 and is used to provide an input light wave to the wavelength selection switch 530.

[0119] The optical power meter is connected to the output port of the wavelength selection switch 530 and is used to monitor the power of the light wave output by the wavelength selection switch 530.

[0120] The wavelength selection switch 530 includes an optical chip. Control instructions are sent to the wavelength selection switch 530 through the computer 540 to turn on the power supply of the wavelength selection switch and set the corresponding phase values required for the output ports of the wavelength selection switch, so as to control the switch states of the corresponding output ports. For example, the phase values of columns 0 to N of the chip can be set to the through state, columns N + 1 to 2N to the blocking state, columns 2N + 1 to 3N to the series-through state, columns 3N + 1 to 4N to the blocking state... and so on to set the phase values of all columns in the chip in turn. Here, the pixel columns corresponding to the blocking state do not allow light waves to pass through.

[0121] Through the steps in the above method embodiments, the central wavelength values corresponding to each column of wavelength channels on the optical chip can be determined, and interpolation processing can be performed based on the central wavelength values, so that the wavelength values corresponding to each pixel column can be obtained, without calibrating each pixel column, reducing the workload, improving the calibration efficiency, and reducing the calibration time.

[0122] In several embodiments provided in the present application, it should be understood that the disclosed methods, systems, and devices can be implemented in other ways. The system and device embodiments described above are merely illustrative. For example, the division of the modules is only a logical function division. In actual implementation, there may be other division methods. For example, multiple modules or components can be combined, or can be integrated into another observable quantity, or some features can be ignored, or not executed. In addition, the communication connections between the various components shown or discussed can be indirect coupling or communication connections through some interfaces, devices, or modules, and can be electrical, mechanical, or other forms.

[0123] The modules described above as separate components may or may not be physically separated. The components shown as units may or may not be physical units, that is, they may be located in one place or distributed to multiple network units. Some or all of the modules can be selected according to actual needs to achieve the purpose of this embodiment.

[0124] Those of ordinary skill in the art can understand that all or part of the steps of implementing the above method embodiments can be completed by hardware related to program instructions. The foregoing program can be stored in a computer-readable storage medium. When the program is executed, it executes the steps including the above method embodiments. The foregoing storage medium includes: various media such as removable storage devices, read-only memory (ROM), magnetic disks, or optical disks that can store program codes.

[0125] Alternatively, if the above integrated modules in the embodiments of the present application are implemented in the form of software function units and sold or used as independent products, they can also be stored in a computer-readable storage medium. Based on this understanding, the technical embodiments of the embodiments of the present application, in essence, or the part that contributes to the prior art can be embodied in the form of a software product. The computer software product is stored in a storage medium and includes several instructions to enable a multi-view remote sensing image classification device (which can be a personal computer, a server, or a network device, etc.) to execute all or part of the methods described in the various embodiments of the present application. The foregoing storage medium includes: various media such as removable storage devices, ROM, magnetic disks, or optical disks that can store program codes.

[0126] A wavelength calibration method and device described in the embodiments of the present application are only taken as examples of the embodiments of the present application, but are not limited thereto. As long as it involves the wavelength calibration method and device, it is within the protection scope of the present application.

[0127] It should be understood that the "one embodiment" or "an embodiment" mentioned throughout the specification means that the specific features, structures or characteristics related to the embodiment are included in at least one embodiment of the present application. Therefore, the "in one embodiment" or "in an embodiment" that appears throughout the specification does not necessarily refer to the same embodiment. In addition, these specific features, structures or characteristics can be combined in one or more embodiments in any suitable manner. It should be understood that in various embodiments of the present application, the order numbers of the above processes do not mean the order of execution, and the execution order of each process should be determined by its function and internal logic, and should not constitute any limitation to the implementation process of the embodiments of the present application. The serial numbers of the embodiments of the present application are only for description and do not represent the advantages and disadvantages of the embodiments.

[0128] It should be noted that in this article, the term "comprising", "including" or any other variant thereof is intended to cover non-exclusive inclusion, so that a process, method, article or device including a series of elements not only includes those elements, but also includes other elements not explicitly listed, or further includes elements inherent to such a process, method, article or device. Without more limitations, an element defined by the statement "including one..." does not exclude the existence of another identical element in the process, method, article or device including the element.

[0129] The above is only the specific implementation manner of the present application, but the protection scope of the present application is not limited thereto. Any person skilled in the art within the technical scope disclosed by the present application can easily think of modifications or replacements, which should be covered by the protection scope of the present application. Therefore, the protection scope of the present application should be subject to the protection scope of the claims.

Claims

1. A wavelength calibration method, characterized in that, the method includes: obtaining a spectral image corresponding to each column of wavelength channels among at least two columns of wavelength channels on the chip to be calibrated; based on the spectral image, determining the central wavelength value corresponding to each column of wavelength channels; obtaining a first central wavelength value and a second central wavelength value corresponding to any two adjacent first wavelength channels and second wavelength channels among the at least two columns of wavelength channels, and determining the wavelength difference between the first central wavelength and the second central wavelength value and the total number of pixel columns between the pixel column corresponding to the first central wavelength and the pixel column corresponding to the second central wavelength value; based on the wavelength difference and the total number of pixel columns, performing linear interpolation processing on the first central wavelength value and the second central wavelength value to determine the wavelength value corresponding to each pixel column in each column of wavelength channels.

2. The wavelength calibration method according to claim 1, characterized in that, the determining the central wavelength value corresponding to each column of wavelength channels based on the spectral image includes: obtaining the minimum insertion loss value corresponding to each column of wavelength channels from the spectral image; based on the minimum insertion loss value and a preset threshold, determining a first wavelength value and a second wavelength value; determining a wavelength average value based on the first wavelength value and the second wavelength value, and taking the wavelength average value as the central wavelength value corresponding to each column of wavelength channels.

3. The wavelength calibration method according to claim 1, characterized in that, the performing linear interpolation processing on the first central wavelength value and the second central wavelength value to determine the wavelength value corresponding to each pixel column in each column of wavelength channels includes: based on the wavelength difference and the total number of pixel columns, performing linear interpolation processing on the first central wavelength value and the second central wavelength value to determine the wavelength value corresponding to each pixel column in the first wavelength channel and the second wavelength channel.

4. The wavelength calibration method according to claim 1, characterized in that, the method further includes: based on the multiple wavelength values obtained after linear interpolation processing, determining the maximum wavelength value and the minimum wavelength value corresponding to each column of wavelength channels; based on the maximum wavelength value and the minimum wavelength value, determining the wavelength range corresponding to each column of wavelength channels.

5. A wavelength calibration device, characterized in that, the device includes: an acquisition module, configured to acquire a spectral image corresponding to each column of wavelength channels among at least two columns of wavelength channels on the chip to be calibrated; a first determination module, configured to determine the central wavelength value corresponding to each column of wavelength channels based on the spectral image; A second determination module, configured to obtain a first central wavelength value and a second central wavelength value corresponding to any two adjacent first wavelength channels and second wavelength channels among the at least two columns of wavelength channels, and determine a wavelength difference between the first central wavelength and the second central wavelength value and a total number of pixel columns between a pixel column corresponding to the first central wavelength and a pixel column corresponding to the second central wavelength value; based on the wavelength difference and the total number of pixel columns, perform linear interpolation processing on the first central wavelength value and the first central wavelength to determine a wavelength value corresponding to each pixel column in each column of wavelength channels.

6. The wavelength calibration device according to claim 5, wherein, the first determination module is specifically configured to: obtain a minimum insertion loss value corresponding to each column of wavelength channels from the spectral image; determine a first wavelength value and a second wavelength value based on the minimum insertion loss value and a preset threshold; determine a wavelength average value based on the first wavelength value and the second wavelength value, and use the wavelength average value as the central wavelength value corresponding to each column of wavelength channels.

7. The wavelength calibration device according to claim 6, wherein, the second determination module is specifically configured to: perform linear interpolation processing on the first central wavelength value and the second central wavelength value based on the wavelength difference and the total number of pixel columns to determine a wavelength value corresponding to each pixel column in the first wavelength channel and the second wavelength channel.

8. The wavelength calibration device according to claim 7, wherein, the device further includes a third determination module, and the third determination module is configured to: determine a maximum wavelength value and a minimum wavelength value corresponding to each column of wavelength channels based on a plurality of the wavelength values obtained after linear interpolation processing; determine a wavelength range corresponding to each column of wavelength channels based on the maximum wavelength value and the minimum wavelength value.

9. An electronic device, wherein, it includes: a memory, configured to store executable instructions; a processor, configured to implement the wavelength calibration method according to any one of claims 1 to 4 when executing the executable instructions stored in the memory.

10. A computer-readable storage medium, on which a computer program is stored, wherein, the computer program, when executed by a processor, implements the steps in the method according to any one of claims 1 to 4.

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