A method for accurately injecting VDT in eMMC testing, a storage medium and an electronic device

Abstract

The application discloses a method for precisely injecting VDT in eMMC testing, a storage medium and an electronic device. The command for injecting VDT is embedded in the data transmission process of the read-write command of the eMMC chip. It can be seen that the command for injecting VDT is embedded in the data transmission process of the read-write command of the eMMC chip, so that voltage fluctuation can occur in the process of reading and writing of the eMMC chip, and excessive cycle testing is not needed, and the testing efficiency can be improved.

Description

Technical Field

[0001] This invention relates to the field of chip testing technology, and in particular to a method, storage medium, and electronic device for accurately injecting VDT in eMMC testing. Background Technology

[0002] With technological advancements, eMMC applications now extend beyond mobile devices to include smart wearables, set-top boxes, home appliances, and automotive control systems. Customers are demanding increasingly higher performance and power consumption from storage devices, and applications like automobiles are placing even more stringent requirements on data reliability.

[0003] Therefore, storage manufacturers need to pay more attention to the reliability of data and the robustness of firmware in eMMC under abnormal power supply conditions. In addition to abnormal power outages, unstable power supply may also occur during use. eMMC manufacturers need to build use cases for similar scenarios during the R&D and testing phase to improve the performance of products under extreme conditions.

[0004] However, in existing driver-level eMMC test cases developed based on Linux uboot / kernel, VDT (Voltage Detect) is usually injected into the eMMC at a set time, such as 10 seconds after the start of the test. This means that when voltage fluctuations are injected, the eMMC chip may not be in a read / write or other working state, and cannot accurately reflect the impact of voltage fluctuations on the eMMC's operation. As a result, it is often necessary to perform many tests in a loop to ensure that voltage fluctuations occur in the eMMC's working state, which consumes a lot of time to complete the test of the eMMC chip. Summary of the Invention

[0005] The technical problem to be solved by the present invention is to provide a method, storage medium and device for accurately injecting VDT in eMMC testing, which can realize accurate injection of VDT in eMMC chip testing.

[0006] To solve the above-mentioned technical problems, the technical solution adopted by the present invention is as follows:

[0007] A method for accurately injecting VDT in eMMC testing, which embeds the VDT injection command into the data transmission process of read and write commands to the eMMC chip.

[0008] To solve the above-mentioned technical problems, another technical solution adopted by the present invention is as follows:

[0009] A storage medium having a computer program stored thereon, which, when executed by a processor, implements the steps of a method for accurately injecting a VDT in an eMMC test as described above.

[0010] To solve the above-mentioned technical problems, another technical solution adopted by the present invention is as follows:

[0011] An electronic device includes a memory, a processor, and a computer program stored in the memory and executable on the processor, wherein the processor executes the computer program to implement the steps of a method for accurately injecting a VDT in an eMMC test as described above.

[0012] The beneficial effects of this invention are as follows: by embedding the command injected into the VDT into the data transmission process of the read and write commands to the eMMC chip, it can ensure that voltage fluctuations occur during the read and write process of the eMMC chip, without the need for excessive cyclic testing, thus improving testing efficiency. Attached Figure Description

[0013] Figure 1 This is a flowchart illustrating a method for accurately injecting VDTs in eMMC testing according to an embodiment of the present invention.

[0014] Figure 2 This invention relates to the IIC data transmission format;

[0015] Figure 3 This is a voltage fluctuation waveform diagram related to an embodiment of the present invention;

[0016] Figure 4 This is a schematic diagram of the structure of an electronic device according to an embodiment of the present invention. Detailed Implementation

[0017] To explain in detail the technical content, objectives, and effects of the present invention, the following description is provided in conjunction with the embodiments and accompanying drawings.

[0018] Please refer to Figure 1 A method for accurately injecting VDT in eMMC testing, which embeds the VDT injection command into the data transmission process of read and write commands to the eMMC chip.

[0019] As can be seen from the above description, the beneficial effect of the present invention is that by embedding the command injected into the VDT into the data transmission process of the read and write commands of the eMMC chip, it can ensure that voltage fluctuations occur during the read and write process of the eMMC chip, without the need for excessive loop testing, thus improving the efficiency of testing.

[0020] Furthermore, the specific steps include:

[0021] Step S1: Send a read or write data command to the eMMC, and send or read data to the eMMC chip after receiving the read or write data command response;

[0022] Step S2, inject VDT;

[0023] Step S3: Data transmission is complete. Send a stop transmission command to the eMMC chip.

[0024] As described above, it enables the embedding of commands injected into the VDT into the data transmission process of read and write commands to the eMMC chip.

[0025] Further, step S2 specifically includes:

[0026] Call a pre-built function, providing parameters to inject the VDT.

[0027] As can be seen from the above description, calling pre-built functions improves the efficiency of chip testing.

[0028] Furthermore, the given parameters specifically include the voltage fluctuation range.

[0029] As can be seen from the above description, various voltage fluctuation scenarios can be simulated by giving a given voltage fluctuation value.

[0030] Furthermore, the pre-built function includes adjusting VCC and / or VCCQ to a first set voltage and holding it for a first set time, and then adjusting VCC and / or VCCQ to a second set voltage and holding it for a second set time.

[0031] As described above, it can be seen that it simulates voltage fluctuations by giving a set voltage value, thereby realizing VDT injection.

[0032] Furthermore, it also includes step S0, setting the power supply VCC of the eMMC to a first set value, setting the power supply VCCQ of the eMMC to a second set value, and performing initialization on the eMMC.

[0033] As described above, initialization ensures that the eMMC power supply is in a normal state at the beginning.

[0034] Furthermore, in step S2, the command to inject the VDT is sent to the PMIC via the IIC protocol and executed by the PMIC.

[0035] As described above, the PMIC can simulate voltage fluctuations by setting the slope and fluctuation range, which can better detect the performance of the eMMC.

[0036] Another embodiment of the present invention provides a storage medium having a computer program stored thereon, which, when executed by a processor, implements the various steps of a method for accurately injecting a VDT in an eMMC test as described above.

[0037] Please refer to Figure 4Another embodiment of the present invention provides an electronic device, including a memory, a processor, and a computer program stored in the memory and executable on the processor, wherein the processor executes the computer program to implement the various steps of a method for accurately injecting a VDT in an eMMC test as described above.

[0038] The present invention discloses a method, storage medium, and device for accurately injecting VDT during eMMC testing, which is used to accurately inject VDT when the eMMC performs operations, specifically when the eMMC performs read and write operations.

[0039] Please refer to Figure 1 Embodiment 1 of the present invention is as follows:

[0040] A method for accurately injecting VDT in eMMC testing, comprising the following steps:

[0041] Step S0: Set the power supply VCC of the eMMC to the first set value, set the power supply VCCQ of the eMMC to the second set value, and perform initialization on the eMMC.

[0042] Wherein, the power supply VCC of the eMMC refers to the voltage provided to the memory chip in the eMMC chip. In this embodiment, the first set value is specifically 3.3V. VCCQ refers to the voltage provided to the controller in the eMMC chip. In this embodiment, the second set value is specifically 1.8V.

[0043] Step S1: Send a read or write data command to the eMMC, and send or read data to the eMMC chip after receiving the read or write data command response.

[0044] In this embodiment, VDT injection can also be performed once or multiple times before sending read or write data commands.

[0045] Alternatively, after receiving a read or write data command response, the VDT can be injected once or multiple times before sending or reading data to the eMMC chip.

[0046] Step S2, inject the VDT of power supply VCC and / or power supply VCCQ.

[0047] Specifically, in this embodiment, a VDT injection is completed by calling a pre-built function with different parameters, which may include voltage fluctuation values. This injection can be either VCC voltage injection, VCCQ voltage injection, or a combination of both. The pre-built function uses the Linux uboot open-source code as the basis for software development. The open-source code can be found on the following website:

[0048] https: / / github.com / hardkernel / u-boot.git-bodroidxu4-v2017.05.

[0049] For software environment setup, please refer to the following website:

[0050] https: / / wiki.odroid.com / odroid-xu4 / software / building_u-boot_mainline.

[0051] The constructed interface function is sent to the PMIC via the IIC protocol to achieve voltage fluctuation.

[0052] Specifically, in this embodiment, a single VDT injection includes: setting VCC to 2.4V and maintaining VCC at 2.4V for 1ms, then adjusting VCC back to 3.3V and maintaining it for 2ms, which produces the following... Figure 3 The waveform shown Figure 3 In the middle, from top to bottom, are the clock signal, VCCQ signal, and VCC signal.

[0053] It is worth noting that the VDT is not triggered once; it can be triggered multiple times during a single read or write command, meaning that step S2 can be executed multiple times.

[0054] Step S3: Data transmission is complete. Send a stop transmission command to the eMMC chip.

[0055] In this embodiment, VDT injection can also be performed once or multiple times before sending the stop transmission command.

[0056] Alternatively, after receiving a stop transmission command response, the VDT can be injected once or multiple times before sending or reading data to the eMMC chip.

[0057] Embodiment 2 of the present invention is as follows:

[0058] A storage medium storing a computer program that, when executed by a processor, implements the steps of a method for accurately injecting a VDT in an eMMC test, as described in Embodiment 1.

[0059] Example 3

[0060] Please refer to Figure 4 An electronic device includes a memory, a processor, and a computer program stored in the memory and executable on the processor, wherein the processor executes the computer program to implement the steps of a method for accurately injecting a VDT in an eMMC test, according to an embodiment.

[0061] In summary, the present invention provides a method, storage medium, and electronic device for accurately injecting VDT in eMMC testing. By embedding the VDT injection command into the data transmission process of the read and write commands to the eMMC chip, it can ensure that voltage fluctuations occur during the read and write process of the eMMC chip, eliminating the need for excessive cyclic testing and improving testing efficiency.

[0062] In the embodiments provided in this application, it should be understood that the disclosed methods, apparatuses, computer-readable storage media, and electronic devices can be implemented in other ways. For example, the apparatus embodiments described above are merely illustrative. For instance, the division of modules is only a logical functional division, and in actual implementation, there may be other division methods. For example, multiple components or modules may be combined or integrated into another device, or some features may be ignored or not executed. Furthermore, the coupling or direct coupling or communication connection shown or discussed may be through some interfaces; the indirect coupling or communication connection between devices, components, or modules may be electrical, mechanical, or other forms.

[0063] The components described as separate parts may or may not be physically separate. The components shown as components may or may not be physical modules; that is, they may be located in one place or distributed across multiple network modules. Some or all of the components can be selected to achieve the purpose of this embodiment according to actual needs.

[0064] Furthermore, the functional modules in the various embodiments of the present invention can be integrated into one processing module, or each component can exist physically separately, or two or more modules can be integrated into one module. The integrated modules described above can be implemented in hardware or as software functional modules.

[0065] If the integrated module is implemented as a software functional module and sold or used as an independent product, it can be stored in a computer-readable storage medium. Based on this understanding, the technical solution of the present invention, in essence, or the part that contributes to the prior art, or all or part of the technical solution, can be embodied in the form of a software product. This computer software product is stored in a storage medium and includes several instructions to cause a computer device (which may be a personal computer, server, or network device, etc.) to execute all or part of the steps of the methods described in the various embodiments of the present invention. The aforementioned storage medium includes various media capable of storing program code, such as USB flash drives, portable hard drives, read-only memory (ROM), random access memory (RAM), magnetic disks, or optical disks.

[0066] It should be noted that, for the sake of simplicity, the foregoing method embodiments are all described as a series of actions. However, those skilled in the art should understand that the present invention is not limited to the described order of actions, because according to the present invention, some steps can be performed in other orders or simultaneously. Furthermore, those skilled in the art should also understand that the embodiments described in the specification are preferred embodiments, and the actions and modules involved are not necessarily essential to the present invention.

[0067] In the above embodiments, the descriptions of each embodiment have different focuses. For parts not described in detail in a certain embodiment, please refer to the relevant descriptions in other embodiments.

[0068] The above description is merely an embodiment of the present invention and does not limit the patent scope of the present invention. Any equivalent modifications made based on the content of the present invention specification and drawings, or direct or indirect applications in related technical fields, are similarly included within the patent protection scope of the present invention.

Claims

1. A method for accurately injecting voltage fluctuations in eMMC testing, characterized in that, The command to inject voltage fluctuations is embedded in the data transmission process of read and write commands to the eMMC chip and executed. Specifically including step: Step S1: Send a read or write data command to the eMMC chip, and send or read data to the eMMC chip after receiving the read or write data command response; Step S2: Call a pre-built function, and give parameters to inject voltage fluctuations; the given parameters specifically include the voltage fluctuation range; the pre-built function includes adjusting VCC and / or VCCQ to a first set voltage and holding it for a first set time, and then adjusting VCC and / or VCCQ to a second set voltage and holding it for a second set time. The command to inject voltage fluctuations is sent to the PMIC via the IIC protocol and executed by the PMIC. Step S3: Data transmission is complete. Send a stop transmission command to the eMMC chip.

2. The method for accurately injecting voltage fluctuations in eMMC testing according to claim 1, characterized in that, Also includes: Step S0: Set the power supply VCC of the eMMC to the first set value, set the power supply VCCQ of the eMMC to the second set value, and perform initialization on the eMMC.

3. A storage medium having a computer program stored thereon, characterized in that, When the computer program is executed by the processor, it implements the steps of the method for accurately injecting voltage fluctuations in eMMC testing as described in any one of claims 1 to 2.

4. An electronic device, comprising a memory, a processor, and a computer program stored in the memory and executable on the processor, characterized in that, When the processor executes the computer program, it implements each step of the method for accurately injecting voltage fluctuations in eMMC testing as described in any one of claims 1 to 2.

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