A gasket heating test bench based on infrared radiation source
By using infrared radiation source and far infrared radiation electric heating tube on the gasket test bench for heating, and using temperature sensors and control modules for precision adjustment, the problems of uneven heating and high energy consumption in the prior art are solved, and uniform heating and energy consumption of the gasket are achieved.
Patent Information
- Application Number
- CN202210243776.0
- Authority / Receiving Office
- CN · China
- Patent Type
- Patents(China)
- Current Assignee / Owner
- Filing Date
- 2022-03-14
- Publication Date
- 2025-03-18
- Estimated Expiration
- 2042-03-14
AI Technical Summary
The heating method of the existing gasket test bench relies on heating resistance, resulting in poor temperature averaging characteristics, excessive local temperature, high power requirements for power supply and difficult to precisely control.
The gasket heating test bench based on infrared radiation sources is used, and the far-infrared radiation electric heating tube is used for heating, and the working power of the electric heating tube is adjusted through the temperature control module composed of the temperature sensor and the control unit to ensure the uniformity of the gasket surface temperature.
The uniform heating of the gasket is achieved, the energy consumption of the heating device is reduced, the defects in the heating resistance method are avoided, and the accuracy and accuracy of the test are improved.
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Figure CN114828309B_ABST
Abstract
Description
Technical Field
[0001] The invention relates to the technical field of gasket heating, in particular to a gasket heating test bench based on an infrared radiation source. Background Art
[0002] The existing gasket test bench basically uses heating resistors as heat sources, but this heating method has many disadvantages. For example, the temperature uniformity of the heating platen in the existing gasket test bench is greatly dependent on the arrangement of the heating resistors inside the heating platen, that is, the uniformity of the temperature distribution on the surface of the heating platen is related to the uniformity of the resistance wire, which can easily cause local overtemperature; the resistance wire has a large power, and to maintain stable high temperature conditions, the power and stability of the power supply are also very high; the resistance of the resistance wire changes with the temperature, which is very unfavorable for precise temperature control. Summary of the invention
[0003] The purpose of the present invention is to provide a gasket heating test bench based on an infrared radiation source, which has the purpose of making the gasket heated evenly and reducing the energy consumption of the heating device.
[0004] To achieve the above object, the present invention provides the following solutions:
[0005] A gasket heating test bench based on an infrared radiation source comprises: a control part and a heating part;
[0006] The heating part includes two heating modules with the same structure; the heating module includes a heating platen, a plurality of first far-infrared radiation electric heating tubes and a plurality of sliding brackets; the plurality of first far-infrared radiation electric heating tubes are arranged in an array inside the heating platen; the plurality of sliding brackets are evenly arranged at the top edge of the heating platen and extend outward, and a temperature sensor is installed on the extension of each sliding bracket; a boss is provided in the central area of the top of the heating platen; the boss is used to place a gasket;
[0007] The temperature sensor is used to collect the temperature value of the gasket;
[0008] The control unit is used to compare the gasket temperature value with a set threshold value to determine a temperature adjustment instruction; the temperature adjustment instruction is used to adjust the working power of the first far-infrared radiation electric heating tube;
[0009] In a working state, the two heating modules are symmetrically arranged; the gasket is located between the two heating modules, and the gasket is in contact with the bosses of the two heating modules respectively.
[0010] Optionally, it also includes a second far-infrared radiation electric heating tube; the second far-infrared radiation electric heating tube is nested on the boss, and one end of the second far-infrared radiation electric heating tube is not in contact with the other end of the second far-infrared radiation electric heating tube.
[0011] Optionally, the second far-infrared radiation electric heating tube is an arc-shaped structure.
[0012] Optionally, the control unit includes a control cabinet and a computer;
[0013] The control cabinet is connected to the first far-infrared radiation electric heating tube and the second far-infrared radiation electric heating tube respectively; the computer is connected to the control cabinet and the temperature sensor respectively;
[0014] The computer is used to perform PID operation on the gasket temperature value and the set threshold value to determine the temperature adjustment instruction, and send the temperature adjustment instruction to the control cabinet;
[0015] The control cabinet is used to adjust the working power of the first far-infrared radiation electric heating tube based on the temperature adjustment instruction.
[0016] Optionally, a radiation surface of the first far-infrared radiation electric heating tube faces the boss.
[0017] Optionally, a plurality of heat dissipation copper tubes are provided between the non-radiating surface of the first far-infrared radiation electric heating tube and the bottom of the heating platen, and the plurality of heat dissipation copper tubes are arranged in an array inside the heating platen.
[0018] Optionally, the sliding bracket includes a main bracket and a slide rail; one end of the main bracket is installed at the top edge of the heating platen, the other end of the main bracket is connected to the slide rail, and the slide rail is perpendicular to the main bracket; the slide rail is used to adjust the position of the temperature sensor.
[0019] Optionally, a heat-insulating layer is further included; the heat-insulating layer is sleeved on the periphery of the heating platen.
[0020] Optionally, the bottom of the heating platen is plated with nickel-cobalt based infrared radiation paint.
[0021] Optionally, in a working state, one of the heating modules is located above another of the heating modules.
[0022] According to the specific embodiments provided by the present invention, the present invention discloses the following technical effects:
[0023] The present invention provides a gasket heating test bench based on an infrared radiation source, which can be applied to gasket tests in high temperature environments. The present invention uses an infrared radiation source as a heat source, utilizes the heating effect of far-infrared technology on objects, heats the gasket placed on the heating platen, and adjusts the working power of the first far-infrared radiation electric heating tube through a temperature control module composed of a temperature sensor and a control unit, controls the difference between the actual surface temperature of the gasket and the test set temperature, thereby achieving the purpose of uniformly heating the gasket and reducing the energy consumption of the heating device, and avoiding various defects of the heating resistance heating method. BRIEF DESCRIPTION OF THE DRAWINGS
[0024] In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the drawings required for use in the embodiments will be briefly introduced below. Obviously, the drawings described below are only some embodiments of the present invention. For ordinary technicians in this field, other drawings can be obtained based on these drawings without paying creative labor.
[0025] Figure 1 A front view of a gasket heating test bench based on an infrared radiation source provided by an embodiment of the present invention;
[0026] Figure 2 Three isometric views of a heating portion provided by an embodiment of the present invention;
[0027] Figure 3 A temperature control flow chart provided by an embodiment of the present invention;
[0028] Figure 4 A schematic diagram of temperature zones provided in an embodiment of the present invention.
[0029] Explanation of symbols: 1: control cabinet; 2: heat dissipation copper tube; 3: first far-infrared radiation electric heating tube; 4: heating platen; 5: insulation layer; 6: sliding bracket; 7: temperature sensor; 8: second far-infrared radiation electric heating tube; 9: computer. DETAILED DESCRIPTION
[0030] The following will be combined with the drawings in the embodiments of the present invention to clearly and completely describe the technical solutions in the embodiments of the present invention. Obviously, the described embodiments are only part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the present invention.
[0031] In order to make the above-mentioned objects, features and advantages of the present invention more obvious and easy to understand, the present invention is further described in detail below with reference to the accompanying drawings and specific embodiments.
[0032] Embodiment 1
[0033] An embodiment of the present invention provides a gasket heating test bench based on an infrared radiation source. The test bench uses an infrared radiation source as a heating method to reduce the temperature difference between various points on the surface of the heating platen, provide uniform heating for the heated gasket, and thereby improve the precision and accuracy of the gasket test.
[0034] Basic concept: As an important component of the gasket heating test bench, the performance of the heating platen directly affects the precision and accuracy of the gasket heating test. The heating methods of the heating platen mainly include: resistive heating, combustion heating, radiation heating, etc. Among them, radiation heating is the exchange of energy through thermal radiation between non-contact objects, and it is a form in which the object emits energy outward in the form of electromagnetic waves due to its own temperature; the components that can generally be used as radiation sources include electric heating solid radiation sources (such as Nensto lamps, tungsten filaments, etc.) and gas radiation sources (such as mercury lamps, etc.). The temperatures that these radiation sources can reach range from 400°C to 1800°C, which can provide strong support for the high temperature environment required for the gasket heating test.
[0035] Working principle: The gasket heating test bench provided in the embodiment of the present invention can adjust the heating power of the far-infrared radiation electric heating tube (such as a halogen quartz tube) by adjusting the output voltage of the high-power power supply. After the far-infrared radiation electric heating tube is powered on, its own temperature rises and emits a continuous spectrum of thermal radiation. Then, after the thermal radiation is transmitted to the bottom of the heating platen, the temperature of the heating platen rises, thereby raising the temperature of the gasket fixed on the heating platen. The embodiment of the present invention also sets a number of temperature measurement points, which are respectively located at the circumference line positions of the gasket, to collect the surface temperature of the gasket in a non-contact manner, and to perform temperature compensation for the area where the actual temperature collected is lower than the set temperature.
[0036] Below through Figure 1 and Figure 2 Let's introduce a gasket heating test bench based on an infrared radiation source provided by an embodiment of the present invention.
[0037] The embodiment of the present invention provides a gasket heating test bench based on an infrared radiation source, comprising: a control unit and a heating unit. The heating unit comprises two heating modules with the same structure.
[0038] Taking one of the heating modules as an example, the heating module includes a heating platen 4, multiple first far-infrared radiation electric heating tubes 3 and multiple sliding brackets 6; multiple first far-infrared radiation electric heating tubes 3 are arranged in an array form inside the heating platen 4; multiple sliding brackets 6 are evenly arranged at the top edge position of the heating platen 4 and extend outward, that is, one end of the sliding bracket 6 is fixed at the top edge position of the heating platen 4, and the other end of the sliding bracket 6 extends outward, and a temperature sensor 7 is installed on the extended part of each sliding bracket 6 to form multiple temperature measuring points; a boss is provided in the central area of the top of the heating platen 4; the boss is used to place a gasket.
[0039] The temperature sensor 7 is used to collect the gasket temperature value; the control unit is used to compare the gasket temperature value with a set threshold value to determine a temperature adjustment instruction; the temperature adjustment instruction is used to adjust the working power of the first far-infrared radiation electric heating tube 3;
[0040] In the working state, the two heating modules are symmetrically arranged; the gasket is located between the two heating modules, and the gasket contacts the bosses of the two heating modules respectively, that is, one side of the gasket contacts the boss of one heating module, and the other side of the gasket contacts the boss of the other heating module. At the same time, in the working state, one heating module is located above the other heating module, so the gasket is tightened by the two heating modules; the control unit adjusts the working power of the first far-infrared radiation electric heating tube 3 according to the gasket temperature value collected by the temperature sensor 7 and the set threshold.
[0041] Preferably, the temperature sensor 7 provided in the embodiment of the present invention is a far-infrared temperature sensor.
[0042] Embodiment 2:
[0043] The embodiment of the present invention provides a gasket heating test bench based on an infrared radiation source. The present invention uses an infrared radiation source as a heat source and utilizes the heating effect of far-infrared technology on an object to uniformly heat a heating platen covered with an infrared radiation energy-saving coating, and adjusts the power supply voltage through a temperature control module composed of a temperature sensor and a fuzzy PID controller to control the difference between the actual surface temperature of the gasket and the test set temperature, thereby achieving the purpose of uniformly heating the heated gasket and reducing the energy consumption of the heating device.
[0044] The embodiment of the present invention, based on the first embodiment, further includes a second far-infrared radiation electric heating tube 8; the second far-infrared radiation electric heating tube 8 is nested on the boss to compensate for the surrounding temperature of the gasket located on the boss, and one end of the second far-infrared radiation electric heating tube 8 is not in contact with the other end of the second far-infrared radiation electric heating tube 8, that is, it is an unclosed structure.
[0045] Among them, the second far-infrared radiation electric heating tube 8 and the first far-infrared radiation electric heating tube 3 are both quartz halogen tubes, and the first far-infrared radiation electric heating tube 3 can also be a short-wave quartz halogen tube.
[0046] Furthermore, the second far-infrared radiation electric heating tube 8 is an arc-shaped structure.
[0047] As a preferred implementation, the control unit provided in the embodiment of the present invention includes a control cabinet 1 and a computer 9. The control cabinet 1 is respectively connected to the second far-infrared radiation electric heating tube 8 and the first far-infrared radiation electric heating tube 3. The computer 9 is respectively connected to the control cabinet 1 and the temperature sensor 7; the temperature sensor 7 processes the radiation signal and sends the data to the computer 9 via Bluetooth communication. The computer 9 is used to perform PID operation on the gasket temperature value and the set threshold to determine the temperature adjustment instruction, and send the temperature adjustment instruction to the control cabinet. The control cabinet 1 is used to adjust the working power of the first far-infrared radiation electric heating tube based on the temperature adjustment instruction. Among them, the PID temperature control process is as follows Figure 3 shown.
[0048] As a preferred embodiment, the number of the first far-infrared radiation electric heating tubes 3 provided in the embodiment of the present invention is 15, which are respectively located in the 15 slots of the heating platen 4 to form an array. The radiation surface of the first far-infrared radiation electric heating tube 3 faces the boss.
[0049] In order to prevent the first far-infrared radiation electric heating tube 3 from malfunctioning due to overtemperature during operation, a plurality of heat dissipation copper tubes 2 are arranged between the non-radiating surface of the first far-infrared radiation electric heating tube and the bottom of the heating platen 4, that is, 5 heat dissipation channels are opened at the lower position of the center line of the heating platen 4, the heat dissipation copper tubes 2 are located in the heat dissipation channels, and the plurality of heat dissipation copper tubes 2 are arranged in an array inside the heating platen 4.
[0050] As a preferred implementation, the embodiment of the present invention may further include a heat-insulating layer 5 , which is sleeved on the outer periphery of the heating platen 4 , and the heat-insulating layer 5 is used to reduce the heat loss of the heating platen 4 during the heating process.
[0051] As a preferred embodiment, the sliding bracket 6 described in the embodiment of the present invention includes a main bracket and a slide rail; one end of the main bracket is installed at the top edge of the heating platen 4, and the other end of the main bracket is connected to the slide rail, and the slide rail is perpendicular to the main bracket; the slide rail is used to adjust the position of the temperature sensor 7, that is, the temperature sensor 7 is fixed on the sliding bracket 6 through the slide rail, and the height can be adjusted up and down.
[0052] Before the test is started, first align the gasket with the center position of the heating platen 4, that is, place it on the boss, and adjust the upper and lower heating platens 4 to clamp the gasket. Then, the bottom of the heating platen 4 is plated with a nickel-cobalt infrared radiation coating to improve the absorption efficiency of infrared radiation. Then, the relative position of the temperature sensor 7 and the gasket is adjusted by sliding, so that the probe of the temperature sensor 7 is facing the gasket, and the control cabinet 1 is used to start the power supply. After the first far-infrared radiation electric heating tube 3 and the second far-infrared radiation electric heating tube 8 are powered on, the electrical energy is converted into infrared radiation energy and transmitted to the heating platen 4. The heating platen 4 converts the received infrared radiation energy into its own internal energy and transmits it to the gasket. The temperature sensor 7 is used to collect the radiation signal at each position and send it to the computer 9 via Bluetooth transmission. The computer 9 performs PID calculation according to the deviation between the set value and the measured value of the temperature.
[0053] The heating method is as follows:
[0054] First, 6-8 marks are made on the gasket at equal intervals along the circumference, with an interval of s1, and each mark m corresponds to a temperature sensor 7, such as Figure 4 shown.
[0055] Second, adjust the probe height of the temperature sensor 7 so that the axis of the probe is at the same height as the edge of the gasket.
[0056] Third, the control cabinet 1 is turned on to power on the first far-infrared radiation electric heating tube 3 to increase the temperature, and the temperature sensor 7 collects the radiation signal and transmits it to the computer 9 .
[0057] Fourth, the computer 9 compares the temperature of each point m with the set temperature of the control cabinet 1. If the actual temperature of point m is lower than the set temperature, the working power of the corresponding upper and lower first far-infrared radiation electric heating tubes 3 in the area where point m is located is increased through PID adjustment; if the actual temperature of point m is higher than the set temperature, the working power of the corresponding upper and lower first far-infrared radiation electric heating tubes 3 in the area where point m is located is reduced through PID adjustment.
[0058] Fifth, the temperature of each point m is adjusted to a value not exceeding 5% from the set temperature of the control cabinet 1.
[0059] The present invention conducts a heating test on the gasket by simultaneously performing a far-infrared matrix placed in the heating platen and a special-shaped far-infrared light source located around the platen and the inner circle of the gasket. The present invention will only generate heat in the direction of radiation irradiation during the heating process, and there will be no obvious temperature rise on the back of the radiation source. The present invention arranges the far-infrared radiation electric heating tube in the form of a matrix, and the heat received within the unit area is similar. The far-infrared radiation electric heating tube used for heating in the present invention can be replaced at any time after reaching the service life, meeting the conditions for long-term use. The present invention arranges a plurality of temperature sensors to control the temperature of the gasket in different regions, and fine-tunes the first far-infrared radiation electric heating tube in the region, so that the surface temperature of the gasket is uniform. Therefore, the present invention provides a gasket heating test bench based on an infrared radiation source, which can meet the test requirements of different temperatures by applying far-infrared radiation electric heating tubes, and test gaskets of different materials in a manner with adjustable heating output power, and achieves uniform heating by performing regional temperature compensation on the gasket, thereby helping the user unit or enterprise to achieve the purpose of simulating the high-temperature working environment of the gasket.
[0060] The various embodiments in this specification are described in a progressive manner, and each embodiment focuses on the differences from other embodiments. The same or similar parts between the various embodiments can be referenced to each other.
[0061] The principles and implementation methods of the present invention are described in this article using specific examples. The description of the above embodiments is only used to help understand the method and core idea of the present invention. At the same time, for those skilled in the art, according to the idea of the present invention, there will be changes in the specific implementation methods and application scope. In summary, the content of this specification should not be understood as limiting the present invention.
Claims
1. A gasket heating test bench based on infrared radiation source, characterized in that: include: Control unit and heating unit; The heating unit includes two heating modules with the same structure; The two heating modules include a heating platen, a plurality of first far-infrared radiation electric heating tubes and a plurality of sliding brackets; the plurality of first far-infrared radiation electric heating tubes are arranged in an array inside the heating platen; the plurality of sliding brackets are evenly arranged at the top edge of the heating platen and extend outward, and a temperature sensor is installed on the extension of each sliding bracket; a boss is provided in the central area of the top of the heating platen; the boss is used to place a gasket; The temperature sensor is used to collect the temperature value of the gasket; The control unit is used to compare the gasket temperature value with a set threshold value to determine a temperature adjustment instruction; the temperature adjustment instruction is used to adjust the working power of the first far-infrared radiation electric heating tube; In the working state, the two heating modules are symmetrically arranged; the gasket is located between the two heating modules, and the gasket is in contact with the bosses of the two heating modules respectively; The gasket heating test bench based on infrared radiation source also includes a second far-infrared radiation electric heating tube; the second far-infrared radiation electric heating tube is nested on the boss, and one end of the second far-infrared radiation electric heating tube is not in contact with the other end of the second far-infrared radiation electric heating tube.
2. A gasket heating test bench based on infrared radiation source according to claim 1, characterized in that: The second far-infrared radiation electric heating tube is an arc-shaped structure.
3. A gasket heating test bench based on infrared radiation source according to claim 1, characterized in that: The control unit includes a control cabinet and a computer; The control cabinet is connected to the first far-infrared radiation electric heating tube and the second far-infrared radiation electric heating tube respectively; the computer is connected to the control cabinet and the temperature sensor respectively; The computer is used to perform PID operation on the gasket temperature value and the set threshold value to determine the temperature adjustment instruction, and send the temperature adjustment instruction to the control cabinet; The control cabinet is used to adjust the working power of the first far-infrared radiation electric heating tube based on the temperature adjustment instruction.
4. A gasket heating test bench based on infrared radiation source according to claim 1, characterized in that: The radiation surface of the first far-infrared radiation electric heating tube faces the boss.
5. A gasket heating test bench based on infrared radiation source according to claim 4, characterized in that: A plurality of heat dissipation copper tubes are arranged between the non-radiating surface of the first far-infrared radiation electric heating tube and the bottom of the heating platen, and the plurality of heat dissipation copper tubes are arranged in an array inside the heating platen.
6. A gasket heating test bench based on infrared radiation source according to claim 1, characterized in that: The sliding bracket includes a main bracket and a slide rail; one end of the main bracket is installed at the top edge of the heating platen, and the other end of the main bracket is connected to the slide rail, and the slide rail is perpendicular to the main bracket; the slide rail is used to adjust the position of the temperature sensor.
7. A gasket heating test bench based on infrared radiation source according to claim 1, characterized in that: It also includes a heat-insulating layer; the heat-insulating layer is sleeved on the outer periphery of the heating platen.
8. The gasket heating test bench based on infrared radiation source according to claim 1, characterized in that: The bottom of the heating platen is plated with nickel-cobalt infrared radiation paint.
9. A gasket heating test bench based on infrared radiation source according to claim 1, characterized in that: In a working state, one of the heating modules is located above another of the heating modules.
Citation Information
Patent Citations
Pressurizable infrared radiation temperature control device
CN111970770A