Transient high voltage suppression tube leakage current test system and method
By designing a transient high-voltage suppression tube leakage current testing system including upper computer module, programmable high-voltage power generation module, power supply polarity switching module and multi-channel TVS testing module, the problem that existing systems cannot conduct bidirectional leakage current testing at the same time is solved, and an efficient and automated testing process is achieved.
Patent Information
- Application Number
- CN202210445482.6
- Authority / Receiving Office
- CN · China
- Patent Type
- Patents(China)
- Current Assignee / Owner
- Filing Date
- 2022-04-26
- Publication Date
- 2025-04-29
- Estimated Expiration
- 2042-04-26
AI Technical Summary
The leakage current testing system of the existing transient high-voltage suppression tube has a complex structure and cannot conduct bidirectional leakage current testing at the same time, resulting in high testing costs.
A test system including a computer module, a programmable high-voltage power generation module, a power polarity switching module and multiple TVS testing modules is designed. The programmable high-voltage power generation module generates a preset range of voltage values, the power polarity switching module switches the polarity of the voltage across the TVS tube, and the multi-channel TVS test module converts leakage current into voltage for measurement.
The bidirectional leakage current test of transient high-voltage suppression tubes is realized, which reduces the testing cost and improves the degree of automation and efficiency of testing.
Smart Images

Figure CN114879080B_ABST
Abstract
Description
Technical Field
[0001] The present invention relates to the field of communication technology, and in particular to a leakage current testing system and method for a transient high voltage suppression tube, and in particular to a leakage current testing system and method for a transient high voltage suppression tube used in electronic detonators. Background Art
[0002] In order to suppress surges and electromagnetic interference, existing electronic detonators all use a bidirectional transient high-voltage suppression tube (TVS tube), which is connected in parallel between the foot line input terminals of the electronic detonator module. Under normal circumstances, the leakage current of the TVS tube is relatively small, generally below 1 microampere, and will not affect the normal communication of the electronic detonator module. The normal power consumption of a single-shot electronic detonator module is generally around 20 microamperes. If the leakage current of the TVS tube is too large (such as greater than 10 microamperes or even greater), it will cause abnormal communication of the electronic detonator module. Therefore, it is necessary to complete the test of the TVS tube through a special test circuit to prevent the TVS tube with excessive leakage current from being mistakenly used in the electronic detonator module, causing detonator abnormality. Most of the existing TVS tube leakage current test circuits have complex structures, and it is impossible to perform bidirectional leakage current tests on the TVS at the same time, resulting in extremely high testing costs.
[0003] The patent document with publication number CN103487736B discloses a device and method for detecting a transient voltage suppressor TVS tube, the device comprising: a DC voltage source for providing a detection voltage for a TVS tube in a power interface circuit to be detected; a power supply conversion device, interconnected with the DC voltage source, for connecting a TVS tube in the power interface circuit to be detected to the detection circuit and controlling the polarity of the TVS tube; a current measuring device, interconnected with the DC voltage source and the power supply conversion device, for judging the electrical performance of the TVS tube currently connected to the detection circuit according to the measured current in the detection circuit. However, the patent document still has the defects of complex structure, inability to simultaneously perform bidirectional leakage current testing on the TVS tube, and high testing cost. Summary of the invention
[0004] In view of the defects in the prior art, the object of the present invention is to provide a leakage current testing system and method for a transient high voltage suppression tube.
[0005] A transient high voltage suppression tube leakage current test system provided by the present invention comprises a host computer module, a programmable high voltage power supply generation module, a power supply polarity switching module and a plurality of TVS test modules;
[0006] The first output end of the host computer module is connected to the input end of the programmable high-voltage power supply generation module, and the second output end of the host computer module is connected to the first input end of the power polarity switching module;
[0007] The output end of the programmable high-voltage power generation module is connected to the second input end of the power polarity switching module;
[0008] The first output end of the power polarity switching module is connected to the first input ends of the plurality of TVS test modules, and the second output end of the power polarity switching module is connected to the second input ends of the plurality of TVS test modules;
[0009] The output ends of the multiple TVS test modules are all connected to the input end of the host computer module;
[0010] The host computer module is used to collect the leakage current of the TVS tube; the programmable high-voltage power supply generation module is used to generate a voltage value in a preset range; the power supply polarity switching module is used to switch the polarity of the voltage at both ends of the TVS tube; the multi-channel TVS test module is used to convert the leakage current of the TVS tube into voltage.
[0011] Preferably, the programmable high voltage power generation module includes a capacitor C I , capacitor C O , capacitor C SS , capacitor C C , resistor R1, resistor R2, resistor R3, resistor R4, resistor R5, resistor R SH , resistor R SL , resistor R C , inductor L, voltage zener diode D, voltage regulator and proportional amplifier;
[0012] The capacitor C I One end of the capacitor C is connected to one end of the inductor L, the VIN pin of the regulator, and the EN pin of the regulator, and is used as a VIN pin connected to the outside; I The other end is grounded;
[0013] The other end of the inductor L is connected to the anode of the voltage regulator diode D and the three SW pins of the voltage regulator respectively;
[0014] The cathode of the voltage stabilizing diode D is connected to the resistor R SH One end and the capacitor C O and as a VOUT pin connected to the power polarity switching module; the capacitor C O The other end is grounded;
[0015] The resistor R SH The other end is connected to the FB pin of the regulator, the resistor R SL and one end of the resistor R1;
[0016] The resistor R SLThe other end is connected to one end of the resistor R5 and the capacitor C SS One end of the capacitor C C one end of the voltage regulator, the AGND pin of the voltage regulator, and the SYNC pin of the voltage regulator;
[0017] The other end of the resistor R5 is connected to the FREQ pin of the regulator; the capacitor C SS The other end of the capacitor C is connected to the SS pin of the regulator; C The other end of the resistor R C One end of the resistor R C The other end is connected to the COMP pin of the regulator;
[0018] The other end of the resistor R1 is respectively connected to one end of the resistor R2 and the output end of the proportional amplifier;
[0019] The first power supply terminal of the proportional amplifier is connected to an external power supply, the second power supply terminal of the proportional amplifier is grounded, the non-inverting input terminal of the proportional amplifier is connected to one end of the resistor R4, and the inverting input terminal of the proportional amplifier is connected to the other end of the resistor R2 and one end of the resistor R3 respectively;
[0020] The other end of the resistor R4 is connected to the host computer module and is used to receive the DA control signal of the host computer module;
[0021] The other end of the resistor R1 is used to receive the DA signal, and the other end of the resistor R3 is grounded;
[0022] The three PGND pins of the regulator are all connected to ground.
[0023] Preferably, the stabilizer is a boost chip.
[0024] Preferably, the power polarity switching module comprises a double-pole double-throw relay K, a resistor R-S1, a resistor R-S2 and a transistor; the model of the double-pole double-throw relay K is TQ2-5V;
[0025] The capacitor C O One end is respectively connected to the second pin of the double-pole double-throw relay K and the seventh pin of the double-pole double-throw relay K;
[0026] One end of the resistor R-S2 is connected to one end of the resistor R-S1 and the base of the triode, and the other end of the resistor R-S2 is connected to the control port of the host computer module;
[0027] The other end of the resistor R-S1 is connected to the emitter of the triode and is grounded;
[0028] The collector of the triode is connected to the pin No. 1 and the pin No. 10 of the double-pole double-throw relay K respectively.
[0029] Preferably, the power polarity switching module further includes a diode M7;
[0030] The collector of the triode is connected to the anode of the diode M7 and the pin 10 of the double-pole double-throw relay K respectively;
[0031] The cathode of the diode M7 is connected to the pin No. 1 of the double-pole double-throw relay K.
[0032] Preferably, the TVS test module includes a resistor R6, a resistor R7, a resistor R8, a resistor R9, a bidirectional transient suppression diode TVS1, a bidirectional transient suppression diode TVS2, a first voltage follower, a second voltage follower, a first ADC voltage acquisition channel, a second ADC voltage acquisition channel, a single-pole double-throw switch K1, and a single-pole double-throw switch K2;
[0033] One end of the resistor R6 is respectively connected to one end of the resistor R7 and the third pin of the double-pole double-throw relay K; the other end of the resistor R6 is respectively connected to one end of the bidirectional transient suppression diode TVS2 and the first contact end of the single-pole double-throw switch K2;
[0034] The other end of the resistor R7 is respectively connected to one end of the bidirectional transient suppression diode TVS1 and the first contact end of the single-pole double-throw switch K1;
[0035] The other end of the bidirectional transient suppression diode TVS2 is respectively connected to one end of the resistor R8 and the second contact end of the single-pole double-throw switch K2;
[0036] The other end of the bidirectional transient suppression diode TVS1 is respectively connected to one end of the resistor R9 and the second contact end of the single-pole double-throw switch K1;
[0037] The other end of the resistor R8 is respectively connected to the other end of the resistor R9 and the eighth pin of the double-pole double-throw relay K;
[0038] The single-pole end of the single-pole double-throw switch K1 is connected to the non-inverting input end of the first voltage follower, and the single-pole end of the single-pole double-throw switch K2 is connected to the non-inverting input end of the second voltage follower;
[0039] The inverting input terminal of the first voltage follower is respectively connected to the output terminal of the first voltage follower and the first ADC voltage acquisition channel; the first power supply terminal of the first voltage follower is externally connected to a power supply, and the second power supply terminal of the first voltage follower is grounded;
[0040] The inverting input terminal of the second voltage follower is respectively connected to the output terminal of the second voltage follower and the second ADC voltage acquisition channel; the first power supply terminal of the second voltage follower is externally connected to a power supply, and the second power supply terminal of the second voltage follower is grounded.
[0041] Preferably, the first power supply terminal of the first voltage follower is externally connected to a 3.3V DC power supply, and the first power supply terminal of the second voltage follower is externally connected to a 3.3V DC power supply.
[0042] Preferably, the host computer module is a STM32F103R8T6 controller.
[0043] The present invention also provides a testing method for the leakage current testing system based on the transient high voltage suppression tube, comprising the following steps:
[0044] Step 1: Connect a power supply to supply power to the host computer module and the programmable high voltage generation module;
[0045] Step 2: Generate a control voltage through the DA conversion function in the host computer module, and provide the control voltage as a DA signal to the programmable high voltage generation module. After being stabilized by the proportional amplifier in the programmable high voltage generation module, it is output to the other end of the resistor R1. The boost chip generates a corresponding high voltage for testing the TVS according to the size of the DA signal;
[0046] Step 3: The high voltage generated by the programmable high voltage generation module is transmitted to the power polarity switching module, and the power polarity switching module transmits the high voltage to the designated end of the TVS test module according to the control signal given by the host computer module;
[0047] Step 4: The current passing through the TVS test module is converted into a voltage by a sampling resistor and output stably through a voltage follower, the ADC sampling function of the host computer module is turned on, and the voltage value is observed and recorded;
[0048] Step 5: Change the control signal from the host computer module to the power polarity switching module, switch the polarity at both ends of the TVS, and test the leakage current at the other end of the TVS.
[0049] Preferably, in step 4, when the TVS is not turned on, the ADC theoretical value is 0, and when the TVS has leakage current or the TVS is turned on, the current value is calculated according to the ADC value.
[0050] Compared with the prior art, the present invention has the following beneficial effects:
[0051] 1. The present invention solves the problem of low test automation and inability to perform bidirectional testing of transient high-voltage suppression tubes used in electronic detonators by adopting a structure combining a programmable constant voltage source generation circuit with a power supply polarity switching circuit, thereby achieving a high degree of automatic testing and being able to perform arbitrary direction measurement on TVS.
[0052] 2. The present invention realizes low-cost large-scale testing of TVS tubes by adopting a multi-channel TVS parallel testing method, thereby ensuring the effectiveness of the TVS tubes on the electronic detonator module and improving the reliability of the detonator;
[0053] 3. The test system of the present invention includes a programmable high-voltage constant voltage source, a TVS voltage polarity switching module and a multi-channel TVS test path, which can not only realize the parallel automatic test of multiple TVSs, but also automatically switch the polarity of the high-voltage constant voltage source to perform a bidirectional leakage current test;
[0054] 4. The testing method of the present invention can simultaneously realize the bidirectional leakage current measurement of multiple bidirectional TVS tubes, which not only greatly reduces the detection cost, but also ensures the effectiveness of the TVS tube on the electronic detonator module and improves the reliability of the detonator. BRIEF DESCRIPTION OF THE DRAWINGS
[0055] Other features, objects and advantages of the present invention will become more apparent from the detailed description of non-limiting embodiments made with reference to the following drawings:
[0056] Figure 1 A system block diagram of a leakage current test system for a transient high voltage suppression tube of the present invention;
[0057] Figure 2 It is the structural block diagram of the electronic detonator module;
[0058] Figure 3 Generates a circuit diagram of a module for a programmable high voltage power supply;
[0059] Figure 4 It is the circuit diagram of the power polarity switching module;
[0060] Figure 5 Circuit diagram for multiple TVS test modules;
[0061] Figure 6 This is the circuit diagram of a single TVS test module;
[0062] Figure 7 This is the structural block diagram of the host computer module. DETAILED DESCRIPTION
[0063] The present invention is described in detail below in conjunction with specific embodiments. The following embodiments will help those skilled in the art to further understand the present invention, but are not intended to limit the present invention in any form. It should be noted that, for those of ordinary skill in the art, several changes and improvements can also be made without departing from the concept of the present invention. These all belong to the protection scope of the present invention.
[0064] Example 1 :
[0065] like Figures 1 to 7 As shown, this embodiment provides a leakage current test system for a transient high voltage suppression tube, including a host computer module, a programmable high voltage power supply generation module, a power supply polarity switching module, and multiple TVS test modules. The first output end of the host computer module is connected to the input end of the programmable high voltage power supply generation module, the second output end of the host computer module is connected to the first input end of the power supply polarity switching module, the output end of the programmable high voltage power supply generation module is connected to the second input end of the power supply polarity switching module, the first output end of the power supply polarity switching module is connected to the first input end of multiple TVS test modules, the second output end of the power supply polarity switching module is connected to the second input end of multiple TVS test modules, the output ends of multiple TVS test modules are all connected to the input end of the host computer module, the host computer module is used to collect the leakage current of the TVS tube, the programmable high voltage power supply generation module is used to generate a voltage value in a preset range, the power supply polarity switching module is used to switch the polarity of the voltage at both ends of the TVS tube, and the multi-channel TVS test module is used to convert the leakage current of the TVS tube into voltage.
[0066] The host computer module sends corresponding control signals to the programmable high-voltage power generation module and the power polarity switching module respectively, and collects the TVS leakage current. The programmable high-voltage power generation module is responsible for generating a certain range of voltage values, determining the specific voltage value VDD according to the PWM control signal given by the host computer module, and transmitting VDD to the power polarity switching module. The power polarity switching module is used to switch the voltage polarity at both ends of the TVS to achieve the function of measuring the bidirectional leakage current of the TVS. The multi-channel TVS test circuit converts the leakage current of several TVSs into voltage through sampling resistors, performs A / D conversion and sends it to the host computer module.
[0067] like Figure 2 The figure shows the block diagram of the electronic detonator module. Foot line: The initiator inputs voltage to the module through the foot line, which is rectified by the bridge stack to power the chip, and communicates with the module through the high and low level switching of the two lines; TVS tube: suppresses surge and electromagnetic interference; current limiting resistor: prevents the bridge stack circuit or the electronic detonator chip from short-circuiting and causing excessive current in the module; bridge stack circuit: converts the high and low switching power on the foot line into direct current to power the detonator chip; electronic detonator chip: the main control chip of the module, which completes communication with the initiator and ignition and detonation.
[0068] The programmable high voltage power generation module includes capacitor C I , capacitor C O , capacitor C SS , capacitor C C , resistor R1, resistor R2, resistor R3, resistor R4, resistor R5, resistor R SH , resistor R SL , resistor R C , inductor L, voltage regulator diode D, voltage regulator and proportional amplifier. Capacitor C I One end of the inductor L is connected to the VIN pin of the regulator, and the EN pin of the regulator, and is used as the external VIN pin. The capacitor C I The other end of the inductor L is connected to the positive electrode of the voltage regulator diode D and the three SW pins of the voltage regulator, and the negative electrode of the voltage regulator diode D is connected to the resistor R SH One end and capacitor C O One end of the capacitor C is used as the VOUT pin of the power polarity switching module. O The other end of the resistor R SH The other end is connected to the FB pin of the regulator, the resistor R SL One end of the resistor R1 and one end of the resistor R SL The other end is connected to one end of resistor R5 and capacitor C SS One end of the capacitor C C One end of the resistor R5 is connected to the AGND pin of the regulator and the SYNC pin of the regulator. The other end of the resistor R5 is connected to the FREQ pin of the regulator. The capacitor C SS The other end of the capacitor C C The other end of the resistor R C One end of the resistor R C The other end of is connected to the COMP pin of the regulator, the other end of the resistor R1 is respectively connected to one end of the resistor R2 and the output end of the proportional amplifier, the first power supply end of the proportional amplifier is externally connected to the power supply, the second power supply end of the proportional amplifier is grounded, the in-phase input end of the proportional amplifier is connected to one end of the resistor R4, the inverting input end of the proportional amplifier is respectively connected to the other end of the resistor R2 and one end of the resistor R3, the other end of the resistor R4 is connected to the host computer module and is used to receive the DA control signal of the host computer module, the other end of the resistor R1 is used to receive the DA signal, the other end of the resistor R3 is grounded, and the three PGND pins of the regulator are all grounded. The stabilizer is a boost chip.
[0069] like Figure 3 As shown in the figure, the main part of the programmable high voltage power generation module is the BOOST boost circuit. SH , resistor RSL And the resistor R1 changes the amplification factor, combined with the DA control signal of the host computer module, different voltage generation ranges can be obtained. The theoretical voltage size can be calculated according to the following formula:
[0070]
[0071]
[0072] The effective range of DA signal value is 0V~1.229V. When it is higher than 1.229V, the effect is equivalent to 1.229V.
[0073] The following is a calculation of the voltage range for different resistance values:
[0074]
[0075] The specific resistance value is selected according to the TVS model.
[0076] The power polarity switching module includes a double-pole double-throw relay K, a resistor R-S1, a resistor R-S2 and a triode. The model of the double-pole double-throw relay K is TQ2-5V. Capacitor C O One end is respectively connected to the second pin of the double-pole double-throw relay K and the seventh pin of the double-pole double-throw relay K, one end of the resistor R-S2 is respectively connected to one end of the resistor R-S1 and the base of the triode, the other end of the resistor R-S2 is connected to the control port of the upper computer module, the other end of the resistor R-S1 is connected to the emitter of the triode and grounded, and the collector of the triode is respectively connected to the first pin and the tenth pin of the double-pole double-throw relay K. The power polarity switching module also includes a diode M7, the collector of the triode is respectively connected to the positive electrode of the diode M7 and the tenth pin of the double-pole double-throw relay K, and the negative electrode of the diode M7 is connected to the first pin of the double-pole double-throw relay K.
[0077] like Figure 4 As shown, the power polarity switching module is mainly realized by a double-pole double-throw relay. By default, the upper network VCC / GND of the TVS is connected to the high voltage VCC, and the lower network GND / VCC of the TVS is grounded. When the host computer gives the polarity switching signal CTRL, the relay works to realize the polarity switching.
[0078] The TVS test module includes resistor R6, resistor R7, resistor R8, resistor R9, bidirectional transient suppression diode TVS1, bidirectional transient suppression diode TVS2, a first voltage follower, a second voltage follower, a first ADC voltage acquisition channel, a second ADC voltage acquisition channel, a single-pole double-throw switch K1, and a single-pole double-throw switch K2. One end of the resistor R6 is respectively connected to one end of the resistor R7 and the third pin of the double-pole double-throw relay K, the other end of the resistor R6 is respectively connected to one end of the bidirectional transient suppression diode TVS2 and the first contact end of the single-pole double-throw switch K2, the other end of the resistor R7 is respectively connected to one end of the bidirectional transient suppression diode TVS1 and the first contact end of the single-pole double-throw switch K1, the other end of the bidirectional transient suppression diode TVS2 is respectively connected to one end of the resistor R8 and the second contact end of the single-pole double-throw switch K2, and the other end of the bidirectional transient suppression diode TVS1 is respectively connected to one end of the resistor R9 and the second contact end of the single-pole double-throw switch K1. , the other end of the resistor R8 is respectively connected to the other end of the resistor R9 and the eighth pin of the double-pole double-throw relay K, the single-pole end of the single-pole double-throw switch K1 is connected to the in-phase input end of the first voltage follower, the single-pole end of the single-pole double-throw switch K2 is connected to the in-phase input end of the second voltage follower, the inverting input end of the first voltage follower is respectively connected to the output end of the first voltage follower and the first ADC voltage acquisition channel, the first power supply end of the first voltage follower is externally connected to the power supply, the second power supply end of the first voltage follower is grounded, and the inverting input end of the second voltage follower is respectively connected to the output end of the second voltage follower and the second ADC voltage acquisition channel. The first power supply end of the first voltage follower is externally connected to a 3.3V DC power supply, and the first power supply end of the second voltage follower is externally connected to a 3.3V DC power supply.
[0079] like Figure 5 and Figure 6 As shown, a single TVS test module mainly converts current into voltage through a sampling resistor and outputs it to the ADC through a voltage follower. The corresponding sampling resistors are different when the power supply polarity is different. When the upper end of the TVS is at a high potential, the sampling resistors are R6 and R7. When the lower end of the TVS is at a high potential, the sampling resistors are R8 and R9. The sampling resistor selection is achieved through a single-pole double-throw switch K1 and a single-pole double-throw switch K2. The structure is simple and can realize the combination of multiple TVSs, greatly improving the test efficiency.
[0080] The host computer module is the STM32F103R8T6 controller, such as Figure 7 As shown in the figure, the host computer uses the STM32F103R8T6 as the core module, and can directly use the STM32F103R8T6 internal ADC sampling module for data conversion. After the conversion is completed, the abnormal TVS can be simply fed back by lighting up the LED light and so on. If necessary, the measured value can be sent to the PC through the serial port for subsequent processing.
[0081] This embodiment also provides a testing method for the leakage current testing system based on the transient high voltage suppression tube, comprising the following steps:
[0082] Step 1: Connect a power supply to supply power to the host computer module and the programmable high voltage generation module;
[0083] Step 2: Generate a control voltage through the DA conversion function in the host computer module, and provide the control voltage as a DA signal to the programmable high voltage generation module. After being stabilized by the proportional amplifier in the programmable high voltage generation module, it is output to the other end of the resistor R1. The boost chip generates a corresponding high voltage for testing the TVS according to the size of the DA signal. When the TVS is not turned on, the ADC theoretical value is 0. When the TVS has a leakage current phenomenon or the TVS is turned on, the current size is converted according to the ADC value.
[0084] Step 3: The high voltage generated by the programmable high voltage generation module is transmitted to the power polarity switching module, and the power polarity switching module transmits the high voltage to the designated end of the TVS test module according to the control signal given by the host computer module;
[0085] Step 4: The current passing through the TVS test module is converted into a voltage by a sampling resistor and output stably through a voltage follower, the ADC sampling function of the host computer module is turned on, and the voltage value is observed and recorded;
[0086] Step 5: Change the control signal from the host computer module to the power polarity switching module, switch the polarity at both ends of the TVS, and test the leakage current at the other end of the TVS.
[0087] Embodiment 2:
[0088] Those skilled in the art may understand this embodiment as a more specific description of Embodiment 1.
[0089] This embodiment provides a testing method for the leakage current testing system of the transient high voltage suppression tube in Embodiment 1, comprising the following steps:
[0090] Step 1: Connect the power supply to power the host computer module and the programmable high voltage generation module;
[0091] Step 2: Use the DA conversion function in STM32F103R8T6 to generate DA control signals of different sizes. The DA signal is stabilized by a proportional amplifier in the programmable high-voltage generation module and then output to one end of resistor R1. The boost chip will generate the corresponding high-voltage VCC for testing TVS according to the size of the DA signal;
[0092] Step 3: VCC is transmitted to the double-pole double-throw relay of the power polarity switching module. The TVS upper network VCC / GND and the TVS lower network GND / VCC are connected to VCC and GND respectively through the double-pole double-throw relay.
[0093] Step 4: After the VCC / GND network and GND / VCC in the TVS test module are connected to VCC and GND respectively, a current is generated in the TVS circuit. The current passing through the TVS is converted into a voltage by the sampling resistor. According to the polarity, the single-pole double-throw switch is connected to the sampling point, and the sampling voltage is connected to the voltage follower stable output through the single-pole double-throw switch.
[0094] Step 5: Turn on the ADC cyclic automatic conversion function of the STM32F103R8T6, output the sampled voltage to the PC, and observe and record the voltage value. When the TVS is not turned on, the sampled voltage is lower than the minimum accuracy of the ADC, so the ADC theoretical value is 0. The TVS has leakage current or the current can be calculated based on the ADC value when the TVS is turned on.
[0095] Step 6: Send CTRL signal to the power polarity switching module. The upper network VCC / GND of TVS and the lower network GND / VCC of TVS are connected to GND and VCC respectively through double-pole double-throw relays. Repeat the sampling test steps to measure the leakage current at the other end of TVS.
[0096] The present invention can not only realize parallel automatic testing of multiple TVS tubes, but also automatically switch the polarity of the high-voltage constant-voltage source to perform bidirectional leakage current testing.
[0097] The above describes the specific embodiments of the present invention. It should be understood that the present invention is not limited to the above specific embodiments, and those skilled in the art can make various changes or modifications within the scope of the claims, which does not affect the essence of the present invention. In the absence of conflict, the embodiments of the present application and the features in the embodiments can be combined with each other arbitrarily.
Claims
1. A transient high voltage suppression tube leakage current test system, characterized in that: It includes a host computer module, a programmable high-voltage power generation module, a power polarity switching module, and multiple TVS test modules; The first output end of the host computer module is connected to the input end of the programmable high-voltage power supply generation module, and the second output end of the host computer module is connected to the first input end of the power polarity switching module; The output end of the programmable high-voltage power generation module is connected to the second input end of the power polarity switching module; The first output end of the power polarity switching module is connected to the first input ends of the plurality of TVS test modules, and the second output end of the power polarity switching module is connected to the second input ends of the plurality of TVS test modules; The output ends of the multiple TVS test modules are all connected to the input end of the host computer module; The host computer module is used to collect the leakage current of the TVS tube; the programmable high-voltage power supply generation module is used to generate a voltage value within a preset range; The power polarity switching module is used to switch the polarity of the voltage at both ends of the TVS tube; the multi-channel TVS test module is used to convert the leakage current of the TVS tube into voltage; The programmable high voltage power generation module includes a capacitor C I , capacitor C O , capacitor C SS , capacitor C C , resistor R1, resistor R2, resistor R3, resistor R4, resistor R5, resistor R SH , resistor R SL , resistor R C , inductor L, voltage zener diode D, voltage regulator and proportional amplifier; The capacitor C I One end of the capacitor C is connected to one end of the inductor L, the VIN pin of the regulator, and the EN pin of the regulator, and is used as a VIN pin connected to the outside; I The other end is grounded; The other end of the inductor L is connected to the anode of the voltage regulator diode D and the three SW pins of the voltage regulator respectively; The cathode of the voltage stabilizing diode D is connected to the resistor R SH One end and the capacitor C O and as a VOUT pin connected to the power polarity switching module; the capacitor C O The other end is grounded; The resistor R SH The other end is connected to the FB pin of the regulator, the resistor R SL and one end of the resistor R1; The resistor R SL The other end is connected to one end of the resistor R5 and the capacitor C SS One end of the capacitor C C one end of the voltage regulator, the AGND pin of the voltage regulator, and the SYNC pin of the voltage regulator; The other end of the resistor R5 is connected to the FREQ pin of the regulator; the capacitor C SS The other end of the capacitor C is connected to the SS pin of the regulator; C The other end of the resistor R C One end of the resistor R C The other end is connected to the COMP pin of the regulator; The other end of the resistor R1 is respectively connected to one end of the resistor R2 and the output end of the proportional amplifier; The first power supply terminal of the proportional amplifier is connected to an external power supply, the second power supply terminal of the proportional amplifier is grounded, the non-inverting input terminal of the proportional amplifier is connected to one end of the resistor R4, and the inverting input terminal of the proportional amplifier is respectively connected to the other end of the resistor R2 and one end of the resistor R3; The other end of the resistor R4 is connected to the host computer module and is used to receive the DA control signal of the host computer module; The other end of the resistor R1 is used to receive the DA signal, and the other end of the resistor R3 is grounded; The three PGND pins of the regulator are all connected to ground.
2. The transient high voltage suppression tube leakage current test system according to claim 1, characterized in that: The voltage regulator is a boost chip.
3. The transient high voltage suppression tube leakage current test system according to claim 2, characterized in that: The power polarity switching module includes a double-pole double-throw relay K, a resistor R-S1, a resistor R-S2 and a transistor; the model of the double-pole double-throw relay K is TQ2-5V; The capacitor C O One end is respectively connected to the second pin of the double-pole double-throw relay K and the seventh pin of the double-pole double-throw relay K; One end of the resistor R-S2 is connected to one end of the resistor R-S1 and the base of the triode, and the other end of the resistor R-S2 is connected to the control port of the host computer module; The other end of the resistor R-S1 is connected to the emitter of the triode and is grounded; The collector of the triode is connected to the pin No. 1 and the pin No. 10 of the double-pole double-throw relay K respectively.
4. The transient high voltage suppression tube leakage current test system according to claim 3, characterized in that: The power polarity switching module also includes a diode M7; The collector of the triode is connected to the anode of the diode M7 and the pin 10 of the double-pole double-throw relay K respectively; The cathode of the diode M7 is connected to the pin No. 1 of the double-pole double-throw relay K.
5. The transient high voltage suppression tube leakage current test system according to claim 4, characterized in that: The TVS test module includes a resistor R6, a resistor R7, a resistor R8, a resistor R9, a bidirectional transient suppression diode TVS1, a bidirectional transient suppression diode TVS2, a first voltage follower, a second voltage follower, a first ADC voltage acquisition channel, a second ADC voltage acquisition channel, a single-pole double-throw switch K1, and a single-pole double-throw switch K2; One end of the resistor R6 is respectively connected to one end of the resistor R7 and the third pin of the double-pole double-throw relay K; the other end of the resistor R6 is respectively connected to one end of the bidirectional transient suppression diode TVS2 and the first contact end of the single-pole double-throw switch K2; The other end of the resistor R7 is respectively connected to one end of the bidirectional transient suppression diode TVS1 and the first contact end of the single-pole double-throw switch K1; The other end of the bidirectional transient suppression diode TVS2 is respectively connected to one end of the resistor R8 and the second contact end of the single-pole double-throw switch K2; The other end of the bidirectional transient suppression diode TVS1 is respectively connected to one end of the resistor R9 and the second contact end of the single-pole double-throw switch K1; The other end of the resistor R8 is respectively connected to the other end of the resistor R9 and the eighth pin of the double-pole double-throw relay K; The single-pole end of the single-pole double-throw switch K1 is connected to the non-inverting input end of the first voltage follower, and the single-pole end of the single-pole double-throw switch K2 is connected to the non-inverting input end of the second voltage follower; The inverting input terminal of the first voltage follower is respectively connected to the output terminal of the first voltage follower and the first ADC voltage acquisition channel; The first power supply terminal of the first voltage follower is connected to an external power supply, and the second power supply terminal of the first voltage follower is grounded; The inverting input terminal of the second voltage follower is respectively connected to the output terminal of the second voltage follower and the second ADC voltage acquisition channel; The first power supply terminal of the second voltage follower is connected to an external power supply, and the second power supply terminal of the second voltage follower is grounded.
6. The transient high voltage suppression tube leakage current test system according to claim 5, characterized in that: The first power supply terminal of the first voltage follower is externally connected to a 3.3V DC power supply, and the first power supply terminal of the second voltage follower is externally connected to a 3.3V DC power supply.
7. The transient high voltage suppression tube leakage current testing system according to claim 1, characterized in that: The host computer module is a STM32F103R8T6 controller.
8. A method for testing a leakage current test system of a transient high voltage suppression tube according to claim 5, characterized in that it comprises the following steps: Step 1: Connect a power supply to supply power to the host computer module and the programmable high voltage generation module; Step 2: Generate a control voltage through the DA conversion function in the host computer module, and provide the control voltage as a DA signal to the programmable high voltage generation module. After being stabilized by the proportional amplifier in the programmable high voltage generation module, it is output to the other end of the resistor R1. The boost chip generates a corresponding high voltage for testing the TVS according to the size of the DA signal; Step 3: The high voltage generated by the programmable high voltage generation module is transmitted to the power polarity switching module, and the power polarity switching module transmits the high voltage to the designated end of the TVS test module according to the control signal given by the host computer module; Step 4: The current passing through the TVS test module is converted into a voltage by a sampling resistor and output stably through a voltage follower, the ADC sampling function of the host computer module is turned on, and the voltage value is observed and recorded; Step 5: Change the control signal from the host computer module to the power polarity switching module, switch the polarity at both ends of the TVS, and test the leakage current at the other end of the TVS.
9. The testing method according to claim 8, characterized in that: In step 4, when the TVS is not turned on, the ADC theoretical value is 0. When the TVS has leakage current or the TVS is turned on, the current value is calculated according to the ADC value.
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