A display defect evaluation method, evaluation device and related equipment

Abstract

The present invention provides a display defect evaluation method, an evaluation device and related equipment, including: obtaining structure data of driving transistors in a plurality of pixel circuits on an array substrate; calculating, according to the structure data of the driving transistors, driving currents output by the corresponding driving transistors when each pixel circuit receives the same data signal; estimating the emission brightness of a plurality of light-emitting regions driven by the plurality of pixel circuits, each light-emitting region including at least one light-emitting pixel; evaluating whether a display panel made of the array substrate has display defects according to the estimated emission brightness of the plurality of light-emitting regions, so that it is not necessary for inspectors to manually detect display defects, improving the accuracy and efficiency of display defect detection. Moreover, an array substrate that will cause serious display defects in the display panel can be discovered in time, and then subsequent production steps such as evaporation of light-emitting materials on the array substrate can be terminated in time, avoiding waste of subsequent process materials.

Description

Technical Field

[0001] The present invention relates to the field of display technology, and particularly to a method for evaluating display defects, an evaluation device and related equipment. Background Art

[0002] Due to factors such as production processes, display panels may have defects such as uneven display. Among them, the defect of uneven display, also known as Mura defect, refers to various dot-like, line-like or block-like display defects caused by uneven display brightness.

[0003] Currently, most often, it is by the way that inspectors visually observe the monochromatic image of the display panel to determine whether the display panel has Mura defects. However, because the subjectivity differences among different inspectors are relatively large, and the inspection effect of the inspector will become worse as the inspection time prolongs and the attention drops, therefore, the detection accuracy of display defects is relatively low. Summary of the Invention

[0004] In view of this, the present invention is committed to providing a method for evaluating display defects, an evaluation device and related equipment to improve the detection accuracy of display defects of display panels.

[0005] In a first aspect, the present invention provides a method for evaluating display defects, including:

[0006] Obtaining structure data of driving transistors in a plurality of pixel circuits on an array substrate;

[0007] According to the structure data of the driving transistors, calculating the driving current output by the corresponding driving transistors of each of the pixel circuits when receiving the same data signal;

[0008] According to the driving current, predicting the emission brightness of a plurality of light-emitting regions driven by the plurality of pixel circuits, each of the light-emitting regions including at least one light-emitting pixel;

[0009] According to the emission brightness of the plurality of light-emitting regions, evaluating whether a display panel made of the array substrate has display defects.

[0010] Optionally, the obtaining structure data of driving transistors in a plurality of pixel circuits on an array substrate includes:

[0011] Obtaining optical detection data of driving transistors in a plurality of pixel circuits on the array substrate, where the optical detection data includes data obtained after optically detecting the driving transistors by an optical tester;

[0012] According to the optical detection data, obtaining the structure data of the driving transistors.

[0013] Optionally, calculating the driving current output by the driving transistor corresponding to each pixel circuit when receiving the same data signal according to the structural data of the driving transistor includes:

[0014] Determining the channel width and channel length of the driving transistor according to the structural data of the driving transistor;

[0015] Calculating the driving current output by the driving transistor corresponding to each pixel circuit when receiving the same data signal according to the channel width and channel length of the driving transistor and the driving current calculation formula.

[0016] Optionally, predicting the emission brightness of a plurality of light-emitting regions driven by the plurality of pixel circuits according to the driving current includes:

[0017] Predicting the gray scale value of each light-emitting region according to the driving current of the light-emitting pixels in each light-emitting region, where the gray scale value represents the emission brightness of the light-emitting region.

[0018] Optionally, predicting the gray scale value of each light-emitting region according to the driving current of the light-emitting pixels in each light-emitting region includes:

[0019] Determining the total charge amount of each light-emitting region according to the driving current of the light-emitting pixels in each light-emitting region;

[0020] Predicting the gray scale value of each light-emitting region according to the total charge amount of each light-emitting region and the average charge amount, maximum charge amount and minimum charge amount of the plurality of light-emitting regions.

[0021] Optionally, evaluating whether a display panel made of the array substrate has display defects according to the emission brightness of the plurality of light-emitting regions includes:

[0022] Calculating the probability of each light-emitting region having display defects according to the gray scale value and gray scale reference value of each light-emitting region; the gray scale reference value includes the average value, median or variance of the gray scale values of the plurality of light-emitting regions;

[0023] Predicting the probability of the display panel made of the array substrate having display defects according to the probability of the plurality of light-emitting regions having display defects;

[0024] Evaluating whether the display panel has display defects according to the probability of the display panel having display defects.

[0025] In a second aspect, the present invention provides a display defect evaluation device, including:

[0026] An acquisition module, configured to acquire the structural data of the driving transistors in a plurality of pixel circuits on an array substrate;

[0027] A calculation module, configured to calculate, according to the structural data of the driving transistor, the driving current output by the corresponding driving transistor of each pixel circuit when receiving the same data signal;

[0028] An estimation module, configured to estimate the emission brightness of a plurality of light-emitting regions driven by the plurality of pixel circuits according to the driving current, where each light-emitting region includes at least one light-emitting pixel;

[0029] An evaluation module, configured to evaluate whether a display panel made of the array substrate has display defects according to the emission brightness of the plurality of light-emitting regions.

[0030] Optionally, the obtaining module obtaining the structural data of the driving transistors in a plurality of pixel circuits on the array substrate includes:

[0031] Obtaining optical detection data of the driving transistors in a plurality of pixel circuits on the array substrate, where the optical detection data includes data obtained by optically detecting the driving transistors using an optical tester;

[0032] Obtaining the structural data of the driving transistors according to the optical detection data.

[0033] In a third aspect, the present invention provides an electronic device, including:

[0034] A memory, configured to store at least one set of instructions;

[0035] A processor, configured to execute the at least one set of instructions to perform the display defect evaluation method described in any one of the above.

[0036] In a fourth aspect, the present invention provides a readable storage medium, where the readable storage medium stores at least one set of instructions, and the at least one set of instructions is used to cause a processor to perform the display defect evaluation method described in any one of the above.

[0037] For the display defect evaluation method, evaluation device, and related equipment provided by the present invention, after obtaining the structural data of the driving transistors in a plurality of pixel circuits on the array substrate, according to the structural data of the driving transistors, it is determined that when each pixel circuit receives the same data signal, the driving current output by the corresponding driving transistor. Since the pixel circuit is used to drive the light-emitting pixel to emit light, and the brightness of the light-emitting pixel is positively correlated with the driving current output by the driving transistor in the pixel circuit, therefore, according to the driving currents of the driving transistors in the plurality of pixel circuits, the emission brightness of the plurality of light-emitting regions driven by the plurality of pixel circuits can be estimated, so that whether the display panel made of the array substrate has display defects can be accurately estimated according to the difference in the emission brightness of the plurality of light-emitting regions. Furthermore, it is not necessary for the inspector to manually detect the display defects, which improves the accuracy and efficiency of the display defect detection.

[0038] Moreover, in the present invention, based on the structural data of the driving transistors in the pixel circuits on the array substrate, it is estimated whether the display panel made of the array substrate will have display defects. Therefore, it is possible to timely discover which array substrates will cause serious display defects in the display panel, and then it is possible to timely terminate subsequent production steps such as vapor deposition of light-emitting materials on the array substrate, avoiding waste of subsequent process materials. Description of the Drawings

[0039] By describing the embodiments of the present application in more detail in conjunction with the accompanying drawings, the above and other objects, features, and advantages of the present application will become more obvious. The accompanying drawings are used to provide a further understanding of the embodiments of the present application, and constitute a part of the specification. Together with the embodiments of the present application, they are used to explain the present application and do not constitute a limitation to the present application. In the accompanying drawings, the same reference numerals generally represent the same components or steps.

[0040] Figure 1 It is an effect diagram of a monochrome display screen of a display panel;

[0041] Figure 2 It is a schematic cross-sectional structure diagram of a display panel;

[0042] Figure 3 It is a flowchart of a display defect evaluation method provided by an embodiment of the present invention;

[0043] Figure 4 It is a schematic structural diagram of a pixel circuit provided by an embodiment of the present invention;

[0044] Figure 5 It is a schematic structural diagram of a driving transistor provided by an embodiment of the present invention;

[0045] Figure 6 It is a schematic diagram of the division of the light-emitting area of an array substrate provided by an embodiment of the present invention;

[0046] Figure 7 It is a schematic structural diagram of a display defect evaluation device provided by an embodiment of the present invention. Detailed Embodiments

[0047] Next, the technical solutions in the embodiments of the present invention will be clearly and completely described in conjunction with the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only a part of the embodiments of the present invention, rather than all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by those of ordinary skill in the art without creative efforts shall fall within the protection scope of the present invention.

[0048] Mura defects are among the most difficult defects to detect in display panels. This is mainly because the distribution, shape, and morphology of Mura defects are not fixed. As Figure 1 shown, Figure 1 Figure 4 shows an effect diagram of a monochromatic display screen of a display panel. Among them, Mura defects include dot defects A1, line defects A2, block defects A3, etc.

[0049] Currently, Mura defect identification is carried out by inspectors viewing the monochromatic screen of the display panel. However, due to the large subjective differences among inspectors and the inability to quantify defects, there may be over-detection and missed-detection situations in defect detection. Moreover, the visual effect of inspectors will deteriorate with the extension of the detection time and the decline of attention. Therefore, the accuracy of defect detection is relatively low.

[0050] In addition, as Figure 2 shown, Figure 2 Figure 5 shows a schematic cross-sectional structure diagram of a display panel. The manufacturing process of this display panel generally includes: forming a circuit array layer 21 on a substrate 20, evaporating a light-emitting material on the circuit array layer 21 to form a light-emitting array layer 22, forming a packaging layer 23 on the light-emitting array layer 22, etc. Among them, the substrate with the circuit array layer 21 can be called an array substrate. The circuit array layer 21 includes a plurality of pixel circuits arranged in an array. The light-emitting array layer 22 includes a plurality of light-emitting pixels arranged in an array. Each pixel circuit is usually correspondingly arranged with a light-emitting pixel. The pixel circuit drives the light-emitting pixel to emit light and display an image by inputting a driving current to the correspondingly arranged light-emitting pixel.

[0051] Currently, most display defect detections are carried out after the formation of the light-emitting array layer or the packaging layer. However, this cannot determine whether the display defect is caused by a defective pixel circuit, a defective light-emitting pixel, or a defective packaging layer. There is currently no detection method for display defects caused by defective pixel circuits, so it is impossible to terminate subsequent manufacturing steps such as evaporating the light-emitting material in a timely manner after discovering a defective pixel circuit, resulting in waste of subsequent process materials.

[0052] Based on this, the present invention provides a display defect determination solution. According to the structural data of the driving transistors in the pixel circuits on the array substrate, the driving current of the driving transistors is determined. Then, based on the driving current, the luminous brightness of multiple light-emitting regions driven by multiple pixel circuits is estimated. Furthermore, based on the luminous brightness of the multiple light-emitting regions, it is evaluated whether the display panel made of this array substrate has display defects, so as to avoid the low accuracy caused by manual detection of display defects and avoid waste of process materials due to the failure to timely discover display defects caused by defective pixel circuits.

[0053] As an alternative implementation of the disclosure of the present invention, an embodiment of the present invention provides a display defect evaluation method for evaluating whether the pixel circuits on the array substrate will cause the subsequent manufactured display panel to have display defects. As Figure 3 shown, Figure 3 is a flowchart of the display defect evaluation method provided by an embodiment of the present invention. The display defect evaluation method includes:

[0054] S301: Obtain the structure data of the driving transistors in multiple pixel circuits on the array substrate;

[0055] In the embodiment of the present invention, after forming the array substrate including multiple pixel circuits, the structure data of the driving transistors in the multiple pixel circuits on the array substrate will be obtained. It should be noted that the array substrate in the embodiment of the present invention is a substrate without evaporated light-emitting material, and the display panel in the embodiment of the present invention is a panel after evaporating the light-emitting material on the array substrate.

[0056] As Figure 4 shown, Figure 4 is a schematic structural diagram of a pixel circuit provided by an embodiment of the present invention. The pixel circuit includes transistors T1 to T9 and a capacitor C. Among them, transistor T1 is a driving transistor, and the structure data of the driving transistor may include line data such as the gate, source, drain, and channel region between the source and the drain. It should be noted that in the embodiment of the present invention, only Figure 4 the pixel circuit structure shown is taken as an example for illustration, and the present invention is not limited thereto.

[0057] It should be noted that in the embodiment of the present invention, the structure data of the driving transistors in all the pixel circuits on the array substrate can be obtained at one time, or the structure data of the driving transistors in all the pixel circuits on the array substrate can be obtained in multiple times, and then by executing the process of evaluating the display defects multiple times, it is evaluated whether the display panel made of the array substrate has display defects.

[0058] In the embodiment of the present invention, only the example of obtaining the structure data of the driving transistors in all the pixel circuits on the array substrate at one time is taken for illustration. That is to say, in step S301, the structure data of the driving transistors in the multiple pixel circuits obtained is the structure data of the driving transistors in all the pixel circuits on the array substrate.

[0059] S302: According to the structure data of the driving transistors, calculate the driving current output by the driving transistors when each pixel circuit receives the same data signal;

[0060] As Figure 4 shown, the data signal received by the pixel circuit mainly refers to the Vdata signal. Each pixel circuit generates a corresponding driving current according to the received data signal.

[0061] Although the pixel circuit also receives the power supply signals Vdd and Vss, since the power supply signals received by all pixel circuits are the same, the power supply signals do not affect the magnitude of the driving current output by the pixel circuit. In addition, the pixel circuit also receives driving signals such as Scan1, Scan2, EM, and Vref, etc. However, these signals are only used to control the on / off of the corresponding transistors and do not affect the magnitude of the driving current output by the pixel circuit. That is to say, the signal that determines the magnitude of the driving current output by the pixel circuit is mainly the Vdata signal, i.e., the data signal.

[0062] However, even if the structures of the pixel circuits of different light-emitting pixels are the same and the data signals received by these pixel circuits, i.e., the Vdata signals, are also the same signals, the driving currents output by their driving transistors are not exactly the same. This is because under the influence of factors such as production process differences, the structural parameters and performance parameters of the driving transistors of different pixel circuits are not exactly the same. If the differences in the structural parameters and performance parameters of the driving transistors of different pixel circuits are relatively large, it will lead to relatively large differences in the brightness of different light-emitting pixels, and further lead to display defects such as Mura defects in the display panel.

[0063] Based on this, in the embodiments of the present invention, after obtaining the structural data of the driving transistors in multiple pixel circuits, according to the structural data of the driving transistors in different pixel circuits, determine the driving currents output by the corresponding driving transistors when different pixel circuits receive the same data signal, so as to estimate the brightness of different light-emitting pixels according to the driving currents of different pixel circuits, and further estimate whether the subsequent manufactured display panel has display defects.

[0064] S303: Estimate the emission brightness of multiple light-emitting regions driven by multiple pixel circuits, where each light-emitting region includes at least one light-emitting pixel;

[0065] Since the brightness of the light-emitting pixel is positively correlated with the driving current of the pixel circuit, that is, the larger the driving current, the greater the brightness, and the smaller the driving current, the smaller the brightness. Therefore, after determining the driving currents of multiple pixel circuits, the brightness of multiple light-emitting pixels respectively driven by multiple pixel circuits can be estimated according to the driving currents of multiple pixel circuits, and further, it can be estimated whether the display panel made of the array substrate has display defects.

[0066] Among them, each light-emitting region may include one light-emitting pixel or multiple light-emitting pixels. Specifically, the number of light-emitting pixels included in each light-emitting region can be determined according to the size of the brightness region that the human eye can recognize or specific display requirements.

[0067] S304: Estimate whether the display panel made of the array substrate has display defects according to the emission brightness of multiple light-emitting regions.

[0068] After obtaining the emission brightness of multiple light-emitting regions, it is possible to estimate whether the display panel made of the array substrate has display defects according to whether there are differences in the emission brightness of different light-emitting regions, and it is possible to estimate the severity of the display defects of the display panel made of the array substrate according to the magnitude of the differences in the emission brightness of different light-emitting regions. Among them, the display defects include but are not limited to Mura defects.

[0069] If the estimation result is that the display panel made of the array substrate has display defects, it is possible to determine whether to make the corresponding display panel from the array substrate according to the severity of the display defects. For example, if the estimation result is that the display panel made of the array substrate has relatively light display defects, the display defects can be compensated by adjusting subsequent processes. For example, the brightness can be adjusted by adjusting the thickness of the light-emitting material of the light-emitting pixels, and then the array substrate can be made into a display panel. If the estimation result is that the display panel made of the array substrate has relatively severe display defects, then the array substrate will no longer be made into a display panel to avoid waste of materials such as light-emitting materials and encapsulation layers.

[0070] In the embodiments of the present invention, it is possible to accurately estimate whether the display panel made of the array substrate has display defects according to quantifiable repeatedly collected or obtained data such as the structural data and driving current of the driving transistors in the pixel circuit. Furthermore, it is not necessary for inspectors to manually detect display defects, which improves the accuracy and efficiency of display defect detection.

[0071] Moreover, since in the present invention, based on the structural data of the driving transistors in the pixel circuit on the array substrate, it is estimated whether the display panel made of the array substrate will have display defects, it is possible to timely discover which array substrates will cause the display panel to have severe display defects, and then it is possible to timely terminate the subsequent production steps of the array substrate to avoid waste of subsequent process materials.

[0072] Since after forming the array substrate, optical detection is performed on multiple pixel circuits on the array substrate to obtain optical detection data of the multiple pixel circuits, so as to judge whether the pixel circuit has structural defects that cause abnormal conditions such as short circuits or open circuits in the pixel circuit, therefore, in order not to purchase additional structural data acquisition equipment and reduce costs, in some embodiments of the present invention, the optical detection data of multiple pixel circuits are used to obtain the structural data of the driving transistors in the multiple pixel circuits. Of course, if cost issues are not considered, in other embodiments, a dedicated measuring instrument (such as a CCD camera) can also be used to obtain the structural data of the driving transistors in the multiple pixel circuits, which will not be elaborated here.

[0073] Based on this, in some embodiments of the present invention, obtaining the structural data of the driving transistors in multiple pixel circuits on the array substrate includes: obtaining the optical detection data of the driving transistors in multiple pixel circuits on the array substrate; and obtaining the structural data of the driving transistors in multiple pixel circuits on the array substrate according to the optical detection data.

[0074] Among them, the optical detection data includes the data obtained after optically detecting the array substrate using an optical tester, and the optical tester can be an Automated Optical Inspection (AOI) or the like.

[0075] It should be noted that since the optical detection data obtained by the optical tester is the image data of the driving transistors in multiple pixel circuits, in the embodiments of the present invention, image processing technology can be used to process the optical detection data to obtain the structural data of the driving transistors in the pixel circuits.

[0076] It should also be noted that although it is possible to detect whether the pixel circuit has a structural defect based on the optical detection data, and a structural defect in the pixel circuit will also cause a display defect in the display panel, however, the fact that the pixel circuit does not have a structural defect does not necessarily mean that the display panel will not have a display defect. This is because even if the pixel circuit does not have a structural defect and enables the pixel circuit to operate normally, if the driving currents output by adjacent pixel circuits when receiving the same data signal differ significantly, it will cause a significant difference in the emission brightness of adjacent light-emitting pixels, and thus cause display defects such as Mura defects in the display panel.

[0077] On this basis, in some embodiments of the present invention, calculating the driving current output by the corresponding driving transistor for each pixel circuit when receiving the same data signal according to the structural data of the driving transistor includes: determining the channel region width and channel region length of the driving transistor according to the structural data of the driving transistor; and calculating the driving current output by the corresponding driving transistor for each pixel circuit when receiving the same data signal according to the channel region width and channel region length of the driving transistor and the driving current calculation formula.

[0078] Among them, the calculation formula for the driving current is:

[0079]

[0080] Among them, I ds is the driving current, W is the channel region width, L is the channel region length, U eff is the electron mobility, C ox is the capacitance per unit area of the gate dielectric, V dd is the voltage value of the power supply signal, V datais the voltage value of the data signal, V ds is the source-drain voltage.

[0081] As Figure 5 shown, Figure 5 is a schematic structural diagram of a driving transistor provided by an embodiment of the present invention. The width of the channel region of the driving transistor is W and the length of the channel region is L. After obtaining the width W and the length L of the channel region of the driving transistor according to the structural data of the driving transistor, the width W and the length L of the channel region of the driving transistor and other known parameters can be substituted into the above calculation formula of the driving current to calculate the driving current I of the driving transistor ds .

[0082] In some embodiments of the present invention, after obtaining the driving currents of multiple pixel circuits, the driving currents of different pixel circuits can be compared to determine whether there are differences in the brightness of different light-emitting pixels, and then according to the brightness of the light-emitting pixels, it can be determined whether the display panel made of the array substrate has display defects.

[0083] However, due to the large number of pixel circuits or light-emitting pixels, the amount of data processing is large and the data processing time is too long. Based on this, in order to simplify the amount of data processing and shorten the data processing time. In some other embodiments of the present invention, as Figure 6 shown, Figure 6 is a schematic diagram of the division of the light-emitting area of an array substrate provided by an embodiment of the present invention. The array substrate is divided into multiple light-emitting areas 60, and each light-emitting area 60 includes multiple light-emitting pixels 600. Then, by integrating and adding the driving currents of the multiple light-emitting pixels 600 in each light-emitting area 60, the total current amount or total charge amount of each light-emitting area 60 can be obtained, and the total charge amount is positively correlated with the light-emitting brightness of the light-emitting area 60.

[0084] On this basis, in some embodiments of the present invention, the gray-scale value of each light-emitting area 60 can be estimated according to the total charge amount of each light-emitting area 60, so as to use the gray-scale value of the light-emitting area 60 to characterize the light-emitting brightness of the light-emitting area 60, so as to determine whether there are differences in the light-emitting brightness of different light-emitting areas 60 by comparing the gray-scale values of different light-emitting areas 60, and further estimate whether the display panel made of the array substrate has display defects.

[0085] In some embodiments of the present invention, estimating the gray-scale value of each light-emitting area according to the driving current of the pixel circuit of the light-emitting pixel in each light-emitting area includes: determining the total charge amount of each light-emitting area according to the driving current of the pixel circuit of the light-emitting pixel in each light-emitting area; estimating the gray-scale value of each light-emitting area according to the total charge amount of each light-emitting area and the average charge amount, maximum charge amount and minimum charge amount of multiple light-emitting areas.

[0086] Specifically, after calculating the driving current of each pixel circuit according to the driving current calculation formula, according to the formula calculate the total charge amount I of each light-emitting region A . Among them, as Figure 6 shown, i a is the driving current of the current light-emitting pixel, a takes values from 1 to N in sequence, and N is the convolution value. Generally, starting from the light-emitting pixel in the upper left corner of the light-emitting region 60, the values of N light-emitting pixels are taken in sequence to the right or downwards.

[0087] That is to say, the charge amount I of each light-emitting region 60 A is obtained by integrating and adding the driving currents of multiple light-emitting pixels 600 it contains. Among them, I A can be obtained by integrating and adding the driving currents of all the light-emitting pixels 600 in each light-emitting region 60, or can be obtained by integrating and adding the driving currents of most of the light-emitting pixels 600 in each light-emitting region 60.

[0088] After that, I A can be substituted into the formula to calculate the gray scale value garryI of each light-emitting region A . Among them, I is the set of charge amounts after charge convolution of the light-emitting pixels in all the light-emitting regions in the display panel, avg(I) is the average charge amount of all the light-emitting regions, max(I) is the maximum charge amount among the charge amounts of all the light-emitting regions, and min(I) is the minimum charge amount among the charge amounts of all the light-emitting regions.

[0089] On this basis, in some embodiments of the present invention, predicting whether the display panel made of the array substrate has display defects according to the light-emitting brightness of multiple light-emitting regions includes: calculating the probability of each light-emitting region having display defects according to the gray scale value and the gray scale reference value of each light-emitting region; the gray scale reference value includes the average value, median or variance of the gray scale values of multiple light-emitting regions; predicting the probability of the display panel having display defects according to the probabilities of multiple light-emitting regions having display defects, so as to determine whether the display panel has display defects according to the probability of the display panel having display defects.

[0090] Specifically, the probability g of each light-emitting region having display defects can be calculated according to the formula A . Among them, disI A =Abs(garyI A -avg(I)), that is, disI A ​The absolute value of the difference between the gray scale value of the light-emitting region and the gray scale reference value. Here, the gray scale reference value is only illustrated by taking the average value avg(I) of the gray scale values of all the light-emitting regions as an example, but is not limited thereto, and it may also be the median or variance of the gray scale values of all the light-emitting regions, etc.

[0091] It can be understood that during the process of obtaining the light-emitting brightness of each light-emitting region, the coordinates or positions of each light-emitting region are marked, so as to determine the coordinates or positions of the display defect in the display panel according to the coordinates or positions of the light-emitting region with the display defect.

[0092] Based on this, by converting the driving current of the pixel circuit into the gray scale value of each light-emitting region, the light-emitting brightness of the light-emitting region can be visualized or numericalized, so that the display defect of the display panel made of the array substrate can be accurately predicted according to the specific data, thereby avoiding the problem of low accuracy caused by manual detection of the display defect and avoiding the waste of process materials caused by the failure to detect the display defect caused by the defective pixel circuit in time.

[0093] As another optional implementation of the disclosure of the present invention, an embodiment of the present invention provides a display defect evaluation device, as Figure 7 shown Figure 7 is a schematic structural diagram of a display defect evaluation device provided by an embodiment of the present invention. The display defect evaluation device includes:

[0094] An acquisition module 70, configured to acquire the structural data of the driving transistors in a plurality of pixel circuits on the array substrate;

[0095] A calculation module 71, configured to calculate the driving current output by the driving transistor when each pixel circuit receives the same data signal according to the structural data of the driving transistor;

[0096] An estimation module 72, configured to estimate the light-emitting brightness of a plurality of light-emitting regions driven by a plurality of pixel circuits, and each light-emitting region includes at least one light-emitting pixel;

[0097] An evaluation module 73, configured to evaluate whether the display panel made of the array substrate has a display defect according to the light-emitting brightness of the plurality of light-emitting regions.

[0098] In some embodiments of the present invention, the acquisition module 70 acquiring the structural data of the driving transistors in a plurality of pixel circuits on the array substrate includes:

[0099] Acquiring the optical detection data of the driving transistors in a plurality of pixel circuits on the array substrate, where the optical detection data includes the data obtained after optically detecting the driving transistors by an optical tester;

[0100] Based on the optical detection data, structural data of the driving transistor is obtained.

[0101] On this basis, in some embodiments of the present invention, after the optical tester obtains the optical detection data of the driving transistors in multiple pixel circuits on the array substrate, the optical detection data can be reported to the corresponding FTP server directory. The acquisition module 70 then obtains the optical detection data from the FTP server directory, and based on the optical detection data, obtains the structural data of the driving transistors in multiple pixel circuits on the array substrate. Other modules then perform subsequent calculation steps and send the final result to the engineer in the form of an email, so that after the engineer conducts a detailed analysis, it can be determined whether to perform subsequent process steps on the array substrate.

[0102] In some embodiments of the present invention, the calculation module 71 calculates the driving current output by the driving transistor when each pixel circuit receives the same data signal according to the structural data of the driving transistor, including:

[0103] Based on the structural data of the driving transistor, determine the channel width and channel length of the driving transistor;

[0104] According to the channel width and channel length of each driving transistor and the driving current calculation formula, calculate the driving current output by the driving transistor when each pixel circuit receives the same data signal.

[0105] In some embodiments of the present invention, the estimation module 72 estimates the emission brightness of multiple light-emitting regions driven by multiple pixel circuits according to the driving current, including:

[0106] According to the driving current of the light-emitting pixels in each light-emitting region, estimate the gray scale value of each light-emitting region, where the gray scale value characterizes the emission brightness of the light-emitting region.

[0107] In some embodiments of the present invention, the estimation module 72 estimates the gray scale value of each light-emitting region according to the driving current of the light-emitting pixels in each light-emitting region, including:

[0108] According to the driving current of the light-emitting pixels in each light-emitting region, determine the total charge amount of each light-emitting region;

[0109] According to the total charge amount of each light-emitting region and the average charge amount, maximum charge amount, and minimum charge amount of multiple light-emitting regions, estimate the gray scale value of each light-emitting region.

[0110] In some embodiments of the present invention, the evaluation module 73 evaluates whether the display panel made of the array substrate has display defects according to the emission brightness of multiple light-emitting regions, including:

[0111] According to the gray scale value and the gray scale reference value of each light-emitting region, calculate the probability that each light-emitting region has a display defect; the gray scale reference value includes the average value, median or variance of the gray scale values of multiple light-emitting regions;

[0112] According to the probabilities that multiple light-emitting regions have display defects, estimate the probability that a display panel made of an array substrate has a display defect;

[0113] According to the probability that the display panel has a display defect, evaluate whether the display panel has a display defect.

[0114] As another optional implementation of the disclosed content of the present invention, an embodiment of the present invention provides an electronic device, which may be a terminal device or a server device, etc. The electronic device includes:

[0115] A memory for storing at least one set of instructions;

[0116] A processor for executing at least one set of instructions to perform the display defect evaluation method provided in any of the above embodiments.

[0117] As another optional implementation of the disclosed content of the present invention, an embodiment of the present invention provides a readable storage medium, and the readable storage medium stores at least one set of instructions, and the at least one set of instructions is used to cause a processor to perform the display defect evaluation method provided in any of the above embodiments.

[0118] The readable storage medium of the embodiment of the present invention includes permanent and non-permanent, removable and non-removable media, and information storage can be implemented by any method or technology. The information may be host-readable instructions, data structures, program modules or other data. Examples of the host storage medium include, but are not limited to, phase change memory (PRAM), static random access memory (SRAM), dynamic random access memory (DRAM), other types of random access memory (RAM), read only memory (ROM), electrically erasable programmable read only memory (EEPROM), flash memory or other memory technologies, compact disc read only memory (CD-ROM), digital versatile disc (DVD) or other optical storage, magnetic cassette tapes, magnetic tape magnetic disk storage or other magnetic storage devices or any other non-transmission medium that can be used to store information accessible by a computing device.

[0119] The various embodiments in this specification are described in a progressive manner. Each embodiment focuses on the differences from other embodiments. For the same or similar parts among the various embodiments, reference can be made to each other. For the apparatuses disclosed in the embodiments, since they correspond to the methods disclosed in the embodiments, the description is relatively simple. For the relevant parts, reference can be made to the description in the method section. The above description of the disclosed embodiments enables those skilled in the art to implement or use the present invention. Various modifications to these embodiments will be obvious to those skilled in the art. The general principles defined herein can be implemented in other embodiments without departing from the spirit or scope of the present invention. Therefore, the present invention will not be limited to these embodiments shown herein, but rather will be accorded the widest scope consistent with the principles and novel features disclosed herein.

Claims

1. A display defect evaluation method, characterized in that, Comprising: Obtaining structure data of driving transistors in multiple pixel circuits on an array substrate, where the array substrate is a substrate without evaporated light-emitting material, and the structure data of the driving transistors includes line data of a gate, a source, a drain, and a channel region between the source and the drain; Calculating, according to the structure data of the driving transistors, a driving current output by the corresponding driving transistor when each of the pixel circuits receives the same data signal; Estimating the light-emitting brightness of multiple light-emitting regions driven by the multiple pixel circuits, where each of the light-emitting regions includes at least one light-emitting pixel; Evaluating whether a display panel made of the array substrate has display defects according to the light-emitting brightness of the multiple light-emitting regions.

2. The display defect evaluation method according to claim 1, wherein The obtaining structure data of driving transistors in multiple pixel circuits on the array substrate includes: Obtaining optical detection data of driving transistors in multiple pixel circuits on the array substrate, where the optical detection data includes data obtained by optically detecting the driving transistors using an optical tester; Obtaining the structure data of the driving transistors according to the optical detection data.

3. The display defect evaluation method according to claim 1, wherein The calculating, according to the structure data of the driving transistors, a driving current output by the corresponding driving transistor when each of the pixel circuits receives the same data signal includes: Determining a channel region width and a channel region length of the driving transistors according to the structure data of the driving transistors; Calculating, according to the channel region width and the channel region length of the driving transistors and a driving current calculation formula, a driving current output by the corresponding driving transistor when each of the pixel circuits receives the same data signal.

4. The display defect evaluation method according to claim 1, wherein The estimating the light-emitting brightness of multiple light-emitting regions driven by the multiple pixel circuits according to the driving current includes: Estimating a gray scale value of each light-emitting region according to the driving current of the light-emitting pixels in each light-emitting region, where the gray scale value characterizes the light-emitting brightness of the light-emitting region.

5. The display defect evaluation method according to claim 4, wherein The estimating a gray scale value of each light-emitting region according to the driving current of the light-emitting pixels in each light-emitting region includes: Determining a total charge amount of each light-emitting region according to the driving current of the light-emitting pixels in each light-emitting region; Estimating the gray scale value of each light-emitting region according to the total charge amount of each light-emitting region and the average charge amount, the maximum charge amount, and the minimum charge amount of the multiple light-emitting regions.

6. The display defect evaluation method according to claim 5, wherein, The evaluating whether a display panel made of the array substrate has display defects according to the light-emitting brightness of the multiple light-emitting regions includes: Calculating a probability of each light-emitting region having display defects according to the gray scale value and a gray scale reference value of each light-emitting region; the gray scale reference value includes an average value, a median, or a variance of the gray scale values of the multiple light-emitting regions; Estimating a probability of the display panel made of the array substrate having display defects according to the probabilities of the multiple light-emitting regions having display defects; Evaluating whether the display panel has display defects according to the probability of the display panel having display defects.

7. A display defect evaluation device, characterized in that, Comprising: An acquisition module, configured to acquire structure data of driving transistors in a plurality of pixel circuits on an array substrate, where the array substrate is a substrate without evaporated light-emitting material, and the structure data of the driving transistors includes line data of a gate, a source, a drain, and a channel region between the source and the drain; A calculation module, configured to calculate, according to the structure data of the driving transistors, driving currents output by the corresponding driving transistors when each of the pixel circuits receives the same data signal; An estimation module, configured to estimate, according to the driving currents, the emission brightness of a plurality of light-emitting regions driven by the plurality of pixel circuits, where each of the light-emitting regions includes at least one light-emitting pixel; An evaluation module, configured to evaluate whether a display panel made of the array substrate has display defects according to the emission brightness of the plurality of light-emitting regions.

8. The display defect evaluation device according to claim 7, characterized in that The acquisition of the structure data of the driving transistors in the plurality of pixel circuits on the array substrate by the acquisition module includes: Acquiring optical detection data of the driving transistors in the plurality of pixel circuits on the array substrate, where the optical detection data includes data obtained by optically detecting the driving transistors by an optical tester; Obtaining the structure data of the driving transistors according to the optical detection data.

9. An electronic device, characterized in that, Including: A memory, configured to store at least one set of instructions; A processor, configured to execute the at least one set of instructions to perform the display defect evaluation method according to any one of claims 1 to 6.

10. A readable storage medium, characterized in that, The readable storage medium stores at least one set of instructions, and the at least one set of instructions is used to cause the processor to perform the display defect evaluation method according to any one of claims 1 to 6.

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