Device, method, system and main control terminal for measuring tensile strength of optical film

Abstract

The present invention proposes a device, method, system, and main control terminal for measuring the tensile strength of optical films. The method includes: first, placing a sample to be tested on a sample holder and controlling a heating module to begin heating the sample on the sample holder; then, obtaining film state information and surface peak-to-valley values ​​of the optical film on the sample; and determining, based on the film state information, when a crack appears in the optical film on the sample; and determining, based on the surface peak-to-valley values, the change in surface peak-to-valley values ​​of the sample from the start of heating to the time when the crack appears in the optical film; and finally, determining the tensile strength of the optical film based on the change in surface peak-to-valley values ​​and a preset film tensile strength-surface peak-to-valley value calculation formula. The present invention aims to test and quantify the tensile strength of optical films.

Description

Technical Field

[0001] The present invention relates to the technical field of optical films, and in particular to a device, method, system and main control terminal for measuring the tensile strength of optical films. Background Art

[0002] Currently, due to the lack of quantitative methods to measure the tensile strength of optical films, there is a lack of research tools for the film cracking phenomenon that often occurs in the coating industry. In-depth analysis of the causes of film cracking is impossible, and the coating conditions can only be improved through a large number of trial and error processes. This not only wastes a lot of manpower and material resources, but may also affect the popularity of plastic components in the optical industry. Summary of the Invention

[0003] The main purpose of the present invention is to provide a device, method, system and main control terminal for measuring the tensile strength of optical films, aiming to achieve the testing and quantification of the tensile strength of optical films.

[0004] To achieve the above objectives, the present invention proposes a method for measuring the tensile strength of an optical film, based on an apparatus for measuring the tensile strength of an optical film. The apparatus comprises a sample holder and a heating module. The sample holder is used to place a sample to be measured, which is a standard substrate coated with the optical film to be measured. The sample holder is disposed on the heating module.

[0005] The method for measuring the tensile strength of an optical film comprises:

[0006] Placing the sample to be tested on the sample holder, and controlling the heating module to start heating the sample to be tested on the sample holder;

[0007] Obtaining film state information of the optical film to be tested on the sample to be tested and surface peak-to-valley values ​​of the sample to be tested, and determining when a crack appears on the optical film to be tested on the sample to be tested based on the film state information, and determining a change in the surface peak-to-valley values ​​of the sample to be tested from the start of heating to the time when the crack appears on the optical film to be tested based on the surface peak-to-valley values;

[0008] The tensile strength of the optical film to be measured is determined according to the surface peak-to-valley value variation and a preset film tensile strength-surface peak-to-valley value variation calculation formula.

[0009] Optionally, the step of obtaining the peak-to-valley value of the surface shape of the sample to be tested is specifically as follows:

[0010] Obtaining the temperature parameter of the sample to be tested;

[0011] The surface peak-valley value of the sample to be tested is determined according to the temperature parameter and a preset temperature-surface peak-valley value formula.

[0012] Optionally, the sample holder is further used to place a standard sample, wherein the standard sample is a standard substrate coated with a standard optical film. The device for measuring the tensile strength of the optical film further includes a surface peak-to-valley value detection module. Before the steps of placing the sample to be tested on the sample holder and controlling the heating module to start heating the sample to be tested on the sample holder, the method for measuring the tensile strength of the optical film further includes:

[0013] Placing the standard sample on the sample holder, and controlling the heating module to start heating the sample to be tested on the sample holder;

[0014] Controlling the surface peak-valley value detection module to start working, so as to obtain the surface peak-valley value of the standard sample and the temperature parameter of the standard sample;

[0015] The preset temperature-surface peak-valley value formula is obtained according to the temperature parameter of the standard sample and the surface peak-valley value of the standard sample.

[0016] Optionally, the device for measuring the tensile strength of an optical film further includes a surface peak-valley value detection module, and the steps of obtaining film state information of the optical film to be tested on the sample to be tested and the surface peak-valley value of the sample to be tested, and determining, based on the film state information, when a crack appears in the optical film to be tested on the sample to be tested, and determining, based on the surface peak-valley value, a change in the surface peak-valley value of the sample to be tested from the start of heating to the time when the crack appears in the optical film to be tested, further include:

[0017] The surface peak-valley value detection module is controlled to start working to obtain the surface peak-valley value of the sample to be tested.

[0018] Optionally, the preset film tensile strength-surface peak-to-valley value change calculation formula is:

[0019]

[0020] Wherein, Es is the elastic modulus of the substrate, vs is the Poisson's ratio, D is the diameter of the substrate, ts is the thickness of the substrate, tf is the thickness of the film layer, and ΔPV is the change in the peak-to-valley value of the surface shape.

[0021] Optionally, the device for measuring the tensile strength of an optical film further comprises a camera module, and the step of obtaining the film state information of the optical film to be measured on the sample to be measured is specifically as follows:

[0022] The camera module is controlled to capture image information of the optical film to be tested on the sample to be tested.

[0023] The present invention also provides a master control terminal, which includes:

[0024] Memory;

[0025] a processor; a program for measuring the tensile strength of an optical film stored in the memory and executed by the processor, wherein the program for measuring the tensile strength of an optical film, when executed by the processor, implements the method for measuring the tensile strength of an optical film as described in any one of the above items.

[0026] The present invention also provides a device for measuring the tensile strength of an optical film, the device comprising:

[0027] A sample holder, the sample holder is used to place a sample to be tested, wherein the sample to be tested is a standard substrate coated with an optical film to be tested;

[0028] A heating module, the sample holder is arranged on the heating module, the heating module is communicatively connected to the main control terminal, and the heating module is used to heat the sample holder under the control of the main control terminal;

[0029] a film state detection module, wherein the film state recognition module is communicatively connected to the main control terminal and is used to detect the film state of the optical film to be tested on the sample to be tested and output a corresponding film state detection signal to the main control terminal;

[0030] A sensor module is communicatively connected to the main control terminal and is used to detect the surface peak-valley values ​​of the sample to be tested and output corresponding surface peak-valley value detection signals to the main control terminal, so that the main control terminal can calculate the change in the surface peak-valley values ​​of the sample to be tested from the start of heating to the time when the optical film to be tested cracks according to the film state detection signal and the surface peak-valley value detection signal, and determine the tensile strength of the optical film to be tested according to a preset film tensile strength-surface peak-valley value change calculation formula.

[0031] Optionally, the sample holder is made of metal;

[0032] The heating module includes a heating plate and a power supply device, the heating plate is electrically connected to the power supply device, and the power supply device is communicatively connected to the main control terminal;

[0033] The heating plate and the sample holder are arranged closely together, and the power supply device is used to output a power supply signal to the heating plate under the control of the main control terminal, so that the heating plate generates heat.

[0034] Optionally, the film state detection module includes a camera module, which is communicatively connected to the main control terminal and is used to capture image information of the optical film to be tested under the control of the main control terminal and output corresponding image signals to the main control terminal.

[0035] Optionally, the sensor module includes a temperature detection module, and the temperature detection module is communicatively connected to the main control terminal;

[0036] The temperature detection module is used to detect the temperature of the sample to be tested and output a corresponding temperature detection signal so that the main control terminal can determine the surface peak-valley value of the sample to be tested based on the temperature detection signal and a preset temperature-surface peak-valley value formula.

[0037] Optionally, the sample holder is further used to place a standard sample, and the standard sample is a standard substrate coated with a standard optical film;

[0038] The device for measuring the tensile strength of the optical film further includes a surface peak-valley value detection module, and the surface peak-valley value detection module is communicatively connected to the main control terminal;

[0039] The surface peak-valley value detection module is used to detect the surface peak-valley value of the standard sample and output the corresponding standard sample surface peak-valley value signal to the main control terminal;

[0040] The temperature detection module is also used to detect the temperature of the standard sample and output the corresponding standard sample temperature detection signal to the main control terminal, so that the main control terminal can generate the preset temperature-surface peak-valley value formula based on the standard sample surface peak-valley value signal and the standard sample temperature detection signal.

[0041] Optionally, the sensor module is the surface peak-valley value detection module.

[0042] Optionally, the surface peak-valley value detection module is a laser interferometer.

[0043] The present invention also provides a system for measuring the tensile strength of an optical film, comprising the main control terminal as described above and the device for measuring the tensile strength of an optical film as described above.

[0044] In the solution of the present invention, the sample to be tested is first placed on the sample holder, and the heating module is controlled to begin heating the sample to be tested on the sample holder. Then, film status information of the optical film to be tested on the sample to be tested is obtained, and based on the film status information, the occurrence of cracks in the optical film to be tested on the sample to be tested is determined. The change in peak-to-valley value of the surface shape of the sample to be tested from the start of heating to the occurrence of cracks in the optical film to be tested is obtained. Finally, the tensile strength of the optical film to be tested is determined based on the change in peak-to-valley value and a preset film tensile strength-surface peak-to-valley value change calculation formula. In this way, in practical applications, for different optical films, as long as a standard substrate with the same parameters is used and tested according to the above method, the tensile strength of different optical films can be quantified, thereby providing corresponding reference for film performance, coating process, and optical film selection, shortening the R&D and production cycle and improving the production efficiency of products requiring coating. BRIEF DESCRIPTION OF THE DRAWINGS

[0045] In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the following briefly introduces the drawings required for use in the embodiments or the description of the prior art. Obviously, the drawings described below are only some embodiments of the present invention. For ordinary technicians in this field, other drawings can be obtained based on the structures shown in these drawings without paying any creative work.

[0046] Figure 1 A schematic flow chart of an embodiment of a method for measuring the tensile strength of an optical film according to the present invention;

[0047] Figure 2 A schematic flow chart of another embodiment of a method for measuring the tensile strength of an optical film according to the present invention;

[0048] Figure 3 Schematic diagram of the structure of an embodiment of a device for measuring the tensile strength of an optical film according to the present invention;

[0049] Figure 4 A schematic structural diagram of another embodiment of the device for measuring the tensile strength of an optical film according to the present invention;

[0050] Figure 5 Schematic diagram of the structure of another embodiment of the device for measuring the tensile strength of an optical film according to the present invention;

[0051] Figure 6 A schematic diagram of functional modules of an apparatus for measuring the tensile strength of an optical film according to an embodiment of the present invention;

[0052] Figure 7 A schematic diagram of functional modules of another embodiment of the device for measuring the tensile strength of an optical film according to the present invention;

[0053] Figure 8 Schematic diagram of functional modules of another embodiment of the device for measuring the tensile strength of an optical film according to the present invention;

[0054] Figure 9 Schematic diagram of functional modules of another embodiment of the device for measuring the tensile strength of an optical film according to the present invention.

[0055] Description of Figure Numbers:

[0056]

[0057] The purpose, features and advantages of the present invention will be further described with reference to the accompanying drawings and in conjunction with the embodiments. DETAILED DESCRIPTION

[0058] The following will clearly and completely describe the technical solutions in the embodiments of the present invention in conjunction with the accompanying drawings. Obviously, the described embodiments are only part of the embodiments of the present invention, not all of the embodiments. All other embodiments obtained by ordinary technicians in this field based on the embodiments of the present invention without making any creative efforts shall fall within the scope of protection of the present invention.

[0059] It should be noted that all directional indications in the embodiments of the present invention (such as up, down, left, right, front, back, etc.) are only used to explain the relative position relationship, movement status, etc. between the various components under a certain specific posture (as shown in the accompanying drawings). If the specific posture changes, the directional indication will also change accordingly.

[0060] In the present invention, unless otherwise specified or limited, the terms "connection" and "fixation" should be understood in a broad sense. For example, "fixation" can mean fixed connection, detachable connection, or integration; mechanical connection or electrical connection; direct connection or indirect connection through an intermediate medium; internal communication between two elements or interaction between two elements, unless otherwise specified. Those skilled in the art will be able to understand the specific meanings of the above terms in the present invention based on specific circumstances.

[0061] In addition, in the present invention, descriptions such as "first" and "second" are for descriptive purposes only and should not be understood as indicating or implying their relative importance or implicitly indicating the number of the indicated technical features. Therefore, the features defined as "first" and "second" may explicitly or implicitly include at least one of such features. In addition, the technical solutions between the various embodiments can be combined with each other, but this must be based on the fact that they can be implemented by ordinary technicians in this field. When the combination of technical solutions is contradictory or cannot be implemented, it should be deemed that such combination of technical solutions does not exist and is not within the scope of protection required by the present invention.

[0062] Currently, due to the lack of quantitative methods to measure the tensile strength of optical films, there is a lack of research tools for the film cracking phenomenon that often occurs in the coating industry. In-depth analysis of the causes of film cracking is impossible, and the coating conditions can only be improved through a large number of trial and error processes. This not only wastes a lot of manpower and material resources, but may also affect the popularity of plastic components in the optical industry.

[0063] To this end, the present invention proposes a method for measuring the tensile strength of an optical film, based on a device for measuring the tensile strength of an optical film. The device for measuring the tensile strength of an optical film includes a sample holder and a heating module. The sample holder is used to place a sample to be measured, which is a standard substrate coated with the optical film to be measured. The sample holder is arranged on the heating module.

[0064] It should be understood that each device in the device for measuring the tensile strength of an optical film can be connected to a main control terminal, such as a computer, PLC or PDA. The main control terminal can be used to execute the method process of the present invention. The user can output corresponding control instructions to the main control terminal through the input device, so that the main control terminal controls the above-mentioned devices to perform the following test actions and process the data obtained according to the test.

[0065] refer to Figure 1 In one embodiment of the present invention, a method for measuring the tensile strength of an optical film includes:

[0066] Step S10: placing the sample to be tested on the sample holder, and controlling the heating module to start heating the sample to be tested on the sample holder;

[0067] In this embodiment, before starting the test, the user can place the sample to be tested on the sample holder. Alternatively, the device for measuring the tensile strength of optical films can be equipped with a robotic arm that is communicatively connected to a main control terminal. The user can control the robotic arm via the main control terminal to place the sample to be tested, which is placed in the test area, on the sample holder. The sample holder can be sized to fit the sample to be tested, thereby stably securing the sample.

[0068] In this embodiment, the sample to be tested is a standard substrate coated with the optical film to be tested. The standard substrate is a batch of substrates with the same material, the same size, and prepared by the same process. The substrate needs to meet the requirements of a thermal expansion coefficient much greater than that of the optical film, a melting point significantly higher than 100°C and higher than the temperature at which cracks appear in the optical film to be tested, and easy to be processed into an optical surface. The material of the substrate can be K26R material, metal, nylon, etc.

[0069] In this embodiment, after placing the sample to be tested on the sample holder, the user can input a test start instruction to the main control terminal via an input device. The main control terminal then controls the heating module to start operating and begin heating the sample to be tested. Optionally, the heating module can be composed of a heating film and a power supply communicatively connected to the main control terminal. The power supply can power the heating film under the control of the main control terminal, causing the heating film to heat up, thereby increasing the temperature of the sample to be tested in the sample holder. Optionally, the heating module can also be composed of a heating plate embedded with a heating element and a power supply communicatively connected to the main control terminal.

[0070] Step S20, obtaining film state information of the optical film to be tested on the sample to be tested and surface peak-to-valley values ​​of the sample to be tested, and determining when a crack appears in the optical film to be tested on the sample to be tested based on the film state information, and determining a change in the surface peak-to-valley values ​​from the time when the sample to be tested starts to be heated to the time when the crack appears in the optical film to be tested based on the surface peak-to-valley values;

[0071] Step S30 , determining the tensile strength of the optical film to be measured according to the surface peak-to-valley value variation and a preset film tensile strength-surface peak-to-valley value variation calculation formula.

[0072] It's important to understand that as temperature rises, the standard substrate in the sample under test expands, causing changes in its peak-to-valley values. This change in peak-to-valley values ​​generates stress in the optical film under test. Therefore, if cracks develop in the optical film under test during heating, the stress induced by the expansion of the standard substrate on the optical film under test can be used to represent the tensile strength of the optical film under test.

[0073] In this embodiment, the apparatus for measuring the tensile strength of an optical film may also include a film state recognition module communicatively connected to a main control terminal. The film state recognition module may be fixed to a sample holder via a fixed bracket to detect the film state of the optical film on the current sample and transmit the detection results to the main control terminal. Optionally, the film state recognition module may be implemented using a camera module, a scattered light detection module, or the like. The camera module may capture images of the current film and upload them to the main control terminal, allowing the main control terminal to identify cracks in the current optical film based on the image information.

[0074] In this embodiment, the calculation formula for the change in the tensile strength of the film-surface peak-to-valley value is preset as follows:

[0075]

[0076] Among them, Es is the elastic modulus of the substrate, vs is the Poisson's ratio, D is the substrate diameter, ts is the substrate thickness, and tf is the thickness of the film to be measured. These are all known quantities and can be entered into the main control terminal by the user in advance. ΔPV is the change in the peak-to-valley value of the surface shape. Therefore, it is only necessary to know the change in the peak-to-valley value of the surface shape of the standard substrate from the start of heating to the time when cracks appear in the optical film to obtain the tensile strength of the optical film to be measured according to the above formula (1).

[0077] To this end, optionally, in one embodiment, the apparatus for measuring the tensile strength of the optical film further includes a surface peak-valley value detection module, and step S20 further includes:

[0078] Step S23, controlling the surface peak-valley value detection module to start working to obtain the surface peak-valley value of the sample to be tested;

[0079] In this embodiment, the device for measuring the tensile strength of the optical film further includes a surface peak-valley value detection module. Figure 5 B. The surface peak-valley detection module can also be mounted directly above the sample holder via a bracket, or the sample holder can be placed directly within the module's test bracket. This module can utilize a laser interferometer. A camera module is also mounted on the upper side to capture the state of the optical film on the sample.

[0080] When the main control terminal receives a start command from the user via the input device, it simultaneously controls the surface shape peak-valley value detection module to start operating, thereby obtaining the surface shape peak-valley value of the sample to be tested, i.e., obtaining the surface shape peak-valley value of the standard substrate. At this time, when it is determined that the optical film to be tested on the sample to be tested has cracks, the step of determining the change in the surface shape peak-valley value of the sample to be tested from the start of heating to the time when the cracks appeared in the optical film to be tested based on the surface shape peak-valley value is specifically as follows: when the main control terminal determines that the optical film to be tested on the sample to be tested has cracks based on the film status information, the main control terminal calculates the difference between a first surface shape peak-valley value of the sample to be tested at the moment the cracks appeared in the optical film to be tested and a second surface shape peak-valley value of the sample to be tested at the moment when the heating module is initially controlled to start heating, i.e., when the start command is received to control the surface shape peak-valley value detection module to start operating, thereby obtaining the change in the surface shape peak-valley value. Finally, the main control terminal will obtain the tensile strength of the optical film to be measured according to the preset film tensile strength-surface peak-to-valley value change calculation formula in the above embodiment.

[0081] In addition, in another embodiment, in one embodiment of the present invention, step S20 further includes:

[0082] Step S21, obtaining the temperature parameters of the sample to be tested;

[0083] Step S22: determining the surface peak-valley value of the sample to be tested according to the temperature parameter and a preset temperature-surface peak-valley value formula.

[0084] In this embodiment, the device for measuring the tensile strength of an optical film may also include a temperature detection module for detecting the temperature of a sample to be tested, which is communicatively connected to a main control terminal. The temperature detection module detects the current temperature of the sample to be tested and transmits the temperature parameters of the sample to the main control terminal. The temperature detection module may be placed on a sample holder and positioned close to the sample to be tested, thereby improving the accuracy of temperature detection. Optionally, the temperature detection module may be implemented using a temperature detection sensor such as a thermistor probe or an infrared sensor.

[0085] In this embodiment, the main control terminal can pre-store a preset temperature-surface shape peak-valley value formula. During the test process, the main control terminal can determine the temperature of the current sample to be tested in real time based on the temperature parameters, and calculate the corresponding surface shape peak-valley values ​​of different samples to be tested at different temperatures based on the preset temperature-surface shape peak-valley value formula. At this time, when it is determined that the optical film to be tested on the test sample has cracks, the step of determining the change in the surface peak-valley value of the test sample from the start of heating to the time when the cracks appear in the test optical film based on the surface peak-valley value is specifically as follows: when the main control terminal determines that the optical film to be tested on the test sample has cracks based on the film status information, it determines the temperatures of the test sample at two moments (the temperature at the start of heating of the test sample and the temperature at which the cracks appear on the test optical film) based on the first temperature parameter transmitted by the temperature detection module upon receiving the start command and the second temperature parameter transmitted by the temperature detection module when the test optical film cracks, respectively, and determines the surface peak-valley values ​​at the two temperatures based on a preset temperature-surface peak-valley value formula, thereby determining the change in the surface peak-valley value from the start of heating to the time when the cracks appear in the test optical film. Finally, the main control terminal obtains the tensile strength of the test optical film based on the preset film tensile strength-surface peak-valley value change calculation formula in the above embodiment. In this way, in actual application, the above measurement method does not require a surface peak and valley value detection module such as a laser interferometer. It only needs to pre-store the preset temperature-surface peak and valley value formula corresponding to the current standard substrate in the main control terminal in advance. Relying only on a film state recognition module such as a camera and a temperature detection module, it is possible to obtain the change in the surface peak and valley value of the current sample to be tested from the beginning of heating to the time when cracks appear on the optical film to be tested, and then obtain the tensile strength of the optical film to be tested. The detection process is simple to operate, the detection device is low in cost, and it is suitable for large-scale testing.

[0086] It is understood that the preset temperature-surface peak-valley value formula corresponding to the standard substrate can also be measured and obtained by R&D personnel during R&D using a device for measuring the tensile strength of an optical film. In one embodiment, the sample holder is also used to place a standard sample, which is a standard substrate coated with a standard optical film. The device for measuring the tensile strength of the optical film also includes a surface peak-valley value detection module. Before step S10, the method for measuring the tensile strength of the optical film further includes:

[0087] Step S40: placing the standard sample on the sample holder, and controlling the heating module to start heating the sample to be tested on the sample holder;

[0088] Step S50: controlling the surface peak-valley value detection module to start working to obtain the surface peak-valley value of the standard sample and the temperature parameter of the standard sample;

[0089] Step S60: Obtain a preset temperature-surface peak-valley value formula according to the temperature parameter of the standard sample and the surface peak-valley value of the standard sample.

[0090] It should be understood that the above process of determining the preset temperature-surface peak-valley value formula corresponding to the standard substrate can be performed before the strength test. At this time, the user can place the standard sample on the sample holder. The standard sample is coated with a thick optical film, for example, at least 400nm thick, to ensure that the optical film will not tear when the standard substrate is heated to the melting point. The optical film can be made of TiO2.

[0091] Specifically, refer to Figure 4 , the surface peak and valley value detection module can be implemented using a laser interferometer. Similar to the above process, when the main control terminal receives the calibration instruction output by the user through the input device, it will start to control the heating module to heat the sample to be tested on the sample holder. At the same time, the main control terminal will control the surface peak and valley value detection module to start working to obtain the surface peak and valley values ​​of the standard sample, and obtain the temperature parameters of the standard sample through the temperature detection module. In this way, in the process of controlling the heating module to heat the temperature of the standard sample to the melting point of the standard substrate, the main control terminal can obtain multiple temperature detection results and multiple corresponding surface peak and valley value detection results. The main control terminal can use the interpolation method to obtain the functional relationship formula of the preset temperature-surface peak and valley value of the corresponding standard substrate:

[0092] PV=F(T) Formula (2)

[0093] In the above formula, T represents temperature and PV represents the peak-to-valley value of the surface shape. After obtaining this formula, the master control terminal can store it on the server. In the above embodiment, in a large-scale testing scenario, the master control terminal can directly call the pre-set temperature-surface shape peak-to-valley value formula from the server. This allows the master control terminal to obtain the change in the peak-to-valley value of the surface shape of the current sample from the time heating begins to the time cracks appear in the optical film under test, using only the camera and temperature detection module, and thus obtain the tensile strength of the optical film under test.

[0094] It is understood that, while the main control terminal is controlling the heating module to heat, the heating module can be controlled to operate according to a gradually increasing heating strategy based on the temperature parameters of the standard sample fed back by the temperature detection module, so that the temperature of the standard sample increases at a preset interval, for example, by 1 degree per second. This helps to improve the continuity of temperature detection and, in turn, the accuracy and precision of the ultimately generated formula.

[0095] In the solution of the present invention, the sample to be tested is first placed on the sample holder, and the heating module is controlled to begin heating the sample to be tested on the sample holder. Then, film status information of the optical film to be tested on the sample to be tested is obtained, and based on the film status information, the occurrence of cracks in the optical film to be tested on the sample to be tested is determined. The change in peak-to-valley value of the surface shape of the sample to be tested from the start of heating to the occurrence of cracks in the optical film to be tested is obtained. Finally, the tensile strength of the optical film to be tested is determined based on the change in peak-to-valley value and a preset film tensile strength-surface peak-to-valley value change calculation formula. In this way, in practical applications, for different optical films, as long as a standard substrate with the same parameters is used and tested according to the above method, the tensile strength of different optical films can be quantified, thereby providing corresponding reference for film performance, coating process, and optical film selection, shortening the R&D and production cycle and improving the production efficiency of products requiring coating.

[0096] In one embodiment of the present invention, the apparatus for measuring the tensile strength of an optical film further includes a camera module, and the steps of obtaining the film state information of the optical film to be tested on the sample to be tested are specifically as follows:

[0097] Step S24 : controlling the camera module to capture image information of the optical film to be tested on the sample to be tested.

[0098] In this embodiment, the camera module can also be implemented by a camera, which can be suspended above the sample to be tested by a fixing device to capture the image information of the optical film on the current sample to be tested and upload it to the main control terminal, so that the main control terminal can determine the current state of the optical film to be tested based on the image information.

[0099] The present invention also proposes a master control terminal, which includes:

[0100] Memory;

[0101] Processor; a program for measuring the tensile strength of an optical film stored in a memory and executed by the processor, wherein the program for measuring the tensile strength of an optical film, when executed by the processor, implements any of the above methods for measuring the tensile strength of an optical film.

[0102] It is worth noting that since the main control terminal of the present invention is based on the above-mentioned method for measuring the tensile strength of optical films, the embodiments of the main control terminal of the present invention include all technical solutions of all embodiments of the above-mentioned method for measuring the tensile strength of optical films, and the technical effects achieved are also exactly the same, which will not be repeated here.

[0103] The present invention also proposes a device for measuring the tensile strength of optical films, referring to Figure 3-6In one embodiment of the present invention, the device for measuring the tensile strength of an optical film comprises:

[0104] Sample holder 00: Sample holder 00 is used to place the sample to be tested, which is a standard substrate coated with the optical film to be tested;

[0105] The heating module 10 is provided on the sample holder 00. The heating module 10 is in communication with the main control terminal and is used to heat the sample holder 00 under the control of the main control terminal.

[0106] The film state detection module and the film state identification module 20 are in communication connection with the main control terminal and are used to detect the film state of the optical film to be tested on the sample to be tested and output a corresponding film state detection signal to the main control terminal;

[0107] The sensor module 30 is communicatively connected to the main control terminal and is used to detect the surface peak-valley values ​​of the sample to be tested and output corresponding surface peak-valley value detection signals to the main control terminal, so that the main control terminal can calculate the change in the surface peak-valley value of the sample to be tested from the start of heating to the time when the optical film to be tested cracks according to the film state detection signal and the surface peak-valley value detection signal, and determine the tensile strength of the optical film to be tested according to a preset film tensile strength-surface peak-valley value change calculation formula.

[0108] In this embodiment, the sample holder 00 is sized to fit the sample to be tested, thereby stably securing it. The sample to be tested is a standard substrate coated with the optical film to be tested. The standard substrate is a batch of substrates made of the same material, size, and process. The substrate must have a thermal expansion coefficient significantly greater than that of the optical film, a melting point significantly above 100°C and above the temperature at which cracks would occur in the optical film to be tested, and be easily processed into an optical surface. The substrate can be made of materials such as K26R.

[0109] In this embodiment, the heating module 10, the film state detection module, and the sensor module 30 are additionally provided with a communication module for communicating with the main control terminal to achieve data transmission between the communication module. Optionally, the communication module can be a wireless communication module, such as a WIFI communication module, a Bluetooth communication module, and a 4G / 5G communication module. Alternatively, the communication module can also be a wireless communication module, such as a CAN communication module, an SPI communication module, an I2C communication module, a USART communication module, an RS232 communication module, etc.

[0110] In this embodiment, the heating module 10 can be composed of a heating film and a power supply connected to the main control terminal; it can also be composed of a heating plate 11 embedded with a heating sheet and a power supply connected to the main control terminal.

[0111] Specifically, after placing the sample to be tested on the sample holder 00, the user can input a start command to the main control terminal via an input device, causing the main control terminal to start controlling the heating module 10 and simultaneously controlling the film state detection module and the sensor module 30 to start operating, thereby receiving the film state detection signal and the surface peak-valley value detection signal transmitted by these two modules. Based on the film state detection signal and the surface peak-valley value detection signal, when it is determined that the optical film to be tested has cracked, the heating module 10 is stopped, and the change in the surface peak-valley value of the sample to be tested from the start of heating to the time when the optical film to be tested has cracked is calculated. The tensile strength of the optical film to be tested is then determined based on a preset film tensile strength - surface peak-valley value change calculation formula.

[0112] In this embodiment, the film state detection module includes a camera module, which is communicatively connected to the main control terminal and is used to capture image information of the optical film to be tested under the control of the main control terminal and output corresponding image signals to the main control terminal.

[0113] Specifically, refer to Figure 3 B. The camera module can be mounted above the sample under test using a fixed bracket to capture images of the optical film under test and output corresponding image signals (film status detection signals) to the main control terminal, which then determines whether the optical film under test is cracked based on the image signals. The use of the camera module enables the main control terminal to more promptly detect cracks in the optical film under test, effectively improving test accuracy.

[0114] Optionally, the film state detection module may also be implemented using a scattered light detection module, a dark field microscope, etc.

[0115] It's important to understand that as temperature rises, the standard substrate in the sample under test expands, causing changes in its peak-to-valley values. This change in peak-to-valley values ​​generates stress in the optical film under test. Therefore, if cracks develop in the optical film under test during heating, the stress induced by the expansion of the standard substrate on the optical film under test can be used to represent the tensile strength of the optical film under test.

[0116] In this embodiment, the calculation formula for the change in the tensile strength of the film-surface peak-to-valley value is preset as follows:

[0117]

[0118] Among them, Es is the elastic modulus of the substrate, vs is the Poisson's ratio, D is the substrate diameter, ts is the substrate thickness, and tf is the thickness of the film to be measured. These are all known quantities and can be entered into the main control terminal by the user in advance. ΔPV is the change in the peak-to-valley value of the surface shape. Therefore, it is only necessary to know the change in the peak-to-valley value of the surface shape of the standard substrate from the start of heating to the time when cracks appear in the optical film to obtain the tensile strength of the optical film to be measured according to the above formula (1).

[0119] To this end, optionally, in one embodiment of the present invention, reference is made to Figure 5 and Figure 9 The sensor module 30 is a face peak-valley value detection module.

[0120] In this embodiment, the surface peak-valley value detection module can be implemented using a laser interferometer. A wired / wireless communication module is also provided within the laser interferometer for communicating with a main control terminal, thereby transmitting the surface peak-valley value detection signal to the main control terminal via the wired / wireless communication module. The laser interferometer can be mounted above the sample to be tested using a bracket.

[0121] So, in the actual test process, refer to Figure 5 B. When the main control terminal receives a startup command from the user via the input device, it simultaneously controls the surface peak-valley value detection module to begin operation, thereby obtaining the surface peak-valley value of the sample under test, that is, the surface peak-valley value of the standard substrate. When the main control terminal determines that a crack has appeared in the optical film under test on the sample under test based on the film status detection signal transmitted by the film status detection module, such as the camera module, the main control terminal determines the first surface peak-valley value of the sample under test at the moment the crack appeared and the second surface peak-valley value at the start of heating based on multiple surface peak-valley value detection signals acquired during the test process. The difference between the two surface peak-valley values ​​is then calculated to obtain the surface peak-valley value change. Finally, the main control terminal obtains the tensile strength of the optical film under test based on the preset film tensile strength - surface peak-valley value change calculation formula in the above-mentioned embodiment. In this way, the tensile strength of different optical films can be tested and quantified.

[0122] Alternatively, in another embodiment, referring to Figure 3 、 Figure 4 and Figure 8 , the sensor module 30 includes a temperature detection module 31, and the temperature detection module 31 is communicatively connected to the main control terminal;

[0123] The temperature detection module 31 is used to detect the temperature of the sample to be tested and output a corresponding temperature detection signal to the main control terminal so that the main control terminal can determine the surface peak-valley value of the sample to be tested based on the temperature detection signal and a preset temperature-surface peak-valley value formula.

[0124] In this embodiment, the temperature detection module 31 can be implemented by using a temperature detection sensor such as a thermistor probe, an infrared detection sensor, etc. Similarly, the temperature detection module 31 can also be provided with a wired communication module / wireless communication module to enable it to establish a communication connection with the main control terminal, thereby uploading the temperature detection signal to the main control terminal via the wired communication module / wireless communication module. Specifically, refer to Figure 3 A and Figure 3 B. The temperature detection module 31 can be placed on the sample holder 00 and arranged close to the sample to be tested placed on the sample holder 00 to improve the accuracy of temperature detection.

[0125] In this embodiment, the main control terminal can pre-store a preset temperature-surface shape peak-valley value formula. During the test process of the above embodiment, the main control terminal can determine the temperature of the current sample to be tested in real time based on the temperature detection signal uploaded by the temperature detection module 31, and calculate the corresponding surface shape peak-valley value of different samples to be tested at different temperatures based on the preset temperature-surface shape peak-valley value formula.

[0126] Thus, during the actual test process, when the main control terminal determines that a crack has appeared on the optical film to be tested based on the film status detection signal, it can determine the temperatures of the sample to be tested at two moments (the temperature at the start of heating of the sample to be tested and the temperature at which a crack appears on the optical film to be tested on the sample to be tested) based on the first temperature detection signal transmitted by the temperature detection module 31 upon receiving the start command and the second temperature detection signal transmitted by the temperature detection module 31 when the optical film to be tested cracks, i.e., the first temperature and the second temperature, respectively. Furthermore, the surface peak-valley values ​​at the two temperatures are determined based on the preset temperature-surface peak-valley value formula, thereby determining the change in the surface peak-valley value from the start of heating of the sample to the time when the optical film to be tested cracks. Finally, the main control terminal obtains the tensile strength of the optical film to be tested based on the preset film tensile strength-surface peak-valley value change calculation formula in the above embodiment. In this way, in actual applications, the device for measuring the tensile strength of the optical film does not need to detect the surface peak and valley values ​​of the sample to be tested through a surface peak and valley value detection module such as a laser interferometer. It only needs to rely on a temperature sensor and a film state recognition module 20 such as a camera to obtain the change in the surface peak and valley values ​​of the current sample to be tested from the beginning of heating to the time when cracks appear on the optical film to be tested, and then obtain the tensile strength of the optical film to be tested. The detection process is simple to operate, the detection device is low in cost, and it is suitable for large-scale testing.

[0127] It is understandable that the preset temperature-surface peak-valley value formula corresponding to the standard substrate in the above embodiment can also be measured and obtained by R&D personnel during the R&D period using a device for measuring the tensile strength of optical films.

[0128] For this purpose, refer to Figure 4 and Figure 8In one embodiment of the present invention, the sample holder 00 is also used to place a standard sample, which is a standard substrate coated with a standard optical film;

[0129] The device for measuring the tensile strength of the optical film further includes a surface peak-valley value detection module 40, which is communicatively connected to the main control terminal;

[0130] The surface peak-valley value detection module 40 is used to detect the surface peak-valley value of the standard sample and output the corresponding standard sample surface peak-valley value signal to the main control terminal;

[0131] The temperature detection module 31 is also used to detect the temperature of the standard sample and output the corresponding standard sample temperature detection signal to the main control terminal, so that the main control terminal can generate a preset temperature-surface peak-valley value formula based on the standard sample surface peak-valley value signal and the standard sample temperature detection signal.

[0132] It should be understood that the above process of determining the preset temperature-surface peak-valley value formula corresponding to the standard substrate can be performed before performing strength testing. At this time, the user can place the standard sample on the sample holder 00. The standard sample is coated with a relatively thick optical film, for example, at least 400nm thick, to ensure that the optical film will not tear when the standard substrate is heated to the melting point. The optical film can be made of TiO2.

[0133] Specifically, refer to Figure 4 A and Figure 4B, wherein the surface peak-valley value detection module 40 can be implemented using a laser interferometer, which can establish a communication connection with the main control terminal via a wired / wireless communication module disposed therein. The calibration process is the same as the above-mentioned test process. When the main control terminal receives the calibration instruction input by the user through the input device, it will start to control the heating module 10 to heat the sample to be tested on the sample holder 00 until it reaches a preset calibration temperature, such as the melting point of the standard substrate. At the same time, the main control terminal will control the surface peak-valley value detection module 40 to start working, so that the surface peak-valley value detection module 40 detects the surface peak-valley value of the standard sample and outputs a corresponding standard sample surface peak-valley value signal to the main control terminal, so that the main control terminal can determine the surface peak-valley value of the standard substrate during the heating process. During the heating process, the temperature detection module 31 will also detect the temperature of the standard sample and output a corresponding standard sample temperature detection signal to the main control terminal, so that the main control terminal can determine the temperature of the standard sample during the heating process. When the main control terminal determines that the temperature of the current standard sample has reached the preset calibration temperature based on the standard sample temperature detection signal, the main control terminal will stop controlling the heating module 10. Thus, during the calibration heating process, the main control terminal determines the results of the temperature detection of multiple standard samples and the corresponding multiple surface peak-valley value detection results based on the obtained surface peak-valley value signals of multiple standard samples and the temperature detection signals of multiple standard samples, i.e., a surface peak-valley value mapping table corresponding to the standard substrate at different temperatures. At this time, the main control terminal can use the interpolation method to generate a functional relationship formula between the preset temperature and the surface peak-valley value of the corresponding standard substrate based on the results of the temperature detection of multiple standard samples and the surface peak-valley value corresponding to each temperature detection result:

[0134] PV=F(T) Formula (2)

[0135] In the above formula, T represents temperature and PV represents the peak-to-valley value of the surface shape. After obtaining this formula, the main control terminal can store it on the server. In the above embodiment, in a large-scale testing scenario, the main control terminal can directly call the pre-set temperature-surface shape peak-to-valley value formula from the server. This allows the main control terminal to obtain the change in the peak-to-valley value of the surface shape of the current sample from the time heating begins to the time cracks appear in the optical film under test, thereby obtaining the tensile strength of the optical film under test.

[0136] It is understood that while the main control terminal is controlling the heating module 10 to heat, the heating module 10 can be controlled based on the temperature detection signals of the multiple standard samples fed back by the temperature detection module 31 so that the temperature of the standard samples is increased by a preset time interval, for example, by 1 degree Celsius per second. This helps to improve the continuity of temperature detection and, in turn, the accuracy and precision of the ultimately generated formula.

[0137] It is understood that the device for measuring the tensile strength of an optical film may also be provided with an indicator module to indicate the tensile strength of the optical film obtained after the test process to the user, for example, by displaying it on a display screen or announcing it via a voice module. Alternatively, the tensile strength of the optical film obtained may be directly uploaded to a cloud server for easy organization and recording by the tester.

[0138] refer to Figure 3 A. Figure 4 A. Figure 5 A and Figure 7 ,In one embodiment of the present invention, the sample holder 00 is made of metal;

[0139] The heating module 10 includes a heating plate 11 and a power supply device 12. The heating plate 11 is electrically connected to the power supply device 12, and the power supply device 12 is communicatively connected to the main control terminal.

[0140] The heating plate 11 and the sample holder 00 are closely arranged, and the power supply device 12 is used to output a power supply signal to the heating plate 11 under the control of the main control terminal, so that the heating plate 11 generates heat.

[0141] In this embodiment, the heating plate 11 can be implemented by a substrate with a heating wire embedded inside. The material of the substrate can be a metal material, such as iron, aluminum, etc., so that the heat generated by the heating wire when energized can be better conducted to the sample holder 00. At the same time, the sample holder 00 is also made of a metal material such as copper, iron, etc., and can be glued together with the heating plate 11 or welded together, so that the heat generated by the heating wire in the heating plate 11 can be more evenly and quickly conducted to the sample holder 00, thereby improving the accuracy of the test. In addition, the fitting arrangement of the heating plate 11 and the sample holder 00 allows for better placement, such as placing them on the bracket of a laser interferometer, to improve stability during testing.

[0142] In this embodiment, the power supply device 12 can be implemented using an adjustable power supply. The adjustable power supply can include a rectifier circuit and a DC voltage conversion circuit. The rectifier circuit can be implemented using a PFC rectifier circuit, a diode rectifier circuit, etc., and the DC voltage conversion circuit can be implemented using a DCDC circuit or an LLC voltage conversion circuit. The rectifier circuit can convert the AC power connected to the power supply terminal into DC power and output it to the input terminal of the DC voltage conversion circuit. The main control terminal can output PWM signals with different duty cycles to the DC voltage conversion circuit, thereby controlling the DC voltage conversion circuit to convert the DC power into a corresponding voltage to power the heating plate 11. The main control terminal can adjust the voltage and thus adjust the current flowing through the heating plate 11, thereby adjusting the temperature of the heating plate 11.

[0143] The present invention also provides a system for measuring the tensile strength of an optical film, comprising the main control terminal described above and any one of the above-mentioned devices for measuring the tensile strength of an optical film.

[0144] It is worth noting that since the system for measuring the tensile strength of optical films of the present invention is based on the above-mentioned device for measuring the tensile strength of optical films and the main control terminal, the embodiments of the system for measuring the tensile strength of optical films of the present invention include all the technical solutions of all the embodiments of the above-mentioned device for measuring the tensile strength of optical films and the main control terminal, and the technical effects achieved are also exactly the same, which will not be repeated here.

[0145] The above are only optional embodiments of the present invention and do not limit the patent scope of the present invention. All equivalent structural transformations made by using the contents of the present invention description and drawings under the inventive concept of the present invention, or direct / indirect application in other related technical fields are included in the patent protection scope of the present invention.

Claims

1. A method for measuring the tensile strength of an optical film, based on an apparatus for measuring the tensile strength of an optical film, characterized in that: The device for measuring the tensile strength of an optical film comprises a sample holder and a heating module, wherein the sample holder is used to place a sample to be measured, the sample to be measured being a standard substrate coated with the optical film to be measured, and the sample holder is arranged on the heating module; The method for measuring the tensile strength of an optical film comprises: Placing the sample to be tested on the sample holder, and controlling the heating module to start heating the sample to be tested on the sample holder; Obtaining film state information of the optical film to be tested on the sample to be tested and surface peak-to-valley values ​​of the sample to be tested, and determining when a crack appears on the optical film to be tested on the sample to be tested based on the film state information, and determining a change in the surface peak-to-valley values ​​of the sample to be tested from the start of heating to the time when the crack appears on the optical film to be tested based on the surface peak-to-valley values; The tensile strength of the optical film to be measured is determined according to the surface peak-to-valley value variation and a preset film tensile strength-surface peak-to-valley value variation calculation formula.

2. The method for measuring the tensile strength of an optical film according to claim 1, wherein: The step of obtaining the peak-to-valley value of the surface shape of the sample to be tested is specifically as follows: Obtaining the temperature parameter of the sample to be tested; The surface peak-valley value of the sample to be tested is determined according to the temperature parameter and a preset temperature-surface peak-valley value formula.

3. The method for measuring the tensile strength of an optical film according to claim 2, wherein: The sample holder is further used to place a standard sample, which is a standard substrate coated with a standard optical film. The device for measuring the tensile strength of the optical film further includes a surface peak-valley value detection module. Before the step of placing the sample to be measured on the sample holder and controlling the heating module to start heating the sample to be measured on the sample holder, the method for measuring the tensile strength of the optical film further includes: Placing the standard sample on the sample holder, and controlling the heating module to start heating the sample to be tested on the sample holder; Controlling the surface peak-valley value detection module to start working, so as to obtain the surface peak-valley value of the standard sample and the temperature parameter of the standard sample; The preset temperature-surface peak-valley value formula is obtained according to the temperature parameter of the standard sample and the surface peak-valley value of the standard sample.

4. The method for measuring the tensile strength of an optical film according to claim 1, wherein: The device for measuring the tensile strength of an optical film further includes a surface peak-valley value detection module. The steps of obtaining film state information of the optical film to be tested on the sample to be tested and the surface peak-valley value of the sample to be tested, and determining, based on the film state information, when a crack occurs in the optical film to be tested on the sample to be tested, and determining, based on the surface peak-valley value, a change in the surface peak-valley value of the sample to be tested from the start of heating to the time when the crack occurs in the optical film to be tested, further include: The surface peak-valley value detection module is controlled to start working to obtain the surface peak-valley value of the sample to be tested.

5. The method for measuring the tensile strength of an optical film according to any one of claims 1 to 4, wherein: The calculation formula for the change in the tensile strength of the preset film-surface peak-to-valley value is: in, Es is the elastic modulus of the substrate, vs is Poisson's ratio, D is the substrate diameter, ts is the substrate thickness, tf is the film thickness, ∆PV is the change in the peak-to-valley value of the surface shape.

6. The method for measuring the tensile strength of an optical film according to claim 1, wherein: The device for measuring the tensile strength of an optical film further includes a camera module, and the step of obtaining the film state information of the optical film to be tested on the sample to be tested is specifically as follows: The camera module is controlled to capture image information of the optical film to be tested on the sample to be tested.

7. A master control terminal, characterized in that: The main control terminal includes: Memory; processor; a program for measuring the tensile strength of an optical film stored in the memory and executed by the processor, wherein the program for measuring the tensile strength of an optical film, when executed by the processor, implements the method for measuring the tensile strength of an optical film according to any one of claims 1 to 6.

8. A device for measuring the tensile strength of an optical film, characterized in that: The device for measuring the tensile strength of an optical film comprises: A sample holder, the sample holder is used to place a sample to be tested, wherein the sample to be tested is a standard substrate coated with an optical film to be tested; A heating module, the sample holder is arranged on the heating module, the heating module is communicatively connected to the main control terminal, and the heating module is used to heat the sample holder under the control of the main control terminal; a film state detection module, the film state detection module being communicatively connected to the main control terminal and configured to detect the film state of the optical film to be tested on the sample to be tested and output a corresponding film state detection signal to the main control terminal; A sensor module is communicatively connected to the main control terminal and is used to detect the surface peak-valley values ​​of the sample to be tested and output corresponding surface peak-valley value detection signals to the main control terminal, so that the main control terminal can calculate the change in the surface peak-valley values ​​of the sample to be tested from the start of heating to the time when the optical film to be tested cracks according to the film state detection signal and the surface peak-valley value detection signal, and determine the tensile strength of the optical film to be tested according to a preset film tensile strength-surface peak-valley value change calculation formula.

9. The device for measuring the tensile strength of an optical film according to claim 8, wherein: The sample holder is made of metal; The heating module includes a heating plate and a power supply device, the heating plate is electrically connected to the power supply device, and the power supply device is communicatively connected to the main control terminal; The heating plate and the sample holder are arranged closely together, and the power supply device is used to output a power supply signal to the heating plate under the control of the main control terminal, so that the heating plate generates heat.

10. The device for measuring the tensile strength of an optical film according to claim 8, wherein: The film state detection module includes a camera module, which is communicatively connected to the main control terminal and is used to capture image information of the optical film to be tested under the control of the main control terminal and output corresponding image signals to the main control terminal.

11. The device for measuring the tensile strength of an optical film according to claim 8, wherein: The sensor module includes a temperature detection module, and the temperature detection module is communicatively connected to the main control terminal; The temperature detection module is used to detect the temperature of the sample to be tested and output a corresponding temperature detection signal to the main control terminal, so that the main control terminal can determine the surface peak-valley value of the sample to be tested based on the temperature detection signal and a preset temperature-surface peak-valley value formula.

12. The device for measuring the tensile strength of an optical film according to claim 11, wherein: The sample holder is also used to place a standard sample, which is a standard substrate coated with a standard optical film; The device for measuring the tensile strength of the optical film further includes a surface peak-valley value detection module, and the surface peak-valley value detection module is communicatively connected to the main control terminal; The surface peak-valley value detection module is used to detect the surface peak-valley value of the standard sample and output the corresponding standard sample surface peak-valley value signal to the main control terminal; The temperature detection module is also used to detect the temperature of the standard sample and output the corresponding standard sample temperature detection signal to the main control terminal, so that the main control terminal can generate the preset temperature-surface peak-valley value formula based on the standard sample surface peak-valley value signal and the standard sample temperature detection signal.

13. The device for measuring the tensile strength of an optical film according to claim 8, wherein: The sensor module is a surface peak-valley value detection module; the surface peak-valley value detection module is a laser interferometer.

14. A system for measuring the tensile strength of an optical film, comprising the main control terminal according to claim 7 and the device for measuring the tensile strength of an optical film according to any one of claims 8 to 13.

Images