A method and device for measuring micron-level dust spreading uniformity

Abstract

A method and device for measuring micron-level dust spreading uniformity belongs to the field of space environment simulation technology and solves the problem of the lack of existing measurement methods that can accurately obtain high-resolution dust spreading uniformity. The method of the present invention includes: placing all measuring cups below the area to be measured for spreading uniformity and arranging them in the form of a matrix; placing all measuring cups below the area to be measured; stopping sampling when the dust in a preset number of measuring cups covers the bottom of the cup; obtaining the dust spreading mass in the area where each measuring cup is located, recording each measuring cup according to its corresponding position in the matrix, and obtaining a dust spreading mass matrix; calculating the mean square error of all elements in the dust spreading average mass matrix, and judging the dust spreading uniformity of the area to be measured based on the ratio of the mean square error of all elements in the dust spreading average mass matrix to the total mass of the dust. The present invention is suitable for high-resolution measurement of micron-level dust spreading uniformity over a large area.

Description

Technical Field

[0001] The present application relates to the field of space environment simulation technology, and in particular to a method and device for measuring micron-level dust spreading uniformity. Background Art

[0002] When designing deep space exploration missions to objects like the Moon and Mars, the impact of dust on the surface of celestial bodies cannot be ignored. For example, due to the Moon's microgravity and vacuum, lunar dust particles are easily lifted and suspended in the air during exploration activities. These particles are often charged and easily adhere to the surfaces of exploration equipment, making them difficult to clean. They can also interfere with the normal operation of exploration equipment and, in severe cases, even cause mission termination. Therefore, constructing a ground-based test environment that can effectively simulate the spatial distribution of dust is crucial for deep space exploration missions.

[0003] Currently, most existing research focuses on creating a dust environment, while paying less attention to the uniformity of dust spreading. Furthermore, there is a lack of high-resolution methods for measuring dust mass distribution in space. Therefore, quantitative control of dust uniformity is difficult, which can lead to inaccurate subsequent test results and incomplete detection of the working conditions of equipment or instruments in dust environments, ultimately affecting the overall reliability, stability, and performance of the equipment. Therefore, space environment simulation experiments involving dust environments require a high-precision measurement method to determine the effectiveness of the spreading device. The measurement method also serves as a reference for improving the accuracy of the spreading device and evaluating the rationality of the established lunar dust simulation experimental environment. For these reasons, in order to more accurately obtain information on the spatial distribution of dust, it is necessary to design a high-resolution dust spreading uniformity measurement method based on the weighing method.

[0004] Dust concentration measurement methods are divided into sampling and non-sampling methods. Compared to non-sampling methods, the sampling method has the advantage of measuring the absolute mass concentration of dust, providing reliable data, a simple principle, and being unaffected by changes in electrical and optical properties. The weighing method within the sampling method is a basic method for measuring dust concentration and is often used as a basis for calibrating and calibrating non-sampling measurement systems. Existing research has paid little attention to the uniformity of dust spreading, with most studies focusing on measuring dust concentration and few on the uniformity of dust distribution. Consequently, there is a lack of high-resolution methods for measuring dust mass distribution within a space.

[0005] Space environment simulation experiments involving dust require such a measurement method to determine the effectiveness of the sprinkler and improve the accuracy of the experimental device. Therefore, a dust sprinkler uniformity measurement method that can accurately obtain information about the spatial distribution of dust is urgently needed. Summary of the Invention

[0006] The purpose of the present invention is to solve the problem that there is a lack of a measurement method that can accurately obtain high-resolution dust spreading uniformity, and to provide a micron-level dust spreading uniformity measurement method and device.

[0007] The present invention is achieved through the following technical solutions. In one aspect, the present invention provides a method for measuring micron-level dust spreading uniformity, the method comprising:

[0008] Step 1. Select several identical measuring cups;

[0009] Step 2: Place all measuring cups below the area to be measured for evenness of spraying, arrange them in a matrix, and number the measuring cups;

[0010] Step 3: Place all measuring cups below the area to be tested, which is the shower area;

[0011] Step 4: Set a preset number. When the dust in the preset number of measuring cups covers the bottom of the cups, stop sampling.

[0012] Step 5: Set a sampling method for the measuring cup, sample the measuring cup according to the sampling method, weigh the sampled measuring cup, and obtain the mass of the sampled measuring cup after sampling;

[0013] Step 6: Obtain the dust shower mass of the area where each measuring cup is located based on the difference between the mass before sampling and the mass after sampling of each sampled measuring cup, and record each sampled measuring cup according to its corresponding position in the matrix to obtain a dust shower mass matrix;

[0014] Step 7: Repeat steps 1-6 several times to obtain several dust scattering mass matrices, add the several dust scattering mass matrices and take the average value to obtain the dust scattering average mass matrix;

[0015] Step 8: Add up all elements in the dust spray average mass matrix to obtain the total mass of the dust;

[0016] The mean square error of all elements in the dust shower average mass matrix is ​​calculated, and the dust shower uniformity of the test area is determined based on the ratio of the mean square error of all elements in the dust shower average mass matrix to the total mass of the dust.

[0017] Furthermore, the number of the plurality of identical measuring cups is a square number.

[0018] Furthermore, before step 1, the method further includes: washing and drying the measuring cup.

[0019] Furthermore, the several times in step 7 is specifically 10 to 15 times.

[0020] Furthermore, after step 8, the method further includes: obtaining a plurality of local dust shower mass matrices of the local area to be measured based on the plurality of dust shower matrices;

[0021] Adding the plurality of local dust shower mass matrices and taking an average value to obtain a local dust shower average mass matrix;

[0022] Adding up all elements in the local dust shower average mass matrix to obtain the local dust total mass;

[0023] The mean square error of all elements in the local dust shower average mass matrix is ​​calculated, and the dust shower uniformity of the local area in the measured area is determined according to the ratio of the mean square error of all elements in the local dust shower average mass matrix to the total mass of the local dust.

[0024] Furthermore, the sampling method is to sample all measuring cups.

[0025] Furthermore, the sampling method is to sample the measuring cups at intervals among the measuring cups arranged in a matrix form.

[0026] In another aspect, the present invention provides a device for measuring micron-level dust spreading uniformity, the device comprising: a plurality of measuring cups, a spreading device, a measuring cup positioning handle, and a baffle;

[0027] The measuring cups have the same specifications;

[0028] The spraying device is placed above the area to be tested and is used to spray dust;

[0029] The measuring cup positioning handle is placed directly below the sprinkling device to limit the position of the measuring cup;

[0030] The baffle is used to be inserted between the sprinkling device and the measuring cup positioning handle when sampling is completed, so as to block the entrances of all measuring cups.

[0031] Furthermore, the interior of the measuring cup positioning is divided into grids of equal size and arranged in a matrix form.

[0032] Furthermore, the measuring cup is a square barrel-shaped cup body, the mass error of several measuring cups is less than 1‰, the cup mouth area error is less than 1‰, the cup mouth cross-section is square, the cup wall at the cup mouth is tilted toward the cup in a funnel shape, the measuring cup fits tightly with the grid in the measuring cup positioning handle, the measuring cup surface is smooth, and it is made of hard material. Beneficial effects of the present invention:

[0033] 1. The device and method of the present invention can ensure that the measurement results are less affected by factors such as the chemical composition, shape, and optics of the dust, and the data is reliable;

[0034] 2. There are many sampling points. The number and distribution area of ​​sampling points can be adjusted according to the required accuracy of the experiment and the actual distribution of dust. Increasing the number of sampling points can obtain higher-resolution data, filling the current research gap in micro-nano dust;

[0035] 3. By analyzing the experimental data in the form of a matrix, it is possible to analyze the dust spreading uniformity in any spreading area, meet the analysis needs and improve work efficiency.

[0036] The present invention provides a calibration method and calibration basis for measuring dust spreading uniformity, and provides a high-resolution measurement method for large-area micron-level dust spreading uniformity. The measurement area is large, the measurement accuracy can reach milligram level, and the resolution is high, which has high engineering value and practical significance.

[0037] The present invention is suitable for high-resolution measurement of micron-level dust spreading uniformity over a large area.

[0038] The inability to accurately measure uniformity parameters makes it impossible to optimize the design of parameters such as the mesh size and array density, vibration frequency, and dust thickness of the shower screen, making it impossible to simulate the uniform dust deposition field of a natural planetary environment. For example, after a single layer of lunar or Martian dust micro-nano particles is evenly distributed on a rover's solar panels, the shading effect of the dust will reduce the solar photovoltaic conversion efficiency, seriously affecting the rover's performance. By accurately measuring shower uniformity in a ground-based planetary environment simulation chamber, it is possible to conduct research on calibration and dust removal technologies for rover solar panels covered with a uniform thickness of trace dust. BRIEF DESCRIPTION OF THE DRAWINGS

[0039] In order to more clearly illustrate the technical solution of the present application, the following is a brief introduction to the drawings required for use in the embodiments. Obviously, for ordinary technicians in this field, other drawings can be obtained based on these drawings without any creative work.

[0040] Figure 1 A structural diagram of a measuring cup provided by the present invention;

[0041] Figure 2 A structural diagram of the measuring cup positioning handle provided by the present invention;

[0042] Figure 3 This is a schematic diagram of the assembly of the large-area micron-level dust spreading uniformity high-resolution measurement device provided by the present invention.

[0043] Among them, 1-sprinkling device; 2-baffle, 3-measuring cup positioning handle; 4-measuring cup. DETAILED DESCRIPTION

[0044] The following is a further detailed description of the embodiments of the present invention in conjunction with the embodiments and the accompanying drawings. Here, the illustrative embodiments of the present invention and their descriptions are used to explain the present invention, but are not intended to limit the present invention.

[0045] Embodiment 1: A method for measuring micron-level dust spreading uniformity, the method comprising:

[0046] Step 1. Select several identical measuring cups;

[0047] Step 2: Place all measuring cups below the area to be measured for evenness of spraying, arrange them in a matrix, and number the measuring cups;

[0048] Step 3: Place all measuring cups below the area to be tested, which is the shower area;

[0049] Step 4: Set a preset number. When the dust in the preset number of measuring cups covers the bottom of the cups, stop sampling.

[0050] Step 5: Set a sampling method for the measuring cup, sample the measuring cup according to the sampling method, weigh the sampled measuring cup, and obtain the mass of the sampled measuring cup after sampling;

[0051] Step 6: Obtain the dust shower mass of the area where each measuring cup is located based on the difference between the mass before sampling and the mass after sampling of each sampled measuring cup, and record each sampled measuring cup according to its corresponding position in the matrix to obtain a dust shower mass matrix;

[0052] Step 7: Repeat steps 1-6 several times to obtain several dust scattering mass matrices, add the several dust scattering mass matrices and take the average value to obtain the dust scattering average mass matrix;

[0053] Step 8: Add up all elements in the dust spray average mass matrix to obtain the total mass of the dust;

[0054] The mean square error of all elements in the dust shower average mass matrix is ​​calculated, and the dust shower uniformity of the test area is determined based on the ratio of the mean square error of all elements in the dust shower average mass matrix to the total mass of the dust.

[0055] According to this embodiment, the controllable parameters of the shower device can be adjusted according to the mean square error to improve the shower uniformity of the shower device. For example, based on the target parameters of the shower effect of the shower device, a threshold D is set. m , if the experimentally measured D <D m , then the overall uniformity of the sprinkling device has reached the target.

[0056] This embodiment can, 1. measure the dust spreading uniformity of the area to be measured, which is less affected by factors such as area, chemical composition, shape, and optics;

[0057] 2. By analyzing the experimental data in the form of a matrix, it is possible to analyze the dust spreading uniformity in any spreading area, meet the analysis needs and improve work efficiency.

[0058] 3. The number and distribution area of ​​sampling points can also be adjusted according to the required accuracy of the experiment and the actual distribution of dust. Increasing the number of sampling points can obtain higher resolution data.

[0059] Implementation method 2: This implementation method further limits the micron-level dust spreading uniformity measurement method described in implementation method 1. In this implementation method, the number of measuring cups is further limited, specifically including:

[0060] The number of the plurality of identical measuring cups is a square number.

[0061] This embodiment can use a matrix form to perform dust shower concentration measurement on the area to be measured, which is convenient for setting the area to be measured and calculating the method, and is easy to evenly divide the measurement area.

[0062] Implementation method 3: This implementation method further defines the method for measuring micron-level dust spreading uniformity described in implementation method 1. In this implementation method, the operations before step 1 are further defined, specifically including:

[0063] After cleaning, dry the measuring cup.

[0064] This embodiment can prevent measurement errors caused by other factors and is used to improve the measurement accuracy of micron-level dust spreading uniformity.

[0065] Implementation method 4: This implementation method further defines the micron-level dust spreading uniformity measurement method described in implementation method 1. In this implementation method, the number of times in step 7 is further defined, specifically including:

[0066] The several times in step 7 is specifically 10 to 15 times.

[0067] The number of repetitions set in this embodiment can meet the measurement requirements of micron-level dust spreading uniformity, and can also avoid unnecessary waste and low work efficiency caused by excessive operations.

[0068] Implementation 5: This implementation further defines the method for measuring micron-level dust spreading uniformity described in Implementation 1. In this implementation, the operations after step 8 are further defined, specifically including:

[0069] After step 8, the further step includes: obtaining a plurality of local dust shower mass matrices of the local area to be measured according to the plurality of dust shower matrices;

[0070] Adding the plurality of local dust shower mass matrices and taking an average value to obtain a local dust shower average mass matrix;

[0071] Adding up all elements in the local dust shower average mass matrix to obtain the local dust total mass;

[0072] The mean square error of all elements in the local dust shower average mass matrix is ​​calculated, and the dust shower uniformity of the local area in the measured area is determined according to the ratio of the mean square error of all elements in the local dust shower average mass matrix to the total mass of the local dust.

[0073] In this embodiment, the dust scattering average mass matrix of the local area in the entire measured area can be obtained based on the dust scattering average mass matrix of the entire measured area. Then, when the scattering device needs to be adjusted, the dust scattering average mass matrix of the local area can be used to determine which part needs to be adjusted, and then the controllable parameters can be adjusted to improve uniformity.

[0074] In specific implementation, if it is necessary to check the sprinkling quality of a certain part of the sprinkling device, the quality measurement data of the local area is taken and the mean square error D is calculated. i If D i <D m , then the controllable parameters of the sprinkler device in the corresponding area are adjusted until the mean square error threshold requirement is met.

[0075] Implementation 6: This implementation further defines the micron-level dust uniformity measurement method described in Implementation 1. In this implementation, the sampling method is further defined, specifically including:

[0076] The sampling method is to sample all the measuring cups.

[0077] This embodiment can be used for measuring the uniformity of micron-level dust spraying with high measurement accuracy and without considering the workload caused by the number of measuring cups.

[0078] Implementation method 7: This implementation method further defines the micron-level dust uniformity measurement method described in implementation method 1. In this implementation method, the sampling method is further defined, specifically including:

[0079] The sampling method is to sample the measuring cups at intervals among the measuring cups arranged in a matrix form.

[0080] It should be noted that, in this embodiment, the spacing distance can be set according to actual needs.

[0081] In this embodiment, in the case where there are too many measuring cups, the work of collecting data is rather tedious. The measuring cups can be selected at intervals as feature points for measurement and calculation of the mean square error.

[0082] Embodiment 8: This embodiment is a device for measuring the micron-level dust spreading uniformity method described above, specifically comprising:

[0083] The device comprises: a plurality of measuring cups, a sprinkling device, a measuring cup positioning handle and a baffle;

[0084] The measuring cups have the same specifications;

[0085] The spraying device is placed above the area to be tested and is used to spray dust;

[0086] The measuring cup positioning handle is placed directly below the sprinkling device to limit the position of the measuring cup;

[0087] The baffle is used to be inserted between the sprinkling device and the measuring cup positioning handle when sampling is completed, so as to block the entrances of all measuring cups.

[0088] This embodiment provides a measuring device for a micron-level dust spreading uniformity measurement method. The device can measure the dust spreading uniformity of the measured area and is less affected by factors such as area, chemical composition, shape, and optics.

[0089] The device can arrange all measuring cups in the form of a matrix, so that the matrix data can be used to analyze the experimental data, and then the dust spreading uniformity of any spreading area can be analyzed to meet the analysis needs and improve work efficiency.

[0090] The device of this embodiment can also adjust the number of sampling points and the corresponding distribution area according to the required accuracy of the experiment, the actual distribution of dust, etc., and increasing the sampling points can obtain higher resolution data.

[0091] It should be noted that the specifications of the measuring cup may include: shape, size, and material. By setting measuring cups with the same parameters such as shape, size, and material, the measurement accuracy of micron-level dust spreading uniformity is improved.

[0092] Implementation method 9 is a further limitation of the micron-level dust spreading uniformity measuring device described in Implementation method 8. In this implementation method, the measuring cup positioning handle is further limited, specifically including:

[0093] The interior of the measuring cup positioning box is divided into grids of equal size and arranged in a matrix form.

[0094] The grid in this embodiment is used to carry the measuring cup. The grid is arranged in a matrix form, which can achieve an effective layout of the area to be measured, thereby facilitating the measurement of micron-level dust spreading uniformity.

[0095] Embodiment 10: This embodiment further defines the device for measuring micron-level dust spreading uniformity described in Embodiment 8. In this embodiment, the measuring cup is further defined, specifically including:

[0096] The measuring cup has a square barrel-shaped cup body, the mass error of several measuring cups is less than 1‰, the cup mouth area error is less than 1‰, the cup mouth cross-section is square, the cup wall at the cup mouth is tilted toward the inside of the cup in a funnel shape, the measuring cup fits tightly with the grid in the measuring cup positioning handle, the measuring cup surface is smooth, and it is made of hard material.

[0097] This embodiment is to set the measuring cup. After setting the measuring cup specifications, the mass error of the measuring cup is less than 1‰, and the cup mouth area error is less than 1‰, so as to ensure the measurement accuracy of micron-level dust spreading uniformity;

[0098] The cup mouth has a square cross section. The rectangular cross section simplifies the arrangement of the cups. The structure of the measuring cup positioning handle used to fix the measuring cup is simple, making it easy to evenly divide the measuring area.

[0099] It is convenient for dividing and measuring the area to be measured; the cup wall at the upper end of the measuring cup is tilted towards the inside of the measuring cup in a funnel shape, which fits in with the grid in the positioning handle of the measuring cup. The surface of the measuring cup is smooth and made of hard material, which makes it easy for dust to fall into the measuring cup and reduce the influence of the cup wall area on the measurement results.

[0100] In summary, this setting can reduce measurement errors and improve the measurement accuracy of micron-level dust spreading uniformity.

[0101] Embodiment 11: This embodiment is a specific example of the device and method for measuring micron-level dust spreading uniformity described above, specifically:

[0102] In this embodiment, the devices required for measurement are specifically configured as follows:

[0103] The sprinkling device 1 is fixed above the area to be tested and is used to sprinkle dust; the movable measuring cup positioning handle 3 with a handle is placed directly below the sprinkling device 1 and opposite to it when sampling, and is used to carry the measuring cup as a whole; 400 measuring cups 4 of the same shape, size and material; the baffle 2 is placed between the simplified sprinkling device 1 and the measuring cup positioning handle 3 at the end of sampling, aligned with each other, and is used to stop sampling.

[0104] The measuring cup positioning handle 3 has a size of 1.1m×1.1m, and is divided into 20×20 grids of equal size. Handles are provided on both sides of the measuring cup positioning handle 3 for easy carrying.

[0105] The 400 measuring cups 4 are lightweight small cups with a mass of less than 1g, and all measuring cups have the same specifications; the surface of the measuring cups is smooth and made of hard material, which is convenient for cleaning the dust in the measuring cups before and after use, reducing subsequent measurement errors, the mass error is less than 1‰, the cup mouth area error is less than 1‰, the cup mouth cross-section is square, and the cup wall at the upper end of the measuring cup 4 is tilted towards the cup in a funnel shape, which makes it easy for dust to fall into the measuring cup and reduce the influence of the cup wall area on the measurement results. The rectangular cross-section makes the arrangement of the cups simple, and the measuring cup positioning handle used to fix the measuring cup has a simple structure and is easy to evenly divide the measurement area.

[0106] The above device is used to measure the micron-level dust spreading uniformity, specifically:

[0107] (1) Number 400 measuring cups. The measuring cups are of the same specifications and have a mass of m0. The mass error is less than 1‰. Clean the measuring cups, measuring cup positioning handles, sprinkler devices, and baffles and place them to dry.

[0108] (2) Install the sprinkler device below the area to be measured, place the measuring cup on the measuring cup positioning handle, and fix the measuring cup positioning handle directly below the sprinkler device opposite to it;

[0109] (3) Start sampling by vibrating the sprinkler at a frequency of 0.25 Hz to sprinkle the dust. Place the measuring cup in a fixed position for a period of time. When the dust in the measuring cup just covers the bottom of the cup, insert a baffle between the sprinkler and the measuring cup, and stop sampling.

[0110] (4) Hold the measuring cup positioning handle and move the measuring cup and measuring cup positioning handle out of the test area. Weigh each of the 400 measuring cups and record their mass after sampling in order of number. ti (i=1,2,3,……,400);

[0111] (5) Using formula m i =m ti -m0 calculates the dust spreading mass in the area where each measuring cup is located and records it as a 20×20 matrix, m i The position arrangement in the matrix is ​​consistent with the position arrangement of the measuring cup in the measuring cup positioning handle. This dust spreading quality matrix is ​​used to further analyze the dust spreading uniformity.

[0112] (6) Repeat steps (1) to (5) 10 to 15 times;

[0113] (7) Add up the measured dust spreading mass matrices and take the average value to obtain the dust spreading average mass matrix. Add up all the elements in this matrix to get the total mass M of the dust. Calculate the mean square error D of all the elements in the dust spreading average mass matrix and then calculate To eliminate the influence of the order of magnitude of different total masses on the mean square error, the smaller the value, the higher the uniformity of dust spreading.

[0114] In the embodiment, a dust spreading mass experiment with different dust spreading vibration times was conducted. Thirteen evenly distributed characteristic sampling points were taken and the dust spreading mass at these locations was weighed using an electronic scale with an accuracy of 1 mg, as shown in Table 1:

[0115] Table 1 Dust spreading quality at uniformly distributed sampling points under different dust spreading vibration times

[0116]

[0117] The variance of the overall dust spreading mass of the device under different dust spreading vibration times in the above experiment was calculated. The results are shown in Table 2:

[0118] Table 2 Variance of dust mass under different dust spreading vibration times

[0119]

[0120] The smaller the variance, the higher the uniformity of dust spreading. From the data, we can see that as the vibration times of the spreading device increase, There is an increasing trend, which can be inferred that the uniformity of dust scattering by the scattering device is not good, which is consistent with the actual situation of the scattering device used in this experiment, proving that the present invention is feasible and effective.

[0121] The present invention provides a high-resolution measurement method for the uniformity of micron-level dust spraying over a large area, comprising the following steps: (1) numbering, cleaning, and drying measuring cups; (2) measuring the initial mass of each measuring cup and recording the mass before sampling; (3) installing a spraying device, a measuring cup, and a measuring cup fixing handle; (4) starting sampling, placing the measuring cup fixing handle for a period of time and timing, and inserting a baffle to stop sampling when the dust in the measuring cup just covers the bottom of the cup; (5) removing the measuring cup fixing handle, weighing each measuring cup, and recording the mass after sampling; (6) using a formula to calculate the dust spraying mass of the area where each measuring cup is located, recorded as a dust spraying mass matrix; (6) repeating steps (1) to (5) 10 to 15 times; (7) processing the experimental data and analyzing the dust spraying uniformity based on the mean square error. The method is based on the idea of ​​the weighing method in the sampling method, and the measurement results are less affected by factors such as the chemical composition, shape, and optics of the dust, and the data is reliable; the measurement accuracy can reach the milligram level and has high resolution; therefore, it has strong engineering value and practical significance.

[0122] The present invention is not limited to the above-mentioned embodiments. On the basis of the technical solutions disclosed in the present invention, those skilled in the art can make some substitutions and modifications to some of the technical features therein according to the disclosed technical content without creative labor, and these substitutions and modifications are all within the protection scope of the present invention.

Claims

1. A method for measuring micron-level dust spreading uniformity, characterized in that: The measuring method is implemented based on a measuring device, which includes: a plurality of measuring cups, a sprinkling device, a measuring cup positioning handle and a baffle; The measuring cups have the same specifications; The spraying device is placed above the area to be tested and is used to spray dust; The measuring cup positioning handle is placed directly below the sprinkling device to limit the position of the measuring cup; The measuring cup positioning frame is divided into grids of equal size and arranged in a matrix form; The cup wall at the mouth of the cup tilts toward the inside of the cup and forms a funnel shape; The baffle is used to be inserted between the sprinkling device and the measuring cup positioning handle at the end of sampling to block the entrance of all measuring cups; The method comprises: Step 1. Select several identical measuring cups; Step 2: Place all measuring cups below the area to be measured for evenness of spraying, arrange them in a matrix, and number the measuring cups; Step 3: Place all measuring cups below the area to be tested, which is the shower area; Step 4: Set a preset number. When the dust in the preset number of measuring cups covers the bottom of the cups, stop sampling. Step 5: Set a sampling method for the measuring cup, sample the measuring cup according to the sampling method, weigh the sampled measuring cup, and obtain the mass of the sampled measuring cup after sampling; Step 6: Obtain the dust shower mass of the area where each measuring cup is located based on the difference between the mass before sampling and the mass after sampling of each sampled measuring cup, and record each sampled measuring cup according to its corresponding position in the matrix to obtain a dust shower mass matrix; Step 7: Repeat steps 1-6 several times to obtain several dust scattering mass matrices, add the several dust scattering mass matrices and take the average value to obtain the dust scattering average mass matrix; Step 8: Add up all elements in the dust spray average mass matrix to obtain the total mass of the dust; The mean square error of all elements in the dust shower average mass matrix is ​​calculated, and the dust shower uniformity of the test area is determined based on the ratio of the mean square error of all elements in the dust shower average mass matrix to the total mass of the dust.

2. The method for measuring micron-level dust spreading uniformity according to claim 1, characterized in that: The number of the plurality of identical measuring cups is a square number.

3. The method for measuring micron-level dust spreading uniformity according to claim 1, characterized in that: Before step 1, the method further includes: washing and drying the measuring cup.

4. The method for measuring micron-level dust spreading uniformity according to claim 1, characterized in that: The several times in step 7 is specifically 10 to 15 times.

5. The method for measuring micron-level dust spreading uniformity according to claim 1, characterized in that: After step 8, the further step includes: obtaining a plurality of local dust shower mass matrices of the local area to be measured according to the plurality of dust shower matrices; Adding the plurality of local dust shower mass matrices and taking an average value to obtain a local dust shower average mass matrix; Adding up all elements in the local dust shower average mass matrix to obtain the local dust total mass; The mean square error of all elements in the local dust shower average mass matrix is ​​calculated, and the dust shower uniformity of the local area in the measured area is determined according to the ratio of the mean square error of all elements in the local dust shower average mass matrix to the total mass of the local dust.

6. The method for measuring micron-level dust spreading uniformity according to claim 1, characterized in that: The sampling method is to sample all the measuring cups.

7. The method for measuring micron-level dust spreading uniformity according to claim 1, characterized in that: The sampling method is to sample the measuring cups at intervals among the measuring cups arranged in a matrix form.

8. The method for measuring micron-level dust spreading uniformity according to claim 1, characterized in that: The measuring cup has a square barrel-shaped cup body, the mass error of several measuring cups is less than 1‰, the cup mouth area error is less than 1‰, the cup mouth cross-section is square, the measuring cup fits tightly with the grid in the measuring cup positioning handle, the measuring cup surface is smooth, and it is made of hard material.

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