A test prototype temperature acquisition method, system, device and storage medium
By simulating the TCM chip signal with a microcontroller, disabling the TCM chip, and obtaining serial port logs to acquire temperature in real time, this solves the problem of not being able to display temperature in real time in existing technologies, and enables the ability to accurately monitor and locate the temperature of the test prototype.
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Patents(China)
- Current Assignee / Owner
- INSPUR SUZHOU INTELLIGENT TECH CO LTD
- Filing Date
- 2022-06-30
- Publication Date
- 2026-05-22
Smart Images
Figure CN115098332B_ABST
Abstract
Description
Technical Field
[0001] This invention relates to the field of testing, and more specifically to a method, system, device, and storage medium for acquiring the temperature of a test prototype. Background Technology
[0002] In System Integration Testing (SIT), the temperature of the test prototype is a crucial indicator. The temperature of each component not only reflects the current state of the machine but can also lead to problems such as system crashes and restarts due to overheating (according to Ampere's Law, the main cause of machine overheating is the accumulation of heat released by the circuitry during prolonged operation). Therefore, timely temperature monitoring not only helps understand the current machine status and prevent overheating issues but also allows us to determine the impact of current operations based on observed temperature changes, thus better pinpointing the problem. Furthermore, real-time reading of internal temperature parameters allows for comparison with actual temperatures to confirm whether the internal temperature readings are accurate, thereby identifying the root cause of the problem.
[0003] Existing methods for observing temperature each have the following drawbacks:
[0004] 1. View the temperature by entering commands in the terminal. The disadvantage is that the temperature information cannot be displayed in real time, and the command needs to be entered manually each time the temperature is displayed. In addition, this method of viewing the temperature requires the system to be running, and often the test prototype is in an abnormal state and cannot enter the system.
[0005] 2. View the temperature via the BMC web interface. This method is only available to SVs. The main problem is that the BMC web interface requires a network cable connection to view the temperature. In practice, some environments or requirements (such as production lines or government offices) make it inconvenient to install excessively long network cables. Furthermore, the information on the BMC web interface has a certain refresh delay and is not very intuitive.
[0006] 3. In some applications, machines have their own audit rules and security red lines. Directly connecting to the serial port will not print any information (e.g., domestically produced BM machines). In such cases, it is generally necessary to install the corresponding development version system and factory version BIOS. This operation is convenient in test prototypes and production lines, but in customer-site machines, which often contain a lot of important information, such operations are not allowed. In this case, the ability to directly read serial port information is required. Summary of the Invention
[0007] In view of this, in order to overcome at least one aspect of the above problems, embodiments of the present invention propose a method for obtaining the temperature of a test prototype, comprising the following steps:
[0008] Establish a serial port connection between the microcontroller and the test prototype;
[0009] Obtain the waveform of the TCM chip in the test prototype;
[0010] A simulated waveform is generated based on the waveform of the TCM chip and sent to the serial port of the test prototype to shield the TCM chip.
[0011] Get serial port logs;
[0012] Search for the temperature in the serial port log.
[0013] In some embodiments, establishing a connection between the microcontroller's serial port and the test prototype's serial port further includes:
[0014] Establish connections with the first, second, third, and fourth pins of the test prototype.
[0015] In some embodiments, acquiring the waveform of the TCM chip in the test prototype further includes:
[0016] The waveform of the TCM chip in the test prototype is obtained using the first pin.
[0017] In some embodiments, obtaining serial port logs further includes:
[0018] Set the second pin, the third pin, and the fourth pin to a low level output and discharge the capacitor in the microcontroller;
[0019] Set the second pin to high level and set the third and fourth pins as inputs to receive serial port logs.
[0020] Based on the same inventive concept, according to another aspect of the present invention, embodiments of the present invention also provide a test prototype temperature acquisition system, comprising:
[0021] The serial port module is configured to establish a connection between the microcontroller's serial port and the test prototype's serial port.
[0022] The first acquisition module is configured to acquire the waveform of the TCM chip in the test prototype;
[0023] The sending module is configured to generate an analog waveform based on the waveform of the TCM chip and send it to the serial port of the test prototype to shield the TCM chip;
[0024] The second acquisition module is configured to acquire serial port logs;
[0025] The search module is configured to search for temperature in the serial port log.
[0026] In some embodiments, establishing a connection between the microcontroller's serial port and the test prototype's serial port further includes:
[0027] Establish connections with the first, second, third, and fourth pins of the test prototype.
[0028] In some embodiments, acquiring the waveform of the TCM chip in the test prototype further includes:
[0029] The waveform of the TCM chip in the test prototype is obtained using the first pin.
[0030] In some embodiments, obtaining serial port logs further includes:
[0031] Set the second pin, the third pin, and the fourth pin to a low level output and discharge the capacitor in the microcontroller;
[0032] Set the second pin to high level and set the third and fourth pins as inputs to receive serial port logs.
[0033] Based on the same inventive concept, according to another aspect of the present invention, embodiments of the present invention also provide a computer device, comprising:
[0034] At least one processor; and
[0035] A memory storing a computer program executable on the processor, characterized in that the processor performs the following steps when executing the program:
[0036] Establish a serial port connection between the microcontroller and the test prototype;
[0037] Obtain the waveform of the TCM chip in the test prototype;
[0038] A simulated waveform is generated based on the waveform of the TCM chip and sent to the serial port of the test prototype to shield the TCM chip.
[0039] Get serial port logs;
[0040] Search for the temperature in the serial port log.
[0041] In some embodiments, establishing a connection between the microcontroller's serial port and the test prototype's serial port further includes:
[0042] Establish connections with the first, second, third, and fourth pins of the test prototype.
[0043] In some embodiments, acquiring the waveform of the TCM chip in the test prototype further includes:
[0044] The waveform of the TCM chip in the test prototype is obtained using the first pin.
[0045] In some embodiments, obtaining serial port logs further includes:
[0046] Set the second pin, the third pin, and the fourth pin to a low level output and discharge the capacitor in the microcontroller;
[0047] Set the second pin to high level and set the third and fourth pins as inputs to receive serial port logs.
[0048] Based on the same inventive concept, according to another aspect of the present invention, embodiments of the present invention also provide a computer-readable storage medium storing a computer program, which, when executed by a processor, performs the following steps:
[0049] Establish a serial port connection between the microcontroller and the test prototype;
[0050] Obtain the waveform of the TCM chip in the test prototype;
[0051] A simulated waveform is generated based on the waveform of the TCM chip and sent to the serial port of the test prototype to shield the TCM chip.
[0052] Get serial port logs;
[0053] Search for the temperature in the serial port log.
[0054] In some embodiments, establishing a connection between the microcontroller's serial port and the test prototype's serial port further includes:
[0055] Establish connections with the first, second, third, and fourth pins of the test prototype.
[0056] In some embodiments, acquiring the waveform of the TCM chip in the test prototype further includes:
[0057] The waveform of the TCM chip in the test prototype is obtained using the first pin.
[0058] In some embodiments, obtaining serial port logs further includes:
[0059] Set the second pin, the third pin, and the fourth pin to a low level output and discharge the capacitor in the microcontroller;
[0060] Set the second pin to high level and set the third and fourth pins as inputs to receive serial port logs.
[0061] The present invention has one of the following beneficial technical effects: The solution proposed in this invention uses a microcontroller to simulate the TCM chip signal, shields the local TCM chip, and retrieves the serial port log, thereby enabling the real-time acquisition of the BM machine's temperature. Attached Figure Description
[0062] To more clearly illustrate the technical solutions in the embodiments of the present invention or the prior art, the drawings used in the description of the embodiments or the prior art will be briefly introduced below. Obviously, the drawings described below are only some embodiments of the present invention. For those skilled in the art, other embodiments can be obtained based on these drawings without creative effort.
[0063] Figure 1 A schematic flowchart of a method for obtaining the temperature of a test prototype provided in an embodiment of the present invention;
[0064] Figure 2 A schematic diagram of the structure of the test prototype temperature acquisition system provided in an embodiment of the present invention;
[0065] Figure 3 A schematic diagram of the structure of a computer device provided for an embodiment of the present invention;
[0066] Figure 4 A schematic diagram of the structure of a computer-readable storage medium provided for an embodiment of the present invention. Detailed Implementation
[0067] To make the objectives, technical solutions, and advantages of the present invention clearer, the embodiments of the present invention will be further described in detail below with reference to specific examples and the accompanying drawings.
[0068] It should be noted that all uses of "first" and "second" in the embodiments of the present invention are for the purpose of distinguishing two entities or parameters with the same name but different names. It is clear that "first" and "second" are only for the convenience of expression and should not be construed as limiting the embodiments of the present invention. Subsequent embodiments will not explain this in detail.
[0069] According to one aspect of the present invention, embodiments of the present invention provide a method for obtaining the temperature of a test prototype, such as... Figure 1 As shown, it may include the following steps:
[0070] S1, Establish the serial port connection between the microcontroller and the test prototype;
[0071] S2, Obtain the waveform of the TCM chip in the test prototype;
[0072] S3, generate a simulated waveform based on the waveform of the TCM chip and send it to the serial port of the test prototype to shield the TCM chip;
[0073] S4, retrieve serial port logs;
[0074] S5, search for the temperature in the serial port log.
[0075] The proposed solution uses a microcontroller to simulate the TCM chip signal, shields the local TCM chip, and retrieves serial port logs, thereby enabling real-time acquisition of the BM machine's temperature.
[0076] In some embodiments, establishing a connection between the microcontroller's serial port and the test prototype's serial port further includes:
[0077] Establish connections with the first, second, third, and fourth pins of the test prototype.
[0078] In some embodiments, acquiring the waveform of the TCM chip in the test prototype further includes:
[0079] The waveform of the TCM chip in the test prototype is obtained using the first pin.
[0080] In some embodiments, obtaining serial port logs further includes:
[0081] Set the second pin, the third pin, and the fourth pin to a low level output and discharge the capacitor in the microcontroller;
[0082] Set the second pin to high level and set the third and fourth pins as inputs to receive serial port logs.
[0083] Specifically, an STC89C52RC microcontroller can be used, with one serial port connected to the test prototype's motherboard debugging serial port. A four-wire serial port connection can be used, meaning only four wires of the test prototype's 9-pin serial port are connected: the pin for sending analog waveforms (pin 1), pin 5 (GND, pin 2), pin 2 (RXD, pin 3), and pin 3 (TXD, pin 4). The serial port log of the test prototype is read to obtain temperature information. Simultaneously, a program is programmed into the bit-safe processor to disable the TCM chip's security baseline, simulating factory BIOS information to bypass limitations and enable the serial port to print log information.
[0084] During the serial port log acquisition process, the second, third, and fourth pins can be set to low-level output to discharge the capacitor in the microcontroller. Then, the third and fourth pins are set as inputs, and the microcontroller receives the serial port logs. The second pin is detected, and the serial port log is recorded when it is high. The three pins are then set to low-level output to discharge the capacitor again. Next, the second and fourth pins are set as inputs, and the temperature measurement circuit searches the serial port logs read by the microcontroller for TEMP-related entries. Finally, the temperature is output in real-time on the digital tube screen.
[0085] The solution proposed in this invention can realize real-time temperature monitoring of the machine under test, accurately display the temperature, eliminate test interference to improve test accuracy, simplify the method of controlling variables in the test, and also provide a new perspective for observing changes in phenomena during the DEBUG process.
[0086] Based on the same inventive concept, according to another aspect of the present invention, embodiments of the present invention also provide a test prototype temperature acquisition system 400, such as... Figure 2 As shown, it includes:
[0087] The serial port module 401 is configured to establish a connection between the serial port of the microcontroller and the serial port of the test prototype.
[0088] The first acquisition module 402 is configured to acquire the waveform of the TCM chip in the test prototype;
[0089] The sending module 403 is configured to generate an analog waveform based on the waveform of the TCM chip and send it to the serial port of the test prototype to shield the TCM chip.
[0090] The second acquisition module 404 is configured to acquire serial port logs;
[0091] The search module 405 is configured to search for temperature in the serial port log.
[0092] In some embodiments, establishing a connection between the microcontroller's serial port and the test prototype's serial port further includes:
[0093] Establish connections with the first, second, third, and fourth pins of the test prototype.
[0094] In some embodiments, acquiring the waveform of the TCM chip in the test prototype further includes:
[0095] The waveform of the TCM chip in the test prototype is obtained using the first pin.
[0096] In some embodiments, obtaining serial port logs further includes:
[0097] Set the second pin, the third pin, and the fourth pin to a low level output and discharge the capacitor in the microcontroller;
[0098] Set the second pin to high level and set the third and fourth pins as inputs to receive serial port logs.
[0099] Based on the same inventive concept, according to another aspect of the present invention, such as Figure 3 As shown, embodiments of the present invention also provide a computer device 501, comprising:
[0100] At least one processor 520; and
[0101] Memory 510 stores a computer program 511 that can run on a processor. When the processor 520 executes the program, it performs the following steps:
[0102] S1, Establish the serial port connection between the microcontroller and the test prototype;
[0103] S2, Obtain the waveform of the TCM chip in the test prototype;
[0104] S3, generate a simulated waveform based on the waveform of the TCM chip and send it to the serial port of the test prototype to shield the TCM chip;
[0105] S4, retrieve serial port logs;
[0106] S5, search for the temperature in the serial port log.
[0107] In some embodiments, establishing a connection between the microcontroller's serial port and the test prototype's serial port further includes:
[0108] Establish connections with the first, second, third, and fourth pins of the test prototype.
[0109] In some embodiments, acquiring the waveform of the TCM chip in the test prototype further includes:
[0110] The waveform of the TCM chip in the test prototype is obtained using the first pin.
[0111] In some embodiments, obtaining serial port logs further includes:
[0112] Set the second pin, the third pin, and the fourth pin to a low level output and discharge the capacitor in the microcontroller;
[0113] Set the second pin to high level and set the third and fourth pins as inputs to receive serial port logs.
[0114] Based on the same inventive concept, according to another aspect of the present invention, such as Figure 4 As shown, embodiments of the present invention also provide a computer-readable storage medium 601, which stores a computer program 610. When the computer program 610 is executed by a processor, it performs the following steps:
[0115] S1, Establish the serial port connection between the microcontroller and the test prototype;
[0116] S2, Obtain the waveform of the TCM chip in the test prototype;
[0117] S3, generate a simulated waveform based on the waveform of the TCM chip and send it to the serial port of the test prototype to shield the TCM chip;
[0118] S4, retrieve serial port logs;
[0119] S5, search for the temperature in the serial port log.
[0120] In some embodiments, establishing a connection between the microcontroller's serial port and the test prototype's serial port further includes:
[0121] Establish connections with the first, second, third, and fourth pins of the test prototype.
[0122] In some embodiments, acquiring the waveform of the TCM chip in the test prototype further includes:
[0123] The waveform of the TCM chip in the test prototype is obtained using the first pin.
[0124] In some embodiments, obtaining serial port logs further includes:
[0125] Set the second pin, the third pin, and the fourth pin to a low level output and discharge the capacitor in the microcontroller;
[0126] Set the second pin to high level and set the third and fourth pins as inputs to receive serial port logs.
[0127] Finally, it should be noted that those skilled in the art will understand that all or part of the processes in the above embodiments can be implemented by a computer program instructing related hardware. The program can be stored in a computer-readable storage medium, and when executed, it can include the processes of the embodiments of the above methods.
[0128] Furthermore, it should be understood that the computer-readable storage medium (e.g., memory) described herein may be volatile memory or non-volatile memory, or may include both volatile memory and non-volatile memory.
[0129] Those skilled in the art will also understand that the various exemplary logic blocks, modules, circuits, and algorithm steps described in conjunction with the disclosure herein can be implemented as electronic hardware, computer software, or a combination of both. To clearly illustrate this interchangeability between hardware and software, the functionality of various illustrative components, blocks, modules, circuits, and steps has been generally described. Whether this functionality is implemented as software or as hardware depends on the specific application and the design constraints imposed on the system as a whole. Those skilled in the art can implement the functionality in various ways for each specific application, but such implementation decisions should not be construed as departing from the scope of the embodiments disclosed herein.
[0130] The above are exemplary embodiments disclosed in this invention. However, it should be noted that various changes and modifications can be made without departing from the scope of the embodiments of this invention as defined by the claims. The functions, steps, and / or actions of the methods according to the disclosed embodiments described herein do not need to be performed in any particular order. Furthermore, although the elements disclosed in the embodiments of this invention may be described or claimed individually, they may be understood as multiple unless explicitly limited to a singular number.
[0131] It should be understood that, as used herein, the singular form “a” is intended to include the plural form as well, unless the context clearly supports an exception. It should also be understood that, as used herein, “and / or” refers to any and all possible combinations of one or more of the associated listed items.
[0132] The embodiment numbers disclosed in the above embodiments of the present invention are for descriptive purposes only and do not represent the superiority or inferiority of the embodiments.
[0133] Those skilled in the art will understand that all or part of the steps of the above embodiments can be implemented by hardware or by a program instructing related hardware. The program can be stored in a computer-readable storage medium, such as a read-only memory, a disk, or an optical disk.
[0134] Those skilled in the art should understand that the discussion of any of the above embodiments is merely exemplary and is not intended to imply that the scope of the invention (including the claims) is limited to these examples. Within the framework of the invention, technical features of the above embodiments or different embodiments can be combined, and many other variations of different aspects of the invention exist, which are not provided in the details for the sake of brevity. Therefore, any omissions, modifications, equivalent substitutions, improvements, etc., made within the spirit and principles of the invention should be included within the protection scope of the invention.
Claims
1. A method for obtaining the temperature of a test prototype, characterized in that, The following steps are performed using a microcontroller: Establish a serial port connection between the microcontroller and the test prototype; Obtain the waveform of the TCM chip in the test prototype; A simulated waveform is generated based on the waveform of the TCM chip and sent to the serial port of the test prototype to shield the TCM chip. Get serial port logs; Search for the temperature in the serial port log; Establishing a serial port connection between the microcontroller and the test prototype further includes: Establish connections with the first, second, third, and fourth pins of the test prototype; Acquiring the waveform of the TCM chip in the test prototype further includes: The waveform of the TCM chip in the test prototype is obtained using the first pin; Obtaining serial port logs, further including: Set the second pin, the third pin, and the fourth pin to a low level output and discharge the capacitor in the microcontroller; Set the second pin to high level and set the third and fourth pins as inputs to receive serial port logs.
2. A temperature acquisition system for a test prototype, characterized in that, include: The serial port module is configured to establish a connection between the microcontroller's serial port and the test prototype's serial port. The first acquisition module is configured to acquire the waveform of the TCM chip in the test prototype; The sending module is configured to generate an analog waveform based on the waveform of the TCM chip and send it to the serial port of the test prototype to shield the TCM chip; The second acquisition module is configured to acquire serial port logs; The search module is configured to search for temperature in the serial port log. Establishing a serial port connection between the microcontroller and the test prototype further includes: Establish connections with the first, second, third, and fourth pins of the test prototype. Acquiring the waveform of the TCM chip in the test prototype further includes: The waveform of the TCM chip in the test prototype is obtained using the first pin; Obtaining serial port logs, further including: Set the second pin, the third pin, and the fourth pin to a low level output and discharge the capacitor in the microcontroller; Set the second pin to high level and set the third and fourth pins as inputs to receive serial port logs.
3. A computer device, comprising: At least one processor; as well as A memory storing a computer program executable on the processor, characterized in that the processor executes the steps of the method as described in claim 1 when executing the program.
4. A computer-readable storage medium storing a computer program, characterized in that, When the computer program is executed by a processor, it performs the steps of the method as described in claim 1.