Method, system, electronic device and storage medium for judging device stability

Abstract

The present application provides a method, system, electronic device and storage medium for judging device stability, including: collecting the ambient temperature in a preset ambient temperature measurement time period in real time at a preset ambient temperature collection frequency to obtain an ambient temperature queue; comparing the ambient temperature difference between the maximum value and the minimum value of the ambient temperature queue with a preset ambient temperature difference threshold; if the ambient temperature difference is less than the ambient temperature difference threshold, collecting the focal plane temperature of the device to be judged in a preset judgment time period in real time at a preset device temperature collection frequency to obtain a focal plane temperature queue; obtaining the focal plane temperature difference between the maximum value and the minimum value of the focal plane temperature queue, and the discrete rate of all focal plane temperatures in the judgment time period, and judging whether the state of the device to be judged is stable according to the focal plane temperature difference and the discrete rate. This makes the judgment of device stability fast and accurate.

Description

Technical Field

[0001] The present application relates to the field of temperature detection, and in particular to a method, system, electronic device and storage medium for determining device stability. Background Art

[0002] With the development of technology, equipment is also developing towards miniaturization and precision. As equipment becomes smaller and smaller, the number of integrated parts increases. A large number of parts will generate a lot of heat during operation, and miniaturized equipment usually has a lower heat dissipation capacity. A large amount of heat cannot be dissipated in time, and slowly accumulates, which will greatly increase the temperature of the equipment during operation. Equipment that is in a high temperature state for a long time will affect the stability of the equipment.

[0003] The prior art generally relies on the temperature of the device casing when judging the device temperature, which often makes the judgment of the device temperature inaccurate, thereby affecting the judgment of the device stability. Summary of the invention

[0004] The main purpose of the embodiments of the present invention is to provide a method, system, electronic device and storage medium for judging the stability of a device, so as to judge the stability of the device based on the temperature of the components of the device itself, so that the judgment of the stability of the device is fast and accurate.

[0005] In a first aspect, a method for determining device stability is provided, the method comprising:

[0006] The ambient temperature within a preset ambient temperature measurement time period is collected in real time at a preset ambient temperature collection frequency to obtain an ambient temperature queue;

[0007] Compare the difference between the maximum and minimum ambient temperature of the ambient temperature queue with a preset ambient temperature difference threshold;

[0008] If the ambient temperature difference is less than the ambient temperature difference threshold, the focal plane temperature of the device to be judged within a preset judgment time period is collected in real time at a preset device temperature collection frequency to obtain a focal plane temperature queue, where the focal plane temperature is the temperature of the focal temperature sensor of the device to be judged;

[0009] Obtain a focal plane temperature difference between a maximum value and a minimum value of the focal plane temperature queue, and a discrete rate of all focal plane temperatures within the judgment time period, and determine whether the state of the device to be determined is stable based on the focal plane temperature difference and the discrete rate.

[0010] In a possible implementation, after comparing the ambient temperature difference between the maximum value and the minimum value of the ambient temperature queue with a preset ambient temperature difference threshold, the method further includes:

[0011] The ambient temperature queue is updated according to the first-in-first-out principle of the time axis.

[0012] In another possible implementation, after obtaining the focal plane temperature difference between the maximum value and the minimum value of the focal plane temperature queue and the discrete rate of all focal plane temperatures within the judgment time period, and judging whether the state of the device to be judged is stable according to the focal plane temperature difference and the discrete rate, the method further includes:

[0013] The focal plane temperature queue is updated according to the first-in-first-out principle of the time axis.

[0014] In another possible implementation, obtaining a focal plane temperature difference between a maximum value and a minimum value of the focal plane temperature queue, and a discrete rate of all focal plane temperatures within the judgment time period, and judging whether the state of the device to be judged is stable according to the focal plane temperature difference and the discrete rate, includes:

[0015] Obtaining a focal plane temperature difference between a maximum value and a minimum value of the focal plane temperature queue, and obtaining a standard deviation of the focal plane temperature queue according to a preset standard deviation formula;

[0016] Comparing the focal plane temperature difference with a preset focal plane temperature difference threshold, and comparing the standard deviation with a preset standard deviation threshold;

[0017] If the focal plane temperature difference is smaller than the focal plane temperature difference threshold, and the standard deviation is smaller than the standard deviation threshold, then the device to be determined is in a stable state.

[0018] In a second aspect, a system for determining device stability is provided, the system comprising:

[0019] An ambient temperature queue acquisition module is used to collect the ambient temperature within a preset ambient temperature measurement time period in real time at a preset ambient temperature acquisition frequency to obtain an ambient temperature queue;

[0020] An ambient temperature comparison module compares the ambient temperature difference between the maximum value and the minimum value of the ambient temperature queue with a preset ambient temperature difference threshold;

[0021] A focal plane temperature queue acquisition module, if the ambient temperature difference is less than the ambient temperature difference threshold, collects the focal plane temperature of the device to be judged in real time within a preset judgment time period at a preset device temperature acquisition frequency, and obtains a focal plane temperature queue, wherein the focal plane temperature is the temperature of the focal temperature sensor of the device to be judged;

[0022] The judgment module obtains the focal plane temperature difference between the maximum value and the minimum value of the focal plane temperature queue, and the discrete rate of all focal plane temperatures within the judgment time period, and judges whether the state of the device to be judged is stable according to the focal plane temperature difference and the discrete rate.

[0023] In a possible implementation, the system further includes:

[0024] The ambient temperature queue updating module is used to update the ambient temperature queue according to the first-in-first-out principle of the time axis.

[0025] In another possible implementation, the system further includes:

[0026] The focal plane temperature queue updating module is used to update the focal plane temperature queue according to the first-in-first-out principle of the time axis.

[0027] In another possible implementation, the determination module includes:

[0028] The data acquisition unit is used to obtain the focal plane temperature difference between the maximum value and the minimum value of the focal plane temperature queue, and obtain the standard deviation of the focal plane temperature queue according to a preset standard deviation formula:

[0029] a comparing unit, configured to compare the focal plane temperature difference with a preset focal plane temperature difference threshold, and to compare the standard deviation with a preset standard deviation threshold;

[0030] A stable state determining unit is used to determine that the device to be determined is in a stable state if the focal plane temperature difference value is smaller than the focal plane temperature difference threshold and the standard deviation is smaller than the standard deviation threshold.

[0031] In a third aspect, an electronic device is provided, comprising a memory, a processor, and a computer program stored in the memory and executable on the processor, wherein when the processor executes the program, the method for determining device stability as provided in the first aspect is implemented.

[0032] In a fourth aspect, a non-transitory computer-readable storage medium is provided, on which a computer program is stored, and when the computer program is executed by a processor, the method for determining device stability as provided in the first aspect is implemented. BRIEF DESCRIPTION OF THE DRAWINGS

[0033] In order to more clearly illustrate the technical solutions in the embodiments of the present application, the drawings required for use in describing the embodiments of the present application are briefly introduced below.

[0034] Figure 1 A flow chart of a method for determining device stability provided by one embodiment of the present invention;

[0035] Figure 2 A flowchart of a method for determining device stability provided by yet another embodiment of the present invention;

[0036] Figure 3 A flowchart of a method for determining device stability provided by another embodiment of the present invention;

[0037] Figure 4 A flowchart of a method for determining device stability provided by another embodiment of the present invention;

[0038] Figure 5 A structural diagram of a system for determining device stability provided by an embodiment of the present invention;

[0039] Figure 6 A structural diagram of a system for determining device stability provided by yet another embodiment of the present invention;

[0040] Figure 7 A structural diagram of a system for determining device stability provided by another embodiment of the present invention;

[0041] Figure 8 A structural diagram of a system for determining device stability provided by another embodiment of the present invention;

[0042] Fig. 9 The figure is a schematic diagram of the physical structure of an electronic device of the present invention.

[0043] Specific implementation method

[0044] The embodiments of the present application are described in detail below, and examples of the embodiments are shown in the accompanying drawings, wherein the same or similar reference numerals throughout represent the same or similar modules or modules with the same or similar functions. The embodiments described below with reference to the accompanying drawings are exemplary and are only used to explain the present application, and cannot be interpreted as limiting the present invention.

[0045] It will be understood by those skilled in the art that, unless expressly stated, the singular forms "a", "an", "said" and "the" used herein may also include plural forms. It should be further understood that the term "comprising" used in the specification of the present application refers to the presence of the features, integers, steps, operations, modules and / or components, but does not exclude the presence or addition of one or more other features, integers, steps, operations, modules, components and / or groups thereof. It should be understood that when we refer to a module as being "connected" or "coupled" to another module, it may be directly connected or coupled to the other modules, or there may be intermediate modules. In addition, the "connection" or "coupling" used herein may include wireless connection or wireless coupling. The term "and / or" used herein includes all or any modules and all combinations of one or more associated listed items.

[0046] In order to make the objectives, technical solutions and advantages of the present application clearer, the implementation method of the present application will be further described in detail below in conjunction with the accompanying drawings.

[0047] The technical solution of the present application and how to solve the above-mentioned technical problems are described in detail below with specific embodiments. The following specific embodiments can be combined with each other, and the same or similar concepts or processes may not be repeated in some embodiments. The embodiments of the present application will be described below in conjunction with the accompanying drawings.

[0048] like Figure 1 FIG. 1 is a flow chart of a method for determining device stability according to an embodiment of the present invention, wherein the method comprises:

[0049] Step 101, collecting the ambient temperature in a preset ambient temperature measurement time period in real time at a preset ambient temperature collection frequency to obtain an ambient temperature queue;

[0050] Step 102, comparing the ambient temperature difference between the maximum value and the minimum value of the ambient temperature queue with a preset ambient temperature difference threshold;

[0051] Step 103: if the ambient temperature difference is less than the ambient temperature difference threshold, the focal plane temperature of the device to be judged within a preset judgment time period is collected in real time at a preset device temperature collection frequency to obtain a focal plane temperature queue, where the focal plane temperature is the temperature of the focal temperature sensor of the device to be judged;

[0052] Step 104, obtaining the focal plane temperature difference between the maximum value and the minimum value of the focal plane temperature queue, and the discrete rate of all focal plane temperatures in the judgment time period, and judging whether the state of the device to be judged is stable according to the focal plane temperature difference and the discrete rate.

[0053] In the embodiment of the present invention, the judgment of the stability of the device is effective only when the ambient temperature meets the judgment criteria, and the ambient temperature changes in real time. Therefore, the ambient temperature within the preset ambient temperature measurement time period is collected in real time at a preset ambient temperature collection frequency, thereby forming an ambient temperature queue. Among them, the ambient temperature collection frequency and the ambient temperature measurement time period can be set according to the actual needs of use, and this application does not limit this.

[0054] After obtaining the ambient temperature queue, obtain the maximum ambient temperature and the minimum ambient temperature from the ambient temperature queue respectively, and then obtain the ambient temperature difference between the maximum and minimum values, and compare the ambient temperature difference with the preset ambient temperature difference threshold. If the ambient temperature difference is less than the ambient temperature difference threshold, perform subsequent processing; if the ambient temperature difference is greater than the ambient temperature difference threshold, wait for the ambient temperature to change so that the ambient temperature difference is less than the ambient temperature difference threshold.

[0055] When the ambient temperature difference is less than the ambient temperature difference threshold, it means that the current ambient temperature can be used to judge the stability of the device, and the focal plane temperature of the device to be judged within the preset judgment time period is collected in real time at the preset device temperature collection frequency, thereby forming a focal plane temperature queue. Among them, the device temperature collection frequency and judgment time period can be set according to the actual needs of use, and this application does not limit this.

[0056] Obtain the maximum and minimum focal plane temperatures from the focal plane temperature queue, and obtain the focal plane temperature difference between the maximum and minimum values; obtain the discrete distribution of focal plane temperatures, i.e., the discrete rate, based on all focal plane temperatures in the focal plane temperature queue. Determine whether the device is stable based on the focal plane temperature difference and the discrete rate.

[0057] In the embodiment of the present invention, the ambient temperature within a preset ambient temperature measurement time period is collected in real time at a preset ambient temperature collection frequency to obtain an ambient temperature queue; the ambient temperature difference between the maximum value and the minimum value of the ambient temperature queue is compared with a preset ambient temperature difference threshold; if the ambient temperature difference is less than the ambient temperature difference threshold, the focal plane temperature of the device to be judged within a preset judgment time period is collected in real time at a preset device temperature collection frequency to obtain a focal plane temperature queue, wherein the focal plane temperature is the temperature of the focal temperature sensor of the device to be judged; the focal plane temperature difference between the maximum value and the minimum value of the focal plane temperature queue and the discrete rate of all focal plane temperatures within the judgment time period are obtained, and whether the state of the device to be judged is stable is judged according to the focal plane temperature difference and the discrete rate. The stability of the device to be judged is judged based on the temperature of the components of the device to be judged, so that the judgment of the stability of the device is fast and accurate.

[0058] like Figure 2 The flowchart of a method for determining device stability provided by another embodiment of the present invention is shown, wherein the method of obtaining the focal plane temperature difference between the maximum value and the minimum value of the focal plane temperature queue and the discrete rate of all focal plane temperatures within the determination time period, and determining whether the state of the device to be determined is stable according to the focal plane temperature difference and the discrete rate, includes:

[0059] Step 201, obtaining a focal plane temperature difference between a maximum value and a minimum value of the focal plane temperature queue, and obtaining a standard deviation of the focal plane temperature queue according to a preset standard deviation formula;

[0060] Step 202, comparing the focal plane temperature difference with a preset focal plane temperature difference threshold, and comparing the standard deviation with a preset standard deviation threshold;

[0061] Step 203: If the focal plane temperature difference is smaller than the focal plane temperature difference threshold, and the standard deviation is smaller than the standard deviation threshold, the device to be determined is in a stable state.

[0062] In the embodiment of the present invention, the standard deviation formula is: According to the standard deviation formula, the standard deviation of all focal plane temperatures in the focal plane temperature queue can be obtained, and the standard deviation is compared with the preset standard deviation threshold. If the standard deviation is less than the standard deviation threshold and the focal plane temperature difference is less than the focal plane temperature difference threshold, it means that the temperature change of the device is small and the device is in a stable state.

[0063] like Figure 3 The flowchart of the method for determining device stability provided by another embodiment of the present invention is shown. After comparing the ambient temperature difference between the maximum value and the minimum value of the ambient temperature queue with a preset ambient temperature difference threshold, the method further includes:

[0064] Step 105: Update the ambient temperature queue according to the first-in-first-out principle of the time axis.

[0065] In an embodiment of the present invention, since the ambient temperature is in a real-time changing state, the ambient temperature queue needs to be updated. Specifically: a certain number of ambient temperature values ​​are deleted from the starting position of the ambient temperature queue in order from early to late time points, and the same number of ambient temperature values ​​are added to the ending position of the ambient temperature queue.

[0066] like Figure 4 Shown is a flow chart of a method for determining device stability provided by another embodiment of the present invention.

[0067] In an embodiment of the present invention, the focal plane temperature of the device to be judged is in a real-time changing state as the usage time increases. The current focal plane temperature queue is stable, while the next focal plane temperature queue may be in a fluctuating state. Therefore, the focal plane temperature queue needs to be updated: a certain number of focal plane temperature values ​​are deleted from the starting position of the focal plane temperature queue in order from early to late time points, and the same number of focal plane temperature values ​​are added to the end position of the focal plane temperature queue.

[0068] like Figure 5 FIG. 1 is a structural diagram of a system for determining device stability provided by an embodiment of the present invention, wherein the system includes:

[0069] The ambient temperature queue acquisition module 501 is used to collect the ambient temperature within a preset ambient temperature measurement time period in real time at a preset ambient temperature acquisition frequency to obtain an ambient temperature queue;

[0070] An ambient temperature comparison module 502 compares the ambient temperature difference between the maximum value and the minimum value of the ambient temperature queue with a preset ambient temperature difference threshold;

[0071] The focal plane temperature queue acquisition module 503 collects the focal plane temperature of the device to be judged within a preset judgment time period in real time at a preset device temperature acquisition frequency if the ambient temperature difference is less than the ambient temperature difference threshold, and obtains a focal plane temperature queue, where the focal plane temperature is the temperature of the focal temperature sensor of the device to be judged;

[0072] The judgment module 504 obtains the focal plane temperature difference between the maximum value and the minimum value of the focal plane temperature queue, and the discrete rate of all focal plane temperatures within the judgment time period, and judges whether the state of the device to be judged is stable according to the focal plane temperature difference and the discrete rate.

[0073] In the embodiment of the present invention, the judgment of the stability of the device is effective only when the ambient temperature meets the judgment criteria, and the ambient temperature changes in real time. Therefore, the ambient temperature within the preset ambient temperature measurement time period is collected in real time at a preset ambient temperature collection frequency, thereby forming an ambient temperature queue. Among them, the ambient temperature collection frequency and the ambient temperature measurement time period can be set according to the actual needs of use, and this application does not limit this.

[0074] After obtaining the ambient temperature queue, obtain the maximum ambient temperature and the minimum ambient temperature from the ambient temperature queue respectively, and then obtain the ambient temperature difference between the maximum and minimum values, and compare the ambient temperature difference with the preset ambient temperature difference threshold. If the ambient temperature difference is less than the ambient temperature difference threshold, perform subsequent processing; if the ambient temperature difference is greater than the ambient temperature difference threshold, wait for the ambient temperature to change so that the ambient temperature difference is less than the ambient temperature difference threshold.

[0075] When the ambient temperature difference is less than the ambient temperature difference threshold, it means that the current ambient temperature can be used to judge the stability of the device, and the focal plane temperature of the device to be judged within the preset judgment time period is collected in real time at the preset device temperature collection frequency, thereby forming a focal plane temperature queue. Among them, the device temperature collection frequency and judgment time period can be set according to the actual needs of use, and this application does not limit this.

[0076] Obtain the maximum and minimum focal plane temperatures from the focal plane temperature queue, and obtain the focal plane temperature difference between the maximum and minimum values; obtain the discrete distribution of focal plane temperatures, i.e., the discrete rate, based on all focal plane temperatures in the focal plane temperature queue. Determine whether the device is stable based on the focal plane temperature difference and the discrete rate.

[0077] In the embodiment of the present invention, the ambient temperature within a preset ambient temperature measurement time period is collected in real time at a preset ambient temperature collection frequency to obtain an ambient temperature queue; the ambient temperature difference between the maximum value and the minimum value of the ambient temperature queue is compared with a preset ambient temperature difference threshold; if the ambient temperature difference is less than the ambient temperature difference threshold, the focal plane temperature of the device to be judged within a preset judgment time period is collected in real time at a preset device temperature collection frequency to obtain a focal plane temperature queue, wherein the focal plane temperature is the temperature of the focal temperature sensor of the device to be judged; the focal plane temperature difference between the maximum value and the minimum value of the focal plane temperature queue and the discrete rate of all focal plane temperatures within the judgment time period are obtained, and whether the state of the device to be judged is stable is judged according to the focal plane temperature difference and the discrete rate. The stability of the device to be judged is judged based on the temperature of the components of the device to be judged, so that the judgment of the stability of the device is fast and accurate.

[0078] like Figure 6 FIG. 5 is a structural diagram of a system for determining device stability according to another embodiment of the present invention. The determining module 504 includes:

[0079] The data acquisition unit 601 is used to obtain the focal plane temperature difference between the maximum value and the minimum value of the focal plane temperature queue, and obtain the standard deviation of the focal plane temperature queue according to a preset standard deviation formula:

[0080] A comparing unit 602, configured to compare the focal plane temperature difference with a preset focal plane temperature difference threshold, and to compare the standard deviation with a preset standard deviation threshold;

[0081] The stable state determining unit 603 is configured to determine that the device to be determined is in a stable state if the focal plane temperature difference is less than the focal plane temperature difference threshold and the standard deviation is less than the standard deviation threshold.

[0082] In the embodiment of the present invention, the standard deviation formula is: Among them, x i For each temperature value in the focal plane temperature queue, is the average value of all the temperature values ​​in the focal plane temperature queue, n is the number of temperatures in the focal plane temperature queue, and S is the standard deviation calculated according to the formula. The standard deviation of all focal plane temperatures in the focal plane temperature queue can be obtained according to the standard deviation formula, and the standard deviation is compared with the preset standard deviation threshold. If the standard deviation is less than the standard deviation threshold, and the focal plane temperature difference is less than the focal plane temperature difference threshold, it means that the temperature change of the device is small and the device is in a stable state.

[0083] like Figure 7 FIG. 1 is a structural diagram of a system for determining device stability according to another embodiment of the present invention, wherein the system further comprises:

[0084] The environment temperature queue updating module 505 is used to update the environment temperature queue according to the first-in-first-out principle of the time axis.

[0085] In an embodiment of the present invention, since the ambient temperature is in a real-time changing state, the ambient temperature queue needs to be updated. Specifically: a certain number of ambient temperature values ​​are deleted from the starting position of the ambient temperature queue in order from early to late time points, and the same number of ambient temperature values ​​are added to the ending position of the ambient temperature queue.

[0086] like Figure 8 FIG. 1 is a structural diagram of a system for determining device stability according to another embodiment of the present invention, wherein the system further comprises:

[0087] The focal plane temperature queue updating module 506 is used to update the focal plane temperature queue according to the first-in-first-out principle of the time axis.

[0088] In an embodiment of the present invention, the focal plane temperature of the device to be judged is in a real-time changing state as the usage time increases. The current focal plane temperature queue is stable, while the next focal plane temperature queue may be in a fluctuating state. Therefore, the focal plane temperature queue needs to be updated: a certain number of focal plane temperature values ​​are deleted from the starting position of the focal plane temperature queue in order from early to late time points, and the same number of focal plane temperature values ​​are added to the end position of the focal plane temperature queue.

[0089] Fig. 9 An example of a physical structure diagram of an electronic device is shown in FIG. Fig. 9As shown, the electronic device may include: a processor (processor) 901, a communication interface (Communications Interface) 902, a memory (memory) 903 and a communication bus 904, wherein the processor, the communication interface and the memory complete mutual communication through the communication bus. The processor may call the logic instructions in the memory to execute the method for judging the stability of the device, the method comprising: collecting the ambient temperature in a preset ambient temperature measurement time period in real time at a preset ambient temperature collection frequency, and obtaining an ambient temperature queue; comparing the ambient temperature difference between the maximum value and the minimum value of the ambient temperature queue with a preset ambient temperature difference threshold; if the ambient temperature difference is less than the ambient temperature difference threshold, collecting the focal plane temperature of the device to be judged in a preset judgment time period in real time at a preset device temperature collection frequency, and obtaining a focal plane temperature queue, wherein the focal plane temperature is the temperature of the focal temperature sensor of the device to be judged; obtaining the focal plane temperature difference between the maximum value and the minimum value of the focal plane temperature queue, and the discrete rate of all focal plane temperatures in the judgment time period, and judging whether the state of the device to be judged is stable according to the focal plane temperature difference and the discrete rate.

[0090] In addition, the logic instructions in the above-mentioned memory can be implemented in the form of software functional units and can be stored in a computer-readable storage medium when sold or used as an independent product. Based on such an understanding, the technical solution of the present invention, in essence, or the part that contributes to the prior art or the part of the technical solution, can be embodied in the form of a software product, which is stored in a storage medium and includes several instructions for a computer device (which can be a personal computer, a server, or a network device, etc.) to perform all or part of the steps of the method described in each embodiment of the present invention. The aforementioned storage medium includes: various media that can store program codes, such as a USB flash drive, a mobile hard disk, a read-only memory (ROM), a random access memory (RAM), a magnetic disk or an optical disk.

[0091] On the other hand, an embodiment of the present invention further provides a computer program product, the computer program product comprising a computer program stored on a non-transitory computer-readable storage medium, the computer program comprising program instructions, and when the program instructions are executed by a computer, the computer can execute the device stability judgment method provided by the above-mentioned method embodiments, the method comprising: collecting the ambient temperature within a preset ambient temperature measurement time period in real time at a preset ambient temperature collection frequency, and obtaining an ambient temperature queue; comparing the ambient temperature difference between the maximum value and the minimum value of the ambient temperature queue with a preset ambient temperature difference threshold; if the ambient temperature difference is less than the ambient temperature difference threshold, collecting the focal plane temperature of the device to be judged within a preset judgment time period in real time at a preset device temperature collection frequency, and obtaining a focal plane temperature queue, the focal plane temperature being the temperature of the focal temperature sensor of the device to be judged; obtaining the focal plane temperature difference between the maximum value and the minimum value of the focal plane temperature queue, and the discrete rate of all focal plane temperatures within the judgment time period, and judging whether the state of the device to be judged is stable according to the focal plane temperature difference and the discrete rate.

[0092] On the other hand, an embodiment of the present invention further provides a non-transitory computer-readable storage medium having a computer program stored thereon, which, when executed by a processor, is implemented to execute the method for determining device stability provided by the above embodiments, the method comprising: acquiring the ambient temperature within a preset ambient temperature measurement time period in real time at a preset ambient temperature acquisition frequency, and obtaining an ambient temperature queue; comparing the ambient temperature difference between the maximum value and the minimum value of the ambient temperature queue with a preset ambient temperature difference threshold; if the ambient temperature difference is less than the ambient temperature difference threshold, acquiring the focal plane temperature of the device to be determined within a preset determination time period in real time at a preset device temperature acquisition frequency, and obtaining a focal plane temperature queue, wherein the focal plane temperature is the temperature of the focal temperature sensor of the device to be determined; obtaining the focal plane temperature difference between the maximum value and the minimum value of the focal plane temperature queue, and the discrete rate of all focal plane temperatures within the determination time period, and determining whether the state of the device to be determined is stable based on the focal plane temperature difference and the discrete rate.

[0093] It should be understood that, although the steps in the flowchart of the accompanying drawings are displayed in sequence as indicated by the arrows, these steps are not necessarily executed in sequence in the order indicated by the arrows. Unless otherwise specified herein, there is no strict order restriction on the execution of these steps, and they can be executed in other orders. Moreover, at least a part of the steps in the flowchart of the accompanying drawings may include multiple sub-steps or multiple stages, and these sub-steps or stages are not necessarily executed at the same time, but can be executed at different times, and their execution order is not necessarily sequential, but can be executed in turn or alternately with other steps or at least a part of the sub-steps or stages of other steps.

[0094] The above is only a partial implementation of the present invention. It should be pointed out that for ordinary technicians in this technical field, several improvements and modifications can be made without departing from the principles of the present invention. These improvements and modifications should also be regarded as the scope of protection of the present invention.

Claims

1. A method for judging equipment stability, characterized in that: The method comprises: The ambient temperature within a preset ambient temperature measurement time period is collected in real time at a preset ambient temperature collection frequency to obtain an ambient temperature queue; Compare the difference between the maximum and minimum ambient temperature of the ambient temperature queue with a preset ambient temperature difference threshold; If the ambient temperature difference is less than the ambient temperature difference threshold, the focal plane temperature of the device to be judged within a preset judgment time period is collected in real time at a preset device temperature collection frequency to obtain a focal plane temperature queue, where the focal plane temperature is the temperature of the focal temperature sensor of the device to be judged; Obtaining a focal plane temperature difference between a maximum value and a minimum value of the focal plane temperature queue, and a discrete rate of all focal plane temperatures within the judgment time period, and judging whether the state of the device to be judged is stable according to the focal plane temperature difference and the discrete rate; The obtaining of the focal plane temperature difference between the maximum value and the minimum value of the focal plane temperature queue and the discrete rate of all focal plane temperatures within the judgment time period, and judging whether the state of the device to be judged is stable according to the focal plane temperature difference and the discrete rate, includes: Obtaining a focal plane temperature difference between a maximum value and a minimum value of the focal plane temperature queue, and obtaining a standard deviation of the focal plane temperature queue according to a preset standard deviation formula; Comparing the focal plane temperature difference with a preset focal plane temperature difference threshold, and comparing the standard deviation with a preset standard deviation threshold; If the focal plane temperature difference is smaller than the focal plane temperature difference threshold, and the standard deviation is smaller than the standard deviation threshold, then the device to be determined is in a stable state.

2. The method according to claim 1, characterized in that After comparing the ambient temperature difference between the maximum value and the minimum value of the ambient temperature queue with a preset ambient temperature difference threshold, the method further includes: The ambient temperature queue is updated according to the first-in-first-out principle of the time axis.

3. The method according to claim 1, characterized in that After obtaining the focal plane temperature difference between the maximum value and the minimum value of the focal plane temperature queue and the discrete rate of all focal plane temperatures within the judgment time period, and judging whether the state of the device to be judged is stable according to the focal plane temperature difference and the discrete rate, the method further includes: The focal plane temperature queue is updated according to the first-in-first-out principle of the time axis.

4. A system for determining equipment stability, characterized in that: The system comprises: An ambient temperature queue acquisition module is used to collect the ambient temperature within a preset ambient temperature measurement time period in real time at a preset ambient temperature acquisition frequency to obtain an ambient temperature queue; An ambient temperature comparison module compares the ambient temperature difference between the maximum value and the minimum value of the ambient temperature queue with a preset ambient temperature difference threshold; A focal plane temperature queue acquisition module, if the ambient temperature difference is less than the ambient temperature difference threshold, collects the focal plane temperature of the device to be judged in real time within a preset judgment time period at a preset device temperature acquisition frequency, and obtains a focal plane temperature queue, wherein the focal plane temperature is the temperature of the focal temperature sensor of the device to be judged; A judgment module, which obtains a focal plane temperature difference between a maximum value and a minimum value of the focal plane temperature queue, and a discrete rate of all focal plane temperatures within the judgment time period, and judges whether the state of the device to be judged is stable according to the focal plane temperature difference and the discrete rate; The judging module comprises: A data acquisition unit is used to obtain the focal plane temperature difference between the maximum value and the minimum value of the focal plane temperature queue, and obtain the standard deviation of the focal plane temperature queue according to a preset standard deviation formula: a comparing unit, configured to compare the focal plane temperature difference with a preset focal plane temperature difference threshold, and to compare the standard deviation with a preset standard deviation threshold; A stable state determining unit is used to determine that the device to be determined is in a stable state if the focal plane temperature difference value is smaller than the focal plane temperature difference threshold and the standard deviation is smaller than the standard deviation threshold.

5. The system according to claim 4, characterized in that The system further comprises: an environment temperature queue updating module, which is used to update the environment temperature queue according to the first-in-first-out principle of the time axis.

6. The system according to claim 4, characterized in that The system further comprises: The focal plane temperature queue updating module is used to update the focal plane temperature queue according to the first-in-first-out principle of the time axis.

7. An electronic device comprising a memory, a processor, and a computer program stored in the memory and executable on the processor, characterized in that: When the processor executes the program, the method for determining device stability as described in any one of claims 1 to 3 is implemented.

8. A non-transitory computer-readable storage medium having a computer program stored thereon, characterized in that: When the computer program is executed by a processor, the method for determining device stability as described in any one of claims 1 to 3 is implemented.

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