A high-precision synchronous testing mechanism for probes
Through the integrated structure-designed probe high-precision synchronization test mechanism, efficient synchronous testing of probe elasticity and impedance is achieved, solving the problem that cannot be tested simultaneously in the existing technology, and improving the accuracy and efficiency of probe testing.
Patent Information
- Application Number
- CN202210711313.2
- Authority / Receiving Office
- CN · China
- Patent Type
- Patents(China)
- Current Assignee / Owner
- Filing Date
- 2022-06-22
- Publication Date
- 2025-08-08
- Estimated Expiration
- 2042-06-22
AI Technical Summary
The prior art cannot efficiently test the elastic force and impedance of the probe at the same time, and cannot judge the real-time impact between the two, and cannot achieve concentric automatic alignment of the probe needle and pinhole, affecting the research and development and production efficiency of the probe.
It adopts an integrated structural design, including substrate, downward pressure test module, vision module and floating carrier module. The floating carrier module drives the product to reciprocate between the downward pressure test module and the visual module, and combines the elastic test module and impedance test module to achieve high-precision synchronous testing of probe position.
High-precision synchronous testing of probe elasticity and impedance is achieved, testing efficiency is improved, the probe landing is ensured accurately, and the impact of probe head and carrier plate offset on elasticity and impedance is analyzed, providing a data basis for in-depth research.
Smart Images

Figure CN115183961B_ABST
Abstract
Description
Technical Field
[0001] The present invention relates to the technical field of high-precision synchronous testing mechanisms for probes, and in particular to a high-precision synchronous testing mechanism for probes. Background Art
[0002] The existing methods mostly use a separate DCR test and then test the spring force on another test machine, which is inefficient and cannot determine the real-time impact of the spring force on the impedance, nor can it confirm the specific relationship between the two or their mutual interference. The present invention aims to solve the problem of being unable to test simultaneously. While achieving high-precision synchronous testing of the probe spring force and impedance, it can also perform concentric automatic alignment of the probe needle and pinhole, analyze the impact of the needle and carrier board offset on the spring force and impedance in the probe usage scenario, and realize verification from concentricity to any eccentricity value. It plays a vital role in probe research and development, proofing, mass production and the use of test equipment.
[0003] A pressure testing device with publication number CN216208194U is disclosed, which includes a frame and a pressure testing module, a carrier module and a lifting module arranged in sequence from top to bottom. The pressure testing module includes the Y-axis linear assembly arranged on the frame and the Z-axis linear assembly and the pressure testing assembly which are sequentially connected to the Y-axis linear assembly. The carrier module includes the X-axis linear assembly arranged on the frame and a carrier body which is connected to the X-axis linear assembly. The lifting module includes a lifting cylinder arranged on the frame and a female connector which is connected to the lifting cylinder. The female connector and the pressure testing assembly are both compatible with the carrier body. The invention uses three stations to perform pressure testing on products simultaneously. It is an automated pressure testing device for electronic products with high precision and effective reduction of labor intensity of personnel. However, the structure only has the effect of pressure testing and lacks testing of other data such as impedance of the product to be tested. Summary of the Invention
[0004] The technical problem to be solved by the present invention is to overcome the deficiencies of the prior art and provide a high-precision synchronous testing mechanism for probes that has a compact structure and can test the elastic force and impedance of the probes at the same time.
[0005] The technical solution adopted by the present invention is: the present invention includes a substrate, a pressure test module, a visual module and a floating carrier module, the pressure test module and the visual module are fixedly connected to the substrate, the floating carrier module is slidingly connected to the substrate, the floating carrier module drives the product to reciprocate between the pressure test module and the visual module, and the floating carrier module is positioned and coordinated with the visual module.
[0006] Furthermore, two groups of stop blocks are provided on the base plate, and the two groups of stop blocks cooperate with the floating carrier module in a limiting manner.
[0007] Furthermore, the downward pressure test module includes a fixed plate, a downward pressure drive device, a downward pressure connecting plate, a downward pressure block and an elastic force testing component. The fixed plate is fixedly connected to the base plate, the downward pressure drive device is arranged on the fixed plate, the downward pressure connecting plate is connected to the output end of the downward pressure drive device, the downward pressure block is fixedly connected to the downward pressure connecting plate, and the downward pressure block is provided with a yield groove that cooperates with the elastic force testing component.
[0008] Furthermore, the elastic force testing assembly includes a pressure sensor, a fixed block, a conductive connecting plate, a conductive fixing piece and a test connector. One end of the pressure sensor is fixedly connected to the lower pressure block, and the other end of the pressure sensor is slidingly connected to the fixed block. The fixed block is connected to the conductive fixing piece. The conductive connecting plate is arranged between the fixed block and the conductive fixing piece. The test connector passes through the conductive fixing block and is conductively connected to the conductive connecting plate.
[0009] Furthermore, the visual module includes a support frame, a visual dual-axis adjustment platform, a visual Z-axis drive device, an industrial camera and a lighting component. The support frame is arranged on the substrate, the visual dual-axis adjustment platform is arranged on the support frame, the visual Z-axis drive device is connected to the movable end of the visual dual-axis adjustment platform, the industrial camera and the lighting component are both connected to the movable end of the visual Z-axis drive device, and the lighting component is arranged below the industrial camera.
[0010] Furthermore, the visual dual-axis adjustment platform includes a visual X-axis adjustment unit and a visual Y-axis adjustment unit, the visual X-axis adjustment unit is arranged on the support frame, the visual Y-axis adjustment unit is connected to the output end of the visual X-axis adjustment unit, and the visual Y-axis adjustment unit is provided with a fixed frame, and the fixed frame is connected to the visual Z-axis drive device.
[0011] Furthermore, the floating carrier module includes a mounting plate, a floating carrier assembly, a Y-axis drive device, an X-axis drive device and a needle block assembly. The mounting plate is slidably matched with the base plate, the floating carrier module is arranged on the mounting plate, the Y-axis drive device is arranged in the middle section of the mounting plate, the X-axis drive device is connected to the movable end of the Y-axis drive device, the needle block assembly is connected to the movable end of the X-axis drive device, the floating carrier assembly is guided by the needle block module, and a limiting member is also provided on the mounting plate to limit the two groups of the stop blocks.
[0012] Furthermore, the floating carrier assembly includes a floating plate and two groups of mounting seats, floating blocks, adjustment plates and limit screws symmetrically on the mounting plate. The two groups of floating blocks are floatingly connected to the two groups of mounting seats respectively. The two groups of adjustment plates are respectively arranged at the upper ends of the two groups of mounting seats. The two groups of limit screws are respectively arranged on the two groups of adjustment plates. The floating plate is fixedly connected to the two groups of floating blocks and is press-fitted with the two groups of limit screws.
[0013] Furthermore, the needle block assembly includes a needle block plate, two groups of first guide pins, two groups of second guide pins and a positioning member. The needle block plate is arranged on the output end of the X-axis drive device. The two groups of first guide pins and the two groups of second guide pins are all arranged on the needle block plate and positioned with the floating guide. The positioning block is arranged in the middle of the needle block plate and is positioned with the visual module.
[0014] Furthermore, it also includes a base, an outer cover and a control panel, the base is connected to the base plate, the outer cover is fixedly connected to the base plate, the control panel is arranged on the outer cover, and the base is provided with a plurality of foot cups and universal wheels.
[0015] The beneficial effects of the present invention are: since the present invention adopts an integrated structural design of elastic force test module and impedance test module, only a single downward pressure is required after the probe position is adjusted into place, so as to realize high-precision synchronous testing of elastic force and impedance, save test procedures, and improve probe test efficiency; the probe adopts high-precision visual alignment, and the probe is accurately positioned. In the probe usage scenario, the influence of the probe head and carrier plate offset on elastic force and impedance is analyzed, and a variety of probe usage scenarios can be simulated in the mechanism with good universal performance; the structural design adopts the joint action of pressure sensor and conductive connection plate, and the probe can be tested for elastic force and impedance at the same time when pressed down, so that the tester can accurately observe the correlation between elastic force and impedance, and provide a strong data basis for in-depth research on the probe; a grid-shaped positioning piece structure design is provided, and when eccentric positioning is required during the visual positioning process of the probe, it is guided and aligned with the grid in the positioning piece, and the test variable control is accurate, thereby improving the validity of the test data. BRIEF DESCRIPTION OF THE DRAWINGS
[0016] Figure 1 It is a structural schematic diagram of the present invention;
[0017] Figure 2 It is a structural schematic diagram of the pressure test module of the present invention;
[0018] Figure 3 yes Figure 2 A partial enlarged view of part A;
[0019] Figure 4 It is a structural diagram of the visual module of the present invention;
[0020] Figure 5 It is a structural schematic diagram of the floating carrier module of the present invention;
[0021] Figure 6 yes Figure 5 A partial enlarged view of part B;
[0022] Figure 7 It is a structural schematic diagram of the needle block assembly of the present invention;
[0023] Figure 8 It is a schematic structural diagram of the present invention as a whole. DETAILED DESCRIPTION
[0024] like Figures 1 to 8 As shown, in this embodiment, the present invention includes a base plate 1, a press test module 2, a visual module 3 and a floating carrier module 4, the press test module 2 and the visual module 3 are fixedly connected to the base plate 1, the floating carrier module 4 is slidably connected to the base plate 1, the floating carrier module 4 drives the product to reciprocate between the press test module 2 and the visual module 3, the floating carrier module 4 is positioned and matched with the visual module 3, the base plate 1 is provided with a number of positioning pins, two sets of slide rails and a number of sliders, the two sets of slide rails are fixed by a number of positioning pins Fixedly connected to the substrate 1, several of the sliders are respectively slidably matched with the two groups of slide rails, and several of the sliders are connected to the floating carrier module 4. The floating carrier module 4 reciprocates under the action of the sliders and the slide rails. The probe is placed in the floating carrier module 4. The vision module 3 automatically aligns the concentricity of the probe needle and the pinhole. After the alignment is completed, the floating carrier module 4 drives the probe into the test station, and the downward pressure test module 2 performs elastic force and DCR tests on the probe at the same time. If the test requires an eccentricity value, the floating carrier module 4 is moved under the vision module 3 for recalibration and setting. The elastic force test module and the impedance test module are integrated into the structural design. After the probe position is adjusted into place, only a single downward pressure is required to achieve high-precision synchronous testing of elastic force and impedance, saving testing procedures and improving probe testing efficiency. The probe adopts high-precision visual alignment, and the probe is accurately positioned. The impact of the probe head and carrier offset on elastic force and impedance is analyzed in the probe usage scenario.
[0025] In this embodiment, two groups of stop blocks 5 are provided on the substrate 1, and the two groups of stop blocks 5 are limitedly cooperated with the floating carrier module 4. The docking positions of the floating carrier module 4 and the stop blocks 5 are respectively located below the visual module 3 and the test station, which simplifies the test movement and transportation process and improves the probe elasticity and impedance test efficiency.
[0026] In this embodiment, the downward pressure test module 2 includes a fixed plate 21, a downward pressure drive device 22, a downward pressure connecting plate 23, a downward pressure block 24 and an elastic test component 25. The fixed plate 21 is fixedly connected to the base plate 1, the downward pressure drive device 22 is arranged on the fixed plate 21, the downward pressure connecting plate 23 is connected to the output end of the downward pressure drive device 22, the downward pressure block 24 is fixedly connected to the downward pressure connecting plate 23, and the downward pressure block 24 is provided with a makeshift groove that cooperates with the elastic test component 25. The fixed plate 21 is provided with reinforcing ribs, the downward pressure drive device 22 is a slide motor, and a calibration downward pressure block 24 is also provided on the downward pressure connecting plate 23. The lowermost end of the calibration downward pressure block 24 is at the same height as the downward pressure block 24, the downward pressure drive device 22 is provided with a downward pressure displacement sensor, and the downward pressure connecting plate 23 is provided with a downward pressure sensing sheet that is compatible with the downward pressure sensor. The motor slider structure is used to control the elastic test component 25 to perform lifting and lowering movements. The structure is compact and easy to use, and it is convenient to control the downward pressure of the elastic test component 25, further improving the accuracy of the probe test.
[0027] In this embodiment, the elastic force testing assembly 25 includes a pressure sensor 251, a fixed block 252, a conductive connecting plate 253, a conductive fixing piece 254 and a test connector 255. One end of the pressure sensor 251 is fixedly connected to the lower pressing block 24, and the other end of the pressure sensor 251 is slidably connected to the fixed block 252. The fixed block 252 is connected to the conductive fixing piece 254. The conductive connecting plate 253 is arranged between the fixed block 252 and the conductive fixing piece 254. The test connector 255 passes through the conductive fixing piece 254 and is conductively connected to the conductive connecting plate 253. A slide groove is provided on the fixed block 252. The pressure sensor is guided and matched with the fixed block 252 through the slide groove to achieve rapid positioning and installation. The conductive connecting plate 253 is a PCB adapter board, and the conductive connecting plate 253 is connected to an external data analysis mechanism. The structural design in which the pressure sensor 251 and the conductive connecting plate 253 work together can simultaneously perform elastic force testing and impedance testing on the probe when pressing down, so that the tester can accurately observe the correlation between elastic force and impedance, providing a strong data basis for in-depth research on the probe.
[0028] In this embodiment, the visual module 3 includes a support frame 31, a visual two-axis adjustment platform 32, a visual Z-axis drive device 33, an industrial camera 34, and a lighting component 35. The support frame 31 is arranged on the substrate 1, the visual two-axis adjustment platform 32 is arranged on the support frame 31, the visual Z-axis drive device 33 is connected to the movable end of the visual two-axis adjustment platform 32, the industrial camera 34 and the lighting component 35 are both connected to the movable end of the visual Z-axis drive device 33, and the lighting component 35 is arranged below the industrial camera 34. The support frame 31 is a plate-type structure, the visual Z-axis drive device 33 is a push cylinder, and the lighting component 35 is a ring light. A three-axis adjustment structure is used to adjust the position of the industrial camera 34 and the lighting component 35. The alignment adjustment process further improves the test accuracy and achieves rapid alignment of the probe and the probe hole.
[0029] In this embodiment, the visual dual-axis adjustment platform 32 includes a visual X-axis adjustment unit 321 and a visual Y-axis adjustment unit 322. The visual X-axis adjustment unit 321 is arranged on the support frame 31, and the visual Y-axis adjustment unit 322 is connected to the output end of the visual X-axis adjustment unit 321. The visual Y-axis adjustment unit 322 is provided with a fixed frame 323, and the fixed frame 323 is connected to the visual Z-axis drive device 33. The visual X-axis adjustment unit 321 and the visual Y-axis adjustment unit 322 are both push cylinders, and the visual Y-axis adjustment unit 322 is provided with two groups of stop plates that limit the visual X-axis adjustment unit 321.
[0030] In this embodiment, the floating carrier module 4 includes a mounting plate 41, a floating carrier assembly 42, a Y-axis drive device 43, an X-axis drive device 44 and a needle block assembly 45. The mounting plate 41 slides with the substrate 1, and the floating carrier module 4 is arranged on the mounting plate 41. The Y-axis drive device 43 is arranged in the middle section of the mounting plate 41. The X-axis drive device 44 is connected to the movable end of the Y-axis drive device 43, and the needle block assembly 45 is connected to the movable end of the X-axis drive device 44. The floating carrier assembly 42 is guided by the needle block module. The mounting plate 41 is also provided with a limit member that limits the two groups of the stop blocks 5. The mounting plate 41 is also provided with a handle to facilitate the staff to push and pull the floating carrier module 4. The Y-axis drive device 43 and the X-axis drive device 44 are rotary motors, and the output ends of the Y-axis drive device 43 and the X-axis drive device 44 both adopt a screw transmission method. The XY dual-axis structure is used to drive the needle block to move, and the screw rod is used to move it. The rotary motor is set to achieve fine-tuning operation. The overall structure is compact and the transmission efficiency is high.
[0031] In this embodiment, the floating carrier assembly 42 includes a floating plate 421 and two groups of mounting seats 422, floating blocks 423, adjustment plates 424 and limiting screws 425 symmetrically arranged on the mounting plate 41. The two groups of floating blocks 423 are respectively connected to the two groups of mounting seats 422 in a floating manner. The two groups of adjustment plates 424 are respectively arranged at the upper ends of the two groups of mounting seats 422. The two groups of limiting screws 425 are respectively arranged on the two groups of adjustment plates 424. The floating plate 421 and the two groups of floating blocks 423 are respectively connected to the two groups of mounting seats 422 in a floating manner. The block 423 is fixedly connected and press-fitted with two sets of limit screws 425. The floating plate 421 is provided with a probe block that cooperates with the probe. The probe block is set in the probe hole. The mounting seat 422 is provided with a guide rail. The floating block 423 slides with the guide rail. A spring is provided between the floating block 423 and the mounting seat 422. The limit screws 425 are fixedly connected to the adjustment plate 424. The floating plate 421 is also provided with several guide blocks that cooperate with the needle block. The use of a floating carrier and the provision of a probe block that cooperates with the probe makes the overall structure suitable for production environments, and the test data is closer to the actual data, thereby improving test accuracy.
[0032] In this embodiment, the needle block assembly 45 includes a needle block plate 451, two groups of first guide posts 452, two groups of second guide posts 453, and a positioning member 454. The needle block plate 451 is disposed at the output end of the X-axis drive device 44. The two groups of first guide posts 452 and the two groups of second guide posts 453 are both disposed on the needle block plate 451 and guided and positioned with the floating plate 421. The positioning member 454 is disposed in the middle of the needle block plate 451 and is positioned and coordinated with the visual module 3. The positioning member 454 is a checkerboard visual alignment calibration member, having a plurality of equally divided rectangular grids within the positioning member 454. The positioning member 454 is made of opaque ceramic material. The two groups of first guide posts 452 and the two groups of second guide posts 453 are respectively guided and coordinated with the floating plate 421. The structural design with the grid-shaped positioning member 454 allows the probe to be guided and aligned with the grids in the positioning member 454 when eccentric positioning is required during visual positioning, resulting in precise control of test variables and improved test data validity.
[0033] In this embodiment, it also includes a base 6, an outer cover 7 and a control panel 8. The base 6 is connected to the substrate 1, the outer cover 7 is fixedly connected to the substrate 1, the control panel 8 is arranged on the outer cover 7, and the base 6 is provided with a plurality of foot cups and universal wheels 9.
[0034] Working principle of the present invention:
[0035] Before the test, the floating carrier module 4 is in the pulled-out state. The probe to be tested is installed on the needle block. The industrial camera 34 calibrates the probe position and records the concentricity of the probe and the probe block. The Y-axis drive device 43 and the X-axis drive device 44 respectively adjust and align the probe. After the alignment is completed, the floating carrier module 4 is pushed into the test position. After it is in place, the downward pressure drive device 22 drives the elastic test assembly 25 to press down, and the elastic force-impedance synchronous test is performed on the probe. During the process, the elastic force and impedance data of the probe are read in real time.
[0036] If the eccentricity value needs to be set during the test, the floating carrier module 4 is pulled out and the probe position is recalibrated, and the above operation is repeated.
[0037] Although the embodiments of the present invention are described with practical solutions, they do not limit the meaning of the present invention. For those skilled in the art, it is obvious to modify the implementation scheme and combine it with other solutions based on this description.
Claims
1. A probe high-precision synchronous testing mechanism, characterized by: It comprises a base plate (1), a downward pressure test module (2), a visual module (3) and a floating carrier module (4); the downward pressure test module (2) and the visual module (3) are both fixedly connected to the base plate (1); the floating carrier module (4) is slidably connected to the base plate (1); the floating carrier module (4) drives the product to reciprocate between the downward pressure test module (2) and the visual module (3); the floating carrier module (4) is positioned and matched with the visual module (3); the downward pressure test module (2) comprises a fixed plate (21), a downward pressure driving device (22), a downward pressure connecting plate (23), a downward pressure block (24) and an elastic force testing component (25); the fixed plate (21) is fixedly connected to the base plate (1); the downward pressure driving device (22) is arranged on the fixed plate (21); the downward pressure connecting plate (23) is connected to the downward pressure The output end of the driving device (22) is connected, the lower pressing block (24) is fixedly connected to the lower pressing connecting plate (23), and the lower pressing block (24) is provided with a clearance groove matched with the elastic test component (25); the visual module (3) includes a support frame (31), a visual dual-axis adjustment platform (32), a visual Z-axis driving device (33), an industrial camera (34) and a lighting component (35), the support frame (31) is arranged on the substrate (1), the visual dual-axis adjustment platform (32) is arranged on the support frame (31), the visual Z-axis driving device (33) is connected to the movable end of the visual dual-axis adjustment platform (32), the industrial camera (34) and the lighting component (35) are both connected to the movable end of the visual Z-axis driving device (33), and the lighting component (35) is arranged below the industrial camera (34); Integrated structural design of elastic force test module and impedance test module.
2. A probe high-precision synchronous testing mechanism according to claim 1, characterized in that: Two groups of stop blocks (5) are provided on the base plate (1), and the two groups of stop blocks (5) are limitedly matched with the floating carrier module (4).
3. The high-precision synchronous testing mechanism for probes according to claim 1, characterized in that: The elastic force test assembly (25) includes a pressure sensor (251), a fixed block (252), a conductive connecting plate (253), a conductive fixing member (254) and a test connector (255), one end of the pressure sensor (251) is fixedly connected to the lower pressing block (24), the other end of the pressure sensor (251) is slidably connected to the fixed block (252), the fixed block (252) is connected to the conductive fixing member (254), the conductive connecting plate (253) is arranged between the fixed block (252) and the conductive fixing member (254), and the test connector (255) passes through the conductive fixing member (254) and is conductively connected to the conductive connecting plate (253).
4. The high-precision synchronous testing mechanism for probes according to claim 1, characterized in that: The visual dual-axis adjustment platform (32) comprises a visual X-axis adjustment unit (321) and a visual Y-axis adjustment unit (322), wherein the visual X-axis adjustment unit (321) is arranged on the support frame (31), the visual Y-axis adjustment unit (322) is connected to the output end of the visual X-axis adjustment unit (321), and the visual Y-axis adjustment unit (322) is provided with a fixing frame (323), and the fixing frame (323) is connected to the visual Z-axis driving device (33).
5. The high-precision synchronous testing mechanism for probes according to claim 2, characterized in that: The floating carrier module (4) includes a mounting plate (41), a floating carrier assembly (42), a Y-axis drive device (43), an X-axis drive device (44) and a needle block assembly (45); the mounting plate (41) is slidably matched with the base plate (1); the floating carrier module (4) is arranged on the mounting plate (41); the Y-axis drive device (43) is arranged in the middle section of the mounting plate (41); the X-axis drive device (44) is connected to the movable end of the Y-axis drive device (43); the needle block assembly (45) is connected to the movable end of the X-axis drive device (44); the floating carrier assembly (42) is guided and matched with the needle block assembly (45); and a limiting member is further provided on the mounting plate (41) for limiting the two groups of the stop blocks (5).
6. A probe high-precision synchronous testing mechanism according to claim 5, characterized in that: The floating carrier assembly (42) includes a floating plate (421) and two groups of mounting seats (422), floating blocks (423), adjustment plates (424) and limiting screws (425) symmetrically arranged on the mounting plate (41). The two groups of floating blocks (423) are respectively connected to the two groups of mounting seats (422) in a floating manner. The two groups of adjustment plates (424) are respectively arranged at the upper ends of the two groups of mounting seats (422). The two groups of limiting screws (425) are respectively arranged on the two groups of adjustment plates (424). The floating plate (421) is fixedly connected to the two groups of floating blocks (423) and is press-fitted with the two groups of limiting screws (425).
7. The high-precision synchronous testing mechanism for probes according to claim 6, characterized in that: The needle block assembly (45) includes a needle block plate (451), two groups of first guide pillars (452), two groups of second guide pillars (453) and a positioning member (454). The needle block plate (451) is arranged on the output end of the X-axis drive device (44). The two groups of the first guide pillars (452) and the two groups of the second guide pillars (453) are both arranged on the needle block plate (451) and guided and positioned with the floating plate (421). The positioning member (454) is arranged in the middle of the needle block plate (451) and is positioned and matched with the visual module (3).
8. The high-precision synchronous testing mechanism for probes according to claim 1, characterized in that: It also includes a base (6), an outer cover (7) and a control panel (8), wherein the base (6) is connected to the base plate (1), the outer cover (7) is fixedly connected to the base plate (1), the control panel (8) is arranged on the outer cover (7), and the base (6) is provided with a plurality of foot cups and universal wheels (9).
Citation Information
Patent Citations
Pressure testing equipment
CN216208194U
Probe high-precision synchronous test mechanism
CN217953816U