Calibration module and its calibration and usage method

Abstract

The present invention relates to the field of reflection detection technology, and provides a calibration module and a calibration and use method thereof. The calibration module comprises: a three-dimensional calibrator; the three-dimensional calibrator comprises a microwave reflection layer and an optical reflection layer; the microwave reflection layer has a first calibration surface, and the optical reflection layer has a second calibration surface; the first calibration surface is divided into a plurality of first calibration areas, and the plurality of second calibration surfaces are divided into a plurality of second calibration areas, and the plurality of first calibration areas and the plurality of second calibration areas are arranged in a one-to-one correspondence; the module is used to reflect microwaves emitted by a synthetic aperture radar, and the optical reflection layer is used to reflect light toward optical imaging equipment; by arranging the microwave reflection layer and the optical reflection layer, the calibration module has both microwave reflection characteristics and optical reflection characteristics, thereby improving the efficiency and accuracy of the calibration of the detection equipment.

Description

Technical Field

[0001] The present invention relates to the field of reflection detection technology, and in particular to a calibration module and a calibration and use method thereof. Background Art

[0002] In the process of detecting parameters such as the distance and speed of the target, it is usually necessary to calibrate the detection equipment using a calibration target, or to calibrate separately through multiple calibration methods and then integrate them. The calibration process is cumbersome and the calibration accuracy is low. Summary of the Invention

[0003] The present invention provides a calibration module and a calibration and use method thereof, which are used to solve or improve the problems of cumbersome calibration and low calibration accuracy in the calibration process of existing detection equipment.

[0004] The present invention provides a calibration module, comprising: a three-dimensional calibrator, the three-dimensional calibrator comprising a microwave reflection layer and an optical reflection layer; the microwave reflection layer having a first calibration surface, and the optical reflection layer having a second calibration surface; the first calibration surface is divided into a plurality of first calibration areas, and the second calibration surface is divided into a plurality of second calibration areas, and the plurality of first calibration areas and the plurality of second calibration areas are arranged in a one-to-one correspondence; the microwave reflection layer is used to reflect microwaves emitted by a synthetic aperture radar, and the optical reflection layer is used to reflect light toward optical imaging equipment.

[0005] According to a calibration module provided by the present invention, the optical reflective layer is arranged on the microwave reflective layer, and the side of the microwave reflective layer facing the optical reflective layer is adhered to the optical reflective layer, and the corresponding first calibration area and second calibration area have the same shape and size.

[0006] According to the calibration module provided by the present invention, the optical reflective layer is bonded to the microwave reflective layer.

[0007] According to a calibration module provided by the present invention, the optical reflection layer and the microwave reflection layer are detachably connected.

[0008] According to a calibration module provided by the present invention, at least two of the plurality of first calibration areas have different microwave reflection characteristics.

[0009] According to a calibration module provided by the present invention, at least two of the plurality of second calibration areas have different optical reflection characteristics.

[0010] According to a calibration module provided by the present invention, the optical reflective layer forms a sealed cavity, and the microwave reflective layer is disposed in the cavity.

[0011] According to a calibration module provided by the present invention, the shape of the cavity includes: a regular tetrahedron, a regular hexahedron, a regular octahedron, a regular dodecahedron and a regular icosahedron.

[0012] The present invention also provides a calibration method for the calibration module as described above, comprising:

[0013] The calibration module is placed in the RCS standard measurement device to determine the RCS standard value of the first calibration surface on the three-dimensional calibrator;

[0014] The calibration module is placed in a standard measuring device for optical reflection spatial distribution characteristics to determine a standard value of the optical reflection spatial distribution characteristics of the second calibration surface on the three-dimensional calibrator.

[0015] The present invention also provides a method for using the calibration module as described above, comprising:

[0016] One or more calibrated calibration modules are placed in the environment where the target to be measured is located, and the synthetic aperture radar and the optical imaging equipment are calibrated by the calibration modules.

[0017] The calibration module and its calibration and use method provided by the present invention provide a microwave reflection layer and an optical reflection layer, so that the three-dimensional calibrator has both microwave reflection characteristics and optical reflection characteristics. When calibrating the three-dimensional calibrator, the three-dimensional calibrator is placed in an RCS standard device, and the RCS standard device is used to calibrate and calibrate each first calibration area on the first calibration surface, thereby obtaining the RCS standard value of each first calibration area on the first calibration surface; the three-dimensional calibrator is placed in an optical reflection distribution standard device, and the optical reflection distribution standard device is used to calibrate and calibrate each second calibration area on the second calibration surface, thereby obtaining the RCS standard value of each second calibration area on the second calibration surface. The optical diffuse reflectance standard value of the calibration area, that is, the microwave reflection characteristics and optical reflection characteristics of the three-dimensional calibrator are assigned values, thereby obtaining a three-dimensional calibrator with standard values. With the help of the three-dimensional calibrator with standard values, the synthetic aperture radar and optical imaging equipment can be calibrated simultaneously, reducing the calibration steps and eliminating the need for separate calibration and then fusion, thereby improving the efficiency and accuracy of calibration; at the same time, the three-dimensional calibrator has good versatility, especially when detecting three-dimensional targets. The three-dimensional calibrator can meet the calibration requirements from multiple dimensions, improve the calibration accuracy, and thus improve the detection accuracy of the synthetic aperture radar and optical imaging equipment after calibration. BRIEF DESCRIPTION OF THE DRAWINGS

[0018] In order to more clearly illustrate the technical solutions in the present invention or the prior art, a brief introduction is given below to the drawings required for use in the embodiments or the description of the prior art. Obviously, the drawings described below are some embodiments of the present invention. For ordinary technicians in this field, other drawings can be obtained based on these drawings without paying any creative work.

[0019] Figure 1 It is a structural schematic diagram of the three-dimensional calibrator provided by the present invention;

[0020] Figure 2 is a schematic diagram of the cross-sectional structure of the three-dimensional calibrator provided by the present invention;

[0021] Figure 3 It is a schematic flow chart of a calibration method for a three-dimensional calibrator provided by the present invention;

[0022] Figure 4 It is a flowchart of a method for using a three-dimensional calibrator provided by the present invention;

[0023] Reference numerals:

[0024] 1: 3D calibrator; 11: microwave reflection layer; 12: optical reflection layer. DETAILED DESCRIPTION

[0025] To make the objectives, technical solutions, and advantages of the present invention more clear, the technical solutions of the present invention will be clearly and completely described below in conjunction with the accompanying drawings. Obviously, the embodiments described are only some of the embodiments of the present invention, not all of them. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without making creative efforts shall fall within the scope of protection of the present invention.

[0026] In the description of the embodiments of the present invention, it should be noted that the terms "inner" and "outer" and the like, indicating orientations or positional relationships, are based on the orientations or positional relationships shown in the accompanying drawings and are intended solely to facilitate the description of the embodiments of the present invention and simplify the description. They do not indicate or imply that the devices or components referred to must have a specific orientation, be constructed, or operate in a specific orientation. Therefore, they should not be construed as limitations on the embodiments of the present invention. Furthermore, the terms "first," "second," and "third" are used for descriptive purposes only and should not be construed as indicating or implying relative importance.

[0027] In the description of the embodiments of the present invention, it should be noted that, unless otherwise specified or limited, the terms "connected" and "connection" should be understood in a broad sense. For example, they can refer to fixed connections, detachable connections, or integral connections; mechanical connections, electrical connections; and direct connections or indirect connections through an intermediary. Those skilled in the art will understand the specific meanings of the above terms in the embodiments of the present invention based on the specific circumstances.

[0028] The following combination Figures 1 to 4 The present invention describes a calibration module and its calibration and use method.

[0029] like Figure 1 and Figure 2 As shown, the calibration module shown in this embodiment includes: a three-dimensional calibrator 1.

[0030] The three-dimensional calibrator 1 includes a microwave reflecting layer 11 and an optical reflecting layer 12; the microwave reflecting layer 11 has a first calibration surface, and the optical reflecting layer 12 has a second calibration surface; the first calibration surface is divided into a plurality of first calibration areas, and the plurality of second calibration surfaces are divided into a plurality of second calibration areas, and the plurality of first calibration areas and the plurality of second calibration areas are arranged in a one-to-one correspondence; the microwave reflecting layer 11 is used to reflect microwaves emitted by a synthetic aperture radar, and the optical reflecting layer 12 is used to reflect light toward optical imaging equipment; wherein the first calibration surface is surrounded by a three-dimensional structure, and the second calibration surface is surrounded by a three-dimensional structure.

[0031] Specifically, the calibration module shown in this embodiment provides a microwave reflection layer 11 and an optical reflection layer 12, so that the three-dimensional calibrator 1 has both microwave reflection characteristics and optical reflection characteristics. When calibrating the three-dimensional calibrator 1, the three-dimensional calibrator 1 is placed in an RCS standard device, and the RCS standard device is used to calibrate each first calibration area on the first calibration surface, thereby obtaining the RCS standard value of each first calibration area on the first calibration surface; the three-dimensional calibrator 1 is placed in an optical reflection distribution standard device, and the optical reflection distribution standard device is used to calibrate each second calibration area on the second calibration surface, thereby obtaining the RCS standard value of each second calibration area on the second calibration surface. The optical diffuse reflectance standard value of the calibration area, that is, the microwave reflection characteristics and optical reflection characteristics of the three-dimensional calibrator are assigned values, thereby obtaining a three-dimensional calibrator with standard values. With the help of the three-dimensional calibrator with standard values, the synthetic aperture radar and optical imaging equipment can be calibrated simultaneously, reducing the calibration steps and eliminating the need for separate calibration and then fusion, thereby improving the efficiency and accuracy of the calibration. At the same time, the three-dimensional three-dimensional calibrator 1 has good versatility. Especially when detecting three-dimensional targets, the three-dimensional calibrator 1 can meet the calibration requirements from multiple dimensions, improve the calibration accuracy, and thus improve the detection accuracy of the synthetic aperture radar and optical imaging equipment after calibration.

[0032] It should be noted that the first calibration area is provided with a carbon powder layer or a hydroxy iron layer; when the first calibration area is provided with a carbon powder layer, the concentration of carbon powder in the carbon powder layer or the thickness of the carbon powder layer can be adjusted to change the reflectivity of the microwave reflection layer; when the first calibration area is provided with a hydroxy iron layer, the concentration of hydroxy iron in the hydroxy iron layer or the thickness of the hydroxy iron layer can be adjusted to change the reflectivity of the microwave reflection layer; Figure 1 In the figure, the microwave reflection layer is indicated by a dotted line, and the optical reflection layer is indicated by a solid line.

[0033] In some embodiments, as Figure 2 As shown, the optical reflective layer 12 shown in this embodiment is provided on the microwave reflective layer 11, and the side of the microwave reflective layer 11 facing the optical reflective layer 12 is adhered to the optical reflective layer 12, and the corresponding first calibration area and second calibration area have the same shape and size.

[0034] Specifically, the optical reflective layer 12 is completely attached to the microwave reflective layer 11, and the corresponding first calibration area and the corresponding second calibration area have the same shape and size, that is, the corresponding first calibration area and the corresponding second calibration area have the same boundary, thereby avoiding mutual interference between two adjacent first calibration areas and two adjacent second calibration areas during the assignment or calibration process.

[0035] The shapes of the first calibration area and the second calibration area include: triangle, quadrilateral, pentagon or hexagon, etc.; Figure 1 Pentagons and hexagons are shown.

[0036] It should be noted that, since the optical reflective layer 12 is attached to the microwave reflective layer 11, the area of ​​the second calibration area is theoretically slightly larger than that of the first calibration area. However, the thickness of the optical reflective layer 12 is relatively thin, so the effect of the thickness of the optical reflective layer on the area size of the second calibration area can be ignored. It can be assumed that the first calibration area and the second calibration area have the same shape and size, and thus have the same boundary.

[0037] In some embodiments, the optical reflective layer 12 shown in this embodiment is bonded to the microwave reflective layer 11 .

[0038] Specifically, a painting operation can be performed on the microwave reflection layer 11 to form the optical reflection layer 12 by spraying paint, thereby improving the convenience of manufacturing the optical reflection layer 12; the microwaves emitted by the synthetic aperture radar can pass through the optical reflection layer 12 and be reflected by the microwave reflection layer 11.

[0039] In some embodiments, the optical reflective layer 12 and the microwave reflective layer 11 shown in this embodiment are detachably connected.

[0040] Specifically, an optical reflector plate can be covered on the microwave reflective layer 11 to form an optical reflective layer 12. At the same time, different optical reflector plates can be flexibly replaced according to different calibration requirements; the microwaves emitted by the synthetic aperture radar can pass through the optical reflective layer 12 and be reflected by the microwave reflective layer 11.

[0041] In some embodiments, at least two of the multiple first calibration areas have different microwave reflection characteristics. It can be understood that the first calibration plane has at least two microwave reflection characteristics. Accordingly, after assigning values ​​to the multiple first calibration areas on the first calibration plane, the first calibration plane has multiple RCS standard values, making the calibration performance of the three-dimensional calibrator 1 more comprehensive, thereby improving the accuracy of synthetic aperture radar calibration.

[0042] In some embodiments, at least two of the multiple second calibration areas have different optical reflection characteristics. It can be understood that the second calibration surface has at least two optical reflection characteristics. Accordingly, after assigning values ​​to the multiple second calibration areas on the second calibration surface respectively, the second calibration surface has multiple optical diffuse reflection standard values, so that the calibration performance of the three-dimensional calibrator 1 is more comprehensive, thereby improving the calibration accuracy of the optical imaging equipment.

[0043] In some embodiments, as Figure 1 As shown, the optical reflective layer 12 forms a sealed cavity, and the microwave reflective layer 11 is disposed in the cavity.

[0044] Specifically, the optical reflective layer 12 forms a cube, making the entire three-dimensional calibrator 1 three-dimensional. Correspondingly, the microwave reflective layer 11 and the optical reflective layer are arranged opposite to each other, so the microwave reflective layer 11 as a whole is also three-dimensional. Therefore, when detecting three-dimensional targets, the three-dimensional calibrator 1 can meet the calibration requirements of synthetic aperture radar and optical imaging equipment from multiple dimensions.

[0045] In order to ensure the stability of the microwave reflecting layer 11 and the optical reflecting layer 12 , a skeleton is provided in the microwave reflecting layer 11 , the microwave reflecting layer 11 is attached to the skeleton, and the optical reflecting layer 12 is provided on the microwave reflecting layer 11 .

[0046] Furthermore, the existing corner reflector can be modified by sequentially setting a microwave reflection layer 11 and an optical reflection layer 12 on each reflecting surface of the corner reflector, so that the modified corner reflector has both microwave reflection characteristics and optical reflection characteristics, and can simultaneously calibrate the synthetic aperture radar and optical imaging equipment, reducing the calibration steps and eliminating the need for separate calibration and then fusion, thereby improving the efficiency and accuracy of the calibration.

[0047] In some embodiments, the cavity formed by the optical reflective layer 12 may have a shape including a regular tetrahedron, a regular hexahedron, a regular octahedron, a regular dodecahedron, and a regular icosahedron.

[0048] Specifically, by setting the optical reflective layer 12 into a regular polyhedron, the shape of the three-dimensional calibrator 1 is more uniform, thereby being able to meet the calibration requirements of synthetic aperture radar and optical imaging equipment from multiple angles and avoiding calibration blind spots; in addition to setting the shape of the cavity to a regular polyhedron, a polyhedron of corresponding shape can also be set according to the actual calibration environment.

[0049] like Figure 3 As shown, the present invention also embodies a calibration method for the calibration module as described above, comprising:

[0050] S310: placing the calibration module in an RCS standard measurement device to determine an RCS standard value of a first calibration surface on the three-dimensional calibrator.

[0051] S320 , placing the calibration module in a standard measurement device for optical reflection spatial distribution characteristics, and determining a standard value of the optical reflection spatial distribution characteristics of a second calibration surface on the three-dimensional calibrator.

[0052] By assigning values ​​to a plurality of first calibration areas on the first calibration plane and assigning values ​​to a plurality of second calibration areas on the second calibration plane, the calibration module becomes a calibrator with standard values.

[0053] like Figure 4 As shown, the present invention also provides a method for using the calibration module as described above, comprising:

[0054] S410: placing one or more calibrated calibration modules in the environment where the target to be measured is located, and calibrating the synthetic aperture radar and the optical imaging equipment through the calibration modules.

[0055] Since the calibration module has both microwave reflection characteristics and optical reflection characteristics, the synthetic aperture radar and optical imaging equipment can be calibrated without replacing the calibration module. No fusion calculation is required, which improves the efficiency and accuracy of the calibration. The calibrated synthetic aperture radar and optical imaging equipment are used to detect the object to be tested.

[0056] Finally, it should be noted that the above embodiments are only used to illustrate the technical solutions of the present invention, rather than to limit it. Although the present invention has been described in detail with reference to the aforementioned embodiments, those skilled in the art should understand that they can still modify the technical solutions described in the aforementioned embodiments, or make equivalent replacements for some of the technical features therein. However, these modifications or replacements do not deviate the essence of the corresponding technical solutions from the spirit and scope of the technical solutions of the various embodiments of the present invention.

Claims

1. A calibration module, characterized in that: include: A three-dimensional scaler, comprising a microwave reflective layer and an optical reflective layer; The microwave reflective layer has a first calibration surface, and the optical reflective layer has a second calibration surface; the first calibration surface is divided into a plurality of first calibration areas, and the second calibration surface is divided into a plurality of second calibration areas, and the plurality of first calibration areas are arranged in a one-to-one correspondence with the plurality of second calibration areas; The microwave reflection layer is used to reflect microwaves emitted by the synthetic aperture radar, and the optical reflection layer is used to reflect light toward optical imaging equipment.

2. The calibration module according to claim 1, wherein: The optical reflective layer is provided on the microwave reflective layer, and the side of the microwave reflective layer facing the optical reflective layer is adhered to the optical reflective layer. The corresponding first calibration area and the second calibration area have the same shape and size.

3. The calibration module according to claim 2, characterized in that: The optical reflective layer is bonded to the microwave reflective layer.

4. The calibration module according to claim 2, characterized in that: The optical reflective layer and the microwave reflective layer are detachably connected.

5. The calibration module according to claim 1, characterized in that: At least two of the plurality of first calibration areas have different microwave reflection characteristics.

6. The calibration module according to claim 1, characterized in that: At least two of the plurality of second calibration areas have different optical reflection characteristics.

7. The calibration module according to claim 1, characterized in that: The optical reflection layer forms a sealed cavity, and the microwave reflection layer is arranged in the cavity.

8. The calibration module according to claim 7, characterized in that: The shape of the cavity is one of a regular tetrahedron, a regular hexahedron, a regular octahedron, a regular dodecahedron and a regular icosahedron.

9. A calibration method for a calibration module according to any one of claims 1 to 8, characterized in that: include: The calibration module is placed in the RCS standard measurement device to determine the RCS standard value of the first calibration surface on the three-dimensional calibrator; The calibration module is placed in a standard measuring device for optical reflection spatial distribution characteristics to determine a standard value of the optical reflection spatial distribution characteristics of the second calibration surface on the three-dimensional calibrator.

10. A method for using the calibration module according to any one of claims 1 to 8, characterized in that: include: One or more calibrated calibration modules are placed in the environment where the target to be measured is located, and the synthetic aperture radar and the optical imaging equipment are calibrated by the calibration modules.

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