Electronic component testing handler and control method thereof

Abstract

The present invention relates to an electronic component test handler. Specifically, according to an embodiment of the present invention, the electronic component test handler includes a plurality of first trays including a first loading tray and a first unloading tray movable in a first direction in a first tray area, a transfer hand capable of loading electronic components onto the first trays or unloading the loaded electronic components from the first trays, at least one second tray capable of being placed in a second tray area adjacent to the first tray area, the second tray including a second loading tray and a second unloading tray capable of housing the electronic components, and a hand moving between the first tray area and the second tray area, the hand including at least one of a picker unit capable of transferring the electronic components from one of the first trays and the second trays to the other and an opening and closing unit capable of selectively opening and closing sockets provided in the second tray.

Description

TECHNICAL FIELD

[0001] The present application relates to an electronic component test handler and a control method thereof. BACKGROUND

[0002] A test handler is a machine that supports testing of electronic components such as semiconductor devices manufactured through a prescribed manufacturing process and classifying the grades of the electronic components according to the test results. Such a test handler can test electronic components such as semiconductor devices by electrically connecting the electronic components to a tester.

[0003] On the other hand, the existing test handler places the electronic components seated on a shuttle in a test socket to test the electronic components, and electrically connects the electronic components loaded in the test socket to the tester. In addition, the existing test socket has a space in which the electronic components are seated formed inside, and the space is opened and closed by a cover.

[0004] On the other hand, the space formed in the test socket needs to be opened to seat the electronic components, and if the electronic components are seated, it needs to be closed again to perform the test. However, in order to open and close the space formed in the test socket as needed, it is difficult for a user to open the cover one by one. In addition, when a plurality of test sockets are provided to test a plurality of electronic components at the same time, the workload of the user is overloaded, and thus the time of the test process is prolonged.

[0005] Therefore, there is a need for an electronic component test handler capable of automatically opening and closing the test socket and simultaneously opening and closing a plurality of test sockets. SUMMARY

[0006] Technical Problem to be Solved

[0007] An embodiment of the present application has been made in view of the above background, and it is an object of the present application to provide an electronic component test handler capable of automatically opening and closing a test socket and simultaneously opening and closing a plurality of test sockets.

[0008] In addition, it is an object of an embodiment of the present application to provide an electronic component test handler capable of automatically opening and closing a test socket, reducing the workload of a user, and shortening the time of a process.

[0009] Means for Solving Technical Problem

[0010] According to an aspect of the present application, an electronic component test handler can be provided, including: a plurality of first trays including a first loading tray and a first unloading tray movable in a first direction in a first tray area; a transfer hand capable of loading electronic components onto the first trays or unloading the loaded electronic components from the first trays; at least one second tray capable of being placed in a second tray area adjacent to the first tray area, the second tray including a second loading tray and a second unloading tray capable of housing the electronic components; and a hand moving between the first tray area and the second tray area, the hand including at least one of a picker unit capable of transferring the electronic components from one of the first trays and the second trays to the other, and an opening and closing unit capable of selectively opening and closing sockets provided in the second tray; the transfer hand transfers the electronic components, loads the electronic components onto the first loading tray, and unloads the electronic components housed in the first unloading tray, the hand transfers the electronic components housed in the first loading tray and loads onto the second loading tray, and unloads the electronic components housed in the second unloading tray and transfers onto the first unloading tray.

[0011] Further, an electronic component test handler can be provided, including: a buffer stage provided at one side of the first tray area in the first direction and capable of housing the electronic components; a stacker including a customer tray capable of housing the electronic components loaded thereon; a tray cart including a plurality of the second trays loaded thereon; a tray transfer capable of transferring a plurality of the second trays from one of the second tray area and the tray cart to the other; and a control part capable of controlling the transfer hand, the hand, and the tray transfer, the control part transferring the electronic components from the customer tray loaded on the stacker to the buffer stage, controlling the transfer hand to transfer the electronic components housed in the buffer stage and load onto the first loading tray, the control part controlling the hand to transfer the electronic components from the first loading tray and load onto the second loading tray placed in the second tray area, and the control part controlling the tray transfer to transfer the second loading tray having the electronic components housed therein from the second tray area to the tray cart.

[0012] Further, the present application can provide an electronic component testing and sorting machine, including: a buffer stage provided at one side of the first tray area in the first direction, capable of placing the electronic components; a stacking machine on which a customer tray capable of mounting the electronic components is loaded; a tray cart on which a plurality of the second trays are loaded; a tray transfer device capable of transferring a plurality of the second trays from one of the second tray area and the tray cart to the other; and a control unit capable of controlling the transfer hand, the hand, and the tray transfer device, the control unit controlling the tray transfer device to transfer the second unloading tray from the tray cart to the second tray area, the control unit controlling the hand to unload and transfer electronic components from the second unloading tray placed in the second tray area to the first unloading tray, the control unit controlling the transfer hand to unload and transfer electronic components from the first unloading tray to the buffer stage, and to transfer the electronic components placed on the buffer stage to the customer tray loaded on the stacking machine.

[0013] Further, the present application can provide an electronic component testing and sorting machine, further including: a first tray guide and a second tray guide, the first tray guide and the second tray guide being capable of guiding a plurality of the first trays to move in the first direction, the first tray guide movably supporting any one of the plurality of the first trays, the second tray guide being provided spaced apart from the first tray guide in a second direction deviated from the first direction, and movably supporting another one of the plurality of the first trays, one of the first trays being provided above the other one of the first trays so that one of the first trays can move independently of the other one of the first trays.

[0014] Further, the present application can provide an electronic component testing and sorting machine, further including: a buffer stage provided at one side of the first tray area in the first direction, capable of placing the electronic components, the buffer stage including: a first buffer portion provided at a prescribed position within a gripping area in which the transfer hand is capable of being placed; and a second buffer portion capable of moving from one of a disengaging area in which the transfer hand is incapable of being placed and the gripping area to the other, the second buffer portion being configured to be movable in the first direction from an upper side of the first buffer portion.

[0015] Further, the present application can provide an electronic component testing handler, wherein the first tray includes: a pocket support movable in the first direction; a pocket table having a hanging area protruding to a lateral side, the pocket table being replaceably supported on the pocket support; and an anti-disengagement portion being placeable in any one of a fixed position and a free position, at least a portion of the fixed position being located on the hanging area such that the pocket table does not disengage from the pocket support, the free position allowing the pocket table to disengage from the pocket support.

[0016] Further, the present application can provide an electronic component testing handler, wherein the hand includes the opening and closing unit, the opening and closing unit including: a hook portion; and a support portion spaced apart from the hook portion and opposite to the hook portion, the hook portion and the support portion each being configured to approach or move away from each other to open and close the socket.

[0017] Further, the present application can provide an electronic component testing handler, including: a first tray movable in a first direction within a first tray area; a second tray placeable on a second tray area adjacent to the first tray area in a second direction deviated from the first direction, the second tray including a socket in which an electronic component is mountable; a hand capable of transferring the electronic component from one of the first tray and the second tray to the other; and a hand transferer capable of transferring the hand in the first direction, the hand including: a hand body supported by the hand transferer; a picker unit including a picker body supported on the hand body to move in the second direction between the first tray area and the second tray area, and a plurality of pickers capable of individually raising and lowering the picker body; and an opening and closing unit capable of selectively opening and closing the socket while raising and lowering the hand body supported by the hand body.

[0018] Further, the present application can provide a control method of an electronic component test handler, including: a first tray processing step of loading electronic components onto a first tray on which a transfer hand can move in a first direction in a first tray area, or unloading the loaded electronic components from the first tray; and a second tray processing step of moving the hand between a second tray area adjacent to the first tray area and the first tray area, and transferring the electronic components from one of the first tray and the second tray to the other, in the first tray processing step, the transfer hand transfers the electronic components and loads on a first loading tray, unloads electronic components disposed on a first unloading tray, in the second tray processing step, the hand transfers the electronic components disposed on the first tray and loads on a second loading tray, unloads the electronic components disposed on a second unloading tray and transfers to the first unloading tray, an opening and closing unit selectively opens and closes sockets provided in the second tray.

[0019] Further, the present application can provide a control method of an electronic component test handler, further including: a buffer loading step of the transfer hand transferring electronic components from a customer tray loaded on a stacker and loading on a buffer stage; and a cart loading step of a tray transferer transferring the second loading tray on which the electronic components are disposed from the second tray area to a tray cart, the first tray processing step includes a first tray loading step in which the transfer hand transfers the electronic components disposed on the buffer stage and loads on the first loading tray, the second tray processing step includes a second tray loading step in which the hand transfers electronic components from the first loading tray and loads on the second loading tray disposed in the second tray area.

[0020] Further, the present application can provide a control method of an electronic component test handler, further including: a buffer loading step of the transfer hand transferring electronic components from a customer tray loaded on a stacker and loading on a buffer stage; and a cart loading step of a tray transferer transferring the second loading tray on which the electronic components are disposed from the second tray area to a tray cart, the first tray processing step includes a first tray loading step in which the transfer hand transfers the electronic components disposed on the buffer stage and loads on the first loading tray, the second tray processing step includes a second tray loading step in which the hand transfers electronic components from the first loading tray and loads on the second loading tray disposed in the second tray area.

[0021] Effects of the Invention

[0022] According to an embodiment of the present application, the test socket can be automatically opened and closed, and multiple test sockets can be simultaneously opened and closed.

[0023] In addition, according to an embodiment of the present application, the test socket can be automatically opened and closed, thereby reducing the workload of a user and shortening the engineering time.

[0024] Brief Description of the Drawings

[0025] Figure 1 is a conceptual diagram showing an electronic component testing handler according to an embodiment of the present application;

[0026] Figure 2 is Figure 1 a perspective view of a stacker, a buffer stage, a transfer hand, and a hand transfer device of

[0027] Figure 3 is Figure 2 an enlarged view of a portion A of

[0028] Figure 4 is Figure 2 a bottom perspective view of the transfer hand of

[0029] Figure 5 is Figure 1 perspective views and an enlarged view of a portion of a first tray, a second tray, and a hand of

[0030] Figure 6 is an enlarged view showing a state in which a plurality of first trays of Figure 5 overlap each other in a vertical direction;

[0031] Figure 7 is Figure 6 a side view of

[0032] Figure 8 is Figure 5 a plan view of

[0033] Figure 9 is Figure 8 an enlarged view of B of

[0034] Figure 10 is Figure 5 a partial bottom perspective view of the hand of

[0035] Figure 11 is Figure 10 perspective views and an enlarged view of a portion of an opening and closing unit of

[0036] Figure 12 is Figure 11 a bottom perspective view of

[0037] Figure 13 is Figure 11a front view of the main body of the electronic component test handler according to an embodiment of the present application;

[0038] Figure 14 is Figure 10 a perspective view of the picker unit of the electronic component test handler according to an embodiment of the present application;

[0039] Figure 15 is Figure 5 a diagram sequentially showing opening steps of the socket disposed in the second tray according to an embodiment of the present application;

[0040] Figure 16 is Figure 15 a diagram sequentially showing opening steps of the socket disposed in the second tray according to an embodiment of the present application;

[0041] Figure 17 is Figure 5 a diagram sequentially showing closing steps of the socket disposed in the second tray according to an embodiment of the present application;

[0042] Figure 18 is Figure 17 a diagram sequentially showing closing steps of the socket disposed in the second tray according to an embodiment of the present application;

[0043] Figure 19 is a flowchart illustrating a control method of an electronic component test handler according to an embodiment of the present application;

[0044] Figure 20 is a flowchart specifically illustrating the opening steps and the closing steps of the electronic component test handler according to an embodiment of the present application. Figure 19 DETAILED DESCRIPTION BEST MODE FOR CARRYING OUT THE INVENTION

[0045] Hereinafter, specific embodiments for carrying out the technical idea of the present application will be described in detail with reference to the accompanying drawings.

[0046] Further, in the description of the present application, if it is determined that a detailed description of a related known configuration or function can obscure the gist of the present application, a detailed description thereof will be omitted.

[0047] In addition, when it is mentioned that a certain component is "connected" or "supported" to another component, it can be directly connected to the other component and supported by the other component, but it should be understood that other components can be interposed therebetween.

[0048] The terms used herein are only used to explain specific embodiments and do not limit the present application. Unless the context clearly indicates otherwise, singular expressions include plural expressions.

[0049] In addition, terms including ordinal numbers such as first, second, etc. can be used to describe various components, but the corresponding components are not limited by the terms. The terms are used only to distinguish one component from another component.

[0050] The meaning of "include" used herein specifically means that a specific feature, region, integer, step, operation, element, and / or component is included; but does not exclude the presence or addition of other specific features, regions, integers, steps, operations, elements, and / or components.

[0051] Further, in the present specification, the expressions of upper side, lower side, and the like are explained with reference to the drawings, and it is to be noted in advance that there can be different expressions when the direction of the corresponding object is changed. On the other hand, in the present specification, the first direction can be the x-axis direction of Figure 1 、 Figure 2 and Figure 5 , and the second direction can be the y-axis direction of Figure 1 、 Figure 2 and Figure 5 . Further, the vertical direction can be the z-axis direction of Figure 1 、 Figure 2 and Fig. 5.

[0052] The detailed configuration of an electronic component test handler 1 according to an embodiment of the present application will be described below with reference to the drawings.

[0053] Hereinafter, with reference to Figure 1 and Figure 2 , an electronic component test handler 1 according to an embodiment of the present application can electrically connect electronic components (not shown) manufactured through predetermined manufacturing processes to a tester, and then can classify the electronic components according to test results. For example, the electronic components can be semiconductor devices. Further, the electronic component test handler 1 can be manufactured in various forms to be optimized for the type of electronic components to be tested. The electronic component test handler 1 can be combined with a tester (not shown) capable of testing electronic components, and can electrically connect the electronic components to the tester. The electronic component test handler 1 can include a frame 100, a stacking machine 200, a buffer stage 300, a transfer hand 400, a shuttle 500, a second tray 600, a hand 700, a hand transfer 800, a tray transfer 900, a tray cart 1000, and a control part 1100.

[0054] The frame 100 can support the stacking machine 200, the transfer hand 400, the shuttle 500, the second tray 600, the hand 700, the hand transfer 800, the tray transfer 900, the tray cart 1000, and the control part 1100. The frame 100 can provide a space to transfer a customer tray CT. Further, the frame 100 can include a conveyor belt (not shown) capable of transferring the customer tray CT from the stacking machine 200 to a position adjacent to the transfer hand 400.

[0055] The stacker 200 can store a customer tray CT loaded with electronic components. The stacker 200 can be supported by the frame 100. In addition, the customer tray CT loaded on the stacker 200 can be moved to a position adjacent to the transfer hand 400 by a conveyor.

[0056] Referring to Figure 1 and Figure 3 , the buffer stage 300 can temporarily load electronic components. In addition, the buffer stage 300 can be disposed at one side (e.g., the left side) of the first tray area TP1 in the first direction. The buffer stage 300 can include a first buffer portion 310 and a second buffer portion 320. Figure 1

[0057] The first buffer portion 310 can be disposed at a prescribed position within a holding area HP and can be fixed to the frame 100. The holding area HP refers to an area in which the transfer hand 400 can be placed. That is, when the first buffer portion 310 is disposed on the holding area HP, the transfer hand 400 can be moved to an upper side of the first buffer portion 310, and electronic components can be held by or released from the first buffer portion 310.

[0058] The second buffer portion 320 can be moved from one of a disengagement area FP and the holding area HP to the other. The disengagement area FP refers to an area in which the transfer hand 400 cannot be placed. That is, the disengagement area FP is an area outside a moving radius of the transfer hand 400, and when the second buffer portion 320 is disposed in the disengagement area FP, the transfer hand 400 cannot reach the second buffer portion 320. The second buffer portion 320 can be supported by a buffer guide to move in the second direction along the buffer guide disposed in the frame 100. For example, the second buffer portion 320 can be moved in the second direction toward the holding area HP so that the transfer hand 400 can reach. As a more detailed example, the second buffer portion 320 can be moved in the second direction from an upper side of the first buffer portion 310, and when disposed on the holding area HP, the second buffer portion 320 can overlap the upper side of the first buffer portion 310.

[0059] On the other hand, the buffer stage 300 can further include a buffer brake (not shown) capable of moving the second buffer portion 320 in the second direction.

[0060] Referring to Figure 2 and Figure 4 ​The transfer hand 400 can transfer the electronic component loaded on the buffer table 300 to the shuttle 500. The transfer hand 400 can move between the buffer table 300 and the customer tray CT to transfer the electronic component. Also, the transfer hand 400 can move in at least one of the first direction and the second direction by the hand transferer 800. The transfer hand 400 can include a gripping portion 410 to grip the electronic component. The gripping portion 410 can grip by adsorbing the electronic component, and can provide one or more.

[0061] On the other hand, the gripping portion 410 can be configured to be rotatable about an imaginary axis extending in the vertical direction. When the electronic component placed on the customer tray CT in one direction needs to be seated on the second tray 600 in another direction different from the one direction, the gripping portion 410 can rotate after gripping the electronic component. For example, the gripper 410 is seated on the customer tray CT such that the terminal of the electronic component faces in one direction, and when the terminal formed in the receptacle 620 faces in another direction, the terminal of the electronic component can be rotated to face in the other direction. Accordingly, the terminal of the electronic component can be connected to the terminal in the receptacle 620 while being placed on the second tray 600 in the other direction. As another example, when the gripping portion 410 transfers the rectangular electronic component elongated in one direction, the gripping portion 410 can rotate the electronic component to correspond to the shape of the receptacle 620 and then seat the electronic component on the receptacle 620.

[0062] Referring to Figure 1 and Figure 5 The shuttle 500 can transfer the electronic component from the transfer hand 400 side to the hand 700 side. Also, the shuttle 500 can include a first tray 501 movable in the first direction in the first tray area TP1. In the present specification, the first tray area TP1 refers to an area in which the first tray 501 is capable of moving in the first direction. A plurality of the first tray 501 can be provided, and the plurality of first trays 501 can include a first loading tray 510 and a first unloading tray 520.

[0063] The first loading tray 510 can be the first tray 501 in which the untested electronic component is seated among the plurality of first trays 501. That is, the electronic component seated on the buffer table 300 before testing can be loaded on the first loading tray 510 by the transfer hand 400. In the present specification, the first loading tray area LTP1 refers to an area in which the first loading tray 510 moves in the first tray area TP1. The first loading tray 510 can move in the first direction along the tray guide 530 described below. Also, referring to Figure 6 and Figure 7A plurality of first loading trays 510 can be provided, and the plurality of first loading trays 510 can have a height difference from each other. In other words, one of the plurality of first loading trays 510 can be disposed on an upper side of another to move independently of the other. Accordingly, the plurality of first loading trays 510 do not interfere with each other and can move in opposite directions.

[0064] The first unloading tray 520 can be a tray in which the electronic components for which the test is completed among the plurality of first trays 501 are seated. That is, after the test, the electronic components seated on the second tray 600 can be unloaded by the hand 700 and transferred to the first unloading tray 520. In this specification, the first unloading tray area UTP1 refers to an area in which the first unloading tray 520 among the first trays 501 moves. The first unloading tray 520 can move in a first direction along the second tray guide rail 532 described below. In addition, a plurality of first unloading trays 520 can be provided, and the plurality of first unloading trays 520 can have a height difference from each other. In other words, one of the plurality of first unloading trays 520 can be disposed on an upper side of another to move independently of the other. Accordingly, the plurality of first unloading trays 520 do not interfere with each other and can move in opposite directions.

[0065] On the other hand, with reference to Figure 8 and Figure 9 The first loading tray 510 and the first unloading tray 520 can include a pocket stage 511, a pocket support 512, and an anti-disengagement portion 513, respectively.

[0066] The pocket stage 511 can provide a space in which a plurality of electronic components are loaded. The pocket stage 511 can be replaceably supported on the pocket support 512. In addition, the pocket stage 511 can be disposed on an upper side of the pocket support 512. For example, the pocket stage 511 can have at least one hanging area 511a protruding to a side.

[0067] The pocket support 512 can move in a first direction along the tray guide rail 530. The pocket support 512 can support the pocket stage 511.

[0068] The anti-disengagement portion 513 can prevent the pocket stage 511 supported by the pocket support 512 from being disengaged from the pocket support 512. A fixing area 513a that can interfere with the hanging area 511a can be formed in the anti-disengagement portion 513. For example, the fixing area 513a can be formed to protrude from the anti-disengagement portion 513 in the first direction. In addition, the anti-disengagement portion 513 can be placed on one of a fixed position and a free position. Among them, as Figure 9As shown, the free position of the anti-disengagement portion 513 refers to a position in which the fixed portion 513a is not provided on the upper side of the hanging area 511a, and the pocket table 511 can be replaced from the pocket support 512. In addition, the fixed position of the anti-disengagement portion 513 refers to a position in which the fixed portion 513a of the anti-disengagement portion 513 is positioned on the upper side of the hanging area 511a, so that the pocket table 511 does not disengage from the pocket support 512. Although not shown in the present specification, the anti-disengagement portion 513 can be moved in a second direction to move from the free position to the fixed position. The anti-disengagement portion 513 can be slidably supported on the pocket support 512. In addition, a ball plunger can be formed in the anti-disengagement portion 513, and the movement of the anti-disengagement portion 513 can be guided by a guide member, such as a bolt and a ball plunger, provided in the pocket support 512.

[0069] Referring again to Figure 5 , the tray guide 530 can guide the movement of the plurality of first loading trays 510 in the first direction. In addition, the tray guide 530 can slidably support the first loading tray 510 and the first unloading tray 520. The tray guide 530 can include a first tray guide 531 and a second tray guide 532.

[0070] The first tray guide 531 can guide the movement of the first loading tray 510, which is disposed on the upper side of another first loading tray 510, among the plurality of first loading trays 510. In addition, a plurality of first tray guides 531 can be provided, and the plurality of first tray guides 531 can respectively support the first loading tray 510 and the first unloading tray 520. For example, the first tray guide 531 placed on the first loading tray area LTP1 can have a length different from that of the first tray guide 531 placed on the first unloading tray area UTP1.

[0071] The second tray guide 532 can guide the movement of the first loading tray 510, which is disposed on the lower side of another first loading tray 510, among the plurality of first loading trays 510. In addition, a plurality of second tray guides 532 can be provided, and the plurality of second tray guides 532 can respectively support the first loading tray 510 and the first unloading tray 520. For example, the second tray guide 532 placed on the first loading tray area LTP1 can have a length different from that of the second tray guide 532 placed on the first unloading tray area UTP1.

[0072] Thus, since the area in which the first loading tray 510 moves and the area in which the first unloading tray 520 moves are different, the tray guide 530 placed on the first loading tray area LTP1 and the tray guide 530 placed on the first unloading tray area UTP1 can have different lengths. Accordingly, there is an effect of minimizing the space in which the tray guide 530 is placed and reducing costs.

[0073] Referring again to FIG. 6, Figure 1 The second tray 600 can provide a space in which a plurality of electronic components are seated, and can fixedly support the plurality of electronic components. The second tray 600 can be placed on the second tray area TP2. In the present specification, the second tray area TP2 is an area in which the second tray 600 is disposed, and refers to an area adjacent to the first tray area TP1. Also, the second tray 600 can be provided in plurality, and can include a second loading tray 601 and a second unloading tray 602.

[0074] The second loading tray 601 can be a second tray 600 in which an untested electronic component is seated, among the plurality of second trays 600. That is, the electronic component seated on the first loading tray 510 can be loaded onto the second loading tray 601 by the hand 700. In the present specification, the second loading tray area LTP2 refers to an area in which the second loading tray 601 is placed in the second tray area TP2.

[0075] The second unloading tray 602 can be a second tray 600 in which a tested electronic component is seated, among the plurality of second trays 600. That is, the electronic component seated on the second tray 600 can be unloaded and transferred to the first unloading tray 520 by the hand 700. In the present specification, the second unloading tray area UTP2 refers to an area in which the second unloading tray 602 is placed in the second tray area TP2.

[0076] On the other hand, the second tray 600 can include a tray plate 610 and a socket 620.

[0077] The tray plate 610 can support a plurality of sockets 620. A plurality of the tray plate 610 can be provided. For example, in order to connect one of the plurality of tray plates 610 to a tester to seat an electronic component during testing, the tray plate 610 can be placed in a loading position.

[0078] The socket 620 can provide a space in which an electronic component is seated, and selectively expose the seated electronic component to the outside. Also, a plurality of the socket 620 can be provided. For example, the socket 620 can be a clamshell socket. The socket 620 can include a latch 621, a cover 622, and a seating portion 623.

[0079] The latch 621 can be rotatably connected to the seating portion 623. The latch 621 can prevent the cover 622 from rotating and can rotate together with the cover 622. For example, when the latch 621 rotates within a prescribed angle range, the cover 622 is in a closed state, and when the latch 621 rotates out of the prescribed angle range, the cover 622 can be in an open state. In addition, the latch 621 can be placed in a fixed position not to rotate by the hook portion 130 while maintaining the cover 622 in the closed state, and can rotate by the hook portion 130 to escape from the fixed position. The latch 621 can maintain the cover 622 in the closed state even in the fixed position, and in addition, even if it escapes from the fixed position, the cover 622 can be maintained in the closed state if the degree of rotation is within the above-described prescribed angle range. When the latch 621 rotates out of the prescribed angle range, the support of the cover 622 can be released.

[0080] The cover 622 can be rotatably connected to the seating portion 623. In addition, the cover 622 can be placed in one of an open state and a rotating state by rotation of the latch 621. Among them, the open state of the cover 622 means a state in which at least a part of the seating portion 623 is open to the outside, and an electronic component seated on the seating portion 623 is exposed to the outside. In addition, the closed state of the cover 622 means a state in which the seating portion 623 is closed to the outside, and an electronic component seated on the seating portion 623 is cut off from the outside.

[0081] The seating portion 623 rotatably supports the latch 621 and the cover 622, and can provide a space to seat an electronic component.

[0082] Reference Figure 10 to Figure 12 The hand 700 can transfer an electronic component seated on the shuttle 500 to the second tray 600, and can transfer an electronic component seated on the second tray 600 to the shuttle 500. The hand 700 can grip an electronic component, and can selectively open the socket 620 of the second tray 600. In addition, the hand 700 can move on the second tray area TP2 in the first direction by the hand mover 800. The hand 700 can include an opening and closing unit 710, a picker unit 720, a hand body 730, a guide portion 740, and a driving portion 750.

[0083] The opening and closing unit 710 can selectively open and close the receptacle 620 of the second tray 600. Also, the opening and closing unit 710 can be supported by the hand body 730 and can move in a vertical direction along the first guide 741. Also, the opening and closing unit 710 can move in the first direction by the hand mover 800. In this case, the opening and closing unit 710 is supported by the hand body 730 and can move in the first direction integrally with the picker unit 720. The opening and closing unit 710 can include a body part 711, a guide part 712, a hook part 713, a support part 714, and an open brake 715.

[0084] The body part 711 can support the guide part 712, the hook part 713, the support part 714, and the open brake 715. The body part 711 can move in a vertical direction along the first guide 741.

[0085] The guide part 712 can guide movement of the hook part 713 and the support part 714. The guide part 712 can be disposed on a bottom surface of the body part 711. Also, the guide part 712 can include a first guide 712a and a second guide 712b.

[0086] The first guide 712a can guide movement of the hook part 713 in the first direction. The first guide 712a can extend in the first direction and can be disposed in plural. Among them, the first direction can be defined as a direction in which the hook part 713 and the support part 714 approach or move away from each other on a horizontal plane, and the second direction can be defined as a direction perpendicular to the first direction on the horizontal plane.

[0087] The second guide 712b can guide movement of the support part 714 in the first direction. The second guide 712b can extend in the first direction and can be disposed in plural. Also, the second guide 712b can be supported by the body part 711 to be spaced apart from the first guide 712a in the second direction.

[0088] The hook part 713 can be disposed to rotate the latch 621 or the cover 622 with respect to the seating part 623. The hook part 713 can move to approach the support part 714 or be isolated from the support part 714, thereby opening and closing the receptacle 620. Also, the hook part 713 can be isolated from the support part 714 in the first direction. The hook part 713 can include a first bracket 713a and a hook unit 713b.

[0089] Reference Figure 13The first bracket 713a can support a plurality of hook units 713b. The first bracket 713a can be slidably supported on the first guide rail 712a. Also, a vertical length L1 of the first bracket 713a can be set to be longer than a vertical length L2 of the second bracket 714a. Accordingly, lower ends of the hook units 713b can be positioned at a lower side of lower ends of the support units 714b described below.

[0090] A plurality of hook units 713b can be provided, and the plurality of hook units 713b can be supported by the first bracket 713a to be spaced apart from each other in the second direction. The hook unit 713b can include a first hook member 713b-1, a second hook member 713b-2, and a hook roller 713b-3.

[0091] The first hook member 713b-1 and the second hook member 713b-2 can support the latch 621 and can be moved while supporting the latch 621 to rotate the latch 621. The first hook member 713b-1 and the second hook member 713b-2 can be supported by the first bracket 713a to be spaced apart from each other in the second direction. Also, the first hook member 713b-1 and the second hook member 713b-2 can be supported by the first bracket 713a to be placed at positions corresponding to the first support roller 714b-1 and the first support roller 714b-2 in the first direction, respectively. For example, the first hook member 713b-1 and the first support roller 714b-1 can be placed on an imaginary straight line extending in the first direction.

[0092] On the other hand, the first hook member 713b-1 and the second hook member 713b-2 are each formed to have one side end portion supported by the first bracket 713a and the other side end portion bent toward the support portion 714. Also, the first hook member 713b-1 and the second hook member 713b-2 can each have an inclined surface 713b-4 formed at the other side end portion toward the support portion 714. The inclined surface 713b-4 can extend to be inclined at a prescribed angle with respect to the first direction, and the inclined surface 713b-4 can extend downward. When the latch 621 releases the support of the cover 622, at a moment when the cover 622 is released from the closed state, the cover 622 is rotated to be opened, and the inclined surface 132a-1 contacts the cover 622 so that the cover 622 is not rotated at an excessively large rotation angle at the moment and slides along an upper surface of the cover 622. Through the inclined surface 713b-4, it is possible to prevent the cover 622 from being instantaneously rotated and damaged.

[0093] The hook roller 713b-3 can support the cover 622 when the socket 620 is opened and closed. Also, the hook roller 713b-3 can move while supporting the cover 622 to rotate the cover 622. The hook roller 713b-3 can press the cover 622 in correspondence with the vertical movement of the first bracket 713a. The hook roller 713b-3 can be disposed between the first hook member 713b-1 and the second hook member 713b-2. Also, the hook roller 713b-3 can include a rubber material to minimize impact applied to the cover 622.

[0094] The support portion 714 can be disposed to rotate the latch 621 or the cover 622 with respect to the seating portion 623. The support portion 714 can move to approach or isolate from the hook portion 713, thereby opening or closing the socket 620. Also, the support portion 714 can include a second bracket 714a and a support unit 714b.

[0095] The second bracket 714a can support a plurality of support units 714b. The second bracket 714a can be slidably supported on the second guide rail 712b.

[0096] A plurality of support units 714b can be provided, which can be supported by the second bracket 714a to be spaced apart from each other in the second direction. The support unit 714b can include a first support roller 714b-1 and a second support roller 714b-2.

[0097] The first support roller 714b-1 and the second support roller 714b-2 can support the latch 621, and can move while supporting the latch 621 to rotate the latch 621. Also, the first support roller 714b-1 and the second support roller 714b-2 can press the latch 621 in correspondence with the movement of the second bracket 714a in the vertical direction. The first support roller 714b-1 and the second support roller 714b-2 can include a buffer member, such as rubber or the like, to minimize impact applied to the latch 621 when in contact with the latch 621.

[0098] The open brake 715 can move the first bracket 713a along the first guide rail 712a, and can move the second bracket 714a along the second guide rail 712b.

[0099] Reference Figure 14The picker unit 720 can grip or release the electronic component. The picker unit 720 can be supported on the hand body 730 and can move along the second guide 742. That is, the picker unit 720 can move along the second guide 742 in the second direction independently of the opening and closing unit 710. For example, the picker unit 720 can reciprocate between the upper side of the second tray 600 and the upper side of the shuttle 500. In addition, the picker unit 720 can move along the first direction together with the opening and closing unit 710 through the hand transfer 800. The picker unit 720 can include a picker body 721, a picker 722, and a pitch variable portion 723.

[0100] The picker body 721 can support a plurality of pickers 722. The picker body 721 can move in the second direction by a second driving unit 752.

[0101] The picker 722 can grip or release the electronic component. The picker 722 can transfer a plurality of electronic components from one of the second tray 600 and the shuttle 500 to the other. For example, five pickers 722 can be provided to grip five electronic components at the same time. In addition, the picker 722 can grip the electronic component by vacuum pressure or air pressure formed by a pump (not shown). A plurality of the pickers 722 can be provided, and the plurality of pickers 722 can be supported by the picker body 721.

[0102] The pitch variable portion 723 can adjust the interval between the plurality of pickers 722. The pitch variable portion 723 can include a pitch guide 723a and a picker driving unit 723b.

[0103] The pitch guide 723a extends along the second direction and can guide movement of the plurality of pickers 722 in the second direction. The pitch guide 723a can be supported by the picker body 721.

[0104] The picker driving unit 723b can move the plurality of pickers 722 in the second direction, respectively, to adjust the interval between the plurality of pickers 722. For example, the picker driving unit 723b can include a brake or a hydraulic cylinder.

[0105] In this way, the interval between the plurality of pickers 722 can be adjusted by the pitch variable portion 723. However, this is merely an example, the pitch variable portion 723 includes a cam and a cam follower (not shown), and the interval between the plurality of pickers 722 can be adjusted by driving the cam and the cam follower. In addition, a plurality of pickers 722 can be provided to be raised and lowered independently of each other.

[0106] On the other hand, the interval of the opening and closing unit 710 and the picker unit 720 in the first direction can be the same as the interval of the plurality of sockets 620 in the first direction. For example, the opening and closing unit 710 and the picker unit 720 can be positioned on the plurality of sockets 620 by moving together in the first direction. In this case, when the opening and closing unit 710 opens the socket 620 positioned in the second column, the picker unit 720 can place the electronic component in the opened socket 620 in the first column.

[0107] Accordingly, the opening and closing unit 710 and the picker unit 720 have an effect of being able to place the electronic component in the socket 620 more quickly.

[0108] The hand body 730 can support the opening and closing unit 710 and the picker unit 720. Also, the hand body 730 can be supported by the hand conveyer 800 and can be moved in the first direction by the hand conveyer 800. In this way, since the opening and closing unit 710 and the picker unit 720 are supported by the hand body 730 and move together, there is an effect of being able to prevent a collision between the opening and closing unit 710 and the picker unit 720. Also, since one hand conveyer 800 moves the opening and closing unit 710 and the picker unit 720 in the first direction, there is an effect of reducing the production unit price and minimizing the space.

[0109] The guide 740 can guide the movement of the opening and closing unit 710 and the movement of the picker unit 720. The guide 740 can include a first guide 741 and a second guide 742.

[0110] The first guide 741 can guide the movement of the opening and closing unit 710 in the vertical direction. The first guide 741 is supported on the hand body 730 and can extend in the vertical direction. Also, a plurality of first guides 741 can be provided.

[0111] The second guide 742 can guide the movement of the picker unit 720 in the second direction. The second guide 742 is supported on the hand body 730 and can extend in the second direction. Also, a plurality of second guides 742 can be provided.

[0112] The driving part 750 can include a first driving unit 751 capable of moving the opening and closing unit 710 in the vertical direction and a second driving unit 752 capable of moving the picker unit 720 in the second direction. For example, the driving part 750 can include a brake or a hydraulic cylinder.

[0113] The hand conveyer 800 can move the conveyer hand 400 in at least one of the first direction and the second direction. Also, the hand conveyer 800 can move the hand 700 in the first direction. For example, the hand conveyer 800 can include a brake or a hydraulic cylinder.

[0114] The tray transferer 900 can transfer the second tray 600 from one of the second tray area TP2 and the tray cart 1000 to the other. For example, the tray transferer 900 can transfer the second loading tray 601 in which electronic components to be tested are seated from the second loading tray area LTP2 to the tray cart 1000. Also, the second unloading tray 602 in which electronic components of which testing is completed are seated can be transferred to the second unloading tray area UTP2.

[0115] The tray cart 1000 can store a plurality of second trays 600.

[0116] The control portion 1100 can control the operation of the buffer stage 300, the transfer hand 400, the shuttle 500, the hand 700, the hand transferer 800, the tray transferer 900, and the tray cart 1000. The control portion 1100 can be implemented by an arithmetic device including a microprocessor, a measurement device such as a sensor, and a memory, and further detailed description thereof will be omitted since its implementation is obvious to those skilled in the art.

[0117] The control portion 1100 can perform the following control to support testing of untested electronic components. For example, the control portion 1100 can control the transfer hand 400 to transfer electronic components from a customer tray CT loaded on the stacker 200 and load into the buffer stage 300. Also, the control portion 1100 can control the transfer hand 400 to transfer electronic components seated on the buffer stage 300 and load onto the first loading tray 510. The control portion 1100 can control the hand 700 to transfer electronic components from the first loading tray 510 and load onto the second loading tray 601 placed in the second loading tray area LTP2. Also, the control portion 1100 can control the tray transferer 900 to transfer the second loading tray 601 in which electronic components are seated from the second loading tray area LTP2 to the tray cart 1000. The electronic components transferred to the tray cart 1000 can be connected to a tester to be tested.

[0118] On the other hand, the tested electronic components can be loaded onto the second unloading tray 602, and the control unit 1100 can perform the following controls to transfer the tested electronic components back to the customer tray CT. For example, the control unit 1100 controls the tray transferor 900 to move the second unloading tray 602 containing the electronic components from the tray trolley 1000 to the second unloading tray area UTP2. Furthermore, the control unit 1100 controls the hand 700 to unload the electronic components from the second unloading tray 602 placed in the second unloading tray area UTP2 and transfer them to the first unloading tray 520. The control unit 1100 can also control the transfer hand 400 to unload the electronic components from the first unloading tray 520 and transfer them to the buffer table 300, so that the electronic components transferred to the buffer table 300 can be transferred to the customer tray CT loaded on the stacker 200.

[0119] The control unit 1100 can selectively execute the electronic component loading and unloading processes as needed. For example, the control unit 1100 can execute the loading process only and then execute the unloading process, or it can execute the loading and unloading processes simultaneously.

[0120] On the other hand, the electronic component testing and sorting machine 1 may also include a vision unit capable of acquiring image information by photographing electronic components mounted on the shuttle 500. This vision unit may be located on the upper part of the shuttle 500 and may include a camera capable of photographing the shuttle 500 and a reflector for auxiliary camera photography of the shuttle 500, wherein the shuttle 500 is located within a wider field of view than the camera. The control unit 1100 may determine whether the electronic components mounted on the shuttle 500 are improperly mounted based on the image information obtained from the vision unit.

[0121] In addition, the electronic component testing and sorting machine 1 may also include a camera unit (not shown) capable of photographing the opening and closing unit 710. The camera unit is located below the opening and closing unit 710 and is used to photograph the opening and closing unit 710. Through the camera unit, the user can observe whether the opening and closing unit 710 is damaged or abnormal.

[0122] In the following text, reference will be made to Figure 15 to Figure 20 The control method S10 for controlling the electronic component test and sorting machine 1 according to an embodiment of the present invention is described.

[0123] The control method S10 for the electronic component testing and sorting machine can control the electronic component testing and sorting machine 1 to electrically connect electronic components to the tester. The control method S10 for the electronic component testing and sorting machine may include a buffer processing step S100, a first tray processing step S200, a second tray processing step S300, and a trolley processing step S400.

[0124] In the buffer processing step S100, the transfer hand 400 can transfer electronic components between the buffer table 300 and the stacker 200. The buffer processing step S100 can include a buffer loading step S110 and a buffer unloading step S120.

[0125] In the buffer loading step S110, the transfer hand 400 can transfer electronic components from the customer tray CT loaded on the stacker 200 and load onto the buffer table 300.

[0126] In the buffer unloading step S120, the transfer hand 400 can unload electronic components seated on the buffer table 300 and transfer to the customer tray CT loaded on the stacker 200.

[0127] In the first tray processing step S200, the transfer hand 400 can transfer electronic components from one of the buffer table 300 and the first tray 510 to the other. For example, in the first tray processing step S200, the holding portion 410 can hold and transfer electronic components one by one. The first tray processing step S200 can include a first tray loading step S210 and a second tray loading step S220.

[0128] In the first tray loading step S210, the transfer hand 400 can transfer electronic components seated on the buffer table 300 and load onto the first loading tray 510.

[0129] In the second tray loading step S220, the transfer hand 400 can unload electronic components from the first unloading tray 520 and transfer onto the buffer table 300.

[0130] In the second tray processing step S300, the hand 700 can transfer electronic components from one of the first tray 510 and the second tray 600 to the other. For example, in the second tray processing step S300, the plurality of pickers 220 can simultaneously hold and transfer a plurality of electronic components. The second tray processing step S300 can include a second tray loading step S310, a second tray unloading step S320, an opening step S330, a closing step S340, and a transfer step S350.

[0131] In the second tray loading step S310, the hand 700 can transfer electronic components from the first loading tray 510 and load onto the second loading tray 601 seated in the second tray area TP2.

[0132] In the second tray unloading step S320, the hand 700 unloads electronic components from the second unloading tray 602 seated in the second tray area TP2 and transfers onto the first unloading tray 520.

[0133] In the opening step S330, the opening and closing unit 710 can open the socket 620 to the outside. The opening step S330 can include a first opening hand moving step S331, a rising step S332, a second opening hand moving step S333, and a third opening hand moving step S334.

[0134] In the first opening hand moving step S331, the hook portion 713 and the support portion 714 can be lowered toward the socket 620 so that the socket 620 is positioned between the hook portion 713 and the support portion 714 (refer to Figure 15 Fig. 15(b)). Further, in the first opening hand moving step S331, the hook portion 713 can be moved to one side of the first direction (for example, the left side of Figure 15 Fig. 15) to support the latch 621. In this case, the support portion 714 can be moved by a distance longer than the distance by which the hook portion 713 is moved to the other side of the first direction (for example, the right side of Figure 15 Fig. 15).

[0135] In the rising step S332, the hook portion 713 supporting the latch 621 can be raised. The rising step S332 can include a first rising step S332A and a second rising step S332B.

[0136] In the first rising step S332A, the hook portion 713 can be raised by a predetermined distance from the seating portion 623 while supporting the latch 621. In this case, as the hook portion 713 is raised, the latch 621 can be rotated in a direction in which the angle formed with the seating portion 623 increases (refer to Figure 15 Fig. 15(d)).

[0137] In the second rising step S332B, the support portion 714 can be raised while supporting the latch 621 in correspondence with the rotation of the latch 621. In this case, the support portion 714 can support the latch 621 at a position adjacent to the initial position of the rotation of the latch 621. In this way, since the support portion 714 is raised while supporting the latch 621 on the upper side of the latch 621 in the second rising step S332B, the latch 621 can be slowly rotated without being abruptly rotated.

[0138] Accordingly, there is an effect that it is possible to prevent generation of vibration in the socket 620 and to prevent an electronic component seated in the socket 620 from being dislodged from the original position or from being subjected to an impact.

[0139] On the other hand, in the second rising step S332B, during the rotation of the latch 621, the hook portion 713 can be raised while moving to one side of the first direction to approach the support portion 714.

[0140] In the second open-hand moving step S333, the support portion 714 can move to one side (for example, the left side of FIG. 16) of the first direction while supporting the latch 621 rotating in a direction in which an angle formed with the seating portion 623 increases. Further, in the second open-hand moving step S333, the support portion 714 can move to be spaced apart from the latch 621 when the latch 621 is perpendicular to the seating portion 623. In this case, the cover 622 can be supported by the hook roller 713b-3 by rotating away from the closed state. That is, by the hook roller 713b-3, it is possible to prevent the cover 622 from being suddenly opened by being detached from the closed state, and it is possible to minimize vibration applied to the cover 622 (refer to Figure 16 (e))).

[0141] In the third open-hand moving step S334, the hook portion 713 can move to the other side (for example, the right side of FIG. 16) of the first direction while supporting the cover 622 rotating in a direction in which an angle formed with the seating portion 623 increases. Further, in the third open-hand moving step S334, the cover 622 can rotate while being supported by the hook roller 713b-3 during the movement of the hook portion 713 (refer to Figure 16 (f))). Figure 16 After the third open-hand moving step S334, the hook portion 713 and the support portion 714 can be raised from the seating portion 623 (refer to Figure 16 (g))).

[0142] In the closing step S340, the socket 620 can be closed to the outside. The closing step S340 can include a first closing-hand moving step S341, a lowering step S342, a second closing-hand moving step S343, and a third closing-hand moving step S344.

[0143] In the first closing-hand moving step S341, the hook portion 713 and the support portion 714 can be lowered toward the socket 620 so that the socket 620 is positioned between the hook portion 713 and the support portion 714 (refer to Figure 17 (a), FIG. 17(b)). Further, in the first closing-hand moving step S341, the hook portion 713 can move to one side (for example, the left side of FIG. 16) of the first direction while supporting the cover 622 rotating in a direction in which an angle formed with the seating portion 623 decreases. In the first closing-hand moving step S341, the cover 622 can rotate while being supported by the hook roller 713b-3 during the movement of the hook portion 713 (refer to Figure 17 (c)). Figure 17

[0144] ​In the lowering step S342, the hook portion 713 can be lowered to press the lid 622, or the support portion 714 can be lowered to press the latch 621. The lowering step S342 can include a first lowering step S342A and a second lowering step S342B.

[0145] In the first lowering step S342A, the hook portion 713 can press the lid 622, thereby causing the lid 622 to be in the closed state (refer to Figure 17 (d)).

[0146] In the second lowering step S342B, the support portion 714 that supports the latch 621 can be lowered so that the lid 622 does not escape from the closed state (refer to Figure 18 (g)).

[0147] In the second closing hand moving step S343, the hook portion 713 can be moved to the other side of the first direction (for example, the right side of Figure 18 (e)). In this case, the hook portion 713 can not be placed above the socket 620. Figure 18

[0148] In the third closing hand moving step S344, the support portion 714 can be moved to the other side of the first direction (for example, the right side of Figure 18 (f)) while supporting the latch 621 so as to rotate the latch 621 in a direction in which the angle formed with the seating portion 623 is reduced. After the third closing hand moving step S344, the hook portion 713 and the support portion 714 are moved in a direction in which they are isolated from each other, and can be raised from the seating portion 623 (refer to Figure 18 (h)). Figure 18

[0149] In the transfer step S350, the tray transfer 900 can transfer the second tray 600 placed on the second unloading tray area UTP2 to the second loading tray area LTP2. In this case, the second tray 600 placed in the second unloading tray area UTP2 can be in a vacant state inside the socket 620 as the electronic components are unloaded. Further, in the transfer step S350, the second tray 600 can be transferred to the second loading tray area LTP2 to load the electronic components into the socket 620 inside which is vacant. In this way, since the electronic components are loaded into the second tray 600 immediately after the electronic components are unloaded from the second tray 600, it has an effect that the engineering time can be shortened.

[0150] ​​In the cart handling step S400, the tray transferer 900 can transfer the second tray 600 from one of the second tray area TP2 and the tray cart 1000 to the other. The cart handling step S400 can include a cart loading step S410 and a cart unloading step S420.

[0151] In the cart loading step S410, the tray transferer 900 can transfer the second loading tray 601 on which the electronic components are seated from the second tray area TP2 to the tray cart 1000.

[0152] In the cart unloading step S420, the tray transferer 900 can transfer the second unloading tray 602 from the tray cart 1000 to the second tray area TP2.

[0153] In the above, the embodiments of the present application have been described as specific implementation forms, but these are only examples, and the present application is not limited thereto, and should be interpreted as having the broadest scope in accordance with the technical idea disclosed in the present specification. A person skilled in the art can realize a pattern of shapes not disclosed by combining / replacing the disclosed implementation forms, which does not depart from the scope of the present application. Furthermore, a person skilled in the art can easily make changes or modifications to the disclosed implementation forms according to the present specification, and it is obvious that such changes or modifications are within the scope of the present application.

Claims

1. An electronic component test handler characterized by, Comprising: a plurality of first trays including a first loading tray and a first unloading tray movable in a first direction in a first tray area; a transfer hand capable of loading electronic components onto the first trays or unloading the loaded electronic components from the first trays; at least one second tray capable of being placed in a second tray area adjacent to the first tray area, the second tray including a second loading tray and a second unloading tray capable of housing the electronic components; and a hand moving between the first tray area and the second tray area, the hand including at least one of a picker unit capable of transferring the electronic components from one of the first trays and the second trays to the other and an opening and closing unit capable of selectively opening and closing a socket provided in the second tray; the transfer hand transfers the electronic components, loads the electronic components onto the first loading tray, and unloads the electronic components housed on the first unloading tray, the hand transfers the electronic components housed on the first loading tray and loads onto the second loading tray, unloads the electronic components housed on the second unloading tray and transfers onto the first unloading tray; the hand includes the opening and closing unit, the opening and closing unit including: a hook portion; and a support portion spaced apart from and opposite to the hook portion, the hook portion and the support portion are each configured to approach or move away from each other to open and close the socket; a side end portion of the hook portion is bent toward the support portion, the side end portion including an inclined surface in contact with a cover of the socket. Further comprising:

2. The electronic component test handler of claim 1, wherein, a buffer stage provided at one side of the first tray area in the first direction and capable of housing the electronic components; a stacker on which a customer tray on which the electronic components are mountable is loaded; a tray cart on which a plurality of the second trays are loaded; a tray transfer capable of transferring a plurality of the second trays from one of the second tray area and the tray cart to the other; and a control portion capable of controlling the transfer hand, the hand, and the tray transfer; the control portion transfers the electronic components from the customer tray loaded on the stacker to the buffer stage, controls the transfer hand to transfer the electronic components housed on the buffer stage and load onto the first loading tray, the control portion controls the hand to transfer the electronic components from the first loading tray and load onto the second loading tray placed in the second tray area, the control portion controls the tray transfer to transfer the second loading tray on which the electronic components are housed from the second tray area to the tray cart. Further comprising:

3. The electronic component test handler of claim 1 wherein, a buffer stage provided at one side of the first tray area in the first direction and capable of housing the electronic components; a stacker on which a customer tray on which the electronic components are mountable is loaded; a tray cart on which a plurality of the second trays are loaded; a tray transfer capable of transferring a plurality of the second trays from one of the second tray area and the tray cart to the other; and a control portion capable of controlling the transfer hand, the hand, and the tray transfer; a tray transferer capable of transferring a plurality of the second trays from one of the second tray area and the tray cart to the other; and a control section capable of controlling the transfer hand, the hand, and the tray transferer; the control section controls the tray transferer to transfer the second unloading tray from the tray cart to the second tray area, the control section controls the hand to unload and transfer the electronic component from the second unloading tray placed on the second tray area to the first unloading tray, the control section controls the transfer hand to unload and transfer the electronic component from the first unloading tray to the buffer stage, and to transfer the electronic component placed on the buffer stage to the customer tray loaded on the stacker crane.

4. The electronic device testing handler of claim 1 wherein, Further comprising: a first tray guide and a second tray guide, the first tray guide and the second tray guide in the first direction, capable of guiding a plurality of the first trays to move in the first direction, the first tray guide movably supports any one of a plurality of the first trays, the second tray guide is spaced apart from the first tray guide in a second direction deviated from the first direction, and movably supports another one of a plurality of the first trays, one of the first trays is disposed above the other one of the first trays, so that one of the first trays can move independently of the other one of the first trays.

5. The electronic component test handler of claim 1 wherein, Further comprising: a buffer stage disposed on one side of the first tray area in the first direction, capable of placing the electronic component, the buffer stage includes: a first buffer section disposed on a prescribed position within a holding area capable of placing the transfer hand; and a second buffer section capable of moving from one of a release area incapable of placing the transfer hand and the holding area to the other area, the second buffer section is configured to be movable from an upper side of the first buffer section in the first direction.

6. The electronic device testing handler of claim 1 wherein, the first tray includes: a pocket support movable in the first direction; a pocket stage having a hanging area protruding to a side, the pocket stage replaceably supported on the pocket support; and an anti-release section capable of being placed in any one of a fixed position and a free position, at least a part of the fixed position being located on the hanging area so that the pocket stage does not release from the pocket support, the free position allowing the pocket stage to release from the pocket support.

7. An electronic component test handler characterized by, including: a first tray movable in a first direction within a first tray area; a second tray placeable on a second tray area adjacent to the first tray area in a second direction deviated from the first direction, the second tray including a socket capable of placing an electronic component; a hand capable of transferring the electronic component from one of the first tray and the second tray to the other; and a hand transferer capable of transferring the hand in the first direction; the hand includes: a hand main body supported by the hand transferer; A picker unit including a picker main body supported on the hand main body to move in the second direction between the first tray area and the second tray area, the picker main body being able to individually raise and lower the pickers; and An opening and closing unit capable of selectively opening and closing the socket, being raised and lowered with respect to the hand main body while being supported by the hand main body; The opening and closing unit includes: a hook portion; and a support portion spaced apart from and opposite to the hook portion, the hook portion and the support portion are each configured to approach or move away from each other to open and close the socket; a side end portion of the hook portion is bent toward the support portion, the side end portion including an inclined surface in contact with a cover of the socket.

8. A control method of an electronic component test handler, characterized by, includes: a first tray processing step of loading electronic components onto a first tray on which a transfer hand can move in a first direction in a first tray area, or unloading the loaded electronic components from the first tray; and a second tray processing step of moving the hand between a second tray area adjacent to the first tray area and the first tray area, and transferring the electronic components from one of the first tray and the second tray to the other, in the first tray processing step, the transfer hand transfers the electronic components and loads on a first loading tray, unloads the electronic components seated on a first unloading tray, in the second tray processing step, the hand transfers the electronic components seated on the first tray and loads on a second loading tray, unloads the electronic components seated on a second unloading tray and transfers to the first unloading tray, an opening and closing unit selectively opens and closes a socket provided in the second tray; The opening and closing unit includes: a hook portion; and a support portion spaced apart from and opposite to the hook portion, the hook portion and the support portion are each configured to approach or move away from each other to open and close the socket; a side end portion of the hook portion is bent toward the support portion, the side end portion including an inclined surface in contact with a cover of the socket. Further includes:

9. The control method of an electronic component test handler according to claim 8, wherein, a buffer loading step in which the transfer hand transfers electronic components from a customer tray loaded on a stacker and loads on a buffer stage; and a cart loading step in which a tray transferer transfers the second loading tray on which the electronic components are seated from the second tray area to a tray cart, the first tray processing step includes a first tray loading step in which the transfer hand transfers the electronic components seated on the buffer stage and loads on the first loading tray, the second tray processing step includes a second tray loading step in which the hand transfers electronic components from the first loading tray and loads on the second loading tray placed in the second tray area. Further includes:

10. The control method of an electronic component test handler according to Claim 8, wherein a buffer unloading step in which the transfer hand unloads electronic components seated on a buffer stage and transfers to a customer tray loaded on a stacker; and a cart unloading step in which a tray transferer transfers the second unloading tray from a tray cart to the second tray area, ​ The first tray handling step includes a first tray unloading step in which the transfer hand unloads the electronic component from the first unloading tray and transfers onto the buffer stage, The second tray handling step includes a second tray unloading step in which the hand unloads the electronic component from the second unloading tray placed in the second tray area and transfers onto the first unloading tray.

Images