Ion mobility analyzer

Abstract

The application belongs to the field of ion mobility spectrometry, and discloses a high-duty-cycle ion mobility analyzer and an analysis method. The analyzer comprises an ion source, a first ion storage region, a second ion storage region and an ion mobility analyzer. The ion mobility analyzer comprises two channels, each of which comprises a gas flow coaxial with the ion migration direction and a direct current electric field opposite to the gas flow direction. The direct current electric field strengths in the two channels are different. In a continuous scanning cycle, ions that cannot pass through the mobility analyzer due to not meeting the appropriate scanning conditions or having missed the appropriate scanning conditions are temporarily stored in the two independent ion storage regions without being lost, and are analyzed by the mobility analyzer when the scanning cycle or the next scanning cycle meets the appropriate conditions. The application can improve the duty cycle of the filter-type ion mobility spectrometer, thereby improving the sensitivity and the qualitative ability during actual analysis.

Description

Technical Field

[0001] The present invention relates to ion mobility spectrum, in particular to a high duty cycle filtering type ion mobility analysis device. Background Art

[0002] Ion mobility spectrometers can be used to analyze the mobility or differential mobility of ions. There are various types of ion mobility spectrometers, such as drift cell mobility, traveling wave ion mobility, trapped ion mobility, high-field asymmetric waveform ion mobility spectrometry (FAIMS), differential ion mobility spectrometry (DMS), and differential ion mobility analyzers (DMAs). These ion mobility spectrometers operate differently, with DMA, DMS, and FAIMS being mobility filters. Under certain operating conditions, the spectrometer only allows ions within a certain mobility (or differential mobility) range to pass through, filtering out all other ions and causing them to be lost. By scanning the operating conditions, ions of different mobilities (or differential mobilities) can be allowed to pass sequentially, resulting in a spectrum. For example, in a differential ion mobility analyzer (DMA), the amplitude of the electric field perpendicular to the airflow direction can be scanned, allowing ions of different mobilities to pass through the receiving slit in sequence, resulting in a mobility spectrum. For the U-type ion mobility spectrometer described in patent CN2017104191571, the field strengths E1 and E2 of the first and second channels can be scanned simultaneously, and the difference between E2 and E1 can be kept constant, so that ions with different mobilities can pass through the device in sequence to obtain a migration spectrum. In one scanning cycle, the ion utilization efficiency of this filter-type ion mobility spectrometer is very low. Hereinafter, according to industry practice, this ion utilization efficiency is defined as the duty cycle of the instrument, especially for higher-resolution filter-type migration spectrometers, the duty cycle is generally less than 1%.

[0003] In non-filtering mobility spectrometers, prior art has been developed to increase the duty cycle. For example, in migration tube mobility spectrometry, traveling wave mobility spectrometry, or trapped ion mobility spectrometry, an ion storage area can be set up before the entrance of the mobility analyzer. Before the mobility analysis is performed, the continuous ion flow is continuously accumulated and stored in this area, and then released into the mobility analyzer for analysis. In theory, this can achieve a duty cycle of 100%. However, this process inevitably leads to a reduction in other performance, such as resolution or dynamic range. In filtering ion mobility spectrometers, due to the reduction in duty cycle caused by the filtering behavior itself, the existing technology does not provide an ion mobility analysis device with a high duty cycle. Summary of the Invention

[0004] In view of the above problems, the present invention proposes an ion mobility analysis device with a high duty cycle, which can improve the ion utilization efficiency of a filter-type ion mobility spectrometer during continuous scanning, thereby improving the sensitivity of the instrument.

[0005] To achieve the above-mentioned and other related objectives, the present invention provides an ion mobility analysis device and a corresponding ion mobility analysis method, wherein the ion mobility analysis device comprises:

[0006] an ion source for continuously generating ions, wherein the generated ions include analyte ions;

[0007] An ion mobility analyzer is located downstream of the ion source and is used to receive ions generated by the ion source and perform mobility analysis. The ion mobility analyzer has a first ion storage area and a second ion storage area.

[0008] The ion mobility analyzer scans at least one working parameter f(t) during a working cycle from t0 to t1, so that ions with different mobilities pass through the ion mobility analyzer in sequence. The working parameter f(t) is a monotonic function of time t. The working parameter range in which the analyte ions can pass through the analyzer is [f( tA ), f( tB )], and t0 <t A <t B <t1;

[0009] The working cycle is repeated multiple times, and in each working cycle:

[0010] At t0≤t <t A a stage in which at least a portion of the analyte ions filtered out by the ion mobility analyzer are transferred to and stored in a first ion storage region;

[0011] In t B <t≤t1阶段,至少一部分在此阶段内被离子迁移率分析器滤除的分析物离子,被传输和存储在第二离子存储区域中;

[0012] In t A ≤t≤t B In this stage, the analyte ions generated by the ion source, the analyte ions stored in the first ion storage area in the same working cycle, and the analyte ions stored in the second ion storage area in the previous working cycle can pass through the ion mobility analyzer and enter the lower-level analysis device or be detected by the detector.

[0013] As described above, the ion mobility analysis device and method of the present invention have the following beneficial effects:

[0014] During a continuous scanning cycle, ions that have not reached the appropriate scanning conditions or have missed the appropriate scanning conditions and cannot pass through the ion mobility analyzer are temporarily stored in two independent ion storage areas without being lost. When the conditions are suitable during the current scanning cycle or the next scanning cycle, they are then driven through the ion mobility analyzer and analyzed. In this way, even for a filter-type ion mobility spectrometer, theoretically, an ion utilization efficiency close to 100% can be achieved, thereby improving the duty cycle of the ion mobility spectrometer and thereby enhancing its sensitivity and qualitative ability when used for actual analysis. The ion mobility analysis device and method of the present invention are applicable to various types of ion mobility spectrometers, such as DMA, DMS / FAIMS, and U-type ion mobility spectrometers. BRIEF DESCRIPTION OF THE DRAWINGS

[0015] Figure 1 2 is a schematic diagram of the analysis process of the ion mobility analysis device in the first embodiment of the present invention;

[0016] Figure 2 It is a schematic diagram of the structure of an ion mobility analysis device in the prior art and the analysis process within one cycle;

[0017] Figure 3 2. It is a schematic diagram of the structure of the ion mobility analysis device and the analysis process within one cycle in the first embodiment of the present invention;

[0018] Figure 4 It is a schematic diagram of a DC electric field scan of an ion mobility analysis device in the prior art;

[0019] Figure 5 2 is a schematic diagram of a DC electric field scan of an ion mobility analysis device according to a first embodiment of the present invention;

[0020] Figure 6 2 is a schematic diagram of a scanning method when the ion mobility analysis device performs multiple target ion analyses in the first embodiment of the present invention;

[0021] Figure 7 is the experimental result of the ion mobility analysis device in the first embodiment of the present invention;

[0022] Figure 8a It is a schematic diagram of the analysis process of the ion mobility analysis device in the prior art;

[0023] Figure 8b 2 is a schematic diagram of the analysis process of the ion mobility analysis device in the second embodiment of the present invention;

[0024] Figure 9 This is a system configuration diagram of the ion mobility analyzer of the present invention used in series with a mass spectrometer.

[0025] Reference numerals:

[0026] 1-Ion source

[0027] 2-First ion storage area

[0028] 3- Second ion storage area

[0029] 4-Ion Mobility Analyzer

[0030] 5-Detector

[0031] 6-Mass spectrometer

[0032] 40-First Channel

[0033] 41-Second Channel

[0034] 7-U Ion Mobility Analyzer

[0035] 8-quadrupole mass analyzer

[0036] 9-Collision Chamber

[0037] 10-Time of Flight Mass Spectrometer. DETAILED DESCRIPTION

[0038] The following describes the implementation of the present invention through specific embodiments. People skilled in the art can easily understand other advantages and effects of the present invention from the contents disclosed in this specification.

[0039] It should be noted that the structures, proportions, sizes, etc. illustrated in the drawings of this specification are only used to match the contents disclosed in the specification for understanding and reading by those familiar with this technology, and are not used to limit the conditions for implementation of the present invention. Therefore, they have no substantial technical significance. Any modification of the structure, change in the proportional relationship, or adjustment of the size should still fall within the scope of the technical content disclosed by the present invention without affecting the efficacy and purpose that can be achieved by the present invention. At the same time, the terms such as "upper", "lower", "left", "right", "middle" and "one" quoted in this specification are only for the convenience of description and are not used to limit the scope of implementation of the present invention. Changes or adjustments in their relative relationships should also be regarded as the scope of implementation of the present invention without substantially changing the technical content.

[0040] "Mobility" or "mobility spectrum" as used herein encompasses not only those related to ion collision cross section (CCS) but also those related to electric field strength, such as "differential mobility" or "differential mobility spectrum." When an ion "passes" through a device or analyzer, it means that the ion can spatially pass through the working region of the device or analyzer and be transported to the next stage.

[0041] Figure 1It is a schematic diagram of the analysis process of the first embodiment of the invention. The analysis process is suitable for a scanning type ion mobility spectrometer. The device includes an ion source 1, which produces a large number of ions, including target analyte ions to be analyzed and other ions. Downstream of the ion source 1 is an ion mobility analyzer 4. After the ions are analyzed by the ion mobility analyzer 4, they are transmitted to the detector 5 and detected to form an ion mobility spectrum. The ion mobility analyzer 4 is configured to operate in a periodic scanning manner, and a typical working cycle is defined as from t0 to t1. During the working cycle, the ion mobility analyzer 4 scans at least one of its working parameters f(t), preferably scanning the electric field strength E(t) in the ion mobility analyzer, so that ions with different mobilities pass through the ion mobility analyzer 4 in sequence. The working parameter range corresponding to the mobility value of the target analyte ion so that the target analyte ion can pass through the ion mobility analyzer 4 is [E(t A ), E(t B )], where t0 <t A <t B <t1。该装置还包含两个暂时存储离子的区域,具体为第一离子存储区域2和第二离子存储区域3,都位于离子源1的下游。

[0042] Any working cycle of this embodiment, such as the Nth cycle, can be divided into the following three stages:

[0043] The first stage is t0≤t <t A In the stage, the conditions of the ion mobility analyzer 4 (e.g., the electric field strength conditions) are not suitable for the target analyte ions to pass through. The target analyte ions generated by the ion source in this stage will pass through a part of the area of ​​the ion mobility analyzer and enter the first ion storage area 2. These target analyte ions stored are recorded as "ions I1(N)", where the subscript 1 represents storage in the first ion storage area 2, and N represents storage in the Nth cycle. At this time, the second ion storage area 3 stores the target analyte ions I2(N-1) stored in the previous cycle, and its generation and storage process will be described later.

[0044] The second stage is t A ≤t≤t Bstage, at which time the condition of the ion mobility analyzer 4 is suitable for the target analyte ions to pass through, then the target analyte ions generated by the ion source 1 in this stage, as well as the target analyte ions I1(N) stored in the first ion storage area 2 in the same cycle, and the certain analyte ions I2(N-1) stored in the second ion storage area 3 in the previous cycle, will enter together and completely pass through the ion mobility analyzer 4, and then reach the detector 5 to be detected; after the completion of this stage, the ions in the first ion storage area 2 and the second ion storage area 3 have been cleared;

[0045] The third stage is t B <t≤t1阶段,此时离子迁移率分析器4的条件又变得不适合目标分析物离子通过,则由离子源1在该阶段产生的目标分析物离子,会经过该离子迁移率分析器4的部分区域而进入第二离子存储区域3,这部分被存储的目标分析物离子记为“离子I2(N)”,而第一离子存储区域2仍然保持离子清空状态;

[0046] In the next cycle, cycle N+1, the three stages above are repeated. For example, in the first stage, ions I1(N+1) continue to be stored, in the second stage, ions are completely transmitted, and in the third stage, ions I2(N+1) are stored. Each cycle repeats until the analysis is complete.

[0047] In this embodiment, in the first cycle, I2(0) is actually an empty ion packet; and in the last cycle M, I2(M) will not have the opportunity to enter the ion mobility analyzer 4. Therefore, at the end of an analysis, an additional clearing stage can be set to clear I2(M) to avoid interference with the next analysis.

[0048] In this embodiment, due to the use of two ion storage areas, ions that do not meet suitable scanning conditions or have missed suitable scanning conditions and cannot pass through the ion mobility analyzer 4 during a continuous working cycle are temporarily stored in one of the two ion storage areas without being lost. When the conditions are suitable during the current working cycle or the next working cycle, these ions are then transmitted and analyzed by the ion mobility analyzer 4. Through the above method, almost all target analyte ions will ultimately pass through the ion mobility analyzer 4 to be analyzed and detected, effectively reducing ion loss during the scanning process. Therefore, the ion utilization efficiency, or the duty cycle of the ion mobility analyzer, can reach a level close to 100%. In traditional scanning processes, the duty cycle is determined by the proportion of the time period during which ions are suitable for transmission to the total cycle, and this proportion is often negatively correlated with the resolution or scanning range. Therefore, to achieve higher resolution or a wider scanning range, the duty cycle is often very low, thereby limiting the sensitivity of the instrument.

[0049] Figures 2 to 5 The differences between the prior art and the first embodiment of the present invention are compared. Figure 2 and Figure 4 It is a device diagram and a DC electric field scanning schematic diagram of the prior art. Figure 3 and Figure 5 The figure is a diagram of the device and a schematic diagram of the DC electric field scanning of the first embodiment of the present invention. The ion mobility analyzer in the prior art is a U-shaped mobility analyzer described in patent CN2017104191571, which comprises two parallel channels, a first channel 40 and a second channel 41, each of which is surrounded by a substrate 42 where the electrode array is located and an electrode array 43 covering it (only one of the substrates and one electrode in the electrode array is marked in the figure), and there is an airflow coaxial with the ion migration direction in the channel, and a DC electric field in the opposite direction of the airflow direction. The field strength of the DC electric field in the first channel 40 (E S1 ) is slightly lower than the field strength (E S2 ), then at a specific moment in a working cycle, only ions with a mobility greater than a certain set ion mobility K1 can pass through the first channel 40, and only ions with a mobility less than a set ion mobility K2 can pass through the second channel 41, where K1 <K2,从而使得仅有迁移率在K1与K2之间的离子可通过U型迁移率分析器,即该分析器为过滤型离子迁移率分析器。参考 Figure 4 , in one working cycle, E S1 and E S2 Gradually increase, such as E S1 Scan linearly from E0 to E1, and keep the difference between the two ΔE=E during the whole scanning process S2 -E S1 The mobility of the target analyte ion is K T , the condition suitable for the target analyte ion to pass through is E A <E S1 <E B For this analyzer, it can be approximately considered that ΔE=E B -E A The following is Figure 4 The scanning process within one working cycle of the prior art is shown as follows:

[0050] At the beginning of the scan (t=t0), E S1 =E0,E S2 =E0+ΔE, such as Figure 4 As shown by the thick dashed line, then E S1 and E S2 Increase synchronously until t=t A , E S1 =E A, E S2 =E A +ΔE=E B ; from t0 to t A In the first stage, due to insufficient field strength in the first channel 40, the target analyte ions will be carried by the airflow through the first channel 40 and transferred to the right end of the second channel 41 by the deflected electric field, and then carried away by the airflow and lost;

[0051] From t A to t B In the stage, the ion mobility analysis device is suitable for the target analyte ion to pass through, and the target analyte will pass through the first channel 40, then be deflected to the right end of the second channel 41, and continue to pass through the second channel 41 to the left, and finally pass through the outlet of the second channel 41 to enter the next stage; this state continues until t=t B , at this time E S1 =E B , E S2 =E B +ΔE;

[0052] From t B At t1 stage, E S1 From E B The scan increases to E1. At this stage, for the analyte ions, the force exerted by the field strength in the first channel 40 on the ions has exceeded the influence of the airflow. As a result, the analyte ions are repelled to the left end by the field strength as soon as they enter the first channel 40 and are lost.

[0053] In the present invention, reference is made to Figure 3 , a first ion storage region 2 is set on the right side of the second channel 41, and a second ion storage region 3 is set on the left side of the first channel 40, and the field strength setting of the ion storage region is different from the area covered by the ion passing path, such as Figure 5 As shown in the figure, the thick dashed line E S1 and E S2 The field strength in the channel during the scanning process is shown in FIG. , and the thick solid line is the field strength in the ion storage area, which can remain unchanged during the scanning process. The following is a scanning process of the present invention:

[0054] At the beginning of the scan (t=t0), E S1 =E0,E S2 =E0+ΔE, the field strength in the second ion storage region 3 is E0, the field strength in the first ion storage region 2 is E1, then E S1 and E S2 Synchronous scanning enhancement, to t = t A , E S1 =E A , E S2 =E A +ΔE=E Band the field strength in the ion storage region remains unchanged; from t0 to t A Stage, due to the insufficient field strength in the channel, the target analyte ions will be carried by the gas flow through the first channel 40 and transmitted to the right end of the second channel 41 by the deflection electric field. Since the field strength in the first storage region 2 at this position is strong, the force on the ions is greater than the force generated by the gas flow, and the analyte ions will not escape from this region. However, the field strength in the second channel 41 is still weak and cannot continue to transmit ions to the left, so the ions will be stored in the first ion storage region 2;

[0055] from t A to t B Stage, the ion mobility analysis device is suitable for target analyte ions to pass through, so the target analyte ions entering from the ion source 1 will pass through the first channel 40 and then be deflected to the second channel 41. At this time, the ions stored in the first storage region 2 will also be released at the same time. These ions pass through the second channel 41 together and then enter the next stage through the outlet of the second channel 41. This state continues until t = t B , at which time E S1 = E B , E S2 = E B + ΔE;

[0056] from t B to t1 stage, E S1 is scanned from E B to E1. At this stage, for analyte ions, the field strength in the first channel 40 has exceeded the influence of the gas flow, so the analyte ions are just entering the first channel 40 and are repelled to the left by the field strength. However, the field strength in the second ion storage region 3 on the left is very low and cannot continue to push the ions, so the ions will be stored in the second ion storage region 3. These ions will be released from the second ion storage region 3 at the next period of t A to t B and pass through the first channel 40 and the second channel 41 together with the ions entering from the ion source 1 to be analyzed.

[0057] In actual analysis, there can be more than one kind of target analyte ion, or sometimes non-target analyte. The present application is also fully applicable to these cases. Figure 6Three kinds of target ions are given, corresponding to high, medium and low mobility ions. In the scanning process, high mobility ions (including ions from ion source region 1 and stored in the second ion storage region 3) are scanned out first, while medium and low mobility ions are stored in the first ion storage region 2. Then, medium mobility ions (including ions from ion source region 1 and stored in the first ion storage region 2) are scanned out, while high mobility ions are stored in the second ion storage region 3, and low mobility ions are continuously stored in the first ion storage region 2. Finally, low mobility ions (including ions from ion source region 1 and stored in the first ion storage region 2) are scanned out, while medium and high mobility ions are stored in the second ion storage region 3. It should be noted that this dynamic process naturally occurs during scanning due to the field strength settings as described above, and in actual operation, it is not necessary to know in advance when ions will be released from the storage region. That is, this process is equivalent for all ions in the scanning range, and can be applied to the scanning of non-target ions. The utilization efficiency (or duty cycle) of all ions in the scanning range is close to 100%.

[0058] Figure 7 The technical effects of the ion mobility analysis device in the first embodiment of the present application can be demonstrated. The horizontal axis is the m / z of the experimental sample, and the vertical axis is the fold increase in ion signal intensity obtained using the first embodiment (i.e., 100% duty cycle scanning) compared to the prior art (i.e., traditional scanning). Figure 7 The results for two different working periods (100 milliseconds and 250 milliseconds) are given in the middle. It can be seen that by selecting a wider mobility range for scanning, the ion signal intensity of the present embodiment is significantly improved, and the ion intensity of some samples is even improved by an order of magnitude, while the resolution remains unchanged or only slightly decreases, thereby balancing the duty cycle and resolution of the ion mobility analysis device.

[0059] Figure 8 compares the differences in operation between the prior art (reference Figure 8a ) and the ion mobility analysis device in the second embodiment of the present application. The ion mobility analyzer of this embodiment is a differential ion mobility analyzer (DMA). As shown in Figure 8b , the ion mobility analysis device provided by the second embodiment adds a first ion storage region 2 on the right and a second ion storage region 3 on the left below the ion inlet based on the traditional DMA. The scanning electric field causes the ions to pass through the DMA in turn, and the transmission and storage in the working process are basically similar to those in the UMA. Ions that do not meet the appropriate transmission conditions are temporarily stored in the first ion storage region 2, and ions that miss the appropriate transmission conditions are temporarily stored in the second ion storage region 3. When the transmission conditions are appropriate, all ions are transmitted and analyzed together.

[0060] Figure 9 For the situation when the ion mobility analysis device in the embodiment of the present invention is used in series with a mass spectrometer. The mass spectrometer in this example is a quadrupole-time of flight mass spectrometer, and the ion mobility analyzer used in the ion mobility analysis device is a U-type ion mobility analyzer 7, and the rear stage of the U-type ion mobility analyzer is followed by a quadrupole mass analyzer 8 (quadrupole mass filter), a collision chamber 9 (collision cell) and a time of flight mass spectrometer 10 (time offlight mass spectrometer). For a certain class of substances with similar chemical properties (such as lipids), since the mobility of the ion has a certain correlation with the mass-to-charge ratio (m / z), the scanning of the ion mobility can be made substantially synchronous with the scanning of the mass-to-charge ratio, that is: when the ion of a certain section or a certain mobility passes through, the condition of the quadrupole is set so that the ion within the corresponding m / z range or a certain m / z passes through. Such an operating mode can enhance the performance of many common data acquisition methods at present. For example, in data dependent acquisition (DDA), a variety of parent ions are usually selected, broken up one by one by the collision chamber, and a daughter ion spectrogram is obtained. In traditional methods, due to the low duty cycle of the ion mobility scan itself, even if synchronized with the quadrupole scan, the utilization efficiency of the parent ions is also very low. However, in an embodiment of the present invention, the ion mobility scan will not lose ions, and will not lose ions after synchronization with the quadrupole, so the quantitative ability of DDA can be greatly enhanced. In data independent acquisition (DIA), such an approach can enhance the qualitative ability of DIA. In these acquisition processes, the scanning of the ion mobility analyzer can be linear and continuous, nonlinear, or discontinuous. As long as the scanning process is unidirectional, that is, the f(t) is a monotonic function of t, a duty cycle close to 100% can be achieved, which is within the scope of protection of the present invention.

[0061] As a variation of the present invention, the ion mobility analysis device may include only the first ion storage region 2 or only the second ion storage region 3. In other words, the first ion storage region 2 and the second ion storage region 3 are combined into a single region. Compared to the prior art, even with a single ion storage region, an improvement in duty cycle can still be achieved, and such scenarios are also within the scope of the present invention.

[0062] The above embodiments are merely illustrative of the principles and effects of the present invention and are not intended to limit the present invention. Anyone skilled in the art may modify or alter the above embodiments without departing from the spirit and scope of the present invention. Therefore, all equivalent modifications or alterations made by one of ordinary skill in the art without departing from the spirit and technical principles disclosed herein are intended to be covered by the claims of the present invention.

Claims

1. An ion mobility analysis device, characterized in that: Comprising: An ion source for continuously generating ions, with the generated ions including analyte ions; A first ion storage region located downstream of the ion source; A second ion storage region located downstream of the ion source; An ion mobility analyzer located downstream of the ion source for receiving the ions generated by the ion source and performing mobility analysis; The ion mobility analyzer scans at least one working parameter f(t) during a working cycle from t0 to t1, so that ions with different mobilities pass through the ion mobility analyzer in sequence. The working parameter f(t) is a monotonic function of time t. The working parameter interval of the ion mobility analyzer is [f( tA ), f( tB )], and t0 <t A <t B <t1; The working cycle is repeated multiple times, and within each working cycle: At t0≤t <t A a stage in which at least a portion of the analyte ions filtered out by the ion mobility analyzer are transferred to and stored in the first ion storage region; At t B <During the t≤t1 stage, at least a portion of the analyte ions filtered by the ion mobility analyzer during this stage are transported and stored in the second ion storage region; In t A ≤t≤t B In this stage, the analyte ions generated by the ion source, the analyte ions stored in the first ion storage area in the same working cycle, and the analyte ions stored in the second ion storage area in the previous working cycle can pass through the ion mobility analyzer and enter the lower-level analysis device or be detected by the detector.

2. The ion mobility analysis device according to claim 1, wherein: The ion mobility analyzer includes a first channel and a second channel. When performing mobility analysis, the ions generated by the ion source sequentially pass through the first channel and the second channel, and Only ions with an ion mobility greater than a set ion mobility K1 can pass through the first channel, and only ions with an ion mobility less than a set ion mobility K2 can pass through the second channel, where K1 < K2, so that only ions with a mobility between K1 and K2 can pass through the ion mobility analyzer; Or Only ions with an ion mobility less than a set ion mobility K1 can pass through the first channel, and only ions with an ion mobility greater than a set ion mobility K2 can pass through the second channel, where K2 < K1, so that only ions with a mobility between K1 and K2 can pass through the ion mobility analyzer.

3. The ion mobility analysis device according to claim 2, wherein: Within the first channel and the second channel, there is an air flow coaxial with the ion migration direction and a DC electric field opposite to the air flow direction, and the DC electric field intensities in the first channel and the second channel are different.

4. The ion mobility analysis device according to claim 2 or 3, characterized in that: The working parameter f(t) is the electric field strength.

5. The ion mobility analysis device according to claim 2, wherein: After passing through the first channel, the ions are deflected into the second channel. The first ion storage region is located at one end of the second channel corresponding to the ion deflection, and the second ion storage region is located at one end of the first channel close to the ion inlet.

6. The ion mobility analysis device according to claim 5, characterized in that: A radio frequency electric field and a DC electric field are applied in the first ion storage region and the second ion storage region to store ions.

7. The ion mobility analysis device according to claim 4, characterized in that: The method of scanning the electric field strength is linear continuous scanning, curve continuous scanning, segmented scanning or a combination of the above scanning methods.

8. The ion mobility analysis device according to claim 1, wherein: It further includes a mass spectrometer downstream of the ion mobility analyzer.

9. The ion mobility analysis device according to claim 8, characterized in that: The mass spectrometer is a quadrupole mass analyzer or a magnetic mass spectrometer.

10. The ion mobility analysis device according to claim 8, characterized in that: In t A ≤t≤t B In the first stage, the analyte ions pass through the ion mobility analyzer and enter the mass spectrometer. At this time, the operating parameters of the mass spectrometer are also set to be suitable for the analyte ions to pass through the mass spectrometer.

11. A method for ion mobility analysis, characterized in that: Comprising: Providing an ion source for continuously generating ions, with the generated ions including analyte ions; Providing a first ion storage region located downstream of the ion source; Providing a second ion storage region located downstream of the ion source; Providing an ion mobility analyzer located downstream of the ion source for receiving the ions generated by the ion source and performing mobility analysis; The ion mobility analyzer scans at least one working parameter f(t) during a working cycle from t0 to t1, so that ions with different mobilities pass through the ion mobility analyzer in sequence. The working parameter f(t) is a monotonic function of time t. The working parameter interval of the ion mobility analyzer is [f( tA ), f( tB )], and t0 <t A <t B <t1; The working cycle is repeated multiple times, and within each working cycle: At t0≤t <t A a stage in which at least a portion of the analyte ions filtered out by the ion mobility analyzer are transferred to and stored in the first ion storage region; At t B <During the stage where t ≤ t1, at least a portion of the analyte ions filtered by the ion mobility analyzer during this stage are transmitted and stored in the second ion storage region; In t A ≤t≤t B In this stage, the analyte ions generated by the ion source, the analyte ions stored in the first ion storage area in the same working cycle, and the analyte ions stored in the second ion storage area in the previous working cycle can pass through the ion mobility analyzer and enter the lower-level analysis device or be detected by the detector.

12. The ion mobility analysis method according to claim 11, wherein: The ion mobility analyzer includes a first channel and a second channel. When performing mobility analysis, the ions generated by the ion source sequentially pass through the first channel and the second channel, and: Only ions with an ion mobility greater than the set K1 can pass through the first channel, and only ions with an ion mobility less than the set K2 can pass through the second channel, where K1 < K2, so that only ions with a mobility between K1 and K2 can pass through the ion mobility analyzer; Or Only ions with an ion mobility less than the set K1 can pass through the first channel, and only ions with an ion mobility greater than the set K2 can pass through the second channel, where K2 < K1, so that only ions with a mobility between K1 and K2 can pass through the ion mobility analyzer.

13. The ion mobility analysis method according to claim 12, wherein: Inside the first channel and the second channel, there is an air flow coaxial with the ion migration direction, and a DC electric field opposite to the air flow direction. The DC electric field intensity in the first channel is different from that in the second channel.

14. The ion mobility analysis method according to claim 12 or 13, characterized in that: The working parameter f(t) is the electric field strength.

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