Quality factor determination method, device, electronic device and storage medium

Abstract

The embodiment of the present invention discloses a quality factor determination method, device, electronic device and storage medium. The method includes: determining the logarithm expression of the ratio of the received wavelet amplitude spectrum to the source wavelet amplitude spectrum based on the attenuation relationship between the received wavelet amplitude spectrum and the source wavelet amplitude spectrum characterized by the quality factor, as the logarithmic amplitude spectrum ratio; determining the expression of the area between the logarithmic amplitude spectrum ratio corresponding to the preset frequency band range and the frequency coordinate axis as the spectrum ratio area; wherein the frequency coordinate axis is the coordinate axis representing the frequency; determining the quality factor based on the actual amplitude of the received wavelet, the actual amplitude of the source wavelet and the spectrum ratio area, so as to evaluate the geological target based on the quality factor. This technical solution reduces the influence of noise in the logarithmic amplitude spectrum ratio waveform on the subsequent calculation process by calculating the spectrum ratio area, so that the quality factor determined based on the spectrum ratio area achieves the effect of high accuracy and good stability.

Description

Technical Field

[0001] The present invention relates to the field of geological exploration technology, and in particular to a quality factor determination method, device, electronic equipment and storage medium. Background Art

[0002] The quality factor can reflect the strength of the underground medium's absorption and attenuation of seismic waves. Accurate and stable estimation of the quality factor is of great significance for improving the resolution of seismic data, accurate imaging and interpretation of geological bodies, reservoir prediction and oil field description.

[0003] The spectral ratio method is a commonly used quality factor estimation method in industry. Specifically, a linear fit is performed on the logarithm of the amplitude spectral ratio of the received wavelet (attenuated seismic wave) and the source wavelet (pre-attenuated seismic wave) within a selected frequency band. The slope of the fitted line is obtained, and the quality factor is estimated based on the relationship between the slope and the quality factor. This method is significantly affected by noise, and the resulting quality factor is less stable. Summary of the Invention

[0004] The present invention provides a quality factor determination method, device, electronic device and storage medium, which can estimate a quality factor with high stability, reduce the influence of noise on the quality factor, and improve the estimation accuracy of the quality factor.

[0005] According to one aspect of the present invention, a quality factor determination method is provided, the method comprising:

[0006] Determine an expression for the logarithm of the ratio of the received wavelet amplitude spectrum to the source wavelet amplitude spectrum based on the attenuation relationship between the received wavelet amplitude spectrum and the source wavelet amplitude spectrum characterized by the quality factor as the logarithmic amplitude spectrum ratio;

[0007] Determine an expression for the area of a region between the logarithmic amplitude spectrum ratio corresponding to a preset frequency band and the frequency coordinate axis as the spectrum ratio area; wherein the frequency coordinate axis is a coordinate axis representing frequency;

[0008] The quality factor is determined according to the actual amplitude of the received wavelet, the actual amplitude of the source wavelet and the spectral ratio area, so as to evaluate the geological target according to the quality factor.

[0009] According to another aspect of the present invention, there is provided a quality factor determination apparatus, comprising:

[0010] a logarithmic amplitude spectrum ratio determination module, configured to determine an expression for the logarithm of the ratio of the received wavelet amplitude spectrum to the source wavelet amplitude spectrum based on an attenuation relationship between the received wavelet amplitude spectrum and the source wavelet amplitude spectrum characterized by a quality factor, as the logarithmic amplitude spectrum ratio;

[0011] A spectrum ratio area determination module is used to determine an expression for the area of the region between the logarithmic amplitude spectrum ratio corresponding to a preset frequency band range and the frequency coordinate axis as the spectrum ratio area; wherein the frequency coordinate axis is a coordinate axis representing frequency;

[0012] The quality factor determination module is used to determine the quality factor according to the actual amplitude of the received wavelet, the actual amplitude of the source wavelet and the spectral ratio area, so as to evaluate the geological target according to the quality factor.

[0013] According to another aspect of the present invention, an electronic device is provided, comprising:

[0014] at least one processor; and

[0015] a memory communicatively connected to the at least one processor; wherein,

[0016] The memory stores a computer program executable by the at least one processor. The computer program is executed by the at least one processor to enable the at least one processor to perform the quality factor determination method according to any embodiment of the present invention.

[0017] According to another aspect of the present invention, a computer-readable storage medium is provided, wherein the computer-readable storage medium stores computer instructions, and the computer instructions are used to enable a processor to implement the quality factor determination method according to any embodiment of the present invention when executed.

[0018] The technical solution of the embodiment of the present application includes: determining an expression for the logarithm of the ratio of the received wavelet amplitude spectrum to the source wavelet amplitude spectrum based on the attenuation relationship between the received wavelet amplitude spectrum and the source wavelet amplitude spectrum, as the logarithmic amplitude spectrum ratio; determining an expression for the area between the logarithmic amplitude spectrum ratio corresponding to a preset frequency band and the frequency coordinate axis, as the spectrum ratio area; wherein the frequency coordinate axis is a coordinate axis representing frequency; and determining the quality factor based on the actual amplitude of the received wavelet, the actual amplitude of the source wavelet, and the spectrum ratio area, so as to evaluate geological targets based on the quality factor. By calculating the spectrum ratio area, this technical solution reduces the impact of noise in the logarithmic amplitude spectrum ratio waveform on subsequent calculation processes. In the presence of noise, some logarithmic amplitude spectrum ratios may be affected by the noise and have a larger value, while others may be affected by the noise and have a smaller value, resulting in inaccurate results when calculating the quality factor based on a single logarithmic amplitude spectrum ratio. In this embodiment, by determining the area value of the logarithmic amplitude spectral ratio within a preset frequency range, the overly large and underlying portions of the logarithmic amplitude spectral ratio are offset to a certain extent, thereby reducing the impact of noise on the subsequent quality factor calculation. This results in a quality factor determined based on the area value of the spectrum ratio, achieving high accuracy and good stability.

[0019] It should be understood that the content described in this section is not intended to identify the key or important features of the embodiments of the present invention, nor is it intended to limit the scope of the present invention. Other features of the present invention will become readily understood through the following description. BRIEF DESCRIPTION OF THE DRAWINGS

[0020] In order to more clearly illustrate the technical solutions in the embodiments of the present invention, the following briefly introduces the drawings required for use in the description of the embodiments. Obviously, the drawings described below are only some embodiments of the present invention. For ordinary technicians in this field, other drawings can be obtained based on these drawings without creative work.

[0021] Figure 1 This is a flow chart of a quality factor determination method provided in accordance with the first embodiment of the present invention;

[0022] Figure 2 1 is a schematic diagram of a spectrum ratio area according to a quality factor determination method provided in Example 1 of the present invention;

[0023] Figure 3 This is a flow chart of a quality factor determination method provided in accordance with the second embodiment of the present invention;

[0024] Figure 4 is a noise-free synthetic attenuation seismic record diagram according to a quality factor determination method provided by an embodiment of the present invention;

[0025] Figure 5 2 is a schematic diagram of a spectral ratio method for determining a quality factor according to an embodiment of the present invention;

[0026] Figure 6 is a schematic diagram of a quality factor determination method provided according to an embodiment of the present invention;

[0027] Figure 7 is a graph showing quality factor estimation results according to the spectral ratio method and quality factor determination method provided by an embodiment of the present invention;

[0028] Figure 8 A synthetic seismic record containing random noise according to a quality factor determination method provided by an embodiment of the present invention;

[0029] Figure 9 1 is a comparison diagram of an actual curve and a fitting curve of a spectral ratio method according to a quality factor determination method provided by an embodiment of the present invention;

[0030] Figure 10 is a comparison diagram of an actual curve and a fitting curve according to a quality factor determination method provided by an embodiment of the present invention;

[0031] Figure 11 is an estimation result of a quality factor according to a time-spectrum ratio method containing random noise interference and a quality factor determination method provided by an embodiment of the present invention;

[0032] Figure 12 is the mean of quality factor estimation results of a spectral ratio method and a quality factor determination method according to an embodiment of the present invention;

[0033] Figure 13 is the standard deviation of the estimation results of the spectral ratio method and the quality factor determination method according to a quality factor determination method provided by an embodiment of the present invention;

[0034] Figure 14 is an actual zero-bias VSP seismic record diagram according to a quality factor determination method provided by an embodiment of the present invention;

[0035] Figure 15 is a quality factor estimation flow chart of a quality factor determination method provided according to an embodiment of the present invention;

[0036] Figure 16 is a formation quality factor estimated by a quality factor determination method provided by an embodiment of the present invention;

[0037] Figure 17 is a schematic diagram of actual formation velocity according to a quality factor determination method provided by an embodiment of the present invention;

[0038] Figure 18 2 is a schematic structural diagram of a quality factor determination device provided in accordance with a third embodiment of the present invention;

[0039] Figure 19 The figure is a schematic structural diagram of an electronic device for implementing a quality factor determination method according to an embodiment of the present invention. DETAILED DESCRIPTION

[0040] In order to enable those skilled in the art to better understand the solutions of the present invention, the technical solutions in the embodiments of the present invention will be clearly and completely described below in conjunction with the drawings in the embodiments of the present invention. Obviously, the embodiments described are only part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without making creative efforts should fall within the scope of protection of the present invention.

[0041] It should be noted that the terms "first", "second", "target", etc. in the description and claims of the present invention and the above-mentioned drawings are used to distinguish similar objects and are not necessarily used to describe a specific order or sequence. It should be understood that the numbers used in this way can be interchanged where appropriate, so that the embodiments of the present invention described herein can be implemented in an order other than those illustrated or described herein. In addition, the terms "including" and "having" and any variations thereof are intended to cover non-exclusive inclusions. For example, a process, method, system, product or device that includes a series of steps or units is not necessarily limited to those steps or units clearly listed, but may include other steps or units that are not clearly listed or inherent to these processes, methods, products or devices.

[0042] Example 1

[0043] Figure 1 A flowchart of a quality factor determination method is provided for the first embodiment of the present invention. This embodiment is applicable to the case of estimating quality factors. The method can be performed by a quality factor determination device. The quality factor determination device can be implemented in the form of hardware and / or software. The quality factor determination device can be configured in an electronic device with data processing capabilities. Figure 1 As shown, the method includes:

[0044] S110 , determining an expression for the logarithm of the ratio of the received wavelet amplitude spectrum to the source wavelet amplitude spectrum based on the attenuation relationship between the received wavelet amplitude spectrum and the source wavelet amplitude spectrum characterized by the quality factor as a logarithmic amplitude spectrum ratio.

[0045] In embodiments of the present application, seismic waves can be artificially excited. Due to the non-perfect elasticity of the strata, the seismic waves will attenuate during propagation. Based on the attenuation of the seismic waves in the strata, embodiments of the present application can determine a quality factor, which can reflect the absorption and attenuation characteristics of the underground medium to the seismic waves. Specifically, the source wavelet amplitude spectrum can reflect the characteristics of the seismic waves before attenuation. The received wavelet amplitude spectrum can reflect the characteristics of the seismic waves after attenuation.

[0046] The attenuation relationship between the received wavelet amplitude spectrum and the source wavelet amplitude spectrum is shown below:

[0047]

[0048] where A(f) is the amplitude spectrum of the received wavelet, A0(f) is the amplitude spectrum of the source wavelet, C represents the scattering attenuation, f is the frequency, Δt is the travel time, and Q is the quality factor.

[0049] Divide A(f) by A0(f) and take the logarithm. According to the above formula, we can get the formula of logarithmic amplitude spectrum ratio:

[0050]

[0051] S120 , determining an expression for the area of a region between the logarithmic amplitude spectrum ratio corresponding to a preset frequency band and the frequency coordinate axis as the spectrum ratio area; wherein the frequency coordinate axis is a coordinate axis representing frequency.

[0052] Among them, the preset frequency band range can be a certain frequency band range of a pre-set seismic wave, such as 10 to 80 Hz, 15 to 90 Hz or 20 to 110 Hz. The embodiment of the present application does not limit the preset frequency band range. Specifically, if the regional graph between the logarithmic amplitude spectrum ratio and the frequency coordinate axis corresponding to the preset frequency band range is a standard graph, such as a rectangle, the spectrum ratio area can be obtained by calculating the area of a geometric figure. If the regional graph between the logarithmic amplitude spectrum ratio and the frequency coordinate axis corresponding to the preset frequency band range is relatively standard and can be approximated to a standard graph, such as a trapezoid, the spectrum ratio area can be approximated by calculating the area of a geometric figure.

[0053] This step is configured in this way because, in the presence of noise, some logarithmic amplitude spectrum ratios may be affected by the noise and may be too large, while others may be too small. This can lead to inaccurate results when calculating the quality factor based on a single logarithmic amplitude spectrum ratio. In this embodiment of the present application, determining the area value of the logarithmic amplitude spectrum ratio within a preset frequency range offsets the excessively large and insufficient logarithmic amplitude spectrum ratios to a certain extent, thereby reducing the impact of noise on the subsequent quality factor calculation results.

[0054] In an embodiment of the present application, optionally, determining an expression for the area of the region between the logarithmic amplitude spectrum ratio corresponding to the preset frequency band range and the frequency coordinate axis includes: taking the integral of the logarithmic amplitude spectrum ratio within the preset frequency band range as the expression for the area of the region between the logarithmic amplitude spectrum ratio corresponding to the preset frequency band range and the frequency coordinate axis.

[0055] Spectral area can be referenced Figure 2 , where the horizontal axis is frequency, the vertical axis is the logarithmic amplitude spectrum ratio, and the two end points of the preset frequency band are represented by f a and f b If f a and f b As the lower limit and upper limit of the definite integral respectively, the logarithmic amplitude spectrum ratio is integrated to obtain the spectrum ratio area of the preset frequency range, that is, the area of the dotted line part.

[0056] S130 , determining the quality factor according to the actual amplitude of the received wavelet, the actual amplitude of the source wavelet, and the spectral ratio area, so as to evaluate the geological target according to the quality factor.

[0057] Taking the propagation of seismic waves from the surface to the ground as an example, a bomb is detonated somewhere on the surface, and the seismic waves propagate from the source. After being absorbed by the strata, the seismic waves gradually attenuate. The actual amplitude of the source wavelet and the actual amplitude of the receiving wavelet are recorded before and after attenuation. Among them, the actual amplitude of the source wavelet can reflect the characteristics of the seismic wave before attenuation. The actual amplitude of the receiving wavelet can reflect the characteristics of the seismic wave after attenuation. The embodiment of the present application does not limit the acquisition position of the actual amplitude of the source wavelet and the actual amplitude of the receiving wavelet. For example, the actual amplitude of the source wavelet is acquired at 900 meters vertically downward from the source position, and the actual amplitude of the receiving wavelet can be acquired at more than 900 meters vertically downward from the source position. It should be noted that the embodiment of the present application does not limit the acquisition quantity and acquisition position of the actual amplitude of the source wavelet and the actual amplitude of the receiving wavelet. The embodiment of the present application does not limit the acquisition method of the actual amplitude of the source wavelet and the actual amplitude of the receiving wavelet, for example, it is acquired through a detector.

[0058] Specifically, the spectral ratio area of the preset frequency range can be obtained based on the actual amplitude of the received wavelet and the actual amplitude of the source wavelet within the preset frequency range. The quality factor can be determined based on the spectral ratio area, and the geology can be evaluated based on the quality factor.

[0059] In an embodiment of the present application, optionally, a parameter value in the spectral ratio area is obtained based on the actual amplitude of the received wavelet and the actual amplitude of the source wavelet corresponding to the preset frequency band range; and the quality factor is determined based on the relationship between the parameter value and the quality factor.

[0060] The logarithmic amplitude spectrum ratio is a linear function of frequency, so the logarithmic amplitude spectrum ratio can also be expressed as: L(f) = kf + b

[0061] Where, L(f)=ln[A(f) / A0(f)] is the logarithmic amplitude spectrum ratio; k is the slope, b is the intercept, b=ln(C).

[0062] In the frequency band f∈[f a , f b ]The expression of the internal spectrum ratio area:

[0063]

[0064] Where S represents the spectral ratio area, f a and f b Indicates the two end points of the preset frequency band.

[0065] Substituting L(f)=kf+b into the expression of spectral ratio area, we can get the quadratic expression of spectral ratio area:

[0066]

[0067] Specifically, the parameter value k in the spectral ratio area can be determined according to the actual amplitude of the received wavelet and the actual amplitude of the source wavelet corresponding to the preset frequency band range. The quality factor can be determined. There is no limitation on the solution method of parameter k, which can be set to multiple groups of f a and f b , and then according to the amplitude spectrum of the source wavelet f a and f b The corresponding actual amplitude and the received wavelet amplitude spectrum f a and f b The parameter value k is obtained by solving the quadratic expression of the spectral ratio area according to the corresponding actual amplitude, or by drawing a relationship curve based on multiple points and then fitting the curve relationship.

[0068] The technical solution of the embodiment of the present application includes: determining an expression for the logarithm of the ratio of the received wavelet amplitude spectrum to the source wavelet amplitude spectrum based on the attenuation relationship between the received wavelet amplitude spectrum and the source wavelet amplitude spectrum, as the logarithmic amplitude spectrum ratio; determining an expression for the area between the logarithmic amplitude spectrum ratio corresponding to a preset frequency band and the frequency coordinate axis, as the spectrum ratio area; wherein the frequency coordinate axis is a coordinate axis representing frequency; and determining the quality factor based on the actual amplitude of the received wavelet, the actual amplitude of the source wavelet, and the spectrum ratio area, so as to evaluate geological targets based on the quality factor. By calculating the spectrum ratio area, this technical solution reduces the impact of noise in the logarithmic amplitude spectrum ratio waveform on subsequent calculation processes. In the presence of noise, some logarithmic amplitude spectrum ratios may be affected by the noise and have a larger value, while others may be affected by the noise and have a smaller value, resulting in inaccurate results when calculating the quality factor based on a single logarithmic amplitude spectrum ratio. In this embodiment, by determining the area value of the logarithmic amplitude spectral ratio within a preset frequency range, the overly large and underlying portions of the logarithmic amplitude spectral ratio are offset to a certain extent, thereby reducing the impact of noise on the subsequent quality factor calculation. This results in a quality factor determined based on the area value of the spectrum ratio, achieving high accuracy and good stability.

[0069] Example 2

[0070] Figure 3 This is a flow chart of a quality factor determination method provided in the second embodiment of the present invention. This embodiment is optimized based on the above embodiment.

[0071] like Figure 3 As shown, the method of this embodiment specifically includes the following steps:

[0072] S210 , determining an expression for the logarithm of the ratio of the received wavelet amplitude spectrum to the source wavelet amplitude spectrum based on the attenuation relationship between the received wavelet amplitude spectrum and the source wavelet amplitude spectrum characterized by the quality factor as a logarithmic amplitude spectrum ratio.

[0073] S220 , determining an expression for the area of a region between the logarithmic amplitude spectrum ratio corresponding to a preset frequency band and the frequency coordinate axis as the spectrum ratio area; wherein the frequency coordinate axis is a coordinate axis representing frequency.

[0074] In the embodiment of the present application, optionally, the first endpoint frequency of the preset frequency range is a preset constant value, and the second endpoint frequency is a frequency extracted from the preset endpoint frequency range according to a preset step size.

[0075] The preset constant value, preset step size, and preset endpoint frequency range can be determined based on actual conditions and are not limited in the embodiments of the present application. The first endpoint and the second endpoint are the two end points of the preset frequency range, respectively. For example, if the first endpoint frequency is 10 Hz and the second endpoint frequency range is 50 Hz to 100 Hz, and if the preset step size is 20 Hz, then the second endpoint frequencies are 50 Hz, 70 Hz, and 90 Hz. If the first endpoint frequency is 20 Hz and the second endpoint frequency range is 50 Hz to 100 Hz, and if the preset step size is 10 Hz, then the second endpoint frequencies are 50 Hz, 60 Hz, 70 Hz, 80 Hz, 90 Hz, and 100 Hz. The preset step size can also be other values, such as 3 Hz, 5 Hz, etc. The embodiments of the present application do not limit the specific values and can be determined based on actual conditions.

[0076] S230 , transforming the quadratic expression of the spectrum ratio area to obtain a linear expression of the spectrum ratio area bandwidth ratio.

[0077] In the embodiment of the present application, the quadratic expression of the spectrum ratio area is not convenient for subsequent calculations, and can be first converted into a linear expression of the spectrum ratio area bandwidth ratio before subsequent calculations.

[0078] In an embodiment of the present application, optionally, the quadratic expression of the spectral ratio area is transformed to obtain a linear expression of the spectral ratio area bandwidth ratio, including: dividing the spectral ratio area expression by the bandwidth corresponding to a preset frequency band range to obtain a linear expression of the spectral ratio area bandwidth ratio.

[0079] The bandwidth can be the width of the preset frequency band, which can be expressed as f b -f a In the calculation of the spectrum ratio area, if f a Given a constant value, f b ∈[f0,f max ] is a variable, then the quadratic expression of the spectral ratio area is about f bDivide both sides of the quadratic expression of the spectral ratio area by the bandwidth f b -f a , we can get the linear expression of the spectrum area width ratio:

[0080]

[0081] make x=f b +f a ,x∈[f0+f a ,f max +f a ], then the linear expression of the spectrum area bandwidth ratio can be expressed as:

[0082]

[0083] S240, performing linear fitting based on the actual spectrum-area-width ratio of the received wavelet and the source wavelet corresponding to the preset frequency band range to obtain a straight-line expression for the spectrum-area-width ratio; determining the slope of the straight-line expression; and determining the quality factor based on the relationship between the slope and the quality factor.

[0084] Among them, the straight line expression can be obtained by linear fitting based on the actual spectral area-width ratio of the received wavelet and the source wavelet corresponding to the preset frequency band range. For example, at least two point coordinates are obtained based on the actual spectral area-width ratio of the received wavelet and the source wavelet corresponding to at least two preset frequency band ranges, and a straight line expression can be linearly fitted based on the point coordinates.

[0085] Specifically, the slope of the straight line expression is k', because The quality factor estimation formula can be derived: The quality factor can be determined based on the estimation formula and the slope k'. It should be noted that in the process of obtaining the linear expression based on the linear fitting of the actual spectrum area-width ratio of the receiving wavelet and the source wavelet corresponding to the preset frequency band range, it is necessary to satisfy x∈[f0+f a ,f max +f a ] conditions, and the embodiment of the present application does not limit the number of point coordinates of the fitting straight line expression.

[0086] The technical solution of the present embodiment performs a linear fit based on the actual amplitude of the received wavelet corresponding to a preset frequency band and the actual amplitude of the source wavelet to obtain a straight line expression; determines the slope of the straight line expression; and determines the quality factor based on the relationship between the slope and the quality factor. This improves the estimation accuracy and stability of the quality factor.

[0087] It should be noted that, in each comparative example, Figure 5 and Figure 9The logarithmic spectrum ratio in is the logarithmic amplitude spectrum ratio in the above embodiment, and the expression is Figure 6 and Figure 10 The spectrum ratio area bandwidth ratio in the above embodiment is The linear fitting curve obtained by the quality factor determination method described in the embodiment of the present application is called: spectrum ratio area bandwidth ratio; the quality factor is expressed as: Q.

[0088] This comparative example uses noiseless synthetic attenuation seismic records to verify the method described in the embodiment of this application, such as Figure 4 As shown in the figure, the source wavelet in the synthetic record is a Ricker wavelet with a main frequency of 45 Hz, located at 150 ms; the attenuated receiver wavelet is located at 450 ms. The Q value in the synthetic record is 100.

[0089] based on Figure 4 Synthesize attenuation seismic records, select the spectral ratio method and the quality factor determination method described in the embodiment of this application to estimate the quality factor and compare them. The spectral ratio method calculates the frequency band of 10-100 Hz. The f of the quality factor determination method described in the embodiment of this application is a =10Hz, f b The value range is 50-100Hz, that is, x∈[60Hz,110Hz]. Figure 5 represents the linear fitting graph obtained by the spectral ratio method, Figure 6 The linear fitting diagram obtained by the quality factor determination method described in the embodiment of the present application is shown in FIG. Figure 7 As shown. Figure 7 It can be seen that the estimated results of the two methods are very close to the theoretical values without noise interference and have high accuracy.

[0090] This comparative example adds Gaussian random noise to the synthetic record to test the stability of the spectrum ratio method and the quality factor determination method described in the embodiment of this application. Figure 4 Gaussian random noise is added to the seismic wave shown in the figure, and the signal-to-noise ratio SNR is 15dB. Figure 8 The frequency bands of the quality factors calculated by the two methods are consistent with the above comparative example. Figure 9 represents the linear fitting graph obtained by the spectral ratio method, Figure 10 It represents the linear fitting graph obtained by the quality factor determination method described in the embodiment of the present application.

[0091] from Figure 9 As can be seen from the figure, the perturbation of the log spectrum ratio curve is very obvious. Figure 10 The perturbation phenomenon of the spectrum ratio area bandwidth ratio curve is significantly weakened. The quality factor obtained by the spectrum ratio method and the quality factor determination method described in the embodiment of the present application is as follows Figure 11By comparison, it can be found that the result estimated by the quality factor determination method described in the embodiment of the present application is closer to the theoretical value of 100, while the result estimated by the spectral ratio method deviates greatly from the theoretical value.

[0092] In addition, due to the randomness of random noise interference, the stability of the quality factors estimated by the two methods was compared by statistical analysis. The frequency band selection was consistent with the previous test, and 1000 independent tests were performed. The results of the quality factor estimated by statistical analysis are as follows: Figure 12 is the average quality factor obtained from 1000 independent tests; Figure 13 is the standard deviation of the quality factor obtained from 1000 independent experiments.

[0093] from Figure 12 It can be seen from the mean value graph that the mean value of the quality factor obtained by the quality factor determination method described in the embodiment of the present application is close to the theoretical value, and the mean value of the quality factor obtained by the spectral ratio method deviates greatly from the theoretical value; Figure 13 The results show that the standard deviation of the quality factor estimated by the quality factor determination method described in the embodiment of the present application is smaller than that of the spectral ratio method. The results of random noise testing show that the stability of the quality factor estimated by the quality factor determination method described in the embodiment of the present application is significantly better than that of the spectral ratio method, and its noise resistance is significantly enhanced.

[0094] The quality factor determination method described in the embodiment of the present application is applied to actual zero-bias VSP seismic data, wherein the actual zero-bias VSP seismic data may be seismic data that records the portion of seismic waves that propagate perpendicular to the ground. Figure 14 The data are actual zero-bias VSP data from an oilfield. The detectors are arranged at depths of 900-1720m, with a trace spacing of 20m and a total of 41 traces.

[0095] like Figure 15 As shown, S310, obtain the original zero-bias VSP seismic data. S320, obtain the VSP downlink wave field. Perform wave field separation on the original zero-bias VSP data to obtain the downlink wave field, which can be the wave field in the seismic wave that is perpendicular to the ground and downward. S330, obtain the VSP first arrival wave. Select the first measured seismic wave from the downlink wave field as the first arrival wave. S340, extract the first arrival wave amplitude spectrum. Perform Fourier transform on the first arrival wave to obtain the seismic wave in the frequency domain. S350, calculate the logarithmic amplitude spectrum ratio. Based on the first arrival wave amplitude spectrum, select the frequency band f a =10Hz, f b Calculate the logarithmic amplitude spectrum ratio (LASR) within the range of 40-80 Hz, i.e., x∈[50 Hz, 90 Hz]. S360: Calculate the spectral ratio area. Integrate the LAR over the preset frequency band to obtain the spectral ratio area. S370: Estimate the quality factor. The quality factor is determined based on the actual amplitude of the received wavelet, the actual amplitude of the source wavelet, and the spectral ratio area-width ratio.

[0096] Figure 16 is the formation quality factor estimated by the quality factor determination method described in the embodiment of the present application, Figure 17 is the formation velocity. Comparing the formation quality factor and velocity curve, it can be seen that the change trend of the formation quality factor is well correlated with the formation velocity, which is consistent with actual laws. For the shallow low-velocity part, the attenuation is strong, and the estimated quality factor is relatively small; both the formation velocity and the quality factor show an increasing trend with increasing depth. Based on this comparative example, it can be determined that the quality factor determination method described in the embodiment of the present application can effectively estimate the formation quality factor.

[0097] Example 3

[0098] Figure 18 This is a schematic diagram of the structure of a quality factor determination device provided in the third embodiment of the present invention. The device can execute the quality factor determination method provided in any embodiment of the present invention and has the corresponding functional modules and beneficial effects of the execution method. Figure 18 As shown, the device includes:

[0099] a logarithmic amplitude spectrum ratio determination module 410 for determining an expression for the logarithm of the ratio of the received wavelet amplitude spectrum to the source wavelet amplitude spectrum based on an attenuation relationship between the received wavelet amplitude spectrum and the source wavelet amplitude spectrum characterized by a quality factor, as the logarithmic amplitude spectrum ratio;

[0100] The spectrum ratio area determination module 420 is configured to determine an expression for the area of the region between the logarithmic amplitude spectrum ratio corresponding to a preset frequency band and the frequency coordinate axis as the spectrum ratio area; wherein the frequency coordinate axis is a coordinate axis representing frequency;

[0101] The quality factor determination module 430 is configured to determine the quality factor according to the actual amplitude of the received wavelet, the actual amplitude of the source wavelet, and the spectral ratio area, so as to evaluate the geological target according to the quality factor.

[0102] Optionally, the spectrum ratio area determination module 420 is specifically configured to:

[0103] The integral of the logarithmic amplitude spectrum ratio within the preset frequency band is used as an expression for the area of the region between the logarithmic amplitude spectrum ratio corresponding to the preset frequency band and the frequency coordinate axis.

[0104] Optionally, the quality factor determination module 430 includes:

[0105] a parameter value solving unit, configured to solve and obtain the parameter value in the spectral ratio area according to the actual amplitude of the received wavelet and the actual amplitude of the source wavelet corresponding to the preset frequency band range;

[0106] The quality factor determining unit is configured to determine the quality factor according to a relationship between the parameter value and the quality factor.

[0107] Optionally, the device further includes:

[0108] The linear expression conversion module is used to transform the quadratic expression of the spectrum ratio area to obtain a linear expression of the spectrum ratio area bandwidth ratio.

[0109] Optional linear expression conversion modules include:

[0110] The linear expression conversion unit is used to divide the spectrum ratio area expression by the bandwidth corresponding to the preset frequency band range to obtain a linear expression of the spectrum ratio area bandwidth ratio.

[0111] Optionally, the device further includes:

[0112] A linear fitting module is used to perform linear fitting based on the actual spectrum area-width ratio of the received wavelet and the source wavelet corresponding to the preset frequency band range to obtain a linear expression for the spectrum area-width ratio;

[0113] A slope determination module, configured to determine the slope of the straight line expression;

[0114] The quality factor determination unit is specifically used for:

[0115] The quality factor is determined according to the relationship between the slope and the quality factor.

[0116] Optionally, the first endpoint frequency of the preset frequency range is a preset constant value, and the second endpoint frequency is a frequency extracted from the preset endpoint frequency range according to a preset step size.

[0117] A quality factor determination device provided in an embodiment of the present invention can execute a quality factor determination method provided in any embodiment of the present invention, and has corresponding functional modules and beneficial effects of the execution method.

[0118] Example 4

[0119] Figure 19 A schematic diagram of the structure of an electronic device 10 that can be used to implement an embodiment of the present invention is shown. The electronic device is intended to represent various forms of digital computers, such as laptop computers, desktop computers, workstations, personal digital assistants, servers, blade servers, mainframe computers, and other suitable computers. The electronic device can also represent various forms of mobile devices, such as personal digital processing, cellular phones, smart phones, wearable devices (such as helmets, glasses, watches, etc.) and other similar computing devices. The components shown herein, their connections and relationships, and their functions are merely examples and are not intended to limit the implementation of the present invention described and / or claimed herein.

[0120] like Figure 19 As shown, the electronic device 10 includes at least one processor 11 and a memory, such as a read-only memory (ROM) 12, a random access memory (RAM) 13, etc., which is communicatively connected to the at least one processor 11. The memory stores a computer program that can be executed by the at least one processor. The processor 11 can perform various appropriate actions and processes according to the computer program stored in the read-only memory (ROM) 12 or the computer program loaded from the storage unit 18 into the random access memory (RAM) 13. Various programs and data required for the operation of the electronic device 10 can also be stored in the RAM 13. The processor 11, ROM 12, and RAM 13 are connected to each other via a bus 14. An input / output (I / O) interface 15 is also connected to the bus 14.

[0121] Multiple components in the electronic device 10 are connected to the I / O interface 15, including an input unit 16, such as a keyboard, a mouse, etc.; an output unit 17, such as various types of displays, speakers, etc.; a storage unit 18, such as a magnetic disk, an optical disk, etc.; and a communication unit 19, such as a network card, a modem, a wireless communication transceiver, etc. The communication unit 19 allows the electronic device 10 to exchange information / data with other devices via a computer network such as the Internet and / or various telecommunication networks.

[0122] The processor 11 may be any general-purpose and / or specialized processing component with processing and computing capabilities. Some examples of the processor 11 include, but are not limited to, a central processing unit (CPU), a graphics processing unit (GPU), various specialized artificial intelligence (AI) computing chips, various processors running machine learning model algorithms, a digital signal processor (DSP), and any appropriate processor, controller, microcontroller, etc. The processor 11 executes the various methods and processes described above, such as the quality factor determination method.

[0123] In some embodiments, the quality factor determination method may be implemented as a computer program tangibly embodied in a computer-readable storage medium, such as the storage unit 18. In some embodiments, part or all of the computer program may be loaded and / or installed on the electronic device 10 via the ROM 12 and / or the communication unit 19. When the computer program is loaded into the RAM 13 and executed by the processor 11, one or more steps of the quality factor determination method described above may be performed. Alternatively, in other embodiments, the processor 11 may be configured to perform the quality factor determination method in any other appropriate manner (e.g., by means of firmware).

[0124] Various embodiments of the systems and techniques described herein can be implemented in digital electronic circuit systems, integrated circuit systems, field programmable gate arrays (FPGAs), application specific integrated circuits (ASICs), application specific standard products (ASSPs), system-on-chip systems (SOCs), programmable logic devices (CPLDs), computer hardware, firmware, software, and / or combinations thereof. These various embodiments can include being implemented in one or more computer programs that are executable and / or interpreted on a programmable system that includes at least one programmable processor, which can be a special purpose or general purpose programmable processor that can receive data and instructions from a storage system, at least one input device, and at least one output device, and transmit data and instructions to the storage system, the at least one input device, and the at least one output device.

[0125] Computer programs for implementing the methods of the present invention may be written in any combination of one or more programming languages. These computer programs may be provided to a processor of a general-purpose computer, a special-purpose computer, or other programmable data processing device, such that when the computer program is executed by the processor, the functions / operations specified in the flowcharts and / or block diagrams are implemented. The computer program may be executed entirely on the machine, partially on the machine, as a stand-alone software package, partially on the machine and partially on a remote machine, or entirely on a remote machine or server.

[0126] In the context of the present invention, computer-readable storage media can be tangible media that can contain or store a computer program for use with an instruction execution system, device or equipment or used in combination with an instruction execution system, device or equipment. Computer-readable storage media can include but are not limited to electronic, magnetic, optical, electromagnetic, infrared or semiconductor systems, devices or equipment, or any suitable combination of the foregoing. Alternatively, computer-readable storage media can be machine-readable signal media. More specific examples of machine-readable storage media can include electrical connections based on one or more lines, portable computer disks, hard disks, random access memories (RAM), read-only memories (ROM), erasable programmable read-only memories (EPROM or flash memory), optical fibers, portable compact disk read-only memories (CD-ROM), optical storage devices, magnetic storage devices, or any suitable combination of the foregoing.

[0127] To provide interaction with a user, the systems and techniques described herein can be implemented on an electronic device having: a display device (e.g., a CRT (cathode ray tube) or LCD (liquid crystal display) monitor) for displaying information to the user; and a keyboard and pointing device (e.g., a mouse or trackball) through which the user can provide input to the electronic device. Other types of devices can also be used to provide interaction with the user; for example, the feedback provided to the user can be any form of sensory feedback (e.g., visual feedback, auditory feedback, or tactile feedback); and input from the user can be received in any form (including acoustic input, voice input, or tactile input).

[0128] The systems and techniques described herein can be implemented in a computing system that includes back-end components (e.g., as a data server), or a computing system that includes middleware components (e.g., an application server), or a computing system that includes front-end components (e.g., a user computer with a graphical user interface or web browser through which a user can interact with implementations of the systems and techniques described herein), or a computing system that includes any combination of such back-end components, middleware components, or front-end components. The components of the system can be interconnected by any form or medium of digital data communication (e.g., a communication network). Examples of communication networks include: a local area network (LAN), a wide area network (WAN), a blockchain network, and the Internet.

[0129] A computing system may include clients and servers. The clients and servers are typically remote from each other and typically interact via a communication network. This client-server relationship arises through computer programs running on the respective computers, creating a client-server relationship. The server may be a cloud server, also known as a cloud computing server or cloud host. This server is a hosting product within the cloud computing service ecosystem that addresses the management difficulties and limited scalability of traditional physical hosting and VPS services.

[0130] It should be understood that the various forms of the processes shown above can be used to reorder, add, or delete steps. For example, the steps described in the present invention can be performed in parallel, sequentially, or in a different order, as long as the desired results of the technical solution of the present invention can be achieved. This is not limited herein.

[0131] The above specific embodiments do not limit the scope of protection of the present invention. Those skilled in the art will appreciate that various modifications, combinations, sub-combinations, and substitutions may be made based on design requirements and other factors. Any modifications, equivalent substitutions, and improvements made within the spirit and principles of the present invention are intended to be included within the scope of protection of the present invention.

Claims

1. A quality factor determination method, characterized in that: include: Determine an expression for the logarithm of the ratio of the received wavelet amplitude spectrum to the source wavelet amplitude spectrum based on the attenuation relationship between the received wavelet amplitude spectrum and the source wavelet amplitude spectrum characterized by the quality factor as the logarithmic amplitude spectrum ratio; Determine an expression for the area between the logarithmic amplitude spectrum ratio corresponding to the preset frequency band range and the frequency coordinate axis as the spectrum ratio area; wherein the frequency coordinate axis is a coordinate axis representing frequency; the expression for the spectrum ratio area is: Where S represents the spectral ratio area, L(f) = ln[A(f) / A0(f)] is the logarithmic amplitude spectrum ratio, A(f) is the amplitude spectrum of the receiving wavelet, A0(f) is the amplitude spectrum of the source wavelet, and f a and f b Indicates the two end point frequencies of the preset frequency band range; the first end point frequency of the preset frequency band range is a preset constant value, and the second end point frequency is a frequency extracted from the preset end point frequency range according to a preset step size; Determining the quality factor according to the actual amplitude of the received wavelet, the actual amplitude of the source wavelet, and the spectral ratio area, so as to evaluate the geological target according to the quality factor; The quality factor is determined according to the actual amplitude of the received wavelet, the actual amplitude of the source wavelet, and the spectral ratio area, including: Obtaining parameter values in the spectral ratio area by solving the actual amplitude of the received wavelet and the actual amplitude of the source wavelet corresponding to the preset frequency band range; determining the quality factor according to a relationship between the parameter value and the quality factor; Wherein, the parameter value k is: Wherein, Δt is the travel time, Q is the quality factor, and the parameter value k is calculated based on the quadratic expression of the spectral ratio area, which is: The quadratic expression of the spectrum ratio area is obtained by substituting the logarithmic amplitude spectrum ratio expressed as: L(f)=kf+b into the spectrum ratio area; wherein b is the intercept.

2. The method according to claim 1, characterized in that Before determining the quality factor based on the actual amplitude of the received wavelet, the actual amplitude of the source wavelet, and the spectral ratio area, the method further includes: The quadratic expression of the spectrum ratio area is transformed to obtain a linear expression of the spectrum ratio area bandwidth ratio.

3. The method according to claim 2, characterized in that The quadratic expression of the spectrum ratio area is transformed to obtain a linear expression of the spectrum ratio area bandwidth ratio, including: The quadratic expression of the spectrum ratio area is divided by the bandwidth corresponding to the preset frequency band range to obtain a linear expression of the spectrum ratio area bandwidth ratio.

4. The method according to claim 3, characterized in that After obtaining the linear expression of the spectrum ratio area bandwidth ratio, the method further includes: Perform linear fitting based on the spectrum area width ratio of the receiving wavelet and the source wavelet corresponding to the preset frequency band range to obtain a linear expression for the spectrum area width ratio; determining the slope of the straight line expression; Determining the quality factor according to a relationship between the parameter value and the quality factor includes: The quality factor is determined according to the relationship between the slope and the quality factor.

5. A quality factor determination device, characterized in that: include: a logarithmic amplitude spectrum ratio determination module, configured to determine an expression for the logarithm of the ratio of the received wavelet amplitude spectrum to the source wavelet amplitude spectrum based on an attenuation relationship between the received wavelet amplitude spectrum and the source wavelet amplitude spectrum characterized by a quality factor, as the logarithmic amplitude spectrum ratio; The spectrum ratio area determination module is used to determine the expression of the area between the logarithmic amplitude spectrum ratio corresponding to the preset frequency band range and the frequency coordinate axis as the spectrum ratio area; wherein the frequency coordinate axis is the coordinate axis representing the frequency; the expression of the spectrum ratio area is: Where S represents the spectral ratio area, L(f) = ln[A(f) / A0(f)] is the logarithmic amplitude spectrum ratio, A(f) is the amplitude spectrum of the receiving wavelet, A0(f) is the amplitude spectrum of the source wavelet, and f a and f b Indicates the two end point frequencies of the preset frequency band range; the first end point frequency of the preset frequency band range is a preset constant value, and the second end point frequency is a frequency extracted from the preset end point frequency range according to a preset step size; a quality factor determination module, configured to determine the quality factor according to the actual amplitude of the received wavelet, the actual amplitude of the source wavelet, and the spectral ratio area, so as to evaluate the geological target according to the quality factor; The quality factor determination module includes: a parameter value solving unit, configured to solve and obtain the parameter value in the spectral ratio area according to the actual amplitude of the received wavelet and the actual amplitude of the source wavelet corresponding to the preset frequency band range; a quality factor determining unit, configured to determine the quality factor according to a relationship between the parameter value and the quality factor; Wherein, the parameter value k is: Wherein, Δt is the travel time, Q is the quality factor, and the parameter value k is calculated based on the quadratic expression of the spectral ratio area, which is: The quadratic expression of the spectrum ratio area is obtained by substituting the logarithmic amplitude spectrum ratio expressed as: L(f)=kf+b into the spectrum ratio area; wherein b is the intercept.

6. An electronic device, characterized in that: The electronic device comprises: at least one processor; and a memory communicatively connected to the at least one processor; wherein, The memory stores a computer program executable by the at least one processor. The computer program is executed by the at least one processor to enable the at least one processor to perform the quality factor determination method according to any one of claims 1 to 4.

7. A computer-readable storage medium, characterized in that The computer-readable storage medium stores computer instructions, and the computer instructions are used to enable a processor to implement the quality factor determination method according to any one of claims 1 to 4 when executed.

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