An automatic test method for satellite platform electronics and its related components

Abstract

The present invention discloses an automatic testing method for satellite platform electronics and related components, which relates to the field of satellite testing. When receiving a user instruction, a test instruction is generated according to the user instruction. When it is determined that the test instruction is a correct instruction, a test task chain corresponding to the test instruction is generated, and the test task chain is sent to the platform electronics so that the platform electronics can execute all corresponding test tasks according to the test task chain. Finally, the test result data of the test tasks of the platform electronics is obtained for display. Since the test task chain is generated according to the test instruction and different platform electronics have different test instructions, different test task chains can be generated according to the types of platform electronics. After the test task chain is sent to the platform electronics, the platform electronics will automatically execute the test tasks, eliminating the need for manual testing, improving the testing efficiency, reducing the workload and testing threshold, avoiding the situation of accidental touch, and can also be applied to testing in special environments.

Description

Technical Field

[0001] The present invention relates to the field of satellite testing, and particularly to an automatic testing method for satellite platform electronics and related components thereof. Background Art

[0002] Platform electronics are some functional modules installed in satellites. For example, functions such as satellite control, communication, and acquisition are all realized by various platform electronics. Before the platform electronics are put into use, it is necessary to conduct interface electrical signal testing on the platform electronics to verify whether the functions of the platform electronics are normal. In the prior art, manual testing is usually adopted, but manual testing has the following disadvantages:

[0003] 1. Since satellites and platform electronics tend to be mass-produced, manual testing not only requires a large amount of work but also has low efficiency;

[0004] 2. Since the platform electronics used in different satellites are different, it is also necessary for the staff to understand the circuit structures of various platform electronics and the corresponding testing methods, and the testing threshold is relatively high;

[0005] 3. When testing the platform electronics, it involves vacuum environment testing and special environment testing such as high temperature or low temperature. It is difficult for the staff to conduct manual testing in such special environments;

[0006] 4. The integration degree of platform electronics is usually relatively high. During manual testing, it is easy to accidentally touch other electronic components in the platform electronics, resulting in the risk of damage to the electronic components. Summary of the Invention

[0007] The purpose of the present invention is to provide an automatic testing method for satellite platform electronics and related components thereof, which does not require manual testing, does not require the staff to understand the circuit structures of various platform electronics and the corresponding testing methods, improves the testing efficiency, reduces the workload and testing threshold, avoids the situation of accidental touch, and can also be applied to testing in special environments.

[0008] To solve the above technical problems, the present invention provides an automatic testing method for satellite platform electronics, which is applied to a processor in a host computer. The host computer is connected to the platform electronics. The testing method for the satellite platform electronics includes:

[0009] When receiving a user instruction, generating a test instruction according to the user instruction;

[0010] Judging whether the test instruction is a correct instruction;

[0011] If the test instruction is a correct instruction, generating a test task chain corresponding to the test instruction;

[0012] Send the test task chain to the platform electronics so that the platform electronics can execute all corresponding test tasks according to the test task chain;

[0013] Determine the test result data of the platform electronics executing the test tasks and display it.

[0014] Preferably, generating a test task chain corresponding to the test instruction includes:

[0015] Determine all the interfaces to be tested on the platform electronics corresponding to the test instruction;

[0016] Determine the preset test tasks corresponding to each of the interfaces to be tested;

[0017] Sort each of the preset test tasks in sequence according to the preset task order;

[0018] Take each of the preset test tasks after sorting as the test task chain.

[0019] Preferably, determining whether the test instruction is a correct instruction includes:

[0020] Determine whether the unique identifier in the test instruction is consistent with the preset identifier;

[0021] If they are consistent, determine that the test instruction is a correct instruction;

[0022] If they are not consistent, determine that the test instruction is not a correct instruction.

[0023] Preferably, determining whether the test instruction is a correct instruction includes:

[0024] Determine whether all the test tasks corresponding to the test instruction exist in the preset task library;

[0025] If they all exist in the preset task library, determine that the test instruction is a correct instruction;

[0026] Otherwise, determine that the test instruction is not a correct instruction.

[0027] Preferably, before sending the test task chain to the platform electronics, it further includes:

[0028] Determine whether the test instruction contains a loop signal;

[0029] If it does not contain the loop signal, enter the step of sending the test task chain to the platform electronics;

[0030] If it contains the loop signal, send the test task chain with the preset loop times corresponding to the loop signal to the platform electronics.

[0031] Preferably, if the test result data of any one of the test tasks is test result data indicating a test failure, after determining and displaying the test result data of the test task executed by the platform electronics, the method further includes:

[0032] When a retest instruction is received, all the test tasks corresponding to the test result data indicating a test failure are used as retest tasks;

[0033] Generate a retest task chain including all the retest tasks, and send the retest task chain to the platform electronics so that the platform electronics can execute all the corresponding retest tasks according to the retest task chain;

[0034] Determine and display the test result data of the retest tasks executed by the platform electronics.

[0035] Preferably, if the test instruction is not a correct instruction, the method further includes:

[0036] Generate an alarm signal indicating that the test instruction is incorrect and send it to the prompt module so that the prompt module can give a prompt.

[0037] Preferably, the method further includes:

[0038] When a hardware status detection instruction is received, send the hardware status detection instruction to the platform electronics to detect the hardware status of the platform electronics;

[0039] Determine and display the hardware status detection result of the platform electronics.

[0040] This application also provides an automatic test device for satellite platform electronics, including:

[0041] A memory for storing a computer program;

[0042] A processor for implementing the steps of the automatic test method for satellite platform electronics as described above when executing the computer program.

[0043] This application also provides a computer-readable storage medium, on which a computer program is stored, and when the computer program is executed by a processor, the steps of the automatic test method for satellite platform electronics as described above are implemented.

[0044] The present invention provides an automatic testing method for satellite platform electronics and related components, which relates to the field of satellite testing. When a user instruction is received, a test instruction is generated according to the user instruction. When it is determined that the test instruction is a correct instruction, a test task chain corresponding to the test instruction is generated, and the test task chain is sent to the platform electronics so that the platform electronics can execute all corresponding test tasks according to the test task chain. Finally, the test result data of the test tasks of the platform electronics is obtained for display. Since the test task chain is generated according to the test instruction and different platform electronics have different test instructions, different test task chains can be generated according to the types of platform electronics. After the test task chain is sent to the platform electronics, the platform electronics will automatically execute the test tasks, without the need for manual testing, and without the need for staff to understand the circuit structures of various platform electronics and the corresponding testing methods, improving the testing efficiency, reducing the workload and testing threshold, avoiding the situation of accidental touch, and can also be applied to testing in special environments. BRIEF DESCRIPTION OF THE DRAWINGS

[0045] In order to more clearly illustrate the technical solutions in the embodiments of the present invention, the accompanying drawings required for use in the prior art and the embodiments will be briefly introduced below. Obviously, the accompanying drawings in the following description are only some embodiments of the present invention. For those of ordinary skill in the art, other drawings can be obtained based on these drawings without creative efforts.

[0046] Figure 1 It is a flowchart of an automatic testing method for satellite platform electronics provided by the present application;

[0047] Figure 2 It is a schematic diagram of a test task chain provided by the present application;

[0048] Figure 3 It is a flowchart of a test program for platform electronics provided by the present application;

[0049] Figure 4 It is a schematic structural diagram of an automatic testing device for satellite platform electronics provided by the present application. DETAILED DESCRIPTION OF THE EMBODIMENTS

[0050] The core of the present invention is to provide an automatic testing method for satellite platform electronics and related components, which does not require manual testing, does not require staff to understand the circuit structures of various platform electronics and the corresponding testing methods, improves the testing efficiency, reduces the workload and testing threshold, avoids the situation of accidental touch, and can also be applied to testing in special environments.

[0051] To make the objectives, technical solutions and advantages of the embodiments of the present invention clearer, the technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings in the embodiments of the present invention. Apparently, the described embodiments are some but not all of the embodiments of the present invention. All other embodiments obtained by those of ordinary skill in the art based on the embodiments of the present invention without creative efforts shall fall within the protection scope of the present invention.

[0052] Please refer to Figure 1 , Figure 1 which is a flowchart of an automatic test method for satellite platform electronics provided by this application, and is applied to a processor in a host computer. The host computer is connected to the platform electronics. The test method for the satellite platform electronics includes:

[0053] S1: When a user instruction is received, generate a test instruction according to the user instruction;

[0054] S2: Determine whether the test instruction is a correct instruction;

[0055] When the host computer generates a test instruction according to the user instruction, due to reasons such as interference or faults, the test instruction generated by the host computer may not be a test instruction that the platform electronics can normally execute. If the platform electronics execute this incorrect test instruction, it may cause the test instruction not to be executed, or even lead to a logical error of the platform electronics. Therefore, after generating the test instruction, the host computer needs to first determine whether the test instruction is a correct instruction.

[0056] S3: If the test instruction is a correct instruction, generate a test task chain corresponding to the test instruction;

[0057] Considering that in actual application scenarios, the platform electronics need to be tested multiple times and in multiple aspects, the user will specify multiple test tasks and the execution order of the tasks according to the actual model of the platform electronics and the content to be tested, so that the platform electronics can be tested according to the content specified by the user. It can be seen that there may be a situation where one test instruction corresponds to multiple test tasks. When this situation occurs, it is necessary to splice the multiple test tasks corresponding to the test instruction to generate a test task chain corresponding to the test instruction. Figure 2A schematic diagram of a test task chain provided for this application. When the test instruction corresponds to four test tasks: CAN (Controller Area Network) bus test, PPS (Pulse Per Second) test, UART (Universal Asynchronous Receiver Transmitter) serial port test, and OC (Open Collector) test, and the user specifies the execution order of the tasks as CAN bus test -> PPS test -> UART serial port test -> OC test, then when the platform electronics receive this test instruction, a test task chain with the execution order of CAN bus test -> PPS test -> UART serial port test -> OC test will be generated, so as to execute each test task according to this execution order subsequently.

[0058] S4: Send the test task chain to the platform electronics so that the platform electronics can execute all corresponding test tasks according to the test task chain;

[0059] Testing the platform electronics usually requires using the interfaces on the platform electronics for testing. Therefore, unified testing of the same type of interfaces can be performed according to the interface type. Store in advance in the host computer the test tasks for interface full coverage in various platform electronics and the combined states of multiple platform electronics to support the testing of various platform electronics. When conducting the test, each test task can be executed sequentially, or multiple test tasks can be executed simultaneously. This application does not make any restrictions on this. Since the conventional satellite platform electronics on-board computer software includes many functions, such as attitude control, orbit control, single machine or sensor data parsing and processing, temperature control, and satellite maneuver control, etc., this software can be installed in the platform electronics as the test software so that the platform electronics can perform tests according to the test instructions sent by the host computer. Please refer to Figure 3 , Figure 3The flowchart of a test program for platform electronics provided by this application can be used as a simplified spacecraft computer program to cooperate with the test program of the host computer for testing, realizing the data feedback of data communication interfaces, data acquisition of acquisition interfaces, and control output of control interfaces on the platform electronics. The telemetry data of the platform electronics is used as the test result data of the test task, and the data output by various interfaces of the platform electronics can also be obtained to determine whether the host computer is connected to the platform electronics. In addition, when multiple platform electronics modules are spliced together, it can also be determined whether the splicing between the platform electronics modules is normal. Specifically, if a telemetry data frame with the correct frame length and correct check is parsed, it can be determined that these platform electronics modules are normally spliced. When multiple platform electronics modules are spliced together, the platform electronics module responsible for the spacecraft function can be used as the main platform electronics module, and all other platform electronics modules can be used as secondary platform electronics modules. Then, the telemetry data of all other secondary platform electronics modules is sent to the main platform electronics module so that the host computer can obtain the telemetry data of all platform electronics modules through the main platform electronics module.

[0060] S5: Determine the test result data of the platform electronics for the test task and display it.

[0061] When performing the test task, considering that the data transmission between the platform electronics and the host computer needs to pass through the communication interface, that is, the host computer needs to pass through the communication interface when sending test instructions to the platform electronics or the platform electronics sends test result data to the host computer. To ensure the smoothness of the communication interface and the correctness of data transmission, and to avoid data errors caused by multiple data entering the communication interface at the same time, when performing all corresponding test tasks, each test task can be executed in sequence according to the arrangement order of the test task chain, and after the execution is completed, the host computer generates the test result data of this test task, and then executes the next test task; or multiple test tasks can be executed simultaneously, and then the test result data of each test task is generated in sequence according to the order of the test tasks. During the test process, if it is detected that an error occurs in this test task, such as the test fails or the test instruction is incorrect, etc., the test result data indicating this error situation will be generated so that the staff can timely discover the existing error.

[0062] The host computer receives data in real time. After determining the test result data of the platform electronics, it will display the test result data on the display screen through software so that the test personnel can make error judgments based on the test result data, manually observe or check the interface path of the test problem and repair it.

[0063] In addition, when testing the platform electronics, the platform electronics itself can be placed in the test environment, and then the host computer can be placed in the room temperature environment. The two are connected through a communication line to simply achieve the testing of the platform electronics in a special environment. In order to reduce the operation difficulty of the staff, a PC (Personal Computer) or other personal terminal can also be set to be connected to the host computer, so that the user can operate the host computer through the software on the PC, and then achieve the testing of the platform electronics.

[0064] In summary, when receiving a user instruction, a test instruction is generated according to the user instruction. When it is determined that the test instruction is a correct instruction, a test task chain corresponding to the test instruction is generated, and the test task chain is sent to the platform electronics, so that the platform electronics can execute all corresponding test tasks according to the test task chain. Finally, the test result data of the test tasks of the platform electronics is obtained for display. Since the test task chain is generated according to the test instruction and different platform electronics have different test instructions, different test task chains can be generated according to the types of platform electronics. After the test task chain is sent to the platform electronics, the platform electronics will automatically execute the test tasks, without the need for manual testing, nor does the staff need to understand the circuit structures of various platform electronics and the corresponding test methods, which improves the test efficiency, reduces the workload and the test threshold, avoids the situation of accidental touch, and can also be applied to the testing in special environments.

[0065] Based on the above embodiments:

[0066] As a preferred embodiment, generating the test task chain corresponding to the test instruction includes:

[0067] Determine all the interfaces to be tested on the platform electronics corresponding to the test instruction;

[0068] Determine the preset test tasks corresponding to each interface to be tested;

[0069] Sort the preset test tasks in sequence according to the preset task order;

[0070] Take the sorted preset test tasks as the test task chain.

[0071] In order to improve the efficiency of generating a test task chain, in this application, it is considered that the electrical signal test of the platform electronics is usually implemented based on the various external interfaces and communication interfaces on the platform electronics. Specifically, the voltage or data signal at each interface is detected to test whether the platform electronics where the interface is located is normal. It can be seen that certain interfaces on the platform electronics are specified as interfaces to be tested in the test instructions, so that the platform electronics can be tested according to these interfaces to be tested later; in addition, for an interface, the electrical signal test task of the interface is usually fixed or even unique, so the test tasks of each interface can be stored in advance. After determining which interfaces on the platform electronics are used as interfaces to be tested, the preset test tasks corresponding to these interfaces to be tested can be determined, and there is no need to generate the test tasks of these interfaces in real time to improve the test efficiency. After determining the preset test tasks of each interface to be tested, it is necessary to sort them according to the preset task order. The preset task order can be a preset default task order or a specific task order specified by the user. When testing, if the user does not have a specific task order requirement, the default task order is used as the preset task order to sort the preset test tasks. After sorting, the test task chain can be obtained. Based on this, the interface to be tested and the preset test tasks are determined, and the test task chain is obtained after the preset test tasks are sorted according to the preset task sequence, which can improve the efficiency of generating the test task chain.

[0072] As a preferred embodiment, determining whether the test instruction is a correct instruction includes:

[0073] Determine whether the unique identifier in the test instruction is consistent with the preset identifier;

[0074] If they are consistent, the test instruction is determined to be a correct instruction;

[0075] If they are inconsistent, it is determined that the test instruction is not a correct instruction.

[0076] In order to accurately determine whether a test instruction is a correct instruction, in this application, multiple characters constituting the test instruction are usually sorted according to a pre-set protocol. The string obtained after sorting according to this protocol is the test instruction. In the test instruction, in addition to the character segment used to enable the platform electronics to execute the corresponding test task, it also includes character segments irrelevant to the test task such as a frame header, a check bit, and a spare bit. Among these character segments irrelevant to the test task, there are some fixed character segments. For example, the frame header segment or the ID (Identity Document) segment, etc. are character segments that are usually fixed. Therefore, these character segments can be used as the unique identifier of the test instruction, and their specific character segments under normal circumstances are set as the preset identifier. In actual application, when a test instruction is received, it is judged whether the unique identifier in the test instruction is consistent with the preset identifier. If they are consistent, it indicates that the test instruction is correct. If they are not consistent, it indicates that at this time, due to electromagnetic interference, a fault, or an abnormal communication line, etc., the test instruction has an error, and at this time, it is determined that it is not a correct instruction. Based on this, by judging the method of the unique identifier and the preset identifier, it is possible to accurately determine whether a test instruction is a correct instruction.

[0077] As a preferred embodiment, determining whether a test instruction is a correct instruction includes:

[0078] Determining whether all test tasks corresponding to the test instruction exist in a preset task library;

[0079] If all exist in the preset task library, it is determined that the test instruction is a correct instruction;

[0080] Otherwise, it is determined that the test instruction is not a correct instruction.

[0081] In order to accurately determine whether a test instruction is a correct instruction, in this application, since different types of platform electronics can perform different test tasks, all test tasks that the platform electronics can perform can be stored in a preset task library in advance. The preset task library can be set in the host computer. In actual application, when a test instruction is received, it is determined whether all test tasks corresponding to the test instruction are tasks in the preset task library. If there is a test task among all test tasks corresponding to the test instruction that does not exist in the preset task library, it means that this test task is not a test task that the platform electronics can normally perform. At this time, it is determined that the test instruction is not a correct instruction. For example, if the platform electronics can perform four test tasks A, B, C, and D, and these four test tasks are stored in the preset task library. When a test instruction is received, if the test instruction contains three test tasks C, D, and E, it can be seen that task E is not a task in the preset task library, that is, task E is a task that the platform electronics cannot normally perform. At this time, it is determined that this test task is not a correct instruction. Based on this, by judging whether all test tasks in the test instruction exist in the preset task library, it is possible to accurately determine whether the test instruction is a correct instruction.

[0082] As a preferred embodiment, before sending the test task chain to the platform electronics, it further includes:

[0083] Judging whether the test instruction contains a loop signal;

[0084] If it does not contain a loop signal, then enter the step of sending the test task chain to the platform electronics;

[0085] If it contains a loop signal, then send the test task chain with the preset number of loops corresponding to the loop signal to the platform electronics.

[0086] In order to achieve automatic execution of test tasks, in this application, considering that the test duration required for test tasks is relatively long; and in actual application, it may be necessary to repeatedly test the platform electronics multiple times to ensure the correctness of the test, resulting in an increase in the number of user instructions that the staff needs to issue and consuming more human resources. Therefore, in order to achieve automatic execution of test tasks and reduce the consumption of human resources, a loop signal can be set in the test instruction. The loop signal can specifically include information indicating whether the current test instruction is a loop task and information indicating how many times the current loop task will loop, etc., so that after the platform electronics receives the test instruction, it can execute the test task according to the loop signal in the test instruction. When there is no loop signal or the loop signal indicates no loop, the platform electronics will execute one round of this test task chain. When a loop signal is included, the platform electronics will execute the corresponding number of rounds of this test task chain according to the number of loops indicated in the loop signal. Please refer to Figure 2 , Figure 2A schematic diagram of a test task chain provided for this application. When Figure 2 the test task chain in it is a loop task, after the OC test ends, the CAN bus test will start again for testing. Based on this, by setting the loop signal, it is possible to execute the test task chain multiple times with only one user instruction, thereby realizing the automatic execution of the test task.

[0087] As a preferred embodiment, if the test result data of any one test task is test result data indicating a test failure, after determining and displaying the test result data of the platform electronics executing the test task, it further includes:

[0088] When a retest instruction is received, all test tasks corresponding to the test result data indicating a test failure are used as retest tasks;

[0089] Generate a retest task chain containing all retest tasks and send the retest task chain to the platform electronics so that the platform electronics can execute all corresponding retest tasks according to the retest task chain;

[0090] Determine and display the test result data of the platform electronics executing the retest tasks.

[0091] In order to improve the test efficiency, in this application, when testing the platform electronics, a certain test task may fail due to a fault in a certain interface on the platform electronics or electromagnetic interference. The failure of the test task indicates that there may be problems with the platform electronics currently. The various problems existing in the platform electronics need to be solved before the platform electronics can be put into normal use. Therefore, when testing the platform electronics, if a certain test task fails during this test, the platform electronics needs to be re-tested. At this time, considering that a test task chain usually contains multiple test tasks, if the test task chain is re-executed, it is equivalent to re-executing all the test tasks in the test task chain. Although there are test tasks that fail to execute in this test for the platform electronics, there are also test tasks that execute successfully in this test. For the test tasks that execute successfully, re-executing the task not only has little effect but also consumes time. Therefore, after determining the test result data of the test tasks executed by the platform electronics and displaying it, if the platform electronics needs to be re-tested, that is, after the staff or the host computer issues a retest instruction after troubleshooting or maintaining the test tasks that failed to execute in the previous test, all the test tasks that failed to execute in the previous test will be used as the tasks to be executed in this retest. After executing all the test tasks that failed to execute in the previous test, the host computer determines the test result data of these tasks so that the staff can determine whether these test tasks are successful. Further, if there are still test tasks that fail to execute in the retest, the test tasks that failed to execute in the retest can be used as the test tasks to be executed in the third test for further testing. Based on this, when a test task fails to execute in a certain test, only all the test tasks that failed to execute in the previous test are executed during the retest, rather than all the test tasks in the previous test, which can improve the test efficiency.

[0092] As a preferred embodiment, if the test instruction is not a correct instruction, it further includes:

[0093] Generating an alarm signal indicating that the test instruction is incorrect and sending it to the prompt module so that the prompt module issues a prompt.

[0094] In order to simply prompt the staff, in this application, after the host computer generates a test instruction, if the test instruction is not a correct test instruction, the host computer can generate an alarm signal indicating that the test instruction is incorrect. Specifically, the alarm signal can include the specific data content of the test instruction received this time, as well as the corresponding sending interface and receiving interface of the test instruction, etc., which can simply prompt the staff so that the staff can know the specific reason for the error of the test instruction based on this information.

[0095] As a preferred embodiment, it further includes:

[0096] When a hardware status detection instruction is received, send the hardware status detection instruction to the platform electronics for detecting the hardware status of the platform electronics;

[0097] Determine the hardware status detection result of the platform electronics and display it.

[0098] To simply determine the hardware status of the platform electronics, in this application, when determining the hardware status of the platform electronics, considering that the platform electronics will continuously throughput data from each interface set on the platform electronics after power-on, and the data content throughput by these interfaces is related to the functions that the platform electronics can achieve. It can be seen that when there is an error or fault in the hardware of the platform electronics, the data content throughput by these interfaces will be inconsistent with the data content throughput when the hardware is normal. Based on this, the host computer can send a hardware status detection instruction to an interface on the platform electronics, and then the platform electronics generates a corresponding feedback instruction according to the received hardware status detection instruction. The host computer judges the hardware status of the platform electronics according to the feedback instruction. If the feedback instruction is normal, it not only indicates that the interface where the host computer is connected to the platform electronics is normal, but also indicates that the platform electronics can normally implement the feedback of the hardware status detection instruction, that is, the hardware status is normal. For example, please refer to Figure 3 , Figure 3 is the flowchart of the test program for the platform electronics provided by this application. When performing hardware status detection through the acquisition interface of the platform electronics, the platform electronics writes the voltage data collected by the acquisition interface into the telemetry data, and the host computer analyzes the voltage data in the telemetry data to judge whether the acquisition interface is normal; when performing hardware status detection through the communication interface of the platform electronics, the platform electronics sends a connection signal to the host computer, and the host computer judges whether the communication interface is connected to judge the hardware status of the platform electronics; when performing hardware status detection through the control interface of the platform electronics, the host computer sends a preset control instruction to the platform electronics, and the control interface generates a corresponding level pulse signal or other output signals according to the preset control instruction, and the host computer judges whether the output signal is a correct signal to judge whether the control interface is normal. Based on this, the hardware status of the platform electronics can be simply determined.

[0099] Please refer to Figure 4 , Figure 4 is the structural schematic diagram of an automatic test device for a satellite platform electronics provided by this application, including:

[0100] A memory 21 for storing computer programs;

[0101] A processor 22 for implementing the steps of the automatic test method for the satellite platform electronics as described above when executing the computer program.

[0102] For a detailed introduction to an automatic test device for satellite platform electronics provided by this application, please refer to the embodiments of the above-mentioned automatic test method for satellite platform electronics, which will not be elaborated herein.

[0103] This application also provides a computer-readable storage medium, on which a computer program is stored. When the computer program is executed by a processor, it implements the steps of the above-mentioned automatic test method for satellite platform electronics.

[0104] For a detailed introduction to a computer-readable storage medium provided by this application, please refer to the embodiments of the above-mentioned automatic test method for satellite platform electronics, which will not be elaborated herein.

[0105] In this specification, the various embodiments are described in a progressive manner. Each embodiment focuses on the differences from other embodiments. For the same or similar parts among the various embodiments, reference can be made to each other. For the devices disclosed in the embodiments, since they correspond to the methods disclosed in the embodiments, the descriptions are relatively simple. For the relevant parts, reference can be made to the description in the method section.

[0106] The above description of the disclosed embodiments enables those skilled in the art to implement or use the present invention. Various modifications to these embodiments will be obvious to those skilled in the art. The general principles defined herein can be implemented in other embodiments without departing from the spirit or scope of the present invention. Therefore, the present invention will not be limited to the embodiments shown herein, but rather to the widest scope consistent with the principles and novel features disclosed herein.

Claims

1. An automatic test method for satellite platform electronics, characterized in that A processor applied to a host computer, the host computer is connected to the platform electronics, and the test method of the satellite platform electronics includes: When receiving a user instruction, generating a test instruction according to the user instruction; Determining whether the test instruction is a correct instruction; If the test instruction is a correct instruction, generating a test task chain corresponding to the test instruction; Sending the test task chain to the platform electronics so that the platform electronics executes all corresponding test tasks according to the test task chain; Determine and display the test result data of the test task executed by the platform electronically; Generating a test task chain corresponding to the test instruction includes: Determine all interfaces to be tested on the platform electronics corresponding to the test instruction; Determine the preset test tasks corresponding to each of the interfaces to be tested; Arrange each of the preset test tasks in sequence according to the preset task order; The preset test tasks after sorting are used as the test task chain.

2. The automatic test method for satellite platform electronics according to claim 1, wherein Determining whether the test instruction is a correct instruction includes: Determining whether the unique identifier in the test instruction is consistent with a preset identifier; If they are consistent, the test instruction is determined to be a correct instruction; If they are inconsistent, it is determined that the test instruction is not a correct instruction.

3. The automatic test method for satellite platform electronics according to claim 1, wherein, Determining whether the test instruction is a correct instruction includes: Determine whether all test tasks corresponding to the test instruction exist in the preset task library; If both exist in the preset task library, then the test instruction is determined to be a correct instruction; Otherwise, it is determined that the test instruction is not a correct instruction.

4. The automatic test method for satellite platform electronics according to claim 1, characterized in that, Before sending the test task chain to the platform electronic device, it also includes: Determining whether the test instruction includes a loop signal; If the cyclic signal is not included, entering the step of sending the test task chain to the platform electronics; If the cycle signal is included, the test task chain with the preset number of cycles corresponding to the cycle signal is sent to the platform electronics.

5. The automatic test method for satellite platform electronics according to claim 1, wherein, If any of the test result data of the test task is test result data indicating a test failure, after determining that the platform electronically executes the test result data of the test task and displays it, the method further includes: When a retest instruction is received, all the test tasks corresponding to the test result data indicating a test failure are used as retest tasks; Generate a retest task chain including all the retest tasks, and send the retest task chain to the platform electronics, so that the platform electronics executes all corresponding retest tasks according to the retest task chain; The test result data of the retest task executed by the platform electronics is determined and displayed.

6. The automatic test method for satellite platform electronics according to claim 1, characterized in that, If the test instruction is not a correct instruction, the method further includes: An alarm signal indicating that the test instruction is wrong is generated and sent to a prompt module so that the prompt module issues a prompt.

7. The automatic test method for satellite platform electronics according to any one of claims 1 to 6, characterized in that Also includes: When receiving a hardware status detection instruction, sending the hardware status detection instruction to the platform electronics to detect the hardware status of the platform electronics; The hardware status detection result of the platform electronics is determined and displayed.

8. An automatic test device for satellite platform electronics, characterized in that, include: Memory for storing computer programs; A processor, configured to implement the steps of the automatic test method for satellite platform electronics according to any one of claims 1 to 7 when executing the computer program.

9. A computer-readable storage medium, characterized in that, A computer program is stored on the computer-readable storage medium, and when the computer program is executed by a processor, the steps of the automatic test method for satellite platform electronics according to any one of claims 1 to 7 are implemented.

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