Device, manufacturing method and method for withstand voltage test of isolation device
By designing a test device that uses air insulation to improve the upper limit of the isolator's pressure resistance test, the problem of insufficient pressure resistance in the existing test tool is solved, and effective testing and performance evaluation of isolators with a pressure resistance level exceeding 6KV is achieved.
Patent Information
- Application Number
- CN202210929159.6
- Authority / Receiving Office
- CN · China
- Patent Type
- Patents(China)
- Current Assignee / Owner
- Filing Date
- 2022-08-03
- Publication Date
- 2025-04-29
- Estimated Expiration
- 2042-08-03
AI Technical Summary
The current test tooling usually has the highest voltage resistance level to withstand 6KV pressure tests, and it is impossible to effectively evaluate isolators with a voltage resistance level of more than 6KV, resulting in the inability to accurately determine whether the test tooling is not qualified or the isolator itself is insufficient withstand voltage.
A device for pressure-resistant testing of isolation devices is designed. This device is separated from the base by air from the isolator, and the upper limit of the pressure-resistant testing of the isolator is improved by using the principle of better air insulation. The device includes a fixture, a PCB board, metal and a base. The fixture and base are made of insulating materials, and air grooves are formed between the fixtures to accommodate the width of different types of isolators.
By increasing the upper limit of isolator withstand voltage testing, the isolator can be tested at a higher test voltage, and the performance indicators of the isolator are more comprehensively evaluated, which solves the problem of insufficient withstand voltage in the existing test tooling and realizes effective testing of isolators with a voltage withstand voltage level exceeding 6KV.
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Abstract
Description
Technical Field
[0001] The present disclosure relates to the field of electric power technology, and in particular to a device, a manufacturing method and a method for withstand voltage testing of an isolation device. Background Art
[0002] With the rapid development of the power industry and the continuous advancement of CMOS technology, digital isolators have replaced traditional optocouplers with their high reliability and high speed to become the mainstream product in the market for isolation devices. From research and development to production to market launch, these isolators need to be batch inspected at specific times to ensure that their functional performance meets the requirements of relevant standards. Among the many testing items, the withstand voltage test of isolators is the most basic and most important testing item for this type of product.
[0003] The withstand voltage test of the isolator needs to be placed on the test fixture for testing. Therefore, the withstand voltage level of the test fixture should be greater than that of the isolator. Otherwise, once a breakdown phenomenon such as flashover or spark occurs, it is impossible to determine whether the failure is caused by the test fixture or the isolator's own insufficient withstand voltage level. Existing test fixtures can often only withstand a withstand voltage test of 6KV at most, so how to design a high-voltage-resistant test fixture has become an urgent problem to be solved. Summary of the invention
[0004] In order to solve the problems in the related art, the embodiments of the present disclosure provide an apparatus, a manufacturing method and a method for withstand voltage testing of an isolation device.
[0005] In a first aspect, an embodiment of the present disclosure provides a device for withstand voltage testing of an isolation device, comprising: a pair of clamps, a PCB board, a metal and a base; the pair of clamps are fixed on the base; each clamp comprises an upper clamping plate and a lower clamping plate, the PCB board is arranged on the lower clamping plate, and the metal is arranged on the PCB board; wherein, when the two side terminals of the isolator respectively contact the metal for short circuit, the isolator and the base are separated by air.
[0006] According to an embodiment of the present disclosure, the area where the metal is applied to the PCB board includes: a first area and a second area; wherein the first area is formed by extending inward from the edge of the lower clamping plate, and the second area is a preset distance from the edge of the lower clamping plate.
[0007] According to an embodiment of the present disclosure, mounting holes are respectively provided on the lower clamping plate and the PCB board.
[0008] According to an embodiment of the present disclosure, an air groove is formed between the pair of clamps; and a width of the air groove is greater than or equal to a width of a package body of the isolator.
[0009] According to an embodiment of the present disclosure, the pair of clamps and / or the base are made of insulating material.
[0010] According to an embodiment of the present disclosure, the pair of clamps are made of plastic.
[0011] According to an embodiment of the present disclosure, the base is made of insulating bakelite.
[0012] In a second aspect, an embodiment of the present disclosure provides a method for manufacturing an isolation device withstand voltage test device, comprising the following steps:
[0013] The first area and the second area of the PCB board are coated with metal;
[0014] Cutting the PCB board along the first area;
[0015] Fix the cut PCB board to the lower clamping plate, and then fix a pair of clamps to the base.
[0016] In a third aspect, an embodiment of the present disclosure provides a method for performing a withstand voltage test on an isolation device using an apparatus for withstand voltage test on an isolation device, comprising the following steps:
[0017] Make the terminals on both sides of the isolator contact with metal for short circuit;
[0018] Apply the test voltage on both sides of the isolator and maintain the test time;
[0019] The test results are determined after the test duration.
[0020] According to an embodiment of the present disclosure, the test voltage is greater than 6 kilovolts.
[0021] The embodiment of the present disclosure provides a device for withstand voltage test of an isolation device, comprising: a pair of clamps, a PCB board, a metal and a base; the pair of clamps are fixed on the base; each clamp comprises an upper clamp and a lower clamp, the PCB board is arranged on the lower clamp, and the metal is arranged on the PCB board; wherein, when the two side terminals of the isolator are respectively in contact with the metal for short circuit, the isolator and the base are separated by air. The device provided by the embodiment of the present disclosure, the isolator and the base are separated by air, and the principle of good air insulation can be used to greatly improve the upper limit of the withstand voltage test of the isolator, and prevent the occurrence of flashover, spark and other breakdown phenomena due to insufficient withstand voltage of the test tooling itself during the isolator test process, so that the isolator can be tested at a higher test voltage, and the performance indicators of the isolator can be more comprehensively evaluated.
[0022] It is to be understood that the foregoing general description and the following detailed description are exemplary and explanatory only and are not restrictive of the present disclosure. BRIEF DESCRIPTION OF THE DRAWINGS
[0023] Other features, objectives and advantages of the present disclosure will become more apparent through the following detailed description of non-limiting embodiments in conjunction with the accompanying drawings. In the accompanying drawings:
[0024] Figure 1 A test circuit schematic diagram of a voltage withstand test of an isolation device according to an embodiment of the present disclosure is shown.
[0025] Figure 2 A front view of a device for performing a withstand voltage test on an isolation device according to an embodiment of the present disclosure is shown.
[0026] Figure 3 A top view of a device for performing a withstand voltage test on an isolation device according to an embodiment of the present disclosure is shown.
[0027] Figure 4 A flow chart of a method for manufacturing an apparatus for voltage withstand testing of an isolation device according to an embodiment of the present disclosure is shown.
[0028] Figure 5 A flow chart of a method for performing a withstand voltage test on an isolation device using an apparatus for withstand voltage test on an isolation device according to an embodiment of the present disclosure is shown. DETAILED DESCRIPTION
[0029] Hereinafter, exemplary embodiments of the present disclosure will be described in detail with reference to the accompanying drawings so that those skilled in the art can easily implement them. In addition, for the sake of clarity, parts not related to the description of the exemplary embodiments are omitted in the accompanying drawings.
[0030] In the present disclosure, it should be understood that terms such as "include" or "have" are intended to indicate the presence of features, numbers, steps, behaviors, components, parts, or a combination thereof disclosed in the present specification, and are not intended to exclude the possibility that one or more other features, numbers, steps, behaviors, components, parts, or a combination thereof exist or are added.
[0031] It should also be noted that, in the absence of conflict, the embodiments and features in the embodiments of the present disclosure may be combined with each other.
[0032] With the rapid development of the power industry and the continuous advancement of CMOS technology, digital isolators have replaced traditional optocouplers with their high reliability and high speed to become the mainstream product in the market for isolation devices. From research and development to production to market launch, these isolators need to be batch inspected at specific times to ensure that their functional performance meets the requirements of relevant standards. Among the many testing items, the withstand voltage test of isolators is the most basic and most important testing item for this type of product.
[0033] The withstand voltage test of the isolator needs to be placed on the test fixture for testing. Therefore, the withstand voltage level of the test fixture should be greater than that of the isolator. Otherwise, once a breakdown phenomenon such as flashover or spark occurs, it is impossible to determine whether the failure is caused by the test fixture or the isolator's own insufficient withstand voltage level. Existing test fixtures can often only withstand a withstand voltage test of 6KV at most, so how to design a high-voltage-resistant test fixture has become an urgent problem to be solved.
[0034] The present disclosure will be described in detail below with reference to the accompanying drawings and in conjunction with embodiments.
[0035] The isolator withstand voltage test is to test the isolator's ability to withstand high voltage without breakdown under specified conditions.
[0036] During the test, the first and second terminals of the isolator are connected together to form a double-sided device. The test voltage is applied between the two sides of the isolator, and its effective value should rise evenly from 0V to the value to be tested within 5 seconds and remain for at least 60 seconds (if a withstand voltage life test is performed, the corresponding test duration is calculated based on the accelerated life test theory). During the test, no flashover, spark or other breakdown phenomena should occur, and the leakage current should not exceed 10mA. The test circuit is connected as follows: Figure 1 As shown, G is the power supply voltage and V is the test voltage of the isolator.
[0037] Figure 2 A front view showing a device for voltage withstand testing of an isolation device according to an embodiment of the present disclosure, Figure 3 FIG. 2 is a top view of a device for performing a withstand voltage test on an isolation device according to an embodiment of the present disclosure. Figure 2-Figure 3 As shown, the isolation device withstand voltage test device includes: a pair of clamps 100, a PCB board 200, a metal 300 and a base 400; the pair of clamps 100 are fixed on the base 400; each clamp includes an upper clamping plate and a lower clamping plate, the PCB board 200 is arranged on the lower clamping plate, and the metal 300 is arranged on the PCB board 200; wherein, when the two side terminals of the isolator are respectively in contact with the metal 300 for short circuit, the isolator and the base 400 are separated by air.
[0038] The device provided by the present invention can greatly improve the upper limit of the isolator's withstand voltage test by separating the isolator and the base with air, utilizing the principle of good air insulation, and prevent flashover, sparks and other breakdown phenomena caused by insufficient withstand voltage of the test tooling itself during the isolator testing process. The isolator can be tested at a higher test voltage, and the performance indicators of the isolator can be evaluated more comprehensively.
[0039] In the disclosed embodiment, the isolator is placed on the lower clamping plate of a pair of clamps 100 and fixed by the upper clamping plate. In some embodiments, the distance between the pair of clamps 100 can be adjusted to adapt to the width of different types of isolators.
[0040] In the disclosed embodiment, the lower clamping plate and the PCB board 200 are respectively provided with mounting holes 210. The lower clamping plate and the PCB board 200 are fixed by a fixing member 500, such as a locking screw, passing through the mounting hole 210, and a mounting hole adapted to the fixing member 500 can be provided on the base 400, so that the clamp 100 is fixed on the base 400 as a whole.
[0041] In the disclosed embodiment, the area where the metal 300 is applied to the PCB board 200 includes: a first area 310 and a second area 320; wherein the first area 310 is formed by extending inward from the edge of the lower clamping plate, and the second area 320 is a preset distance from the edge of the lower clamping plate.
[0042] Specifically, the metal 300 can be copper, nickel, gold, etc. Taking copper as an example, the copper-clad area on the PCB board 200 is not entirely copper-clad, but partially copper-clad, for example, the first area 310 and the second area 320 are copper-clad on the surface. The copper-clad first area 310 is used for the terminals on both sides of the isolator to short-circuit with copper, and the copper-clad second area 320 is used to connect with the wiring terminals of the test power supply to provide power to the isolator, wherein the copper-clad parts of the first area 310 and the second area 320 are connected as a whole. By setting the second area 320 at a preset distance from the edge of the lower clamping plate as the wiring terminal of the test power supply, it is possible to prevent the positive and negative poles of the test power supply from being short-circuited due to the cutting process of the PCB board, and avoid the isolator from being directly broken down during the withstand voltage test.
[0043] Furthermore, in the disclosed method, except for the first area 310 and the second area 320, there is no conductive metal on the PCB board 200, which further avoids short circuit between the positive and negative poles of the test power supply.
[0044] In the embodiment of the present disclosure, the pair of clamps 100 and / or the base 400 are made of insulating material.
[0045] Specifically, the material of the pair of clamps 100 can be insulating materials such as plastic, and the use of plastic material can also increase the test voltage of the isolator. In addition, the material of the base 400 can be insulating bakelite.
[0046] In the embodiment of the present disclosure, an air slot is formed between the pair of clamps 100; the width of the air slot is greater than or equal to the width of the package body of the isolator, so that the terminals on both sides of the isolator can contact the metal to achieve short circuit. The greater the width of the air slot, the higher the withstand voltage level of the isolator. The air slot is a hollow area formed at the adjacent ends of a pair of clamps 100, with air inside. The insulation of air is higher than the insulation of existing isolator test tooling materials, so as to increase the test voltage of the isolator. After testing, the withstand voltage level of the device for withstand voltage testing of the isolation device disclosed in the present disclosure is greater than or equal to 8KV, and isolators with a withstand voltage level exceeding 6KV can be tested, which solves the problem that the withstand voltage level of the existing test tooling itself is less than or equal to 6KV, resulting in the inability to test isolators with a withstand voltage level exceeding 6KV.
[0047] Figure 4 A flow chart of a method for manufacturing an apparatus for voltage withstand testing of an isolation device according to an embodiment of the present disclosure is shown. Figure 4 As shown, the manufacturing method of the isolation device withstand voltage test device comprises the following steps:
[0048] Step S101, a first area and a second area of a PCB board are coated with metal;
[0049] Step S102, cutting the PCB board along the first area;
[0050] Step S103, fixing the cut PCB board to the lower clamping plate, and then fixing a pair of clamps to the base.
[0051] For specific technical details of the embodiments of the present disclosure, please refer to Figure 2-Figure 3 The device part of the isolation device withstand voltage test is not described in detail here.
[0052] In the disclosed embodiment, the metal can be copper, nickel, gold, etc. Taking copper as an example, the copper-clad area on the PCB board is not entirely copper-clad, but partially copper-clad, for example, the first area and the second area are copper-clad on the surface, the copper-clad first area is used for the two-side terminals of the isolator to short-circuit with copper, and the copper-clad second area is used for connecting with the terminal of the test power supply to provide power to the isolator, wherein the copper-clad parts of the first area and the second area are connected as a whole. By setting the second area at a preset distance from the edge of the lower clamping plate as the terminal of the test power supply, it is possible to prevent the positive and negative poles of the test power supply from being short-circuited due to the cutting process of the PCB board, and avoid the isolator from being directly broken down during the withstand voltage test.
[0053] In the disclosed embodiment, each clamp includes an upper clamping plate and a lower clamping plate, and the PCB board is arranged on the lower clamping plate; wherein, when the two side terminals of the isolator contact the metal short circuit respectively, the isolator and the base are separated by air.
[0054] In the disclosed embodiment, mounting holes are respectively provided on the lower clamping plate and the PCB board.
[0055] In an embodiment of the present disclosure, an air groove is formed between the pair of clamps; and a width of the air groove is greater than or equal to a width of a packaging body of the isolator.
[0056] In the disclosed embodiment, the pair of clamps and / or the base are made of insulating material.
[0057] In the disclosed embodiment, the pair of clamps are made of plastic.
[0058] In the disclosed embodiment, the base is made of insulating bakelite.
[0059] Figure 5 A flow chart of a method for performing a withstand voltage test on an isolation device using an apparatus for withstand voltage test on an isolation device according to an embodiment of the present disclosure is shown. Figure 5 As shown, the method for performing a withstand voltage test on an isolation device using the device for withstand voltage test on an isolation device comprises the following steps:
[0060] Step S201, short-circuiting the terminals on both sides of the isolator by contacting them with metals;
[0061] Step S202, applying a test voltage on both sides of the isolator and maintaining the test time;
[0062] Step S203, determining the test result after the test duration ends.
[0063] The device for withstand voltage testing of the isolation device of the embodiment of the present disclosure is Figure 2-Figure 3 The device adopts Figure 4 The production method is described, and the details can be referred to the above technical details, which will not be described here.
[0064] In the disclosed embodiment, in order to detect whether the withstand voltage level of the isolator meets the standard, the device for withstand voltage test of the isolation device disclosed in the present application is used for detection. First, the terminals on both sides of the isolator are short-circuited with the metal contacts of the PCB board respectively, and then the wiring terminals of the test power supply are connected to the metal of the second area of the PCB board, so that the isolator is loaded with the test voltage and the test duration is maintained. If there is no breakdown phenomenon such as short circuit, flashover, spark, etc. in the isolator within the test duration, the test is passed.
[0065] In the disclosed embodiment, the test voltage is greater than 6 kilovolts. Preferably, the test voltage is greater than or equal to 8 kV.
[0066] The above description is only a preferred embodiment of the present disclosure and an explanation of the technical principles used. Those skilled in the art should understand that the scope of the invention involved in the present disclosure is not limited to the technical solution formed by a specific combination of the above technical features, but should also cover other technical solutions formed by any combination of the above technical features or their equivalent features without departing from the inventive concept. For example, the above features are replaced with the technical features with similar functions disclosed in the present disclosure (but not limited to) by each other.
Claims
1. A device for withstand voltage testing of an isolation device, characterized in that: include: A pair of clamps, a PCB board, a metal and a base; the pair of clamps are fixed on the base; each clamp comprises an upper clamping plate and a lower clamping plate, the PCB board is arranged on the lower clamping plate, and the metal is arranged on the PCB board; wherein, when the two side terminals of the isolator respectively contact the metal for short circuit, the isolator and the base are separated by air; the material of the pair of clamps and / or the base is an insulating material.
2. The device according to claim 1, characterized in that The area where the metal is applied to the PCB board includes: a first area and a second area; wherein the first area is formed by extending inwardly from the edge of the lower clamping plate, and the second area is at a preset distance from the edge of the lower clamping plate.
3. The device according to claim 1, characterized in that The lower clamping plate and the PCB board are respectively provided with mounting holes.
4. The device according to claim 1, characterized in that An air slot is formed between the pair of clamps; the width of the air slot is greater than or equal to the width of the packaging body of the isolator.
5. The device according to claim 1, characterized in that The material of the pair of clamps is plastic.
6. The device according to claim 1, characterized in that The base is made of insulating bakelite.
7. The method for manufacturing the device according to any one of claims 1 to 6, characterized in that: The steps include: The first area and the second area of the PCB board are coated with metal; Cutting the PCB board along the first area; Fix the cut PCB board to the lower clamping plate, and then fix a pair of clamps to the base.
8. A method for performing a withstand voltage test on an isolation device using the device according to any one of claims 1 to 6, characterized in that: The steps include: Make the terminals on both sides of the isolator contact with metal for short circuit; Apply the test voltage on both sides of the isolator and maintain the test time; The test results are determined after the test duration is completed.
9. The method according to claim 8, characterized in that The test voltage is greater than 6 kilovolts.
Citation Information
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Digital isolator and chip
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