Test method, apparatus, device, and storage medium

Abstract

The test method, device, equipment and storage medium provided in the application first test each to-be-tested parameter of a preset number of DRAM samples through a system-level test machine and each standard parameter value in a high-temperature environment and a low-temperature environment, to obtain a corresponding first test result, then test each to-be-tested parameter of the DRAM sample with a failed first test result through a test machine and each target parameter value in a normal-temperature environment, to obtain a corresponding second test result. If the second test result is also failed, each to-be-tested parameter of the to-be-tested DRAM is tested through a test machine and each target parameter value in a normal-temperature environment, to realize that the normal-temperature environment replaces the high-temperature environment and the low-temperature environment to perform STL test on the to-be-tested DRAM sample, and test cost and test time are saved.

Description

TECHNICAL FIELD

[0001] The present application relates to the technical field of testing, in particular to a testing method, device, equipment and storage medium. BACKGROUND

[0002] In the system level test (SLT) of dynamic random access memory (DRAM), the performance of the memory needs to be tested under different temperatures and pressures, for example, high temperature and high pressure, high temperature and low pressure, low temperature and high pressure, and low temperature and low pressure. Therefore, switching between high and low temperatures is required, and the dependence on the temperature regulating function of the oven is too high, which eventually leads to an increase in testing cost and testing time. SUMMARY

[0003] The present application provides a testing method, device, equipment and storage medium, which is used to replace the testing under high and low temperature environments with testing at room temperature, thereby saving testing cost and testing time.

[0004] According to some embodiments, the first aspect of the present application provides a testing method, comprising:

[0005] Respectively under a high temperature environment and a low temperature environment, each test parameter of a preset number of dynamic random access memory (DRAM) samples is tested by a system level test (SLT) test machine and each standard parameter value, to obtain a corresponding first test result;

[0006] Under a room temperature environment, each test parameter of the DRAM sample with a failed first test result is tested by the test machine and each target parameter value, to obtain a corresponding second test result;

[0007] If the second test result is failed, each test parameter of a to-be-tested DRAM is tested by the test machine and the target parameter value under the room temperature environment, the DRAM sample and the to-be-tested DRAM are DRAMs of the same type, and the target parameter value of the same test parameter is less than the standard parameter value.

[0008] According to some embodiments, the second aspect of the present application provides a testing device, comprising:

[0009] The first processing module is configured to respectively under a high temperature environment and a low temperature environment, test each test parameter of a preset number of dynamic random access memory (DRAM) samples by a system level test (SLT) test machine and each standard parameter value, to obtain a corresponding first test result;

[0010] a second processing module, configured to test each to-be-tested parameter of a DRAM sample with a failed first test result by using the test machine and each target parameter value in a normal temperature environment, to obtain a corresponding second test result;

[0011] a third processing module, configured to test each to-be-tested parameter of a to-be-tested DRAM by using the test machine and the target parameter values in the normal temperature environment if the second test result is failed, wherein the memory sample and the to-be-tested DRAM are the same type of memory, and the target parameter value of a same to-be-tested parameter is less than a standard parameter value.

[0012] According to some embodiments, a third aspect of the present application provides an electronic device, comprising a processor, and a memory connected to the processor in communication;

[0013] The memory stores computer execution instructions.

[0014] The processor executes the computer execution instructions stored in the memory, to implement any one of the possible test methods provided in the first aspect.

[0015] According to some embodiments, a fourth aspect of the present application provides a computer readable storage medium, wherein the computer readable storage medium stores computer execution instructions, and the computer execution instructions are executed by a processor to implement any one of the possible test methods provided in the first aspect.

[0016] According to some embodiments, a fifth aspect of the present application further provides a computer program product, comprising a computer program, and the computer program is executed by a processor to implement any one of the possible test methods provided in the first aspect.

[0017] The test method, device, equipment and storage medium provided in the embodiments of the present application first test each to-be-tested parameter of a preset number of DRAM samples by using a test machine and each standard parameter value in a high temperature environment and a low temperature environment, to obtain a corresponding first test result, then test each to-be-tested parameter of a DRAM sample with a failed first test result by using the test machine and each target parameter value in a normal temperature environment, to obtain a corresponding second test result, and if the second test result is also failed, test each to-be-tested parameter of a to-be-tested DRAM by using the test machine and each target parameter value in the normal temperature environment, to implement the STL test of the to-be-tested DRAM sample in the normal temperature environment instead of the high temperature environment and the low temperature environment, and save the test cost and the test time. BRIEF DESCRIPTION OF DRAWINGS

[0018] In order to more clearly illustrate the technical solutions in the embodiments of the present application or the prior art, the following will briefly introduce the drawings needed to be used in the embodiments or prior art description. Obviously, the drawings in the following description are some embodiments of the present application, and for those skilled in the art, other drawings can also be obtained from these drawings without any creative effort.

[0019] Figure 1 An application scenario schematic diagram provided for the embodiments of the present application;

[0020] Figure 2 A flowchart of a test method provided for the embodiments of the present application;

[0021] Figure 3 A flowchart of another test method provided for the embodiments of the present application;

[0022] Figure 4 A flowchart of still another test method provided for the embodiments of the present application;

[0023] Figure 5 A flowchart of yet another test method provided for the embodiments of the present application;

[0024] Figure 6 A flowchart of yet another test method provided for the embodiments of the present application;

[0025] Figure 7 A structural schematic diagram of a test device provided for the embodiments of the present application;

[0026] Figure 8 A structural schematic diagram of another test device provided for the embodiments of the present application;

[0027] Figure 9 A structural schematic diagram of an electronic device provided for the embodiments of the present application. DETAILED DESCRIPTION

[0028] The exemplary embodiments will be described in detail herein with reference to the attached drawings. When the description refers to the drawings, the same numbers in different drawings represent the same or similar elements unless otherwise indicated. The following exemplary embodiments described in the following description are not meant to be limiting in terms of the scope of the application. Rather, they are example methods and apparatuses consistent with some aspects of the application, as detailed in the appended claims.

[0029] The terms "first", "second", "third", "fourth" and the like in the description and in the claims of the present application, and above-mentioned drawings (if any), are used to distinguish between similar objects, and are not necessarily used to describe a particular sequential or chronological order. It is to be understood that the use of the terms so-termed, data can be interchanged, where appropriate, so that the embodiments of the present application described herein, for example, can be practiced in other than the illustrative order shown or described herein. Furthermore, the terms "comprise" and "have", and any variations thereof, are intended to cover non-exclusive inclusion, for example, a process, method, system, product, or apparatus that comprises a list of steps or units is not necessarily limited to those steps or units that are clearly listed, but can include other steps or units that are not clearly listed or inherent to such processes, methods, products, or apparatuses.

[0030] In the system level test (SLT) of dynamic random memory (DRAM), the performance of the memory needs to be tested at different temperatures and pressures, for example, high temperature and high pressure, high temperature and low pressure, low temperature and high pressure, and low temperature and low pressure. Therefore, switching between high and low temperatures is required, and the temperature adjustment function of the oven is too high, which eventually leads to an increase in test cost and test time.

[0031] The embodiments of the present application provide a test method, device, equipment and storage medium. Since the timing parameters and test voltages of DRAM under different temperature environments are different, for the timing parameters, if a more stringent parameter value is determined based on the parameter value of the timing parameter under different temperature environments for the SLT test of DRAM under normal temperature environment, then the abnormal DRAM under high temperature environment and low temperature environment can be screened out, so that the SLT test of DRAM under high temperature environment and low temperature environment can be replaced by the SLT test under normal temperature environment, thereby saving the test cost and test time.

[0032] The following describes an exemplary application scenario of the embodiments of the present application.

[0033] Figure 1 An application scenario diagram provided by the embodiments of the present application is shown in FIG. 1. Figure 1As shown, the electronic device 100 can be configured to perform the test method provided by the embodiments of the present application. The electronic device 100 can run the test machine to test the to-be-tested DRAM 200, for example, by simulating a real environment through the test machine to test whether each module function of the to-be-tested DRAM 200 is normal, such as testing each timing parameter and test voltage (HV / LV) of the to-be-tested DRAM 200. Each timing parameter includes one or more of tCL, tRCD, tRP, tRAS, tWR, and tREF. The test method provided by the embodiments of the present application can test each to-be-tested parameter of the to-be-tested DRAM 200 based on the target parameter value of each to-be-tested parameter in a normal temperature environment, without the need for testing in a high-temperature environment and a low-temperature environment, thereby saving test cost and test time.

[0034] In a possible design, the normal temperature environment can be, for example, an environment with a temperature box temperature of 25°C, the high-temperature environment can be, for example, an environment with a temperature box temperature of 50°C-70°C, and the low-temperature environment can be, for example, an environment with a temperature box temperature of -10°C- -30°C.

[0035] It should be noted that the type of the electronic device 100 can be a computer, a notebook computer, a server, a server cluster, and the like, and the embodiments of the present application do not limit the type of the electronic device 100. Figure 1 The electronic device 100 in the above description is exemplified by taking a computer as an example. In addition, the embodiments of the present application do not limit the type of the to-be-tested DRAM 200, which can be, for example, CDRAM, EDRAM, MDRAM, SDRAM, or RDRAM, and the like.

[0036] The above application scenarios are merely illustrative, and the test method, device, equipment, and storage medium provided by the embodiments of the present application include but are not limited to the above application scenarios.

[0037] Figure 2 A flowchart of a test method provided by the embodiments of the present application is shown in FIG. 1. As shown in FIG. 1, the test method provided by the embodiments of the present application includes the following steps. Figure 2

[0038] S101: respectively in a high-temperature environment and a low-temperature environment, test each to-be-tested parameter of a preset number of DRAM samples by using a system-level test machine and each standard parameter value, to obtain a corresponding first test result.

[0039] Select a preset number of DRAM samples, and perform SLT testing on the selected DRAM samples in a high-temperature environment and a low-temperature environment by using a system-level test machine. Specifically, SLT testing can be performed on each to-be-tested parameter of the DRAM sample by using the test machine based on the standard parameter value corresponding to each to-be-tested parameter of the DRAM sample.

[0040] ​The JEDEC standard specifies a corresponding value of each to-be-tested parameter for each type of DRAM to quantify the to-be-tested parameter, and the corresponding value is defined as a standard parameter value of each to-be-tested parameter, for example, the standard parameter value of tCL is 18 ns. Therefore, the type of the DRAM sample is known, and the standard parameter values of each to-be-tested parameter of the DRAM sample can be obtained from the JEDEC standard.

[0041] The standard parameter values of each to-be-tested parameter of the DRAM sample, that is, each standard parameter value, are subjected to SLT testing by using a test machine in a high-temperature environment and a low-temperature environment respectively, to obtain a corresponding first test result. The first test result includes pass or fail.

[0042] Optionally, the test machine can be, for example, an automatic test equipment (ATE), which is a computer-driven automatic system for testing, such as semiconductors, electronic circuits, and printed circuit board assemblies.

[0043] S102: In a normal-temperature environment, each to-be-tested parameter of the DRAM sample with a failed first test result is tested by using a test machine and each target parameter value, to obtain a corresponding second test result.

[0044] The DRAM sample with a failed first test result is subjected to SLT testing by using a test machine, which can be specifically based on each target parameter value corresponding to each to-be-tested parameter of the DRAM sample with a failed first test result, to perform SLT testing on each to-be-tested parameter of the DRAM sample with a failed first test result by using a test machine. Each target parameter value is a corresponding value for quantifying each to-be-tested parameter, which is different from the JEDEC standard.

[0045] For example, in a normal-temperature environment, each target parameter value of each to-be-tested parameter of the DRAM sample with a failed first test result is input to a test machine for SLT testing, and the output is a corresponding second test result. The second test result includes pass or fail.

[0046] In this step S102, for the DRAM sample with a failed test result after SLT testing according to each standard parameter value, SLT testing is further performed according to each target parameter value, to verify the accuracy of each target parameter value provided in the embodiments of the present application for performing SLT testing.

[0047] Therefore, if the second test result is failed, it indicates that the test result obtained by using the target parameter values in the normal temperature environment is consistent with the test result obtained by using the standard parameter values in the high temperature or low temperature environment, and then the target parameter values can be introduced into the SLT test production line in the normal temperature environment to perform SLT test on the to-be-tested parameters of the to-be-tested DRAM in the normal temperature environment, for example, step S103 is performed. On the contrary, if the second test result is passed, it indicates that the test result obtained by using the target parameter values in the normal temperature environment is inconsistent with the test result obtained by using the standard parameter values in the high temperature or low temperature environment, and then the target parameter values of the to-be-tested parameters whose second test result is passed need to be corrected, for example, step S104 is performed.

[0048] S103: Test the to-be-tested parameters of the to-be-tested DRAM by using the test machine and the target parameter values in the normal temperature environment.

[0049] The DRAM sample and the to-be-tested DRAM are DRAMs of the same type, and the target parameter value of the same to-be-tested parameter is less than the standard parameter value.

[0050] The DRAM sample and the to-be-tested DRAM are DRAMs of the same type. In addition, the target parameter value of the same to-be-tested parameter is less than the standard parameter value, in other words, the target parameter value is more stringent than the standard parameter value for testing.

[0051] If the second test result is failed, it indicates that the test result obtained by using the target parameter values in the normal temperature environment is consistent with the test result obtained by using the standard parameter values in the high temperature or low temperature environment, and then the to-be-tested parameters of the to-be-tested DRAM are tested by using the test machine and the target parameter values in the normal temperature environment, without using the standard parameters to perform tests in the high temperature and low temperature environments, which realizes the test process of replacing the high temperature and low temperature environments with the normal temperature environment, saves the test cost and test time,

[0052] S104: Correct the target parameter values of the to-be-tested parameters whose second test result is passed.

[0053] If the second test result is passed, it indicates that the test result obtained by using the target parameter values in the normal temperature environment is inconsistent with the test result obtained by using the standard parameter values in the high temperature or low temperature environment, and then the target parameter values of the to-be-tested parameters whose second test result is passed need to be further corrected, so that the test result obtained by using the corrected target parameter values in the normal temperature environment is consistent with the test result obtained by using the standard parameter values in the high temperature or low temperature environment.

[0054] The implementation of the target parameter value of the to-be-tested parameter which is modified according to the second test result passing can determine a more stringent target parameter value relative to the test, for example, the numerical value of the target parameter value is smaller. The specific implementation can be made by analyzing the reason for the second test result passing, which is not limited in the embodiments of the present application.

[0055] The test method provided by the embodiments of the present application firstly tests each to-be-tested parameter of a preset number of DRAM samples under a high-temperature environment and a low-temperature environment by a test machine and each standard parameter value, to obtain a corresponding first test result. Then, the test method tests each to-be-tested parameter of the DRAM sample with a failed first test result under a normal-temperature environment by a test machine and each target parameter value, to obtain a corresponding second test result. If the second test result is also failed, the test method tests each to-be-tested parameter of the to-be-tested DRAM under a normal-temperature environment by a test machine and each target parameter value, and does not need to perform the SLT test under a high-temperature environment and a low-temperature environment, so that the normal-temperature environment is used to replace the high-temperature environment and the low-temperature environment to perform the STL test of the to-be-tested DRAM sample, thereby saving the test cost and the test time.

[0056] In step S102 of the above embodiment, the target parameter value of each to-be-tested parameter is used to perform the test under a normal-temperature environment. Therefore, in a possible design, before step S102, the following step can also be included:

[0057] The target parameter value of each to-be-tested parameter is determined according to the standard parameter value of each to-be-tested parameter and the test data.

[0058] The target parameter value which is more stringent than the standard parameter value for the SLT test is determined according to the standard parameter value of each to-be-tested parameter and the test data. The test data is represented as a Shmoo graph, which can be one-dimensional, two-dimensional, three-dimensional or N-dimensional, and each dimension represents one or more variable to-be-tested parameters.

[0059] In a possible design, the possible implementation of determining each target parameter value according to the standard parameter value of each to-be-tested parameter and the test data is as shown in Figure 3 . Figure 3 The flowchart of another test method provided by the embodiments of the present application is shown in Figure 3 . The embodiments of the present application include the following steps:

[0060] S201: For each to-be-tested parameter, each intermediate parameter value under a high-temperature environment, a normal-temperature environment and a low-temperature environment is respectively determined according to the corresponding standard parameter value of each to-be-tested parameter and the test data.

[0061] S202: The target parameter value of each to-be-tested parameter is determined according to each intermediate parameter value of each to-be-tested parameter and a preset screening algorithm.

[0062] For each to-be-tested parameter, a target parameter value of the to-be-tested parameter is determined according to the standard parameter value of the to-be-tested parameter and the test data.

[0063] For example, for each to-be-tested parameter, first, intermediate parameter values of each to-be-tested parameter in a high-temperature environment, a normal-temperature environment and a low-temperature environment are respectively determined by the standard parameter value of each to-be-tested parameter and the test data, and it can be understood that each to-be-tested parameter corresponds to three intermediate parameter values. Then, a target parameter value of each to-be-tested parameter is determined by using a preset screening algorithm and the intermediate parameter values of each to-be-tested parameter, so as to realize the determination of the target parameter values of the to-be-tested parameters according to the standard parameter values of the to-be-tested parameters and the test data.

[0064] For each to-be-tested parameter, an intermediate parameter value of the to-be-tested parameter in a high-temperature environment is determined by the test data and the standard parameter value of the to-be-tested parameter, which is assumed to be represented by b1. Correspondingly, an intermediate parameter value of the to-be-tested parameter in a low-temperature environment is determined by the test data and the standard parameter value of the to-be-tested parameter, which is assumed to be represented by b2. An intermediate parameter value of the to-be-tested parameter in a normal-temperature environment is determined by the test data and the standard parameter value of the to-be-tested parameter, which is assumed to be represented by c. Then, a target parameter value m of each to-be-tested parameter can be determined by using a preset screening algorithm represented by, for example, the following formula (1):

[0065] m = a - (b - c) (1)

[0066] Wherein, a represents the standard parameter value of each to-be-tested parameter, and b represents the maximum value of b1 and b2.

[0067] For example, the intermediate parameter values of each to-be-tested parameter and the corresponding standard parameter value of the to-be-tested parameter are input into the preset screening algorithm represented by formula (1), and an output is obtained. Then, the output is determined as the target parameter value of the to-be-tested parameter, so as to obtain the target parameter values of each to-be-tested parameter.

[0068] The test method provided by the embodiments of the present application determines the intermediate parameter values in the high-temperature environment, the normal-temperature environment and the low-temperature environment by using the test data and the corresponding standard parameter value of each to-be-tested parameter, and then determines the target parameter value of each to-be-tested parameter by using the preset screening algorithm and the intermediate parameter values of each to-be-tested parameter, so as to obtain the target parameter values of the to-be-tested parameters. The most stringent parameter value in the high-temperature environment, the normal-temperature environment and the low-temperature environment is determined as the target parameter value by using the preset screening algorithm, and then the to-be-tested DRAMs that are abnormal in the high-temperature environment / low-temperature environment can be screened out when the test is performed in the normal-temperature environment, so as to realize the test in the normal-temperature environment instead of the high-temperature environment and the low-temperature environment.

[0069] In a possible design, for each to-be-tested parameter, each intermediate parameter value in a high-temperature environment, a normal-temperature environment, and a low-temperature environment is determined respectively by using a standard parameter value corresponding to the to-be-tested parameter and test data. Possible implementation manners include the following.

[0070] In the high-temperature environment, a first running result corresponding to each to-be-tested parameter is obtained according to the standard parameter value corresponding to the to-be-tested parameter and the test data, and then an intermediate parameter value of each to-be-tested parameter in the high-temperature environment is obtained according to each first running result. Each first running result includes pass or fail.

[0071] In the normal-temperature environment, a second running result corresponding to each to-be-tested parameter is obtained according to the standard parameter value corresponding to the to-be-tested parameter and the test data, and then an intermediate parameter value of each to-be-tested parameter in the normal-temperature environment is obtained according to each second running result. Each second running result includes pass or fail.

[0072] In the low-temperature environment, a third running result corresponding to each to-be-tested parameter is obtained according to the standard parameter value corresponding to the to-be-tested parameter and the test data, and then an intermediate parameter value of each to-be-tested parameter in the low-temperature environment is obtained according to each third running result. Each third running result includes pass or fail.

[0073] In the high-temperature environment, a first running result corresponding to each to-be-tested parameter is obtained according to the standard parameter value corresponding to the to-be-tested parameter and the test data, and then an intermediate parameter value of each to-be-tested parameter in the high-temperature environment is obtained according to each first running result. Possible implementation manners are as shown in Figure 4 Figure 4 FIG. 2 shows a flowchart of another test method provided by an embodiment of the present application. As shown in Figure 4

[0074] S301: A first running result corresponding to each to-be-tested parameter is obtained according to a standard parameter value corresponding to the to-be-tested parameter and test data.

[0075] In the high-temperature environment, the standard parameter value corresponding to each to-be-tested parameter is input into a test machine to run the test data, so as to obtain a first running result corresponding to each to-be-tested parameter, and then an intermediate parameter value of each to-be-tested parameter in the high-temperature environment is obtained according to each first running result.

[0076] Each first running result includes pass or fail. For each first running result, if the current first running result is pass, step S302a is performed. Otherwise, if the current first running result is fail, step S302b is performed.

[0077] ​​S302a: decrementing the standard parameter value of the to-be-tested parameter corresponding to the current first running result.

[0078] S302b: incrementing the standard parameter value of the to-be-tested parameter corresponding to the current first running result.

[0079] If the current first running result is passed, the standard parameter value of the to-be-tested parameter corresponding to the current first running result is tightened by the decrementing processing.

[0080] For example, the standard parameter value of a to-be-tested parameter is 18ns, and the first running result obtained according to the 18ns and the test data is passed in a high-temperature environment. Then, the 18ns is tightened by the decrementing processing based on the 18ns, for example, the tightening amplitude of the decrementing processing is 0.1ns, and the standard parameter value 18ns after the decrementing processing is 18ns-0.1ns, i.e., 17.9ns. Further, the intermediate parameter value of the to-be-tested parameter in the high-temperature environment corresponding to the current first running result is determined according to the standard parameter value after the decrementing and the test data, i.e., step S303 is further executed.

[0081] Similarly, if the current first running result is failed, the standard parameter value of the to-be-tested parameter corresponding to the current first running result is relaxed by the incrementing processing.

[0082] For example, the standard parameter value of a to-be-tested parameter is 18ns, and the first running result obtained according to the 18ns and the test data is failed in a high-temperature environment. Then, the 18ns is relaxed by the incrementing processing based on the 18ns, for example, the relaxing amplitude of the incrementing processing is 0.1ns, and the standard parameter value 18ns after the incrementing processing is 18ns+0.1ns, i.e., 18.1ns. Further, the intermediate parameter value of the to-be-tested parameter in the high-temperature environment corresponding to the current first running result is determined according to the standard parameter value after the incrementing and the test data, i.e., step S304 is further executed.

[0083] S303: obtaining a first intermediate running result according to the standard parameter value after the decrementing and the test data.

[0084] S304: obtaining a second intermediate running result according to the standard parameter value after the incrementing and the test data.

[0085] For step S303, the standard parameter value after the decrementing is input to a test machine to run and test the data, and a first intermediate running result is obtained, which includes passed or failed.

[0086] If the first intermediate running result is pass, the decrement processing of the standard parameter value is continued, and then the test data is executed according to the new decrement standard parameter value, i.e., the step S302a and the step S303 are continued. Until the running result of the test data is fail, the standard parameter value of the fail result is determined as the intermediate parameter value of the to-be-tested parameter corresponding to the current first running result in the high temperature environment, i.e., the step S305 is executed.

[0087] It can be understood that if the first intermediate running result is fail, the standard parameter value of the first intermediate running result is directly determined as the intermediate parameter value of the to-be-tested parameter corresponding to the current first running result in the high temperature environment, i.e., the step S305 is executed, and the standard parameter value of the running result of the test data is determined as the intermediate parameter value of the to-be-tested parameter corresponding to the current first running result in the high temperature environment.

[0088] For the step S304, after the increment processing, the increment standard parameter value is input to the test machine to execute the test data, and the second intermediate running result is obtained, which includes pass or fail.

[0089] If the second intermediate running result is fail, the increment processing of the standard parameter value is continued, and then the test data is executed according to the new increment standard parameter value, i.e., the step S302b and the step S304 are continued. Until the running result of the test data is pass, the standard parameter value of the pass result is determined as the intermediate parameter value of the to-be-tested parameter corresponding to the current first running result in the high temperature environment, i.e., the step S306 is executed.

[0090] It can be understood that if the second intermediate running result is pass, the standard parameter value of the second intermediate running result is directly determined as the intermediate parameter value of the to-be-tested parameter corresponding to the current first running result in the high temperature environment, i.e., the step S306 is executed, and the standard parameter value of the running result of the test data is determined as the intermediate parameter value of the to-be-tested parameter corresponding to the current first running result in the high temperature environment.

[0091] S305: The standard parameter value of the fail result is determined as the intermediate parameter value of the to-be-tested parameter corresponding to the current first running result in the high temperature environment.

[0092] S306: The standard parameter value of the pass result is determined as the intermediate parameter value of the to-be-tested parameter corresponding to the current first running result in the high temperature environment.

[0093] In the high temperature environment, for all to-be-tested parameters of the to-be-tested DRAM, the steps S301-S306 are executed as follows Figure 4The embodiment shown is based on the standard parameter value corresponding to each to-be-tested parameter and test data, and obtains the intermediate parameter value of each to-be-tested parameter in a high-temperature environment through decrement processing or increment processing, and then determines the target parameter value of each to-be-tested parameter by using a preset screening algorithm based on the obtained intermediate parameter value, so as to realize SLT testing in a normal-temperature environment instead of a high-temperature environment and a low-temperature environment, thereby saving test cost and test time.

[0094] In a normal-temperature environment, the second running result corresponding to each to-be-tested parameter is obtained according to the standard parameter value corresponding to each to-be-tested parameter and test data, and then the intermediate parameter value of each to-be-tested parameter in the normal-temperature environment is obtained according to each second running result, and a possible implementation manner is as shown in Figure 5 Figure 5 A flowchart of another test method provided by the embodiment is shown in Figure 5

[0095] S401: The second running result corresponding to each to-be-tested parameter is obtained according to the standard parameter value corresponding to each to-be-tested parameter and test data.

[0096] In a normal-temperature environment, the second running result corresponding to each to-be-tested parameter is obtained according to the standard parameter value corresponding to each to-be-tested parameter and test data, and then the intermediate parameter value of each to-be-tested parameter in the normal-temperature environment is obtained according to each second running result, and a possible implementation manner is as shown in

[0097] Each second running result includes pass or fail. For each second running result, if the current second running result is pass, step S402a is performed. Otherwise, if the current second running result is fail, step S402b is performed.

[0098] S402a: The standard parameter value of the to-be-tested parameter corresponding to the current second running result is decremented.

[0099] S402b: The standard parameter value of the to-be-tested parameter corresponding to the current second running result is incremented.

[0100] If the current second running result is pass, the standard parameter value of the to-be-tested parameter corresponding to the current second running result is decremented through decrement processing.

[0101] ​​For example, a standard parameter value of a to-be-tested parameter is 18ns, and a second running result obtained according to the 18ns and test data is pass in a normal temperature environment, then the 18ns is reduced by a decrement processing, for example, the decrement processing is reduced by 0.1ns, and the standard parameter value 18ns is reduced to 17.9ns after the decrement processing. Then, the intermediate parameter value of the to-be-tested parameter in the normal temperature environment corresponding to the current second running result is further determined according to the reduced standard parameter value and the test data, that is, step S403 is further executed.

[0102] Similarly, if the current second running result is failure, the standard parameter value of the to-be-tested parameter corresponding to the current second running result is relaxed by an increment processing.

[0103] For example, a standard parameter value of a to-be-tested parameter is 18ns, and a second running result obtained according to the 18ns and test data is failure in a normal temperature environment, then the 18ns is relaxed by an increment processing, for example, the increment processing is relaxed by 0.1ns, and the standard parameter value 18ns is relaxed to 18.1ns after the increment processing. Then, the intermediate parameter value of the to-be-tested parameter in the normal temperature environment corresponding to the current second running result is further determined according to the relaxed standard parameter value and the test data, that is, step S404 is further executed.

[0104] S403: obtaining a third intermediate running result according to the reduced standard parameter value and the test data.

[0105] S404: obtaining a fourth intermediate running result according to the relaxed standard parameter value and the test data.

[0106] For step S403, the reduced standard parameter value is input to a test machine to run the test data after the decrement processing, and a third intermediate running result is obtained, which includes pass or failure.

[0107] If the third intermediate running result is pass, the decrement processing is continued to be performed on the standard parameter value, and the test data is run according to the new reduced standard parameter value, that is, step S402a and step S403 are continued to be executed. Until the running result of the test data is failure, the standard parameter value of the failure running result is determined as the intermediate parameter value of the to-be-tested parameter in the normal temperature environment corresponding to the current second running result, that is, step S405 is executed.

[0108] Understandably, if the third intermediate running result is a failure, the standard parameter value of the third intermediate running result is directly determined as the intermediate parameter value of the parameter to be tested corresponding to the current second running result under normal temperature conditions. That is, step S405 is executed to determine the standard parameter value of the running result of the failed test data as the intermediate parameter value of the parameter to be tested corresponding to the current second running result under normal temperature conditions.

[0109] For step S404, after incremental processing, the fourth intermediate running result is obtained based on the incremental standard parameter values ​​and test data. The fourth intermediate running result includes pass or failure.

[0110] If the fourth intermediate running result is a failure, the standard parameter value is incremented, and the test data is run according to the new incremented standard parameter value, i.e., steps S402b and S404 are continued. Until the test data running result is a pass, the standard parameter value of the passing running result is determined as the intermediate parameter value of the parameter to be tested corresponding to the current second running result under normal temperature environment, i.e., step S406 is executed.

[0111] Understandably, if the fourth intermediate running result is passed, the standard parameter value for which the fourth intermediate running result is passed will be directly determined as the intermediate parameter value of the parameter to be tested corresponding to the current second running result under normal temperature conditions. That is, step S406 will be executed, and the standard parameter value for which the running result of the test data is passed will be determined as the intermediate parameter value of the parameter to be tested corresponding to the current second running result under normal temperature conditions.

[0112] S405: Determine the standard parameter value of the failed run result as the intermediate parameter value of the parameter to be measured corresponding to the current second run result under normal temperature conditions.

[0113] S406: The standard parameter value of the obtained successful operation result is determined as the intermediate parameter value of the parameter to be measured under normal temperature environment corresponding to the current second operation result.

[0114] Under normal temperature conditions, for all the parameters to be measured of the DRAM under test, by means of... Figure 5 The embodiment shown obtains the intermediate parameter value of each parameter under normal temperature environment by reducing or increasing the amount of data based on the standard parameter value and test data corresponding to each parameter to be tested. Then, the target parameter value of each parameter to be tested can be determined by using a preset screening algorithm based on the obtained intermediate parameter value, so as to realize the use of normal temperature environment to replace high temperature environment and low temperature environment for SLT test, saving test cost and test time.

[0115] In the low-temperature environment, according to the standard parameter value corresponding to each to-be-tested parameter and the test data, a third running result corresponding to each to-be-tested parameter is obtained, and then an intermediate parameter value of each to-be-tested parameter in the low-temperature environment is obtained according to each third running result. The possible implementation manner is as shown in Figure 6 Figure 6 The flowchart of another test method provided by the embodiment of the present application is shown in Figure 6

[0116] S501: According to the standard parameter value corresponding to each to-be-tested parameter and the test data, a third running result corresponding to each to-be-tested parameter is obtained.

[0117] In the low-temperature environment, the standard parameter value corresponding to each to-be-tested parameter is input to a test machine to run the test data, so as to obtain a third running result corresponding to each to-be-tested parameter, and then an intermediate parameter value of each to-be-tested parameter in the low-temperature environment is obtained according to each third running result.

[0118] Each third running result includes pass or fail. For each third running result, if the current third running result is pass, step S502a is executed. Otherwise, if the current third running result is fail, step S502b is executed.

[0119] S502a: The standard parameter value of the to-be-tested parameter corresponding to the current third running result is decremented.

[0120] S502b: The standard parameter value of the to-be-tested parameter corresponding to the current third running result is incremented.

[0121] If the current third running result is pass, the standard parameter value of the to-be-tested parameter corresponding to the current third running result is tightened by decrementing.

[0122] For example, the standard parameter value of a to-be-tested parameter is 18 ns, and in the low-temperature environment, the third running result obtained according to the 18 ns and the test data is pass. Then, the 18 ns is tightened by decrementing on the basis of the 18 ns, for example, the decrementing is performed by 0.1 ns, and the standard parameter value 18 ns is decremented to 17.9 ns after the decrementing. Then, the intermediate parameter value of the to-be-tested parameter corresponding to the current third running result in the low-temperature environment is further determined according to the decremented standard parameter value and the test data, that is, step S503 is further executed.

[0123] Similarly, if the current third running result is fail, the standard parameter value of the to-be-tested parameter corresponding to the current third running result is relaxed by incrementing.

[0124] ​​For example, a standard parameter value of a to-be-tested parameter is 18 ns, and a third running result obtained according to the 18 ns and test data in a low-temperature environment is failure, then the 18 ns is relaxed by increment processing based on the 18 ns, for example, the relaxed range of the increment processing is 0.1 ns, and the standard parameter value 18 ns after the increment processing is 18.1 ns. Then, the intermediate parameter value of the to-be-tested parameter in the low-temperature environment corresponding to the current third running result is further determined according to the standard parameter value after the increment processing and the test data, that is, step S504 is further performed.

[0125] S503: obtaining a fifth intermediate running result according to the standard parameter value after the decrement processing and the test data.

[0126] S504: obtaining a sixth intermediate running result according to the standard parameter value after the increment processing and the test data.

[0127] For step S503, after the decrement processing, the fifth intermediate running result is obtained according to the standard parameter value after the decrement processing and the test data, and the fifth intermediate running result includes pass or failure.

[0128] If the fifth intermediate running result is pass, the decrement processing of the standard parameter value is continued, and the test data is run according to the new standard parameter value after the decrement processing, that is, step S502a and step S503 are continued to be performed. Until the running result of the test data is failure, the standard parameter value of the failure running result is determined as the intermediate parameter value of the to-be-tested parameter in the low-temperature environment corresponding to the current third running result, that is, step S505 is performed.

[0129] It can be understood that if the fifth intermediate running result is failure, the standard parameter value of the fifth intermediate running result is directly determined as the intermediate parameter value of the to-be-tested parameter in the low-temperature environment corresponding to the current third running result, that is, step S505 is performed, and the standard parameter value of the test data of the failure running result is determined as the intermediate parameter value of the to-be-tested parameter in the low-temperature environment corresponding to the current third running result.

[0130] For step S504, after the increment processing, the sixth intermediate running result is obtained according to the standard parameter value after the increment processing and the test data, and the sixth intermediate running result includes pass or failure.

[0131] If the sixth intermediate running result is a failure, the standard parameter value is further incrementally processed, and then the test data is run according to the new incremental standard parameter value, that is, steps S502b and S504 are continued. Until the test data running result is a pass, the standard parameter value of the passing running result is determined as the intermediate parameter value of the parameter to be tested corresponding to the current third running result in the low temperature environment, that is, step S506 is executed.

[0132] Understandably, if the sixth intermediate running result is passed, the standard parameter value for which the sixth intermediate running result is passed will be directly determined as the intermediate parameter value of the parameter to be tested corresponding to the current third running result in the low temperature environment. That is, step S506 will be executed, and the standard parameter value for which the running result of the test data is passed will be determined as the intermediate parameter value of the parameter to be tested corresponding to the current third running result in the low temperature environment.

[0133] S505: Determine the standard parameter value of the failed run result as the intermediate parameter value of the parameter to be measured corresponding to the current third run result under low temperature environment.

[0134] S506: The standard parameter value of the obtained successful operation result is determined as the intermediate parameter value of the parameter to be measured in the low temperature environment corresponding to the current third operation result.

[0135] In low-temperature environments, for all the parameters to be measured of the DRAM under test, by means of... Figure 6 The embodiment shown obtains the intermediate parameter value of each parameter under low temperature environment by reducing or increasing the amount of data based on the standard parameter value and test data corresponding to each parameter to be tested. Then, the target parameter value of each parameter to be tested can be determined by using a preset screening algorithm based on the obtained intermediate parameter value, so as to realize the SLT test in the normal temperature environment instead of the high temperature environment and the low temperature environment, saving test cost and test time.

[0136] Figure 7 This is a schematic diagram of a testing device provided in an embodiment of this application. Figure 7 As shown, the testing apparatus 600 provided in this application embodiment includes:

[0137] The first processing module 601 is used to test the parameters to be tested on a preset number of DRAM samples under high temperature and low temperature environments using a system-level test machine and standard parameter values, and to obtain the corresponding first test results.

[0138] The second processing module 602 is used to test the parameters to be tested of the DRAM sample whose first test result is failed under normal temperature environment by using a test machine and the target parameter values, and to obtain the corresponding second test result.

[0139] The third processing module 603 is used to test the parameters of the DRAM under test in a normal temperature environment by using a test machine and the target parameter values ​​if the second test result is a failure. The memory sample and the DRAM under test are the same type of memory, and the target parameter value of the same parameter under test is less than the standard parameter value.

[0140] In one possible design, the third processing module 603 is also used for:

[0141] If the second test result is passed, adjust the target parameter value of the parameter to be tested for which the second test result is passed.

[0142] exist Figure 7 On this basis, Figure 8 This is a schematic diagram of another testing device provided in an embodiment of this application. Figure 8 As shown, the testing apparatus 600 provided in this embodiment of the application further includes: a fourth processing module 604, which is used for:

[0143] The target parameter value for each parameter to be tested is determined based on the standard parameter value and test data.

[0144] In one possible design, the fourth processing module 604 includes:

[0145] The first processing submodule is used to determine the intermediate parameter values ​​for high temperature environment, normal temperature environment and low temperature environment for each parameter to be measured, based on the standard parameter value and test data corresponding to each parameter to be measured.

[0146] The second processing submodule is used to determine the target parameter value for each parameter to be tested based on the intermediate parameter values ​​and the preset filtering algorithm.

[0147] In one possible design, the first processing submodule is specifically used for:

[0148] In a high-temperature environment, based on the standard parameter value and test data corresponding to each parameter to be tested, the first running result corresponding to each parameter to be tested is obtained, and the intermediate parameter value of each parameter to be tested in a high-temperature environment is obtained based on each first running result. Each first running result includes pass or fail.

[0149] Under normal temperature conditions, based on the standard parameter values ​​and test data corresponding to each parameter to be tested, the second running result corresponding to each parameter to be tested is obtained, and the intermediate parameter value of each parameter to be tested under normal temperature conditions is obtained based on each second running result. Each second running result includes pass or fail.

[0150] In the low-temperature environment, according to the standard parameter value corresponding to each to-be-tested parameter and the test data, a third running result corresponding to each to-be-tested parameter is obtained, and an intermediate parameter value of each to-be-tested parameter in the low-temperature environment is obtained according to each third running result, each third running result including pass or fail.

[0151] In a possible design, the second processing submodule is specifically configured to:

[0152] The intermediate parameter value of each to-be-tested parameter and the standard parameter value corresponding to each to-be-tested parameter are input into a preset screening algorithm, and an output is determined as a target parameter value of each to-be-tested parameter.

[0153] In a possible design, the first processing submodule is further specifically configured to:

[0154] If the current first running result is pass, the standard parameter value of the to-be-tested parameter corresponding to the current first running result is subjected to decrement processing, and an intermediate parameter value of the to-be-tested parameter corresponding to the current first running result in the high-temperature environment is determined according to the decremented standard parameter value and the test data.

[0155] If the current first running result is fail, the standard parameter value of the to-be-tested parameter corresponding to the current first running result is subjected to increment processing, and an intermediate parameter value of the to-be-tested parameter corresponding to the current first running result in the high-temperature environment is determined according to the incremented standard parameter value and the test data.

[0156] In a possible design, the first processing submodule is further specifically configured to:

[0157] A first intermediate running result is obtained according to the decremented standard parameter value and the test data, the first intermediate running result including pass or fail;

[0158] If the first intermediate running result is pass, the decrement processing of the standard parameter value is continued, and a standard parameter value of a running result of the test data being fail is determined as the intermediate parameter value of the to-be-tested parameter corresponding to the current first running result in the high-temperature environment according to the new decremented standard parameter value and the test data;

[0159] If the first intermediate running result is fail, a standard parameter value of the first intermediate running result is determined as the intermediate parameter value of the to-be-tested parameter corresponding to the current first running result in the high-temperature environment.

[0160] In a possible design, the first processing submodule is further specifically configured to:

[0161] A second intermediate running result is obtained according to the incremented standard parameter value and the test data, the second intermediate running result including pass or fail;

[0162] If the second intermediate running result is failure, continue to incrementally process the standard parameter value, and determine the standard parameter value of the passing running result as the intermediate parameter value of the to-be-tested parameter corresponding to the current first running result in the high-temperature environment according to the new incrementally processed standard parameter value and the test data until the running result of the test data is passing.

[0163] If the second intermediate running result is passing, determine the standard parameter value of the second intermediate running result as the intermediate parameter value of the to-be-tested parameter corresponding to the current first running result in the high-temperature environment.

[0164] In a possible design, the high-temperature environment includes an environment with a temperature of 50-70 degrees Celsius, the normal-temperature environment includes an environment with a temperature of 25 degrees Celsius, and the low-temperature environment includes an environment with a temperature of -10-30 degrees Celsius.

[0165] In a possible design, the to-be-tested parameters include timing parameters and test voltages, and the timing parameters include one or more of tCL, tRCD, tRP, tRAS, tWR, and tREF.

[0166] The test device provided by the embodiment of the present application can execute each step of the test method in the method embodiment, and the implementation principle and technical effects are similar, which will not be repeated here.

[0167] Figure 9 A structural schematic diagram of an electronic device provided by the embodiment of the present application is shown in FIG. 7. As shown in FIG. 7, the electronic device 700 can include a processor 701 and a memory 702 connected with the processor 701. Figure 9

[0168] The memory 702 is configured to store a program. Specifically, the program can include program code, and the program code includes computer execution instructions.

[0169] The memory 702 can include a high-speed RAM memory, and can also include a non-volatile memory (MoM-volatile memory), for example, at least one disk memory.

[0170] The processor 701 is configured to execute the computer execution instructions stored in the memory 702 to implement the test method.

[0171] The processor 701 can be a central processing unit (CPU), or an application specific integrated circuit (ASIC), or one or more integrated circuits configured to implement the embodiments of the present application. ​

[0172] Optionally, the memory 702 can be independent of the processor 701 or integrated with the processor 701. When the memory 702 is independent of the processor 701, the electronic device 700 can further include:

[0173] A bus 703 is used to connect the processor 701 and the memory 702. The bus can be an industry standard architecture (ISA) bus, a peripheral component (PCI) bus, an extended industry standard architecture (EISA) bus, or the like. The bus can be divided into an address bus, a data bus, a control bus, and the like, but does not mean that there is only one bus or one type of bus.

[0174] Optionally, in a specific implementation, if the memory 702 and the processor 701 are integrated on a chip, the memory 702 and the processor 701 can communicate through an internal interface.

[0175] The application further provides a computer readable storage medium, which can include a U disk, a mobile hard disk, a read-only memory (ROM), a random access memory (RAM), a magnetic disk or an optical disk, and various media that can store program codes, and specifically, the computer readable storage medium stores computer execution instructions, and the computer execution instructions are used for each step of the method in the above embodiments.

[0176] The application further provides a computer program product, which includes computer execution instructions, and the computer instructions are executed by a processor to realize each step of the method in the above embodiments.

[0177] Other embodiments of the application will be apparent to those skilled in the art from consideration of the specification and practice of the application disclosed herein. The specification and examples given are exemplary only and the true scope and spirit of the application is indicated by the claims. The true scope and spirit of the application is indicated by the claims.

[0178] It should be understood that the application is not limited to the precise construction that has been described above and shown in the accompanying drawings, and that various modifications and changes can be made by those skilled in the art without departing from the scope of the application. The scope of the application is indicated only by the appended claims.

Claims

1. A test method characterized by, The method comprises the following steps: respectively in a high-temperature environment and a low-temperature environment, testing each to-be-tested parameter of a preset number of dynamic random access memory (DRAM) samples through a system-level test machine and each standard parameter value, to obtain a corresponding first test result; in a normal-temperature environment, testing each to-be-tested parameter of a DRAM sample with a failed first test result through the test machine and each target parameter value, to obtain a corresponding second test result; if the second test result is failed, testing each to-be-tested parameter of a to-be-tested DRAM in the normal-temperature environment through the test machine and the target parameter values, the DRAM sample and the to-be-tested DRAM being DRAMs of the same type, and a target parameter value of a same to-be-tested parameter being less than a standard parameter value.

2. The test method of claim 1, wherein, if the second test result is passed, correcting the target parameter value of the to-be-tested parameter of the second test result that is passed.

3. The test method according to claim 1 or 2, characterized in that, Before the step of testing each to-be-tested parameter of a memory sample with a failed first test result in a normal-temperature environment through the test machine and each target parameter value, the method further comprises the step of determining the target parameter value of each to-be-tested parameter according to a standard parameter value and test data of each to-be-tested parameter.

4. The method of claim 3, wherein the step of determining the target parameter value of each to-be-tested parameter according to a standard parameter value and test data of each to-be-tested parameter comprises: for each to-be-tested parameter, determining each intermediate parameter value in the high-temperature environment, the normal-temperature environment and the low-temperature environment respectively according to the standard parameter value corresponding to the to-be-tested parameter and the test data; determining the target parameter value of each to-be-tested parameter according to each intermediate parameter value of each to-be-tested parameter and a preset screening algorithm. the step of determining each intermediate parameter value in the high-temperature environment, the normal-temperature environment and the low-temperature environment respectively according to the standard parameter value corresponding to each to-be-tested parameter and the test data comprises:

5. The test method of claim 4, wherein, in the high-temperature environment, obtaining a first running result corresponding to each to-be-tested parameter according to the standard parameter value corresponding to each to-be-tested parameter and the test data, and obtaining an intermediate parameter value of each to-be-tested parameter in the high-temperature environment according to each first running result, each first running result comprising pass or fail; in the normal-temperature environment, obtaining a second running result corresponding to each to-be-tested parameter according to the standard parameter value corresponding to each to-be-tested parameter and the test data, and obtaining an intermediate parameter value of each to-be-tested parameter in the normal-temperature environment according to each second running result, each second running result comprising pass or fail; in the low-temperature environment, obtaining a third running result corresponding to each to-be-tested parameter according to the standard parameter value corresponding to each to-be-tested parameter and the test data, and obtaining an intermediate parameter value of each to-be-tested parameter in the low-temperature environment according to each third running result, each third running result comprising pass or fail.

6. The method of claim 5, wherein ​ The target parameter value of each to-be-tested parameter is determined according to the intermediate parameter value of each to-be-tested parameter and a preset screening algorithm, and the target parameter value of each to-be-tested parameter is determined according to the intermediate parameter value of each to-be-tested parameter and a preset screening algorithm. The intermediate parameter value of each to-be-tested parameter and the corresponding standard parameter value of each to-be-tested parameter are input into the preset screening algorithm, and the output is determined as the target parameter value of each to-be-tested parameter.

7. The test method of claim 5, wherein the intermediate parameter value of each to-be-tested parameter in the high-temperature environment is obtained according to each first running result, and the intermediate parameter value of each to-be-tested parameter in the high-temperature environment is obtained according to each first running result. If the current first running result is passed, the standard parameter value of the to-be-tested parameter corresponding to the current first running result is decremented, and the intermediate parameter value of the to-be-tested parameter corresponding to the current first running result in the high-temperature environment is determined according to the decremented standard parameter value and the test data. If the current first running result is failed, the standard parameter value of the to-be-tested parameter corresponding to the current first running result is incremented, and the intermediate parameter value of the to-be-tested parameter corresponding to the current first running result in the high-temperature environment is determined according to the incremented standard parameter value and the test data.

8. The test method of claim 7, wherein the intermediate parameter value of the to-be-tested parameter corresponding to the current first running result in the high-temperature environment is determined according to the decremented standard parameter value and the test data, and the intermediate parameter value of the to-be-tested parameter corresponding to the current first running result in the high-temperature environment is determined according to the decremented standard parameter value and the test data. If the first intermediate running result is passed, the decrementing of the standard parameter value is continued, and the intermediate parameter value of the to-be-tested parameter corresponding to the current first running result in the high-temperature environment is determined according to the new decremented standard parameter value and the test data until the running result of the test data is failed. If the first intermediate running result is failed, the standard parameter value of the first intermediate running result is determined as the intermediate parameter value of the to-be-tested parameter corresponding to the current first running result in the high-temperature environment.

9. The test method of claim 7, wherein the intermediate parameter value of the to-be-tested parameter corresponding to the current first running result in the high-temperature environment is determined according to the incremented standard parameter value and the test data, and the intermediate parameter value of the to-be-tested parameter corresponding to the current first running result in the high-temperature environment is determined according to the incremented standard parameter value and the test data. If the second intermediate running result is failed, the incrementing of the standard parameter value is continued, and the intermediate parameter value of the to-be-tested parameter corresponding to the current first running result in the high-temperature environment is determined according to the new incremented standard parameter value and the test data until the running result of the test data is passed. If the second intermediate running result is failed, the standard parameter value of the first intermediate running result is determined as the intermediate parameter value of the to-be-tested parameter corresponding to the current first running result in the high-temperature environment. ​ ​ ​ ​ If the second intermediate operation result is pass, a standard parameter value obtained by the second intermediate operation result is determined as an intermediate parameter value of the to-be-tested parameter corresponding to the current first operation result in the high-temperature environment.

10. The test method of claim 1, wherein, the high-temperature environment comprises a temperature chamber environment of 50-70°C; the normal-temperature environment comprises a temperature chamber environment of 25°C; and the low-temperature environment comprises a temperature chamber environment of -10- -30°C.

11. The test method of claim 1, wherein, the to-be-tested parameters comprise timing parameters and test voltages, and the timing parameters comprise one or more of tCL, tRCD, tRP, tRAS, tWR, and tREF.

12. A test device, comprising: a first processing module configured to test to-be-tested parameters of a preset number of dynamic random access memory (DRAM) samples in a high-temperature environment and a low-temperature environment respectively by a system-level test machine and standard parameter values, to obtain corresponding first test results; a second processing module configured to test the to-be-tested parameters of the DRAM samples with failed first test results in a normal-temperature environment by the test machine and target parameter values, to obtain corresponding second test results; a third processing module configured to test the to-be-tested parameters of a to-be-tested DRAM in the normal-temperature environment by the test machine and the target parameter values if the second test results are failed, wherein the DRAM samples and the to-be-tested DRAM are same type memories, and a target parameter value of a same to-be-tested parameter is less than a standard parameter value.

13. An electronic device, comprising: a processor, and a memory connected to the processor in communication; the memory stores computer-executed instructions; the processor executes the computer-executed instructions stored in the memory to implement the test method of any one of claims 1-11.

14. A computer-readable storage medium, comprising: the computer-readable storage medium stores computer-executed instructions, and the computer-executed instructions are executed by a processor to implement the test method of any one of claims 1-11. ​ ​

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