Micrometer Scale Automatic Calibration Device and Micrometer Scale Automatic Calibration Method

Abstract

The present invention discloses an automatic micrometer scale calibration device and a method for automatic micrometer scale calibration. The automatic micrometer scale calibration device includes a base, a laser distance measuring unit disposed on the base, a display adjustment unit, and a computer control module. The display adjustment unit is connected to a micrometer knob and is used to rotate the micrometer knob to adjust the display scale on the micrometer to a preset scale. The laser distance measuring unit is used to measure the actual distance between the measuring surfaces of the micrometer corresponding to the preset scale. The computer control module is connected to the display adjustment unit and the laser distance measuring unit, respectively, and calculates the difference between the preset scale and the actual distance. The difference is the scale error of the measured micrometer. The calibration process realizes the automation of micrometer scale calibration, can save human resources, and has better calibration result accuracy and data reproducibility than manual measurement calibration.

Description

Technical Field

[0001] The present invention relates to the technical field of micrometers, and in particular to a micrometer scale automatic calibration device and a micrometer scale automatic calibration method. Background Art

[0002] At present, the standard equipment commonly used in the field of micrometer calibration is gauge blocks, flat crystals, parallel crystals, etc., which are used to calibrate parameters such as indication error, flatness, and parallelism respectively. Each calibration step is performed manually. The current micrometer calibration method is not only inefficient, but also has high requirements for operators and low reproducibility. Laser length measuring machines exist in the existing technology, but the measurement process does not actually achieve non-contact automatic measurement. It still requires the use of a hook to contact the measuring surface, requiring the operator to perform more operations, and more adjustments are required in the step of finding the inflection point. It requires high skills of the operator and is time-consuming and labor-intensive. Summary of the Invention

[0003] The technical problem to be solved by the present invention is to provide a micrometer scale automatic calibration device and a micrometer scale automatic calibration method in view of the defects of the prior art.

[0004] The technical solution adopted by the present invention to solve the technical problem is as follows: providing a micrometer scale automatic calibration device, which includes a base, a laser distance measuring unit and a display adjustment unit arranged on the base, and a computer control module;

[0005] The display adjustment unit is connected to the micrometer knob of the micrometer and is used to rotate the micrometer knob to adjust the display scale on the micrometer to a preset scale; the laser distance measuring unit is used to measure the actual distance between the measuring surfaces of the micrometer corresponding to the preset scale;

[0006] The computer control module is connected to the indication adjustment unit and the laser distance measuring unit respectively, and calculates the difference between the preset scale and the actually measured distance.

[0007] Preferably, the micrometer scale automatic calibration device further comprises a fixing seat for fixing the micrometer, and the fixing seat is arranged on the base.

[0008] Preferably, the laser ranging unit comprises a three-dimensional adjustment base, an interferometer lens group and a laser ranging unit group;

[0009] The interferometer lens group is arranged on the three-dimensional adjustment base and cooperates with the laser rangefinder group to measure the actual distance.

[0010] Preferably, the laser ranging unit includes a laser generator, a photoelectric receiver and a signal processor;

[0011] The laser generator is used to emit laser light through the interference mirror group to generate interference fringes, the photoelectric receiver records the change signal of the interference fringes, the signal processor receives the change signal, and sends the change signal to the computer control module.

[0012] Preferably, the indication adjustment unit includes a columnar fixture connected to the micrometer knob of the micrometer and a control motor axially connected to the fixture.

[0013] Preferably, the indication adjustment unit further includes an image sensing unit provided on the base, and the image sensing unit is used to collect the display scale on the micrometer.

[0014] The present invention also provides a method for automatically calibrating the micrometer scale, which uses any of the above-mentioned automatic calibration devices for micrometer scales. The method for automatically calibrating the micrometer scale comprises the following steps:

[0015] S1. Fixing the micrometer on the base;

[0016] S2, the laser ranging unit automatically aligns the optical path under the control of the computer control module;

[0017] S3, the display value adjustment unit adjusts the display scale of the micrometer to a preset scale under the control of the computer control module;

[0018] S4. The laser distance measuring unit measures the actual distance between the measuring surfaces of the micrometer corresponding to the preset scale, and the computer control module receives the actual distance and calculates the difference between the preset scale and the actual distance.

[0019] Preferably, step S2 includes the following steps:

[0020] S2.1. The three-dimensional adjustment base of the laser ranging unit moves in three dimensions under the control of the computer control module;

[0021] S2.2. When the laser ranging unit detects the generation of interference fringes, the three-dimensional adjustment base stops moving, and the optical path is now aligned.

[0022] Preferably, step S3 includes the following steps:

[0023] S3.1. The fixture of the indication adjustment unit rotates the micrometer knob of the micrometer under the control of the computer control module;

[0024] S3.2. The image sensor unit of the indication adjustment unit monitors the display scale on the micrometer and transmits the display scale back to the computer control module in real time;

[0025] S3.3. When the fixture adjusts the display scale of the micrometer to the preset scale, the fixture stops rotating under the control of the computer control module.

[0026] Preferably, step S4 includes the following steps:

[0027] S4.1. The laser ranging unit records the detected interference fringe change signal and converts the interference fringe change signal into a corresponding displacement signal;

[0028] S4.2. The computer control module receives the displacement signal and obtains the actual distance between the measuring surfaces of the micrometer corresponding to the preset scale;

[0029] S4.3. The computer control module calculates the difference between the preset scale and the measured distance.

[0030] The present invention has at least the following beneficial effects: under the control of a computer control module, the indication adjustment unit adjusts the micrometer to a preset scale, the laser distance measuring unit measures the actual distance between the micrometer measuring surfaces, and the scale error of the measured micrometer is calculated by calculating the difference between the preset scale and the actual distance. The calibration process automates micrometer calibration, saving human resources and achieving better calibration result accuracy and data reproducibility than manual measurement and calibration. BRIEF DESCRIPTION OF THE DRAWINGS

[0031] The present invention will be further described below with reference to the accompanying drawings and embodiments, in which:

[0032] Figure 1 1 is a schematic structural diagram of an automatic calibration device for a micrometer scale according to an embodiment of the present invention;

[0033] Figure 2 The figure is a schematic diagram of the optical path design of the automatic calibration device for micrometer scale according to one embodiment of the present invention. DETAILED DESCRIPTION

[0034] In order to have a clearer understanding of the technical features, purposes and effects of the present invention, specific embodiments of the present invention are now described in detail with reference to the accompanying drawings.

[0035] Figure 1-2 The micrometer scale automatic calibration device according to an embodiment of the present invention is shown, which includes a base 1, a laser distance measuring unit 2 and an indication adjustment unit 4 provided on the base 1, and a computer control module.

[0036] Specifically, the indication adjustment unit 4 is connected to the micrometer knob of the micrometer 3, and is used to rotate the micrometer knob of the micrometer 3 to adjust the display scale on the micrometer 3 to a preset scale; the laser ranging unit 2 is used to measure the actual distance between the measuring surfaces of the micrometer 3 corresponding to the preset scale; the computer control module is respectively connected to the indication adjustment unit 4 and the laser ranging unit 2, and calculates the difference between the preset scale and the actual distance.

[0037] In order to fix the micrometer 3 on the base 1 , the micrometer scale automatic calibration device further includes a fixing seat (not shown in the figure) for fixing the micrometer, and the fixing seat is arranged on the base 1 .

[0038] Specifically, if Figure 1 In the embodiment shown, the fixing seat includes three bosses provided on the base 1 , and the positions of the three bosses are distributed to adapt to three points on the contour path of the scale frame 32 of the micrometer 3 .

[0039] like Figure 1 As shown, a boss 11 and a boss 12 are respectively provided on the ruler frame 32 near the fixed measuring surface 30 and above the movable measuring surface 31 , and another boss 13 is provided above the ruler frame 32 at the midpoint between the fixed measuring surface 30 and the movable measuring surface 31 .

[0040] Furthermore, in order to achieve a better limiting function, a vertical limiting component for limiting the vertical displacement of the ruler frame 32 may be further provided on the fixing seat.

[0041] Ke Ru Figure 1 As shown, in order to fix the fixed measuring surface 30, a vertical limiting component 14 is added to the boss 11 at the fixed measuring surface 30. The vertical limiting component 14 is pressed against the boss 11 above the boss 11 to fix the portion of the ruler frame 32 close to the fixed measuring surface 30 between the boss 11 and the vertical limiting component 14 in the vertical direction. Specifically, it can be as follows Figure 1 As shown, the vertical limiting component 14 is connected to the fixing seat through bolts 15.

[0042] Alternatively, in other embodiments, in order to achieve a better vertical limiting effect, vertical limiting components may be provided on all three bosses (boss 11, boss 12, boss 13) without affecting the normal use of the micrometer 3, especially the rotation of the micrometer screw.

[0043] Furthermore, a limiting step (not shown in the figure) is formed on a surface of the fixing seat, and the limiting step limits the displacement of the micrometer 3 in the horizontal direction.

[0044] Specifically, if Figure 1As shown in the embodiment, the top surfaces of the bosses 11, 12, and 13 are all formed with limiting steps, and the parts of the scale frame 32 of the micrometer 3 placed on each boss are in contact with the wall surface of the limiting step, thereby limiting the horizontal displacement of the scale frame 32 of the micrometer 3 on each boss, fixing the micrometer 3 on the fixed seat, and avoiding the displacement of the micrometer 3 during the measurement process to affect the accuracy of the measurement result.

[0045] In order to adapt to the cylindrical structural characteristics of the micrometer 3 and better fix the micrometer 3 on the fixing seat, a groove corresponding to the arcuate surface of the micrometer 3 can also be provided on the fixing seat, and the arcuate surface of the micrometer 3 falls into the groove to fix the micrometer 3 on the fixing seat.

[0046] When the micrometer scale automatic calibration device is working, since the distance is measured by laser interferometry, the straight line direction from the fixed measuring surface 30 to the moving measuring surface 31 needs to be kept stable to avoid affecting the validity and accuracy of the measurement results. Figure 1 As shown, V-shaped grooves (not shown) are provided on bosses 11 and 12. The fixed sleeve portion of micrometer 3 (the fixed sleeve portion near the movable measuring surface 31) falls into the groove on boss 12, and the portion of scale frame 32 near the fixed measuring surface 30 falls into the groove on boss 11.

[0047] Therefore, the arc-shaped surfaces of the micrometer 3 at the opposite ends close to the fixed measuring surface 30 and the movable measuring surface 31 fall into the groove, and the arc-shaped surfaces abut against the groove wall surfaces of the groove, further fixing the opposite ends of the micrometer 3 close to the fixed measuring surface 30 and the movable measuring surface 31 on the corresponding bosses (boss 11, boss 12).

[0048] Similarly, in other embodiments, corresponding grooves as described above may also be provided on the boss 13 .

[0049] It is understandable that in other embodiments, the number and position distribution of the bosses may be increased, decreased or adjusted accordingly based on factors such as the specifications and models of the micrometer selected and the specifications and dimensions of the designed base.

[0050] Furthermore, in order to adapt to fixing micrometers of different sizes on the base 1, a positioning groove 6 is also provided on the base 1, and the fixing seat is inserted into the positioning groove 6 and is movably connected to the base 1.

[0051] Specifically, see Figure 1 , boss 11, boss 12, boss 13 are respectively inserted into the corresponding positioning groove 6, so that the spacing between the bosses can be adjusted by sliding the above-mentioned bosses to adapt to fixing micrometers of different sizes.

[0052] like Figure 1-2As shown, the laser ranging unit 2 includes a three-dimensional adjustment base 20, an interferometer group 21 and a laser ranging unit 22; the interferometer group 21 is set on the three-dimensional adjustment base 20, and cooperates with the laser ranging unit 22 to measure the actual distance between the measuring surfaces of the micrometer 3.

[0053] Specifically, the optical path design of this embodiment is as follows: Figure 2 As shown, the interferometer assembly 21 includes a convex lens 213, a reflective and transmissive beam splitter 210, a fixed-angle pyramid 211, and a double-sided reflector 212. The interferometer assembly 21 is positioned between the two inner measuring surfaces of the micrometer 3, namely the fixed measuring surface 30 and the movable measuring surface 31. The laser light emitted by the laser rangefinder assembly 22 is split by the interferometer assembly 21, generating a reference beam and a measuring beam that interfere with each other between the fixed measuring surface 30 and the movable measuring surface 31, and producing interference fringes. By monitoring the variation of the interference fringes, the distance between the two inner measuring surfaces of the micrometer 3 can be detected.

[0054] The micrometer scale automatic calibration device further includes a drive motor (not shown) connected to the three-dimensional adjustment base 20 , and the drive motor drives the three-dimensional adjustment base 20 to move in three dimensions relative to the base 1 .

[0055] Preferably, see Figure 2 The laser rangefinder assembly 22 includes a laser transmitter, a photoelectric receiver, and a signal processor. The laser transmitter transmits laser light through the interferometer assembly 21 to generate interference fringes. As the moving measuring surface 31 moves, the photoelectric receiver records the change signal of the interference fringes. The signal processor receives this change signal and sends it to the computer control module.

[0056] Specifically, the change signal is the change in the interference fringes, which can be converted into an electric pulse signal by the photoelectric conversion elements and electronic circuits in the photoelectric receiver, and this electric pulse signal is input into the signal processor. The signal processor can convert the electric pulse signal into a corresponding displacement signal and input it into the computer control module.

[0057] Preferably, if Figure 1 As shown, the indication adjustment unit 4 includes a columnar fixture 40 connected to the micrometer knob of the micrometer 3 and a control motor 41 axially connected to the fixture 40. Figure 1 As shown, the outer shape of the fixture 40 may be cylindrical and adapted to the shape of the micrometer knob of the micrometer 3. The end thereof close to the micrometer knob (not shown) of the micrometer 3 may include a cavity, the diameter of which is approximately equivalent to the diameter of the outer peripheral surface of the micrometer knob of the micrometer 3, or slightly smaller than the diameter of the outer peripheral surface of the micrometer knob of the micrometer 3 so as to fit on the outer peripheral surface of the micrometer knob in an interference fit manner.

[0058] Alternatively, the end of the fixture 40 close to the micrometer knob of the micrometer 3 can also cooperate with the micrometer knob of the micrometer 3 in other ways to firmly connect the fixture 40 itself to the micrometer knob of the micrometer 3.

[0059] Specifically, the fixture 40 can be firmly sleeved on the outer peripheral surface of the micrometer knob of the micrometer 3, so that the micrometer knob of the micrometer 3 can be controlled by rotating the fixture 40, that is, torque can be transmitted between the fixture 40 and the micrometer knob of the micrometer 3.

[0060] The specific connection method between the fixture 40 and the micrometer knob of the micrometer 3 can be adjusted accordingly based on the physical properties such as the specifications of the micrometer actually selected, the roughness and smoothness of the outer surface of the micrometer knob, etc. Professional and technical personnel can use different connection methods to achieve the function of the aforementioned fixture 40, but such implementation should not be considered to exceed the scope of the present invention.

[0061] Further, if Figure 1 As shown, a coupling may be included between the control motor 41 and the fixture 40. In this embodiment, the coupling includes a coupling rod 42 and a coupling sleeve 43 sleeved on the outer circumference of the coupling rod. The coupling is used to transmit the torque generated by the control motor 41 to the fixture 40, thereby transmitting the control micrometer knob to adjust the display scale of the micrometer 3.

[0062] Preferably, the indication adjustment unit 4 further includes an image sensing unit 50 disposed on the base 1, and the image sensing unit 50 collects the display scale on the micrometer 3. In this embodiment, the image sensing unit 50 is a CMOS camera with a CMOS image sensor.

[0063] Specifically, see Figure 1 A bracket 51 is provided on the base 1 near the scale line of the micrometer 3, and the image sensing unit 50 is set on the bracket 51. It can collect the display scale image information on the micrometer 3 in real time and convert the display scale image information into numerical information, which is input into the computer control module.

[0064] It is understood that in other embodiments, other types of image sensing units besides CMOS cameras may be used. Similarly, in other embodiments, the image sensing unit 50 may be positioned elsewhere on the base 1 to achieve the aforementioned function of capturing the scale displayed on the micrometer 3, taking into account specific factors such as the type of image sensor selected, the performance parameters of the corresponding camera, the quality requirements for the captured image, and the influence of ambient light. However, such implementations should not be considered beyond the scope of the present invention.

[0065] The present invention also includes a micrometer scale automatic calibration method, which can be used Figure 1-2The micrometer scale automatic calibration device and the micrometer scale automatic calibration method of the illustrated embodiment include the following steps:

[0066] S1. Fix the micrometer 3 on the base 1;

[0067] Specifically, see Figure 1 , place three points on the ruler frame 32 (close to the fixed measuring surface 30, close to the movable measuring surface 31, and the arc vertex of the ruler frame 32) on the fixed seats (boss 11, boss 12, boss 13) for fixation.

[0068] S2. The laser ranging unit 2 automatically aligns the optical path under the control of the computer control module.

[0069] Preferably, step S2 includes the following steps:

[0070] S2.1. The three-dimensional adjustment base 20 moves in three dimensions under the control of the computer control module;

[0071] S2.2. When the photoelectric receiver detects the generation of interference fringes, the three-dimensional adjustment base 20 stops moving. At this time, the optical path has been aligned.

[0072] Specifically, before step S2.1, the computer control module can be started, and a preset scale value can be input into the computer control module. The laser rangefinder assembly 22 is started, and the laser transmitter emits laser light through the interferometer assembly 21.

[0073] The interferometer lens group 21 can be set between the two internal measuring surfaces of the micrometer 3, which are the fixed measuring surface 30 and the movable measuring surface 31. The laser emitted by the laser rangefinder group 22 is split into a reference beam (not shown) and a measuring beam (not shown) between the fixed measuring surface 30 and the movable measuring surface 31 through the interferometer lens group 21.

[0074] When the three-dimensional adjustment base 20 moves to a suitable position, the optical paths of the reference beam and the measuring beam are aligned, resulting in light interference. The photoelectric receiver detects the interference fringes and inputs the corresponding information received into the computer control module through the signal processing system. The computer control module can obtain the information on the completion of the optical path alignment.

[0075] S3, the display adjustment unit 4 adjusts the display scale of the micrometer 3 to a preset scale under the control of the computer control module;

[0076] Preferably, step S3 includes the following steps:

[0077] S3.1. The fixture 40 rotates the micrometer knob of the micrometer 3 under the control of the computer control module.

[0078] Specifically, the movable measuring surface 31 moves toward the side close to the fixed measuring surface 30 as the micrometer knob rotates. During the movement, the optical path difference between the reference beam and the measuring beam changes, and the photoelectric receiver receives the corresponding interference fringe change signal.

[0079] The interference fringe change signal can be converted into an electric pulse signal by the photoelectric conversion elements and electronic circuits in the photoelectric receiver, and this electric pulse signal is input into the signal processor. The signal processor can convert the electric pulse signal into a corresponding displacement signal and input it into the computer control module.

[0080] S3.2. The image sensing unit 50 monitors the display scale on the micrometer 3 and transmits the display scale back to the computer control module in real time;

[0081] Specifically, the computer control module controls the fixture 40 of the display adjustment unit 4 to rotate and adjust the micrometer knob of the micrometer 3. The image sensor unit 50 captures the displayed scale of the micrometer 3 in real time during this process and feeds it back to the computer control module. This process is actually a closed-loop control process in which the computer control module controls the displayed scale of the micrometer 3. The goal of this closed-loop control process is to make the displayed scale of the micrometer 3 equal to the preset scale.

[0082] It is understood that the preset scale may be set in advance in the computer control module. The preset scale may be adjustable in real time in the computer control module. The preset scale may be a single value or multiple different values, taking into account different user needs or calibration accuracy.

[0083] S3.3. When the fixture 40 adjusts the display scale of the micrometer 3 to the preset scale, the fixture 40 stops rotating under the control of the computer control module.

[0084] Specifically, the computer control module outputs a command signal to control the rotation of the control motor 41 connected to the coupling, and transmits the micrometer knob of the control micrometer 3 to change its display scale. When the computer control module determines that the display scale of the micrometer 3 is equal to the preset scale, it sends a command signal to brake the control motor 41, and the control motor 41 stops running accordingly.

[0085] S4, after the laser distance measuring unit 2 measures the actual distance between the measuring surfaces of the micrometer 3 corresponding to the preset scale, the computer control module receives the actual distance and calculates the difference between the preset scale and the actual distance;

[0086] Preferably, step S4 includes the following steps:

[0087] S4.1. The signal processor records the interference fringe change signal detected by the photoelectric receiver and converts the interference fringe change signal into a corresponding displacement signal;

[0088] S4.2. The computer control module receives the displacement signal and obtains the actual measured distance between the measuring surfaces of micrometer 3 (i.e., fixed measuring surface 30 and movable measuring surface 31) corresponding to the preset scale.

[0089] S4.3. The computer control module calculates the difference between the preset scale and the actual measured distance.

[0090] When the displayed scale on the micrometer 3 is equal to the preset scale, the difference between the preset scale and the above-mentioned measured distance is the scale calibration result error of the micrometer 3.

[0091] Furthermore, the computer control module can show the user the difference between the preset scale and the actual measured distance.

[0092] The control methods of the computer control modules described in the embodiments disclosed herein, or the related steps involved in the control methods, can be implemented directly using hardware, software modules executed by a processor, or a combination of the two. The software modules can be placed in random access memory (RAM), internal memory, read-only memory (ROM), electrically programmable ROM, electrically erasable programmable ROM, registers, hard disk, removable disk, CD-ROM, or any other form of storage medium known in the art.

[0093] The above descriptions are merely some specific embodiments of the present invention and are not intended to limit the patent scope of the present invention. Any equivalent structures or equivalent process transformations made using the contents of the present invention's description and drawings, or directly or indirectly applied to other related technical fields, are also included in the patent protection scope of the present invention.

Claims

1. A micrometer scale automatic calibration device, characterized in that: It includes a base, a laser distance measuring unit and a display value adjustment unit arranged on the base, and a computer control module; The display adjustment unit is connected to the micrometer knob of the micrometer and is used to rotate the micrometer knob to adjust the display scale on the micrometer to a preset scale; the laser distance measuring unit is used to measure the actual distance between the measuring surfaces of the micrometer corresponding to the preset scale; The computer control module is connected to the indication adjustment unit and the laser distance measuring unit respectively, and calculates the difference between the preset scale and the measured distance; The laser ranging unit includes a three-dimensional adjustment base, an interferometer group and a laser ranging unit; the interferometer group is arranged on the three-dimensional adjustment base and cooperates with the laser ranging unit to measure the actual measured distance; the interferometer group is arranged between the two inner measuring surfaces of the micrometer, and the three-dimensional adjustment base can move in three directions under the control of the computer control module to complete the automatic centering of the optical path.

2. The micrometer scale automatic calibration device according to claim 1, characterized in that: The micrometer scale automatic calibration device also includes a fixing seat for fixing the micrometer, and the fixing seat is arranged on the base.

3. The micrometer scale automatic calibration device according to claim 1, characterized in that: The laser ranging unit includes a laser generator, a photoelectric receiver and a signal processor; The laser generator is used to emit laser light through the interference mirror group to generate interference fringes, the photoelectric receiver records the change signal of the interference fringes, the signal processor receives the change signal, and sends the change signal to the computer control module.

4. The micrometer scale automatic calibration device according to claim 1, characterized in that: The indication adjustment unit includes a columnar fixture connected to the micrometer knob of the micrometer and a control motor axially connected to the fixture.

5. The micrometer scale automatic calibration device according to claim 4, characterized in that: The indication adjustment unit further includes an image sensing unit disposed on the base, and the image sensing unit is used to collect the display scale on the micrometer.

6. A method for automatically calibrating micrometer scales, characterized in that: The micrometer scale automatic calibration device according to any one of claims 1 to 5 comprises the following steps: S1. Fixing the micrometer on the base; S2, the laser ranging unit automatically aligns the optical path under the control of the computer control module; S3, the display value adjustment unit adjusts the display scale of the micrometer to a preset scale under the control of the computer control module; S4. The laser distance measuring unit measures the actual distance between the measuring surfaces of the micrometer corresponding to the preset scale, and the computer control module receives the actual distance and calculates the difference between the preset scale and the actual distance.

7. The automatic calibration method for micrometer scale according to claim 6, characterized in that: Step S2 includes the following steps: S2.

1. The three-dimensional adjustment base of the laser ranging unit moves in three dimensions under the control of the computer control module; S2.

2. When the laser ranging unit detects the generation of interference fringes, the three-dimensional adjustment base stops moving, and the optical path is now aligned.

8. The automatic calibration method for micrometer scale according to claim 6, characterized in that: Step S3 includes the following steps: S3.

1. The fixture of the indication adjustment unit rotates the micrometer knob of the micrometer under the control of the computer control module; S3.

2. The image sensor unit of the indication adjustment unit monitors the display scale on the micrometer and transmits the display scale back to the computer control module in real time; S3.

3. When the fixture adjusts the display scale of the micrometer to the preset scale, the fixture stops rotating under the control of the computer control module.

9. The automatic calibration method for micrometer scale according to claim 6, characterized in that: Step S4 includes the following steps: S4.

1. The laser ranging unit records the detected interference fringe change signal and converts the interference fringe change signal into a corresponding displacement signal; S4.

2. The computer control module receives the displacement signal and obtains the actual distance between the measuring surfaces of the micrometer corresponding to the preset scale; S4.

3. The computer control module calculates the difference between the preset scale and the measured distance.

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