A galvanometer performance testing system and method

Abstract

The present disclosure provides a galvanometer performance test system and method, which comprises a galvanometer driving module, a laser, a position detection module and a performance test module, the galvanometer driving module is configured to generate a target driving signal and drive a to-be-tested galvanometer to swing in a target direction according to the target driving signal; the laser is configured to emit a laser signal to the to-be-tested galvanometer, so that the to-be-tested galvanometer reflects the laser signal during the swinging process; the position detection module is configured to obtain a target position signal representing the swinging position of the to-be-tested galvanometer in the target direction according to the reflected laser signal; and the performance test module is configured to determine the delay time of the target position signal relative to the target driving signal, and test the performance of the to-be-tested galvanometer according to the delay time.

Description

TECHNICAL FIELD

[0001] The present disclosure relates to the field of projection technology, and more particularly, to a galvanometer performance testing system and a galvanometer performance testing method. BACKGROUND

[0002] DLP (Digital Light Process) is a technology that projects light after digital processing of image signals.

[0003] Some DLP projection devices are equipped with galvanometers, which can improve the resolution of projected images. The performance of the galvanometer determines the resolution, trailing, and other performance of the projected image. Specifically, the swing position of the galvanometer needs to be synchronized with the projected frame image to avoid errors in the projected image, affect the resolution, trailing, and color distortion of the pixels.

[0004] The swing position of the galvanometer is not synchronized with the driving signal, and there is a delay between the two, which is determined by the performance parameters of the galvanometer itself. To ensure the consistency of the performance of the galvanometer, the delay between the swing position of the galvanometer and the driving signal needs to be consistent.

[0005] Therefore, it is valuable to propose a scheme that can detect whether the delay between the swing position of the galvanometer and the driving signal is consistent. SUMMARY

[0006] An object of the present disclosure is to provide a new technical solution for testing the performance of a galvanometer.

[0007] According to a first aspect of the present disclosure, a galvanometer performance testing system is provided, comprising a galvanometer driving module, a laser, a position detection module, and a performance testing module. The galvanometer driving module is configured to generate a target driving signal and drive a to-be-tested galvanometer to swing in a target direction according to the target driving signal. The laser is configured to emit a laser signal to the to-be-tested galvanometer, so that the to-be-tested galvanometer reflects the laser signal during the swing. The position detection module is configured to obtain a target position signal representing the swing position of the to-be-tested galvanometer in the target direction according to the reflected laser signal. The performance testing module is configured to determine the delay time of the target position signal relative to the target driving signal, and test the performance of the to-be-tested galvanometer according to the delay time.

[0008] Optionally, the galvanometer driving module includes a signal generation unit, a digital-to-analog conversion unit, and a first power amplification unit. The signal generation unit is configured to generate the target driving signal; the analog-to-digital conversion unit is configured to perform digital-to-analog conversion processing on the target driving signal to obtain an analog driving signal; the power amplification unit is configured to amplify the analog driving signal to obtain an amplified driving signal, and output the amplified driving signal to the galvanometer under test to drive the galvanometer under test to swing in the target direction.

[0009] Optionally, the position detection module includes a position detection unit, a second power amplification unit, and an analog-to-digital conversion unit. The position detection unit is configured to output an analog position signal representing the swing position of the mirror under test based on the reflected laser signal. The second power amplification unit is configured to amplify the analog position signal to obtain an amplified position signal. The analog-to-digital conversion unit is configured to perform analog-to-digital conversion on the amplified position signal to obtain the target position signal.

[0010] Optionally, the system further includes a control module, a button module, and a switch circuit. The switch circuit is connected to the drive circuit of the mirror under test, and the control module is configured to control the switching state of the switch circuit according to the button signal input by the button module.

[0011] Optionally, the system further includes a display module configured to display the performance test results of the galvanometer under test.

[0012] Optionally, the performance testing module is further configured as follows:

[0013] A first time point is determined for at least one rising edge of the target driving signal; the time point for the first rising edge of the target position signal after the first time point is determined as the corresponding second time point; the time difference between the second time point and the corresponding first time point is determined as the delay time; and the performance of the galvanometer under test is tested based on the delay time.

[0014] Optionally, the performance testing module is further configured as follows:

[0015] After a set number of rising edges appear in the target position signal, the first time point and the second time point are determined.

[0016] Optionally, the performance testing module is further configured as follows:

[0017] Calculate the average value of the delay time;

[0018] Determine whether the average value is within the set range;

[0019] If the average value is not within the set range, the performance test result of the galvanometer under test is determined to be unqualified; if the average value is within the set range, the performance test result of the galvanometer under test is determined to be qualified.

[0020] Optionally, the performance testing module is further configured as follows:

[0021] Calculate the minimum and maximum values ​​of the delay time;

[0022] The fluctuation range of the delay time is determined based on the maximum value and the minimum value;

[0023] If the average value is not within the set range, compare the fluctuation range with the set value;

[0024] If the fluctuation amplitude is greater than the set value, the performance test result of the galvanometer under test is determined to be unqualified; if the fluctuation amplitude is less than or equal to the set value, the performance test result of the galvanometer under test is determined to be qualified.

[0025] According to a second aspect of this disclosure, a method for testing the performance of a galvanometer is provided, comprising:

[0026] Generate a target driving signal, and drive the galvanometer under test to swing in the target direction according to the target driving signal;

[0027] A laser signal is emitted to the galvanometer under test so that the galvanometer under test reflects the laser signal during its oscillation.

[0028] Based on the reflected laser signal, a target position signal representing the swing position of the galvanometer under test in the target direction is obtained;

[0029] The delay time of the target position signal relative to the target drive signal is determined, and the performance of the galvanometer under test is tested based on the delay time.

[0030] The embodiments of this disclosure can simulate the usage environment of the galvanometer under test in a projection device, accurately test the delay performance of the galvanometer under test, and achieve high testing efficiency, ensuring the consistency of the delay performance of the galvanometer under test. Thus, when the galvanometer under test is applied to a projection device, it can be ensured that the oscillation of the galvanometer under test is synchronized with the projection frame signal.

[0031] Other features and advantages of this disclosure will become clear from the following detailed description of exemplary embodiments with reference to the accompanying drawings. Attached Figure Description

[0032] The accompanying drawings, which are incorporated in and form a part of this specification, illustrate embodiments of the present disclosure and, together with their description, serve to explain the principles of the present disclosure.

[0033] Figure 1 This is a block diagram of a galvanometer performance testing system according to an embodiment of the present disclosure.

[0034] Figure 2 This is a schematic diagram of the galvanometer's swing position.

[0035] Figure 3 This is a block diagram of a galvanometer performance testing system according to another embodiment of the present disclosure.

[0036] Figure 4 This is a signal timing diagram of one embodiment of the present disclosure.

[0037] Figure 5 This is a schematic flowchart of a galvanometer performance testing method according to an embodiment of the present disclosure. Detailed Implementation

[0038] Various exemplary embodiments of the present disclosure will now be described in detail with reference to the accompanying drawings. It should be noted that, unless otherwise specifically stated, the relative arrangement, numerical expressions, and values ​​of the components and steps set forth in these embodiments do not limit the scope of the present disclosure.

[0039] The following description of at least one exemplary embodiment is merely illustrative and is in no way intended to limit this disclosure or its application or use.

[0040] Techniques, methods, and equipment known to those skilled in the art may not be discussed in detail, but where appropriate, such techniques, methods, and equipment should be considered part of the specification.

[0041] In all the examples shown and discussed herein, any specific values ​​should be interpreted as merely exemplary and not as limitations. Therefore, other examples of exemplary embodiments may have different values.

[0042] It should be noted that similar labels and letters in the following figures indicate similar items; therefore, once an item is defined in one figure, it does not need to be discussed further in subsequent figures.

[0043] This disclosure provides a galvanometer performance testing system 1000, such as... Figure 1 As shown, it includes a galvanometer driving module 1100, a laser 1200, a position detection module 1300, and a performance testing module 1400.

[0044] The galvanometer drive module 1100 is configured to generate a target drive signal and drive the galvanometer under test 2000 to swing around the target direction according to the target drive signal.

[0045] In one embodiment of this disclosure, the galvanometer under test 2000 is a biaxial galvanometer that can oscillate in both a first direction and a second direction. The first and second directions may be perpendicular to each other. The galvanometer driving module 1100 may provide a first driving signal and a second driving signal, driving the galvanometer under test 2000 to oscillate in the first direction according to the first driving signal and driving it to oscillate in the second direction according to the second driving signal.

[0046] In this embodiment, the target direction can be either the first direction or the second direction, or it can include both the first direction and the second direction. Correspondingly, the target driving signal can be either the first driving signal or the second driving signal, or it can include both the first driving signal and the second driving signal.

[0047] Specifically, when the target direction is the first direction, the target driving signal is the first driving signal; when the target direction is the second direction, the target driving signal is the second driving signal; and when the target direction is both the first and second directions, the target driving signal is both the first driving signal and the second driving signal.

[0048] like Figure 2 As shown, the galvanometer 2000 under test swings in the first and second directions under the drive of the first and second driving signals, and projects the projection frame signal to the corresponding positions of the four positions a, b, c, and d during the swing.

[0049] In one embodiment of this disclosure, such as Figure 3 As shown, the galvanometer driving module 1100 may include a signal generation unit 1110, a digital-to-analog converter 1120, and a first power amplifier unit 1130. The signal generation unit 1110 is configured to generate a target driving signal. The digital-to-analog converter 1120 is configured to perform digital-to-analog conversion processing on the target driving signal to obtain an analog driving signal. The first power amplifier unit 1130 is configured to amplify the analog driving signal to obtain an amplified driving signal, and output the amplified driving signal to the galvanometer under test to drive the galvanometer under test to oscillate in the target direction.

[0050] For example, the signal generation unit 1110 may be provided by an FPGA (Field Programmable Gate Array).

[0051] The laser 1200 is configured to emit a laser signal to the galvanometer under test so that the galvanometer under test reflects the laser signal during its oscillation.

[0052] The position detection module 1300 is configured to detect the swing position of the galvanometer under test based on the reflected laser signal, and obtain a target position signal representing the swing position of the galvanometer under test in the target direction.

[0053] In one embodiment of this disclosure, such as Figure 3 As shown, the position detection module 1300 may include a position detection unit 1310, a second power amplifier unit 1320, and an analog-to-digital converter unit 1330. The position detection unit 1310 is configured to output an analog position signal representing the swing position of the galvanometer 2000 under test, based on the laser signal reflected by the galvanometer 2000. The second power amplifier unit 1320 is configured to amplify the analog position signal to obtain an amplified position signal. The analog-to-digital converter unit 1330 is configured to perform analog-to-digital conversion on the amplified position signal to obtain a target position signal.

[0054] In this embodiment, the position detection unit 1310 can be provided by a PSD (PositionSensitiveDevice). During the swinging process, the galvanometer under test 2000 can reflect a laser signal onto the position detection unit 1310. The position detection unit 1310 obtains a simulated position signal representing the swinging position of the galvanometer under test 2000 based on the position of the laser signal reflected onto the position detection unit 1310 by the galvanometer under test 2000.

[0055] When the galvanometer under test 2000 is a biaxial galvanometer, it can swing in either a first direction or a second direction. Therefore, by performing analog-to-digital conversion on the amplified position signal through the analog-to-digital conversion unit 1330, a first position signal representing the swing position of the galvanometer under test 2000 in the first direction and a second position signal representing the swing position of the galvanometer under test 2000 in the second direction can be obtained.

[0056] When the target direction is the first direction, the target position signal is the first position signal; when the target direction is the second direction, the target position signal is the second position signal; when the target direction includes both the first and second directions, the target position signal includes both the first and second position signals.

[0057] The performance test module 1400 is set to determine the delay time of the target position signal relative to the target drive signal, and test the performance of the galvanometer under test based on the delay time.

[0058] In one example, the performance test module 1400 could be provided by an FPGA.

[0059] In one embodiment, the timing diagram of the first drive signal, the second drive signal, the first position signal, and the second position signal can be as follows: Figure 4 As shown. When both the first and second drive signals are low, the galvanometer under test 2000 can be driven to swing to position d; when the first drive signal is low and the second drive signal is high, the galvanometer under test 2000 can be driven to swing to position a; when both the first and second drive signals are high, the galvanometer under test 2000 can be driven to swing to position b; when the first drive signal is high and the second drive signal is low, the galvanometer under test 2000 can be driven to swing to position c. Correspondingly, when both the first and second position signals are low, it indicates that the galvanometer under test is swinging at position d; when the first drive signal is low and the second drive signal is high, it indicates that the galvanometer under test is swinging at position a; when both the first and second drive signals are high, it indicates that the galvanometer under test is swinging at position b; when the first drive signal is high and the second drive signal is low, it indicates that the galvanometer under test is swinging at position c.

[0060] In this embodiment, since there is a delay between the swing position of the mirror under test and the driving signal, therefore, as Figure 4 As shown, the first position signal is delayed relative to the first drive signal, and the second position signal is delayed relative to the second drive signal.

[0061] Under normal circumstances, the signal periods of the first drive signal and the second drive signal are equal. Therefore, under normal circumstances, the delay time of the first position signal relative to the first drive signal is equal to the delay time of the second position signal relative to the second drive signal. Thus, the first drive signal can be used as the target drive signal, and the first position signal can be used as the target position signal; or, the second drive signal can be used as the target drive signal, and the second position signal can be used as the target position signal.

[0062] In such Figure 4 In the example shown, t1 is the starting time when the galvanometer under test 2000 swings to position d, t2 is the starting time when the driving signal changes to drive the galvanometer under test 2000 to position a, and t3 is the starting time when the galvanometer under test 2000 swings to position a. Furthermore, t1, t2, and t3 satisfy the following formula:

[0063] Δt1=t2-t1 (Formula 1)

[0064] Δt2=t3-t2 (Formula 2)

[0065] T=Δt1+Δt2 (Formula 3)

[0066] Where T is the signal period of the target driving signal, which is a constant; Δt2 is the delay time.

[0067] To achieve synchronization between the image frame signal and the oscillation position of the galvanometer in the projection device, it is necessary to ensure that Δt1 is a constant value.

[0068] When both the galvanometer drive module 1100 and the performance testing module 1400 are provided by an FPGA, the FPGA can obtain the t2 time point more accurately. If the t1 time point is selected as the starting point and Δt1 is calculated using Formula 1 above to test the performance of the galvanometer under test, the test results may not be accurate enough. Therefore, the t2 time point can be selected as the starting point, and the delay time Δt2 can be calculated according to Formula 2. Δt2 can then be used to indirectly determine whether Δt1 is constant.

[0069] In one embodiment of this disclosure, the performance testing module 1400 may be configured to: determine a first time point of at least one rising edge of the target driving signal; and determine the time point of the first rising edge of the target position signal after each first time point as a corresponding second time point; determine the time difference between the corresponding second time point and the first time point as a delay time; and test the performance of the galvanometer 2000 under test according to the delay time.

[0070] In one example, the oscillation of the galvanometer under test 2000 may be unstable at the beginning of the test. Therefore, to ensure the accuracy of the test results, the performance test module 1400 may determine the first time point and the second time point after a set number of rising edges appear in the target position signal. That is, the performance test module 1400 may determine the delay time after a set number of rising edges appear in the target position signal and test the performance of the galvanometer under test according to the delay time.

[0071] The quantity can be set in advance based on the application scenario or specific needs. For example, the quantity can be 10.

[0072] In the first embodiment of this disclosure, the performance testing module 1400 may be: determining at least one delay time of the target position signal relative to the target drive signal, and determining whether each delay time is within a set range; if each delay time is within the set range, determining that the performance test result of the galvanometer under test 2000 is qualified; if any delay time is not within the set range, determining that the performance test result of the galvanometer under test 2000 is unqualified.

[0073] In the second embodiment of this disclosure, the performance testing module 1400 may determine at least one delay time based on the target position signal and the target drive signal, and calculate the average value of at least one delay time; determine whether the average value is within a set range; if the average value is within the set range, determine that the performance test result of the galvanometer 2000 under test is qualified; if the average value is not within the set range, determine that the performance test result of the galvanometer 2000 under test is unqualified.

[0074] Furthermore, the performance test module 1400 can also be configured to: calculate the maximum and minimum values ​​of the delay time, and determine the fluctuation range of the delay time based on the maximum and minimum values; compare the fluctuation range with the set value if the average value is within a set range; determine that the performance test result of the galvanometer under test is unqualified if the fluctuation range is greater than the set value; and determine that the performance test result of the galvanometer under test is qualified if the fluctuation range is less than or equal to the set value.

[0075] In the first and second embodiments described above, the set range can be determined based on Formula 3, the constant value of Δt1, the constant value of T, and the preset tolerance ±Δd. Specifically, the set range can be expressed as [(T-Δt1-Δd), (T-Δt1+Δd)]. The tolerance can be preset according to the application scenario or specific requirements.

[0076] In one embodiment of this disclosure, such as Figure 3 As shown, the system 1000 may also include a control module 1500, a button module 1600, and a switch circuit 1700. The switch circuit 1700 is connected to the drive circuit of the galvanometer under test 2000. The control module 1500 is configured to control the switching state of the switch circuit 1700 according to the button signal input by the button module 1600.

[0077] When the switching circuit 1700 is on, the galvanometer drive module 1100 can drive the galvanometer under test 2000 to swing in the target direction according to the target drive signal. When the switching circuit 1700 is off, the amplified drive signal cannot be output to the galvanometer under test 2000, and the galvanometer under test 2000 will stop swinging. In this embodiment, the test of the galvanometer under test 2000 can be started or stopped by controlling the switching state of the switching circuit 1700.

[0078] In one example, the button module 1600 may have a first button and a second button. The control module 1500 may turn on the switch circuit 1700 when the first button is detected to be pressed. The control module 1500 may also turn off the switch circuit 1700 when the second button is detected to be pressed.

[0079] In another example, the button module 1700 may have a third button. The control module 1500 may change the switching state of the switch circuit 1700 upon detecting that the third button has been pressed. Specifically, the control module 1500 may, if it detects that the third button has been pressed while the switch circuit 1700 is on, then control the switch circuit 1700 to turn off; or, if it detects that the third button has been pressed while the switch circuit 1700 is off, then control the switch circuit 1700 to turn on.

[0080] Furthermore, the button module 1700 in this embodiment can be provided by mechanical buttons or by virtual buttons in the host computer.

[0081] In one embodiment of this disclosure, such as Figure 3 As shown, the system 1000 may also include a display module 1800, which is configured to display the performance test results of the galvanometer 2000 under test.

[0082] Furthermore, the display module 1800 can be provided by a host computer.

[0083] The embodiments of this disclosure can simulate the usage environment of the galvanometer under test in a projection device, accurately test the delay performance of the galvanometer under test, and achieve high testing efficiency, ensuring the consistency of the delay performance of the galvanometer under test. Thus, when the galvanometer under test is applied to a projection device, it can be ensured that the oscillation of the galvanometer under test is synchronized with the projection frame signal.

[0084] This disclosure also provides a method for testing the performance of a galvanometer. This method can be implemented using the aforementioned galvanometer performance testing system.

[0085] Figure 5 This is a flowchart illustrating a galvanometer performance testing method according to an embodiment of this disclosure.

[0086] according to Figure 5 As shown, the method may include steps S5100 to S5400 as follows:

[0087] Step S5100: Generate a target driving signal and drive the galvanometer under test to swing in the target direction according to the target driving signal.

[0088] Step S5200: A laser signal is emitted to the galvanometer under test so that the galvanometer under test reflects the laser signal during the oscillation process.

[0089] Step S5300: Based on the reflected laser signal, obtain the target position signal representing the swing position of the galvanometer under test in the target direction.

[0090] Step S5400: Determine the delay time of the target position signal relative to the target drive signal, and test the performance of the galvanometer under test based on the delay time.

[0091] In one embodiment of this disclosure, determining the delay time of the target position signal relative to the target drive signal, and testing the performance of the galvanometer under test based on this delay time, may include:

[0092] Determine the first time point of at least one rising edge of the target drive signal; determine the time point of the first rising edge of the target position signal after the first time point as the second time point; determine the time difference between the second time point and the corresponding first time point as the delay time; and test the performance of the galvanometer under test based on the delay time.

[0093] In one embodiment of this disclosure, the method may further include: after a set number of rising edges appear in the target position signal, performing the step of determining a first time point and a second time point.

[0094] In one embodiment of this disclosure, testing the performance of the galvanometer under test based on the delay time may include: calculating the average value of the delay time; determining whether the average value is within a set range; if the average value is not within the set range, determining that the performance test result of the galvanometer under test is unqualified; if the average value is within the set range, determining that the performance test result of the galvanometer under test is qualified.

[0095] In one embodiment of this disclosure, the method may further include:

[0096] Calculate the maximum and minimum values ​​of the delay time; determine the fluctuation range of the delay time based on the maximum and minimum values; if the average value is within the set range, compare the fluctuation range with the set value; if the fluctuation range is greater than the set value, determine that the performance test result of the galvanometer under test is unqualified; if the fluctuation range is less than or equal to the set value, determine that the performance test result of the galvanometer under test is qualified.

[0097] The embodiments of this disclosure can simulate the usage environment of the galvanometer under test in a projection device, accurately test the delay performance of the galvanometer under test, and achieve high testing efficiency, ensuring the consistency of the delay performance of the galvanometer under test. Thus, when the galvanometer under test is applied to a projection device, it can be ensured that the oscillation of the galvanometer under test is synchronized with the projection frame signal.

[0098] This disclosure may also include a computer program product. A computer program product may include a computer-readable storage medium having computer-readable program instructions, i.e., executable instructions, on which a processor is loaded to implement various aspects of this disclosure.

[0099] Computer-readable storage media can be tangible devices capable of holding and storing instructions for use by an instruction execution device. Computer-readable storage media can be, for example, but not limited to, electrical storage devices, magnetic storage devices, optical storage devices, electromagnetic storage devices, semiconductor storage devices, or any suitable combination thereof. More specific examples (a non-exhaustive list) of computer-readable storage media include: portable computer disks, hard disks, random access memory (RAM), read-only memory (ROM), erasable programmable read-only memory (EPROM or flash memory), static random access memory (SRAM), portable compact disc read-only memory (CD-ROM), digital multifunction disc (DVD), memory sticks, floppy disks, mechanical encoding devices, such as punch cards or recessed protrusions storing instructions thereon, and any suitable combination thereof. The computer-readable storage media used herein are not to be construed as transient signals themselves, such as radio waves or other freely propagating electromagnetic waves, electromagnetic waves propagating through waveguides or other transmission media (e.g., light pulses through fiber optic cables), or electrical signals transmitted through wires.

[0100] The computer-readable program instructions described herein can be downloaded from computer-readable storage media to various computing / processing devices, or downloaded via a network, such as the Internet, local area network, wide area network, and / or wireless network, to an external computer or external storage device. The network may include copper transmission cables, fiber optic transmission, wireless transmission, routers, firewalls, switches, gateway computers, and / or edge servers. A network adapter card or network interface in each computing / processing device receives the computer-readable program instructions from the network and forwards them to the computer-readable storage media in the respective computing / processing device.

[0101] Computer program instructions used to perform the operations of this disclosure may be assembly instructions, instruction set architecture (ISA) instructions, machine instructions, machine-dependent instructions, microcode, firmware instructions, status setting data, or source code or object code written in any combination of one or more programming languages, including object-oriented programming languages ​​such as Smalltalk, C++, etc., and conventional procedural programming languages ​​such as the "C" language or similar programming languages. The computer-readable program instructions may execute entirely on the user's computer, partially on the user's computer, as a standalone software package, partially on the user's computer and partially on a remote computer, or entirely on a remote computer or server. In cases involving a remote computer, the remote computer may be connected to the user's computer via any type of network—including a local area network (LAN) or a wide area network (WAN)—or may be connected to an external computer (e.g., via the Internet using an Internet service provider). In some embodiments, electronic circuitry, such as programmable logic circuitry, field-programmable gate arrays (FPGAs), or programmable logic arrays (PLAs), is personalized by utilizing the status information of the computer-readable program instructions to implement various aspects of this disclosure.

[0102] Various aspects of this disclosure are described herein with reference to flowchart illustrations and / or block diagrams of methods, computing devices, and computer program products according to embodiments of this disclosure. It should be understood that each block of the flowchart illustrations and / or block diagrams, and combinations of blocks in the flowchart illustrations and / or block diagrams, can be implemented by computer-readable program instructions.

[0103] These computer-readable program instructions can be provided to a processor of a general-purpose computer, a special-purpose computer, or other programmable data processing apparatus to produce a machine such that, when executed by the processor of the computer or other programmable data processing apparatus, they create means for implementing the functions / actions specified in one or more blocks of the flowchart and / or block diagram. These computer-readable program instructions can also be stored in a computer-readable storage medium that causes a computer, programmable data processing apparatus, and / or other device to operate in a particular manner; thus, the computer-readable medium storing the instructions comprises an article of manufacture that includes instructions for implementing aspects of the functions / actions specified in one or more blocks of the flowchart and / or block diagram.

[0104] Computer-readable program instructions may also be loaded onto a computer, other programmable data processing apparatus, or other device to cause a series of operational steps to be performed on the computer, other programmable data processing apparatus, or other device to produce a computer-implemented process, thereby causing the instructions executed on the computer, other programmable data processing apparatus, or other device to perform the functions / actions specified in one or more boxes of a flowchart and / or block diagram.

[0105] The flowcharts and block diagrams in the accompanying drawings illustrate the architecture, functionality, and operation of possible implementations of computing devices, methods, and computer program products according to various embodiments of the present disclosure. In this regard, each block in a flowchart or block diagram may represent a module, segment, or portion of an instruction containing one or more executable instructions for implementing a specified logical function. In some alternative implementations, the functions marked in the blocks may occur in a different order than those marked in the drawings. For example, two consecutive blocks may actually be executed substantially in parallel, and they may sometimes be executed in reverse order, depending on the functions involved. It should also be noted that each block in the block diagrams and / or flowcharts, and combinations of blocks in the block diagrams and / or flowcharts, can be implemented using a dedicated hardware-based computing device that performs the specified function or action, or using a combination of dedicated hardware and computer instructions. It will be known to those skilled in the art that implementation in hardware, implementation in software, and implementation in a combination of software and hardware are equivalent.

[0106] The various embodiments of this disclosure have been described above. These descriptions are exemplary and not exhaustive, and are not limited to the disclosed embodiments. Many modifications and variations will be apparent to those skilled in the art without departing from the scope and spirit of the described embodiments. The terminology used herein is chosen to best explain the principles, practical applications, or technical improvements to the technology in the market, or to enable others skilled in the art to understand the embodiments disclosed herein.

Claims

1. A galvanometer performance testing system, characterized in that, The system includes a galvanometer driving module, a laser, a position detection module, and a performance testing module. The galvanometer driving module is configured to generate a target driving signal and drive the galvanometer under test to swing in a target direction according to the target driving signal. The laser is configured to emit a laser signal to the galvanometer under test so that the galvanometer under test reflects the laser signal during the swing. The position detection module is configured to obtain a target position signal representing the swing position of the galvanometer under test in the target direction based on the reflected laser signal. The performance testing module is configured to determine the delay time of the target position signal relative to the target drive signal, and test the performance of the galvanometer under test based on the delay time. The performance testing module is further configured to: determine a first time point of at least one rising edge of the target driving signal; determine the time point of the first rising edge of the target position signal after the first time point, as the corresponding second time point; and determine the time difference between the second time point and the corresponding first time point, as the delay time. Calculate the average value of the delay time; determine whether the average value is within a set range; if the average value is within the set range, determine that the performance test result of the galvanometer under test is qualified; if the average value is not within the set range, calculate the minimum and maximum values ​​of the delay time, determine the fluctuation amplitude of the delay time based on the maximum and minimum values, and compare the fluctuation amplitude with a set value; if the fluctuation amplitude is greater than the set value, determine that the performance test result of the galvanometer under test is unqualified; if the fluctuation amplitude is less than or equal to the set value, determine that the performance test result of the galvanometer under test is qualified. The delay performance of the galvanometer under test is tested by simulating its usage environment in a projection device.

2. The system according to claim 1, characterized in that, The galvanometer driving module includes a signal generation unit, a digital-to-analog conversion unit, and a first power amplification unit. The signal generation unit is configured to generate the target driving signal; the digital-to-analog conversion unit is configured to perform digital-to-analog conversion processing on the target driving signal to obtain an analog driving signal; the power amplification unit is configured to amplify the analog driving signal to obtain an amplified driving signal, and output the amplified driving signal to the galvanometer under test to drive the galvanometer under test to swing in the target direction.

3. The system according to claim 1, characterized in that, The position detection module includes a position detection unit, a second power amplification unit, and an analog-to-digital conversion unit. The position detection unit is configured to output an analog position signal representing the swing position of the mirror under test based on the reflected laser signal. The second power amplification unit is configured to amplify the analog position signal to obtain an amplified position signal. The analog-to-digital conversion unit is configured to perform analog-to-digital conversion on the amplified position signal to obtain the target position signal.

4. The system according to claim 1, characterized in that, The system also includes a control module, a button module, and a switch circuit. The switch circuit is connected to the drive circuit of the mirror under test. The control module is configured to control the switching state of the switch circuit according to the button signal input by the button module.

5. The system according to claim 1, characterized in that, The system also includes a display module, which is configured to display the performance test results of the galvanometer under test.

6. The system according to claim 1, characterized in that, The performance testing module is also configured to: After a set number of rising edges appear in the target position signal, the first time point and the second time point are determined.

7. A method for testing the performance of a galvanometer, characterized in that, include: Generate a target driving signal, and drive the galvanometer under test to swing in the target direction according to the target driving signal; A laser signal is emitted to the galvanometer under test so that the galvanometer under test reflects the laser signal during its oscillation. Based on the reflected laser signal, a target position signal representing the swing position of the galvanometer under test in the target direction is obtained; Determine the delay time of the target position signal relative to the target drive signal, and test the performance of the galvanometer under test based on the delay time; The process of testing the performance of the galvanometer under test based on the delay time includes: A first time point is determined for at least one rising edge of the target driving signal; a second time point is determined for the first rising edge of the target position signal after the first time point; the time difference between the second time point and the corresponding first time point is determined as the delay time; the average value of the delay time is calculated; it is determined whether the average value is within a set range; if the average value is within the set range, the performance test result of the galvanometer under test is determined to be qualified; if the average value is not within the set range, the minimum and maximum values ​​of the delay time are calculated, and the fluctuation amplitude of the delay time is determined based on the maximum and minimum values, and the fluctuation amplitude is compared with a set value; if the fluctuation amplitude is greater than the set value, the performance test result of the galvanometer under test is determined to be unqualified; if the fluctuation amplitude is less than or equal to the set value, the performance test result of the galvanometer under test is determined to be qualified; the delay performance of the galvanometer under test is tested by simulating the usage environment of the galvanometer under test in a projection device.

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