Electronic equipment and its testing methods and devices

Abstract

This disclosure relates to the field of electronic equipment technology, specifically to an electronic device and its detection method and apparatus. A detection method, applied to an electronic device, includes: acquiring the temperature of a target antenna of the electronic device; detecting the electromagnetic power of the target antenna in a target frequency band in response to the temperature meeting a preset condition; and generating and saving abnormal data in response to the electromagnetic power not being less than a preset power threshold. The detection method of this disclosure, when the temperature of the electronic device is abnormal, detects whether the electromagnetic power in the target frequency band exceeds the standard. Therefore, for damage to electronic devices caused by high-power electromagnetic devices, abnormal detection and abnormal data can be saved. In subsequent after-sales testing, the saved abnormal data can accurately determine the cause of the damage, improving after-sales efficiency.

Description

Technical Field

[0001] This disclosure relates to the field of electronic equipment technology, specifically to an electronic device and its testing method and apparatus. Background Technology

[0002] After-sales testing of electronic devices often requires determining the cause of damage to confirm whether the device is covered under warranty. In some technical scenarios, staff can only rely on experience to determine the cause of damage based on the characteristics of the damage, which requires a high level of skill and subjective judgment is difficult to prove, easily leading to consumer disputes. Summary of the Invention

[0003] To address the technical problem of inaccurately determining the cause of damage to electronic devices, this disclosure provides a detection method, apparatus, electronic device, and storage medium.

[0004] In a first aspect, embodiments of this disclosure provide a detection method applied to an electronic device, the detection method comprising:

[0005] Obtain the temperature of the target antenna of the electronic device;

[0006] In response to the temperature meeting a preset condition, the electromagnetic power of the target antenna in the target frequency band is detected;

[0007] In response to the electromagnetic power being not less than a preset power threshold, abnormal data is generated and saved.

[0008] In some embodiments, obtaining the temperature of the target antenna of the electronic device includes:

[0009] The temperature is obtained by a temperature detection circuit located near the target antenna.

[0010] In some implementations, the process of determining that the temperature meets preset conditions includes:

[0011] In response to the temperature being not less than a preset temperature threshold, it is determined that the temperature meets a preset condition;

[0012] And / or,

[0013] In response to the temperature change rate being not less than a preset rate threshold, it is determined that the temperature meets a preset condition.

[0014] In some embodiments, detecting the electromagnetic power of the target antenna in the target frequency band includes:

[0015] In response to the temperature meeting a preset condition, the receiving frequency band of the radio frequency circuit of the target antenna is controlled to be the target frequency band;

[0016] The electromagnetic power is detected by the radio frequency circuit.

[0017] In some implementations, generating and saving the abnormal data includes:

[0018] The abnormal data is generated in response to the electromagnetic power being not less than a preset power threshold;

[0019] The abnormal data is stored in the storage unit of the electronic device.

[0020] In some implementations, the target frequency band includes 2400MHz to 2500MHz.

[0021] Secondly, this disclosure provides a detection method, including:

[0022] Obtain abnormal data stored in an electronic device; the abnormal data is obtained according to the detection method described in any embodiment of the first aspect;

[0023] Based on the abnormal data, the cause of damage to the electronic device is determined.

[0024] Thirdly, this disclosure provides a detection device applied to an electronic device, the detection device comprising:

[0025] The first acquisition module is configured to acquire the temperature of the target antenna of the electronic device;

[0026] The detection module is configured to detect the electromagnetic power of the target antenna in the target frequency band in response to the temperature meeting a preset condition;

[0027] The storage module is configured to generate and save abnormal data in response to the electromagnetic power being not less than a preset power threshold.

[0028] In some implementations, the process of determining that the temperature meets preset conditions includes:

[0029] In response to the temperature being not less than a preset temperature threshold, it is determined that the temperature meets a preset condition;

[0030] And / or,

[0031] In response to the temperature change rate being not less than a preset rate threshold, it is determined that the temperature meets a preset condition.

[0032] In some implementations, the detection module is specifically configured as follows:

[0033] In response to the temperature meeting a preset condition, the receiving frequency band of the radio frequency circuit of the target antenna is controlled to be the target frequency band;

[0034] The electromagnetic power is detected by the radio frequency circuit.

[0035] In some implementations, the storage module is specifically configured as follows:

[0036] The abnormal data is generated in response to the electromagnetic power being not less than a preset power threshold;

[0037] The abnormal data is stored in the storage unit of the electronic device.

[0038] In some implementations, the target frequency band includes 2400MHz to 2500MHz.

[0039] Fourthly, embodiments of this disclosure provide a detection device, including:

[0040] The second acquisition module is configured to acquire abnormal data stored in the electronic device; the abnormal data is obtained according to the detection method described in any embodiment of the first aspect;

[0041] The determination module is configured to determine the cause of damage to the electronic device based on the abnormal data.

[0042] Fifthly, embodiments of this disclosure provide an electronic device, including:

[0043] Target antenna;

[0044] The temperature detection circuit is located near the target antenna.

[0045] Processor; and

[0046] A memory storing computer-readable instructions for causing a processor to perform the method according to any embodiment of the first aspect.

[0047] In a sixth aspect, embodiments of this disclosure provide a storage medium storing computer-readable instructions for causing a computer to perform the method described according to any one of the first or second aspects.

[0048] The detection method of this disclosure, applied to electronic devices, includes acquiring the temperature of a target antenna of the electronic device; detecting the electromagnetic power of the target antenna in a target frequency band in response to the temperature meeting a preset condition; and generating and saving abnormal data in response to the electromagnetic power not being less than a preset power threshold. This detection method, when the temperature of the electronic device is abnormal, detects whether the electromagnetic power in the target frequency band exceeds the standard. Therefore, for damage to electronic devices caused by high-power electromagnetic devices, abnormal data can be detected and saved. In subsequent after-sales testing, the saved abnormal data can accurately determine the cause of the damage, improving after-sales efficiency. Attached Figure Description

[0049] To more clearly illustrate the technical solutions in the specific embodiments of this disclosure or the prior art, the drawings used in the description of the specific embodiments or the prior art will be briefly introduced below. Obviously, the drawings described below are some embodiments of this disclosure. For those skilled in the art, other drawings can be obtained from these drawings without creative effort.

[0050] Figure 1 This is a structural block diagram of an electronic device according to some embodiments of the present disclosure.

[0051] Figure 2 This is a schematic diagram of a temperature detection circuit of an electronic device according to some embodiments of the present disclosure.

[0052] Figure 3 This is a flowchart of a detection method according to some embodiments of this disclosure.

[0053] Figure 4 This is a flowchart of a detection method according to some embodiments of this disclosure.

[0054] Figure 5 This is a flowchart of a detection method according to some embodiments of this disclosure.

[0055] Figure 6 This is a flowchart of a detection method according to some embodiments of this disclosure.

[0056] Figure 7 This is a structural block diagram of the detection device according to some embodiments of the present disclosure.

[0057] Figure 8 This is a structural block diagram of the detection device according to some embodiments of the present disclosure. Detailed Implementation

[0058] The technical solutions of this disclosure will now be clearly and completely described with reference to the accompanying drawings. Obviously, the described embodiments are only a part of the embodiments of this disclosure, not all of them. All other embodiments obtained by those skilled in the art based on the embodiments of this disclosure without inventive effort are within the scope of protection of this disclosure. Furthermore, the technical features involved in the different embodiments of this disclosure described below can be combined with each other as long as they do not conflict with each other.

[0059] For electronic devices such as mobile phones, computers, and wearable devices, after-sales testing often requires determining the cause of the damage in order to identify the responsible party and whether it falls under warranty. In actual after-sales scenarios, it is common to encounter situations where devices are burned out due to strong external electromagnetic energy, such as a mobile phone being burned out when it is near an induction cooker or microwave oven.

[0060] For after-sales service, staff can only determine whether the damage was caused by high-power electromagnetic devices based on the characteristics of the burnt-out equipment. For example, the burnt-out might start at the antenna and be most severe, or the internal circuitry might have been damaged by overcurrent. This requires a high level of expertise from the staff. Furthermore, due to the lack of accurate evidence of the cause, consumers often refuse to acknowledge that their improper operation caused the burnt-out, demanding unreasonable after-sales service from the manufacturer. Some even deliberately place the device in a microwave oven, demanding compensation for the damaged equipment, leading to after-sales disputes.

[0061] This shows that in the after-sales scenarios of related technologies, the efficiency of cause detection is low, and the accuracy of cause judgment is also low, which can easily lead to after-sales disputes and affect the brand image.

[0062] Based on the deficiencies in the aforementioned related technologies, this disclosure provides a detection method, apparatus, electronic device, and storage medium, which aim to accurately detect and save abnormal data in the front-end usage scenarios of electronic devices, thereby facilitating the back-end to quickly and accurately identify the cause of equipment damage and avoid losses and disputes.

[0063] Firstly, this disclosure provides a detection method applicable to electronic devices. The electronic device in this disclosure can be any suitable type of electronic device, such as a smartphone, tablet computer, laptop computer, wearable device, etc., and this disclosure does not limit this.

[0064] It's understandable that electronic devices, in order to communicate with other terminals or servers, often have at least one communication antenna, and each antenna operates at a different frequency band. Taking smartphones as an example, a phone typically includes a WiFi antenna, a GPS antenna, an LTE antenna, and a 5G antenna. For example, a WiFi antenna operates in the 2.4GHz to 2.48GHz frequency band. The radio frequency module of a WiFi antenna (such as a WiFi chip) can receive electromagnetic field power within this range. The power range of a WiFi signal normally used for communication is -30dB to -70dB.

[0065] Internationally, the microwave wavelength for household microwave ovens is 122 nm, corresponding to a frequency of 2450 MHz. Since the microwave oven's operating frequency falls within the receiving band of a WiFi chip, and its power can reach hundreds to thousands of watts, the close-range radiation from the microwave oven can cause a mobile phone's WiFi antenna to receive a huge amount of electromagnetic power in a short period, generating a large current that causes the WiFi antenna to overheat and burn out.

[0066] Through extensive after-sales research, the inventors of this case discovered that mobile phones exhibit the following characteristics when subjected to strong external electromagnetic energy: 1) The burning phenomenon begins with the phone's antenna, with the antenna area experiencing the most severe burning; 2) Overcurrent causes burnouts in the phone's internal circuitry, resulting in moderate burning.

[0067] 3) The processing and storage chips on the motherboard are intact and can be used normally in other working environments.

[0068] Based on the above findings, the detection method of this disclosure, in the front-end usage scenario of electronic devices, can detect, for example, the temperature of a WiFi antenna. When it is determined that the device is in an abnormal environment with high electromagnetic energy, abnormal data is recorded and stored in the memory chip of the electronic device. Therefore, in the after-sales service, even if the electronic device is burned out and cannot be turned on, staff can read the memory chip of the electronic device to obtain the abnormal data stored in the memory chip, thereby accurately determining the cause of the damage to the electronic device.

[0069] Figure 1 Some embodiments of the electronic device disclosed herein are shown in the figure, such as Figure 1 As shown, the electronic device disclosed herein includes a processor 110, a memory 120, an antenna unit 140, and a temperature detection circuit 150.

[0070] The processor 110, memory 120, antenna unit 140 and temperature detection circuit 150 can establish a communicable connection between any two of them via bus 130.

[0071] The processor 110 can be any type of processor with one or more processing cores. It can perform single-threaded or multi-threaded operations, used to parse instructions to perform operations such as data acquisition, logical operations, and outputting processing results.

[0072] In some implementations, the processor 110 can be implemented as a CPU (central processing unit) chip, an MCU (microcontroller unit) chip, a SoC (system on chip) chip, etc. Those skilled in the art can make specific settings according to different types of electronic devices, and this disclosure does not limit this.

[0073] The memory 120 may include a non-volatile computer-readable storage medium, such as at least one disk storage device, flash memory device, or other non-volatile solid-state storage device. The memory 120 may have a program storage area for storing non-volatile software programs, non-volatile computer-executable programs, and modules, which can be invoked by the processor 110 to cause the processor 110 to execute one or more method steps. The memory 120 may also include a storage portion such as a volatile random access storage medium or a hard disk as a data storage area for storing the processing results and data output by the processor 110.

[0074] In this embodiment, the memory 120 stores computer-readable instructions executable by the processor 110. When the computer-readable instructions are executed, the processor 110 can perform the detection method in any of the following embodiments. Furthermore, the memory 120 can also serve as a storage unit for an electronic device, permanently storing abnormal data from any of the following embodiments for subsequent after-sales retrieval.

[0075] Antenna unit 140 is a wireless communication module for electronic devices. Taking smartphones as an example, it can often include multiple antenna units 140, such as GPS antennas, WiFi antennas, data network antennas, etc.

[0076] Antenna element 140 includes an antenna for transmitting and receiving electromagnetic signals and radio frequency circuitry. The antenna can often be housed inside the casing of the electronic device. This disclosure does not limit the structure and type of the antenna; it can be any suitable antenna type, such as an FPC (Flexible Printed Circuit) antenna, an LDS (Laser Direct Structuring) antenna, a slot antenna, an inverted F antenna, etc. This disclosure does not impose any limitations.

[0077] The temperature detection circuit 150 is located near the antenna element 140, so that the temperature change of the antenna element 140 can be detected.

[0078] In some implementations, the temperature detection circuit 150 is implemented as follows: Figure 2As shown, it includes a temperature-sensing resistor. The first terminal 1 of the temperature-sensing resistor can be connected to the processor 110, and the second terminal 2 is grounded. The working principle of the temperature detection circuit 150 is as follows: when the temperature-sensing resistor detects a temperature change, its resistance changes, and the processor 110 can determine the temperature based on the change in resistance. Therefore, the temperature-sensing resistor can be positioned close to the antenna unit 140, so that temperature changes in the antenna unit 140 can be detected promptly and accurately.

[0079] In one example, the temperature sensing resistor is selected from hardware models that respond quickly to changes in ambient temperature, such as the RT0601, which has a sensing accuracy of 0.1℃.

[0080] Based on the structural framework of the aforementioned electronic device, the detection method of this embodiment can be applied to the aforementioned electronic device and executed by the processor 110 of the electronic device. The following describes the method in conjunction with... Figure 3 Please provide an explanation.

[0081] like Figure 3 As shown, in some embodiments, the detection method of this disclosure includes:

[0082] S310: Obtain the temperature of the target antenna of the electronic device.

[0083] Specifically, the target antenna is the antenna element selected based on the needs of the detection scenario. For example, in detecting a damaged microwave oven, considering that the microwave oven's operating frequency of 2450MHz falls within the operating frequency range of a WiFi antenna, the WiFi antenna will receive a large amount of electromagnetic energy for a short period when the electronic device is in close proximity to or placed inside the microwave oven. Therefore, for a damaged microwave oven scenario, the target antenna can be a WiFi antenna.

[0084] However, it is understood that the target antenna of this disclosure is not limited to WiFi antennas. Those skilled in the art can select the antenna in the electronic device that is closest to the frequency band of strong electromagnetic energy in the outside world as the target antenna according to the specific detection scenario. This disclosure will not elaborate on this further.

[0085] In some implementations, the temperature change of the target antenna can be detected by the aforementioned temperature detection circuit 150. Specifically, when the target antenna receives strong external electromagnetic energy, the temperature of the target antenna will rise rapidly, causing the resistance value of the temperature sensing resistor in the temperature detection circuit 150 to change rapidly. The processor can then obtain the temperature of the target antenna based on the change in resistance value.

[0086] S320: In response to the temperature meeting the preset conditions, detect the electromagnetic power of the target antenna in the target frequency band.

[0087] Specifically, after obtaining the temperature of the target antenna, it can be determined whether the preset conditions are met based on the obtained temperature.

[0088] In some implementations, the preset condition may be a pre-set preset temperature threshold, used to determine whether the temperature of the target antenna exceeds this threshold. The preset temperature threshold may be a threshold value indicating that the electromagnetic energy currently received by the target antenna is in an abnormal state. When the temperature of the target antenna is not lower than the preset temperature threshold, it indicates that the electromagnetic energy currently received by the target antenna is not electromagnetic waves for normal communication, but rather electromagnetic waves in an abnormal state, such as electromagnetic waves from a microwave oven. When the temperature of the target antenna is lower than the preset temperature threshold, it indicates that the electromagnetic energy currently received by the target antenna is electromagnetic waves for normal communication, and no further detection is required.

[0089] It is understood that the preset temperature threshold can be based on prior knowledge or obtained through a limited number of experiments, and those skilled in the art can set it according to the specific application scenario. This disclosure does not impose any restrictions on this.

[0090] In other embodiments, the preset condition may be a pre-set preset rate threshold, used to determine whether the temperature change rate of the target antenna exceeds this preset rate threshold. The preset rate threshold may be a threshold value indicating that the electromagnetic energy currently received by the target antenna is in an abnormal state. When the temperature rise rate of the target antenna is not less than the preset rate threshold, it indicates that the target antenna temperature is rising too rapidly, and the currently received electromagnetic energy is not normal communication electromagnetic waves, but rather electromagnetic waves in an abnormal state, such as electromagnetic waves from a microwave oven. When the temperature rise rate of the target antenna is less than the preset rate threshold, it indicates that the electromagnetic energy currently received by the target antenna is normal communication electromagnetic waves, and no further detection is required.

[0091] It is understood that the preset rate threshold can be based on prior knowledge or obtained through a limited number of experiments, and those skilled in the art can set it according to the specific application scenario. This disclosure does not impose any restrictions on this.

[0092] If the temperature is not less than a preset temperature threshold and / or the rate of temperature change is not less than a preset rate threshold, it can be determined that the electromagnetic energy currently received by the target antenna is an abnormal electromagnetic wave, thereby enabling the detection of the electromagnetic power of the target antenna in the target frequency band.

[0093] The target frequency band is a preset operating frequency band corresponding to external strong electromagnetic energy devices; that is, the target frequency band can be set according to the operating frequency bands of common electromagnetic devices. In some embodiments, the target frequency band includes 2400MHz to 2500MHz.

[0094] For example, if a microwave oven operates at 2450MHz, the target frequency band could be any band including 2450MHz. The purpose of detecting the electromagnetic power of the target antenna in the target frequency band is to limit the detection frequency band to the target frequency band, thereby confirming whether the strong electromagnetic energy received by the electronic device originates from the target device.

[0095] In one example, the target frequency band corresponding to the microwave oven can be preset to 2450MHz. If the temperature meets the preset conditions, it indicates that the electromagnetic signal currently received by the target antenna is an abnormal signal. To further confirm whether the electromagnetic signal comes from the microwave oven, the detection frequency can be limited to the target frequency band of 2450MHz to determine whether the electromagnetic power received by the target antenna in the target frequency band meets the requirements.

[0096] In this embodiment of the disclosure, as described above, the antenna element 140 includes a radio frequency circuit and an antenna. The antenna is a metallic radiator, and is fed by the radio frequency circuit, thereby enabling the antenna to transmit and receive electromagnetic signals in a preset frequency band. Figure 4 As shown, when detecting the electromagnetic power of a target antenna in the target frequency band, the detection method of this disclosure example may include:

[0097] S321. In response to the temperature meeting the preset conditions, the receiving frequency band of the radio frequency circuit of the target antenna is controlled to be the target frequency band.

[0098] S322, Electromagnetic power is detected through radio frequency circuit.

[0099] Specifically, if the temperature of the target antenna meets preset conditions, it indicates that the electromagnetic signal currently received by the target antenna is an abnormal electromagnetic signal. At this time, the receiving frequency band of the radio frequency circuit of the target antenna can be controlled to be the target frequency band.

[0100] In one example, the target antenna is a WiFi antenna, which includes a WiFi chip and a metal antenna radiator. The WiFi chip is a radio frequency circuit, and the receiving frequency band of the antenna can be controlled through the WiFi chip.

[0101] For example, by limiting the receiving frequency band of the WiFi chip to the target frequency band of 2450MHz, the WiFi chip can detect the electromagnetic power of the electromagnetic signal at a frequency of 2450MHz, which means the electromagnetic power of the current radiation signal from the microwave oven.

[0102] S330: In response to electromagnetic power not being less than a preset power threshold, generate and save abnormal data.

[0103] Specifically, the preset power threshold can be a threshold value indicating whether the current electromagnetic signal originates from a device corresponding to the target frequency band. When the electromagnetic power is not less than the preset power threshold, it means that the electromagnetic signal currently received by the target antenna originates from a device corresponding to the target frequency band, such as a microwave oven. When the electromagnetic power is less than the preset power threshold, it means that the electromagnetic signal currently received by the target antenna is a normal communication signal.

[0104] It is understood that the preset power threshold can be based on prior knowledge or obtained through a limited number of experiments, and those skilled in the art can set it according to the specific application scenario. This disclosure does not impose any restrictions on this.

[0105] If it is confirmed that the electromagnetic power of the target antenna in the target frequency band is not less than the preset power threshold, it means that the electromagnetic signal currently received by the target antenna comes from the device corresponding to the target frequency band, and thus abnormal data can be generated.

[0106] In some implementations, the abnormal data may include one or more abnormal information such as time, temperature, heating rate, electromagnetic power, and judgment result.

[0107] After generating the abnormal data, it can be stored in the electronic device's storage unit. The storage unit can be, for example... Figure 1 The memory 120 shown is a non-volatile storage area.

[0108] As mentioned above, in scenarios where electronic devices are burned out due to high-power electromagnetic energy, the chips on the motherboard of the electronic device remain intact. As a result, the abnormal data in the memory can be saved before the electronic device is burned out. Therefore, during subsequent after-sales testing, it is only necessary to read the abnormal data in the memory to find out the cause of the damage to the electronic device, that is, to know whether the electronic device was burned out by high-power electromagnetic energy.

[0109] In some embodiments, an independent power supply can be provided for the temperature detection circuit described in this disclosure, so that the temperature of the target antenna can still be detected when the electronic device is powered off. That is, when the electronic device is powered off, the processor of the electronic device can still execute the above-described detection method. Those skilled in the art will understand and fully implement this, and this disclosure does not impose any limitations on it.

[0110] Secondly, this disclosure provides a testing method that can be applied to after-sales testing equipment for the aforementioned electronic devices.

[0111] like Figure 5 As shown, in some embodiments, the detection method of this disclosure includes:

[0112] S510, Obtain abnormal data stored in the electronic device.

[0113] S520. Based on the abnormal data, determine the cause of damage to the electronic equipment.

[0114] Specifically, the memory in the damaged electronic device can be accessed first, and the abnormal data stored in the memory can be obtained by reading the memory using appropriate equipment.

[0115] After obtaining the abnormal data, it can be read and analyzed. Since the abnormal data includes information such as the time of the abnormality, temperature, heating rate, electromagnetic power, and judgment results, the cause of the damage to the electronic equipment can be determined based on this information, and the true and reliable cause can be obtained.

[0116] As described above, the detection method of this disclosure, at the electronic device level, can detect whether the electromagnetic power of the target frequency band exceeds the standard based on the abnormal temperature of the target antenna. This allows for effective detection of damage to electronic devices caused by high-power electromagnetic devices, and the abnormal data can be saved. In subsequent after-sales service, staff can directly read the abnormal data saved by the electronic device to determine the cause of the damage, eliminating the need for subjective judgment based on the characteristics of the damage and reducing after-sales disputes.

[0117] Figure 6 This paper illustrates a specific embodiment of the detection method of this disclosure. In this embodiment, the detection method of this disclosure is used to determine whether the damage to the electronic device is caused by burns from a microwave oven. The following is a detailed description of the method. Figure 6 Please provide an explanation.

[0118] like Figure 6 As shown, in this embodiment, the detection method of this disclosure example includes:

[0119] S601. The temperature of the target antenna of the electronic device is obtained through a temperature detection circuit.

[0120] Specifically, the target antenna is a WiFi antenna, and the temperature detection circuit is as follows: Figure 2 As shown, the temperature detection circuit can be placed close to the WiFi antenna, so that when the WiFi antenna receives a high-power electromagnetic signal and heats up, the temperature of the WiFi antenna can be detected by the temperature sensing resistor of the temperature detection circuit.

[0121] S602. Determine whether the temperature of the target antenna meets the preset conditions. If yes, proceed to step S603. If no, return to step S601.

[0122] In one example, after obtaining the temperature of the WiFi antenna, it is determined whether the temperature of the WiFi antenna exceeds a preset temperature threshold. If it exceeds the preset temperature threshold, it indicates that the electromagnetic signal received by the WiFi antenna is a high-power abnormal signal, and step S603 is executed. If it does not exceed the preset temperature threshold, it indicates that the electromagnetic signal received by the WiFi antenna is a normal communication signal, and the process returns to step S601.

[0123] S603, The receiving frequency band of the radio frequency circuit controlling the target antenna is the target frequency band.

[0124] Specifically, in one example, the microwave oven operates at 2450MHz, thus the target frequency is set to 2450MHz. The WiFi chip controls the WiFi antenna's receiving frequency to 2450MHz.

[0125] S604. Determine whether the electromagnetic power of the target antenna in the target frequency band is not less than a preset power threshold. If yes, proceed to step S605. If no, return to step S601.

[0126] Specifically, the electromagnetic power of the WiFi antenna receiving the signal at 2450MHz is detected by the WiFi chip, and it is determined whether the electromagnetic power is not less than a preset power threshold. If yes, it indicates that the electromagnetic signal currently received by the WiFi antenna is an abnormal high-power electromagnetic signal from the microwave oven, and step S605 is executed. If no, the process returns to step S601.

[0127] S605. Generate abnormal data and save the abnormal data in the storage unit.

[0128] Specifically, abnormal data may include the time of receiving the abnormal electromagnetic signal, the electromagnetic power, the temperature of the WiFi antenna, the heating rate of the WiFi antenna, and the judgment result. Therefore, when it is determined that the electromagnetic signal originates from a high-power abnormal electromagnetic signal from a microwave oven, the judgment result and all related detection information can be stored in the electronic device's storage unit.

[0129] S606. Read abnormal data stored in electronic devices.

[0130] It's understandable that even if an electronic device is burned out due to the high-power electromagnetic signal from a microwave oven, abnormal data has already been stored in its memory before the burnout. Furthermore, in scenarios where electronic devices are burned out by high-power electromagnetic signals, the memory remains intact, allowing the stored abnormal data to be retrieved during subsequent after-sales testing.

[0131] S607. Based on the abnormal data, determine the cause of damage to the electronic equipment.

[0132] Specifically, after reading the abnormal data, the cause of the electronic device damage can be determined based on the relevant information and judgment results recorded in the abnormal data. This eliminates the need for subjective judgment by humans, reduces the requirements for after-sales staff, and also reduces the risk of disputes caused by unreasonable after-sales service from consumers.

[0133] Thirdly, this disclosure provides a detection device that can be applied to electronic devices. The electronic device in this disclosure can be any suitable type of electronic device, such as a smartphone, tablet computer, laptop computer, wearable device, etc., and this disclosure does not limit this.

[0134] like Figure 7 As shown, in some embodiments, the detection apparatus of this disclosure includes:

[0135] The first acquisition module 710 is configured to acquire the temperature of the target antenna of the electronic device;

[0136] The detection module 720 is configured to detect the electromagnetic power of the target antenna in the target frequency band in response to the temperature meeting a preset condition;

[0137] The storage module 730 is configured to generate and save abnormal data in response to electromagnetic power not being less than a preset power threshold.

[0138] As described above, the detection device of this embodiment can detect whether the electromagnetic power of the target frequency band exceeds the standard based on the abnormal temperature of the target antenna. This allows for effective detection of damage to electronic equipment caused by high-power electromagnetic devices, and the abnormal data can be saved. In subsequent after-sales service, staff can directly read the abnormal data saved by the electronic equipment to determine the cause of the damage, eliminating the need for subjective judgment based on the characteristics of the damage and reducing after-sales disputes.

[0139] In some implementations, the process of determining that the temperature meets preset conditions includes:

[0140] In response to the temperature not being less than a preset temperature threshold, the temperature is determined to meet the preset condition;

[0141] And / or,

[0142] In response to the temperature change rate being not less than a preset rate threshold, the temperature is determined to meet the preset condition.

[0143] In some implementations, the detection module 720 is specifically configured as follows:

[0144] In response to the temperature meeting preset conditions, the receiving frequency band of the radio frequency circuit of the target antenna is controlled to be the target frequency band;

[0145] Electromagnetic power is detected using radio frequency circuits.

[0146] In some implementations, the storage module 730 is specifically configured as follows:

[0147] In response to electromagnetic power not being less than a preset power threshold, abnormal data is generated;

[0148] Abnormal data is stored in the electronic device's storage unit.

[0149] In some implementations, the target frequency band includes 2400MHz to 2500MHz.

[0150] Fourthly, this disclosure provides a testing device that can be applied to after-sales testing equipment for the aforementioned electronic devices.

[0151] like Figure 8 As shown, in some embodiments, the detection apparatus of this disclosure includes:

[0152] The second acquisition module 810 is configured to acquire abnormal data stored in the electronic device; the abnormal data is obtained according to the detection method in any embodiment of the first aspect;

[0153] The determination module 820 is configured to determine the cause of damage to electronic devices based on abnormal data.

[0154] As described above, the detection device of this embodiment can detect whether the electromagnetic power of the target frequency band exceeds the standard based on the abnormal temperature of the target antenna at the electronic device end. This allows for effective detection of damage to electronic devices caused by high-power electromagnetic devices, and the abnormal data can be saved. In subsequent after-sales service, staff can directly read the cause of the damage based on the abnormal data saved by the electronic device, eliminating the need for subjective judgment based on the characteristics of the damage and reducing after-sales disputes.

[0155] Fifthly, the present disclosure provides an electronic device. The electronic device in the embodiments of the present disclosure can be any type of electronic device suitable for implementation, such as a smartphone, tablet computer, laptop computer, wearable device, etc., and the present disclosure does not limit it.

[0156] In some implementations, see Figure 1 and Figure 2 As shown in the embodiments, the electronic device of this disclosure includes:

[0157] Target antenna;

[0158] The temperature detection circuit is located near the target antenna.

[0159] Processor; and

[0160] A memory storing computer-readable instructions for causing a processor to execute the detection method according to any embodiment of the first aspect.

[0161] For the specific implementation of the electronic device, please refer to the foregoing; this disclosure will not repeat it further.

[0162] Sixthly, embodiments of this disclosure provide a storage medium storing computer-readable instructions for causing a computer to perform the detection method according to any of the foregoing embodiments.

[0163] Obviously, the above embodiments are merely examples for clear illustration and are not intended to limit the embodiments. Those skilled in the art will recognize that other variations or modifications can be made based on the above description. It is neither necessary nor possible to exhaustively list all embodiments here. However, obvious variations or modifications derived therefrom are still within the scope of protection of this disclosure.

Claims

1. A detection method, characterized in that, The detection method, applied to electronic devices, includes: Obtain the temperature of the target antenna of the electronic device; In response to the temperature meeting a preset condition, the target antenna is controlled to operate in the target frequency band, which is the operating frequency band of a high electromagnetic energy device, and the high electromagnetic energy device refers to a device that can damage the electronic device. Detect the electromagnetic power of the target antenna in the target frequency band; In response to the electromagnetic power being not less than a preset power threshold, indicating that the electromagnetic signal corresponding to the electromagnetic power originates from the strong electromagnetic energy device, abnormal data is generated and saved.

2. The detection method according to claim 1, characterized in that, The step of obtaining the temperature of the target antenna of the electronic device includes: The temperature is obtained by a temperature detection circuit located near the target antenna.

3. The detection method according to claim 1, characterized in that, The process of determining that the temperature meets the preset conditions includes: In response to the temperature being not less than a preset temperature threshold, it is determined that the temperature meets a preset condition; And / or, In response to the temperature change rate being not less than a preset rate threshold, it is determined that the temperature meets a preset condition.

4. The detection method according to claim 1, characterized in that, The detection of the electromagnetic power of the target antenna in the target frequency band includes: In response to the temperature meeting a preset condition, the receiving frequency band of the radio frequency circuit of the target antenna is controlled to be the target frequency band; The electromagnetic power is detected by the radio frequency circuit.

5. The detection method according to claim 1, characterized in that, The generation and storage of abnormal data includes: In response to the electromagnetic power being not less than a preset power threshold, indicating that the electromagnetic signal corresponding to the electromagnetic power is from the strong electromagnetic energy device, abnormal data for the strong electromagnetic energy device is generated. The abnormal data is stored in the storage unit of the electronic device.

6. The detection method according to any one of claims 1 to 5, characterized in that, The target frequency band includes 2400MHz~2500MHz.

7. A detection method, characterized in that, include: Obtain abnormal data stored in an electronic device; the abnormal data is obtained by the detection method according to any one of claims 1 to 6; Based on the abnormal data, the cause of damage to the electronic device is determined.

8. A detection device, characterized in that, The detection device, applied to electronic devices, includes: The first acquisition module is configured to acquire the temperature of the target antenna of the electronic device; The detection module is configured to, in response to the temperature meeting a preset condition, control the target antenna to operate in a target frequency band, the target frequency band being the operating frequency band of a high electromagnetic energy device, the high electromagnetic energy device being a device capable of damaging the electronic device; and detect the electromagnetic power of the target antenna in the target frequency band; The storage module is configured to generate and store abnormal data in response to the electromagnetic power being not less than a preset power threshold, indicating that the electromagnetic signal corresponding to the electromagnetic power is from the strong electromagnetic energy device.

9. A detection device, characterized in that, include: The second acquisition module is configured to acquire abnormal data stored in the electronic device; The abnormal data is obtained by the detection method according to any one of claims 1 to 6; The determination module is configured to determine the cause of damage to the electronic device based on the abnormal data.

10. An electronic device, characterized in that, include: Target antenna; The temperature detection circuit is located near the target antenna. processor; as well as A memory storing computer-readable instructions for causing a processor to perform the method according to any one of claims 1 to 6.

11. A storage medium, characterized in that, The device stores computer-readable instructions for causing a computer to perform the method according to any one of claims 1 to 6, or the method according to claim 7.

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