A batch quality detection device and detection method for a platinum film sensor

Abstract

The present invention discloses a detection method for batch quality detection of platinum film sensors, including: a sensor batch feeding unit for sequentially inputting a fixed quantity of platinum film sensors to an aging detector; the aging detector for sequentially connecting to each platinum film sensor and regularly passing a constant current into the platinum film sensor to simulate the usage process of the platinum film sensor, and the aging detector screening qualified platinum film sensors by analyzing the characteristic parameters in the simulated usage process of the platinum film sensor. The detection of the present invention is accurate and has high detection efficiency.

Description

Technical Field

[0001] The present invention relates to the technical field of platinum film sensors, and particularly relates to a batch quality detection device and method for platinum film sensors. Background Art

[0002] The platinum thin film resistance temperature sensor is a temperature sensor, which has advantages such as good stability, wide measurement range, high precision, and good repeatability. Its innovation and superiority lie in: extremely short response time; wide operating temperature range: -200°C to +1000°C; it can also be used as a low-temperature sensor element for -200°C to +150°C; it has high stability and high vibration resistance even in very small sizes.

[0003] During the production process of the developed and calibrated platinum film sensors, there may be unqualified products, which will be damaged during the power-on process and affect the use. Therefore, quality detection is required after the production of platinum film sensors, and unqualified products are screened out.

[0004] However, most of the existing quality aging detectors for platinum film sensors are semi-automated programs. Generally, the platinum film sensors are automatically transported to the sensor aging detector, and the operator manually connects the platinum film sensors to the sensor aging detector and detects the functions of the platinum film sensors to identify unqualified products. The detection efficiency is low, and there is a certain error rate in manual participation. Summary of the Invention

[0005] The purpose of the present invention is to provide a batch quality detection device and method for platinum film sensors, so as to solve the technical problems in the prior art that most of the existing quality aging detectors for platinum film sensors are semi-automated programs, with low detection efficiency and a certain error rate in manual participation.

[0006] To solve the above technical problems, the present invention specifically provides the following technical solutions:

[0007] A batch quality detection device for platinum film sensors includes:

[0008] A sensor batch feeding unit for batch inputting a fixed quantity of platinum film sensors into the aging detector, with the same contact force between each platinum film sensor and the aging detector;

[0009] An aging detector for sequentially connecting to each of the platinum film sensors and regularly passing a constant current through the platinum film sensors to simulate the usage process of the platinum film sensors. The aging detector screens qualified platinum film sensors by analyzing the characteristic parameters during the simulated usage process of the platinum film sensors.

[0010] As a preferred embodiment of the present invention, the sensor batch feeding unit includes an inserting component disposed opposite to the detection surface of the aging detector, and a pushing component disposed on the side of the inserting component. The pushing component pushes the inserting component to linearly move towards the aging detector, so that the sensors on the inserting component are inserted into the slots of the aging detector for quality inspection. The pushing component pulls the inserting component to linearly move away from the aging detector to withdraw the sensors on the inserting component from the slots of the aging detector.

[0011] As a preferred embodiment of the present invention, the inserting component includes a plurality of sensor assembling parts, and a connecting cross beam movably connected between two adjacent sensor assembling parts. The sensor assembling part can rotate 90° around the connecting cross beam, and the working shaft of the pushing component is fixedly installed on the connecting cross beam;

[0012] When the pushing component pushes the inserting component to insert the sensors into the slots of the aging detector, the sensors inserted in the sensor assembling part remain in a horizontal state. When the pushing component pulls the inserting component to reset, the sensor assembling part rotates 90°, and the sensors inserted in the sensor assembling part are converted to a vertical state.

[0013] As a preferred embodiment of the present invention, the sensor batch feeding unit is disposed on a workbench. The workbench includes a lower-level tabletop and a higher-level tabletop. The bottom of the sensor assembling part linearly moves along the lower-level tabletop, and the bottom of the sensor assembling part rotates under the blocking action of the higher-level tabletop;

[0014] Wherein, the height difference between the lower-level tabletop and the higher-level tabletop is equal to the height difference between the installation position of the connecting cross beam and the sensor assembling part.

[0015] As a preferred embodiment of the present invention, a weight block is provided at the lower end of each sensor assembling part to enable the sensor assembling part to stably shift towards the slots of the aging detector;

[0016] Each sensor assembling part includes two rows of sensor fastening areas. The number of each row of sensor fastening areas includes at least two fastening grooves. Each fastening groove is provided with two columns of uniformly distributed sinking grooves. A rubber ring for clamping the sensor is provided at the bottom of the sinking groove, and a voltage plate is commonly provided at the bottom of the sinking groove to apply voltage to the end of the sensor.

[0017] As a preferred embodiment of the present invention, a circular groove is provided at the center position of the side surface of each of the sensor assemblies connected to the connecting cross beam, and the end of the connecting cross beam is installed in the circular groove through a bearing, and the sensor assembly rotates freely around the connecting cross beam;

[0018] Two limiting straight plates are provided on the outer surface of the end of the connecting cross beam, and the included angle between the two limiting straight plates is 90°. A pointing plate is provided on the side surface of the sensor assembly facing the connecting cross beam. When the sensor assembly rotates around the connecting cross beam, the sensor assembly rotates 90° through the mutual locking action between the limiting straight plates and the pointing plate.

[0019] As a preferred embodiment of the present invention, the pushing assembly includes a plurality of pushing cylinders uniformly arranged on the high-order table surface, and the working shaft of each pushing cylinder is fixedly installed at the center position of the corresponding connecting cross beam;

[0020] Wherein, the working shaft of the pushing cylinder linearly contracts along the upper surface of the high-order table surface.

[0021] As a preferred embodiment of the present invention, a slot for receiving the sensor is provided on the back of the aging detector, and the position of the slot corresponds one-to-one with the sensor insertion position of the sensor batch feeding unit.

[0022] As a preferred embodiment of the present invention, the aging detector applies a voltage to the end of the sensor in each slot, and at the same time the voltage plate applies a voltage to the end of the sensor in the sinking groove. The aging detector judges the sensor by detecting the resistance value of the sensor before and after the loading is completed and comparing the difference between the resistance values of the sensor detected at least twice.

[0023] To solve the above technical problems, the present invention further provides the following technical solution: A batch detection method for a batch quality detection device of a platinum film sensor, including the following steps:

[0024] The sensor batch feeding unit is reset and rotated to make the opening of the tank face upward, and the platinum film sensors are loaded into the tank of the sensor batch feeding unit step by step or simultaneously;

[0025] Push the sensor batch feeding unit towards the aging detector, and the sensor batch feeding unit gradually rotates while moving so that the opening of the tank faces the aging detector;

[0026] The sensor batch feeding unit pushes the platinum film sensors into the slots of the aging detector, and the acting force between the ends of all the platinum film sensors and the bottom of the corresponding slots is constant;

[0027] A current is applied to both ends of the platinum thin film sensor, and an aging test is performed on the platinum film and silver paste of the platinum thin film sensor by using the resistance difference before and after the application of the current.

[0028] Compared with the prior art, the present invention has the following beneficial effects: The sensor batch feeding unit receives 128 sensors transferred step by step or simultaneously by the manipulator. The distribution mode of the sensors on the sensor batch feeding unit is the same as the distribution mode of the slots, and 128 sensors can be inserted into the slots simultaneously for voltage application and quality detection. Therefore, batch synchronous and efficient quality detection of sensors is achieved. BRIEF DESCRIPTION OF THE DRAWINGS

[0029] In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the following will briefly introduce the drawings required for the description of the embodiments or the prior art. Obviously, the drawings in the following description are only exemplary, and for those of ordinary skill in the art, other implementation drawings can be obtained by extending according to the provided drawings without creative efforts.

[0030] Figure 1 It is a schematic side sectional structure diagram of the quality detection device provided by the embodiment of the present invention;

[0031] Figure 2 It is a schematic back structure diagram of the aging detector provided by the embodiment of the present invention;

[0032] Figure 3 It is a schematic front structure diagram of the plugging component provided by the embodiment of the present invention;

[0033] Figure 4 It is a schematic side sectional structure diagram of the sensor assembly provided by the embodiment of the present invention.

[0034] The reference numerals in the drawings are respectively represented as follows:

[0035] 1 - Sensor batch feeding unit; 2 - Aging detector; 3 - Workbench; 4 - Weight block; 5 - Sinking groove; 6 - Rubber ring; 7 - Voltage plate;

[0036] 11 - Plugging component; 12 - Pushing component;

[0037] 111 - Sensor assembly; 112 - Connecting cross beam; 113 - Circular groove; 114 - Limiting straight plate; 115 - Pointing plate

[0038] 121 - Pushing cylinder;

[0039] 21 - Slot;

[0040] 31 - Low - level table surface; 32 - High - level table surface. DETAILED DESCRIPTION OF THE EMBODIMENTS

[0041] Next, in combination with the accompanying drawings in the embodiments of the present invention, the technical solutions in the embodiments of the present invention will be clearly and completely described. Obviously, the described embodiments are only a part of the embodiments of the present invention, rather than all the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by those of ordinary skill in the art without creative efforts shall fall within the protection scope of the present invention.

[0042] As Figure 1 shown, the present invention provides a batch quality detection device for platinum film sensors, including a sensor batch feeding unit 1 and an aging detector 2. The aging detector 2 is arranged on the platform, and the slot of the aging detector 2 is directly opposite to the sensor batch feeding unit 1, so that the sensor batch feeding unit 1 inserts the sensor into the slot for quality detection.

[0043] Among them, the sensor batch feeding unit 1 is used to batch input a fixed quantity of platinum film sensors into the aging detector 2, and the contact force of each platinum film sensor with the aging detector 2 is the same;

[0044] The aging detector 2 is used to connect with each platinum film sensor in turn, and regularly pass a constant current into the platinum film sensor to simulate the use process of the platinum film sensor. The aging detector 2 screens qualified platinum film sensors by analyzing the characteristic parameters in the simulated use process of the platinum film sensor.

[0045] As Figure 2 shown, the back of the aging detector 2 is provided with a slot 21 for receiving the sensor, and the position of the slot 21 corresponds one-to-one with the sensor insertion position of the sensor batch feeding unit 1.

[0046] The slots of the aging detector 2 are generally divided into two rows, each row contains 8 inspection areas, each inspection area is provided with two columns and each column has 4 slots, a total of 128 slots. Generally, the existing quality detection of sensors is mostly manual operation. The sensors are inserted into the slots one by one. After the slots are filled with sensors, the pressure plate is covered, and at the same time, voltage is applied to both ends of all the sensors. According to the resistance change of the sensors, the quality of the sensors is judged. However, this method has low working efficiency and cannot meet the high-efficiency and rapid test requirements of industrialization.

[0047] Therefore, in this embodiment, the sensor batch feeding unit 1 receives 128 sensors transferred step by step or simultaneously by the manipulator. The distribution mode of the sensors on the sensor batch feeding unit 1 is the same as the distribution mode of the slots, and 128 sensors can be inserted into the slots at the same time for voltage application for quality detection. Therefore, batch synchronous and high-efficiency quality detection of sensors is realized.

[0048] Specifically, the sensor batch feeding unit 1 includes a plugging component 11 arranged opposite to the detection surface of the aging detector 2, and a pushing component 12 arranged on the side of the plugging component 11. The pushing component 12 pushes the plugging component 11 to linearly move towards the aging detector 2, so that the sensors on the plugging component 11 are inserted into the slots 21 of the aging detector 2 for quality inspection. The pushing component 12 pulls the plugging component 11 to linearly move away from the aging detector 2, so as to extract the sensors on the plugging component 11 from the slots 21 of the aging detector 2.

[0049] As Figure 3 shown, the plugging component 11 includes a plurality of sensor assembly parts 111, and is movably connected to a connecting cross beam 112 arranged between two adjacent sensor assembly parts 111. The sensor assembly parts 111 can rotate 90° around the connecting cross beam 112, and the working shaft of the pushing component 12 is fixedly installed on the connecting cross beam 112.

[0050] When the pushing component 12 pushes the plugging component 11 to insert the sensors into the slots 21 of the aging detector 2, the sensors inserted in the sensor assembly parts 111 remain in a horizontal state. When the pushing component 12 pulls the plugging component 11 to reset, the sensor assembly parts 111 rotate 90°, and the sensors inserted in the sensor assembly parts 111 are converted to a vertical state.

[0051] In this embodiment, the sensor batch feeding unit 1 mainly uses the plugging component 11 to temporarily fix the sensors, and then under the pushing and pulling action of the pushing component 12, inserts the sensors into the slots 21 of the aging detector 2 for quality inspection. After the quality inspection is completed, the sensors are extracted from the slots 21 of the aging detector 2 for waste removal. After unloading the sensors, new sensors are reinstalled for quality inspection.

[0052] In order to facilitate the sensor installation operation of the plugging component 11, the opening of the plugging component 11 in this embodiment can be converted, that is, mainly using the sensor assembly parts 111 to load the sensors. When the sensor assembly parts 111 are reset, the sensor assembly parts 111 rotate to have the opening facing upwards, which is convenient for sensor installation and disassembly operations. When the sensor assembly parts 111 insert the sensors into the slots 21 of the aging detector 2 for quality inspection, the sensor assembly parts 111 rotate to have the opening facing the slots 21 of the aging detector 2, thus completing the sensor plugging operation.

[0053] The sensor batch feeding unit 1 is arranged on the workbench 3. The workbench 3 includes a low-level tabletop 31 and a high-level tabletop 32. The bottom of the sensor assembly parts 111 linearly moves along the low-level tabletop 31, and the bottom of the sensor assembly parts 111 rotates under the blocking action of the high-level tabletop 32.

[0054] Among them, the height difference between the low-level tabletop 31 and the high-level tabletop 32 is equal to the height difference between the installation position of the connecting cross beam 112 and the sensor assembly 111.

[0055] A weight 4 is provided at the lower end of each sensor assembly 111 so that the sensor assembly 111 stably displaces toward the slot 21 of the aging detector 2.

[0056] As Figure 4 As shown, each sensor assembly 111 includes two rows of sensor fastening areas. The number of fastening grooves in each row of sensor fastening areas is at least two, and each fastening groove is provided with two columns of uniformly distributed sinking grooves 5. A rubber ring 6 for clamping the sensor is provided at the bottom of the sinking groove 5, and a voltage plate 7 is jointly provided at the bottom of the sinking groove 5 to apply a voltage to the end of the sensor.

[0057] In this embodiment, the sensor assembly 111 mainly rotates around the connecting cross beam 112. The specific rotation implementation method is as follows:

[0058] The pushing assembly 12 includes a plurality of pushing cylinders 121 uniformly arranged on the high-level tabletop 32. The working shaft of each pushing cylinder 121 is fixedly installed at the central position of the corresponding connecting cross beam 112. Among them, the working shaft of the pushing cylinder 121 linearly contracts along the upper surface of the high-level tabletop 32;

[0059] When the pushing assembly 12 pushes the connecting cross beam 112 toward the slot 21 of the aging detector 2, a weight 4 is provided at the lower end of the sensor assembly 111. Therefore, when it disengages from the high-level tabletop 32, the sensor assembly 111 gradually rotates to a vertical state, and the sensor assembly 111 stably displaces toward the slot 21 of the aging detector 2;

[0060] When the pushing assembly 12 pulls the connecting cross beam 112 away from the aging detector 2 for resetting, the sensor assembly 111 rotates around the connecting cross beam 112 under the resistance of the high-level tabletop 32 until it rotates to a horizontal state;

[0061] Since a rubber ring 6 for clamping the sensor is provided at the bottom of the sinking groove 5 of the sensor assembly 111, the sensor remains in a relatively stable state under the clamping action of the rubber ring 6 and maintains a straight state.

[0062] A circular groove 113 is provided at the central position of the side surface where each sensor assembly 111 is connected to the connecting cross beam 112. The end of the connecting cross beam 112 is installed in the circular groove 113 through a bearing, and the sensor assembly 111 rotates freely around the connecting cross beam 112.

[0063] Two limiting straight plates 114 are provided on the outer surface of the end of the connecting beam 112, and the angle between the two limiting straight plates 114 is 90°. A pointing plate 115 is provided on the side surface of the sensor assembly 111 facing the connecting beam 112. When the sensor assembly 111 rotates around the connecting beam 112, the limiting straight plates 114 and the pointing plates 115 are mutually locked, so that the sensor assembly 111 rotates 90°.

[0064] In order to ensure the stability of the sensor assembly 111 rotating around the connecting beam 112, this embodiment utilizes the mutual locking effect of the limiting straight plate 114 and the pointing plate 115 to allow the sensor assembly 111 to rotate 90°, that is, to switch between the horizontal state and the vertical state, thereby changing the opening direction of the sensor slot.

[0065] Due to the limited space between the aging detector 2 and the sensor assembly 111, the installation and removal of the sensor is very inconvenient. The present embodiment can improve the convenience of feeding the sensor by converting the state of the sensor assembly 111. That is, when the opening direction is upward, the installation and removal of the sensor is very convenient, and when the opening direction is toward the aging detector 2, the insertion and pulling out operations of the sensor are completed.

[0066] The aging detector 2 loads voltage to the sensor end in each slot 21, and the voltage plate 7 loads voltage to the sensor end in the sinking groove 5. The aging detector 2 judges the sensor by detecting the sensor resistance before and after loading is completed, and comparing the difference in the sensor resistance values detected at least twice.

[0067] When the sensor is inserted into the slot 21 of the aging detector 2, voltage is applied to both ends of the sensor. The specific application method is: in the slot 21, voltage is connected to one end of the sensor, and voltage is applied to the voltage plate 7 of the sensor assembly 111, that is, voltage is connected to the other end of the sensor, thereby completing the operation of applying voltage to both ends of the sensor.

[0068] The voltage size and duration of voltage applied to both ends of the platinum thin film resistance thermometer can be selected, and the current is used to age and test the platinum film and silver paste of the platinum thin film resistance thermometer. Poor quality ones, such as platinum film floating on the glass substrate, silver paste and platinum film in poor contact, silver paste floating, wire poor welding, etc., will be damaged or the resistance will change significantly after current loading.

[0069] That is, before applying voltage, the sensor resistance on all connected channels is automatically measured, and then the loading voltage or current and time are selected; after a few minutes after loading, the sensor resistance can be measured again; given the resistance values measured before and after, the quality of the sensor can be judged (the difference between the resistance values before and after of qualified quality is very small ≤0.1Ω), and 128 sensors can be judged at the same time.

[0070] In addition, the present invention also provides a batch detection method for a batch quality detection device of a platinum film sensor, comprising the following steps:

[0071] The sensor batch feeding unit is reset and rotated until the slot opening faces upward, and the platinum film sensors are loaded into the slots of the sensor batch feeding unit step by step or simultaneously;

[0072] Push the sensor batch feeding unit towards the aging detector, and the sensor batch feeding unit gradually rotates while moving until the slot opening faces the aging detector;

[0073] The sensor batch feeding unit pushes the platinum film sensors into the slots of the aging detector, and the acting force between the ends of all the platinum film sensors and the bottoms of the corresponding slots is constant;

[0074] Apply a current to both ends of the platinum thin film sensor, and use the resistance difference before and after the current application to conduct an aging test on the platinum film and silver paste of the platinum thin film sensor.

[0075] In this embodiment, the sensor batch feeding unit receives 128 sensors transferred step by step or simultaneously by the manipulator. The distribution mode of the sensors on the sensor batch feeding unit is the same as the distribution mode of the slots, and 128 sensors can be inserted into the slots simultaneously to apply voltage for quality detection. Therefore, batch synchronous and efficient quality detection of the sensors is achieved.

[0076] The above embodiments are only exemplary embodiments of the present application and do not limit the present application. The protection scope of the present application is defined by the claims. Those skilled in the art can make various modifications or equivalent replacements within the essence and protection scope of the present application, and such modifications or equivalent replacements should also be regarded as falling within the protection scope of the present application.

Claims

1. A batch quality detection device for platinum film sensors, characterized in that, Including: A sensor batch feeding unit (1) for batch inputting a fixed quantity of platinum film sensors into an aging detector (2), with the same contact force between each platinum film sensor and the aging detector (2); An aging detector (2) for successively connecting with each of the platinum film sensors and regularly passing a constant current through the platinum film sensors to simulate the usage process of the platinum film sensors, and the aging detector (2) screens the qualified platinum film sensors by analyzing the characteristic parameters during the simulated usage process of the platinum film sensors; The sensor batch feeding unit (1) includes an inserting component (11) arranged opposite to the detection surface of the aging detector (2), and a pushing component (12) arranged on the side of the inserting component (11). The pushing component (12) pushes the inserting component (11) to linearly move towards the aging detector (2) so that the sensors on the inserting component (11) are inserted into the slots (21) of the aging detector (2) for quality inspection, and the pushing component (12) pulls the inserting component (11) to linearly move away from the aging detector (2) to extract the sensors on the inserting component (11) from the slots (21) of the aging detector (2); The inserting component (11) includes a plurality of sensor assembly parts (111) and is movably connected with a connecting cross beam (112) arranged between two adjacent sensor assembly parts (111). The sensor assembly part (111) can rotate 90° around the connecting cross beam (112), and the working shaft of the pushing component (12) is fixedly installed on the connecting cross beam (112); When the pushing component (12) pushes the inserting component (11) to insert the sensors into the slots (21) of the aging detector (2), the sensors inserted in the sensor assembly part (111) remain in a horizontal state, and when the pushing component (12) pulls the inserting component (11) to reset, the sensor assembly part (111) rotates 90°, and the sensors inserted in the sensor assembly part (111) are converted to a vertical state; The sensor batch feeding unit (1) is arranged on a workbench (3). The workbench (3) includes a low-level tabletop (31) and a high-level tabletop (32). The bottom of the sensor assembly part (111) linearly moves along the low-level tabletop (31), and the bottom of the sensor assembly part (111) rotates under the blocking action of the high-level tabletop (32); Wherein, the height difference between the low-level tabletop (31) and the high-level tabletop (32) is equal to the height difference between the installation position of the connecting cross beam (112) and the sensor assembly part (111).

2. The batch quality inspection device for platinum film sensors according to claim 1, characterized in that A weight (4) is provided at the lower end of each sensor assembly part (111) to enable the stable displacement of the sensor assembly part (111) towards the slots (21) of the aging detector (2). Each of the sensor assemblies (111) includes two rows of sensor fastening areas. The number of sensor fastening areas in each row is at least two fastening grooves, and each of the fastening grooves is provided with two columns of evenly distributed sinking grooves (5). A rubber ring (6) for clamping the sensor is provided at the bottom of the sinking groove (5), and a voltage plate (7) is commonly provided at the bottom of the sinking groove (5) to apply a voltage to the end of the sensor.

3. The batch quality detection device for platinum film sensors according to claim 1, wherein At the center position of the side surface where each of the sensor assemblies (111) is connected to the connecting cross beam (112), a circular groove (113) is provided. The end of the connecting cross beam (112) is installed in the circular groove (113) through a bearing, and the sensor assembly (111) rotates freely around the connecting cross beam (112); On the outer surface of the end of the connecting cross beam (112), two limiting straight plates (114) are provided. The included angle between the two limiting straight plates (114) is 90°. A pointing plate (115) is provided on the side surface of the sensor assembly (111) facing the connecting cross beam (112). When the sensor assembly (111) rotates around the connecting cross beam (112), through the mutual locking action of the limiting straight plate (114) and the pointing plate (115), the sensor assembly (111) rotates 90°.

4. The batch quality detection device for platinum film sensors according to claim 1, wherein The pushing assembly (12) includes a plurality of pushing cylinders (121) evenly arranged on the high-order table surface (32). The working shaft of each pushing cylinder (121) is fixedly installed at the center position of the corresponding connecting cross beam (112); Wherein, the working shaft of the pushing cylinder (121) linearly contracts along the upper surface of the high-order table surface (32).

5. The batch quality detection device for platinum film sensors according to claim 2, wherein On the back of the aging detector (2), a slot (21) for receiving the sensor is provided. The position of the slot (21) corresponds one-to-one with the sensor insertion position of the sensor batch feeding unit (1).

6. The batch quality detection device for platinum film sensors according to claim 5, wherein The aging detector (2) applies a voltage to the end of the sensor in each slot (21), and at the same time, the voltage plate (7) applies a voltage to the end of the sensor in the sinking groove (5). The aging detector (2) judges the sensor by detecting the resistance value of the sensor before and after the loading is completed and comparing the difference in the resistance values of the sensor detected at least twice.

7. A batch detection method for a batch quality detection device of a platinum film sensor according to any one of claims 1-6, characterized in that, Including the following steps: The sensor batch feeding unit is reset and rotated until the slot opening faces upward, and the platinum film sensors are loaded into the slots of the sensor batch feeding unit step by step or simultaneously; Push the sensor batch feeding unit to move towards the aging detector, and the sensor batch feeding unit gradually rotates while moving until the slot opening faces the aging detector; The sensor batch feeding unit pushes the platinum film sensors into the slots of the aging detector, and the acting force between the ends of all the platinum film sensors and the bottoms of the corresponding slots is constant; A current is applied to both ends of the platinum film sensor, and an aging test is performed on the platinum film and silver paste of the platinum film sensor by using the resistance difference before and after the application of the current.

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