An automatic processing method and device for satellite signal reflection loss

Abstract

The application provides a satellite signal reflection loss automatic processing method and device, the method comprises the following steps: when a network analyzer detects satellite signal reflection loss of a to-be-tested board card and obtains corresponding test data, the test data is acquired; preset standard data is acquired, the test data is compared with the standard data, and a comparison result is obtained; and electrical parameter adjustment information of the to-be-tested board card is generated according to the comparison result. The test data of the network analyzer is acquired by a host computer, and is automatically compared with standard data to generate electrical parameter adjustment information of the to-be-tested board card, so that the workload of circuit board researchers for adjusting electrical parameters according to experience is reduced.

Description

TECHNICAL FIELD

[0001] The present application relates to the technical field of circuit board, in particular to a satellite signal reflection loss automatic processing method and device. BACKGROUND

[0002] The newly developed TV circuit board usually needs to do a satellite signal strength test experiment, that is, to test the noise wave sensitivity. In the noise wave sensitivity test work, when the test result does not meet the relevant national regulations, the R&D designers need to test the TV satellite signal reflection loss index, and increase the corresponding rectification measures according to the test result.

[0003] However, due to the fact that the satellite signal is easily disturbed by the electromagnetic signal of the experimental environment, in the actual test rectification process, the R&D designers usually increase the rectification measures by using their own experience. Such processing method greatly increases the workload of the R&D personnel, and also has certain requirements on the ability and technology of the R&D personnel.

[0004] Therefore, the prior art has defects and needs to be improved and developed. SUMMARY

[0005] The technical problem to be solved by the present application is to provide a satellite signal reflection loss automatic processing method and device to solve the problem that the R&D designers need to adjust the electrical parameters according to experience when rectifying the circuit board according to the test result in the prior art, which is a large workload.

[0006] The technical scheme adopted by the present application to solve the technical problem is as follows:

[0007] In a first aspect, the present application provides a satellite signal reflection loss automatic processing method, which comprises:

[0008] When the network analyzer detects the satellite signal reflection loss of the to-be-tested board card and obtains the corresponding test data, the test data is acquired.

[0009] The preset standard data is acquired, the test data is compared with the standard data, and the comparison result is obtained.

[0010] The electrical parameter adjustment information of the to-be-tested board card is generated according to the comparison result.

[0011] In an embodiment, the to-be-tested board card is connected with the network analyzer through an SMA coaxial shielded wire; and when the network analyzer detects the satellite signal reflection loss of the to-be-tested board card and obtains the corresponding test data, the test data is acquired, which comprises:

[0012] A communication connection is established with the network analyzer in advance through a USB bus.

[0013] When the network analyzer detects the satellite signal reflection loss of the to-be-tested board card and obtains corresponding test data, the test data is acquired through a USB bus.

[0014] In an embodiment, the standard data is a standard value based on a Smith chart, and the test data includes all test data point values corresponding to test points on the to-be-tested board card; the standard data is acquired, the test data is compared with the standard data, and a comparison result is obtained, including:

[0015] The plurality of test data point values are saved into an array;

[0016] The standard value based on the Smith chart is acquired, all test data point values in the array are traversed, each test data point value is compared with a corresponding standard value, and a comparison result is obtained.

[0017] In an embodiment, the standard value includes a standard abscissa value and a standard ordinate value, and the standard abscissa value and the standard ordinate value correspond to each other one by one; each test data point value includes a test abscissa value and a test ordinate value, and the test abscissa value and the test ordinate value correspond to each other one by one;

[0018] The standard value based on the Smith chart is acquired, all test data point values in the array are traversed, each test data point value is compared with a corresponding standard value, and a comparison result is obtained, including:

[0019] The standard value based on the Smith chart is searched according to the test abscissa value, a target standard abscissa value same as the test abscissa value is determined;

[0020] A target standard ordinate value corresponding to the target standard abscissa value is acquired;

[0021] The test ordinate value is compared with the size of the target standard ordinate value.

[0022] In an embodiment, electrical parameter adjustment information of the to-be-tested board card is generated according to the comparison result, including:

[0023] If the test ordinate value is greater than the target standard ordinate value, increasing capacitance information is generated;

[0024] If the test ordinate value is less than the target standard ordinate value, decreasing capacitance information is generated.

[0025] In an embodiment, the generating the electrical parameter adjustment information of the to-be-tested board card according to the comparison result further comprises:

[0026] If the test ordinate value is equal to the target standard ordinate value, the test data is saved, and the holding capacitance information is generated.

[0027] In an embodiment, after the generating the electrical parameter adjustment information of the to-be-tested board card according to the comparison result, the method further comprises:

[0028] The electrical parameter adjustment information of the to-be-tested board card is displayed.

[0029] In a second aspect, the embodiments of the present application further provide an automatic processing device for satellite signal reflection loss, wherein the device comprises:

[0030] An acquisition module is configured to acquire test data when a network analyzer detects satellite signal reflection loss of a to-be-tested board card and obtains the test data;

[0031] A comparison module is configured to acquire preset standard data, compare the test data with the standard data, and obtain a comparison result;

[0032] A generation module is configured to generate electrical parameter adjustment information of the to-be-tested board card according to the comparison result.

[0033] In a third aspect, the embodiments of the present application further provide a terminal, wherein the terminal comprises a memory, a processor, and an automatic processing program for satellite signal reflection loss stored in the memory and executable on the processor, and the automatic processing program for satellite signal reflection loss, when executed by the processor, implements the steps of the automatic processing method for satellite signal reflection loss.

[0034] In a fourth aspect, the embodiments of the present application further provide a computer readable storage medium, wherein the computer readable storage medium stores a computer program, and the computer program can be executed to implement the steps of the automatic processing method for satellite signal reflection loss.

[0035] The embodiments of the present application have the following beneficial effects: the embodiments of the present application acquire test data when a network analyzer detects satellite signal reflection loss of a to-be-tested board card and obtains the test data, acquire preset standard data, compare the test data with the standard data, and obtain a comparison result, and generate electrical parameter adjustment information of the to-be-tested board card according to the comparison result. The embodiments of the present application acquire test data of a network analyzer by a host computer, automatically compare the test data with standard data, and generate electrical parameter adjustment information of a to-be-tested board card, so that circuit board researchers do not need to adjust electrical parameters according to experience, and workload is reduced. BRIEF DESCRIPTION OF DRAWINGS

[0036] Figure 1 is a flow chart of a preferred embodiment of the automatic processing method of satellite signal reflection loss in the present application.

[0037] Figure 2 is a principle flow chart block diagram of a preferred embodiment of the automatic processing method of satellite signal reflection loss in the present application.

[0038] Figure 3 is a functional principle block diagram of a preferred embodiment of the automatic processing device of satellite signal reflection loss in the present application.

[0039] Figure 4 is a functional principle block diagram of a preferred embodiment of the terminal in the present application. DETAILED DESCRIPTION

[0040] In order to make the objects, technical solutions and advantages of the present application clearer and more explicit, the present application is further described in detail below with reference to the drawings and examples. It should be understood that the specific examples described herein are only used to explain the present application and do not limit the present application.

[0041] A newly developed TV circuit board usually needs to be tested for satellite signal strength, i.e., noise wave sensitivity. In the test of noise wave sensitivity, when the test result does not meet the relevant national regulations, the R&D designer needs to test the TV satellite signal reflection loss and increase corresponding rectification measures according to the test result.

[0042] However, due to the fact that the satellite signal is extremely susceptible to the interference of electromagnetic signals in the experimental environment, in the actual test rectification process, the R&D designer usually uses inherent experience to increase the rectification measures, which on the one hand greatly increases the workload of the R&D personnel, and on the other hand has certain requirements on the ability and technology of the R&D personnel. At the same time, due to the problems such as different test environments and unprofessional test methods, the final test result has the problem of low reproducibility.

[0043] That is, the current network analyzer can only reflect the test data, and the R&D personnel need to judge based on the test data and then apply new measures, which cannot completely liberate the productivity of the R&D personnel; at the same time, due to the factors such as test environment and test method, the test result has the problems of poor stability and low reproducibility.

[0044] In view of the above defects of the prior art, the present application provides an automatic processing method and device for satellite signal reflection loss, which comprises the following steps: when a network analyzer detects satellite signal reflection loss of a to-be-tested board card and obtains corresponding test data, the test data is acquired; preset standard data is acquired, the test data is compared with the standard data to obtain a comparison result; and electrical parameter adjustment information of the to-be-tested board card is generated according to the comparison result. The test data of the network analyzer is acquired by the upper computer, and is automatically compared with the standard data to generate the electrical parameter adjustment information of the to-be-tested board card, so that the circuit board R&D personnel do not need to adjust the electrical parameters according to experience, and the workload is reduced.

[0045] Referring to Figure 1 The automatic processing method for satellite signal reflection loss provided by the embodiment of the present application comprises the following steps:

[0046] Step S100: When a network analyzer detects satellite signal reflection loss of a to-be-tested board card and obtains corresponding test data, the test data is acquired.

[0047] Specifically, the to-be-tested board card refers to a TV circuit board. In this embodiment, the network analyzer is used to automatically detect satellite signal reflection loss of the to-be-tested board card, and the network analyzer can generate test data of the satellite signal reflection loss of the to-be-tested board card. In this way, the terminal (i.e. the upper computer) can directly acquire the test data of the network analyzer.

[0048] In an implementation manner, the to-be-tested board card is connected to the network analyzer through an SMA (Sub-Miniature-A) coaxial shielded wire; and the step S100 comprises the following steps:

[0049] Step S110: A communication connection is established with the network analyzer through a USB bus in advance;

[0050] Step S120: When the network analyzer detects satellite signal reflection loss of the to-be-tested board card and obtains corresponding test data, the test data is acquired through the USB bus.

[0051] Specifically, the existing network analyzer supports exporting test data through a USB protocol, which provides a possibility for subsequent data analysis and processing of the upper computer. The to-be-tested board card is connected to the network analyzer through an SMA (Sub-Miniature-A) coaxial shielded wire, and the upper computer is connected to the network analyzer through a USB bus. In this embodiment, the test data of the network analyzer is directly acquired through the USB bus without changing the existing hardware, and no cost is increased.

[0052] As Figure 1 shown, the automatic processing method for satellite signal reflection loss further comprises the following steps:

[0053] In step S200, the preset standard data is acquired, the test data is compared with the standard data, and a comparison result is obtained.

[0054] Specifically, the existing technology is that the circuit board R&D personnel need to distinguish the test data according to experience, which greatly increases the workload of the R&D personnel and requires higher technical ability of the R&D personnel. In the embodiment, the host computer stores the standard data, and when testing, the test data only needs to be compared with the pre-stored standard data to obtain the comparison result, so that the rectification suggestion can be proposed according to the comparison result. In an embodiment, the standard data can be standard data set according to an industry standard.

[0055] In an implementation manner, the standard data is standard numerical value based on a Smith chart, and the test data includes all test data point numerical values corresponding to test points on the to-be-tested board card. The step S200 specifically includes:

[0056] In step S210, the plurality of test data point numerical values are saved into an array.

[0057] In step S220, the standard numerical value based on the Smith chart is acquired, all test data point numerical values in the array are traversed, each test data point numerical value is compared with a corresponding standard numerical value, and a comparison result is obtained.

[0058] Specifically, the Smith chart is a calculation graph in which a normalized input impedance (or admittance) equal value circle family is plotted on a reflection system plane, and is mainly applied to impedance matching of a transmission line. In the embodiment, when the to-be-tested board card is tested, the test data obtained is a plurality of test data point numerical values corresponding to a test point, such as 1024 test data point numerical values. Of course, the standard data also includes 1024 standard numerical values, so that each test data point numerical value can be compared with a corresponding standard numerical value to obtain a comparison result.

[0059] In an embodiment, the standard numerical value includes a standard abscissa numerical value and a standard ordinate numerical value, and the standard abscissa numerical value and the standard ordinate numerical value correspond to each other; each test data point numerical value includes a test abscissa numerical value and a test ordinate numerical value, and the test abscissa numerical value and the test ordinate numerical value correspond to each other. For example, the standard numerical value can be represented as (X1, Y1), (X2, Y2), and the like, and the test data point numerical value can be represented as (x1, y1), (x2, y2), and the like.

[0060] The step S220 specifically includes:

[0061] Step S221, searching for a standard value based on the Smith chart according to the test abscissa value, and determining a target standard abscissa value same as the test abscissa value;

[0062] Step S222, obtaining a target standard ordinate value corresponding to the target standard abscissa value.

[0063] Step S223, comparing the test ordinate value with the target standard ordinate value.

[0064] Specifically, when performing the comparison, the embodiment is by fixing the abscissa value and comparing the ordinate values. Of course, the comparison can also be performed by fixing the ordinate value and comparing the abscissa values. That is, the abscissa value of the test data of the test point is consistent with the standard abscissa value on the Smith chart, that is, if the standard value is (X1, Y1) and the test data point value is (x1, y1), then X1 is same as x1, and the sizes of Y1 and y1 are compared.

[0065] As shown in Figure 1 The automatic processing method of the satellite signal reflection loss further includes the following steps:

[0066] Step S300, generating electrical parameter adjustment information of the to-be-tested board card according to the comparison result.

[0067] Specifically, the embodiment realizes file reading, data analysis, model matching, data output and other functions through the powerful processing capability of the host computer.

[0068] In an implementation manner, the step S300 specifically includes: if the test ordinate value is greater than the target standard ordinate value, generating an increase capacitance information; and if the test ordinate value is less than the target standard ordinate value, generating a decrease capacitance information.

[0069] Specifically, after reading the test data, the host computer of the embodiment gives an analysis suggestion, and the user increases rectification measures according to the analysis suggestion to complete the correction. The embodiment automatically analyzes and generates rectification suggestions through the host computer, avoids the subjectivity of the technicians, and prevents the problem of judgment errors caused by insufficient experience of the technicians.

[0070] In an embodiment, the step S300 further includes: if the test ordinate value is equal to the target standard ordinate value, saving the test data and generating a keep capacitance information.

[0071] Specifically, the comparison result of the embodiment has three kinds. If the test ordinate value is equal to the target standard ordinate value, it indicates that the satellite signal reflection loss of the to-be-tested board card meets the standard, and no modification is needed. If the test ordinate value is greater than the target standard ordinate value, it indicates that the satellite signal reflection loss of the to-be-tested board card does not meet the standard, and the capacitance needs to be increased so that the satellite signal reflection loss meets the standard. If the test ordinate value is less than the target standard ordinate value, it also indicates that the satellite signal reflection loss of the to-be-tested board card does not meet the standard, and the capacitance needs to be reduced so that the satellite signal reflection loss meets the standard.

[0072] Of course, other electrical parameters can also be adjusted to meet the standard, such as adjusting the resistance and inductance.

[0073] In an implementation manner, the step S300 further includes displaying electrical parameter adjustment information of the to-be-tested board card.

[0074] Specifically, the electrical parameter adjustment information can be displayed on the GUI interface of the host computer, the operation logic is clear, and man-machine interaction is realized.

[0075] In this way, for the existing test and adjustment of the TV satellite receiving signal reflection loss, based on the test result of the network analyzer, the researchers need to judge by themselves and then increase the modification measures according to the experience value. On the one hand, the actual experience of the researchers has a higher requirement, and experimental errors caused by objective conditions such as experimental environment are also unavoidable. The present application can be based on the existing hardware equipment without adding additional hardware circuit. The host computer software is connected to the network analyzer through the USB cable, the program is automatically run to realize the automatic measurement and correction of the TV board card satellite signal reflection loss, so as to reduce the working intensity of the researchers and improve the stability of the test result.

[0076] A specific embodiment is listed below for description.

[0077] Embodiment one:

[0078] The network analyzer is connected with the host computer through the USB bus, the network analyzer transmits the test data to the host computer through the USB bus, the host computer analyzes the data, and the host computer stores an automatic processing program of the satellite signal reflection loss. The data measured by the network analyzer can be analyzed and compared with the standard Smith chart, and an analysis and modification suggestion is given according to the model comparison result.

[0079] The automatic processing program of the satellite signal reflection loss is as shown in Figure 2 , and includes:

[0080] Step S1, the host computer runs the program and waits for the USB device to be inserted;

[0081] Step S2, detecting whether there is a device connected to the USB port; if yes, executing step S3; if no, continuing to wait;

[0082] Step S3, detecting whether there is data reading; if yes, executing step S4; if no, continuing to wait for data reading;

[0083] Step S4, detecting whether the data reading is completed; if yes, executing step S5; if no, entering a loop of reading data until the data reading is completed;

[0084] Step S5, detecting whether the data is the same as the standard data of the standard Smith chart; if not, executing step S6; if yes, executing step S7;

[0085] Specifically, the data starts to be compared, the obtained data is stored in an array, the data in the array is traversed, and a judgment is made according to the standard Smith chart;

[0086] Step S6, detecting whether the data is greater than the standard data; specifically, comparing the test data point a (x1, y1) with the Smith chart data A (X1, Y1) to judge the value of y1 and Y1; if y1 > Y1, a suggestion of reducing the capacitance C is given; if y1 < Y1, a suggestion of reducing the capacitance C is given;

[0087] Step S7, saving the data and giving a suggestion of keeping the capacitance C unchanged;

[0088] Step S8, ending the program; the user can adjust the parameters of the circuit board according to the system suggestion.

[0089] The embodiment can automatically complete the satellite signal reflection loss automatic measurement and correction in a very simple way. The above program design method can improve the test precision by increasing the number of collected data, reduce the test cycle times, and improve the work efficiency.

[0090] In one embodiment, as shown in Figure 3 Based on the above automatic processing method of satellite signal reflection loss, the application also correspondingly provides an automatic processing device of satellite signal reflection loss, which comprises:

[0091] An acquisition module 100 is configured to acquire test data when a network analyzer detects the satellite signal reflection loss of a to-be-tested board card and obtains the corresponding test data;

[0092] A comparison module 200 is configured to acquire preset standard data, compare the test data with the standard data, and obtain a comparison result;

[0093] A generation module 300 is configured to generate electrical parameter adjustment information of the to-be-tested board card according to the comparison result.

[0094] In one embodiment, as shown in Figure 4 Based on the automatic processing method of satellite signal reflection loss described above, the application also provides a terminal accordingly, which comprises a processor 10 and a memory 20. Figure 3 Only some components of the terminal are shown, but it should be understood that all the components shown are not required, and more or less components can be implemented instead.

[0095] The memory 20 can be an internal storage unit of the terminal in some embodiments, such as a hard disk or a memory of the terminal. The memory 20 can also be an external storage device of the terminal in other embodiments, such as a plug-in hard disk, a smart media card (SMC), a secure digital (SD) card, a flash card, etc. equipped on the terminal. Further, the memory 20 can include both the internal storage unit and the external storage device of the terminal. The memory 20 is used to store application software and various data installed on the terminal, such as program codes installed on the terminal, etc. The memory 20 can also be used to temporarily store data that has been output or will be output. In one embodiment, the memory 20 stores the automatic processing program 30 of satellite signal reflection loss, which can be executed by the processor 10 to implement the automatic processing method of satellite signal reflection loss in the application.

[0096] The processor 10 can be a central processing unit (CPU), a microprocessor or other data processing chip in some embodiments, which is used to run program codes or process data stored in the memory 20, such as to execute the automatic processing method of satellite signal reflection loss, etc.

[0097] In one embodiment, the following steps are implemented when the processor 10 executes the automatic processing program 30 of satellite signal reflection loss in the memory 20:

[0098] When the network analyzer detects the satellite signal reflection loss of the to-be-tested board card and obtains corresponding test data, the test data is acquired;

[0099] The preset standard data is acquired, the test data is compared with the standard data, and a comparison result is obtained;

[0100] The electrical parameter adjustment information of the to-be-tested board card is generated according to the comparison result.

[0101] The to-be-tested board card is connected with the network analyzer through an SMA coaxial shielded wire; when the network analyzer detects satellite signal reflection loss of the to-be-tested board card and obtains corresponding test data, the test data is acquired, including:

[0102] A communication connection is established with the network analyzer in advance through a USB bus;

[0103] When the network analyzer detects satellite signal reflection loss of the to-be-tested board card and obtains corresponding test data, the test data is acquired through the USB bus.

[0104] The standard data is a standard value based on a Smith chart, and the test data includes all test data point values corresponding to test points on the to-be-tested board card; the preset standard data is acquired, the test data is compared with the standard data, and a comparison result is obtained, including:

[0105] The plurality of test data point values are saved into an array;

[0106] The standard value based on the Smith chart is acquired, all test data point values in the array are traversed, each test data point value is compared with a corresponding standard value, and a comparison result is obtained.

[0107] The standard value includes a standard abscissa value and a standard ordinate value, and the standard abscissa value and the standard ordinate value correspond to each other; each test data point value includes a test abscissa value and a test ordinate value, and the test abscissa value and the test ordinate value correspond to each other;

[0108] The standard value based on the Smith chart is acquired, all test data point values in the array are traversed, each test data point value is compared with a corresponding standard value, and a comparison result is obtained, including:

[0109] According to the test abscissa value, a target standard abscissa value same as the test abscissa value is searched based on the Smith chart;

[0110] A target standard ordinate value corresponding to the target standard abscissa value is acquired;

[0111] The test ordinate value is compared with the target standard ordinate value in size.

[0112] According to the comparison result, electrical parameter adjustment information of the to-be-tested board card is generated, including:

[0113] If the test ordinate value is greater than the target standard ordinate value, increasing capacitance information is generated;

[0114] If the test ordinate value is less than the target standard ordinate value, generating a decrease capacitance information.

[0115] According to the comparison result, generating the electrical parameter adjustment information of the to-be-tested board card, further comprising:

[0116] If the test ordinate value is equal to the target standard ordinate value, saving the test data and generating a keep capacitance information.

[0117] After generating the electrical parameter adjustment information of the to-be-tested board card according to the comparison result, further comprising:

[0118] Displaying the electrical parameter adjustment information of the to-be-tested board card.

[0119] The application further provides a computer readable storage medium, which stores a computer program capable of being executed to implement the steps of the automatic processing method of satellite signal reflection loss.

[0120] To sum up, the application discloses an automatic processing method and device of satellite signal reflection loss, the method comprising: when a network analyzer detects satellite signal reflection loss of a to-be-tested board card and obtains corresponding test data, acquiring the test data; acquiring preset standard data, comparing the test data with the standard data to obtain a comparison result; and generating electrical parameter adjustment information of the to-be-tested board card according to the comparison result. The application acquires test data of a network analyzer by a host computer, and automatically compares the test data with standard data to generate electrical parameter adjustment information of the to-be-tested board card, so that circuit board researchers do not need to adjust electrical parameters according to experience, and workload is reduced.

[0121] It should be understood that the application of the application is not limited to the above examples, and can be improved or changed according to the above description for those skilled in the art, and all these improvements and changes should belong to the protection scope of the appended claims of the application.

Claims

1. A method for automatic processing of satellite signal reflection loss, characterized in that, The method comprises the steps of: When the network analyzer detects the satellite signal reflection loss of the to-be-tested board card and obtains corresponding test data, the test data is acquired; The preset standard data is acquired, the test data is compared with the standard data, and a comparison result is obtained; According to the comparison result, the electrical parameter adjustment information of the to-be-tested board card is generated; The standard data is a standard value based on a Smith chart, and the test data includes all test data point values corresponding to test points on the to-be-tested board card; The preset standard data is acquired, the test data is compared with the standard data, and a comparison result is obtained, which comprises the steps of: The plurality of test data point values are saved in an array; The standard value based on the Smith chart is acquired, all test data point values in the array are traversed, each test data point value is compared with a corresponding standard value, and a comparison result is obtained; The standard value includes a standard abscissa value and a standard ordinate value, and the standard abscissa value and the standard ordinate value are one-to-one corresponding; each test data point value includes a test abscissa value and a test ordinate value, and the test abscissa value and the test ordinate value are one-to-one corresponding; The standard value based on the Smith chart is acquired, all test data point values in the array are traversed, each test data point value is compared with a corresponding standard value, and a comparison result is obtained, which comprises the steps of: The test abscissa value is used to search for the standard value based on the Smith chart, and a target standard abscissa value same as the test abscissa value is determined; A target standard ordinate value corresponding to the target standard abscissa value is acquired; The test ordinate value is compared with the size of the target standard ordinate value.

2. The method of claim 1, wherein, The to-be-tested board card is connected with the network analyzer through an SMA coaxial shielded wire; when the network analyzer detects the satellite signal reflection loss of the to-be-tested board card and obtains corresponding test data, the test data is acquired, which comprises the steps of: A communication connection with the network analyzer is established in advance through a USB bus; When the network analyzer detects the satellite signal reflection loss of the to-be-tested board card and obtains corresponding test data, the test data is acquired through the USB bus.

3. The method of claim 1, wherein the satellite signal reflection loss is automatically processed by: According to the comparison result, the electrical parameter adjustment information of the to-be-tested board card is generated, which comprises the steps of: If the test ordinate value is greater than the target standard ordinate value, increasing capacitance information is generated; If the test ordinate value is less than the target standard ordinate value, decreasing capacitance information is generated.

4. The method of claim 1, wherein, According to the comparison result, the electrical parameter adjustment information of the to-be-tested board card is generated, which further comprises the steps of: If the test ordinate value is equal to the target standard ordinate value, the test data is saved, and the capacitance information is kept.

5. The method of claim 1, wherein, After the electrical parameter adjustment information of the to-be-tested board card is generated according to the comparison result, the electrical parameter adjustment information of the to-be-tested board card is displayed. The method comprises the steps of:

6. An apparatus for automatic processing of satellite signal reflection loss, characterized in that, When the network analyzer detects the satellite signal reflection loss of the to-be-tested board card and obtains corresponding test data, the test data is acquired; ​ The comparison module is used to acquire preset standard data, compare the test data with the standard data, and obtain the comparison result; The generation module is used to generate electrical parameter adjustment information for the board under test based on the comparison results; The standard data are standard values ​​based on the Smith chart, and the test data includes the values ​​of all test data points corresponding to the test points on the board under test. The step of acquiring preset standard data and comparing the test data with the standard data to obtain a comparison result includes: Save the values ​​of multiple test data points to an array; Obtain the standard values ​​based on the Smith chart, iterate through all the test data point values ​​in the array, compare each test data point value with the corresponding standard value, and obtain the comparison results. The standard values ​​include standard horizontal coordinate values ​​and standard vertical coordinate values, and the standard horizontal coordinate values ​​and standard vertical coordinate values ​​correspond one-to-one; each of the test data point values ​​includes test horizontal coordinate values ​​and test vertical coordinate values, and the test horizontal coordinate values ​​and test vertical coordinate values ​​correspond one-to-one. The step of obtaining the standard values ​​based on the Smith chart involves iterating through all test data point values ​​in the array, comparing each test data point value with its corresponding standard value, and obtaining the comparison results, including: Based on the test x-axis value, find the standard value based on the Smith chart, and determine the target standard x-axis value that is the same as the test x-axis value; Obtain the target standard ordinate value corresponding to the target standard abscissa value; The test ordinate value is compared with the target standard ordinate value.

7. A terminal, characterized by comprising: include: The system includes a memory, a processor, and an automatic processing program for satellite signal reflection loss stored in the memory and executable on the processor. When executed by the processor, the automatic processing program for satellite signal reflection loss implements the steps of the automatic processing method for satellite signal reflection loss as described in any one of claims 1 to 5.

8. A computer-readable storage medium, characterized in that, The computer-readable storage medium stores a computer program that can be executed to implement the steps of the automatic processing method for satellite signal reflection loss as described in any one of claims 1 to 5.

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