An automatic calibration method and system for a contact detection fixture

Abstract

The present invention discloses an automatic calibration method and system for a contact detection fixture. An automatic calibration method for a contact detection fixture includes the following steps: obtaining the safety height value Zf of the contact detection fixture; obtaining the height value Zt when the contact detection fixture contacts the metal conduction plate; after the contact detection fixture is lifted to the safety height value Zf, obtaining the distance measurement value Z1 from the laser rangefinder to the metal conduction plate; after the contact detection fixture is lifted to the safety height value Zf, obtaining the distance measurement value Z2 from the laser rangefinder to the working platform; the actual distance between the contact detection fixture and the working platform is L1, and L1 = Z2 - Z1 + Zf - Zt. The automatic calibration method and system for the contact detection fixture of the present invention calculate the actual distance L1 between the contact detection fixture and the working platform through the above detection data, and thus can achieve accurate calibration of the height position between the contact detection fixture and the working platform, improving the accuracy and safety of equipment production.

Description

Technical Field

[0001] The present invention relates to the field of fixture detection, and specifically to an automatic calibration method and system for a contact detection fixture. Background Art

[0002] In the liquid crystal panel industry, it is necessary to perform open circuit detection or other detections on the circuits on the glass through a contact detection fixture; since it is a contact detection, it is necessary to accurately know the relationship between the contact detection fixture and the equipment working platform; there are differences in the glass circuits of different varieties, and the equipment needs to replace different contact detection fixtures correspondingly.

[0003] Due to the differences in the processing or installation of the contact detection fixture, it is impossible to ensure that the contact detection fixture is exactly the same every time it is replaced. Therefore, it is necessary to calibrate the contact detection fixture. However, for the frequent replacement of the contact detection fixture, if each calibration relies on manual calibration, it is extremely cumbersome, and the accuracy is greatly affected by human subjective factors, and it is difficult to achieve accurate calibration.

[0004] Some existing methods are to measure the distance between a fixed device and an object. For such a measuring mechanism, there are the following defects: 1. It measures the distance from the laser rangefinder to the equipment platform, rather than the accurate distance between the actual processing fixture and the equipment platform; 2. For some relatively small objects, such as the metal probes of the contact detection fixture in the liquid crystal industry, whose diameter is in the order of micrometers, it is impossible to directly measure the distance with a laser rangefinder.

[0005] For some precision machining or measurement industries, the fixtures on the equipment need to be continuously replaced, and the fixture has a small volume and high precision. For such an equipment mechanism, the traditional single measurement method can no longer meet the requirements. Therefore, it is an urgent problem for those skilled in the art to develop an automatic calibration method for a contact detection fixture. Summary of the Invention

[0006] The purpose of the present invention is to provide an automatic calibration method and system for a contact detection fixture to solve the problems raised in the above background art.

[0007] To achieve the above purpose, the present invention provides the following technical solutions:

[0008] An automatic calibration method for a contact detection fixture includes the following steps:

[0009] Obtain the safety height value Zf of the contact detection fixture;

[0010] Obtain the height value Zt when the contact detection fixture contacts the metal conduction plate;

[0011] After the contact detection fixture is lifted to the safety height value Zf, obtain the distance measurement value Z1 from the laser rangefinder to the metal conduction plate;

[0012] After the contact detection fixture is lifted to the safe height value Zf, obtain the distance measurement value Z2 from the laser rangefinder to the working platform;

[0013] The actual distance between the contact detection fixture and the working platform is L1,

[0014] L1 = Z2 - Z1 + Zf - Zt.

[0015] As a further solution of the present invention: obtaining the height value Zt when the contact detection fixture contacts the metal conduction plate further includes:

[0016] When the contact detection fixture contacts the metal conduction plate, the circuit detector detects a short - circuit signal, then slowly lift the contact detection fixture, and at the moment when the circuit detector fails to detect a short - circuit signal, record the height value Zt of its feedback position.

[0017] The present invention also provides a contact detection fixture automatic calibration system, and the calibration system is based on the above - mentioned automatic calibration method, including:

[0018] X - direction motion mechanism: arranged above the working platform and moving in the X - direction;

[0019] Y - direction motion mechanism, slidably installed on the X - direction motion mechanism along the Y - direction;

[0020] Z - direction motion mechanism, slidably installed on the Y - direction motion mechanism along the Z - direction;

[0021] The X - direction motion mechanism, Y - direction motion mechanism, and Z - direction motion mechanism are all provided with encoder feedback devices for feeding back their displacement amounts;

[0022] Contact detection fixture, fixedly installed on the Z - direction motion mechanism and moving synchronously with the Z - direction motion mechanism;

[0023] Laser rangefinder, fixedly installed on the Y - direction motion mechanism;

[0024] Circuit detection instrument, fixedly installed on the X - direction motion mechanism, and used to detect short - circuit or open - circuit information when the contact detection fixture contacts or separates from the object to be measured;

[0025] Metal conduction plate, arranged beside the working platform, and when the contact detection fixture contacts the metal conduction plate, the circuit detection instrument can detect short - circuit information;

[0026] Equipment working platform, used for placing the glass to be detected.

[0027] Compared with the prior art, the beneficial effects of the present invention are:

[0028] Automatic calibration method and system for a contact detection fixture of the present invention. By setting a metal conduction plate on one side of the working platform and an X, Y, Z-direction movement mechanism above the working platform, and the above movement mechanism can feedback the displacement through an encoder feedback device. At the same time, a laser rangefinder is installed on the Y movement mechanism, and the contact detection fixture is fixed on the Z-direction movement mechanism. By obtaining the safety height value Zf of the contact detection fixture; obtaining the height value Zt when the contact detection fixture contacts the metal conduction plate; after keeping the contact detection fixture lifted to the safety height value Zf, obtaining the distance measurement value Z1 from the laser rangefinder to the metal conduction plate; after keeping the contact detection fixture lifted to the safety height value Zf, obtaining the distance measurement value Z2 from the laser rangefinder to the working platform; and calculating the actual distance L1 between the contact detection fixture and the working platform through the above detection data, thus enabling accurate calibration of the height position between the contact detection fixture and the working platform, greatly reducing the calibration error, saving time, improving production efficiency, and at the same time improving the accuracy and safety of equipment production. BRIEF DESCRIPTION OF THE DRAWINGS

[0029] Figure 1 It is a schematic structural diagram of an automatic calibration system for a contact detection fixture;

[0030] In the figure: X-direction movement mechanism 1, Y-direction movement mechanism 2, Z-direction movement mechanism 3, contact detection fixture 4, laser rangefinder 5, circuit detection instrument 6, metal conduction plate 7, working platform 8, glass to be detected 9. DETAILED DESCRIPTION OF THE EMBODIMENTS

[0031] To describe in detail the technical content, structural features, achieved objectives and effects of the technical solution, the following is described in detail in conjunction with specific embodiments and with reference to the accompanying drawings.

[0032] In this embodiment, an automatic calibration method for a contact detection fixture includes the following steps:

[0033] Obtain the safety height value Zf of the contact detection fixture 4;

[0034] Obtain the height value Zt when the contact detection fixture 4 contacts the metal conduction plate 7;

[0035] After keeping the contact detection fixture 4 lifted to the safety height value Zf, obtain the distance measurement value Z1 from the laser rangefinder 5 to the metal conduction plate 7;

[0036] After keeping the contact detection fixture 4 lifted to the safety height value Zf, obtain the distance measurement value Z2 from the laser rangefinder 5 to the working platform 8;

[0037] The actual distance between the contact detection fixture 4 and the working platform 8 is L1,

[0038] L1 = Z2 - Z1 + Zf - Zt.

[0039] Place the glass 9 to be detected on the working platform 8. The thickness of the glass 9 to be detected is H. Then the actual distance between the contact detection fixture 4 and the glass 9 to be detected is L2.

[0040] L2 = L1 - H = Z2 - Z1 + Zf - Zt - H.

[0041] In actual detection work, it is necessary to control the contact detection fixture 4 and the glass 9 to be detected to just come into contact, and then move downward a set distance D to ensure that the contact detection fixture 4 and the glass 9 are in full contact without damaging the glass. Then, during actual detection, the actual running distance of the contact detection fixture 4 is L3.

[0042] L3 = Zf - L2 - D = Zf - (L1 - H) - D = Zf - (Z2 - Z1 + Zf - Zt - H) - D.

[0043] Refer to Figure 1 , in another embodiment, a contact detection fixture 4 automatic calibration system based on the above automatic calibration method is further provided, including:

[0044] The X - direction movement mechanism 1 (equipped with an encoder feedback device), which can move along the X - direction above the working platform 8;

[0045] The Y - direction movement mechanism 2 (equipped with an encoder feedback device), which is installed on the X - direction movement mechanism 1 and can move along the Y - direction above the working platform 8;

[0046] The Z - direction movement mechanism 3, with the upward direction as the positive coordinate direction (equipped with an encoder feedback device), which is installed on the Y - direction movement mechanism 2 and can move up and down along the Z - direction;

[0047] The contact detection fixture 4, which is installed on the Z - direction movement mechanism 3 and rises and falls with the lifting of the Z - direction movement mechanism 3;

[0048] The laser rangefinder 5, which is installed on the Y - direction movement mechanism 2. By controlling the movement of the X - direction movement mechanism 1 and the Y - direction movement mechanism 2, the laser rangefinder 5 can reach above the object to be measured;

[0049] The circuit detection instrument 6, which is installed above the X - direction movement mechanism 1. After the contact detection fixture 4 and the object to be measured come into contact, the circuit detection instrument 6 can detect information such as open circuit and short circuit;

[0050] The metal conduction plate 7, which is installed beside the equipment working platform 8. When the contact detection fixture 4 and the metal conduction plate 7 come into contact, the circuit detection instrument 6 will detect short - circuit information;

[0051] The equipment working platform 8, on whose upper surface the glass 9 to be detected is placed.

[0052] It should be reminded that the X direction is the length direction of the working platform 8, the Y direction is the width direction of the working platform 8, and the Z direction is the height direction of the working platform 8.

[0053] When the system is in use,

[0054] Raise the Z-direction moving mechanism 3 to a safe position. Ensure that when the Z-direction moving mechanism 3 is in this position, the movement of the X-direction moving mechanism 1 and the Y-direction moving mechanism 2 will not interfere with other mechanisms. Teach and record the position Zf of the Z-direction moving mechanism 3 at this time, that is, the safe height value Zf of the contact detection fixture 4.

[0055] Keep the Z-direction moving mechanism 3 moving at the Zf height position, control the movement of the X-direction moving mechanism 1 and the Y-direction moving mechanism 2, so that the contact detection fixture 4 reaches directly above the metal conduction plate 7. Teach and record the position X1 of the X-direction moving mechanism 1 and the position Y1 of the Y-direction moving mechanism 2.

[0056] Keep the Z-direction moving mechanism 3 moving at the Zf height position, control the movement of the X-direction moving mechanism 1 and the Y-direction moving mechanism 2, so that the laser rangefinder 5 reaches directly above the metal conduction plate 7. Teach and record the position X2 of the X-direction moving mechanism 1 and the position Y2 of the Y-direction moving mechanism 2.

[0057] Keep the Z-direction moving mechanism 3 moving at the Zf height position, control the movement of the X-direction moving mechanism 1 and the Y-direction moving mechanism 2, so that the laser rangefinder 5 reaches directly above the equipment working platform 8. Teach and record the position X3 of the X-direction moving mechanism 1 and the position Y3 of the Y-direction moving mechanism 2.

[0058] The PC automatically moves the Z-direction moving mechanism 3 to a higher safe position Zf by using a pre-written program, ensuring that there is no interference between the horizontal movement of the mechanism and the metal conduction plate 7 and the equipment working platform 8.

[0059] Control the X-direction moving mechanism 1 to X1 and the Y-direction moving mechanism 2 to Y1, so that the contact detection fixture 4 is directly above the metal conduction plate 7.

[0060] The PC controls the Z-direction moving mechanism 3 to slowly descend until the circuit detection instrument 6 detects a short-circuit signal, and then stops the movement of the Z-direction moving mechanism 3.

[0061] Control the Z-direction moving mechanism 3 to slowly rise at a lower speed. At the moment when the circuit detection instrument 6 does not detect a short-circuit signal, record the feedback position Zt of the Z-direction moving mechanism 3.

[0062] Control the Z-direction movement mechanism 3 to move to the safe position Zf;

[0063] Control the X-direction movement mechanism 1 to X2 and the Y-direction movement mechanism 2 to Y2, so that the laser rangefinder 5 is directly above the metal conduction plate 7, and record the measured value Z1 of the laser rangefinder 5 at this time;

[0064] Keep the Z-direction movement mechanism 3 at the position of Zf unchanged, control the X-direction movement mechanism 1 to X3 and the Y-direction movement mechanism 2 to Y3, so that the laser rangefinder 5 is above the equipment working platform 8, and record the measured value Z2 of the laser rangefinder 5 at this time.

[0065] From this, it can be obtained that when the Z-direction movement mechanism 3 moves to Zf, the distance L1' between the lower surface of the contact detection fixture 4 and the metal conduction plate 7 is:

[0066] L1' = Zf - Zt;

[0067] The measured value of the laser rangefinder 5 at this time is Z1.

[0068] The height between the metal conduction plate 7 and the working platform 8 is L1”,

[0069] L1” = Z2 - Z1

[0070] When the Z-direction movement mechanism 3 remains at the position of Zf, the actual distance between the lower surface of the contact detection fixture 4 and the equipment working platform 8 is L1,

[0071] L1 = L1' + L1” = Z2 - Z1 + Zf - Zt

[0072] The thickness of the glass 9 to be detected placed on the working platform 8 is H, then the actual distance between the lower surface of the contact detection fixture 4 and the glass 9 to be detected is L2,

[0073] L2 = L1 - H = Z2 - Z1 + Zf - Zt - H

[0074] In actual detection work, it is necessary to control the contact detection fixture 4 and the glass 9 to be detected to just touch, and then run down a set distance D to ensure that the contact detection fixture 4 and the glass 9 to be detected are in full contact without damaging the glass. Then, during actual detection, the actual running distance of the contact detection fixture 4 is L3,

[0075] L3 = Zf - L2 - D = Zf - (L1 - H) - D = Zf - (Z2 - Z1 + Zf - Zt - H) - D.

[0076] It should be noted that in this text, relational terms such as first and second are only used to distinguish one entity or operation from another entity or operation, and do not necessarily require or imply any actual relationship or order between these entities or operations. Moreover, the term "comprising", "including" or any other variant thereof is intended to cover non-exclusive inclusion, so that a process, method, article or terminal device comprising a series of elements not only includes those elements, but also includes other elements not expressly listed, or further includes elements inherent to such process, method, article or terminal device. Without further limitation, elements defined by the statement "comprising..." or "including..." do not exclude the existence of additional elements in the process, method, article or terminal device comprising the said elements. In addition, in this text, "greater than", "less than", "exceeding", etc. are understood not to include the present number; "above", "below", "within", etc. are understood to include the present number.

[0077] Although the above embodiments have been described, those skilled in the art can make additional changes and modifications once they know the basic creative concept. Therefore, the above are only embodiments of the present invention, and do not limit the patent protection scope of the present invention. Any equivalent structure or equivalent process transformation made by using the content of the specification and drawings of the present invention, or directly or indirectly applied in other related technical fields, shall be included in the patent protection scope of the present invention by the same token.

Claims

1. An automatic calibration method for a contact detection fixture, characterized in that: Including the following steps: Obtain the safe height value Zf of the contact detection fixture; Obtain the height value Zt when the contact detection fixture contacts the metal conduction plate; After the contact detection fixture is lifted to the safe height value Zf, obtain the distance measurement value Z1 from the laser rangefinder to the metal conduction plate; After the contact detection fixture is lifted to the safe height value Zf, obtain the distance measurement value Z2 from the laser rangefinder to the working platform; The actual distance between the contact detection fixture and the working platform is L1, L1 = Z2 - Z1 + Zf - Zt.

2. The automatic calibration method of the contact detection fixture according to claim 1, wherein: The obtaining of the height value Zt when the contact detection fixture contacts the metal conduction plate further includes: When the contact detection fixture contacts the metal conduction plate, the circuit detector detects a short - circuit signal, then slowly lift the contact detection fixture, and record the height value Zt of its feedback position at the moment when the circuit detection instrument can no longer detect the short - circuit signal.

3. A contact detection fixture automatic calibration system, the calibration system being based on the automatic calibration method described in claim 1 or 2, characterized in that: Including: X - direction motion mechanism: arranged above the working platform and moving in the X - direction; Y - direction motion mechanism, slidably mounted on the X - direction motion mechanism along the Y - direction; Z - direction motion mechanism, slidably mounted on the Y - direction motion mechanism along the Z - direction; The X - direction motion mechanism, Y - direction motion mechanism, and Z - direction motion mechanism are all provided with encoder feedback devices for feedback of their displacement amounts; Contact detection fixture, fixedly installed on the Z - direction motion mechanism and moving synchronously with the Z - direction motion mechanism; Laser rangefinder, fixedly installed on the Y - direction motion mechanism; Circuit detection instrument, fixedly installed on the X - direction motion mechanism, used to detect short - circuit or open - circuit information when the contact detection fixture contacts or separates from the object to be measured; Metal conduction plate, arranged beside the working platform, and when the contact detection fixture contacts the metal conduction plate, the circuit detection instrument can detect short - circuit information; Equipment working platform, used to place the glass to be detected.

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