Laser spherical aberration observation method, device, equipment and storage medium

Abstract

The present invention discloses a method for observing laser spherical aberration, comprising: controlling a preset laser to process a preset material based on a preset process to obtain a material to be observed including various observation points; observing the material to be observed, and determining the spherical aberration of the preset laser based on the length of the modified point corresponding to each observation point. The present invention also discloses a laser spherical aberration observation device, apparatus, and computer-readable storage medium. The present invention can effectively observe the focal morphology of the laser after entering a denser medium, thereby analyzing the spherical aberration at the focal point, thereby improving the efficiency of spherical aberration observation and achieving better observation results.

Description

Technical Field

[0001] The present invention relates to the field of laser spherical aberration observation, and in particular to a laser spherical aberration observation method, device, equipment and storage medium. Background Art

[0002] Spherical aberration occurs when light rays of different apertures emitted from the same object point have different image-side intercept values ​​after refraction, resulting in concentric beams becoming non-concentric after refraction. When using lasers for internal processing of transparent or translucent materials, spherical aberration occurs when the laser enters the material from air. The magnitude of this spherical aberration is related to the material's refractive index and the depth of the laser's penetration. The greater the material's refractive index, the greater the spherical aberration; the deeper the laser's penetration, the greater the spherical aberration.

[0003] Due to the increase in spherical aberration, the laser energy at the laser focus will not be concentrated. Therefore, it is necessary to observe the spherical aberration when the laser enters the denser medium. The traditional method is generally to use a camera to observe the spherical aberration generated when the laser enters the denser medium. However, since the laser's action time after entering the denser medium is very short, generally at the picosecond level, this method is difficult to obtain effective observation results.

[0004] Therefore, it is necessary to propose a technical solution that can effectively observe the spherical aberration when the laser enters a dense medium. Summary of the Invention

[0005] The main purpose of the present invention is to provide a laser spherical aberration observation method, which aims to solve the technical problems of poor observation effect and low observation efficiency of existing means for observing spherical aberration generated when laser enters a dense medium.

[0006] To achieve the above object, the present invention provides a laser spherical aberration observation method, which comprises the following steps:

[0007] Based on a preset process, a preset laser is controlled to process a preset material to obtain a material to be observed including various observation points;

[0008] The material to be observed is observed, and the spherical aberration of the preset laser is determined based on the length of the modified point corresponding to each of the observation points.

[0009] Preferably, the step of controlling a preset laser to process a preset material based on a preset process to obtain the material to be observed including various observation points includes:

[0010] Controlling the preset laser to mark points in the preset material to form each of the observation points;

[0011] The preset materials forming each of the observation points are used as the materials to be observed.

[0012] Preferably, the step of controlling the preset laser to perform dotting in the preset material includes:

[0013] Setting the emission direction of the preset laser, and the movement direction and incident surface of the preset material, wherein the emission direction is perpendicular to the incident surface, and the movement direction is parallel to the incident surface;

[0014] The preset material is controlled to move in the moving direction, and the preset laser is emitted toward the incident surface based on the emission direction to perform dotting on the preset material.

[0015] Preferably, the laser spherical aberration observation method further includes:

[0016] Among the observation points, the intervals between adjacent observation points are the same.

[0017] Preferably, before the step of observing the material to be observed, the method further comprises:

[0018] An observation surface of the material to be observed is set, wherein the distances of the observation points relative to the observation surface are the same.

[0019] Preferably, the step of observing the material to be observed includes:

[0020] The preset microscope is controlled to perform observation based on the observation surface, wherein the lighting mode of the preset microscope is paraxial illumination.

[0021] Preferably, the laser spherical aberration observation method further includes:

[0022] The preset laser is a laser with a wavelength of 1064 nanometers, and the preset material is an acrylic plate.

[0023] In addition, to achieve the above-mentioned purpose, the present invention further provides a laser spherical aberration observation device, the laser spherical aberration observation device comprising:

[0024] A processing module, configured to control a preset laser to process a preset material based on a preset process, to obtain a material to be observed including various observation points;

[0025] The observation module is used to observe the material to be observed and determine the spherical aberration of the preset laser based on the length of the modified point corresponding to each observation point.

[0026] In addition, to achieve the above-mentioned purpose, the present invention also provides a laser spherical aberration observation device, which includes: a memory, a processor, and a laser spherical aberration observation program stored in the memory and runnable on the processor. When the laser spherical aberration observation program is executed by the processor, the steps of the laser spherical aberration observation method are implemented.

[0027] In addition, to achieve the above-mentioned purpose, the present invention also provides a computer-readable storage medium, on which a laser spherical aberration observation program is stored. When the laser spherical aberration observation program is executed by a processor, the steps of the laser spherical aberration observation method are implemented.

[0028] The laser spherical aberration observation method proposed in this invention processes a predetermined material using a predetermined laser according to a predetermined process, obtaining a material to be observed that includes various observation points. The material to be observed is then observed, and the spherical aberration of the predetermined laser is determined based on the length of the modified point corresponding to each observation point. This method effectively observes the focal morphology of the laser after entering an optically denser medium and analyzes the spherical aberration at the focal point, thereby improving the efficiency of spherical aberration observation and achieving better observation results. BRIEF DESCRIPTION OF THE DRAWINGS

[0029] Figure 1 Schematic diagram of the structure of a laser spherical aberration observation device in a hardware operating environment involved in an embodiment of the present invention;

[0030] Figure 2 Schematic diagram of the process of the first embodiment of the laser spherical aberration observation method of the present invention;

[0031] Figure 3 Schematic diagram of a module of a laser spherical aberration observation device according to an embodiment of the present invention;

[0032] Figure 4 Schematic diagram of observation results in one embodiment of the laser spherical aberration observation method of the present invention;

[0033] Figure 5 Schematic diagram comparing the spherical aberration formed at different lengths of the modified point in one embodiment of the laser spherical aberration observation method of the present invention.

[0034] The purpose, features and advantages of the present invention will be further described with reference to the accompanying drawings and in conjunction with the embodiments. DETAILED DESCRIPTION

[0035] It should be understood that the specific embodiments described herein are only used to explain the present invention and are not intended to limit the present invention.

[0036] like Figure 1 As shown, Figure 1 It is a structural diagram of a laser spherical aberration observation device in a hardware operating environment involved in an embodiment of the present invention.

[0037] The terminal in the embodiment of the present invention may be a PC, or may be a mobile terminal device with a display function, such as a smart phone, a tablet computer, or a portable computer.

[0038] like Figure 1 As shown, the laser spherical aberration observation device may include: a processor 1001, such as a CPU, a network interface 1004, a user interface 1003, a memory 1005, and a communication bus 1002. Among them, the communication bus 1002 is used to realize the connection and communication between these components. The user interface 1003 may include a display screen (Display), an input unit such as a keyboard (Keyboard), and the user interface 1003 may also include a standard wired interface and a wireless interface. The network interface 1004 may optionally include a standard wired interface and a wireless interface (such as a WI-FI interface). The memory 1005 may be a high-speed RAM memory, or a stable memory (non-volatile memory), such as a disk memory. The memory 1005 may also be a storage device independent of the aforementioned processor 1001.

[0039] Optionally, the laser spherical aberration observation device may further include a camera, an RF (Radio Frequency) circuit, a sensor, an audio circuit, a WiFi module, etc. Sensors such as light sensors, motion sensors, and other sensors are not described in detail here.

[0040] Those skilled in the art will understand that Figure 1 The terminal structure shown in does not constitute a limitation on the laser spherical aberration observation device, and may include more or fewer components than shown in the figure, or a combination of certain components, or a different arrangement of components.

[0041] like Figure 1 As shown, the memory 1005 as a computer storage medium may include an operating system, a network communication module, a user interface module, and a laser spherical aberration observation program.

[0042] exist Figure 1 In the laser spherical aberration observation device shown, the network interface 1004 is mainly used to connect to the background server and communicate data with the background server; the user interface 1003 is mainly used to connect to the client (user end) and communicate data with the client; and the processor 1001 can be used to call the laser spherical aberration observation program stored in the memory 1005.

[0043] In this embodiment, the laser spherical aberration observation device includes: a memory 1005, a processor 1001, and a laser spherical aberration observation program stored in the memory 1005 and executable on the processor 1001, wherein when the processor 1001 calls the laser spherical aberration observation program stored in the memory 1005, the steps of the laser spherical aberration observation method in each of the following embodiments are executed.

[0044] The present invention also provides a laser spherical aberration observation method, referring to Figure 2 , Figure 2 Schematic diagram of the flow chart of the first embodiment of the laser spherical aberration observation method of the present invention.

[0045] In this embodiment, the method includes the following steps:

[0046] Step S101, controlling a preset laser to process a preset material based on a preset process to obtain a material to be observed including various observation points;

[0047] It should be noted that when light rays of different apertures emitted from the same object point have different image intercept values ​​after refraction, it means that spherical aberration has occurred. Spherical aberration will cause the concentric light beams to no longer be concentric light beams after refraction.

[0048] In this embodiment, in order to observe the spherical aberration of the laser, it is first necessary to determine a preset laser and a preset material, and then control the preset laser to process the preset material according to a preset process. For example, the preset laser is a laser with a wavelength of 1064nm, and the pulse energy of the laser is fixed. The preset material is an acrylic plate with good light transmittance. According to the preset process, the 1064nm wavelength laser is controlled to mark points at a certain interval in the acrylic plate to form various observation points in the acrylic plate. The preset process includes: setting a fixed movement direction and incident surface of the acrylic plate, controlling the acrylic plate to move at a uniform speed along the movement direction, and making the emission direction of the laser emitter perpendicular to the incident surface, controlling the laser emitter to emit a 1064nm wavelength laser at a certain time interval to form observation points at a certain depth of the incident surface of the acrylic plate. Since the movement direction of the acrylic plate is fixed, the various observation points are arranged in a straight line, and there is a certain interval between adjacent observation points. Finally, the acrylic plate with various observation points is used as the material to be observed, so that the material to be observed can be observed through a microscope later.

[0049] Step S102: observing the material to be observed, and determining the spherical aberration of the preset laser based on the length of the modified point corresponding to each of the observation points.

[0050] In this embodiment, after obtaining the material to be observed including various observation points, the length of the modified point corresponding to each observation point can be obtained by observing it, thereby analyzing the spherical aberration of the preset laser through the length of the modified point corresponding to each observation point. Figure 5 , Figure 5 The following is a schematic diagram comparing the spherical aberration generated by modified points at different lengths. For example, a laser with a wavelength of 1064 nm is preset, the material to be observed is an acrylic plate including various observation points, and the microscope used for observation is a high-power optical microscope. First, the observation surface of the acrylic plate needs to be determined. To achieve better observation results, this observation surface is perpendicular to the incident surface and parallel to the direction of motion, so that each observation point is at the same distance from the observation surface. Therefore, before performing the preset process, the direction of motion can be parallel to any edge of the incident surface of the acrylic plate. If the acrylic plate is a rectangular parallelepiped or a cube, the other side connected to the edge is the observation surface. Second, the acrylic plate is placed on the stage of a high-power optical microscope, so that the microscope observes it through the observation surface, that is, observes each observation point from the side. The shape of the modified point at the internal focus of the laser at each observation point can be observed, and the length of the modified point corresponding to each observation point can be obtained. Through analysis, the final result is: when the laser pulse energy remains unchanged, the longer the modified point, the greater the spherical aberration; the shorter the modified point, the smaller the spherical aberration.

[0051] In this embodiment, a predetermined laser is controlled based on a predetermined process to process a predetermined material, obtaining a material to be observed, including various observation points. The material to be observed is then observed, and the spherical aberration of the predetermined laser is determined based on the length of the modified point corresponding to each observation point. This effectively observes the focal morphology of the laser after entering an optically denser medium and analyzes the spherical aberration at the focal point, thereby improving the efficiency of spherical aberration observation and achieving better observation results.

[0052] Based on the first embodiment, a second embodiment of the laser spherical aberration observation method of the present invention is proposed. In this embodiment, step S101 includes:

[0053] Step S201, controlling the preset laser to mark points in the preset material to form the observation points;

[0054] Step S202 : using the preset materials forming the respective observation points as the materials to be observed.

[0055] In this embodiment, in order to obtain the material to be observed including various observation points, it is first necessary to control the preset laser to process the preset material according to the preset process, that is, to control the preset laser to make dots in the preset material according to the preset process to form various observation points, and then use the preset material to form various observation points as the material to be observed.

[0056] Specifically, the preset laser is a laser with a wavelength of 1064nm, the pulse energy of the laser is fixed, and the preset material is an acrylic plate with good light transmittance. According to the preset process, the emission direction of the laser, as well as the movement direction and incident surface of the acrylic plate are first set. The emission direction of the laser is perpendicular to the incident surface, and the movement direction of the acrylic plate is parallel to the incident surface. Then, the acrylic plate is controlled to move in the movement direction, and the laser is emitted toward the incident surface of the acrylic plate according to the emission direction to form various observation points. Then, the acrylic plate forming each observation point is used as the material to be observed.

[0057] Furthermore, the method of controlling the preset laser to perform dotting in the preset material comprises the following specific steps:

[0058] Step S301, setting the emission direction of the preset laser, and the movement direction and incident surface of the preset material, wherein the emission direction is perpendicular to the incident surface, and the movement direction is parallel to the incident surface;

[0059] Step S302 : controlling the preset material to move in the movement direction, and emitting the preset laser toward the incident surface based on the emission direction, so as to dot the preset material.

[0060] In this embodiment, a laser with a wavelength of 1064nm is discontinuously emitted to the incident surface of the acrylic plate by a laser emitter, and the emission direction of the laser is perpendicular to the incident surface. At the same time, the acrylic plate is controlled to move at a uniform speed along the movement direction, thereby forming an observation point on the incident surface of the acrylic plate. Since the movement direction of the acrylic plate is fixed and the movement is uniform, the laser emitted by the laser emitter is discontinuous and the energy of the laser pulse emitted each time is unchanged. Therefore, the various observation points are arranged in a straight line, and the depth of each observation point relative to the incident surface is the same. Finally, the acrylic plate with various observation points is used as the material to be observed, so that the material to be observed can be observed later.

[0061] In this embodiment, the emission direction of the preset laser, the movement direction of the preset material, and the incident surface are set, wherein the emission direction is perpendicular to the incident surface and the movement direction is parallel to the incident surface; the preset material is controlled to move in the movement direction, and the preset laser is emitted toward the incident surface based on the emission direction to dot the preset material. This allows for subsequent observation of the material to be observed, effectively observing the focal morphology of the laser after entering the optically denser medium, and analyzing the spherical aberration at the focal point. This ultimately improves the efficiency of spherical aberration observation and achieves better observation results.

[0062] Furthermore, the laser spherical aberration observation method further includes:

[0063] Step S401: Among the observation points, the intervals between adjacent observation points are the same.

[0064] In this embodiment, according to the above-mentioned steps of discontinuously emitting a laser with a wavelength of 1064nm to the incident surface of the acrylic plate by a laser emitter to form each observation point, a time can also be set to control the laser emitter to emit the laser with a wavelength of 1064nm according to the time, so that in each observation point formed subsequently, the intervals between adjacent observation points are the same. For example, the laser emitter is used to emit a laser with a wavelength of 1064nm to the incident surface of the acrylic plate at a regular interval, and the acrylic plate moves at a uniform speed in the direction of movement, thereby forming each observation point with the same interval between adjacent observation points. The interval can be about 50μm. Due to actual errors, there can be a certain floating value.

[0065] In this embodiment, the intervals between adjacent observation points are the same among the observation points. When observing each observation point later, the intervals can effectively prevent interference between the observation points, thereby achieving a better observation effect.

[0066] In this embodiment, the predetermined laser is controlled to create dots in the predetermined material to form observation points. The predetermined material forming each observation point serves as the material to be observed. This provides multiple samples for subsequent observations, allowing for effective observation of the focal morphology of the laser after entering the optically denser medium, and analysis of the spherical aberration at the focal point. This ultimately improves the efficiency of spherical aberration observation and achieves better observation results.

[0067] Based on the first embodiment, a third embodiment of the laser spherical aberration observation method of the present invention is proposed. In this embodiment, before step S102, the method further includes:

[0068] Step S501 : setting an observation surface of the material to be observed, wherein the distances of the observation points relative to the observation surface are the same.

[0069] In this embodiment, the material to be observed is an acrylic plate including various observation points. Before observing the material to be observed, it is necessary to determine the observation surface of the material to be observed. In order to achieve a better observation effect, the distance between each observation point and the observation surface should be the same. Therefore, the observation surface should be perpendicular to the incident surface and parallel to the direction of movement.

[0070] Specifically, before performing the preset process, the movement direction of the acrylic plate can be determined so that the movement direction is parallel to any edge of the incident surface of the acrylic plate, and ensure that the acrylic plate is a rectangular parallelepiped or a cube. After forming each observation point according to the preset process, the other side connected to the edge is used as the observation surface, so that the distance between each observation point and the observation surface is the same. For example, if the incident position of the laser on the incident surface of the acrylic plate and the vertical length of the above-mentioned edge are controlled to be 2 mm, then the distance between each observation point formed subsequently and the observation surface can be the same and all are 2 mm.

[0071] Furthermore, the method for observing the material to be observed comprises the following steps:

[0072] Step S601 : controlling a preset microscope to perform observation based on the observation surface, wherein the lighting mode of the preset microscope is paraxial illumination.

[0073] In this embodiment, the preset microscope is a high-power optical microscope. By observing the material to be observed through the microscope, the length of the modified point corresponding to each observation point can be determined, wherein the lighting method of the microscope is paraxial illumination.

[0074] Specifically, after determining the observation surface of the acrylic plate, place the acrylic plate with the observation surface facing upward on the stage of a high-power optical microscope. In order to make the observation clear, the illumination mode of the microscope needs to be paraxial illumination. Then, the microscope can be used for observation, and the situation of each observation point can be observed. The modified point length corresponding to each observation point can be determined by referring to Figure 4 , Figure 4 This is a schematic diagram of the observation results.

[0075] In this embodiment, observation is performed based on the observation surface by controlling a preset microscope, wherein the preset microscope uses paraxial illumination. This makes the observation results clearer and allows for effective observation of the focal morphology of the laser after entering the optically denser medium, thereby analyzing the spherical aberration at the focal point. This improves the efficiency of spherical aberration observation and achieves better observation results.

[0076] In this embodiment, an observation surface of the material to be observed is set, wherein each observation point is located at the same distance from the observation surface. Since each observation point has the same distance from the observation surface, the observation conditions at each observation point are the same. This effectively observes the focal morphology of the laser after entering the optically denser medium and analyzes the spherical aberration at the focal point, thereby improving the observation efficiency of spherical aberration and achieving better observation results.

[0077] Based on the above embodiments, a fourth embodiment of the laser spherical aberration observation method of the present invention is proposed. In this embodiment, the method further includes:

[0078] In step S701 , the preset laser is a laser with a wavelength of 1064 nanometers, and the preset material is an acrylic plate.

[0079] In this embodiment, the preset laser is a laser with a wavelength of 1064nm, and the preset material is an acrylic plate. This laser is widely used in various industries. By observing the spherical aberration of this laser, the use of this laser in related technologies can be improved. Since the acrylic plate has good light transmittance, observing the spherical aberration of the laser through the acrylic plate can make the final observation effect better.

[0080] In this embodiment, the preset laser is a 1064-nanometer laser and the preset material is an acrylic sheet. The acrylic sheet's excellent light transmittance allows for effective observation of the focal morphology of the 1064-nanometer laser after entering an optically dense medium, allowing for analysis of the spherical aberration at the focal point. This improves the efficiency of observing laser spherical aberration and achieves better observation results.

[0081] In addition, an embodiment of the present invention further provides a laser spherical aberration observation device, characterized in that the laser spherical aberration observation device includes:

[0082] The processing module 10 is used to control a preset laser to process a preset material based on a preset process to obtain a material to be observed including various observation points;

[0083] The observation module 20 is used to observe the material to be observed and determine the spherical aberration of the preset laser based on the length of the modified point corresponding to each observation point.

[0084] Furthermore, the processing module 10 is further configured to:

[0085] Controlling the preset laser to mark points in the preset material to form each of the observation points;

[0086] The preset materials forming each of the observation points are used as the materials to be observed.

[0087] Furthermore, the laser spherical aberration observation device further includes:

[0088] Setting the emission direction of the preset laser, and the movement direction and incident surface of the preset material, wherein the emission direction is perpendicular to the incident surface, and the movement direction is parallel to the incident surface;

[0089] The preset material is controlled to move in the moving direction, and the preset laser is emitted toward the incident surface based on the emission direction to perform dotting on the preset material.

[0090] Furthermore, the laser spherical aberration observation device further includes:

[0091] Among the observation points, the intervals between adjacent observation points are the same.

[0092] Furthermore, the laser spherical aberration observation device further includes:

[0093] An observation surface of the material to be observed is set, wherein the distances of the observation points relative to the observation surface are the same.

[0094] Furthermore, the laser spherical aberration observation device further includes:

[0095] The preset microscope is controlled to perform observation based on the observation surface, wherein the lighting mode of the preset microscope is paraxial illumination.

[0096] The method performed by the above-mentioned laser spherical aberration observation device can refer to the various embodiments of the laser spherical aberration observation method of the present invention, and will not be described in detail here.

[0097] In addition, an embodiment of the present invention also proposes a laser spherical aberration observation device, which includes: a memory, a processor, and a laser spherical aberration observation program stored on the memory and runnable on the processor. When the laser spherical aberration observation program is executed by the processor, the steps of the laser spherical aberration observation method described above are implemented.

[0098] In addition, an embodiment of the present invention further provides a computer-readable storage medium, on which a laser spherical aberration observation program is stored. When the laser spherical aberration observation program is executed by a processor, the steps of the laser spherical aberration observation method described above are implemented.

[0099] It should be noted that, in this document, the terms "comprises," "includes," or any other variations thereof are intended to encompass non-exclusive inclusion, such that a process, method, article, or system comprising a series of elements includes not only those elements but also other elements not explicitly listed, or elements inherent to such process, method, article, or system. In the absence of further limitations, an element defined by the phrase "comprising a ..." does not exclude the presence of other identical elements in the process, method, article, or system comprising the element.

[0100] The serial numbers of the above embodiments of the present invention are for description only and do not represent the advantages or disadvantages of the embodiments.

[0101] Through the description of the above embodiments, those skilled in the art can clearly understand that the above embodiment methods can be implemented by means of software plus the necessary general hardware platform, and of course can also be implemented by hardware, but in many cases the former is a better embodiment. Based on this understanding, the technical solution of the present invention is essentially or the part that contributes to the prior art can be embodied in the form of a software product, which is stored in a storage medium (such as ROM / RAM, magnetic disk, optical disk) as described above, and includes a number of instructions for enabling a terminal device (which can be a mobile phone, computer, server, air conditioner, or network device, etc.) to execute the methods described in each embodiment of the present invention.

[0102] The above are only preferred embodiments of the present invention and are not intended to limit the patent scope of the present invention. Any equivalent structure or equivalent process transformation made using the contents of the present invention description and drawings, or directly or indirectly applied in other related technical fields, are also included in the patent protection scope of the present invention.

Claims

1. A laser spherical aberration observation method, characterized in that: The laser spherical aberration observation method comprises the following steps: Based on a preset process, a preset laser is controlled to process a preset material to obtain a material to be observed including various observation points; Observing the material to be observed, and determining the spherical aberration of the preset laser based on the length of the modified point corresponding to each of the observation points; The step of controlling a preset laser to process a preset material based on a preset process to obtain the material to be observed including various observation points includes: Controlling the preset laser to make dots in the preset material to form the observation points, wherein the intervals between adjacent observation points in each of the observation points are the same; Using the preset materials forming each of the observation points as the materials to be observed; The step of controlling the preset laser to dot the preset material includes: Setting the emission direction of the preset laser, and the movement direction and incident surface of the preset material, wherein the emission direction is perpendicular to the incident surface, and the movement direction is parallel to the incident surface; The preset material is controlled to move in the moving direction, and the preset laser is emitted toward the incident surface based on the emission direction to perform dotting on the preset material.

2. The laser spherical aberration observation method according to claim 1, wherein: Before the step of observing the material to be observed, the method further includes: An observation surface of the material to be observed is set, wherein the distances of the observation points relative to the observation surface are the same.

3. The laser spherical aberration observation method according to claim 2, wherein: The step of observing the material to be observed comprises: The preset microscope is controlled to perform observation based on the observation surface, wherein the lighting mode of the preset microscope is paraxial illumination.

4. The laser spherical aberration observation method according to any one of claims 1 to 3, characterized in that: The laser spherical aberration observation method further includes: The preset laser is a laser with a wavelength of 1064 nanometers, and the preset material is an acrylic plate.

5. A laser spherical aberration observation device, characterized in that: The laser spherical aberration observation device comprises: A processing module, configured to control a preset laser to process a preset material based on a preset process, to obtain a material to be observed including various observation points; An observation module, configured to observe the material to be observed and determine the spherical aberration of the preset laser based on the length of the modified point corresponding to each observation point; The processing module is further configured to control the preset laser to perform dotting in the preset material to form the observation points, wherein the intervals between adjacent observation points in each of the observation points are the same; Using the preset materials forming each of the observation points as the materials to be observed; The processing module is further configured to set an emission direction of the preset laser, and a movement direction and an incident surface of the preset material, wherein the emission direction is perpendicular to the incident surface, and the movement direction is parallel to the incident surface; The preset material is controlled to move in the moving direction, and the preset laser is emitted toward the incident surface based on the emission direction to perform dotting on the preset material.

6. A laser spherical aberration observation device, characterized in that: The laser spherical aberration observation device includes: a memory, a processor, and a laser spherical aberration observation program stored in the memory and executable on the processor. When the laser spherical aberration observation program is executed by the processor, the steps of the laser spherical aberration observation method according to any one of claims 1 to 4 are implemented.

7. A computer-readable storage medium, characterized in that The readable storage medium stores a laser spherical aberration observation program, which, when executed by a processor, implements the steps of the laser spherical aberration observation method according to any one of claims 1 to 4.

Images