IPM test method, test circuit and test device

Abstract

This application relates to the field of electronic circuit technology and discloses an IPM testing method, test circuit, and test device. The method includes: driving switch tube combinations one by one to power on and conduct one by one; detecting the voltage of the currently driven switch tube combination and generating a switch signal, and outputting the switch signal to the IPM module; detecting the switch signal received by the IPM module to obtain a detection signal; and determining the conduction status of the currently driven switch tube combination based on the detection signal; wherein the switch signal is used to indicate whether the currently driven switch tube combination is on or off, and the detection signal is used to indicate the level state of the switch signal. Embodiments of this application can improve the intelligence and testing efficiency of the IPM testing device.

Description

Technical Field

[0001] The present application relates to the field of electronic circuit technology, and in particular to an IPM testing method, a testing circuit, and a testing device. Background Art

[0002] An intelligent power module (IPM) is a power drive product that combines power electronics and integrated circuit technology. It is typically used in electronic control boards that drive equipment such as fans and compressors. To ensure product quality and extend its lifecycle, IPMs are typically tested for various electrical parameters, particularly their dynamic characteristics. This dynamic characteristics test essentially examines the switching characteristics of the six power switches integrated within the IPM.

[0003] Currently, the method for testing the switching characteristic parameters of a switching tube is to use a motor to drag the device. The intelligent power module must be electrically connected to the motor before testing can be carried out. As a result, the controller manufacturer cannot perform single-board functional testing, resulting in long testing time and low testing efficiency. Summary of the Invention

[0004] The purpose of this application is to provide an IPM testing method, a testing circuit and a testing device, aiming to improve the efficiency of IPM dynamic testing.

[0005] In a first aspect, an IPM testing method is provided for dynamic testing of an IPM. Switches of an IPM module are connected in pairs in series to form a plurality of switch combinations. The IPM testing method includes:

[0006] Driving the switch tube combinations one by one, so that the switch tube combinations are powered on and turned on one by one;

[0007] Detect the voltage of the currently driven switch tube combination and generate a switch signal, and output the switch signal to the IPM module;

[0008] Detecting the switch signal received by the IPM module to obtain a detection signal;

[0009] Determine the conduction status of the currently driven switch tube combination according to the detection signal;

[0010] The switch signal is used to indicate whether the currently driven switch tube combination is turned on or off, and the detection signal is used to indicate the level state of the switch signal.

[0011] In some embodiments, driving the switch tube combinations one by one to power on and conduct the switch tube combinations one by one includes:

[0012] When driving the switch tube combination, one group of switch tube combinations is turned on while the other switch tube combinations are turned off. After determining the conduction status of the currently driven switch tube combination, another group of switch tube combinations is driven to be powered on and turned on while the other switch tube combinations are turned off.

[0013] In some embodiments, the IPM testing method further comprises:

[0014] Pause driving the switch tube combination;

[0015] Generate a trigger signal, convert the trigger signal into a switch signal and output it to the IPM module;

[0016] Detect the switch signal received by the IPM module to obtain an analog detection signal;

[0017] An analog detection signal is received, the analog detection signal is compared with a preset test signal to obtain a comparison result, and it is determined whether the converted switch signal and the analog detection signal are true values according to the comparison result.

[0018] In a second aspect, an IPM test circuit is provided, comprising:

[0019] IPM, its switch tubes are connected in pairs in series to form several groups of switch tube combinations;

[0020] The test processing circuit is connected to the IPM module, detects the voltage of the currently driven switch tube combination and generates a switch signal, and outputs the switch signal to the IPM module;

[0021] A test drive circuit is connected to the IPM module, drives the switch tube combinations one by one, powers on and turns on the switch tube combinations one by one, and detects the switch signal received by the IPM module from the test processing circuit to obtain a detection signal;

[0022] A test control circuit is connected to the test drive circuit and determines the conduction status of the currently driven switch tube combination according to the detection signal received by the test drive circuit;

[0023] The switch signal is used to indicate whether the currently driven switch tube combination is turned on or off, and the detection signal is used to indicate the level state of the switch signal.

[0024] In some embodiments, when the test drive circuit drives the switch tube combination, one group of switch tube combinations is turned on while the other switch tube combinations are turned off. After determining the conduction status of the currently driven switch tube combination, another group of switch tube combinations is driven to be powered on and turned on while the other switch tube combinations are turned off.

[0025] In some embodiments, the IPM includes a first switch tube, a second switch tube, a third switch tube, a fourth switch tube, a fifth switch tube, and a sixth switch tube, wherein the first switch tube and the fifth switch tube are connected in series, the second switch tube and the sixth switch tube are connected in series, and the third switch tube and the fourth switch tube are connected in series.

[0026] The IPM test circuit also includes a first inductor, a second inductor, and a third inductor. One end of the first inductor is connected to the first switching tube and the fourth switching tube at the same time. One end of the second inductor is connected to the second switching tube and the fifth switching tube at the same time. One end of the third inductor is connected to the third switching tube and the sixth switching tube at the same time. The other end of the first inductor, the other end of the second inductor, and the other end of the third inductor are connected.

[0027] When the test driving circuit drives the first switching tube and the fifth switching tube to be turned on at the same time, the first switching tube, the first inductor, the second inductor and the fifth switching tube are connected in series;

[0028] When the test driving circuit drives the second switch tube and the sixth switch tube to be turned on at the same time, the second switch tube, the second inductor, the third inductor and the sixth switch tube are connected in series;

[0029] When the test driving circuit drives the third switching tube and the fourth switching tube to be turned on simultaneously, the third switching tube, the third inductor, the first inductor and the fourth switching tube are connected in series.

[0030] In some embodiments, the test processing circuit includes an operational amplifier, a first resistor, a second resistor, and a third resistor;

[0031] One end of the first resistor is connected to the non-inverting input terminal of the operational amplifier and the switch tube combination at the same time, and the other end of the first resistor is grounded. One end of the third resistor is connected to the inverting input terminal of the operational amplifier and the reference voltage at the same time, and the other end of the third resistor is grounded through the second resistor.

[0032] In some embodiments, the test driving circuit suspends driving the switch tube combination, detects the switch signal received by the IPM module, and obtains an analog detection signal;

[0033] The test control circuit is connected to the test processing circuit, the test control circuit generates a trigger signal, and the test processing circuit converts the trigger signal into a switch signal and outputs it to the IPM module;

[0034] The test control circuit receives the analog detection signal, compares the analog detection signal with a preset test signal, obtains a comparison result, and determines whether the converted switch signal and the analog detection signal are true values according to the comparison result.

[0035] In some embodiments, the IPM module is a PSS20S92F6-AG series IPM chip.

[0036] In a third aspect, an IPM testing device is provided, comprising the IPM testing circuit according to the second aspect.

[0037] The beneficial effects of the present application are as follows: by connecting the switch tubes in the IPM in series in pairs to form a switch tube combination, each group of switch tube combinations is driven one by one during actual testing, so that the switch tube combinations are powered on and turned on one by one, a switching signal is generated based on the voltage formed when each group of switch tube combinations is driven, and the conduction status of the currently driven switch tube combination is determined by detecting the detection signal obtained by detecting the switch signal, thereby realizing automatic testing of the dynamic characteristics of each switch tube in the IPM without the need for manual jumpers, improving the intelligence of the IPM test device, and thus solving the problem that the switching characteristics of the six switch tubes of the IPM need to be tested one by one by using jumpers, which makes the operation of the staff extremely inconvenient during the test, and the test efficiency is low and is not suitable for industrial production. BRIEF DESCRIPTION OF THE DRAWINGS

[0038] Figure 1 It is a flowchart of the IPM testing method provided in the first embodiment.

[0039] Figure 2 It is a flowchart of the IPM testing method provided by the second embodiment.

[0040] Figure 3 It is a structural diagram of the IPM test circuit provided by the first embodiment.

[0041] Figure 4 FIG. 1 is a schematic structural diagram of an IPM test circuit provided by the second embodiment.

[0042] Figure 5 FIG. 1 is a schematic structural diagram of an IPM test circuit provided by the third embodiment. DETAILED DESCRIPTION

[0043] In order to make the purpose, technical solutions and advantages of the embodiments of the present application clearer, the present application will be further described below in conjunction with the embodiments and drawings.

[0044] In the description of this application, "several" means an indefinite quantity, "plurality" means more than two, "greater than," "less than," and "exceed" are understood to exclude the number itself, and "above," "below," and "within" are understood to include the number itself. The terms "first" and "second" are used solely to distinguish technical features and are not to be construed as indicating or implying relative importance, or as implicitly specifying the number or order of the technical features indicated.

[0045] In the description of the present application, the terms "comprises," "includes," or any other variations thereof are intended to cover a non-exclusive inclusion, ie, in addition to the listed elements, there may also be other elements not expressly listed.

[0046] An intelligent power module (IPM) is a power integrated circuit that integrates power devices and gate drive circuits. It typically consists of high-speed, low-power power transistor chips and optimized gate drive and protection circuits. Compared with other power modules, IPMs simplify system hardware circuits, reduce size, improve reliability, and shorten development cycles. Consequently, IPMs are increasingly used in variable-frequency speed regulation, metallurgical machinery, electric traction, servo drives, and other fields.

[0047] Due to the dead-time effect of the power transistors in the IPM, as well as the surge voltages and currents that can damage the devices during turn-on and turn-off, dead-time must be considered when designing the IPM control signals to prevent direct short-circuiting of the transistors in the upper and lower bridge arms. To ensure product quality and extend the lifecycle, the intelligent power module (IPM) is generally tested for electrical parameters such as breakdown voltage, high-voltage leakage current, forward and reverse conduction voltages, short-circuit withstand current, dynamic characteristics, overcurrent protection, undervoltage protection, overtemperature protection, and short-circuit protection, with a particular emphasis on dynamic characteristics testing. The essence of IPM dynamic characteristics testing is to test the switching characteristics of the six power switches integrated within the IPM, including the rise time, fall time, rise delay time, fall delay time, turn-on loss, turn-off loss, and reverse recovery time. Currently, the most common method for testing the switching characteristic parameters of power tubes is the double-pulse test method. This double-pulse test circuit requires the use of jumpers to test the switching characteristics of the six power switch tubes of the IPM one by one, making it extremely inconvenient for workers to operate during testing. In addition, the test efficiency is low and it is not suitable for industrial production.

[0048] Based on this, the embodiments of the present application provide an IPM testing method, a testing circuit, and a testing device, aiming to improve the efficiency of IPM dynamic testing.

[0049] The IPM testing method, testing circuit, and testing device provided in the embodiments of the present application are specifically described through the following embodiments.

[0050] According to a first aspect of the present application, an IPM testing method is provided.

[0051] Figure 1 This is an optional flowchart of the IPM testing method provided in the embodiment of the present application. Figure 1 The method may include but is not limited to steps S101 to S104.

[0052] Step S101, driving the switch tube combinations one by one, so that the switch tube combinations are powered on and turned on one by one;

[0053] Step S102, detecting the voltage of the currently driven switch tube combination and generating a switch signal, and outputting the switch signal to the IPM module;

[0054] Step S103, detecting the switch signal received by the IPM module to obtain a detection signal;

[0055] Step S104: determining the conduction status of the currently driven switch tube combination according to the detection signal.

[0056] The switch tubes of the IPM module are connected in pairs in series to form several groups of switch tube combinations.

[0057] The switching signal is used to indicate whether the currently driven switch tube combination is turned on or off.

[0058] The detection signal is used to represent the level state of the switch signal.

[0059] It can be understood that the switch tube combination is formed by connecting two switch tubes in the IPM in series. The IPM has six switch tubes. After the switch tubes are connected in series in pairs, three groups of switch tube combinations are formed. When the two switch tubes constituting the same group of switch tube combinations are turned on at the same time, the switch tube combination is powered on.

[0060] In steps S101 to S104 shown in the embodiment of the present application, the switch tubes in the IPM are connected in series in pairs to form a switch tube combination. During actual testing, each group of switch tube combinations is driven one by one, so that the switch tube combinations are powered on and started one by one. A switching signal is generated based on the voltage formed when each group of switch tube combinations is driven, and a detection signal obtained by detecting the switch signal is used to determine whether the currently driven switch tube combination is normally turned on or abnormally turned on, thereby realizing automatic testing of the dynamic characteristics of each switch tube in the IPM without the need for manual jumpers, thereby improving the intelligence of the IPM test device, and thus solving the problem of needing to use jumpers to test the switching characteristics of the six switch tubes of the IPM one by one, which makes the operation of the staff extremely inconvenient during the test, and the test efficiency is low and is not suitable for industrial production.

[0061] In some embodiments, the switch tube combinations are driven one by one to be powered on and turned on one by one, including: when driving the switch tube combinations, one group of switch tube combinations is turned on and the other switch tube combinations are turned off; after determining the conduction status of the currently driven switch tube combination, another group of switch tube combinations is driven to be powered on and turned on and the other switch tube combinations are turned off.

[0062] like Figure 2 As shown, in Figure 1 Based on the embodiment, the IPM testing method may further include but is not limited to steps S201 to S204.

[0063] Step S201, suspending driving of the switch tube combination;

[0064] Step S202: generating a trigger signal, converting the trigger signal into a switch signal and outputting the signal to the IPM module;

[0065] Step S203, detecting the switch signal received by the IPM module to obtain an analog detection signal;

[0066] Step S204 , receiving an analog detection signal, comparing the analog detection signal with a preset test signal to obtain a comparison result, and determining whether the converted switch signal and the analog detection signal are true values according to the comparison result.

[0067] It can be understood that steps S201 to S204 are all executed by one or more peripheral circuits, and can be implemented by four peripheral circuits. The first peripheral circuit drives the switch tube combination, the second peripheral circuit generates a switch signal, the second peripheral circuit outputs the switch signal to the IPM module, the third peripheral circuit detects the switch signal obtained by the IPM module from the second peripheral circuit and obtains an analog detection signal, the fourth peripheral circuit generates a trigger signal and obtains the analog detection signal from the third peripheral circuit, compares the level state of the analog detection signal with the level state of the preset test signal, and the four peripheral circuits and the IPM module constitute a signal transmission loop. By executing steps S201 to S204, it is determined whether the converted switch signal and analog detection signal are true values, thereby determining whether the detection signal transmission loop is normal.

[0068] According to a second aspect of the present application, an IPM test circuit is provided.

[0069] like Figure 3 As shown, the IPM test circuit includes an IPM module 100 , a test processing circuit 200 , a test driving circuit 300 and a test control circuit 400 .

[0070] The switching tubes of the IPM are connected in pairs in series to form several groups of switching tube combinations.

[0071] In this embodiment, the IPM has six switch tubes, and each switch tube is connected in series in pairs to form three groups of switch tube combinations.

[0072] The test processing circuit 200 is connected to the IPM module 100 . The test processing circuit 200 detects the voltage of the currently driven switch tube combination and generates a switch signal, and outputs the switch signal to the IPM module 100 .

[0073] Specifically, the input end of the test processing circuit 200 is connected to each group of switch tube combinations, collects the voltage of the currently driven switch tube combination, converts the collected voltage signal into a switch signal, and outputs it.

[0074] The switching signal represents whether the currently driven switch tube combination is turned on or off.

[0075] It is understood that if the switch combination is normally turned on after being driven, the test processing circuit 200 outputs a first switching signal; if the switch combination is abnormally turned on after being driven, the test processing circuit 200 outputs a second switching signal. The first switching signal and the second switching signal may differ in terms of level parameters. That is, if the switch combination is normally turned on after being driven, the test processing circuit 200 outputs a high-level switching signal; if the switch combination is abnormally turned on after being driven, the test processing circuit 200 outputs a low-level switching signal.

[0076] The test driving circuit 300 is connected to the IPM module 100 , and drives the switch tube combinations one by one to turn on the switch tube combinations one by one, and detects the switch signals received by the IPM module 100 from the test processing circuit 200 to obtain detection signals.

[0077] Specifically, the test drive circuit 300 outputs drive signals to the corresponding drive pins of the IPM module 100 in turn, so that the corresponding switch tubes are electrically turned on in pairs, and each group of switch tube combinations is turned on one by one. When the switch tube combination is normally turned on, a voltage signal is generated. After the voltage signal of the currently driven switch tube combination is detected by the test processing circuit 200 and a switch signal is generated, the test processing circuit 200 outputs the switch signal to the IPM module 100. After receiving the signal, the IPM module 100 generates a detection signal, and the test drive circuit 300 detects and receives the detection signal.

[0078] The test control circuit 400 is connected to the test drive circuit 300 . The test control circuit 400 determines the conduction status of the currently driven switch tube combination according to the detection signal received by the test drive circuit 300 .

[0079] Specifically, the test control circuit 400 obtains a detection signal from the test drive circuit 300. The detection signal represents the level state of the switch signal. The level state of the detection signal matches the level state of the switch signal. By identifying the level state of the detection signal, the current level state of the switch signal is determined, thereby determining whether the switch tube combination is normally turned on after being driven.

[0080] In some embodiments, when the test drive circuit 300 drives the switch tube combination, one group of switch tube combinations is turned on while the other switch tube combinations are turned off. After determining the conduction status of the currently driven switch tube combination, another group of switch tube combinations is driven to be powered on and turned on while the other switch tube combinations are turned off.

[0081] like Figure 5As shown, in one embodiment, the IPM includes a first switch tube Q1, a second switch tube Q2, a third switch tube Q3, a fourth switch tube Q4, a fifth switch tube Q5 and a sixth switch tube Q6.

[0082] The first switch tube Q1 is connected in series with the fifth switch tube Q5 , the second switch tube Q2 is connected in series with the sixth switch tube Q6 , and the third switch tube Q3 is connected in series with the fourth switch tube Q4 .

[0083] The IPM test circuit further includes a first inductor L1 , a second inductor L2 , and a third inductor L3 .

[0084] One end of the first inductor L1 is connected to the first switching tube Q1 and the fourth switching tube Q4 at the same time, one end of the second inductor L2 is connected to the second switching tube Q2 and the fifth switching tube Q5 at the same time, one end of the third inductor L3 is connected to the third switching tube Q3 and the sixth switching tube Q6 at the same time, and the other end of the first inductor L1, the other end of the second inductor L2, and the other end of the third inductor L3 are connected.

[0085] The test driving circuit 300 drives the IPM module 100 to turn on the first switch Q1 and the fifth switch Q5 at the same time. The first switch Q1 , the first inductor L1 , the second inductor L2 and the fifth switch Q5 are connected in series.

[0086] The test driving circuit 300 drives the IPM module 100 to turn on the second switch Q2 and the sixth switch Q6 at the same time. The second switch Q2, the second inductor L2, the third inductor L3 and the sixth switch Q6 are connected in series.

[0087] The test driving circuit 300 drives the IPM module 100 to turn on the third switch Q3 and the fourth switch Q4 at the same time. The third switch Q3, the third inductor L3, the first inductor L1 and the fourth switch Q4 are connected in series.

[0088] The IPM module 100 is a PSS20S92F6-AG series IPM chip.

[0089] First, the first switch tube Q1 and the fifth switch tube Q5 are tested.

[0090] The test drive circuit 300 inputs a drive signal to pins 5 and 11 of the IPM module 100 through the I / O port. The test drive circuit 300 sends a drive signal to pin 11 of the IPM module 100 through the I / O port, turning on the first switch tube Q1 and the fifth switch tube Q5.

[0091] The current flows to the first switch Q1 through pin 24 of the IPM module 100 . The current flowing out of the first switch Q1 flows through pin 23 of the IPM module 100 and sequentially through the first inductor L1 , the second inductor L2 and pin 22 of the IPM module 100 .

[0092] The current from pin 22 of the IPM module 100 flows to the fifth switch Q5 , and the current from the fifth switch Q5 flows to the test processing circuit 200 through pin 19 of the IPM module 100 .

[0093] The test processing circuit 200 collects the voltage of pin 19 of the IPM module 100 . When the first switch Q1 and the fifth switch Q5 are normally turned on, the test processing circuit 200 outputs a high-level switch signal to pin 15 of the IPM module 100 .

[0094] After the IPM module 100 receives the switching signal, pin 16 of the IPM module 100 outputs a low-level detection signal. Upon receiving the low-level detection signal, the test drive circuit 300 shuts off the drive signal input to pins 5 and 11 of the IPM module 100. If the drive signal input to pin 5 of the IPM module 100 lasts longer than a preset time, the test drive circuit 300 also shuts off the drive signal input to the IPM module 100. The test drive circuit 300 transmits the received detection signal to the test control circuit 400. If the detection signal is low, the first switch Q1 and the fifth switch Q5 are operating normally. Otherwise, the first switch Q1 and / or the fifth switch Q5 are malfunctioning.

[0095] Then, the second switch tube Q2 and the sixth switch tube Q6 are tested.

[0096] The test drive circuit 300 inputs drive signals to pins 6 and 12 of the IPM module 100 through the I / O port. The test drive circuit 300 sends a drive signal to pin 12 of the IPM module 100 through the I / O port, turning on the second switch tube Q2 and the sixth switch tube Q6.

[0097] The current flows to the second switch tube Q2 through pin 24 of the IPM module 100 . The current flowing out of the second switch tube Q2 flows through pin 22 of the IPM module 100 , then flows through the second inductor L2 , the third inductor L3 and pin 21 of the IPM module 100 in sequence.

[0098] The current from pin 21 of the IPM module 100 flows to the sixth switch tube Q6 , and the current flowing out of the sixth switch tube Q6 flows to the test processing circuit 200 through pin 18 of the IPM module 100 .

[0099] The test processing circuit 200 detects the voltage of pin 18 of the IPM module 100 . When the second switch Q2 and the sixth switch Q6 are normally turned on, the test processing circuit 200 outputs a high-level switch signal to pin 15 of the IPM module 100 .

[0100] After the IPM module 100 receives the switching signal, pin 16 of the IPM module 100 outputs a low-level detection signal. Upon receiving the low-level detection signal, the test drive circuit 300 shuts off the drive signal inputs to pins 6 and 12 of the IPM module 100. If the drive signal input to pin 6 of the IPM module 100 lasts longer than a preset time, the test drive circuit 300 also shuts off the drive signal input to the IPM module 100. The test drive circuit 300 transmits the received detection signal to the test control circuit 400. If the detection signal is low, the second switch Q2 and the sixth switch Q6 are operating normally. Otherwise, the second switch Q2 and / or the sixth switch Q6 are malfunctioning.

[0101] Finally, the third switch tube Q3 and the fourth switch tube Q4 are tested.

[0102] The test driving circuit 300 inputs driving signals to pins 7 and 10 of the IPM module 100 through the I / O port, and the test driving circuit 300 sends driving signals to pin 10 of the IPM module 100 through the I / O port.

[0103] The current flows to the third switch Q3 through pin 24 of the IPM module 100 , and the current flows out of pin 21 of the IPM module 100 through the third inductor L3 , the first inductor L1 and pin 23 of the IPM module 100 in sequence.

[0104] The current at pin 23 of the IPM module 100 flows to the fourth switch tube Q4 , and the current flowing out of the fourth switch tube Q4 flows to the test processing circuit 200 through pin 20 of the IPM module 100 .

[0105] The test processing circuit 200 detects the voltage of pin 20 of the IPM module 100 . When the third switch Q3 and the fourth switch Q4 are normally turned on, the test processing circuit 200 outputs a high-level switch signal to pin 15 of the IPM module 100 .

[0106] After the IPM module 100 receives the switching signal, pin 16 of the IPM module 100 outputs a low-level detection signal. Upon receiving the low-level detection signal, the test drive circuit 300 shuts off the drive signal inputs to pins 7 and 10 of the IPM module 100. If the drive signal input to pin 7 of the IPM module 100 exceeds a preset time, the test drive circuit 300 also shuts off the drive signal input to the IPM module 100. The test drive circuit 300 transmits the received level signal to the test control circuit 400. If the level is low, the third and fourth switches Q3 and Q4 are operating normally. Otherwise, the third and / or fourth switches Q3 and Q4 are malfunctioning.

[0107] like Figure 5As shown, in one embodiment, the test processing circuit 200 includes an operational amplifier U1 , a first resistor R1 , a second resistor R2 , and a third resistor R3 .

[0108] One end of the first resistor R1 is connected to the non-inverting input terminal of the operational amplifier U1 and the switch tube combination at the same time, and the other end of the first resistor R1 is grounded. One end of the third resistor R3 is connected to the inverting input terminal of the operational amplifier U1 and the reference voltage VCC at the same time, and the other end of the third resistor R3 is grounded through the second resistor R2.

[0109] Specifically, the operational amplifier U1 collects and detects the voltage generated when the current driving switch tube combination is turned on through the first resistor R1. The overcurrent flows through the sampling first resistor R1 and generates an overcurrent voltage. The overcurrent voltage input is greater than the reference voltage VCC input, and the operational amplifier U1 flips and outputs a high-level switching signal.

[0110] like Figure 4 and Figure 5 As shown, in some embodiments, the IPM test device performs the following steps:

[0111] The test driving circuit 300 stops driving the switch tube combination, detects the switch signal received by the IPM module 100, and obtains an analog detection signal.

[0112] The test control circuit 400 is connected to the test processing circuit 200 . The test control circuit 400 generates a trigger signal. The test processing circuit 200 converts the trigger signal into a switch signal and outputs the signal to the IPM module 100 .

[0113] The test control circuit 400 receives the analog detection signal, compares the analog detection signal with a preset test signal, obtains a comparison result, and determines whether the converted switch signal and the analog detection signal are true values according to the comparison result.

[0114] Specifically, when the test drive circuit 300 does not output a drive signal to the IPM module 100, the test control circuit 400 outputs a trigger signal to the test processing circuit 200, so that the test processing circuit 200 generates a switch signal indicating that the switch tube combination is normally turned on, so that the IPM module 100 generates an analog detection signal after receiving the switch signal. The test drive circuit 300 obtains the analog detection signal and sends it to the test control circuit 400. The test control circuit 400 compares the level state of the analog detection signal with the level state of the preset test signal to determine whether the level state of the analog detection signal matches the level state of the preset test signal. If they match, the loop formed by the test processing circuit 200, the IPM module 100 and the test drive circuit 300 functions normally. Otherwise, the function of the formed loop is abnormal.

[0115] According to a third aspect of the present application, an IPM testing device is provided.

[0116] The IPM test device includes the IPM test circuit of the second aspect. The specific structure of the IPM test circuit refers to the above embodiment. Since the IPM test device proposed in this application adopts all the technical solutions of all the above embodiments, it at least has all the beneficial effects brought by the technical solutions of the above embodiments, which will not be repeated here one by one.

[0117] In summary, the IPM testing method, testing circuit, and testing device provided by the present application connect the switching tubes in the IPM in series in pairs to form a switching tube combination. During actual testing, each group of switching tube combinations is driven one by one, so that the switching tube combinations are powered on and turned on one by one. A switching signal is generated based on the voltage formed when each group of switching tube combinations is driven, and the conduction status of the currently driven switching tube combination is determined by detecting the detection signal obtained by detecting the switching signal, thereby realizing automatic testing of the dynamic characteristics of each switching tube in the IPM without the need for manual jumpers, thereby improving the intelligence of the IPM testing device, and thus solving the problem that the switching characteristics of the six switching tubes of the IPM need to be tested one by one by using jumpers, which makes it extremely inconvenient for staff to operate during testing, and the test efficiency is low and is not suitable for industrial production.

[0118] In this application, unless otherwise expressly specified and limited, the terms "first", "second", "third", "fourth", etc. (if any) are used to distinguish similar objects and are not necessarily used to describe a specific order or sequential order. It should be understood that the data used in this way can be interchangeable where appropriate, so that the embodiments of the application described herein can be implemented in a sequence other than those illustrated or described herein. In addition, the terms "including" and "having" and any variations thereof are intended to cover non-exclusive inclusions, for example, a process, method, system, product or device comprising a series of steps or units is not necessarily limited to those steps or units clearly listed, but may include other steps or units that are not clearly listed or inherent to these processes, methods, products or devices.

[0119] In this application, unless otherwise expressly specified and limited, "at least one (item)" means one or more, and "plurality" means two or more. "And / or" is used to describe the association relationship of associated objects, indicating that three relationships may exist. For example, "A and / or B" can mean: only A exists, only B exists, and A and B exist at the same time, where A and B can be singular or plural. The character " / " generally indicates that the previous and next associated objects are in an "or" relationship. "At least one of the following items" or similar expressions refers to any combination of these items, including any combination of single or plural items. For example, at least one of a, b or c can mean: a, b, c, "a and b", "a and c", "b and c", or "a and b and c", where a, b, c can be single or multiple.

[0120] Throughout this specification, reference to terms such as "one embodiment," "some embodiments," "illustrative embodiments," "examples," "specific examples," or "some examples" means that a specific feature, structure, material, or characteristic described in conjunction with the embodiment or example is included in at least one embodiment or example of the present application. In this specification, the schematic representations of the above terms do not necessarily refer to the same embodiment or example. Furthermore, the specific features, structures, materials, or characteristics described may be combined in any suitable manner in any one or more embodiments or examples.

[0121] The above description is merely a specific embodiment of the present application, but the scope of protection of the present application is not limited thereto. Any changes or substitutions that can be easily conceived by a person skilled in the art within the technical scope disclosed in this application should be included in the scope of protection of this application. Therefore, the scope of protection of this application should be based on the scope of protection of the claims.

Claims

1. An IPM testing method for dynamic testing of an IPM module, wherein the switch tubes of the IPM module are connected in pairs in series to form a plurality of switch tube combinations, characterized in that: The IPM testing method includes: Driving the switch tube combinations one by one, so that the switch tube combinations are powered on and turned on one by one; Detecting the voltage of the currently driven switch tube combination and generating a switch signal, and outputting the switch signal to the IPM module; detecting a response signal of the switch signal received by the IPM module to obtain a detection signal; Determining the conduction status of the currently driven switch tube combination according to the detection signal; The switch signal is used to indicate whether the currently driven switch tube combination is turned on or off, and the detection signal is used to indicate the level state of the response signal of the switch signal; IPM test methods also include: Step S201, suspending driving of the switch tube combination; Step S202: Generate a trigger signal, convert the trigger signal into a switch signal and output it to the IPM module; Step S203: detecting a response signal of the switch signal received by the IPM module to obtain an analog detection signal; Step S204: receiving an analog detection signal, comparing the analog detection signal with a preset test signal to obtain a comparison result, and determining whether the converted switch signal and the analog detection signal are true values according to the comparison result; Among them, when the test drive circuit does not output a drive signal to the IPM module, the test control circuit outputs a trigger signal to the test processing circuit, so that the test processing circuit generates a switch signal indicating that the switch tube combination is normally turned on, so that the IPM module generates an analog detection signal after receiving the switch signal. The test drive circuit obtains the analog detection signal and sends it to the test control circuit. The test control circuit compares the level state of the analog detection signal with the level state of the preset test signal to determine whether the level state of the analog detection signal matches the level state of the preset test signal. If they match, the loop formed by the test processing circuit, the IPM module and the test drive circuit functions normally; otherwise, the formed loop functions abnormally.

2. The IPM testing method according to claim 1, wherein: Driving the switch tube combinations one by one to power on and conduct the switch tube combinations one by one includes: When driving the switch tube combinations, one group of the switch tube combinations is turned on while the other switch tube combinations are turned off. After determining the conduction status of the currently driven switch tube combination, another group of the switch tube combinations is driven to be powered on and turned on while the other switch tube combinations are turned off.

3. An IPM test circuit, characterized in that: include: The IPM module has switching tubes connected in pairs in series to form several switching tube combinations; A test processing circuit, connected to the IPM module, detects the voltage of the currently driven switch tube combination and generates a switch signal, and outputs the switch signal to the IPM module; a test drive circuit connected to the IPM module, driving the switch tube combinations one by one to power on and turn on the switch tube combinations one by one, and detecting a response signal of the switch signal received by the IPM module from the test processing circuit to obtain a detection signal; a test control circuit connected to the test drive circuit, and determining the conduction status of the currently driven switch tube combination according to the detection signal received by the test drive circuit; The switch signal is used to indicate whether the currently driven switch tube combination is turned on or off, and the detection signal is used to indicate the level state of the response signal of the switch signal; The test drive circuit suspends driving the switch tube combination, detects a response signal of the switch signal received by the IPM module, and obtains an analog detection signal; The test control circuit is connected to the test processing circuit, the test control circuit generates a trigger signal, and the test processing circuit converts the trigger signal into a switch signal and outputs it to the IPM module; The test control circuit receives the analog detection signal, compares the analog detection signal with a preset test signal, obtains a comparison result, and determines whether the converted switch signal and the analog detection signal are true values according to the comparison result; When the test drive circuit does not output a drive signal to the IPM module, the test control circuit outputs a trigger signal to the test processing circuit, causing the test processing circuit to generate a switch signal indicating that the switch tube combination is normally turned on, so that the IPM module generates an analog detection signal after receiving the switch signal. The test drive circuit obtains the analog detection signal and sends it to the test control circuit. The test control circuit compares the level state of the analog detection signal with the level state of the preset test signal to determine whether the level state of the analog detection signal matches the level state of the preset test signal. If they match, the loop formed by the test processing circuit, the IPM module and the test drive circuit functions normally; otherwise, the function of the formed loop is abnormal.

4. The IPM test circuit according to claim 3, characterized in that: When the test drive circuit drives the switch tube combination, one group of the switch tube combinations is turned on while the other switch tube combinations are turned off. After determining the conduction status of the currently driven switch tube combination, the test drive circuit drives another group of the switch tube combinations to be powered on and turned on while the other switch tube combinations are turned off.

5. The IPM test circuit according to claim 4, characterized in that: The IPM module comprises a first switch tube, a second switch tube, a third switch tube, a fourth switch tube, a fifth switch tube and a sixth switch tube, wherein the first switch tube and the fifth switch tube are connected in series, the second switch tube and the sixth switch tube are connected in series, and the third switch tube and the fourth switch tube are connected in series; The IPM test circuit further includes a first inductor, a second inductor, and a third inductor, one end of the first inductor is connected to the first switching transistor and the fourth switching transistor, one end of the second inductor is connected to the second switching transistor and the fifth switching transistor, one end of the third inductor is connected to the third switching transistor and the sixth switching transistor, and the other end of the first inductor, the other end of the second inductor, and the other end of the third inductor are connected; When the test drive circuit drives the first switch tube and the fifth switch tube to be turned on at the same time, the first switch tube, the first inductor, the second inductor and the fifth switch tube are connected in series; When the test drive circuit drives the second switch tube and the sixth switch tube to be turned on at the same time, the second switch tube, the second inductor, the third inductor and the sixth switch tube are connected in series; When the test driving circuit drives the third switch tube and the fourth switch tube to be turned on simultaneously, the third switch tube, the third inductor, the first inductor and the fourth switch tube are connected in series.

6. The IPM test circuit according to claim 3, characterized in that: The test processing circuit includes an operational amplifier, a first resistor, a second resistor and a third resistor; One end of the first resistor is connected to the non-inverting input terminal of the operational amplifier and the switch tube combination at the same time, and the other end of the first resistor is grounded. One end of the third resistor is connected to the inverting input terminal of the operational amplifier and the reference voltage at the same time, and the other end of the third resistor is grounded through the second resistor.

7. The IPM test circuit according to claim 3, characterized in that: The IPM module is a PSS20S92F6-AG series IPM chip.

8. An IPM testing device, characterized in that: The method comprises the IPM test circuit according to any one of claims 3 to 7.

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