Frequency jitter parameter acquisition method and device, electromagnetic interference suppression device and storage medium

Abstract

The application relates to a dithering frequency parameter acquisition method and device, an electromagnetic interference suppression device and a storage medium. The method comprises the following steps: for multiple dithering frequency modes, acquiring the minimum difference between the electromagnetic interference test result and a standard curve in each dithering frequency mode and the dithering frequency parameter corresponding to the minimum difference; comparing the minimum differences in each dithering frequency mode, and determining the first dithering frequency parameter corresponding to the dithering frequency mode with the minimum minimum difference as the optimal dithering frequency parameter. The scheme provided by the application can acquire the optimal dithering frequency parameter, and better suppress electromagnetic interference.

Description

Technical Field

[0001] This application relates to the field of frequency dithering technology, and in particular to a method, apparatus, electromagnetic interference suppression device, and storage medium for obtaining frequency dithering parameters. Background Technology

[0002] Frequency dithering is widely recognized as a key technology for suppressing electromagnetic interference. However, the determination of dithering parameters, such as dithering mode and dithering period, is currently based on actual test results. This method does not guarantee optimal parameters; it only yields relatively good results and is inefficient, wasting experimental resources. Summary of the Invention

[0003] This application provides a method, apparatus, electromagnetic interference suppression device, and storage medium for obtaining jitter parameters, in order to solve the technical problem that the jitter parameters obtained in the prior art are not optimal parameters.

[0004] Firstly, this application provides a method for obtaining frequency dithering parameters, the method comprising:

[0005] For multiple dithering modes, obtain the minimum difference between the electromagnetic interference test result and the standard curve for each dithering mode, as well as the dithering parameter corresponding to the minimum difference; compare the minimum difference for each dithering mode, and determine the first dithering parameter corresponding to the dithering mode with the smallest minimum difference as the optimal dithering parameter.

[0006] In one embodiment, obtaining the minimum difference between the electromagnetic interference test result and the standard curve and the dithering parameter corresponding to the minimum difference under each dithering mode includes: when the dithering mode is a frequency-by-frequency linear dithering mode, continuously changing the frequency interval within a preset frequency range; obtaining the frequency interval with the minimum difference between the electromagnetic interference test result and the standard curve; and determining the frequency interval with the minimum difference as the dithering parameter corresponding to the minimum difference under the frequency-by-frequency linear dithering mode.

[0007] In one embodiment, obtaining the minimum difference between the electromagnetic interference test result and the standard curve under each dithering mode, and the dithering parameter corresponding to the minimum difference, includes: when the dithering mode is a non-linear dithering mode, continuously adjusting the modulation period within a preset frequency range; obtaining the modulation period with the smallest difference between the electromagnetic interference test result and the standard curve; and determining the modulation period with the smallest difference as the dithering parameter corresponding to the minimum difference under the non-linear dithering mode.

[0008] In one embodiment, obtaining the minimum difference between the electromagnetic interference test result and the standard curve under each frequency dithering mode, and the frequency dithering parameter corresponding to the minimum difference, includes: when the frequency dithering mode is a random frequency dithering mode, continuously adjusting the frequency range and performing random frequency dithering within different frequency ranges; obtaining the frequency range with the minimum difference between the electromagnetic interference test result and the standard curve; and determining the frequency range with the minimum difference as the frequency dithering parameter corresponding to the minimum difference under the random frequency dithering mode.

[0009] In one embodiment, before obtaining the minimum difference between the electromagnetic interference test result and the standard curve and the dithering parameter corresponding to the minimum difference for each dithering mode, the method further includes: obtaining a set target value and the difference between the electromagnetic interference test result and the standard curve; determining whether the difference reaches the target value; and when the difference does not reach the target value, obtaining the minimum difference between the electromagnetic interference test result and the standard curve and the dithering parameter corresponding to the minimum difference for each dithering mode.

[0010] In one embodiment, after determining whether the difference has reached the target value, the method further includes: when the difference reaches the target value, not acquiring the minimum difference between the electromagnetic interference test result and the standard curve for each dithering mode, and the dithering parameters corresponding to the minimum difference.

[0011] In one embodiment, the method further includes: using an optical fiber conversion device to obtain a set target value and the difference between the electromagnetic interference test result and the standard curve.

[0012] Secondly, this application provides a device for obtaining dithering parameters, the device comprising:

[0013] The acquisition module is used to acquire the minimum difference between the electromagnetic interference test result and the standard curve for each of the multiple dithering modes, as well as the dithering parameters corresponding to the minimum difference.

[0014] The determination module is used to compare the minimum difference of each dithering mode and determine the first dithering parameter corresponding to the dithering mode with the smallest minimum difference as the optimal dithering parameter.

[0015] In one embodiment, the acquisition module is further configured to, when the frequency dithering mode is a frequency-by-frequency linear dithering mode, continuously change the frequency interval within a preset frequency range; acquire the frequency interval with the smallest difference between the electromagnetic interference test result and the standard curve; and determine the frequency interval with the smallest difference as the dithering parameter corresponding to the smallest difference in the frequency-by-frequency linear dithering mode.

[0016] In one embodiment, the acquisition module is further configured to, when the frequency dithering mode is a non-linear frequency dithering mode, continuously adjust the modulation period within a preset frequency range; acquire the modulation period with the smallest difference between the electromagnetic interference test result and the standard curve; and determine the modulation period with the smallest difference as the frequency dithering parameter corresponding to the smallest difference under the non-linear frequency dithering mode.

[0017] In one embodiment, the acquisition module is further configured to continuously adjust the frequency range when the frequency dithering mode is a random frequency dithering mode, perform random frequency dithering in different frequency ranges, and obtain the frequency range with the smallest difference between the electromagnetic interference test result and the standard curve; and determine the frequency range with the smallest difference as the frequency dithering parameter corresponding to the smallest difference in the random frequency dithering mode.

[0018] In one embodiment, the acquisition module is further configured to acquire a set target value and the difference between the electromagnetic interference test result and the standard curve; determine whether the difference reaches the target value; and when the difference does not reach the target value, acquire the minimum difference between the electromagnetic interference test result and the standard curve and the dithering parameter corresponding to the minimum difference for each dithering mode.

[0019] In one embodiment, the acquisition module is further configured to, when the difference reaches the target value, not acquire the minimum difference between the electromagnetic interference test result and the standard curve under each dithering mode, and the dithering parameters corresponding to the minimum difference.

[0020] In one embodiment, the acquisition module is further configured to acquire a set target value and the difference between the electromagnetic interference test result and the standard curve using an optical fiber conversion device.

[0021] Thirdly, this application provides a magnetic interference suppression device, including: a main control device, a communication data conversion device, a product under test equipped with a main chip, and an optimal frequency dithering parameter acquisition program;

[0022] The main control device is used to obtain the difference between the electromagnetic interference test results and the standard curve;

[0023] The communication data conversion device is used to transmit the difference between the electromagnetic interference test result and the standard curve to the product under test equipped with the main chip.

[0024] The optimal dithering parameter acquisition program is used to execute the steps of the method as described in any of the first aspects to acquire the optimal dithering parameters of the product under test equipped with the main chip.

[0025] Fourthly, this application provides a storage medium storing a computer program, characterized in that, when the computer program is executed by a processor, it implements the steps of the method as described in any embodiment of the first aspect.

[0026] The technical solutions provided in this application have the following advantages compared with the prior art:

[0027] The method provided in this application embodiment can obtain the optimal frequency dithering parameters and suppress electromagnetic interference faster and better. Attached Figure Description

[0028] The accompanying drawings, which are incorporated in and form part of this specification, illustrate embodiments consistent with the invention and, together with the description, serve to explain the principles of the invention.

[0029] To more clearly illustrate the technical solutions in the embodiments of the present invention or the prior art, the drawings used in the description of the embodiments or the prior art will be briefly introduced below. Obviously, those skilled in the art can obtain other drawings based on these drawings without creative effort.

[0030] Figure 1 A flowchart illustrating a method for obtaining frequency dithering parameters provided in an embodiment of this application;

[0031] Figure 2 This is a schematic diagram illustrating the process of obtaining the optimal dithering parameters in an embodiment of this application;

[0032] Figure 3 This is a structural block diagram of the electromagnetic interference suppression device according to an embodiment of this application;

[0033] Figure 4 This is a schematic diagram of the structure of an electronic device provided in an embodiment of this application. Detailed Implementation

[0034] To make the objectives, technical solutions, and advantages of the embodiments of this application clearer, the technical solutions of the embodiments of this application will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of this application, not all embodiments. Based on the embodiments of this application, all other embodiments obtained by those skilled in the art without creative effort are within the scope of protection of this application.

[0035] Figure 1 This is a flowchart illustrating a method for obtaining frequency dithering parameters provided in an embodiment of this application. Figure 1 As shown, the method includes:

[0036] Step 101: For multiple frequency dithering modes, obtain the minimum difference between the electromagnetic interference test result and the standard curve for each frequency dithering mode, as well as the frequency dithering parameters corresponding to the minimum difference;

[0037] Step 102: Compare the minimum difference in each dithering mode, and determine the first dithering parameter corresponding to the dithering mode with the smallest minimum difference as the optimal dithering parameter.

[0038] In this embodiment, the minimum difference between the electromagnetic interference test result and the standard curve can be determined based on the difference between the electromagnetic interference test result and the standard curve at different frequency points. Specifically, the difference between the electromagnetic interference test result and the standard curve can be identified using difference recognition modes, image recognition methods, curve parameter extraction methods, etc.

[0039] This embodiment can obtain the optimal value of dithering parameters for different product characteristics; and it can fully demonstrate the effect of this embodiment in suppressing electromagnetic interference through dithering, which is more efficient than traditional dithering implementation methods.

[0040] In one embodiment, obtaining the minimum difference between the electromagnetic interference test result and the standard curve for each dithering mode, and the dithering parameters corresponding to the minimum difference, includes:

[0041] When the frequency dithering mode is frequency-by-frequency linear dithering mode, the frequency interval is continuously changed within a preset frequency range;

[0042] The frequency interval with the smallest difference between the electromagnetic interference test results and the standard curve is obtained;

[0043] The frequency interval with the smallest difference is determined as the dithering parameter corresponding to the smallest difference in the frequency linear dithering mode.

[0044] Here, you can set a preset frequency range according to the actual situation.

[0045] In this embodiment, when changing the frequency interval, the frequency interval can be changed by increasing or decreasing the same value each time.

[0046] In one embodiment, obtaining the minimum difference between the electromagnetic interference test result and the standard curve for each dithering mode, and the dithering parameters corresponding to the minimum difference, includes:

[0047] When the frequency dithering mode is a non-linear frequency dithering mode, the modulation period is continuously adjusted within a preset frequency range;

[0048] Obtain the modulation period with the smallest difference between the electromagnetic interference test result and the standard curve;

[0049] The modulation period with the smallest difference is determined as the dithering parameter corresponding to the smallest difference in the nonlinear dithering mode.

[0050] Here, a preset frequency range can be set according to the actual situation. When adjusting the modulation period, modulation can also be performed according to the actual situation.

[0051] In one embodiment, obtaining the minimum difference between the electromagnetic interference test result and the standard curve for each dithering mode, and the dithering parameters corresponding to the minimum difference, includes:

[0052] When the frequency dithering mode is random frequency dithering mode, the frequency range is continuously adjusted, and random frequency dithering is performed within different frequency ranges.

[0053] Obtain the frequency range where the difference between the electromagnetic interference test results and the standard curve is the smallest;

[0054] The frequency range with the smallest difference is determined as the dithering parameter corresponding to the smallest difference in the random dithering mode.

[0055] Here, the minimum and maximum values ​​of the frequency range can be set based on the situation, and the frequency range can be determined based on the minimum and maximum values ​​of the frequency range.

[0056] In one embodiment, before obtaining the minimum difference between the electromagnetic interference test result and the standard curve for each dithering mode, and the dithering parameter corresponding to the minimum difference, the method further includes:

[0057] Obtain the set target value, as well as the difference between the electromagnetic interference test results and the standard curve;

[0058] Determine whether the difference reaches the target value;

[0059] When the difference does not reach the target value, obtain the minimum difference between the electromagnetic interference test result and the standard curve for each dithering mode, as well as the dithering parameters corresponding to the minimum difference.

[0060] Correspondingly, when the difference reaches the target value, the minimum difference between the electromagnetic interference test result and the standard curve under each dithering mode, as well as the dithering parameters corresponding to the minimum difference, are not acquired.

[0061] Before proceeding with the process of obtaining the optimal frequency dithering parameters, this embodiment can first calculate the difference between the electromagnetic interference test result and the standard curve, and then calculate it with the set target value to determine whether the difference between the electromagnetic interference test result and the standard curve has reached the target value. If the target value has been reached, the optimal frequency dithering mode will not be performed; if the target value has not been reached, the frequency dithering mode will be selected.

[0062] In one embodiment, the method further includes:

[0063] The target value is obtained using a fiber optic conversion device, as well as the difference between the electromagnetic interference test results and the standard curve.

[0064] To avoid the impact of additional communication cables on test results, a fiber optic converter can be used to transmit parameters.

[0065] This invention identifies the difference between electromagnetic interference test results and the standard curve at different frequency points, and adjusts the frequency dithering parameters online in real time. This allows for the fastest acquisition of optimal frequency dithering parameters, enabling faster and better electromagnetic interference suppression for different products.

[0066] The following will describe a specific embodiment.

[0067] See Figure 2 , Figure 2 This is a flowchart illustrating the process of obtaining the optimal jitter parameters. Follow the flowchart to complete the process of obtaining the optimal jitter parameters. Specifically:

[0068] 1. The main control device consists of two parts: EMI test results and difference identification. It is used to obtain the difference between the test results and the standard curve, and to set the required target difference.

[0069] 2. Communication data conversion transmits the set parameters, such as the target difference, to the main chip of the product. In order to avoid the test results being affected by the additional communication cables, an optical fiber conversion device is used to transmit the parameters to the main chip.

[0070] 3. The main chip in the product receives information such as the EMI test difference set by the main control device and starts the optimal frequency dithering parameter acquisition program. At the same time, the laboratory testing equipment adopts a continuous testing mode, and the test ends after obtaining the optimal frequency dithering parameters.

[0071] 4. After the optimal frequency dithering parameter acquisition program starts, it first calculates the difference between the EMI test result and the standard curve. At this time, it calculates the target value set by the main control device to see if the target value has been reached. If the target value has been reached, the optimal frequency dithering mode will not be used. If the target value has not been reached, the frequency dithering mode will be selected.

[0072] 5. Frequency dithering modes are divided into frequency-sequential linear dithering, non-linear dithering, and random dithering modes.

[0073] 6. When entering the frequency-by-frequency linear dithering mode, continuously change the frequency interval Tstep within the limited frequency range until the minimum difference in this mode is found and the optimal Tstep is determined.

[0074] 7. When entering the nonlinear frequency dithering mode, within the limited frequency range, adjust the modulation period Tm to obtain different frequency change patterns until the minimum difference in this mode is found and Tm is determined.

[0075] 8. When entering the random frequency dithering mode, continuously adjust the frequency range and perform random frequency dithering in different frequency ranges until the frequency range Tmin-Tmax corresponding to the minimum difference in this mode is found.

[0076] 9. Compare the three dithering modes above, determine the dithering mode with the smallest difference and the corresponding dithering parameters, and output the final result to the display module.

[0077] 10. The optimal dithering parameters determined for this product shall be used for dithering control in subsequent product applications.

[0078] The frequency dithering parameter acquisition method provided in this application, for multiple frequency dithering modes, obtains the minimum difference between the electromagnetic interference test result and the standard curve under each frequency dithering mode, as well as the frequency dithering parameter corresponding to the minimum difference; compares the minimum difference under each frequency dithering mode, and determines the first frequency dithering parameter corresponding to the frequency dithering mode with the smallest minimum difference as the optimal frequency dithering parameter. The solution provided in this application can obtain the optimal frequency dithering parameter and suppress electromagnetic interference faster and better.

[0079] To implement the method of the embodiments of the present invention, this application also provides a dithering parameter acquisition device. The dithering parameter acquisition includes:

[0080] The acquisition module is used to acquire the minimum difference between the electromagnetic interference test result and the standard curve for each of the multiple dithering modes, as well as the dithering parameters corresponding to the minimum difference.

[0081] The determination module is used to compare the minimum difference of each dithering mode and determine the first dithering parameter corresponding to the dithering mode with the smallest minimum difference as the optimal dithering parameter.

[0082] In one embodiment, the acquisition module is further configured to, when the frequency dithering mode is a frequency-by-frequency linear dithering mode, continuously change the frequency interval within a preset frequency range; acquire the frequency interval with the smallest difference between the electromagnetic interference test result and the standard curve; and determine the frequency interval with the smallest difference as the dithering parameter corresponding to the smallest difference in the frequency-by-frequency linear dithering mode.

[0083] In one embodiment, the acquisition module is further configured to, when the frequency dithering mode is a non-linear frequency dithering mode, continuously adjust the modulation period within a preset frequency range; acquire the modulation period with the smallest difference between the electromagnetic interference test result and the standard curve; and determine the modulation period with the smallest difference as the frequency dithering parameter corresponding to the smallest difference under the non-linear frequency dithering mode.

[0084] In one embodiment, the acquisition module is further configured to continuously adjust the frequency range when the frequency dithering mode is a random frequency dithering mode, perform random frequency dithering in different frequency ranges, and obtain the frequency range with the smallest difference between the electromagnetic interference test result and the standard curve; and determine the frequency range with the smallest difference as the frequency dithering parameter corresponding to the smallest difference in the random frequency dithering mode.

[0085] In one embodiment, the acquisition module is further configured to acquire a set target value and the difference between the electromagnetic interference test result and the standard curve; determine whether the difference reaches the target value; and when the difference does not reach the target value, acquire the minimum difference between the electromagnetic interference test result and the standard curve and the dithering parameter corresponding to the minimum difference for each dithering mode.

[0086] In one embodiment, the acquisition module is further configured to, when the difference reaches the target value, not acquire the minimum difference between the electromagnetic interference test result and the standard curve under each dithering mode, and the dithering parameters corresponding to the minimum difference.

[0087] In one embodiment, the acquisition module is further configured to acquire a set target value and the difference between the electromagnetic interference test result and the standard curve using an optical fiber conversion device.

[0088] It should be noted that the apparatus provided in the above embodiments and the method embodiments belong to the same concept, and the specific implementation process can be found in the method embodiments, which will not be repeated here.

[0089] To implement the method of the embodiments of the present invention, this application also provides an electromagnetic interference suppression device, including: a main control device, a communication data conversion device, a product under test equipped with a main chip, and an optimal frequency dithering parameter acquisition program;

[0090] The main control device is used to obtain the difference between the electromagnetic interference test results and the standard curve;

[0091] The communication data conversion device is used to transmit the difference between the electromagnetic interference test result and the standard curve to the product under test equipped with the main chip.

[0092] The optimal dithering parameter acquisition program is used to execute the steps of any of the above methods to obtain the optimal dithering parameters of the product under test equipped with the main chip.

[0093] Specifically, see Figure 3 , Figure 3 This is a structural block diagram of the EMI interference suppression device of this patent, including a main control device, a communication data conversion unit, a product entity, and a laboratory component, among which:

[0094] The main control device consists of two parts: EMI test results and difference identification. It is used to obtain the difference between the test results and the standard curve, and to set the required target difference.

[0095] The communication data conversion transmits the set parameters, such as the target difference, to the main chip of the product. In order to avoid the test results being affected by the additional communication cables, an optical fiber conversion device is used to transmit the parameters to the main chip.

[0096] The main chip in the product receives information such as the EMI test difference set by the main control device and starts the optimal frequency dithering parameter acquisition program.

[0097] The laboratory's testing equipment adopts a continuous testing mode, and the test ends after obtaining the optimal jitter parameters.

[0098] Based on the hardware implementation of the above program modules, and in order to implement the embodiments of the present invention, the present invention also provides an electronic device (computer device), including a processor 111, a communication interface 112, a memory 113, and a communication bus 114, wherein the processor 111, the communication interface 112, and the memory 113 communicate with each other through the communication bus 114.

[0099] Memory 113 is used to store computer programs;

[0100] In one embodiment of this application, when the processor 111 executes the program stored in the memory 113, it implements the steps of the method provided in any of the foregoing method embodiments.

[0101] Those skilled in the art will understand that Figure 4 The structure shown is merely a block diagram of a portion of the structure related to the present application and does not constitute a limitation on the computer device to which the present application is applied. Specific computer devices may include more or fewer components than those shown in the figure, or combine certain components, or have different component arrangements.

[0102] The device provided in the embodiments of the present invention includes a processor, a memory, and a program stored in the memory and executable on the processor. When the processor executes the program, it implements the method of any of the above embodiments.

[0103] Those skilled in the art will understand that embodiments of this application can be provided as methods, systems, or computer program objects. Therefore, this application can take the form of a completely hardware embodiment, a completely software embodiment, or an embodiment combining software and hardware aspects. Furthermore, this application can take the form of a computer program object implemented on one or more computer-usable storage media (including, but not limited to, disk storage, CD-ROM, optical storage, etc.) containing computer-usable program code.

[0104] This application is described with reference to flowchart illustrations and / or block diagrams of methods, apparatus (systems), and computer program objects according to embodiments of this application. It will be understood that each block of the flowchart illustrations and / or block diagrams, and combinations of blocks in the flowchart illustrations and / or block diagrams, can be implemented by computer program instructions. These computer program instructions can be provided to a processor of a general-purpose computer, special-purpose computer, embedded processor, or other programmable data processing apparatus to produce a machine, such that the instructions, which execute via the processor of the computer or other programmable data processing apparatus, generate instructions for implementing the flowchart... Figure 1 One or more processes and / or boxes Figure 1 A device that provides the functions specified in one or more boxes.

[0105] These computer program instructions may also be stored in a computer-readable storage medium that can direct a computer or other programmable data processing device to function in a particular manner, such that the instructions stored in the computer-readable storage medium produce an article of manufacture including instruction means, which are implemented in a process Figure 1 One or more processes and / or boxes Figure 1 The function specified in one or more boxes.

[0106] These computer program instructions may also be loaded onto a computer or other programmable data processing equipment to cause a series of operational steps to be performed on the computer or other programmable equipment to produce a computer-implemented process, thereby providing instructions that execute on the computer or other programmable equipment for implementing the process. Figure 1 One or more processes and / or boxes Figure 1 The steps of the function specified in one or more boxes.

[0107] In a typical configuration, a computing device includes one or more processors (CPU), input / output interfaces, network interfaces, and memory.

[0108] This application also provides a computer-readable storage medium storing a computer program thereon, which, when executed by a processor, implements the steps of the method provided in any of the foregoing method embodiments.

[0109] Memory may include non-persistent memory in computer-readable media, such as random access memory (RAM) and / or non-volatile memory, like read-only memory (ROM) or flash RAM. Memory is an example of computer-readable media.

[0110] Computer-readable media include both permanent and non-permanent, removable and non-removable media that can store information by any method or technology. Information can be computer-readable instructions, data structures, modules of programs, or other data. Examples of computer storage media include, but are not limited to, phase-change memory (PRAM), static random access memory (SRAM), dynamic random access memory (DRAM), other types of random access memory (RAM), read-only memory (ROM), electrically erasable programmable read-only memory (EEPROM), flash memory or other memory technologies, CD-ROM, digital versatile optical disc (DVD) or other optical storage, magnetic tape, magnetic magnetic disk storage or other magnetic storage devices, or any other non-transferable medium that can be used to store information accessible by a computing device. As defined herein, computer-readable media does not include transient computer-readable media, such as modulated data signals and carrier waves.

[0111] It is understood that the memory in the embodiments of the present invention can be volatile memory or non-volatile memory, or both. Specifically, non-volatile memory can be read-only memory (ROM), programmable read-only memory (PROM), erasable programmable read-only memory (EPROM), electrically erasable programmable read-only memory (EEPROM), ferromagnetic random access memory (FRAM), flash memory, magnetic surface memory, optical disc, or compact disc read-only memory (CD-ROM); magnetic surface memory can be disk storage or magnetic tape storage. Volatile memory can be random access memory (RAM), which is used as an external cache. By way of example, but not limitation, many forms of RAM are available, such as Static Random Access Memory (SRAM), Synchronous Static Random Access Memory (SSRAM), Dynamic Random Access Memory (DRAM), Synchronous Dynamic Random Access Memory (SDRAM), Double Data Rate Synchronous Dynamic Random Access Memory (DDRSDRAM), Enhanced Synchronous Dynamic Random Access Memory (ESDRAM), SyncLink Dynamic Random Access Memory (SLDRAM), and Direct Rambus Random Access Memory (DRRAM).The memories described in the embodiments of this invention are intended to include, but are not limited to, these and any other suitable types of memories.

[0112] It should be noted that, in this document, relational terms such as "first" and "second" are used merely to distinguish one entity or operation from another, and do not necessarily require or imply any such actual relationship or order between these entities or operations. Furthermore, the terms "comprising," "including," or any other variations thereof are intended to cover non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements includes not only those elements but also other elements not expressly listed, or elements inherent to such a process, method, article, or apparatus. Without further limitations, an element defined by the phrase "comprising one..." does not exclude the presence of other identical elements in the process, method, article, or apparatus that includes said element.

[0113] The above description is merely a specific embodiment of the present invention, enabling those skilled in the art to understand or implement the invention. Various modifications to these embodiments will be readily apparent to those skilled in the art, and the general principles defined herein may be implemented in other embodiments without departing from the spirit or scope of the invention. Therefore, the present invention is not to be limited to the embodiments shown herein, but is to be accorded the widest scope consistent with the principles and novel features claimed herein.

Claims

1. A method for obtaining a dithering parameter, characterized in that, The method comprises: For a plurality of frequency jitter modes, obtaining the minimum difference between the electromagnetic interference test result and the standard curve and the frequency jitter parameter corresponding to the minimum difference in each frequency jitter mode, the frequency jitter parameter being used for suppressing electromagnetic interference; Comparing the minimum differences in each frequency jitter mode, and determining the first frequency jitter parameter corresponding to the frequency jitter mode with the minimum minimum difference as the optimal frequency jitter parameter; Before the obtaining the minimum difference between the electromagnetic interference test result and the standard curve and the frequency jitter parameter corresponding to the minimum difference in each frequency jitter mode, the method further comprises: Obtaining a set target value and the difference between the electromagnetic interference test result and the standard curve; Judging whether the difference reaches the target value; When the difference does not reach the target value, obtaining the minimum difference between the electromagnetic interference test result and the standard curve and the frequency jitter parameter corresponding to the minimum difference in each frequency jitter mode.

2. The method of claim 1, wherein, The obtaining the minimum difference between the electromagnetic interference test result and the standard curve and the frequency jitter parameter corresponding to the minimum difference in each frequency jitter mode comprises: When the frequency jitter mode is a frequency-linear frequency jitter mode, constantly changing the frequency interval in a preset frequency range; Obtaining the frequency interval with the minimum difference between the electromagnetic interference test result and the standard curve; Determining the frequency interval with the minimum difference as the frequency jitter parameter corresponding to the minimum difference in the frequency-linear frequency jitter mode.

3. The method of claim 1, wherein, The obtaining the minimum difference between the electromagnetic interference test result and the standard curve and the frequency jitter parameter corresponding to the minimum difference in each frequency jitter mode comprises: When the frequency jitter mode is a nonlinear frequency jitter mode, constantly adjusting the modulation period in a preset frequency range; Obtaining the modulation period with the minimum difference between the electromagnetic interference test result and the standard curve; Determining the modulation period with the minimum difference as the frequency jitter parameter corresponding to the minimum difference in the nonlinear frequency jitter mode.

4. The method of claim 1, wherein, The obtaining the minimum difference between the electromagnetic interference test result and the standard curve and the frequency jitter parameter corresponding to the minimum difference in each frequency jitter mode comprises: When the frequency jitter mode is a random frequency jitter mode, constantly adjusting the frequency range and performing random frequency jitter in different frequency ranges; Obtaining the frequency range with the minimum difference between the electromagnetic interference test result and the standard curve; Determining the frequency range with the minimum difference as the frequency jitter parameter corresponding to the minimum difference in the random frequency jitter mode.

5. The method of claim 1, wherein, After the judging whether the difference reaches the target value, the method further comprises: When the difference reaches the target value, not obtaining the minimum difference between the electromagnetic interference test result and the standard curve and the frequency jitter parameter corresponding to the minimum difference in each frequency jitter mode.

6. The method of claim 1, wherein, The method further comprises: Using a fiber conversion device to obtain a set target value and the difference between the electromagnetic interference test result and the standard curve.

7. A jitter parameter acquisition apparatus characterized by comprising: The frequency jitter parameter obtaining device comprises: An obtaining module, configured to, for a plurality of frequency jitter modes, obtain the minimum difference between the electromagnetic interference test result and the standard curve and the frequency jitter parameter corresponding to the minimum difference in each frequency jitter mode, the frequency jitter parameter being used for suppressing electromagnetic interference; A determining module, configured to compare the minimum differences in each frequency jitter mode, and determine the first frequency jitter parameter corresponding to the frequency jitter mode with the minimum minimum difference as the optimal frequency jitter parameter; The acquisition module is further configured to acquire a target value set and a difference between the electromagnetic interference test result and the standard curve; determine whether the difference reaches the target value; and acquire a minimum difference between the electromagnetic interference test result and the standard curve and a jitter frequency parameter corresponding to the minimum difference when the difference does not reach the target value.

8. An electromagnetic interference suppression device, characterized by comprising: The application relates to a method for acquiring an optimal jitter frequency parameter of a product with a main chip. The application relates to a method for acquiring an optimal jitter frequency parameter of a product with a main chip. The application relates to a method for acquiring an optimal jitter frequency parameter of a product with a main chip. The application relates to a method for acquiring an optimal jitter frequency parameter of a product with a main chip. The application relates to a method for acquiring an optimal jitter frequency parameter of a product with a main chip.

9. A storage medium having stored therein a computer program, characterized in that, The application relates to a method for acquiring an optimal jitter frequency parameter of a product with a main chip. The application relates to a method for acquiring an optimal jitter frequency parameter of a product with a main chip. The application relates to a method for acquiring an optimal jitter frequency parameter of a product with a main chip. The application relates to a method for acquiring an optimal jitter frequency parameter of a product with a main chip. The application relates to a method for acquiring an optimal jitter frequency parameter of a product with a main chip. The application relates to a method for acquiring an optimal jitter frequency parameter of a product with a main chip. The application relates to a method for acquiring an optimal jitter frequency parameter of a product with a main chip. The application relates to a method for acquiring an optimal jitter frequency parameter of a product with a main chip. The application relates to a method for acquiring an optimal jitter frequency parameter of a product with a main chip. The application relates to a method for acquiring an optimal jitter frequency parameter of a product with a main chip. The application relates to a method for acquiring an optimal jitter frequency parameter of a product with a main chip. The application relates to a method for acquiring an optimal jitter frequency parameter of a product with a main chip. The application relates to a method for acquiring an optimal jitter frequency parameter of a product with a main chip. The application relates to a method for acquiring an optimal jitter frequency parameter of a product with a main chip. The application relates to a method for acquiring an optimal jitter frequency parameter of a product with a main chip. The application relates to a method for acquiring an optimal jitter frequency parameter of a product with a main chip. The application relates to a method for acquiring an optimal jitter frequency parameter of a product with a main chip.

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