A multi-channel ultrashort pulse beam combining measurement device and a measurement method

Abstract

The present invention discloses a multi-channel ultrashort pulse beam combining measurement device and a measurement method, which include an ultrashort pulse generator, a detection array, a programmable synthesizer, a pulse train processor, and a signal processing and analysis system. The detection end of the detection array is arranged around the medium to be measured and is used to obtain the scattered waves generated by the medium to be measured. The input end of the programmable synthesizer is electrically connected to the output end of the detection array, the input end of the pulse train processor is electrically connected to the output end of the programmable synthesizer, and the output end of the pulse train processor is electrically connected to the input end of the signal analysis and processing system. The present invention enables the simultaneous reception of the scattered waves generated by the medium to be measured. During multi-channel measurement, the ultrashort pulses measured at N spatial positions are combined into a pulse train signal with an adjustable time interval, achieving the purpose of measuring multi-channel pulse signals with a set of data acquisition system and signal analysis and processing system, which can reduce the equipment cost, realize multiple measurements and superposition measurements at multiple spatial positions, and reduce the measurement error.

Description

Technical Field

[0001] The present invention relates to the technical field of electromagnetic wave scattering diagnosis and measurement of nuclear fusion plasmas, and particularly to a multi-channel ultrashort pulse beam combining measurement device and a measurement method. Background Art

[0002] The generation and transformation of pulse signals have wide applications in signal measurement and processing systems. In the measurement of plasma parameters, pulses or pulse trains are often used to achieve different spatio-temporal measurements. Since one pulse usually corresponds to one measurement position or one measurement angle at a moment, in multi-spatio-temporal measurements, not only multiple receiving systems are needed to record these waveforms, but also a large number of acquisition and processing systems are required, which causes difficulties in system operation control and maintenance. For example, when using high-energy pulse electromagnetic waves with a pulse width of 10 ns for scattering measurement, more than 6 pulse measurement signals need to be separated in the frequency domain at one spatial position. If 200-channel measurement is to be achieved in one measurement, at least thousands of pulse signals need to be subjected to waveform acquisition. Recording these ns-level pulse signals requires a very complex data acquisition and processing system, with high equipment cost and labor cost. In addition, the repetition frequency of the pulse signal generation system determines the measurement time accuracy, while high-energy pulse signal generation systems are expensive, have a short lifespan, and require high maintenance requirements.

[0003] Therefore, it is necessary to design a multi-channel pulse beam combining measurement device and method to solve the problems of complex systems, high equipment cost and labor cost encountered in multi-channel pulse measurements. Summary of the Invention

[0004] The technical problem to be solved by the present invention is the complexity of the system, high equipment cost and labor cost encountered in multi-channel pulse measurements. The purpose is to provide a multi-channel ultrashort pulse beam combining measurement device and a measurement method, which solve the problems of combined measurement and signal transformation of multi-channel short pulse signals.

[0005] The present invention is achieved by the following technical solutions:

[0006] A multi-channel ultrashort pulse beam combining measurement device includes:

[0007] An ultrashort pulse generator for emitting a detection wave to a medium to be measured;

[0008] A detection array having a detection end and a signal output end, the detection end of the detection array being arranged around the medium to be measured and used for obtaining the scattered wave generated by the medium to be measured;

[0009] A programmable synthesizer, the input end of which is electrically connected to the output end of the detection array;

[0010] A pulse train processor and a signal analysis and processing system, wherein the input end of the pulse train processor is electrically connected to the output end of the program-controlled synthesizer, and the output end of the pulse train processor is electrically connected to the input end of the signal analysis and processing system.

[0011] Furthermore, the measuring device also includes a control system, a control end of which is electrically connected to the ultrashort pulse generator, the detection array, the program-controlled synthesizer, the pulse train processor and the signal analysis and processing system.

[0012] Specifically, the detection array includes n detection units, the n detection units are arranged in parallel, and the output ends of the n detection units are electrically connected to the input end of the program-controlled synthesizer;

[0013] The detection unit includes a detector, a first isolator, a shaping circuit and a second isolator. The output end of the detector is electrically connected to the input end of the first isolator, the output end of the first isolator is electrically connected to the input end of the shaping circuit, the output end of the shaping circuit is electrically connected to the input end of the second isolator, the output end of the second isolator is the output end of the detection unit, and the detector is used to obtain the scattered wave generated by the medium to be measured.

[0014] Optionally, the first isolator and the second isolator are used to prevent parasitic reflection interference.

[0015] The shaping circuit is used to control the waveform of the scattered wave and the speed of its passing time, and the output waveform of the shaping circuit is controlled by the control system.

[0016] The program-controlled synthesizer is used to synthesize the short pulse signals output by n detection units into one output, and the output waveform of the program-controlled synthesizer is controlled by the control system and the shaping circuit.

[0017] The pulse train processor is used for waveform arrangement and amplification of the output signal of the program-controlled synthesizer.

[0018] The ultrashort wave generator is a high energy laser generator or a microwave generator.

[0019] A multi-path ultra-short pulse beam combining measurement method, based on the multi-path ultra-short pulse beam combining measurement device as described above, the measurement method comprises:

[0020] The scattering angle of each detector can be the same or different according to the measurement requirements. The scattering angle is the angle between the detection wave and the scattered wave.

[0021] When the detectors are controlled to be aimed at different areas of the medium to be measured, and the scattering angles of each of the control detectors are made the same, scattering characteristics of the same characteristic scale in different areas of the medium to be measured are obtained.

[0022] The measurement method further includes: when the control detectors are aligned with the same area of the medium to be measured and the scattering angles of each control detector are different, obtaining the scattering characteristics of different characteristic scales in the same area of the medium to be measured.

[0023] Compared with the prior art, the present invention has the following advantages and beneficial effects:

[0024] By providing a detection array including a plurality of detection units and enabling the simultaneous reception of scattered waves generated by the medium to be measured, during multi-channel measurement, the ultrashort pulses measured at N spatial positions are synthesized into a pulse train signal with an adjustable time interval, achieving the purpose of measuring multi-channel pulse signals with a set of data acquisition system and signal analysis and processing system. This can not only reduce the equipment cost, but also enable multiple measurements and superposition measurements at multiple spatial positions, reducing the measurement error. BRIEF DESCRIPTION OF THE DRAWINGS

[0025] The drawings illustrate exemplary embodiments of the present invention and, together with the description, are used to explain the principles of the present invention. These drawings are included to provide a further understanding of the present invention, and the drawings are included in this specification and form a part of this specification, and do not constitute a limitation on the embodiments of the present invention.

[0026] Figure 1 It is a schematic structural diagram of a multi-channel ultrashort pulse beam combination measurement device according to the present invention.

[0027] Reference numerals: 1 - ultrashort pulse generator, 2 - medium to be measured, 3 - detection wave, 4 - scattered wave, 5 - detector, 6 - first isolator, 7 - shaping circuit, 8 - second isolator, 9 - short pulse signal, 10 - programmable synthesizer, 11 - pulse train processor, 12 - data acquisition system, 13 - signal analysis and processing system, 14 - control system. DETAILED DESCRIPTION OF THE EMBODIMENTS

[0028] To make the objectives, technical solutions, and advantages of the present invention clearer and more understandable, the present invention will be further described in detail below with reference to the drawings and embodiments. It can be understood that the specific embodiments described herein are only used to explain the relevant content and do not limit the present invention.

[0029] In addition, it should be noted that only parts related to the present invention are shown in the drawings for the convenience of description.

[0030] Without conflict, the embodiments in the present invention and the features in the embodiments can be combined with each other. The following will refer to the attached Figure 1 and will describe the present invention in detail in combination with the embodiments.

[0031] Embodiment 1

[0032] A multi-channel ultrashort pulse beam combination measurement device, comprising an ultrashort pulse generator 1, a detection array, a programmable synthesizer 10, a pulse train processor 11, a signal processing and analysis system, and a control system 14;

[0033] The ultrashort pulse generator 1 is a high-energy laser generator or a microwave generator, which is used to emit a detection wave 3 to a medium under test 2. After the emitted detection wave 3 is reflected by the medium under test 2, a scattered wave 4 is generated. The parameters such as the power and pulse width of the ultrashort pulse generator 1 are determined by factors such as the scattering physical characteristics of the detection wave 3 on the medium under test 2 and the performance of the detection array.

[0034] The detection array has a detection end and a signal output end. The detection end of the detection array is arranged around the medium under test 2 and is used to obtain the scattered wave 4 generated by the medium under test 2; the detection array includes n detection units, and the n detection units are arranged in parallel. The output ends of the n detection units are electrically connected to the input end of the programmable synthesizer 10. According to the actual situation, multiple detection ends of the detection array are arranged at different positions relative to the detection medium, and different scattering characteristics can be obtained.

[0035] The input end of the programmable synthesizer 10 is electrically connected to the output end of the detection array, the input end of the pulse train processor 11 is electrically connected to the output end of the programmable synthesizer 10, and the output end of the pulse train processor 11 is electrically connected to the input end of the signal analysis and processing system 13.

[0036] The programmable synthesizer 10 is used to synthesize the short pulse signals 9 output by the n detection units into one output, and control the output waveform of the programmable synthesizer 10 through the control system 14 and the shaping circuit 7. Among them, the programmable synthesizer 10 has a channel gating function, and the working mode of each channel is controlled by the control system 14. The output signal waveform of the programmable synthesizer 10 is mainly determined by the control system 14 and the detection unit, and n is an integer greater than 1.

[0037] The pulse train processor 11 is used to perform waveform sorting and amplification processing on the output signal of the programmable synthesizer 10, increase the amplitude and load-carrying capacity of the pulse signal, and it can also play a role in isolation and protection.

[0038] The control end of the control system 14 is electrically connected to the ultrashort pulse generator 1, the detection array, the programmable synthesizer 10, the pulse train processor 11, and the signal analysis and processing system 13.

[0039] The first isolator 6 and the second isolator 8 are used to prevent parasitic reflection interference.

[0040] The shaping circuit 7 is used to control the waveform of the scattered wave 4 and the passing time, and the output waveform of the shaping circuit 7 is controlled by the control system 14. For different types of pulse signals such as low-frequency, radio-frequency, millimeter-wave, and laser, the shaping circuit 7 can select different gated shaping circuits 7 according to the specific conditions of the device and the signal.

[0041] The detection unit includes a detector 5, a first isolator 6, a shaping circuit 7, and a second isolator 8. The output end of the detector 5 is electrically connected to the input end of the first isolator 6. The output end of the first isolator 6 is electrically connected to the input end of the shaping circuit 7. The output end of the shaping circuit 7 is electrically connected to the input end of the second isolator 8. The output end of the second isolator 8 is the output end of the detection unit. The detector 5 is used to obtain the scattered wave 4 generated by the medium to be measured 2. After the detector 5 detects the scattered wave 4 of the medium to be measured 2, it is shaped by the shaping circuit 7 and then output to the programmable synthesizer 10.

[0042] Embodiment 2

[0043] Based on a multi-channel ultrashort pulse beam combining measurement device as in Embodiment 1, in this embodiment, a multi-channel ultrashort pulse beam combining measurement method is provided. The measurement method includes:

[0044] According to the measurement requirements, the scattering angles of each detector 5 can be the same or different. The scattering angle is the included angle between the detection wave 3 and the scattered wave 4;

[0045] The included angle between the detection wave 3 and the scattered wave 4 is determined according to the physical characteristics of the medium to be measured 2 and the measurement area. The same scattering angle means scattering on the same characteristic scale of the medium to be measured 2. The detector 5 arrays are aligned with different regions of the medium to be measured 2. If the scattering angles of each detector 5 array are the same, the scattering characteristics of the same characteristic scale in different regions of the medium to be measured 2 can be obtained.

[0046] To obtain the scattering characteristics of the same characteristic scale in different regions of the medium to be measured 2, the specific calculation process is as follows:

[0047] The incident pulse signal is scattered on the medium to be measured 2, and its scattered signal can be given by the following formula: P S ∝P i ·n e ·dΩ·S(k,ω).

[0048] Where P S is the scattering power, P i is the incident power, n eLet \(\rho\) be the density of the medium to be measured, \(d\Omega\) be the scattering cross-section, and \(S(k,\omega)\) be the shape factor of the scattering spectrum. The scattering wave vector \(k\) represents the scattering characteristics of different characteristic scales, which is determined by the scattering angle \(\varphi\). The scattering angle \(\varphi\) is the angle between the probing wave and the scattering wave. When the detectors are controlled to be aligned with different regions of the medium to be measured and the scattering angle \(\varphi\) of each detector is the same, the scattering characteristics of the same characteristic scale in different regions of the medium to be measured are obtained.

[0049] In different regions \(x\) i , when measuring at the same scattering angle, the obtained scattering signal is

[0050] \(P\) S (x i ,k,\omega)=P S (x,\omega),

[0051] where \(\omega\) is the perturbation frequency. First, perform a Fourier transform on the scattering signal, then extract the power corresponding to a certain perturbation frequency \(\omega\), and sequentially extract the corresponding power signals \(P\) i for different regions \(x\) S (\omega), and the corresponding relationship \((x\) i ,P S (\omega)) can be obtained, which represents the spatial distribution of the scattering signal under the same scattering characteristic scale \(k\) and the same perturbation frequency \(\omega\). Using the scattering signals extracted from different spatial regions, correlation analysis can also be performed to extract the correlation coefficient and phase characteristics of the perturbations with the same characteristic scale in different spatial regions.

[0052] The measurement method further includes: when the detectors are controlled to be aligned with the same region of the medium to be measured and the scattering angle \(\varphi\) of each detector is different, the corresponding scattering wave vectors \(k\) are also different. At this time, the scattering characteristics of different characteristic scales in the same region of the medium to be measured can be obtained.

[0053] To obtain the scattering characteristics of different characteristic scales in the same region of the medium to be measured 2, the specific calculation process is as follows: In the same region \(x\) i , the scattering signals obtained under different scattering wave vectors \(k\) are

[0054] \(P\) S (x i ,k,\omega)=P S (k,\omega),

[0055] The method is the same as above. First, perform a Fourier transform on the scattering signal, then extract the power corresponding to a certain perturbation frequency \(\omega\), and sequentially extract the corresponding power signals \(P\) S for different scattering wave vectors \(k\) \((\omega)\), and the \((k, P\) SThe correspondence of (ω)) represents the k-space distribution of the scattering signals, i.e., the k-space spectrum, at the same measurement position for different scattering characteristic scales k under the same perturbation frequency ω. Using the scattering signals extracted at different scattering wave vectors k, correlation analysis can also be performed to extract the correlation coefficient and phase characteristics of the perturbation characteristics at different characteristic scales at the same position.

[0056] For the scattering measurement of the medium 22 to be measured at the same position, the signals measured by the detector 5 array correspond to different scattering angles. According to the wave vector k conservation: k = k i -k s , where k i is the wave vector of the probing wave 3, and k s is the wave vector of the scattered wave 4. The measured signal is related to the angle between the scattered wave 4. At this time, the signals measured at different angles represent the scattering measurements of different characteristic scales, that is, the direct measurement of the k-space at the same position. By processing the output pulse train through the control system 14, the shaping circuit 7, the programmable synthesizer 10, and the pulse train processor 11, the output of the k-space spectrum is directly realized in the signal analysis and processing system 13.

[0057] Based on the above measurements, by scanning different spaces and different scattering angles, multi-dimensional measurement of the characteristics of the medium 2 to be measured can be achieved.

[0058] Embodiment III

[0059] A multi-channel ultrashort pulse beam combining measurement terminal includes a memory, a processor, and a computer program stored in the memory and executable on the processor. When the processor executes the computer program, the steps of the above-mentioned multi-channel ultrashort pulse beam combining measurement method are implemented.

[0060] The memory can be used to store software programs and modules. The processor executes various functional applications and data processing of the terminal by running the software programs and modules stored in the memory. The memory mainly includes a program storage area and a data storage area. Among them, the program storage area can store an operating system, execution programs required for at least one function, etc.

[0061] The data storage area can store data created according to the use of the terminal, etc. In addition, the memory can include high-speed random access memory, and can also include non-volatile memory, such as at least one disk storage device, a flash memory device, or other volatile solid-state storage devices.

[0062] A computer-readable storage medium stores a computer program. When the computer program is executed by a processor, the steps of the above-mentioned multi-channel ultrashort pulse beam combining measurement method are implemented.

[0063] Without loss of generality, computer-readable media can include computer storage media and communication media. Computer storage media includes volatile and non-volatile, removable and non-removable media implemented by any method or technology for storing information such as computer-readable instructions, data structures, program modules, or other data. Computer storage media includes RAM, ROM, EPROM, EEPROM, flash memory or other solid-state storage technologies, CD-ROM, DVD or other optical storage, magnetic tape cartridges, magnetic tape, disk storage or other magnetic storage devices. Of course, those skilled in the art will understand that computer storage media is not limited to the above several types. The above-mentioned system memory and mass storage devices can be collectively referred to as memory.

[0064] In the description of this specification, the description of reference terms such as "one embodiment / way", "some embodiments / ways", "example", "specific example", or "some examples" means that the specific features, structures, materials, or characteristics described in connection with the embodiment / way or example are included in at least one embodiment / way or example of this application. In this specification, the schematic expressions of the above terms do not necessarily refer to the same embodiment / way or example. Moreover, the specific features, structures, materials, or characteristics described can be combined in a suitable manner in any one or more embodiments / ways or examples. In addition, without contradiction, those skilled in the art can combine and combine the different embodiments / ways or examples described in this specification and the features of different embodiments / ways or examples.

[0065] In addition, the terms "first" and "second" are only used for descriptive purposes and cannot be understood as indicating or implying relative importance or implicitly indicating the quantity of the indicated technical features. Thus, the features defined with "first" and "second" can explicitly or implicitly include at least one of these features. In the description of this application, "a plurality" means at least two, such as two, three, etc., unless otherwise specifically defined.

[0066] Those skilled in the art should understand that the above embodiments are only for clearly explaining the present invention and are not intended to limit the scope of the present invention. For those skilled in the art, other changes or variations can be made based on the above invention, and these changes or variations are still within the scope of the present invention.

Claims

1. A multi-channel ultrashort pulse beam combining measurement device, characterized in that Comprising: An ultrashort pulse generator (1) for emitting a detection wave (3) to a medium under test (2); A detection array having a detection end and a signal output end, the detection end of the detection array being disposed around the medium under test (2) and for obtaining a scattered wave (4) generated by the medium under test (2); A programmable synthesizer (10) whose input end is electrically connected to the output end of the detection array; A pulse train processor (11) and a signal analysis and processing system (13), the input end of the pulse train processor (11) being electrically connected to the output end of the programmable synthesizer (10), and the output end of the pulse train processor (11) being electrically connected to the input end of the signal analysis and processing system (13).

2. The multi-channel ultrashort pulse beam combining measurement device according to claim 1, wherein Further comprising a control system (14) whose control end is electrically connected to the ultrashort pulse generator (1), the detection array, the programmable synthesizer (10), the pulse train processor (11), and the signal analysis and processing system (13).

3. A multiplexed ultrashort pulse beam combining measurement device according to claim 2, characterized in that, The detection array includes n detection units, the n detection units are connected in parallel, and the output ends of the n detection units are all electrically connected to the input end of the programmable synthesizer (10); The detection unit includes a detector (5), a first isolator (6), a shaping circuit (7), and a second isolator (8), the output end of the detector (5) is electrically connected to the input end of the first isolator (6), the output end of the first isolator (6) is electrically connected to the input end of the shaping circuit (7), the output end of the shaping circuit (7) is electrically connected to the input end of the second isolator (8), the output end of the second isolator (8) is the output end of the detection unit, and the detector (5) is used to obtain the scattered wave (4) generated by the medium under test (2).

4. A multiplexed ultrashort pulse beam combining measurement device according to claim 3, characterized in that The first isolator (6) and the second isolator (8) are used to prevent parasitic reflection interference.

5. The multi-channel ultrashort pulse beam combination measurement device according to claim 4, wherein The shaping circuit (7) is used to control the waveform of the scattered wave (4) and the passing time speed, and the control system (14) controls the output waveform of the shaping circuit (7).

6. The multi-channel ultra-short pulse beam combining measurement device according to claim 5, wherein The programmable synthesizer (10) is used to synthesize the short pulse signals (9) output by the n detection units into one output, and the control system (14) and the shaping circuit (7) control the output waveform of the programmable synthesizer (10).

7. A multi-channel ultrashort pulse beam combining measurement device according to claim 6, characterized in that The pulse train processor (11) is used to perform waveform sorting and amplification processing on the output signal of the programmable synthesizer (10).

8. A multiplexed ultrashort pulse beam combining measurement device according to claim 7, characterized in that, The ultrashort pulse generator (1) is a high-energy laser generator or a microwave generator.

9. A method for measuring multiplexed ultrashort pulse beam combination, characterized in that, Based on a multi-channel ultrashort pulse beam combining measurement device according to any one of claims 3-8, the measurement method includes: According to measurement requirements, the scattering angles of each detector (5) can be the same or different, and the scattering angle is the included angle between the detection wave (3) and the scattered wave (4); When the detectors (5) are controlled to be aligned with different regions of the medium under test (2), when the scattering angles of each controlled detector (5) are the same, the scattering characteristics of the same characteristic scale of different regions of the medium under test (2) are obtained.

10. A multiplexed ultrashort pulse beam combining measurement method according to claim 9, characterized in that, Further comprising: When the control detectors (5) are aligned with the same region of the medium to be measured (2) and the scattering angles of each control detector (5) are different, the scattering characteristics of the same region of the medium to be measured (2) with different characteristic scales are obtained.

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