Sensor probe with combined non-contact sensor and rogowski coil

Abstract

One or more embodiments of the present disclosure relate to a sensor probe of a measurement system for measuring a plurality of electrical parameters (e.g., voltage, current) of a conductor and a method for measuring these electrical parameters. In at least one embodiment, the sensor probe integrates a Rogowski coil and a non-contact voltage sensor that are arranged relative to each other such that when positioned to measure a conductor, such as a wire, the Rogowski coil and the non-contact voltage sensor are held in place for measurement.

Description

BACKGROUND

[0001] TECHNICAL FIELD TECHNICAL FIELD

[0002] The present disclosure relates generally to sensor probes and measurement instruments including sensor probes.

[0003] TECHNICAL FIELD

[0004] Measurement instruments, such as multimeters, are configured to measure one or more electrical parameters, such as voltage and current. These measurement instruments are often used for troubleshooting, service, and maintenance applications, which often require multiple measurements over a period of time. To obtain the measurements, a sensor probe can be arranged relative to the conductor under test.

[0005] Typically, measurement instruments use various sensor probes to measure various electrical parameters of a conductor. For example, to measure the current and voltage of a conductor, two different sensor probes are typically held relative to the conductor under test. Accordingly, a user can need to couple and decouple two different sensor probes with the measurement device and hold the various sensor probes in place during testing.

[0006] In many cases, such as in confined spaces, holding a sensor probe around a conductor under test can be awkward and cumbersome, and in some cases, dangerous. Accordingly, improved electrical parameter measurement devices are desired. SUMMARY

[0007] One or more embodiments of the present disclosure relate to a sensor probe for a measurement system for measuring a plurality of electrical parameters (e.g., voltage, current) of a conductor and a method for measuring these electrical parameters. In at least one embodiment, the sensor probe integrates a Rogowski coil and a non-contact voltage sensor that are arranged relative to one another such that when positioned to measure a conductor, such as a wire, the Rogowski coil and the non-contact voltage sensor are held in place for measurement. Accordingly, a user can be able to separate from the sensor probe when the sensor probe is taking measurements.

[0008] In at least one embodiment, the sensor probe includes a Rogowski coil that forms a loop, and the non-contact sensor includes a sensor element on an inner surface of a pair of jaws of a spring-loaded clamp. The pair of jaws of the clamp are arranged to hold the conductor under test at a central region of the loop formed by the Rogowski coil such that the conductor is in a suitable position for testing. More specifically, the pair of jaws of the clamp are arranged relative to the Rogowski coil such that the conductor under test extends perpendicularly through a central region of a plane of the loop formed by the Rogowski coil.

[0009] Generally, it is desirable to test the conductor in the center region of the Rogowski coil. That is, positioning the conductor to be tested in the center region of the Rogowski coil is the best location for accurate current readings. The arrangement of the non-contact sensor and the Rogowski coil optimizes the position of the conductor under test so that the non-contact sensor and the Rogowski coil can continuously measure the conductor under test without the need for continuous user manipulation or intervention.

[0010] The jaws of the clamp are configured to hold the conductor under test such that the surface of the insulating material surrounding the conductor under test is aligned with and abuts the non-contact sensor element. In some embodiments, the interior surface of the jaws is concave in shape so as to accommodate the conductor and facilitate alignment of the conductor with respect to the non-contact sensing element. The recess of the first jaw can overlap with the end of the second jaw, further facilitating alignment of the conductor with respect to the non-contact sensing element. BRIEF DESCRIPTION OF DRAWINGS

[0011] Figure 1A An isometric view of at least one non-limiting embodiment of a sensor probe in a closed position is shown.

[0012] Figure 1B A sensor probe of FIG. 1 in an open position is shown.

[0013] Figure 1C A sensor probe of FIG. 1 holding a wire is shown.

[0014] Figure 1D A sensor probe in a plan view and a cross-sectional view of FIG. 1 is shown.

[0015] Figure 2 A measurement system including a sensor probe of FIG. 1 coupled to a measuring instrument is shown in at least one non-limiting embodiment.

[0016] Figure 3 A block diagram of electrical components of a measurement system of Figure 2 is shown in at least one non-limiting embodiment.

[0017] Figure 4A An isometric view of at least one non-limiting embodiment of a sensor probe assembly is shown.

[0018] Figure 4B A sensor probe assembly of FIG. 1 in a separated state is shown.

[0019] Figure 5A A measurement system including a sensor probe assembly of Figure 4A coupled to a measuring meter is shown in at least one non-limiting embodiment.

[0020] Figure 5BAt least one non-limiting embodiment of a measurement system is shown that includes a sensor probe combination in a separated state and coupled to a measurement meter Figure 4B

[0021] Figure 6 At least one non-limiting embodiment of a block diagram of electrical components of a measurement system is shown Figure 5A

[0022] Figure 7 At least one non-limiting embodiment of a plan view of a sensor probe is shown

[0023] Figure 8 At least one non-limiting embodiment of a measurement system is shown that includes a sensor probe combination in a separated state and coupled to a measurement meter Figure 7

[0024] Figure 9 At least one non-limiting embodiment of a method of using one or more measurement instruments according to at least one embodiment is shown

[0025] In the drawings, like reference numerals refer to like elements throughout. The size and relative positions of elements in the drawings are not necessarily to scale as primarily the illustrations of these figures are intended to convey functional information to the skilled artisan rather than to delineate structural or dimensional limitations of the disclosed subject matter. For example, the shapes and relative angles of various elements illustrated in the drawings are not necessarily to scale and can have been arbitrarily exaggerated or rendered for the sake of illustrative clarity. DETAILED DESCRIPTION

[0026] One or more embodiments of the present disclosure relate to a sensor probe of a measurement system for measuring a plurality of electrical parameters (e.g., voltage, current) of a conductor and a method for measuring these electrical parameters. In at least one embodiment, the sensor probe integrates a Rogowski coil and a non-contact voltage sensor that are arranged relative to one another such that when positioned to measure a conductor, such as a wire, the Rogowski coil and the non-contact voltage sensor are held in place for measurement. Accordingly, when the sensor probe is taking measurements, a user can be able to separate from the sensor probe.

[0027] ​​​In at least one embodiment, the sensor probe includes a Rogowski coil forming a loop, and the non-contact sensor includes a sensor element on an inner surface of a pair of jaws of a spring-loaded clamp. The pair of jaws of the clamp are arranged to hold the conductor under test at a central region of the loop formed by the Rogowski coil, such that the conductor is in a suitable position for testing. More specifically, the pair of jaws of the clamp are arranged relative to the Rogowski coil such that the conductor under test extends perpendicularly through a central region of the plane of the loop formed by the Rogowski coil.

[0028] Generally, it is desirable to test the conductor in the central region of the Rogowski coil. That is, positioning the conductor under test in the central region of the Rogowski coil is the best location for accurate current readings. The arrangement of the non-contact sensor and the Rogowski coil optimizes the position of the conductor under test such that the non-contact sensor and the Rogowski coil can continuously measure the conductor under test without the need for continuous user manipulation or intervention.

[0029] The jaws of the clamp are configured to hold the conductor under test such that a surface of the insulating material surrounding the conductor under test is aligned with and abuts the non-contact sensor element. In some embodiments, the inner surface of the jaws is concave in shape so as to accommodate the conductor and facilitate alignment of the conductor relative to the non-contact sensing element. The recess of the first jaw can overlap with an end of the second jaw, further facilitating alignment of the conductor relative to the non-contact sensing element.

[0030] As used herein, a "non-contact" device or sensor is operable to detect an electrical parameter in an insulated conductor without the need for galvanic contact with the conductor. The conductor can be an energized insulated conductor, such as a wire.

[0031] In the following description, certain specific details are set forth in order to provide a thorough understanding of various embodiments of the disclosure. However, one skilled in the art will recognize that embodiments, in which one or more of the specific details are not utilized, or are utilized in other manners, are also within the scope of the disclosure.

[0032] In addition, reference throughout this specification to "one embodiment" or "an embodiment" means that a particular feature, structure, or characteristic described in connection with the embodiment is included in at least one embodiment. Furthermore, the appearances of the phrase "in at least one embodiment" in various places in the specification are not necessarily referring to the same embodiment. Particular features, structures, or characteristics of the various embodiments described herein can be combined in any suitable manner in additional embodiments.

[0033] Figure 1AAn isometric view of at least one non-limiting embodiment of a sensor probe 100 in a closed position is shown. The sensor probe 100 includes a non-contact sensor 102 and a Rogowski coil 104. The Rogowski coil 104 includes a conductive loop 106 configured to be placed around a conductor under test and sense an electric field of the conductor when the conductor is energized. The electric field sensed in the conductor is indicative of the current flowing through the conductor.

[0034] The non-contact sensor 102 includes a spring-loaded clamp 108 having a handle portion 110 and a jaw portion 112. The handle portion 110 and the jaw portion 112 are configured to move relative to each other about a pivot point 114. The jaw portion 112 includes a pair of jaws disposed in a central region of the Rogowski coil 104. A surface of one of the pair of jaws includes a non-contact sensing element 116 (shown in Figure 1D ). The non-contact sensing element 116 does not require an electrical connection to the conductor to measure an electrical parameter. The non-contact sensing element 116 is configured to sense a voltage of the conductor.

[0035] The handle portion 110 of the spring-loaded clamp 108 is coupled to the Rogowski coil 104. More specifically, the handle portion 110 of the spring-loaded clamp 108 forms a portion of the Rogowski coil 104, such as a receptacle for accommodating a lead of the Rogowski coil 104.

[0036] As Figure 1A best shown in the rest position, the pair of jaws of the jaw portion 112 are held in a closed position by a spring (not shown). As Figure 1B best shown, to place the pair of jaws in an open position, a user squeezes the handles of the handle portion 110 together, thereby opposing the spring that holds the pair of jaws closed. The pair of jaws of the jaw portion 112 move within the plane of the Rogowski coil. The pair of jaws of the jaw portion 112 move in opposite directions from each other and by the same amount. The position of the pair of jaws facilitates placement of the conductor under test in the central region of the loop of the Rogowski coil.

[0037] When the pair of jaws are in the open position, a conductor 120, such as a wire, can be placed between the pair of jaws. In response to releasing the handle portion 110, the spring of the spring-loaded clamp 108 causes the pair of jaws of the jaw portion 112 to close and thereby secure or clamp to the conductor 120. Figure 1C An isometric view of the jaw portion 112 of the sensor probe 100 holding a wire is shown. Figure 1A As Figure 1CAs shown in FIG. 1, the jaw portion 112 of the spring-loaded clamp 108 is arranged so that the conductor under test extends vertically through a central region of the loop of the Rogowski coil. The central region includes more than just the center point of the loop. In fact, the jaw portion 112 can be in the central region while also being offset from the center point of the loop. Generally, the central region includes about 30% of the area inside the loop about its center point. The spring-loaded clamp 108 helps to place the conductor under test in the proper position relative to the Rogowski coil 104.

[0038] As shown in FIG. 1, the jaw portion 112 of the spring-loaded clamp 108 is arranged so that the conductor under test extends vertically through a central region of the loop of the Rogowski coil. The central region includes more than just the center point of the loop. In fact, the jaw portion 112 can be in the central region while also being offset from the center point of the loop. Generally, the central region includes about 30% of the area inside the loop about its center point. The spring-loaded clamp 108 helps to place the conductor under test in the proper position relative to the Rogowski coil 104. Figure 1D As best shown in FIG. 2, the inner surface of one of the pair of jaws includes a non-contact sensing element 116. The non-contact sensing element 116 abuts the insulating portion of the conductor 120 and senses an electrical parameter of the conductor 120, such as voltage. That is, the clamp holds the conductor 120 so that the non-contact sensor of the sensing probe is placed within a threshold distance of the wire. The threshold distance is any distance that allows the non-contact sensor element to measure an electrical parameter of the conductor, such as voltage. In some embodiments, the threshold distance can be the distance so that the insulating material of the conductor abuts the non-contact sensor element of the non-contact sensor.

[0039] In some embodiments, the location of the pivot point 114 of the spring-loaded clamp 108 can be tangential to the loop 106 formed by the Rogowski coil 104, positioning the jaw in the central region of the loop of the Rogowski coil 104, and positioning the jaw so that the inner surface of the jaw, so that the non-contact voltage sensor element 116 is aligned with the conductor.

[0040] In various embodiments, the non-contact sensing element 116 on the inner surface of one of the jaw portions 112 of the jaw is a non-contact voltage sensor, a non-contact current sensor, a Hall effect element, a current transformer, a fluxgate sensor, an anisotropic magnetoresistive (AMR) sensor, a giant magnetoresistive (GMR) sensor, or other type of sensor for sensing an electrical parameter of an insulated conductor without requiring galvanic contact.

[0041] The inner surface of the jaw is concave in shape so as to accommodate the conductor and to help align the conductor relative to the non-contact sensing element 116. As shown in FIG. 1, the inner surface of the jaw is concave in shape so as to accommodate the conductor and to help align the conductor relative to the non-contact sensing element 116. Figure 1A In the illustrated embodiment as best shown in FIG. 2, the recess of the first jaw overlaps with one end of the second jaw, further helping to align the conductor relative to the non-contact sensing element 116, as shown in FIG. 2. Figure 1DThe first jaw is best shown. That is, the first jaw is longer than the second jaw and is curled toward the second jaw. The overlap of the first jaw can prevent the conductor from slipping away during clamping. In addition, the opening formed by the curvature of the recesses of the first and second jaws, as well as the spring of the spring-loaded clip, push the conductor held therein toward the non-contact sensing element 116.

[0042] The jaws of the non-contact sensor 102 are configured to accommodate conductors of various sizes. In one embodiment, the jaws are configured to accommodate diameters of about 6 millimeters (mm) to about 20 mm. Accordingly, the jaws are configured to open wider than 20 mm to accommodate and hold a 20 mm conductor.

[0043] The Rogowski coil 104 includes a conductive material having a first end and a second end forming first and second leads 117 and 118. Although not shown, an insulating material can surround exposed portions of the conductive material of the Rogowski coil 104. The first and second leads 117 and 118 are received into receptacles operably coupled to the sensing head 122. In one embodiment, the first lead 117 is permanently fixed to the receptacle, while the second lead 118 is removable from the respective receptacle. That is, the first lead 117 is not detachable from the receptacle to position the Rogowski coil 104 in place during use, while the second lead 118 is removable from the respective receptacle so that the Rogowski coil 104 can be placed in position during use.

[0044] In another embodiment, both the first and second leads 117 and 118 are removable from the receptacles. Accordingly, the Rogowski coil 104 can be completely detached from the rest of the sensor probe 100 and placed around a conductor to be measured that is under tight spatial constraints and then again fixed into the receptacles of the sensor probe 100.

[0045] To place the Rogowski coil 104 around the conductor 120 to be measured, the second lead 118 is removed from the receptacle and the conductor 120 is slid between the opening formed by the first lead 117 and the receptacle. The jaws of the non-contact sensor 102 clamp onto the conductor 120. The second lead 118 can be placed in the receptacle.

[0046] The position of the conductor under test relative to the Rogowski coil 104 is important for obtaining accurate measurements. The Rogowski coil 104 can be made of a sufficiently rigid material so that it is held in place around the conductor 120. That is, the Rogowski coil 104 surrounds the conductor 120 when the jaws of the spring-loaded clamp 108 hold the conductor under test 120. When the conductor is held by the jaws of the non-contact sensor 102, the relative position of the Rogowski coil 104 to the non-contact sensor 102 optimizes the placement of the conductor 120.

[0047] The non-contact sensing element 116 of the non-contact sensor is configured to measure electrical parameters, such as voltage, of the measured charged conductor, while the Rogowski coil 104 is configured to measure another electrical parameter, such as current, of the measured charged conductor. Accordingly, the sensor probe 100 is configured to perform continuous measurements using the non-contact sensor 102 and the Rogowski coil 104 without user intervention or manipulation.

[0048] Figure 2 A measurement system 300 is shown, including a sensor probe 100 of FIG. 1, which is coupled to a measuring instrument 200 via a wire 204 as shown or alternatively via a wireless connection. The measuring instrument 200 can be any suitable measuring instrument configured to communicate with the sensor probe 100. Accordingly, a non-contact sensor 102 and a Rogowski coil 104 of the sensor probe 100 are operatively coupled to the measuring instrument 200. For example, the sensor probe 100 and the measuring instrument 200 can be configured to transmit and receive signals therebetween. The measuring instrument 200 includes a housing, a user interface including a display 208, and at least one interface connector 210 for coupling with the wire 204 of the sensor probe. A sensing head 122 of the sensor probe 100 is operatively coupled to the measuring instrument 200 to provide and receive one or more signals therebetween. The sensing head 122 of the sensor probe may also include circuitry, such as amplification circuitry, processing circuitry, or control circuitry.

[0049] Figure 3 Showing includes Figure 2 A block diagram of the electrical components of the measurement system 300 and the sensor probe 100. As described above, the sensor probe 100 includes a non-contact sensor 102 and a Rogowski coil 104 operatively coupled to a sensor head 122, which is operatively coupled to the measuring instrument 200.

[0050] The sensor probe 100 includes one or more sensor heads 122 that are operably coupled to the non-contact sensor 102 and the Rogowski coil 104. In the illustrated embodiment, there is one sensor head 122. The sensor head can be located in the handle member 128 of the non-contact sensor 102. The one or more sensor heads 122 can include circuitry, such as amplification circuitry, processing circuitry, control circuitry, etc., as well as for sending signals between the non-contact sensor 102 and the Rogowski coil 104 and the measuring instrument 200. In some implementations, the sensor head 122 does not include further circuitry and operably couples the non-contact sensor 102 and the Rogowski coil 104 of the sensor probe to the lead 204 and the measuring instrument 200.

[0051] The measuring instrument 200 includes processing and / or control circuitry 212, a user interface 214 including a display 208, and a memory 216. The user interface 214 including the display 208 provides measurement results and other information to a user. The user interface 214 is also configured to receive user input information, such as measurement instructions or other information. The display 208 can provide readings and waveforms indicative of the measurements received from the sensor probe 100 for communication with a user. The display 208 can be any suitable type of display, such as a liquid crystal display (LCD), a light emitting diode (LED) display, an organic LED display, a plasma display, or an e-ink display. The user interface 214 can include various inputs and outputs, including audio, visual, touch screen, buttons, knobs, scroll wheels, etc.

[0052] The processing and / or control circuitry 212 of the measuring instrument 200 includes circuitry for sending, receiving, and processing signals to and from the sensing head 122 of the sensor probe 100. The processing and / or control circuitry 212 of the measuring instrument 200 is used to send control signals to the sensing head 122, as well as receive and process measurement signals received from the sensing head and / or directly from the non-contact sensor 102 and / or Rogowski coil 104. The processor and / or control circuitry 212 can process the received signals and output the signals to the user interface 214. The received signals can include signals indicative of electrical parameters such as voltage and current. The processor and / or control circuitry 212 can be configured to determine one or more electrical parameters such as power or phase angle. Additionally or alternatively, the processing and / or control circuitry 212 can include conditioning or conversion circuitry operable to condition or convert the signals into another form receivable by the measuring instrument, such as an analog form (e.g., 0V-1V) or a digital form (e.g., 8-bit, 16-bit, 64-bit). The control circuitry can include one or more processors (e.g., microcontrollers, DSPs, ASICs, FPGAs), one or more types of memory (e.g., ROM, RAM, flash memory, other non-transitory storage media), and / or one or more other types of processing or control-related components.

[0053] In some embodiments, the measuring instrument 200 is configured for wireless communication with another instrument. The wireless communication can include a wireless communication subsystem such as a Bluetooth® module, Wi-Fi® module, ZIGBEE® module, near field communication (NFC) module, etc. The measuring instrument can be operable to wirelessly communicate with an external system such as a computer, smart phone, tablet computer, personal digital assistant, etc. via the wireless communication subsystem in order to transmit measurement results to the external system or receive instruction signals or input information from the external system. Additionally or alternatively, the measuring instrument can include a wired communication subsystem such as a USB interface, etc.

[0054] Although not shown, the measuring instrument 200 includes a power source such as a battery or battery pack for supplying power to the various electrical components of the measuring instrument 200 and sensor probe 100, or includes an output for coupling to an external power source.

[0055] In use, the jaws of the spring-loaded clamp 108 of the sensor probe 100 hold the conductor 120 under test, while the Rogowski coil 104 is wrapped around the conductor 120, as shown in FIG. 1. The non-contact sensor 102 is positioned to sense the magnetic field generated by the current flowing through the conductor 120. The Rogowski coil 104 is positioned to sense the magnetic field generated by the current flowing through the conductor 120. The sensor probe 100 is connected to the measuring instrument 200, which is configured to receive signals from the sensor probe 100 and process the signals to determine one or more electrical parameters of the conductor 120 under test. Figure 1DThe Rogowski coil 104 is placed around the conductor under test 120 by removing one of the first lead 117 and the second lead 118, such as the second lead 118, from the socket, such that the conductor 120 can slide between the second lead 118 and the socket. The Rogowski coil is configured to sense the magnetic field generated by the live conductor for measuring the current in the conductor. The position of the conductor under test relative to the Rogowski coil 104 is important for obtaining accurate measurements. The electrical parameters, such as current and voltage, measured by the sensor probe 100 are provided to the measuring instrument 200. In at least one embodiment, the Rogowski coil 104 measures the current of the conductor under test and the non-contact sensor measures the voltage of the conductor under test.

[0056] Figure 4A and Figure 4B A sensor probe 100a according to another embodiment is shown. The sensor probe 100a includes a Rogowski coil 104a and a non-contact sensor 102a. The Rogowski coil 104a is substantially the same as the Rogowski coil 104 of the sensor probe 100 Figure 1A of the sensor probe 100. Further, the Rogowski coil 104a of the sensor probe 100a is configured to be separate from the non-contact sensor 102a. The non-contact sensor 102a is substantially similar to the non-contact sensor 102 of the sensor probe 100. Figure 1A of the sensor probe 100. Further, the Rogowski coil 104a of the sensor probe 100a is configured to be separate from the non-contact sensor 102a. The non-contact sensor 102a is substantially similar to the non-contact sensor 102 of the sensor probe 100.

[0057] The sensor probe 100a is configured such that the Rogowski coil 104a can be separated from the non-contact sensor 102a. Accordingly, the Rogowski coil 104a and the non-contact sensor 102a are each coupled to the measuring instrument 200 by separate leads 204.

[0058] The handle member 128 of the Rogowski coil 104a includes respective sockets for receiving the first lead 117 and the second lead 118. The shape of the handle member 128 including the sockets for receiving the first lead 117 and the second lead 118 corresponds to the shape of the conductive loop 106. In the illustrated embodiment, the handle member 128 has a first portion that is curved relative to a second portion. In another embodiment, the handle member 128 can have a curved shape that substantially corresponds to the curvature of the Rogowski coil 104a.

[0059] The first lead 117 can be fixed to the socket of the handle member 128, while the second lead 118 can be removably fixed to the socket of the handle member 128.Figure 4B The second lead 118 is shown removed from the socket of the handle member 128. In another embodiment, the second lead 118 can be fixed to the socket of the handle member 128, while the first lead 117 can be removably fixed to the socket of the handle member 128, or both leads can be removably fixed.

[0060] The spring-loaded clip 108a, although structurally not identical, is substantially the same as the spring-loaded clip 108 of Figure 1A The handle portion 110 of the non-contact sensor 102a is removably coupled to the handle member 128 of the Rogowski coil 104a. In combination with Figure 4B The handle portion 110a of the non-contact sensor includes a through-hole 130 that passes through the handle member 128 of the Rogowski coil 104a and secures the non-contact sensor 102a to the Rogowski coil 104a.

[0061] Figure 5A A measurement system 300a is shown that includes the sensor probes 100a coupled to the measuring instrument 200a by the respective leads 204, and the non-contact sensor 102a to the Rogowski coil 104a of the sensor probe 100a are shown coupled together in a coupled state. Figure 5B A measurement system 300a is shown that includes the sensor probes 100a coupled to the measuring instrument 200a by the respective leads 204, and the non-contact sensor 102a to the Rogowski coil 104a of the sensor probe 100a are shown coupled together in a coupled state. Figure 5A The sensor probes 100a of the measurement system 300a are capable of taking measurements with the non-contact sensor 102a and the Rogowski coil 104a in the combined state shown in Figure 5B the decoupled state shown in

[0062] Figure 6 A block diagram of the electrical components of the measurement system 300a including the measurement system 300 and the sensor probes 100a is shown. In addition to the non-contact sensor 102a and the Rogowski coil 104a being coupled to the respective sensing heads 122, Figure 6 The block diagram of the electrical components of the measurement system 300a has the same components as the above-described Figure 3The electrical components of the measurement system 300 are the same as those in the block diagram, and these components are configured to perform the same function. That is, the non-contact sensor 102a is coupled to the sensing head 122 in the handle portion 110a of the non-contact sensor 102a, and the Rogowski coil 104a is coupled to the sensing head 122 in the handle member 128 of the Rogowski coil 104a. Thus, the sensing head 122 of the non-contact sensor 102a has a first communication line with the measuring instrument 200, while the sensing head 122 of the Rogowski coil 104a has a second communication line with the measuring instrument 200.

[0063] Figure 7 A sensor probe 100b according to yet another embodiment is shown. Except for the non-contact sensor 102b, the structure and function of the sensor probe 100b are similar to... Figure 4A The sensor probe 100a is basically similar. For the sake of brevity, only the differences between the non-contact sensor 102b and the non-contact sensor 102a or the non-contact sensor 102 will be discussed.

[0064] The jaw portion 112 of the non-contact sensor 102b has the same structure and function as the jaw portion 112 of the sensor probe 100a. However, the handle portion 110b is different. Figure 1A The handle part 100 and Figure 4A The handle portion 100a. The handle portion 100b engages the jaw portion 112 by moving the first handle member 132 relative to the second handle member 134. That is, when the first handle member 132 moves toward the second handle member 134 in the direction indicated by the arrow, the jaws separate from each other. When the first handle member 132 is released, the spring of the non-contact sensor 102b moves the jaws toward each other. If the conductor to be tested is placed between the jaws before the first handle member 132 is released, the jaws clamp the conductor to be tested. In this embodiment, the pivot point 114 between the jaws and the handle portion 100b is arranged to be substantially tangent to the loop of the Rogowski coil 104a.

[0065] Typically, Rogowski coil 104a is the same as Rogowski coil 104a; however, the handle member 128 of Rogowski coil 104a is operatively coupled to non-contact sensor 102b, such that signals from non-contact sensor 102b are transmitted to sensing head 122.

[0066] Figure 8A measurement system 300b is shown that includes a sensor probe 100b coupled to a measurement instrument 200 through a wire 204 at an interface connector 210. Although the sensor probe 100b includes a single wire 204 for coupling to the measurement instrument 200, in other embodiments, the sensor probe 100b can be coupled to the measurement instrument 200 through two wires such that the non-contact sensor 102 is directly coupled to the measurement instrument 200 and the Rogowski coil 104a is directly and separately coupled to the measurement instrument 200, such as shown in the embodiments of Figure 5A and Figure 5B .

[0067] Figure 9 A method 900 of using the measurement systems 300, 300a, and 300b is shown in accordance with at least one embodiment. The method 900 includes holding a wire with the jaws of the sensing probe such that the non-contact sensor of the sensing probe is placed within a threshold distance of the wire and the wire is placed in a center region of the Rogowski coil of the sensor probe, as shown in block 902, and sensing at least one electrical parameter of the wire using the sensor probe while the non-contact sensor of the sensing probe remains in a first position and while the loop of the Rogowski coil of the sensor probe remains in a second position, as shown in block 904.

[0068] In view of the above disclosure, various examples of a sensor probe or measurement system can include any or a combination of the following features: a Rogowski coil forming a loop having a first lead and a second lead at opposite ends of the loop, the loop having a center region configured to accommodate a conductor to be measured.

[0069] a non-contact sensor coupled to the Rogowski coil, the non-contact sensor including a non-contact sensor element and a jaw having a pair of clamping jaws configured to hold the conductor, wherein the non-contact sensor element is configured to press the conductor to sense an electrical characteristic of the conductor.

[0070] The sensor probe or measurement system can include another feature such as the jaw of the non-contact sensor being permanently coupled to the Rogowski coil.

[0071] The sensor probe or measurement system can include another feature such as the jaw being configured to hold the conductor in a center region of the loop formed by the Rogowski coil. The center region of the loop is approximately 30% of the area inside the loop and can be centrally located about a center point of the area inside the loop.

[0072] The sensor probe or measurement system can include another feature such as further including one or more sensing heads configured to receive signals from the Rogowski coil and the non-contact sensor.

[0073] The sensor probe or measurement system can include another feature such as the pair of jaws being concave in shape, where the first jaw is longer than the second jaw.

[0074] The sensor probe or measurement system can include another feature such as the pair of clamping jaws being arranged to displace the same amount when moving between the closed position, the open position, and the held position. The sensor probe or measurement system can include another feature such as one or more sensing heads including a first sensing head and a second sensing head. The first sensing head can be operatively coupled to the Rogowski coil, and the second sensing head can be operatively coupled to the non-contact sensor. By achieving a smaller conductive travel distance between the sensor and the sensing heads, more sensing heads can provide better performance. Accordingly, fewer external influencing factors, such as nearby conductive wires, capacitive stray fields, etc., can influence the measurement signal, and a higher amplitude of the measurement signal can be achieved, resulting in better accuracy.

[0075] The sensor probe or measurement system can include another feature such as the non-contact sensor configured to be separated from the Rogowski coil in a separated state, where the non-contact sensor and the Rogowski coil are operable in the separated state.

[0076] The sensor probe or measurement system can include another feature such as the non-contact sensor configured to be separated from the Rogowski coil.

[0077] The sensor probe or measurement system can include another feature such as a first lead permanently fixed to the first socket, and a second lead configured to be removably fixed to the second lead.

[0078] In view of the foregoing disclosure, various examples of the sensor probe or measurement system can include any one or combination of the following features: a sensor probe or measurement system including a sensor probe configured to sense an electrical parameter in a conductor. The sensor probe includes a Rogowski coil having first and second leads at opposite ends, the Rogowski coil having a central region configured to accommodate the conductor to be measured. The sensor probe further includes a non-contact sensor coupled to the Rogowski coil. The non-contact sensor includes a non-contact sensor element and a clamp having a pair of clamping jaws. The pair of clamping jaws are configured to hold the conductor, and the non-contact sensor element is configured to press the conductor to sense an electrical characteristic of the conductor.

[0079] The clamp can be a spring-loaded clamp having a pair of clamping jaws in a central region of the Rogowski coil. The pair of clamping jaws are configured to hold the conductor under test in the central region of the Rogowski coil with the non-contact sensor element on an inner surface of one of the pair of clamping jaws. The measurement system also includes a measuring instrument operably coupled to the sensor probe, the measuring instrument including control circuitry configured to send signals to and receive signals from the sensor probe.

[0080] The sensor probe or measurement system can include another feature such as the non-contact sensor being removably coupled to the Rogowski coil. The non-contact sensor and the Rogowski coil are configured to operate when decoupled.

[0081] The sensor probe or measurement system can include another feature such as the first lead and the second lead of the Rogowski coil being housed in a socket of a handle member of the Rogowski coil. The spring-loaded clamp includes a through hole in which the handle member of the Rogowski coil is located.

[0082] The sensor probe or measurement system can include another feature such as the sensor probe including a first wire coupling the Rogowski coil to the measuring instrument and a second wire coupling the non-contact sensor to the measuring instrument.

[0083] The sensor probe or measurement system can include another feature such as the non-contact sensor being permanently fixed to the Rogowski coil.

[0084] The sensor probe or measurement system can include another feature such as the first lead being permanently fixed to the first socket and the second lead being configured to be removably fixed to the second lead.

[0085] In view of the above disclosure, various examples of the method of operation can include any or a combination of the following features: removing the non-contact sensor from a first location, removing the Rogowski coil from a second location, and decoupling the non-contact sensor from the Rogowski coil. The method can also include moving the handles of the clamp toward each other to move the pair of jaws away from each other or moving the first handle of the clamp toward the second handle to move the pair of jaws away from each other. The method can also include placing the pair of jaws around an insulated conductor and releasing the handles to allow the pair of jaws to hold the insulated conductor.

[0086] The method can include holding the wire with the jaws of the sensing probe such that the non-contact sensor of the sensing probe is placed within a threshold distance of the wire and the wire is placed in a central region of the Rogowski coil of the sensor probe. The at least one electrical parameter of the wire is sensed using the sensor probe while the non-contact sensor of the sensing probe is held in the first position and while the Rogowski coil of the sensor probe is held in the second position.

[0087] The method can include another feature such as removing the non-contact sensor from the first position and removing the Rogowski coil from the second position and decoupling the non-contact sensor from the Rogowski coil.

[0088] The method can include another feature decoupling the non-contact sensor from the Rogowski coil, sensing a first electrical parameter of the wire using the non-contact sensor, and sensing a second electrical parameter of the wire using the Rogowski coil.

[0089] The method can include another feature including sending a first signal indicative of the first electrical parameter to the measuring instrument and sending a second signal indicative of the second electrical parameter to the measuring instrument. The first signal and the second signal can be sent to the measuring instrument through first and second wires, respectively. Alternatively, the first signal and the second signal can be sent to the measuring instrument through the same wire.

[0090] The method can include another feature such as moving the handles of the jaws toward each other to move the pair of jaws away from each other, placing the pair of jaws around the insulated wire, and releasing the handles to allow the pair of jaws to hold the insulated wire.

[0091] The method can include another feature such as moving a first handle of the jaws toward a second handle to move the pair of jaws away from each other, placing the pair of jaws around the insulated wire, and releasing the first handle to allow the pair of jaws to hold the insulated wire.

[0092] The method can include another feature such as sensing the current using the Rogowski coil and sensing the voltage using the non-contact sensor.

[0093] The method can include another feature such as the pair of jaws holding the insulated wire extending perpendicularly through the central region of the Rogowski coil.

[0094] The various embodiments described above can be combined to provide further embodiments. All of the U.S. patents, U.S. patent application publications, U.S. patent applications, foreign patents, foreign patent applications, and non-patent publications referred to in this specification are hereby incorporated by reference, in their entireties. Where necessary, aspects of the embodiments can be modified to employ the concepts of the various patents, patent applications, and patent publications to provide yet further embodiments.

[0095] These and other changes can be made to the embodiments in light of the above Detailed Description. In general, in the following claims, the terms used are to be construed as limiting, unless otherwise indicated such as claimed in the appended claims, shall include all possible embodiments of the application with the scope of the description. Accordingly, the application is not limited by the disclosure, which is intended to be illustrative only.

Claims

1. A sensor probe comprising: a Rogowski coil forming a loop having a first lead and a second lead at opposite ends of the loop, the loop having a central region configured to accommodate a conductor; and a non-contact sensor coupled to the Rogowski coil, the non-contact sensor including a non-contact sensor element and a clamp having a pair of clamping jaws positioned to hold the conductor in the central region of the loop, wherein the non-contact sensor element is configured to press against the conductor to sense an electrical characteristic of the conductor, wherein the non-contact sensor is configured to be separable from the Rogowski coil in a separated state, wherein the non-contact sensor and the Rogowski coil are operable in the separated state, wherein the clamp has a first handle member and a second handle member, the first handle member moving relative to the second handle member to engage the pair of clamping jaws, wherein the second handle member forms a receptacle to accommodate one of the first lead and the second lead, the first handle member is positioned within the loop of the Rogowski coil, and a pivot point between the pair of clamping jaws and the first handle member and the second handle member is disposed tangential to the loop.

2. The sensor probe of claim 1, wherein the clamp of the non-contact sensor is permanently coupled to the Rogowski coil.

3. The sensor probe of claim 1, wherein the jaws of the clamp are configured to hold the conductor such that a surface of an insulating material surrounding the conductor is aligned with and abuts the non-contact sensor element.

4. The sensor probe of claim 1, wherein the central region of the loop is 30% of an area inside the loop.

5. The sensor probe of claim 4, wherein the central region is centrally located about a center point of the area inside the loop.

6. The sensor probe of claim 1, further comprising one or more sense heads configured to receive signals from the Rogowski coil and the non-contact sensor.

7. The sensor probe of claim 1, wherein the pair of clamping jaws includes a first jaw and a second jaw that are concave in shape, wherein the first jaw is longer than the second jaw.

8. The sensor probe of claim 1, wherein the first lead and the second lead of the Rogowski coil are each removably secured to a respective receptacle.

9. A measurement system comprising: a sensor probe configured to sense an electrical parameter in a conductor, the sensor probe including a Rogowski coil having a first lead and a second lead at opposite ends, the Rogowski coil having a central region configured to accommodate a conductor under test; a non-contact sensor coupled to the Rogowski coil, the non-contact sensor including a non-contact sensor element and a clamp having a pair of clamping jaws positioned to hold the conductor in the central region of the Rogowski coil, wherein the non-contact sensor element is configured to press against the conductor to sense an electrical characteristic of the conductor; and a measurement instrument operably coupled to the sensor probe, the measurement instrument including control circuitry configured to send and receive signals to and from the sensor probe, wherein the non-contact sensor is removably coupled to the Rogowski coil, wherein the non-contact sensor and the Rogowski coil are configured to operate when decoupled; wherein the clamp has a first handle member and a second handle member, the first handle member moving relative to the second handle member to engage the pair of clamping jaws, wherein the second handle member forms a receptacle for receiving one of the first and second lead wires, the first handle member is positioned within a loop of the Rogowski coil, and a pivot point between the pair of clamping jaws and the first and second handle members is disposed tangential to the loop.

10. The measurement system of claim 9, wherein the sensor probe includes a first lead wire coupling the Rogowski coil to the measurement instrument and a second lead wire coupling the non-contact sensor to the measurement instrument.

11. The measurement system of claim 9, wherein the non-contact sensor is permanently affixed to the Rogowski coil.

12. The measurement system of claim 9, wherein the first lead wire is permanently affixed to a first receptacle and the second lead wire is configured to be removably affixed to a second receptacle.

13. A method for measuring electrical parameters using a sensor probe according to any one of claims 1-8, comprising: holding a lead wire with a clamp of a sensor probe such that: (1) a non-contact sensor of the sensor probe is placed within a threshold distance of the lead wire; and (2) the lead wire is placed in a central region of a Rogowski coil of the sensor probe; and sensing at least one electrical parameter of the lead wire using the sensor probe while the non-contact sensor of the sensor probe remains within the threshold distance and while the lead wire is in the central region of the Rogowski coil.

14. The method of claim 13, wherein sensing the at least one electrical parameter of the lead wire using the sensor probe comprises: sensing current using the Rogowski coil and voltage within the threshold distance using the non-contact sensor.

15. The method of claim 13, comprising: separating the non-contact sensor from the Rogowski coil; sensing a first electrical parameter of the lead wire using the non-contact sensor; and sensing a second electrical parameter of the lead wire using the Rogowski coil.

16. The method of claim 15, comprising sending a first signal indicative of the first electrical parameter to a measuring instrument and sending a second signal indicative of the second electrical parameter to the measuring instrument.

17. The method of claim 16, wherein the first signal and the second signal are sent to the measuring instrument through first and second conductors, respectively.

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