Method and system for mtie rapid analysis and method for analyzing mtie index analysis curve

Abstract

The MTIE rapid analysis method takes time error samples xi at t0, defines a sliding window length, analyzes the minimum and maximum values of time interval error data TIE, and puts them into cache MinCache and MaxCache respectively, when n>1, calls the cache values MinCache[k] and MaxCache[k] of n-1 to calculate the minimum and maximum values of time interval error data TIE and put them into cache, and substitutes the obtained MinCache[k] and MaxCache[k] into the formula to calculate MTIE(n)=Max[k]{MaxCache[k]-MinCache[k]}, k=1..N-n, i=k..k+n; the MTIE index analysis curve analysis method fits all the MTIE values obtained by calculation into an index analysis curve and compares it with a corresponding standard MTIE template. The MTIE rapid analysis system comprises a collection module for collecting time error samples xi; a cache module for caching MinCache[k] and MaxCache[k]; a first calculation module, a second calculation module and a third calculation module for calculating the MTIE value. The present application greatly improves the analysis efficiency.

Description

[Technical Field]

[0001] This application relates to the field of time-frequency synchronization in communication technology, and in particular to an analysis method for MTIE. [Background Technology]

[0002] Modern telecommunications networks require a high degree of synchronization between network transmission elements, and timing is crucial for all network transmission elements in the SDH architecture. However, phase variations in the reference clock frequency that controls the synchronization of network elements can introduce errors at various stages of the network.

[0003] One measure of timing error in synchronous digital transmission systems is the Maximum Time Interval Error (MTIE), which is derived from a set of timing error samples. In SDH systems, timing error samples are referred to as "time interval errors" or TIE samples, and a standardized measure of the maximum timing variation, MTIE, is defined accordingly. MTIE is a measure of signal time variation and can also provide information about signal frequency offset and phase transients. MTIE values, along with other parameters, are used to evaluate the performance of equipment and systems, and are often used to diagnose faults that have formed and impair customer service.

[0004] The ITU-T G.810 standard provides a specific MTIE evaluation formula.

[0005] X1, X2, ..., Xn (X(1..N)): Sample data of time error actually measured within a measurement period. Specifically, for a given time delay error value, samples are taken at a sampling interval of t0, and finally, a sample data result of {x0, x1, x2, ...} with equal intervals is formed.

[0006] MTIE (Maximum Time Interval Error): refers to the maximum phase change within a given sliding observation window time n*t0 within a measurement period.

[0007] The relationship between MTIE and X(1..N) can be defined by the following formula:

[0008]

[0009] in,

[0010] N: The total number of samples obtained by sampling at time interval t0.

[0011] t0: Time error sampling interval;

[0012] n: Observation of the sliding window series 1…N-1

[0013] xi: Time error sample;

[0014] While the MTIE formula works fine for small datasets, it becomes unacceptable for large sample sizes. Relying solely on the formula for computer processing and analysis results in extremely long analysis times. For example, analyzing 10 million data points could take over 30 days on a standard office computer, making the time commitment unacceptable. Analyzing massive datasets leads to enormous time consumption, consuming significant computer resources and causing inconvenience for testing personnel. Therefore, addressing the time-consuming nature of time-frequency instrument data processing and analysis is crucial. [Summary of the Invention]

[0015] The purpose of this application is to provide a rapid MTIE analysis method, an MTIE index analysis curve analysis method, and a rapid MTIE analysis system.

[0016] To achieve the purpose of this application, the following technical solution is provided:

[0017] This application provides a fast MTIE analysis method, which includes:

[0018] Time error samples xi are taken at time interval t0 to obtain the original time interval error data TIE. The original time interval error data TIE refers to the phase difference of a given signal relative to a reference clock at a specific time point.

[0019] Given a sliding window t = nt0, calculate the maximum time interval error MTIE using the maximum and minimum values ​​of the time interval error data TIE within the sliding window.

[0020]

[0021] N: The total number of samples obtained by sampling at time interval t0.

[0022] t0: Time error sampling interval,

[0023] n: Observe the sliding window series 1…N-1,

[0024] xi: Time error sample;

[0025] Configure the cache MinCache and MaxCache.

[0026] When n=1, the minimum value of the time interval error data TIE for each analysis is assigned to MinCache[k], and the maximum value is assigned to MaxCache[k].

[0027] Calculate MTIE(1) = Max[k]{MaxCache[k]-MinCache[k]}, k = 1..N-1;

[0028] When n>1, the minimum value obtained by further analysis of the previous cache MinCache[k] is assigned to the intermediate variable MinV, and the maximum value obtained by further analysis of the previous cache MaxCache[k] is assigned to the intermediate variable MaxV. The obtained MinV is cached in MinCache[k] and the obtained MaxV is cached in MaxCache[k] for use by the next k value.

[0029] Calculate Max[k] = MaxV - MinV for each iteration;

[0030] Calculate MTIE(n) = Max[k], k = 1..Nn;

[0031] Finally, calculate MTIE(N-1) = Max[1], k = 1..N-(N-1).

[0032] In some implementations, all the obtained MTIE values ​​are fitted to obtain an MTIE index analysis curve, which can then be further compared and analyzed with the template.

[0033] In some implementations, discrete TIE sampling points of T = N * t0 are fitted into a curve with time intervals of t0. In the MTIE fast analysis method, the sliding window slides on the curve, and there are i discrete TIE points within the sliding window t = it0. The phase error of the sampling period it0 is: TIE(i) = x(it0), i = 0, 1, 2, N.

[0034] An analysis method for the MTIE index analysis curve, comprising:

[0035] The input signal is compared with the reference signal, and a time error sample xi is taken at time interval t0.

[0036] Then, the measured time error sample xi is analyzed using the MTIE rapid analysis method described above to obtain all MTIE values ​​of the index analysis curve;

[0037] Then, the analysis curve of this indicator is compared with the series of MTIE templates of the corresponding ITU-T standards G.811, G.812, G.813, G.823, G.8261, G.8262, and G.8273.

[0038] A fast MTIE analysis method, comprising:

[0039] The input signal and the reference signal are compared, and a time error sample xi is taken at a time interval t0 to obtain the original time interval error data TIE.

[0040] Given a sliding window t = nt0, analyze the maximum and minimum values ​​of the time interval error data TIE for each slide of the sliding window.

[0041] Configure a maximum value cache (MaxCache) and a minimum value cache (MinCache). The minimum value of the time interval error data (TIE) for each analysis will be stored in MinCache, and the maximum value in MaxCache.

[0042] When n=1, calculate the maximum time interval error (MTIE) using MinCache[k] and MaxCache[k].

[0043] MTIE(1)=Max[k]{MaxCache[k]-MinCache[k]}, k=1..N-1;

[0044] When n>1, the maximum value obtained by analyzing the previous maximum value cache MaxCache[k] and minimum value cache MinCache[k] is assigned to the intermediate variable MaxV and cached in the maximum value cache MaxCache[k] at the same time; the minimum value obtained by analyzing is assigned to the intermediate variable MinV and cached in the minimum value cache MinCache[k] at the same time.

[0045] Calculate MTIE(n) for each iteration.

[0046] MTIE(n)=Max[k]=Max[k]{MaxV-MinV}, k=1..Nn;

[0047] Finally, calculate MTIE(N-1) = Max[1], k = 1..N-(N-1).

[0048] N: The total number of samples obtained by sampling at time interval t0.

[0049] t0: Time error sampling interval;

[0050] n: Observation of the sliding window series 1…N-1

[0051] xi: Time error sample.

[0052] A rapid MTIE analysis method is proposed, which calculates the MTIE value using the MTIE evaluation formula.

[0053] in,

[0054] N: The total number of samples obtained by sampling at time interval t0.

[0055] t0: Time error sampling interval,

[0056] n: the number of sampling intervals within time t, t = n * t0

[0057] xi: Time error sample;

[0058] Given a sliding window t = nt0, analyze the minimum and maximum values ​​of the time interval error data TIE within each sliding window.

[0059] Configure the cache MinCache and MaxCache.

[0060] When n=1, use the cache MinCache[k] to store the minimum value of the time interval error data TIE for each analysis when n=1, and use the cache MaxCache[k] to store the minimum value of the time interval error data TIE for each analysis when n=1. Substitute the obtained MinCache[k] and MaxCache[k] into the formula to calculate MTIE(t0), k=1..N-1, i=k..k+n;

[0061] When n>1, the minimum value of the time interval error data TIE is calculated by calling the cache value MinCache[k] at n-1 and assigned to the intermediate variable MinV, and simultaneously cached in the minimum value cache MinCache[k]. The maximum value of the time interval error data TIE is calculated by calling the cache value MaxCache[k] at n-1 and assigned to the intermediate variable MaxV, and simultaneously cached in the maximum value cache MaxCache[k]. The obtained MinCache[k] and MaxCache[k] are substituted into the formula to calculate the MTIE(nt0) value, k=1..Nn, i=k..k+n.

[0062] This application also provides an MTIE rapid analysis system, which includes:

[0063] The acquisition module takes time error samples xi at time intervals t0; and defines a sliding window length t = it0, allowing the sliding window to slide to collect samples.

[0064] The caching module allows you to configure the MinCache and MaxCache caches.

[0065] The first analysis module, when n=1, analyzes the minimum and maximum values ​​of the time interval error data TIE of each sliding window, and puts them into the caches MinCache[k] and MaxCache[k] respectively;

[0066] The second analysis module, when n>1, calls the cache values ​​MinCache[k] and MaxCache[k] at n-1 to analyze the minimum and maximum values ​​of the time interval error data TIE respectively, assigns them to the intermediate variables MinV and MaxV, and caches them in MinCache[k] and MaxCache[k] at the same time;

[0067] The third analysis module substitutes the MinCache[k] and MaxCache[k] obtained from each analysis into the formula to calculate the MTIE value;

[0068] MTIE(n)=Max[k]{MaxCache[k]-MinCache[k]}, k=1..Nn, i=k..k+n;

[0069] In some implementations, at least two of the first analysis module, the second analysis module, and the third analysis module are the same analysis module.

[0070] Compared with the prior art, this application has the following advantages:

[0071] This application first measures the time interval error data of the time-frequency signal under test on a time-frequency instrument, and then uses a rapid analysis algorithm to analyze the measured time interval error data to obtain the required index analysis curve. This index analysis curve is then compared with the corresponding ITU-T standards G.811, G.812, G.813, G.823, G.8261, G.8262, G.8273 and other series of MTIE templates to determine whether the result is acceptable.

[0072] The optimized fast algorithm described in this application ultimately yields the above solution through formula decomposition and statistics, and its effectiveness in improving time consumption has been greatly enhanced in practical applications. Using this calculation method, the MTIE computation that originally required 30 days can be reduced to just a few hours in actual tests. This significantly improves analysis efficiency, making real-time MTIE analysis possible. [Attached Image Description]

[0073] Figure 1 This is a schematic diagram of the MTIE rapid analysis method of this application.

Detailed Implementation Methods

[0074] Exemplary embodiments of this application will now be described in more detail. While exemplary embodiments of this application are shown in the following description, it should be understood that this application may be implemented in various forms and should not be limited to the embodiments set forth herein. Rather, these embodiments are provided to enable a more thorough understanding of this application and to fully convey the scope of this application to those skilled in the art.

[0075] Please see Figure 1 The MTIE rapid analysis method of this application includes:

[0076] Time error samples xi are taken at time interval t0 to obtain the original time interval error data TIE. The original time interval error data TIE refers to the phase difference of a given signal relative to a reference clock at a specific time point.

[0077] Given a sliding window t = nt0, the maximum time interval error MTIE is calculated using the maximum and minimum values ​​of the time interval error data TIE within the sliding window. In other words, it is the maximum phase change within all given sliding windows over a measurement period T.

[0078]

[0079] N: The total number of samples obtained by sampling at time interval t0.

[0080] t0: Time error sampling interval,

[0081] n: Observe the sliding window series 1…N-1,

[0082] xi: Time error sample;

[0083] After decomposing the formula, it was found that the calculated Max[k]{Max(x[i])-Min(x[i])} can be used in the next calculation without needing to be recalculated each time. This greatly saves computer resources, thus enabling fast MTIE analysis.

[0084] Through step-by-step analysis, it was discovered that by placing the maximum and minimum values ​​among each sample data point in the intermediate caches MinCache and MaxCache from the very first analysis, and then using MinCache and MaxCache to calculate the MTIE(n) value for each iteration, it was found that after each calculation of the current MTIE(n) value, the MinCache and MaxCache caches to be used for the next MTIE(n+1) analysis could be processed simultaneously during the analysis process, thus saving a significant amount of analysis time.

[0085] Therefore, the optimized computation scheme of this application is adopted, and caches MinCache and MaxCache are set.

[0086] When n=1, the minimum value of the time interval error data TIE for each analysis is assigned to MinCache[k], and the maximum value is assigned to MaxCache[k].

[0087] Calculate MTIE(1) = Max[k]{MaxCache[k]-MinCache[k]}, k = 1..N-1;

[0088] When n>1, the minimum value obtained by further analysis of the previous cache MinCache[k] is assigned to the intermediate variable MinV, the maximum value obtained by further analysis of the previous cache MaxCache[k] is assigned to the intermediate variable MaxV, and the obtained MinV is cached in MinCache[k] and the obtained MaxV is cached in MaxCache[k].

[0089] Calculate Max[k] = MaxV - MinV for each iteration;

[0090] Calculate MTIE(n) = Max[k], k = 1..Nn;

[0091] Finally, calculate MTIE(N-1) = Max[1], k = 1..N-(N-1).

[0092] This application also provides a method for analyzing the MTIE index curve, which includes:

[0093] The input signal is compared with the reference signal, and a time error sample xi is taken at time interval t0.

[0094] Then, the measured time error sample xi is analyzed using the MTIE rapid analysis method described above to obtain all MTIE values ​​of the index analysis curve;

[0095] Then, the analysis curve of this indicator is compared with the series of MTIE templates of the corresponding ITU-T standards G.811, G.812, G.813, G.823, G.8261, G.8262, and G.8273.

[0096] This application also provides an MTIE rapid analysis system, which includes:

[0097] The acquisition module takes time error samples xi at time intervals t0; and defines a sliding window length t = it0, allowing the sliding window to slide to collect samples.

[0098] The caching module allows you to configure the MinCache and MaxCache caches.

[0099] The first analysis module, when n=1, analyzes the minimum and maximum values ​​of the time interval error data TIE of each sliding window, and puts them into the caches MinCache[k] and MaxCache[k] respectively;

[0100] The second analysis module, when n>1, calls the cache values ​​MinCache[k] and MaxCache[k] at n-1 to analyze the minimum and maximum values ​​of the time interval error data TIE respectively, assigns them to the intermediate variables MinV and MaxV, and caches them in MinCache[k] and MaxCache[k] at the same time;

[0101] The third analysis module substitutes the MinCache[k] and MaxCache[k] obtained from each analysis into the formula to calculate the MTIE value;

[0102] MTIE(n)=Max[k]{MaxCache[k]-MinCache[k]}, k=1..Nn, i=k..k+n;

[0103] In some implementations, at least two of the first analysis module, the second analysis module, and the third analysis module are the same analysis module.

[0104] The above description is only a preferred embodiment of this application. The scope of protection of this application is not limited thereto. Any equivalent transformation based on the technical solution of this application shall fall within the scope of protection of this application.

Claims

1. A rapid MTIE analysis method, characterized in that, It includes: Taking time error samples xi at time interval t0, the original time interval error data TIE is obtained. Given a sliding window t = nt0, calculate the maximum time interval error MTIE using the maximum and minimum values ​​of the time interval error data TIE within the sliding window; N: The total number of samples obtained by sampling at time interval t0. t0: Time error sampling interval, n: Observe the sliding window series 1…N-1, xi: Time error sample; Configure the cache MinCache and MaxCache. When n=1, the minimum value of the time interval error data TIE for each analysis is assigned to MinCache[k], and the maximum value is assigned to MaxCache[k]. Calculate MTIE(1) = Max[k]{MaxCache[k]-MinCache[k]}, k = 1..N-1; When n>1, the minimum value obtained by further analysis of the previous cache MinCache[k] is assigned to the intermediate variable MinV, and the maximum value obtained by further analysis of the previous cache MaxCache[k] is assigned to the intermediate variable MaxV. The obtained MinV is cached in MinCache[k] and the obtained MaxV is cached in MaxCache[k] for use by the next k value. Calculate Max[k] = MaxV - MinV for each iteration; Calculate MTIE(n) = Max[k], k = 1..Nn; Finally, calculate MTIE(N-1) = Max[1], k = 1..N- (N-1).

2. The MTIE rapid analysis method as described in claim 1, characterized in that, The obtained MTIE values ​​are fitted to obtain the MTIE index analysis curve.

3. The MTIE rapid analysis method as described in claim 1, characterized in that, Phase error of sampling period it0: TIE(i)=x(it0), i=0, 1, 2, N; The discrete TIE sampling points of T = N*t0 are fitted into a curve with the time coordinate of t0 intervals. The sliding window slides on the curve, and there are i discrete TIE points in the sliding window t = it0.

4. A method for analyzing the MTIE index curve, comprising: The input signal is compared with the reference signal, and a time error sample xi is taken at time interval t0. The feature is that the MTIE rapid analysis method as described in claim 1 is used to analyze the measured time error sample xi to obtain all MTIE values ​​of the index analysis curve; Then, the analysis curve of this indicator is compared with the series of MTIE templates of the corresponding ITU-T standards G.811, G.812, G.813, G.823, G.8261, G.8262, and G.8273.

5. A rapid MTIE analysis system, characterized in that, It includes, The acquisition module takes time error samples xi at time intervals t0; Define the sliding window length t = it0, and let the sliding window slide to collect samples; The caching module allows you to configure the MinCache and MaxCache caches. The first analysis module, when n=1, analyzes the minimum and maximum values ​​of the time interval error data TIE for each sliding window, and puts them into the caches MinCache[k] and MaxCache[k] respectively; The second analysis module, when n>1, calls the cache values ​​MinCache[k] and MaxCache[k] at n-1 to analyze the minimum and maximum values ​​of the time interval error data TIE respectively, assigns them to the intermediate variables MinV and MaxV, and caches them in MinCache[k] and MaxCache[k] at the same time; The third analysis module substitutes the MinCache[k] and MaxCache[k] obtained from each analysis into the formula to calculate the MTIE value; MTIE(n)=Max[k]{MaxCache[k]-MinCache[k]}, k=1..Nn, i=k..k+n.

6. The MTIE rapid analysis system as described in claim 5, characterized in that, At least two of the first analysis module, the second analysis module, and the third analysis module are the same analysis module.

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