A method and device for testing interface resistance of various thermoelectric components

Abstract

The present invention belongs to the technical field of detection equipment, and specifically relates to an interface resistance testing method suitable for various forms of thermoelectric elements, comprising the following steps: fixing a first electrode cap to a first fixed electrode platform, embedding a second electrode cap in an electrode cavity, placing a spring between the second electrode cap and the electrode cavity, making one end of the spring abut against the second electrode cap, making the other end of the spring abut against a limiting screw, rotating and adjusting the relative position of the limiting screw and the electrode cavity to fix the compression of the spring, and fixing the sample between the first electrode cap and the second electrode cap. The present invention can realize the function of flexibly adjusting the type of spring and its compression, ensure that the pressure between the sample and the electrode cap is equal each time it is measured, achieve good contact between the sample and the electrode cap, and significantly improve the accuracy and consistency of the test results. In addition, the present invention also provides an interface resistance testing device suitable for various forms of thermoelectric elements.

Description

Technical Field

[0001] The present invention belongs to the technical field of detection equipment, and in particular relates to an interface resistance testing method and device applicable to various types of thermoelectric elements. Background Art

[0002] As we all know, thermoelectric materials are a type of special functional material that uses the Seebeck effect to directly convert thermal energy into electrical energy. A thermoelectric element is formed by welding the two ends of a block of thermoelectric material together with electrodes or guide plates. The resistance of a thermoelectric element is a key indicator of its performance.

[0003] Building upon traditional thermoelectric elements, various new types of thermoelectric elements have emerged. With technological advancements, the requirements for thermoelectric conversion efficiency continue to increase. Cascading technology, combining high, medium, and low temperature thermoelectric materials, can significantly improve this efficiency. However, one of the challenges of cascading technology is ensuring low resistance at the interface between materials in different temperature ranges. Furthermore, the interface resistance of thermoelectric elements directly impacts thermoelectric conversion efficiency and is crucial for evaluating thermoelectric material performance.

[0004] However, testing the interface resistance of thermoelectric components presents a significant challenge. In existing traditional testing methods and devices, the pressure between the electrode and the thermoelectric component is not fixed, and the pressure between the electrode and the specimen is uncontrollable. This makes it difficult to maintain consistent pressure between the specimen and the electrode during each test. Furthermore, it is difficult to adjust the pressure specifically when testing specimens of different sizes, resulting in poor test consistency and accuracy. Therefore, a new technical solution is urgently needed to address these issues. Summary of the Invention

[0005] One of the purposes of the present invention is to address the shortcomings of the existing technology and provide an interface resistance testing method suitable for various types of thermoelectric elements, which can flexibly adjust the type of spring and its compression amount, ensure that the pressure between the sample and the electrode cap is equal each time it is measured, achieve good contact between the sample and the electrode cap, and significantly improve the accuracy and consistency of the test results.

[0006] In order to achieve the above object, the present invention adopts the following technical solutions:

[0007] A method for testing interface resistance of various thermoelectric components, comprising the following steps:

[0008] S1. Fix the first electrode cap to the first fixed electrode platform via the second nut, embed the second electrode cap in the electrode cavity, place a spring between the second electrode cap and the electrode cavity, make one end of the spring abut against the second electrode cap, make the other end of the spring abut against the limiting screw, thread the limiting screw into the inner wall of the electrode cavity, rotate and adjust the relative position of the limiting screw and the electrode cavity to fix the compression of the spring, and fix the sample between the first electrode cap and the second electrode cap;

[0009] S2. Clamp the sample with the first electrode cap and the second electrode cap in the X-axis direction, secure the first wire nose to the first electrode cap via a first nut, connect the first electrode cap to a high-frequency AC power supply via the first wire nose, secure the second wire nose to the second electrode cap via a third nut, connect the second electrode cap to the high-frequency AC power supply via the second wire nose, and measure the current flowing through the sample interface in a closed loop using the first electrode cap and the second electrode cap;

[0010] S3. Install the first telescopic probe on the first XY-axis displacement platform, and install the second telescopic probe on the second XY-axis displacement platform, so that the sample contacts the first telescopic probe and the second telescopic probe in the Y-axis direction, and the first telescopic probe and the second telescopic probe are respectively placed on both sides of the sample interface, and adjust the first XY-axis displacement platform and the second XY-axis displacement platform so that the contact points of the first telescopic probe, the second telescopic probe and the sample are at a very small distance from the sample interface, and use the first telescopic probe and the second telescopic probe to test the voltage value at the sample interface in the closed loop, and calculate the interface resistance of the thermoelectric element according to Ohm's law using the measured current and voltage values.

[0011] As an improvement to the testing method of the present invention, S1 further includes: passing the lead screw through the limit screw and the spring in sequence, securing the lead screw to the limit screw via a fourth nut, threading the lead screw to the second electrode cap, securing the electrode cavity to the second fixed electrode platform, mounting the second fixed electrode platform on a manual lead screw displacement platform, and adjusting the position of the second electrode cap relative to the first electrode cap by moving the manual lead screw displacement platform. The lead screw can improve the efficiency and stability of the test operation.

[0012] As an improvement to the testing method of the present invention, S2 further includes: replacing the spring according to the size and type of the sample, thereby changing the pressure on the sample to obtain the most accurate test result.

[0013] As an improvement to the test method of the present invention, S2 also includes: by rotating the limit screw, changing the relative position of the electrode cavity and the limit screw, changing the compression amount of the spring during measurement, and changing the pressure on the sample to obtain the most accurate test results.

[0014] As an improvement to the testing method of the present invention, S2 further includes: mounting the first XY-axis displacement platform, the second XY-axis displacement platform, the first fixed electrode platform, and the lead screw manual displacement platform on a base plate; the base plate is provided with a wiring hole, a pole, and a switch for connecting an external high-frequency AC power supply; and the circuit is connected by toggling the switch. The wiring hole, pole, and switch can improve the safety of the test operation.

[0015] A second object of the present invention is to provide an interface resistance testing device applicable to various types of thermoelectric elements, comprising:

[0016] a first fixed electrode platform, a first electrode cap, and a first wire nose, wherein the first electrode cap is fixed to the first fixed electrode platform via a second nut, and the first wire nose is fixed to the first electrode cap via a first nut;

[0017] a second electrode cap, a second wire nose, an electrode cavity, and a limiting screw, wherein the second electrode cap is arranged opposite to the first electrode cap, the second wire nose is fixed to the second electrode cap by a third nut, the second electrode cap is embedded in the electrode cavity, a spring is provided between the second electrode cap and the electrode cavity, one end of the spring abuts against the second electrode cap, and the other end of the spring abuts against the limiting screw, which is threadedly connected to the inner wall of the electrode cavity;

[0018] A first XY-axis displacement platform and a second XY-axis displacement platform are arranged opposite to each other, the first XY-axis displacement platform is provided with a first telescopic probe, and the second XY-axis displacement platform is provided with a second telescopic probe;

[0019] A high-frequency AC power supply is provided, wherein the first electrode cap is connected to the high-frequency AC power supply through a first wire nose, and the second electrode cap is connected to the high-frequency AC power supply through a second wire nose.

[0020] As an improvement to the testing device of the present invention, the second electrode cap has a hollow cavity, the side wall of the cavity has a thread, the second electrode cap is connected to the guide screw through the thread, the guide screw passes through the limit screw and the spring in sequence, the guide screw is fixed to the limit screw through a fourth nut, and the outer diameter of the second electrode cap is smaller than the inner diameter of the electrode cavity.

[0021] As an improvement to the testing device of the present invention, the first fixed electrode platform, the second XY-axis displacement platform and the first XY-axis displacement platform are installed on a substrate, the electrode cavity is fixed to the second fixed electrode platform, the substrate is installed with a lead screw manual displacement platform, the second fixed electrode platform is installed on the lead screw manual displacement platform, and the second fixed electrode platform and the lead screw manual displacement platform both correspond to the first fixed electrode platform.

[0022] As an improvement to the testing device of the present invention, the substrate is provided with a wiring hole, a pole and a switch for externally connecting the high-frequency AC power supply.

[0023] As an improvement to the testing device of the present invention, the displacement stroke of the screw manual displacement platform is 40mm to 60mm, and the displacement strokes of the second XY axis displacement platform and the first XY axis displacement platform along the X axis and Y axis are 15mm to 40mm respectively.

[0024] The beneficial effects of the present invention are: 1) The technical solution of the present invention can flexibly adjust the distance between the two electrode caps and the two telescopic probes, so as to realize efficient and stable testing of the interface resistance of thermoelectric samples of different types, different sizes and different interface positions; 2) The technical solution of the present invention can flexibly adjust the compression amount of the spring, flexibly adjust the pressure between the electrode cap and the sample, and after the adjustment is completed, it can ensure that the pressure between the electrode cap and the sample is kept consistent in each test, and ensure that the electrode cap maintains good contact with samples of different materials and sizes, so that the interface resistance of the cascaded thermoelectric element can be directly and accurately measured, and high accuracy and high consistency of the test can be achieved. BRIEF DESCRIPTION OF THE DRAWINGS

[0025] Figure 1 Schematic diagram of the structure of the testing device of the present invention.

[0026] Figure 2 4 is a cross-sectional view of the first electrode of the present invention.

[0027] Figure 3 4 is a cross-sectional view of the second electrode of the present invention.

[0028] Figure 4 This is a test principle diagram of the present invention.

[0029] Among them: 1. Base plate; 2. First XY-axis displacement platform; 3. Second XY-axis displacement platform; 4. First fixed electrode platform; 5. Screw manual displacement platform; 6. Second fixed electrode platform; 7. Wiring hole; 8. Pole; 9. Switch; 10. First electrode; 11. Second electrode; 12. First telescopic probe; 13. Second telescopic probe; 14. First electrode cap; 15. First nut; 16. First wire nose; 17. Second nut; 18. Second electrode cap; 19. Second wire nose; 20. Third nut; 21. Electrode cavity; 22. Limit screw; 23. Fourth nut; 24. Spring; 25. Guide screw. DETAILED DESCRIPTION

[0030] If certain words are used in the specification and claims to refer to specific components, those skilled in the art should understand that manufacturers may use different nouns to refer to the same component. This specification and claims do not use differences in names as a way to distinguish components, but use differences in the functions of components as the criteria for distinction. As mentioned throughout the specification and claims, "including" is an open term, so it should be interpreted as "including but not limited to". "Approximately" means that within an acceptable error range, those skilled in the art can solve technical problems within a certain error range and basically achieve technical effects. In addition, the terms "first", "second", etc. are only used for descriptive purposes to distinguish different objects, rather than to describe a specific order or primary and secondary relationship, and cannot be understood as indicating or implying relative importance.

[0031] In the description of the present invention, it should be understood that the terms "up", "down", "front", "back", "left", "right", "horizontal", etc., indicating directions or positional relationships, are based on the directions or positional relationships shown in the accompanying drawings, and are only for the convenience of describing the present invention and simplifying the description, rather than indicating or implying that the device or element referred to must have a specific direction, be constructed and operated in a specific direction, and therefore cannot be understood as a limitation on the present invention.

[0032] In the present invention, unless otherwise expressly specified or limited, the terms "mounted," "connected," "connect," "fixed," etc. should be understood broadly. For example, they may refer to fixed, detachable, or integral connections; mechanical or electrical connections; direct or indirect connections through an intermediary; or internal communication between two components. Those skilled in the art will understand the specific meanings of the above terms in the present invention based on specific circumstances.

[0033] Among existing resistance measurement technologies, traditional methods have at least the following drawbacks: ① The electrode spacing is not adjustable, limiting the measurement to fixed-length thermoelectric elements; ② The probes cannot be moved or adjusted, limiting the measurement to the voltage between the sample and the fixed probes. Consequently, traditional methods are limited in their ability to measure interface resistance over a narrow range, making it impossible to directly and accurately measure the interface resistance of cascaded thermoelectric elements.

[0034] At the same time, the interface resistance of thermoelectric elements is extremely small, at the milliΩ level. The contact between the electrode and the sample can significantly affect the resistance measurement, and the pressure between the electrode and the sample most directly affects the contact between the electrode and the sample. The inventors discovered that the pressure between the electrode and the sample in traditional methods is uncontrollable, making it difficult to maintain consistent pressure between the sample and the electrode for each test. It is also difficult to specifically adjust the pressure value when testing samples of different sizes, resulting in poor accuracy and consistency in sample testing. Therefore, a new test device and test method are urgently needed to address the above issues.

[0035] The following is combined with Figures 1 to 4 The present invention is further described in detail with reference to the accompanying drawings and specific examples, but is not intended to limit the present invention.

[0036] Example 1

[0037] An interface resistance testing device suitable for various types of thermoelectric components, such as Figures 1 to 4 As shown, including:

[0038] A first fixed electrode platform 4, a first electrode cap 14 and a first wire nose 16, wherein the first electrode cap 14 is fixed to the first fixed electrode platform 4 via a second nut 17, and the first wire nose 16 is fixed to the first electrode cap 14 via a first nut 15;

[0039] A second electrode cap 18, a second wire nose 19, an electrode cavity 21, and a limiting screw 22. The second electrode cap 18 is arranged opposite to the first electrode cap 14. The second wire nose 19 is fixed to the second electrode cap 18 by a third nut 20. The second electrode cap 18 is embedded in the electrode cavity 21. A spring 24 is provided between the second electrode cap 18 and the electrode cavity 21. One end of the spring 24 abuts against the second electrode cap 18, and the other end of the spring 24 abuts against the limiting screw 22. The limiting screw 22 is threadedly connected to the inner wall of the electrode cavity 21.

[0040] A first XY-axis displacement platform 2 and a second XY-axis displacement platform 3 are arranged opposite to each other, the first XY-axis displacement platform 2 is provided with a first telescopic probe 12, and the second XY-axis displacement platform 3 is provided with a second telescopic probe 13;

[0041] The first electrode cap 14 is connected to the high-frequency AC power supply through a first wire nose 16 , and the second electrode cap 18 is connected to the high-frequency AC power supply through a second wire nose 19 .

[0042] Among them, see Figure 2 The first electrode 10 includes a first electrode cap 14 , a first nut 15 , a first wire nose 16 and a second nut 17 , and the first electrode 10 is mounted on the first fixed electrode platform 4 .

[0043] Preferably, the second electrode cap 18 has a hollow cavity, the side wall of the cavity has threads, the second electrode cap 18 is connected to the guide screw 25 through the threads, the guide screw 25 passes through the limit screw 22 and the spring 24 in sequence, the guide screw 25 is fixed to the limit screw 22 through the fourth nut 23, and the outer diameter of the second electrode cap 18 is smaller than the inner diameter of the electrode cavity 21.

[0044] Preferably, the first fixed electrode platform 4, the second XY-axis displacement platform 3 and the first XY-axis displacement platform 2 are installed on the substrate 1, the second XY-axis displacement platform 3 and the first XY-axis displacement platform 2 are used to adjust the distance between the first telescopic probe 12, the second telescopic probe 13 and the sample, and the spacing between the first telescopic probe 12, the second telescopic probe 13, the electrode cavity 21 is fixed to the second fixed electrode platform 6, the substrate 1 is installed with a screw manual displacement platform 5, the second fixed electrode platform 6 is installed on the screw manual displacement platform 5, and the second fixed electrode platform 6 and the screw manual displacement platform 5 both correspond to the first fixed electrode platform 4.

[0045] Also, see Figure 3 The second electrode 11 includes a second electrode cap 18, a second wire nose 19, a third nut 20, an electrode cavity 21, a limit screw 22, a fourth nut 23, a spring 24 and a guide screw 25, and the second electrode 11 is installed on the second fixed electrode platform 6.

[0046] Preferably, the substrate 1 is provided with a wiring hole 7 for connecting to an external high-frequency AC power supply, a pole 8, and a switch 9. The wires of the first and second electrode caps 14, 18, and the first and second wire lugs 16, 19 connected thereto are connected to the nearby wiring hole 7. The wires of the electrodes and probes are connected from the back of the substrate 1 to the lower portion of the pole 8 through the nearby wiring hole 7. The wires are then connected to the external high-frequency AC power supply through the upper portion of the pole 8. The number of poles 8 can be 4 to 8.

[0047] Preferably, the displacement stroke of the screw manual displacement platform 5 is 40mm~60mm, specifically 40mm~45mm, 45mm~49mm, 49mm~51mm, 51mm~55mm, 55mm~60mm, and the displacement strokes of the second XY-axis displacement platform 3 and the first XY-axis displacement platform 2 along the X-axis and Y-axis are 15mm~40mm respectively.

[0048] Preferably, see Figure 1 The first fixed electrode platform 4 and the lead screw manual displacement platform 5 are located in the X-axis direction, that is, the first electrode cap 14 and the second electrode cap 18 are also located in the X-axis direction. The test area is between the first electrode cap 14 and the second electrode cap 18. The first telescopic probe 12 and the second telescopic probe 13 are respectively located on both sides of the test area. The first telescopic probe 12 and the second telescopic probe 13 are located in the Y-axis direction, and the X-axis direction is perpendicular to the Y-axis direction.

[0049] Preferably, the first electrode cap 14 and the second electrode cap 18 are coaxial, and the material of the first electrode cap 14 and the second electrode cap 18 are both brass.

[0050] Preferably, the second XY-axis displacement platform 3 and the first XY-axis displacement platform 2 are coaxial, and the displacement strokes of the second XY-axis displacement platform 3 and the first XY-axis displacement platform 2 along the X-axis and Y-axis can be 15mm~19mm, 19mm~23mm, 23mm~26mm, 26mm~30mm, 30mm~35mm, and 35mm~40mm, respectively.

[0051] Preferably, the guide screw 25 can move unrestricted in the electrode cavity 21 and the limiting screw 22 , and the compression amount of the spring 24 can be adjusted by the limiting screw 22 .

[0052] Preferably, the compression amount of the spring 24 can be obtained by calculation, and the spring 24 can be replaced according to different samples.

[0053] Method for testing interface resistance: According to experience or actual needs, select a suitable spring 24 to be installed on the second electrode 11, and adjust the relative position of the limit screw 22 and the electrode cavity 21 to fix the compression amount of the spring 24. Thus, the pressure between the electrode cap and the sample is fixed and determined, and the sample is placed between the first electrode cap 14 and the second electrode cap 18. Adjust the manual screw moving platform 5 until it cannot move. At this time, the sample is fixed between the first electrode cap 14 and the second electrode cap 18 and the contact is good, and the pressure is fixed; then adjust the first XY-axis displacement platform 2 and the second XY-axis displacement platform 3, and adjust the position of the first telescopic probe 12 and the second telescopic probe 13 so that they are located on both sides of the interface in the X-axis direction and the distance from the interface is extremely small, and they maintain good contact with the sample in the Y-axis direction; then turn on the switch 9, the circuit is connected, and the current and voltage values ​​at the sample interface are read, and the interface resistance of the thermoelectric element is obtained using Ohm's law.

[0054] Example 2

[0055] A method for testing interface resistance of various thermoelectric components, comprising the following steps:

[0056] S1. Fix the first electrode cap 14 to the first fixed electrode platform 4 through the second nut 17, embed the second electrode cap 18 in the electrode cavity 21, place a spring 24 between the second electrode cap 18 and the electrode cavity 21, make one end of the spring 24 abut against the second electrode cap 18, make the other end of the spring 24 abut against the limiting screw 22, thread the limiting screw 22 into the inner wall of the electrode cavity 21, rotate and adjust the relative position of the limiting screw 22 and the electrode cavity 21 to fix the compression amount of the spring 24, and fix the sample between the first electrode cap 14 and the second electrode cap 18;

[0057] S2. Clamp the sample with the first electrode cap 14 and the second electrode cap 18 in the X-axis direction. Secure the first wire nose 16 to the first electrode cap 14 via the first nut 15. Connect the first electrode cap 14 to the high-frequency AC power supply via the first wire nose 16. Secure the second wire nose 19 to the second electrode cap 18 via the third nut 20. Connect the second electrode cap 18 to the high-frequency AC power supply via the second wire nose 19. Measure the current flowing through the sample interface in the closed loop with the first electrode cap 14 and the second electrode cap 18.

[0058] S3. Install the first telescopic probe 12 on the first XY-axis displacement platform 2, and install the second telescopic probe 13 on the second XY-axis displacement platform 3, so that the sample contacts the first telescopic probe 12 and the second telescopic probe 13 in the Y-axis direction, and the first telescopic probe 12 and the second telescopic probe 13 are respectively placed on both sides of the sample interface, adjust the first XY-axis displacement platform 2 and the second XY-axis displacement platform 3 so that the contact points of the first telescopic probe 12 and the second telescopic probe 13 with the sample are at a very small distance from the sample interface, use the first telescopic probe 12 and the second telescopic probe 13 to test the voltage value at the sample interface in the closed loop, and calculate the interface resistance of the thermoelectric element using the measured current and voltage values ​​according to Ohm's law.

[0059] Preferably, step S1 also includes: passing the guide screw 25 through the limit screw 22 and the spring 24 in sequence, fixing the guide screw 25 to the limit screw 22 through the fourth nut 23, connecting the guide screw 25 to the second electrode cap 18 through a thread, fixing the electrode cavity 21 to the second fixed electrode platform 6, installing the second fixed electrode platform 6 on the screw manual displacement platform 5, and adjusting the position of the second electrode cap 18 and the first electrode cap 14 by moving the screw manual displacement platform 5, so that the sample is tested under appropriate pressure conditions, thereby obtaining the most accurate test results.

[0060] Preferably, step S2 further includes: replacing spring 24 according to the size and type of the sample, thereby changing the pressure applied to the sample to obtain the most accurate test results. Different springs 24 have different stiffness coefficients, so that the pressure applied to the sample can be changed while the compression of spring 24 remains unchanged to obtain the most accurate test results.

[0061] Preferably, step S2 further includes: by rotating the limit screw 22, changing the relative position of the electrode cavity 21 and the limit screw 22, changing the compression amount of the spring 24 during measurement, and changing the pressure on the sample to obtain the most accurate test results. When testing the interface resistance of the sample, the second electrode cap 18 contacts the sample, and at the same time, the second electrode cap 18 moves toward the interior of the electrode cavity 21, compressing the spring 24 between the second electrode cap 18 and the electrode cavity 21. When the relative position of the electrode cavity 21 and the limit screw 22 remains unchanged, the compression amount of the spring can be guaranteed to be consistent during each measurement, which can ensure that the pressure on the sample remains consistent during each measurement.

[0062] Preferably, step S2 also includes: installing the first XY-axis displacement platform 2, the second XY-axis displacement platform 3, the first fixed electrode platform 4 and the screw manual displacement platform 5 on the substrate 1, and providing a wiring hole 7, a pole 8 and a switch 9 for an external high-frequency AC power supply on the substrate 1, and connecting the circuit by toggling the switch 9.

[0063] Obviously, the present invention sets up two electrodes and two probes. The two probes can move freely in the axial direction of the thermoelectric element. The middle area of ​​the two probes is the measured resistance area, which significantly increases the test range. Through the cooperation of the second electrode cap 18 in the second electrode 11 and the electrode cavity 21, the limiting screw 22, and the spring 24, the function of flexibly adjusting the type of spring 24 and its compression amount can be achieved, ensuring that the pressure between the sample and the electrode cap is equal every time after the adjustment is completed, and good contact between the sample and the electrode cap can be achieved in each test, thereby significantly improving the accuracy and consistency of the test results.

[0064] Based on the disclosure and teachings of the above description, those skilled in the art will be able to make changes and modifications to the above embodiments. Therefore, the present invention is not limited to the above specific embodiments. Any obvious improvements, substitutions, or modifications made by those skilled in the art based on the present invention fall within the scope of protection of the present invention. In addition, although certain specific terms are used in this description, these terms are only for convenience of description and do not constitute any limitation to the present invention.

Claims

1. A method for testing interface resistance of various thermoelectric components, characterized in that: The following steps are involved: S1. Fix the first electrode cap (14) to the first fixed electrode platform (4) through the second nut (17), embed the second electrode cap (18) in the electrode cavity (21), place a spring (24) between the second electrode cap (18) and the electrode cavity (21), make one end of the spring (24) abut against the second electrode cap (18), make the other end of the spring (24) abut against the limiting screw (22), thread the limiting screw (22) to the inner wall of the electrode cavity (21), make the guide screw (25) pass through the limiting screw (22) and the spring (24) in sequence, and put the guide screw (25) through the fourth The nut (23) is fixed to the limiting screw (22), the guide screw (25) is connected to the second electrode cap (18) through a thread, the electrode cavity (21) is fixed to the second fixed electrode platform (6), the second fixed electrode platform (6) is installed on the screw manual displacement platform (5), the position of the second electrode cap (18) and the first electrode cap (14) is adjusted by moving the screw manual displacement platform (5), the relative position of the limiting screw (22) and the electrode cavity (21) is rotated to adjust the compression amount of the spring (24), and the sample is fixed between the first electrode cap (14) and the second electrode cap (18); S2, clamping the sample in the X-axis direction with the first electrode cap (14) and the second electrode cap (18), fixing the first wire nose (16) to the first electrode cap (14) through the first nut (15), connecting the first electrode cap (14) to the high-frequency AC power supply through the first wire nose (16), fixing the second wire nose (19) to the second electrode cap (18) through the third nut (20), connecting the second electrode cap (18) to the high-frequency AC power supply through the second wire nose (19), and testing the current value flowing through the sample interface in the closed loop by the first electrode cap (14) and the second electrode cap (18); S3. Install the first telescopic probe (12) on the first XY-axis displacement platform (2), and install the second telescopic probe (13) on the second XY-axis displacement platform (3), so that the sample contacts the first telescopic probe (12) and the second telescopic probe (13) in the Y-axis direction, and the first telescopic probe (12) and the second telescopic probe (13) are respectively placed on both sides of the sample interface, and adjust the first XY-axis displacement platform (2) and the second XY-axis displacement platform (3) so that the contact point between the first telescopic probe (12) and the second telescopic probe (13) and the sample is at a very small distance from the sample interface, and use the first telescopic probe (12) and the second telescopic probe (13) to test the voltage value at the sample interface in the closed loop, and calculate the interface resistance of the thermoelectric element according to Ohm's law using the measured current value and voltage value.

2. The interface resistance testing method applicable to various types of thermoelectric elements according to claim 1, wherein: Said S2 also includes: replacing the spring (24) according to the size and type of the sample, thereby changing the pressure on the sample to obtain the most accurate test result.

3. The interface resistance testing method applicable to various types of thermoelectric elements according to claim 1, wherein: Said S2 also includes: by rotating the limiting screw (22), changing the relative position of the electrode cavity (21) and the limiting screw (22), changing the compression amount of the spring (24) during measurement, and changing the pressure on the sample, so as to obtain the most accurate test result.

4. The interface resistance testing method applicable to various types of thermoelectric elements according to claim 1, wherein: Said S2 also includes: installing a first XY-axis displacement platform (2), a second XY-axis displacement platform (3), a first fixed electrode platform (4) and a lead screw manual displacement platform (5) on a base plate (1); a wiring hole (7), a pole (8) and a switch (9) for connecting an external high-frequency AC power supply are provided on the base plate (1); and the circuit is connected by toggling the switch (9).

5. An interface resistance testing device suitable for various types of thermoelectric elements, comprising the testing method according to any one of claims 1 to 4, characterized in that: include: a first fixed electrode platform (4), a first electrode cap (14) and a first wire nose (16), wherein the first electrode cap (14) is fixed to the first fixed electrode platform (4) via a second nut (17), and the first wire nose (16) is fixed to the first electrode cap (14) via a first nut (15); A second electrode cap (18), a second wire nose (19), an electrode cavity (21) and a limiting screw (22), wherein the second electrode cap (18) and the first electrode cap (14) are arranged opposite to each other, the second wire nose (19) is fixed to the second electrode cap (18) through a third nut (20), the second electrode cap (18) is embedded in the electrode cavity (21), a spring (24) is provided between the second electrode cap (18) and the electrode cavity (21), one end of the spring (24) abuts against the second electrode cap (18), the other end of the spring (24) abuts against the limiting screw (22), and the limiting screw (22) is threadedly connected to the inner wall of the electrode cavity (21); A first XY-axis displacement platform (2) and a second XY-axis displacement platform (3) are arranged opposite to each other, the first XY-axis displacement platform (2) is provided with a first telescopic probe (12), and the second XY-axis displacement platform (3) is provided with a second telescopic probe (13); A high-frequency AC power supply is provided, wherein the first electrode cap (14) is connected to the high-frequency AC power supply via a first wire nose (16), and the second electrode cap (18) is connected to the high-frequency AC power supply via a second wire nose (19).

6. The interface resistance testing device applicable to various types of thermoelectric elements according to claim 5, characterized in that: The second electrode cap (18) has a hollow cavity, the side wall of the cavity has a thread, the second electrode cap (18) is connected to the guide screw (25) through the thread, the guide screw (25) passes through the limit screw (22) and the spring (24) in sequence, the guide screw (25) is fixed to the limit screw (22) through a fourth nut (23), and the outer diameter of the second electrode cap (18) is smaller than the inner diameter of the electrode cavity (21).

7. The interface resistance testing device applicable to various types of thermoelectric elements according to claim 5, characterized in that: The first fixed electrode platform (4), the second XY-axis displacement platform (3) and the first XY-axis displacement platform (2) are mounted on a substrate (1); the electrode cavity (21) is fixed to the second fixed electrode platform (6); a lead screw manual displacement platform (5) is mounted on the substrate (1); the second fixed electrode platform (6) is mounted on the lead screw manual displacement platform (5); and both the second fixed electrode platform (6) and the lead screw manual displacement platform (5) correspond to the first fixed electrode platform (4).

8. The interface resistance testing device applicable to various types of thermoelectric elements according to claim 7, characterized in that: The substrate (1) is provided with a wiring hole (7) for externally connecting the high-frequency AC power supply, a pole (8) and a switch (9).

9. The interface resistance testing device applicable to various types of thermoelectric elements according to claim 7, characterized in that: The displacement stroke of the lead screw manual displacement platform (5) is 40 mm to 60 mm, and the displacement strokes of the second XY axis displacement platform (3) and the first XY axis displacement platform (2) along the X axis and Y axis are 15 mm to 40 mm respectively.

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