Optical element inspection device and method

Abstract

An optical element detection device is characterized by comprising: a rotating module, including a substantially plate-shaped disc capable of rotating around a rotating axis and at least one pickup assembly fixed to the disc for picking up an optical element to be detected, the disc driving the optical element to rotate and forming a rotating path of the optical element through the at least one pickup assembly; a plurality of detection assemblies arranged in a radial direction of the rotating path and spaced around the rotating axis of the disc, each of the plurality of detection assemblies being capable of detecting at least a part of a certain surface of a plurality of surfaces of the optical element picked up by the at least one pickup assembly. Accordingly, the surfaces of the optical element of different shapes can be detected at multiple angles.

Description

TECHNICAL FIELD

[0001] The present application relates to an optical element detection device and method capable of detecting multiple surfaces of a special-shaped optical element, improving detection efficiency, and reducing secondary damage. BACKGROUND

[0002] Optical elements often have various defects such as scratches, depressions, cracks, and pits during processing, which not only reduces user experience but also affects the performance of the optical system. With the increasing requirements of consumers at the present stage, many electronic products have higher and higher requirements for the size, shape, and optical quality of optical elements, and the test items are also increasing.

[0003] The existing detection method is low in efficiency and basically blank in the field of automatic detection of special-shaped optical elements. Chinese patent CN103674977B discloses a "large-aperture optical element surface damage detection device and corresponding detection method", which can meet the detection requirements of high precision, but needs to manually load and clamp the optical element, and the detection efficiency is low.

[0004] Chinese patent CN109490313B discloses an "automatic detection device and method for surface defects of large-aperture curved optical elements", which can quickly measure the surface defects of large-aperture optical elements through automatic clamping of the optical elements by a mechanical hand in automatic production. However, the detection object is single, and the shape of the detected optical element is limited, which is not suitable for detection of multiple types of special-shaped optical elements.

[0005] Therefore, in the prior art, it is a problem to detect multiple types of special-shaped optical elements and improve detection efficiency and precision.

[0006] Comparative documents

[0007] Patent document 1: CN103674977B

[0008] Patent document 2: CN109490313B SUMMARY

[0009] The present application relates to an optical element detection device and method capable of detecting multiple surfaces of a special-shaped optical element, improving detection efficiency, and reducing secondary damage.

[0010] The optical element detection device further comprises a plurality of detection assemblies arranged along a radial direction of the rotation path and spaced around the rotation axis of the rotating body, each of the plurality of detection assemblies being configured to detect at least a portion of a surface of the optical element picked up by the at least one picking assembly.

[0011] In a preferred embodiment, the rotating body is a substantially flat disc.

[0012] According to the foregoing technical solution, the rotating disc drives the optical element to rotate, and a plurality of detection assemblies are arranged along the radial direction of the rotation path, so that the surfaces of the optical element substantially facing the plurality of detection assemblies can be detected at multiple angles.

[0013] In a preferred embodiment,

[0014] Each of the at least one picking assembly has a picking portion for picking up the optical element, the picking portion being capable of rotating integrally with the picked optical element around a rotation axis of the picking portion, the rotation axis of the picking portion being substantially parallel to the rotation axis of the rotating body,

[0015] Further, each of the plurality of detection assemblies is configured to detect any orientation of the surface of the optical element substantially facing the detection assembly in a radial direction perpendicular to the rotation axis of the rotating body.

[0016] According to the foregoing technical solution, the rotating disc drives the optical element to revolve, and the picking portion drives the optical element to rotate, so that the surfaces of the optical element substantially facing the plurality of detection assemblies can be detected at any orientation, and 360-degree detection without dead angle can also be achieved.

[0017] In a preferred embodiment, at least a portion of the plurality of detection assemblies is capable of detecting any orientation of the side surface of the optical element substantially facing the side in the radial direction.

[0018] According to the foregoing technical solution, any orientation of the side surface of the optical element substantially facing the side can be detected, or 360-degree detection without dead angle can be achieved.

[0019] In a preferred embodiment, the picking portion is further capable of translational movement along the rotation axis direction of the disc, and translational and / or rotational movement along a first direction and a second direction on the radial cross section of the disc, the first direction and the second direction being perpendicular to each other.

[0020] According to the foregoing technical solution, the pose of the picking portion can be adjusted to facilitate picking up the optical element and improve the detection accuracy.

[0021] In a preferred mode, each of the at least one pickup assembly is provided with an elastic element connected with the pickup part, the elastic element having a deformation allowance amount allowing the pickup part to float in the direction of the rotation axis of the disc body.

[0022] According to the foregoing technical solution, certain tolerances can be absorbed, and damage to the optical element during pickup of the optical element can be avoided through elastic floating.

[0023] In a preferred mode, a top surface detection assembly arranged above the optical element to be detected in the direction of the rotation axis of the disc body is used to detect the top surface of at least a portion of the optical element generally facing the top surface detection assembly.

[0024] According to the foregoing technical solution, the detection of the top surface of the portion can be realized through the top surface detection assembly.

[0025] In a preferred mode, a radial plane coordinate system is established along the radial section of the disc body, and the top surface detection assembly can further acquire the coordinate of the center position of the top surface of the optical element before the pickup part picks up the optical element.

[0026] According to the foregoing technical solution, the position of the center of the top surface of the optical element can be accurately acquired, and the detection accuracy can be improved.

[0027] In a preferred mode, a first lower detection assembly arranged below the rotation path in the direction of the rotation axis of the disc body can detect the bottom surface of at least a portion of the optical element picked up by the pickup part generally facing the first lower detection module.

[0028] According to the foregoing technical solution, the bottom surface of the optical element generally facing downward can be detected.

[0029] In a preferred mode, the first lower detection assembly can further acquire the position coordinate of the radial section center of the pickup part in the radial plane coordinate system before the pickup part picks up the optical element.

[0030] According to the foregoing technical solution, the feeding transfer module can accurately deliver the optical element to be detected to the position corresponding to the pickup part.

[0031] In a preferred mode, the feeding transfer module delivers the optical element detected by the top surface detection assembly to the position corresponding to the pickup part according to the position coordinate of the radial section center of the pickup part in the radial plane coordinate system and the coordinate of the center position of the top surface of the optical element.

[0032] According to the technical scheme, the pickup part can pick up the optical element, and the detection efficiency is improved.

[0033] In a preferred mode, a second lower detection assembly is arranged below the rotation path along the rotation axis of the disc body, and can detect the area of the bottom surface of the optical element that is not detected by the first lower detection assembly.

[0034] According to the technical scheme, the bottom surface of the optical element can be detected more comprehensively.

[0035] In a preferred mode, before the pickup part picks up the optical element, the second lower detection assembly can also obtain a projection imaging of the pickup part of each of the at least one pickup assembly on the radial cross section of the disc body; and each of the at least one pickup assembly is adjusted based on the projection imaging.

[0036] According to the technical scheme, the pose consistency of the pickup part of each pickup assembly can be ensured, and the convenience of picking up the optical element and the detection accuracy are improved.

[0037] In a preferred mode, a remaining undetected surface detection assembly is further arranged to detect the remaining surface of the optical element that is not detected and that is separated from the pickup part and that passes the detection of the plurality of detection assemblies, the top surface detection assembly, the first lower detection assembly and the second lower detection assembly.

[0038] According to the technical scheme, the remaining undetected surface can be detected, and the comprehensiveness of the optical element detection is ensured.

[0039] In a preferred mode, a storage unit is further arranged to receive the optical element that is separated from the pickup part and that passes the detection of the plurality of detection assemblies, the top surface detection assembly, the first lower detection assembly and the second lower detection assembly; and a throwing assembly is arranged to take out the optical element whose remaining surface detection fails from the storage unit.

[0040] According to the technical scheme, the good products can be picked up to the 0K tray, and rapid sorting is realized.

[0041] In a preferred mode, a height measuring assembly is further arranged to obtain the height position of the optical element to be detected in the rotation axis direction of the disc body; and the top surface detection assembly can adjust the position in the rotation axis direction of the disc body according to the height position of the optical element obtained by the height measuring assembly.

[0042] According to the technical scheme, the optical element can be ensured to be located in the detection field of view of the top surface detection assembly, and the detection accuracy is improved.

[0043] Further, another aspect of the present application is a method for detecting an optical element, characterized by comprising:

[0044] S 1: an element pickup step of picking up an optical element to be detected by at least one pickup assembly provided on a rotary body capable of rotating around a rotary axis thereof and spaced apart from the rotary axis of the rotary body by a predetermined distance;

[0045] S2: a rotation detection step of rotating the optical element around the rotary axis of the rotary body by the at least one pickup assembly and forming a rotation path of the optical element, and detecting at least a portion of one of the surfaces of the optical element by a plurality of detection assemblies provided in a radial direction of the rotation path and spaced apart around the rotary axis of the rotary body.

[0046] According to the foregoing technical solution, the optical element is rotated by the turntable, and a plurality of detection assemblies are provided in the radial direction of the rotation path, so that the surfaces of the optical element approximately facing the plurality of detection assemblies can be detected at multiple angles.

[0047] In a preferred mode,

[0048] Each of the at least one pickup assembly has a pickup portion for grabbing the optical element;

[0049] In the rotation detection step, the pickup portion can rotate around the rotary axis of the pickup portion integrally with the picked-up optical element, and the rotary axis of the pickup portion is approximately parallel to the rotary axis of the rotary body,

[0050] Further, each of the plurality of detection assemblies is configured to detect any orientation of the surface of the optical element approximately facing the detection assembly in a radial direction perpendicular to the rotary axis of the rotary body.

[0051] According to the foregoing technical solution, the optical element is revolved by the turntable, and the optical element is rotated by the pickup portion, so that the surfaces of the optical element approximately facing the plurality of detection assemblies can be detected at any orientation, and 360-degree detection without dead angle can be achieved.

[0052] In a preferred mode, before the element pickup step, a top surface positioning detection step is performed, in which a top surface detection assembly is provided above the optical element to be detected in the direction of the rotary axis of the disc body, and a top surface of at least a portion of the optical element approximately facing the top surface detection assembly is detected, and the center position of the top surface of the optical element is obtained.

[0053] According to the technical scheme, the top surface detection assembly can be used to detect the top surface of the optical element, and the center position of the top surface can be accurately obtained, thereby improving the detection accuracy.

[0054] In a preferred mode, before the element picking step, a picking part positioning step is performed, and a first lower detection assembly arranged below the rotating path along the rotating axis of the disc body is used to obtain the position of the picking part on a radial plane perpendicular to the rotating axis of the disc body.

[0055] According to the technical scheme, the feeding transfer module can accurately deliver the optical element to be detected to the position corresponding to the picking part.

[0056] In a preferred mode, after the top surface positioning detection step and before the element picking step, a feeding transfer step is performed, and the feeding transfer module is used to deliver the optical element detected by the top surface detection assembly to the position corresponding to the picking part according to the position of the picking part on the radial plane and the center position of the top surface of the optical element.

[0057] According to the technical scheme, the picking part can pick the optical element, and the detection efficiency is improved.

[0058] In a preferred mode, after the element picking step, a first bottom surface detection step is performed, and the first lower detection assembly is used to detect the bottom surface of the optical element picked by the at least one picking assembly.

[0059] According to the technical scheme, the bottom surface of the optical element can be detected.

[0060] In a preferred mode, after the first bottom surface detection step, a second bottom surface detection step is performed, and a second lower detection assembly arranged below the rotating path along the rotating axis of the disc body is used to detect the area of the bottom surface of the optical element that is not detected by the first lower detection assembly.

[0061] According to the technical scheme, the bottom surface of the optical element can be detected.

[0062] In a preferred mode, before the element picking step, a picking assembly calibration step is performed, and the first lower detection assembly or the second lower detection assembly is used to obtain the projection imaging of the picking part of each of the at least one picking assembly on the radial section of the disc body; and each of the at least one picking assembly is calibrated based on the projection imaging.

[0063] According to the technical solution, the pose consistency of the pickup part of each pickup assembly can be ensured, and the convenience of picking up the optical element and the detection accuracy can be improved.

[0064] In a preferred mode, after the first bottom surface detection step, the second bottom surface detection step, and the rotation detection step, a remaining surface detection step is performed, and the remaining surface of the optical element that has been separated from the pickup part and has passed the detection of the multiple detection assemblies, the top surface detection assembly, the first bottom detection assembly, and the second bottom detection assembly is detected by a remaining surface detection assembly.

[0065] According to the technical solution, the remaining surface can be detected, and the comprehensiveness of the optical element detection can be ensured.

[0066] In a preferred mode, after the first bottom surface detection step, the second bottom surface detection step, and the rotation detection step, and before the remaining surface detection step, a discharging step is performed, and the optical element that has passed the detection of the multiple detection assemblies, the top surface detection assembly, the first bottom detection assembly, and the second bottom detection assembly is placed in a storage unit; after the remaining surface detection step, a throwing step is performed, and the optical element with the remaining surface that fails the detection is taken out of the first storage unit.

[0067] According to the technical solution, the good products can be picked up to the OK tray, and the defective products can be picked up to the NG tray, and the sorting can be quickly realized.

[0068] In a preferred mode, before the element pickup step, a height measurement step is performed, and a height position of the optical element to be detected in the direction of the rotation axis of the disc body is obtained by a height measurement assembly; and the top surface detection assembly adjusts the position in the direction of the rotation axis of the disc body according to the height position of the optical element obtained by the height measurement assembly.

[0069] According to the technical solution, the optical element can be ensured to be located in the detection field of view of the top surface detection assembly, and the detection accuracy can be improved.

[0070] The optical element detection device and the detection method of the above-mentioned embodiments can realize the omnidirectional detection of the multiple surfaces of the special-shaped optical element, greatly improve the detection efficiency, and reduce the secondary damage to the optical element in the detection process. BRIEF DESCRIPTION OF DRAWINGS

[0071] In order to more clearly illustrate the present application, the accompanying drawings of the present application will be described and explained. Obviously, the drawings in the following description only illustrate some aspects of some exemplary embodiments of the present application, and other drawings can be obtained by those of ordinary skill in the art without creative effort on the basis of these drawings.

[0072] Figure 1 is an example of the overall structure of the detection device.

[0073] Figure 2 is an example of the connection diagram of the rotating disc.

[0074] Figure 3 is an example of the structure diagram of the pickup assembly.

[0075] Figure 4 is an example of the schematic diagram of the feeding and discharging transfer module.

[0076] Figure 5 is an example of the schematic diagram of the positioning detection module.

[0077] Figure 6 is an example of the schematic diagram of the tray taking and placing module.

[0078] Figure 7 is an example of the camera calibration schematic diagram.

[0079] Figure 8 is an example of the optical element detection flowchart.

[0080] Textual description of the drawings:

[0081] 100 detection device

[0082] 101 base mounting surface

[0083] 102 beam support

[0084] 103 hopper

[0085] 104 to-be-inspected tray

[0086] 105 OK tray

[0087] 106 NG tray

[0088] 1 rotating module

[0089] 11 disc body

[0090] 112 gas-electricity conveying and shunting rotating table

[0091] 113 rotating disc connection rotating table

[0092] 114 rotating disc base

[0093] 12 pickup assembly

[0094] 120 pickup portion

[0095] 121 X-direction translation adjustment portion

[0096] 122 Y-direction translation adjustment portion

[0097] 123 Z-direction translation adjustment portion

[0098] 124 X-direction rotation adjustment portion

[0099] 125 Y-direction rotation adjustment portion

[0100] 126 Z-direction rotation adjustment portion

[0101] 127 pickup portion fixation mechanism

[0102] 128 elastic element

[0103] 2 side surface detection module

[0104] 21 side surface detection assembly

[0105] 22 side surface detection assembly

[0106] 23 side surface detection assembly

[0107] 3 bottom surface detection module

[0108] 31 first lower detection assembly

[0109] 32 second lower detection assembly

[0110] 5 positioning detection assembly

[0111] 51 top surface detection assembly

[0112] 52 remaining undetected surface detection assembly

[0113] 53 material throwing assembly

[0114] 54 dust removal assembly

[0115] 55 height measurement assembly

[0116] 56 intermediate calibration camera

[0117] 6 tray pick-and-place module

[0118] 61 to-be-inspected tray gripper assembly

[0119] 620 K tray gripper assembly

[0120] 63 NG tray gripper assembly

[0121] 64 first translation track

[0122] 65 second translation track

[0123] 7 loading transfer module

[0124] 9 unloading transfer module DETAILED DESCRIPTION

[0125] Various exemplary embodiments of the present disclosure are described in detail below with reference to the accompanying drawings. The description of exemplary embodiments is merely illustrative in nature and is in no way intended to limit the disclosure, its application or uses. The disclosure can be implemented in numerous different forms, not limited to the embodiments described herein. These embodiments are provided so that this disclosure will be thorough and complete, and fully convey the scope of the disclosure to those skilled in the art. It should be noted that the relative arrangement of components and steps set forth in these embodiments, numerical expressions, and numerical values, etc. should be interpreted as merely exemplary, rather than as a limitation, unless otherwise specified.

[0126] The "comprising" or "including" or similar words used in the present disclosure mean that the elements before the word encompass the elements listed after the word, and do not exclude the possibility of also encompassing other elements.

[0127] All terms used in the present disclosure, including technical terms or scientific terms, have the same meanings as those understood by a person of ordinary skill in the art to which the present disclosure belongs, unless otherwise specifically defined. It should also be understood that terms defined in a generally used dictionary should be interpreted in the same meaning as those in the context of the relevant technology, and should not be interpreted in an idealized or extremely formalized sense, unless otherwise explicitly defined herein.

[0128] For components not described in detail in this section, specific models of components, etc. parameters, mutual relationships between components, and control circuits can be considered as technology, methods, and devices known to those of ordinary skill in the relevant art, but in appropriate cases, the technology, methods, and devices should be considered as part of the specification.

[0129] (detection device)

[0130] During processing and handling, optical elements are prone to produce defects such as pits, scratches, burrs, broken edges, and bubbles, pits, etc. In the embodiments of the present application, optical element detection is the process of detecting the surface or interior of the optical element product through optical imaging technology and image processing system to distinguish between good and bad products.

[0131] Considering the irregular shape and surface of the special optical element, the suction nozzle in the rotating module is used to suck the optical element, and the optical element is driven to revolve around the revolution axis of the rotating disc and rotate around the rotation axis of the suction nozzle. During the rotation, the detection cameras arranged at different azimuthal distances are used to complete sampling at multiple angles. Then, the image processing system processes the sampled images, extracts and analyzes the target features, and finally gives the detection results such as good products and defective products.

[0132] The following refers to Figures 1-7 The optical element detection device of the present application is described. Figure 1 is a general structure diagram of the detection device, Figure 2 is a rotating disc connection schematic diagram, Figure 3 is a pickup assembly structure diagram, Figure 4 is a feeding and discharging transfer module schematic diagram, Figure 5 is a positioning detection module schematic diagram, Figure 6 is a tray taking and placing module schematic diagram, Figure 7 is a camera calibration schematic diagram.

[0133] Firstly, the rotating module 1 is described.

[0134] As shown in Figure 1 , the detection device 100 includes a substantially flat base mounting surface 101 for mounting various modules and components for detecting optical elements. The rotating module 1 is mounted on the base mounting surface 101 and includes a disc body 11 capable of rotating around its own rotation axis and at least one pickup assembly 12 mounted on the disc body 11 for picking up the optical elements to be detected. During the detection process, the disc body 11 rotates the optical elements with the pickup assembly 12 and forms a rotating path of the optical elements. The pickup assembly 12 can be one or multiple, and when multiple, they are arranged at equal intervals around the rotation axis of the disc body 11, and the number can be determined according to actual needs, which is not limited here.

[0135] For convenience of description, the direction of the rotation axis of the disc body 11 is taken as the axial direction of the detection device 100, the radial direction perpendicular to the rotation axis of the disc body 11 is taken as the radial direction of the detection device 100, the direction away from the base mounting surface 101 along the axial direction is taken as the upper direction, and the direction close to the base mounting surface 101 along the axial direction is taken as the lower direction. In the following, the expressions of axial direction, radial direction, upper direction and lower direction are the same as this unless otherwise specified.

[0136] In the embodiment, the disc body 11 is arranged substantially parallel to the base mounting surface 101, i.e. the rotation axis of the disc body 11 is perpendicular to the base mounting surface 101, and the disc body 11 is preferably in the shape of a disc. At this time, the pickup assembly 12 is arranged at a position close to the radial outer periphery of the disc body 11, so as to facilitate picking up the optical element to be detected. It can be understood that the disc body 11 can also be in the shape of a ring, and at this time the pickup assembly 12 can also be arranged at a position close to the radial inner periphery of the disc body 11, and the optical element to be picked up is also close to the radial inner periphery of the disc body 11. In addition, the disc body 11 can also be replaced by several rotating parts arranged at intervals and extending in the radial direction, each of which is provided with a pickup assembly 12, as long as it can carry the pickup assembly 12 and rotate integrally with the pickup assembly 12 around the rotation axis. For the sake of simplicity, the present application only takes the disc body 11 in the shape of a disc as an example for description.

[0137] As shown in Figure 2 , as an example, the disc body 11 is connected to the base mounting surface 101 through an air-electric slip ring structure. Specifically, the disc body 11 is connected to the rotating table 112 through the air-electric transmission and distribution rotating table 113, and the rotating table 113 is fixed to the base mounting surface 101 through the rotating disc base 114. During operation, the disc body 11 synchronously rotates with the air-electric transmission and distribution rotating table 112 and the rotating table 113 around the axial rotation, while realizing stable air and electric transmission.

[0138] Next, the pickup assembly 12 is described.

[0139] In the embodiment, as shown in Figure 3 , the pickup assembly 12 has a pickup part 120 for picking up the optical element to be detected, and an X-direction translation adjustment part 121, a Y-direction translation adjustment part 122, a Z-direction translation adjustment part 123, an X-direction rotation adjustment part 124, a Y-direction rotation adjustment part 125 and a Z-direction rotation adjustment part 126.

[0140] Among them, the X-direction and the Y-direction are perpendicular to each other and are located on the radial plane parallel to the base mounting surface 101, and the Z-direction is perpendicular to the radial plane, i.e. the same as the axial direction of the detection device 100. Through the translation and rotation adjustment in the three directions, the pickup part 120 has six degrees of freedom in space, which is more convenient for adjusting the specific position of the pickup part 120, and improves the convenience, accuracy and detection accuracy of picking up the optical element.

[0141] The pickup portion 120 extends along the Z direction, the lower end surface faces the optical element to be picked up and has a suction hole in communication with the suction mechanism, and the upper end of the pickup portion 120 is connected with a pickup portion fixing mechanism 127. As an example, the pickup portion fixing mechanism 127 is provided with a negative pressure cavity in communication with the suction hole, and the negative pressure cavity is formed with negative pressure by the suction mechanism, so that the optical element is sucked to the suction hole. At this time, the top surface of the optical element facing upward abuts against the lower end surface of the pickup portion 120, and the optical element is moved upward by the suction force of the pickup portion 120 and is extracted. Of course, in another embodiment, the pickup portion 120 can also extend horizontally along the radial direction to suck the side surface of the optical element which is generally directed to the side, which will not be described here.

[0142] During the process of picking up the optical element, there is inevitably a certain floating error between the relative position and the relative distance between the pickup portion 120 and the optical element, and when the optical element is sucked, there is also a certain impact force between the optical element and the lower end surface of the pickup portion 120, thereby causing damage to the optical element. Therefore, preferably, an elastic element 128 connected with the pickup portion 120 is arranged in the pickup portion fixing mechanism 127, and the elastic element 128 has a deformation allowance amount allowing the pickup portion 120 to float up and down along the axial direction. In this way, the floating error between the pickup portion 120 and the optical element can be absorbed, and the impact force between the two can also be reduced to affect the optical element. It can be understood that the lower end surface of the pickup portion 120 is usually made of soft elastic material such as rubber, PEEK plastic, etc., which is also to avoid damage to the optical element.

[0143] Next, the side surface detection module 2 will be described.

[0144] As shown in Figure 1 The detection device 100 further comprises a side surface detection module 2 arranged in the radial direction of the rotation path and comprising a plurality of side surface detection assemblies (21, 22, 23) arranged at intervals along the axial direction. The actual number of side surface detection assemblies (21, 22, 23) is not limited to three as shown, and for the sake of simplicity, only three will be described here as an example.

[0145] When the disc body 11 is disc-shaped, the side surface detection assemblies (21, 22, 23) are arranged radially outward of the outer periphery of the disc body 11, but when the disc body 11 is ring-shaped, the side surface detection assemblies (21, 22, 23) can also be arranged radially inward of the inner periphery of the disc body 11, as long as they are generally directed toward the pickup assembly 12 and can detect the optical element to be picked up. Here, only the case where the side surface detection assemblies (21, 22, 23) are arranged radially outward of the outer periphery of the disc body 11 will be described.

[0146] In one embodiment, the side surface detection assembly (21, 22, 23) is used to detect the side surface of the picked optical element at multiple angles. The side surface can be a vertical surface extending along the axial direction, or a slant surface extending at an angle with the axial direction, which is not specifically limited here.

[0147] In one aspect, the side surface detection assembly (21, 22, 23) is not limited to be absolutely directed to the radial cross-sectional center of the disc body 11, but can be adjusted in posture, for example, close to or away from the radial cross-sectional center of the disc body 11, adjusted in pitch with the radial cross-section of the disc body 11 as the reference surface, or swung left and right with respect to the direction toward the radial cross-sectional center. In addition, the interval angle between any two adjacent side surface detection assemblies (21, 22, 23) is not specifically limited, which can be uniformly distributed at equal intervals, or can have an undefined angle between each other. In actual operation, the posture of the side surface detection assembly (21, 22, 23) is adjusted before the optical element is picked, so as to ensure more comprehensive detection of the side surface of the picked optical element.

[0148] On the other hand, after the optical element is picked to the pickup portion 120, under the action of the Z-direction rotation adjusting portion 126, the optical element can rotate with the pickup portion 120 around the rotation axis of the pickup portion 120. That is, the picked optical element revolves with the disc body 11, and also rotates with the pickup portion 120.

[0149] Specifically, in the detection process, the disc body 11 first drives the optical element to revolve into the detection field of view of the side surface detection assembly 21, and completes the detection of the first side surface region corresponding to the side surface detection assembly 21. When the disc body 11 drives the optical element to revolve to a specific position between the side surface detection assembly 21 and the side surface detection assembly 22, the pickup portion 120 drives the optical element to rotate by a certain angle, for example, 120°, under the control of the control system, and then the optical element revolves into the detection field of view of the side surface detection assembly 22, and completes the detection of the second side surface region corresponding to the side surface detection assembly 22. When the disc body 11 drives the optical element to revolve to a specific position between the side surface detection assembly 22 and the side surface detection assembly 23, the pickup portion 120 drives the optical element to rotate by a certain angle, for example, 120°, under the control of the control system, and then the optical element revolves into the detection field of view of the side surface detection assembly 23, and completes the detection of the third side surface region corresponding to the side surface detection assembly 23.

[0150] Thus, by the revolution of the disc body 11 and the rotation of the pickup part 120, each of the side surface detection assemblies (21, 22, 23) can detect the side surface of the optical element in any orientation. It can be understood that the side surface detection assemblies (21, 22, 23) can also detect the side surface of the optical element in a 360° full circumferential direction, thereby ensuring the comprehensiveness of the side surface detection and avoiding the occurrence of detection blind area and dead angle.

[0151] In another embodiment, the side surface detection assemblies (21, 22, 23) can also be arranged more downwardly relative to the picked optical element, i.e., from the obliquely downward direction to the optical element, so as to detect the oblique surface of the bottom of the optical element which is generally directed to the obliquely downward direction. Alternatively, the side surface detection assemblies (21, 22, 23) can also be arranged more upwardly relative to the picked optical element, i.e., from the obliquely upward direction to the optical element, so as to detect the oblique surface of the top of the optical element which is generally directed to the obliquely upward direction. By the revolution of the disc body 11 and the rotation of the pickup part 120, the oblique surface of the bottom and the oblique surface of the top can also be detected in any orientation or in a 360° full circumferential direction.

[0152] Next, the top surface detection assembly 51 is described.

[0153] As an example, the detection device 100 comprises a beam bracket 102 arranged in parallel with the base mounting surface 101, and a positioning detection module 5 mounted on the beam bracket 102. The positioning detection module 5 comprises a top surface detection assembly 51 arranged generally downwardly, and a remaining un-detected surface detection assembly 52. The top surface detection assembly 51 is used to detect the top surface of at least a portion of the optical element directed upwardly, and the remaining un-detected surface detection assembly 52 is described later.

[0154] In daily operation, a plurality of optical elements to be detected are arranged and placed in the detection trays 104 in advance, and the plurality of detection trays 104 are stored in the storage bin 103 in a stacking manner. During detection, the detection device 100 first takes and places a single detection tray 104 to the feeding transfer module 7 through the tray taking and placing module 6. The feeding transfer module 7 comprises a stepping motor which can accurately control the number of steps, and can drive the detection tray 104 to move in translation on a radial plane parallel to the base mounting surface 101. Under the control of the control system, the feeding transfer module 7 transports the detection tray 104 to the lower side of the top surface detection assembly 51, so as to ensure that each optical element to be detected is within the detection field of view of the top surface detection assembly 51. The present application adopts the stacking storage bin feeding mode, which can enhance the convenience of feeding and discharging of the equipment and save the equipment switching time, and improve the automatic production efficiency.

[0155] In the present embodiment, the top surface detection assembly 51 only detects part of the top surface of the optical element in the tray 104 under inspection, and the undetected part of the top surface is used to contact the pick-up assembly 12 to facilitate the pick-up of the optical element by the pick-up assembly 12.

[0156] The top surface detection assembly 51 is also used to locate the visual center of the top surface of the optical element. As an example, a radial plane coordinate system is established on a radial plane parallel to the base mounting surface 101, and a point in the radial plane is arbitrarily selected as the origin. In the case where the position coordinates of the detection camera in the top surface detection assembly 51 are known, the visual center coordinates of the top surface of the optical element can be obtained by image processing system to extract and analyze the imaging of the top surface of the optical element, and then the position adjustment of the tray 104 by the feeding and transferring module 7 is controlled to ensure that the projection of the visual center of the top surface of the optical element on the radial plane coincides with the projection of the visual center of the detection camera in the top surface detection assembly 51 on the radial plane, so as to improve the detection accuracy. After the detection of the optical element is completed, the feeding and transferring module 7 continues to perform the position adjustment to make the visual center of the next optical element under inspection in the tray 104 coincide with the projection of the visual center of the detection camera in the top surface detection assembly 51 on the radial plane. The visual center of the detection camera in the top surface detection assembly 51 here is the center of the imaging surface of the detection camera.

[0157] Next, the bottom surface detection module 3 is described.

[0158] The picked-up optical element also has a bottom surface generally facing downward in the axial direction, and therefore the bottom surface detection module 3 needs to be arranged below the optical element to detect the bottom surface thereof. The bottom surface can be a surface perpendicular to the axial direction or a bevel surface having a certain angle with the axial direction, as long as it can be sampled by the bottom surface detection module 3 generally facing downward.

[0159] As an embodiment, the bottom surface detection module 3 comprises a first lower detection assembly 31 and a second lower detection assembly 32 arranged below the axial direction of the rotation path of the picked-up optical element and spaced apart around the axial direction, and the first lower detection assembly 31 and the second lower detection assembly 32 respectively detect different regions of the bottom surface of the optical element. It can be understood that the bottom surface detection module 3 can be provided with one or more lower detection assemblies according to actual needs to adapt to the detection needs of the irregular bottom surface of the special-shaped optical element. For the sake of simplicity, only the first lower detection assembly 31 and the second lower detection assembly 32 shown are described here as examples.

[0160] Preferably, after the pickup assembly 12 picks up the optical element to be inspected, the projection of the optical element on a radial plane parallel to the base mounting surface 101 is placed outside the projection of the disc body 11 on the radial plane, so as to avoid the disc body 11 from blocking the bottom surface of the optical element. For example, when the disc body 11 is disc-shaped, the pickup assembly 12 places the picked-up optical element radially outside the outer periphery of the disc body 11. When the disc body 11 is ring-shaped, the pickup assembly 12 can also place the picked-up optical element radially inside the inner periphery of the disc body 11, which will not be described herein.

[0161] As another embodiment, the bottom surface detection module 3 can also be arranged at the center of the radial section of the disc body 11 and extend in the radial direction of the disc body 11 by a detection portion, which extends all the way below the picked-up optical element to detect the bottom surface of the optical element. At this time, the projection of the optical element on a radial plane can or can not at least partially overlap with the projection of the disc body 11 on the radial plane, and the relative positional relationship between the two projections is not limited herein. For simplicity, the present application will be described by way of example with the bottom surface detection module 3 arranged below the axial direction of the rotation path of the picked-up optical element and the picked-up optical element placed radially outside the outer periphery of the disc body 11.

[0162] During the detection process, after the pickup assembly 12 picks up the optical element, the first lower detection assembly 31 first detects the bottom surface of part of the optical element, and when the pickup assembly 12 is rotated to above the second lower detection assembly 32, the second lower detection assembly 32 detects at least the area of the bottom surface that has not been detected by the first lower detection assembly 31. That is, the first lower detection assembly 31 and the second lower detection assembly 32 can realize comprehensive detection sampling of the bottom surface of the optical element and will not leave a detection blind area and a dead angle.

[0163] In addition, the first lower detection assembly 31 and the second lower detection assembly 32 can also position the pickup assembly 12, so as to adjust the pose of the pickup assembly 12, thereby facilitating the pickup of the optical element to be inspected and improving the detection accuracy.

[0164] On the one hand, the installation position and the pose of each pickup assembly 12 on the disc body 11 have certain deviations, which causes the picked-up optical element to also have pose deviations, such as some being vertical and some being inclined, some being close to the disc body 11 and some being far away from the disc body 11, thereby affecting the detection accuracy. Therefore, before the detection starts, each pickup assembly 12 needs to be adjusted to ensure consistency.

[0165] Specifically, the projection imaging of the pickup part 120 of each pickup assembly 12 on the radial plane parallel to the base mounting surface 101 is acquired by the first lower detection assembly 31 or the second lower detection assembly 32, and each pickup assembly 12 is calibrated based on at least the projection imaging, so that the projection imaging of each pickup part 120 acquired by the first lower detection assembly 31 or the second lower detection assembly 32 coincides with each other, to ensure that when each pickup assembly 12 turns to the same position on the radial plane, the position and posture of the pickup part 120 in the axial direction are consistent, so as to make the detection of the bottom surface of the optical element by the first lower detection assembly 31 and the second lower detection assembly 32 have higher precision.

[0166] Specific adjustment of the position and posture, for example, adjustment of the perpendicularity of the pickup part 120, can be achieved by controlling the aforementioned X-direction translation adjustment part 121, Y-direction translation adjustment part 122, Z-direction translation adjustment part 123, X-direction rotation adjustment part 124, Y-direction rotation adjustment part 125, and Z-direction rotation adjustment part 126 to control the translation and / or rotation of the pickup part 120 along the X-direction, Y-direction, and Z-direction, which will not be described in detail here.

[0167] On the other hand, after the top surface detection assembly 51 detects the top surface of the part of the optical element, in order to accurately transport the to-be-detected tray 104 from below the top surface detection assembly 51 to below the corresponding pickup part 120, the position of the pickup part 120 needs to be acquired. Specifically, in the aforementioned radial plane coordinate system, the imaging of the lower end surface of the pickup part 120 is acquired by the first lower detection assembly 31, and the coordinates of the radial cross-sectional center of the lower end surface of the pickup part 120 can be acquired by image processing system extraction analysis, and then according to the coordinates of the visual center of the top surface of the optical element acquired by the top surface detection assembly 51, the number of steps of the stepping motor in the feeding transfer module 7 can be accurately adjusted, so as to accurately transport the optical element in the tray 104 to below the corresponding pickup part 120.

[0168] Next, the discharging process is described.

[0169] As shown in Figure 1 , Figure 4 , the base mounting surface 101 is provided with a discharging transfer module 9, and OK trays 105 and NG trays 106 arranged in the discharging transfer module 9. The discharging transfer module 9 includes a stepping motor capable of accurately controlling the number of steps, and can realize the translational motion of the OK trays 105 and the NG trays 106 on the radial plane parallel to the base mounting surface 101.

[0170] The OK tray 105 is used to receive the optical element that is separated from the pickup portion 120 and is detected as qualified by the top surface detection assembly 51, the side surface detection assembly (21, 22, 23), the first lower detection assembly 31 and the second lower detection assembly 32. The NG tray 106 is used to receive the optical element that is separated from the pickup portion and is detected as unqualified by at least one of the top surface detection assembly 51, the side surface detection assembly (21, 22, 23), the first lower detection assembly 31 and the second lower detection assembly 32.

[0171] Specifically, after the optical element completes the detection by the top surface detection assembly 51, the side surface detection assembly (21, 22, 23), the first lower detection assembly 31 and the second lower detection assembly 32, the second lower detection module 2 transmits the result information of all the previous detection procedures to the positioning detection module 5, and according to the NG / OK result, the positioning of the hole position of the NG tray / OK tray for receiving the optical element is completed by the remaining undetected surface detection assembly 52. If no defect is found in all the previous detection procedures, the unloading transfer module 9 moves the OK tray 105 to the lower side of the optical element, at which time the negative pressure cavity of the pickup portion 120 stops working, and the optical element falls into the OK tray 105. If a defect is found at any place, the unloading transfer module 9 moves the NG tray 106 to the lower side of the optical element, and the optical element falls into the NG tray 106.

[0172] At this time, for the optical element that falls into the OK tray 105, the part of the top surface that abuts against the pickup portion 120 has not been effectively detected due to the influence of the pickup portion 120, and this part of the undetected surface is the remaining undetected surface.

[0173] It should be noted that the reason why the remaining undetected surface is not detected by the top surface detection assembly 51 before the optical element is picked up is that the pickup portion 120 may cause damage to the part in contact with the optical element during the process of picking up the optical element, i.e., it is meaningless to detect the remaining undetected surface before the optical element is picked up. Therefore, the detection of the remaining undetected surface is arranged to be performed after the optical element is separated from the pickup portion 120.

[0174] As shown in FIGS. 1, 2 and 3, the optical element to be separated from the pickup portion 120 enters the OK tray 105, and the unloading transfer module 9 drives the OK tray 105 to move and transport the optical element to the detection field of view of the remaining undetected surface detection assembly 52, and the remaining undetected surface detection assembly 52 detects the remaining undetected surface. Figure 1 Figure 5 If no defect is found, the optical element is left in the OK tray 105. If a defect is found, the optical element is picked up from the OK tray 105 by the throwing assembly 53 and placed into a throwing box (not shown in the drawings). Figure 5 If a defect is found, the optical element is picked up from the OK tray 105 by the throwing assembly 53 and placed into a throwing box (not shown in the drawings).​

[0175] As shown in Figure 5 The positioning detection module 5 also comprises a height measuring assembly 55, which is usually provided with a laser sensor. Before the optical elements are picked up, the height position of each optical element in the tray 104 to be inspected in the axial direction is obtained by the height measuring assembly 55, and according to the height position, the top surface detection assembly 51 can be automatically adjusted in height in the axial direction, so that each optical element to be inspected can be within the focusing field of view of the top surface detection assembly 51. It should be noted that the pickup portion 120 can float up and down in the axial direction, and the axial height adjustment has been completed when the equipment is installed and adjusted, so that the floating difference of the axial height of all optical elements in the tray 104 to be inspected is within the height range of the axial floating of the pickup portion 120, and therefore the pickup portion 120 can suck optical elements of different heights.

[0176] In addition, the positioning detection module 5 also comprises a dust removal assembly 54, which performs dust removal operation on the hole position in the tray 104 to be inspected and the OK tray 105 and the tray 106 in which the optical elements are not placed, for example, by using high-pressure airflow to first blow the hole position, and then sucking the dust and other impurities after blowing them up, so as to ensure the cleanliness of the tray and prevent secondary pollution to the optical elements.

[0177] Next, the tray taking and placing module 6 will be described.

[0178] As shown in Figure 6 The tray taking and placing module 6 comprises a first translation rail 64 and a second translation rail 65 parallel to the base mounting surface 101, wherein the first translation rail 64 and the second translation rail 65 are perpendicular to each other, and the first translation rail 64 can move in translation along the second translation rail 65. The first translation rail 64 is also provided with a jaw base 66, which can move in translation along the first translation rail 64. In other words, by the translation of the first translation rail 64 along the second translation rail 65 and the translation of the jaw base 66 along the first translation rail 64, the position of the jaw base 66 in the radial plane parallel to the base mounting surface 101 can be moved.

[0179] The jaw base 66 is also provided with a tray-to-be-inspected jaw assembly 61, an OK tray jaw assembly 62, and an NG tray jaw assembly 63, which are respectively used to grasp the tray 104 to be inspected, the OK tray 105, and the NG tray 106. For example, when feeding, the tray-to-be-inspected jaw assembly 61 grasps the tray 104 to be inspected from the hopper 103 to the feeding transfer module 7; when the OK tray and the NG tray are full, the OK tray jaw assembly 62 and the NG tray jaw assembly 63 respectively sort the OK tray and the NG tray to the predetermined position.

[0180] In fact, the material tray loading and unloading module 6 is not limited to the three gripper components mentioned above. Multiple grippers can be set according to requirements and correspond to multiple material tray stations respectively, so as to accurately and efficiently complete the parallel operation of multiple action processes and improve the detection efficiency.

[0181] Next, the camera calibration will be explained.

[0182] In typical examples, the top surface detection component 51, the side surface detection components (21, 22, 23), the first lower detection component 31, the second lower detection component 32, and the remaining undetected surface detection component 52 all include a detection camera, such as a CCD camera, for detection and positioning through camera imaging. Therefore, during the equipment assembly and adjustment process, the detection device 100 needs to calibrate the detection cameras of each detection component, i.e., obtain the relative coordinate values ​​between each module, to improve the detection accuracy.

[0183] For simplicity, this explanation will only take the calibration of the detection camera in the remaining undetected surface detection component 52 and the second lower detection component 32 as an example.

[0184] Preferably, such as Figure 7 As shown, an intermediate calibration camera 56, a first calibration block, and a second calibration block (not shown) are disposed on the mounting surface 101 of the base. The first calibration block is simultaneously located within the imaging field of view of both the detection camera of the remaining undetected surface detection component 52 and the intermediate calibration camera 56, and has a first feature point, such as a micropore, that can be captured by both cameras simultaneously. The second calibration block is simultaneously located within the imaging field of view of both the detection camera of the second lower detection component 32 and the intermediate calibration camera 56, and has a second feature point, such as a micropore, that can be captured by both cameras simultaneously.

[0185] During the calibration process, the detection camera of the remaining undetected surface detection component 52 and the intermediate calibration camera 56 simultaneously photograph the first calibration block to obtain the image of the first feature point. After image processing, such as obtaining the pixel difference between the position point of the first feature point in the image and the position point of the imaging surface center of the camera, the relative coordinate position of the imaging surface center of the two cameras in the radial plane coordinate system can be obtained.

[0186] Then, the detection camera in the second detection component 32 and the intermediate calibration camera 56 simultaneously photograph the second calibration block to obtain the image of the second feature point. After image processing, such as obtaining the pixel difference between the position point of the second feature point in the image and the position point of the center of the imaging surface of the camera, the relative coordinate position of the center of the imaging surface of the two cameras in the radial plane coordinate system can be obtained.

[0187] Further, by associating with the intermediate calibration camera 56, the relative coordinate positions of the detection cameras in the remaining unexamined surface detection assembly 52 and the second lower detection assembly 32 can be obtained. Similarly, the relative coordinate positions between the detection cameras in any two detection assemblies can be obtained.

[0188] It should be noted that two calibration blocks are provided because the overlapping imaging field of view range between the detection cameras in the remaining unexamined surface detection assembly 52 and the intermediate calibration camera 56 is different from the overlapping imaging field of view range between the detection cameras in the second lower detection assembly 32 and the intermediate calibration camera 56. The positions and number of the intermediate calibration camera 56 and the calibration blocks need to be determined according to the relative positions and imaging field of view ranges of the detection cameras to be calibrated, which are not specifically limited here.

[0189] (Detection method)

[0190] The detection method of the optical element will be described below. Figure 8 The detection method of the optical element will be described below. Figure 8 The detection method of the optical element will be described below.

[0191] As an embodiment, the detection method of the optical element mainly includes the following steps:

[0192] S1: Feeding step. The single to-be-inspected tray 104 is taken from the tray warehouse 103 to the feeding transfer module 7 by the tray taking and placing module 6, and the feeding transfer module 7 transports the to-be-inspected tray 104 to the lower side of the top surface detection assembly 51, so as to ensure that each to-be-inspected optical element is in the detection field of view range of the top surface detection assembly 51.

[0193] S2: Top surface positioning detection step. The top surface detection assembly 51 detects part of the area of the top surface of the optical element in the to-be-inspected tray 104, and also positions the optical element, so as to obtain the coordinates of the visual center of the top surface of the optical element in the radial plane coordinate system parallel to the base table mounting surface 101. Then, the feeding transfer module 7 adjusts the position of the to-be-inspected tray 104, so as to make the projection of the visual center of the top surface of the optical element and the imaging surface center of the top surface detection assembly 51 on the radial plane coincide.

[0194] S3: Element picking step. The first lower detection assembly 31 obtains the coordinates of the radial cross-section center of the picking part 120 in the radial plane coordinate system parallel to the base table mounting surface 101, and then, according to the coordinates of the visual center of the top surface of the optical element obtained in the top surface positioning detection step, the feeding transfer module 7 translates the to-be-inspected tray 104 to accurately send the optical element to the position corresponding to the picking part 120, for example, directly below. The picking part 120 extracts the optical element from below to above by sucking the top surface of the optical element through the lower end surface facing downward.

[0195] S4: rotation detection step. On the one hand, the approximately side-ward side surface of the picked optical element is detected. The disc body 11 drives the picked optical element to revolve to the detection field of the side surface detection assembly 21, and the detection of the first side surface area corresponding to the side surface detection assembly 21 is completed. When the disc body 11 drives the optical element to revolve to a specific position between the side surface detection assembly 21 and the side surface detection assembly 22, the pickup 120 drives the optical element to rotate by an angle, for example, 120°, and then the optical element revolves to the detection field of the side surface detection assembly 22, and the detection of the second side surface area corresponding to the side surface detection assembly 22 is completed. When the disc body 11 drives the optical element to revolve to a specific position between the side surface detection assembly 22 and the side surface detection assembly 23, the pickup 120 drives the optical element to rotate by an angle, for example, 120°, and the rotation direction of the two rotations is the same, and then the optical element revolves to the detection field of the side surface detection assembly 23, and the detection of the third side surface area corresponding to the side surface detection assembly 23 is completed. Through the revolution driven by the disc body 11 and the rotation driven by the pickup 120, each of the side surface detection assemblies (21, 22, 23) can detect the approximately side-ward side surface of the optical element in any direction. At the same time, on the other hand, the approximately downward bottom surface of the picked optical element is detected. The first lower detection assembly 31 first detects part of the bottom surface of the optical element, and when the optical element rotates to the upper side of the second lower detection assembly 32, the second lower detection assembly 32 detects at least the area of the bottom surface that has not been detected by the first lower detection assembly 31.

[0196] S5: blanking step. After the optical element completes the detection of the top surface detection assembly 51, the side surface detection assembly (21, 22, 23), the first lower detection assembly 31, and the second lower detection assembly 32, the second lower detection module 2 transmits the result information of all the previous detection processes to the positioning detection module 5, and according to the NG / OK result, the remaining undetected surface detection assembly 52 completes the positioning of the hole position for receiving the product of the NG tray / OK tray. If no defects are found in all the previous detection processes, the blanking transfer module 9 moves the OK tray 105 to the lower side of the optical element, at which time the negative pressure cavity of the pickup 120 stops working, and the optical element falls into the OK tray 105. If any defect is found, the blanking transfer module 9 moves the NG tray 106 to the lower side of the optical element, and the optical element falls into the NG tray 106.

[0197] S6: remaining un-inspected surface detection step. After the optical element is detached from the pickup unit 120 and enters the OK tray 105, the blanking transfer module 9 drives the OK tray 105 to move and transport the optical element into the detection field of the remaining un-inspected surface detection assembly 52, and the remaining un-inspected top surface is detected by the remaining un-inspected surface detection assembly 52. If no defect is found, the optical element is left in the OK tray 105. If a defect is found, the optical element is picked up from the OK tray 105 by the discarding assembly 53 and placed into a discarding box (not shown in the figure).

[0198] S7: full tray sorting step. When the OK tray and the NG tray are full, the tray pickup and placement module 6 sorts the OK tray and the NG tray to predetermined positions, respectively, and the detection ends.

[0199] Preferably, before the loading step S1, a device calibration step is performed. Specifically, the calibration of the pickup unit 120 is performed, and the projection imaging of the pickup unit 120 of each pickup assembly 12 in the radial plane parallel to the base mounting surface 101 is obtained by the first lower detection assembly 31 or the second lower detection assembly 32. Based at least on the projection imaging, each pickup assembly 12 is calibrated so that the projection imaging of each pickup unit 120 obtained by the first lower detection assembly 31 or the second lower detection assembly 32 coincides with each other, thereby ensuring that the position and attitude of the pickup unit 120 of each pickup assembly 12 in the axial direction are consistent when each pickup assembly 12 is turned to the same position in the radial plane. At the same time, the calibration of the detection assembly is also performed, and the attitude of the side surface detection assembly (21, 22, 23) is adjusted, such as close to or away from the radial cross-sectional center of the tray body 11, pitch adjustment with the radial cross-section of the tray body 11 as the reference surface, or left and right swing relative to the direction towards the radial cross-sectional center.

[0200] Preferably, before the loading step S1, a camera calibration step is also performed. As an example, an intermediate calibration camera 56 and a first calibration block having a first feature point and a second calibration block having a second feature point are provided. First, the detection camera of one detection assembly and the intermediate calibration camera 56 are used to take the first calibration block to obtain the image of the first feature point, and through image processing, such as obtaining the pixel difference between the position point of the first feature point in the image and the position point of the imaging center of the camera, the relative coordinate position of the imaging center of the detection camera and the intermediate calibration camera 56 in the radial plane coordinate system can be obtained.

[0201] Then, the detection camera of another detection assembly and the intermediate calibration camera 56 are used to take the second calibration block to obtain the image of the second feature point, and through image processing, such as obtaining the pixel difference between the position point of the second feature point in the image and the position point of the imaging center of the camera, the relative coordinate position of the imaging center of the detection camera and the intermediate calibration camera 56 in the radial plane coordinate system can be obtained.

[0202] Further, by being associated with the intermediate calibration camera 56, the relative coordinate positions of the imaging surface centers of the detection cameras in the above two detection assemblies can be obtained.

[0203] Preferably, after the feeding step S1 and before the top surface positioning detection step S2, a height measurement step is further performed, in which the height position of each optical element in the tray 104 to be detected in the axial direction is obtained by the height measurement assembly 55, and according to the height position, the top surface detection assembly 51 is automatically adjusted in height in the axial direction, so that each optical element to be detected can be within the focusing field of view of the top surface detection assembly 51.

[0204] The optical element detection device and detection method described above can perform omnidirectional automatic detection on special-shaped optical elements, greatly improve the detection efficiency through automatic feeding and discharging and automatic detection of multiple surfaces, and can freely combine the detection stations to complete the detection of multiple types of products, have strong applicability, and can effectively reduce the production cost. Through the product and pickup assembly double positioning, camera calibration, and pickup assembly and detection assembly adjustment operations, the detection precision is improved. Only one pickup operation is performed in the detection process, which can reduce the secondary damage to the optical elements. At the same time, the equipment has strong anti-interference ability, is convenient to debug and maintain, ensures the detection yield of the product, and is more conducive to improving the consistency of the product.

[0205] It should be understood that the specific embodiments described above are only used to explain the present application, and the protection scope of the present application is not limited thereto, and any skilled person in the art can make changes, substitutions, combinations within the technical range disclosed by the present application according to the technical solutions and inventive concepts of the present application, which should be covered within the protection scope of the present application.

Claims

1. An optical element detection device, characterized in that, a rotating module is provided, comprising a rotating body capable of rotating around its rotating axis, and at least one pickup assembly fixed to the rotating body and spaced apart from the rotating axis of the rotating body by a predetermined distance for picking up an optical element to be detected, the rotating body drives the optical element to rotate around the rotating axis of the rotating body through the at least one pickup assembly and forms a rotating path of the optical element; the optical element detection device further comprises a plurality of side surface detection assemblies arranged in the radial direction of the rotating path and spaced apart around the rotating axis of the rotating body, each of the plurality of side surface detection assemblies is used for detecting at least a part of a certain surface of a plurality of surfaces of the optical element picked up by the at least one pickup assembly, the optical element detection device further comprises a top surface detection assembly arranged above the optical element to be detected along the direction of the rotating axis of the rotating body, for detecting at least a part of the top surface of the optical element facing the top surface detection assembly, each of the at least one pickup assembly has a pickup portion for picking up the optical element, the pickup portion is capable of rotating integrally with the picked-up optical element around the rotating axis of the pickup portion, and the rotating axis of the pickup portion is parallel to the rotating axis of the rotating body, a radial plane coordinate system is established along the radial cross section of the rotating body, before the pickup portion picks up the optical element, the top surface detection assembly can further obtain the coordinate of the center position of the top surface of the optical element, further, each of the plurality of side surface detection assemblies is used for detecting the orientation of the surface of the optical element facing the side surface detection assembly in the radial direction perpendicular to the rotating axis of the rotating body, a first lower detection assembly is arranged below the rotating path along the direction of the rotating axis of the rotating body, capable of detecting the bottom surface of the optical element picked up by the pickup portion facing the first lower detection assembly, before the pickup portion picks up the optical element, the first lower detection assembly can further obtain the position coordinate of the radial cross section center of the pickup portion in the radial plane coordinate system, the optical element detection device further comprises a feeding and transferring module, according to the position coordinate of the radial cross section center of the pickup portion in the radial plane coordinate system and the center position coordinate of the top surface of the optical element, the optical element detected by the top surface detection assembly is transported to the position corresponding to the pickup portion.

2. The optical element detection device according to claim 1, characterized in that, the rotating body is a disc-shaped plate.

3. The optical element detection device according to claim 1, characterized in that: the pickup portion is further capable of translational motion along the direction of the rotating axis of the rotating body, and translational and / or rotational motion along a first direction and a second direction on the radial cross section of the rotating body, the first direction and the second direction are perpendicular to each other.

4. The optical element detection device according to claim 3, characterized in that: Each of the at least one pickup assembly is provided with an elastic element connected with the pickup portion, the elastic element has a deformation allowance amount allowing the pickup portion to float along the rotation axis direction of the rotating body.

5. The optical element inspection apparatus according to claim 1, wherein Further provided are: A second lower detection assembly arranged below the rotating path along the rotation axis direction of the rotating body, capable of detecting the area of the bottom surface of the optical element that is not detected by the first lower detection assembly.

6. The optical element detection device according to claim 5, characterized in that: Before the pickup portion picks up the optical element, the second lower detection assembly can further acquire the projection imaging of the pickup portion of each of the at least one pickup assembly on the radial cross section of the rotating body; Each of the at least one pickup assembly is adjusted based on at least the projection imaging.

7. The optical element inspection apparatus according to claim 6, wherein Further provided are: A remaining undetected surface detection assembly for detecting the undetected remaining surface of the optical element that is separated from the pickup portion and has passed the detection of the plurality of side surface detection assemblies, the top surface detection assembly, the first lower detection assembly, and the second lower detection assembly.

8. The optical element inspection apparatus according to claim 7, wherein Further provided are: A storage unit for accommodating the optical element that is separated from the pickup portion and has passed the detection of the plurality of side surface detection assemblies, the top surface detection assembly, the first lower detection assembly, and the second lower detection assembly; A throwing assembly for taking out the optical element whose remaining surface detection is failed from the storage unit.

9. The optical element inspection apparatus according to claim 8, wherein Further provided are: A height measuring assembly for acquiring the height position of the optical element to be detected in the rotation axis direction of the rotating body; The top surface detection assembly can be adjusted in the position along the rotation axis direction of the rotating body according to the height position of the optical element acquired by the height measuring assembly.

10. An optical element inspection method characterized by comprising: Comprising: S1: an element pickup step of picking up an optical element to be detected by at least one pickup assembly arranged on a rotating body capable of rotating about a rotation axis thereof and spaced apart from the rotation axis of the rotating body by a predetermined distance; S2: a rotating detection step of rotating the rotating body about the rotation axis thereof by the at least one pickup assembly to rotate the optical element and form a rotating path of the optical element, and detecting at least a part of one of the plurality of surfaces of the optical element by a plurality of side surface detection assemblies arranged in the radial direction of the rotating path and spaced apart around the rotation axis of the rotating body, Before the element pickup step, a top surface positioning detection step is performed, in which a top surface detection assembly arranged above the optical element to be detected along the rotation axis direction of the rotating body detects at least a part of the top surface of the optical element facing the top surface detection assembly and acquires the center position of the top surface of the optical element, After the top surface positioning detection step and before the element pickup step, a feeding transfer step is performed, in which a feeding transfer module transports the optical element that has passed the detection of the top surface detection assembly to a position corresponding to the pickup portion according to the position of the pickup portion on the radial plane and the center position of the top surface of the optical element acquired, Each of the at least one pickup assembly has a pickup portion that grips the optical element; In the rotation detection step, the pickup portion is capable of rotating integrally with the picked-up optical element around a rotation axis of the pickup portion, the rotation axis of the pickup portion being parallel to the rotation axis of the rotation body, Further, each of the plurality of side surface detection assemblies is configured to detect any orientation of a surface of the optical element facing the side surface detection assembly in a radial direction perpendicular to the rotation axis of the rotation body, Before the element pickup step, a pickup portion positioning step is performed, in which a first lower detection assembly disposed below the rotation path in the direction of the rotation axis of the rotation body is used to obtain a position of the pickup portion in a radial plane perpendicular to the rotation axis of the rotation body.

11. The optical element detection method according to claim 10, wherein The rotation body is a disc-shaped plate.

12. The optical element detection method according to claim 10, wherein: After the element pickup step, a first bottom surface detection step is performed, in which the first lower detection assembly is used to detect a bottom surface of the optical element picked up by the at least one pickup assembly facing at least a portion of the first lower detection assembly.

13. The optical element detection method according to claim 12, wherein: After the first bottom surface detection step, a second bottom surface detection step is performed, in which a second lower detection assembly disposed below the rotation path in the direction of the rotation axis of the rotation body is used to detect a region of the bottom surface of the optical element that has not been detected by the first lower detection assembly.

14. The optical element detection method according to claim 13, wherein: Before the element pickup step, a pickup assembly calibration step is performed, in which the first lower detection assembly or the second lower detection assembly is used to obtain a projection image of the pickup portion of each of the at least one pickup assembly in a radial cross section of the rotation body; Each of the at least one pickup assembly is calibrated based at least on the projection image.

15. The optical element detection method according to claim 14, wherein: After the first bottom surface detection step, the second bottom surface detection step, and the rotation detection step, a remaining undetected surface detection step is performed, in which a remaining surface detection assembly is used to detect a remaining surface of the optical element picked up by the pickup portion that has not been detected, and that has passed the detection of the plurality of side surface detection assemblies, the top surface detection assembly, the first lower detection assembly, and the second lower detection assembly.

16. The optical element inspection method according to claim 15, wherein comprising: After the first bottom surface detection step, the second bottom surface detection step, and the rotation detection step, and before the remaining undetected surface detection step, a discharging step is performed, in which the optical element picked up by the pickup portion that has passed the detection of the plurality of side surface detection assemblies, the top surface detection assembly, the first lower detection assembly, and the second lower detection assembly is placed in a storage unit; After the remaining unexamined surface detection step, a material throwing step is performed to take out the optical element whose surface detection is not qualified from the storage unit.

17. The optical element detection method according to claim 16, wherein: Before the element pickup step, a height measurement step is performed to obtain a height position of the optical element to be examined in the rotation axis direction of the rotary body by a height measurement assembly; The top surface detection assembly performs position adjustment in the rotation axis direction of the rotary body based on the height position of the optical element obtained by the height measurement assembly.

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